首页 > 最新文献

International Journal of Numerical Modelling-Electronic Networks Devices and Fields最新文献

英文 中文
Open-set recognition of LPI radar signals based on a slightly convolutional neural network and support vector data description 基于略卷积神经网络和支持向量数据描述的 LPI 雷达信号开放集识别
IF 1.6 4区 工程技术 Q2 Mathematics Pub Date : 2024-01-22 DOI: 10.1002/jnm.3213
Zhilin Liu, Tianzhang He, Tong Wu, Jindong Wang, Bin Xia, Liangjian Jiang

LPI radar signal recognition based on convolutional neural networks usually assumes that the signal to be recognized belongs to a closed set of known signal classes. In an open electromagnetic signal environment, this type of closed-set recognition method will experience a drastic drop in performance due to the encounter with unknown types of signals. We propose an SCNN-SVDD model based on a combination of a lightweight convolutional neural network and a support vector data description algorithm to achieve open-set recognition of LPI radar signals under unknown signal conditions. In this approach, Choi-William's time-frequency distribution is used to obtain two-dimensional time-frequency images of the signal to be identified, and convolutional neural networks are used to achieve high-precision classification of known signals and extract the corresponding feature vectors. Then, the feature vectors are used as input to the SVDD algorithm and a hypersphere is constructed to detect whether the signal to be identified belongs to a known class. Experimental results show that the proposed method can detect unknown signals while maintaining high recognition accuracy for known signals.

基于卷积神经网络的 LPI 雷达信号识别通常假定要识别的信号属于已知信号类别的封闭集。在开放的电磁信号环境中,这种封闭集识别方法会因为遇到未知类型的信号而导致性能急剧下降。我们提出了一种基于轻量级卷积神经网络和支持向量数据描述算法组合的 SCNN-SVDD 模型,以实现未知信号条件下 LPI 雷达信号的开放集识别。在该方法中,利用 Choi-William 时频分布获取待识别信号的二维时频图像,利用卷积神经网络实现对已知信号的高精度分类,并提取相应的特征向量。然后,将特征向量作为 SVDD 算法的输入,构建超球,检测待识别信号是否属于已知类别。实验结果表明,所提出的方法可以检测未知信号,同时对已知信号保持较高的识别准确率。
{"title":"Open-set recognition of LPI radar signals based on a slightly convolutional neural network and support vector data description","authors":"Zhilin Liu,&nbsp;Tianzhang He,&nbsp;Tong Wu,&nbsp;Jindong Wang,&nbsp;Bin Xia,&nbsp;Liangjian Jiang","doi":"10.1002/jnm.3213","DOIUrl":"10.1002/jnm.3213","url":null,"abstract":"<p>LPI radar signal recognition based on convolutional neural networks usually assumes that the signal to be recognized belongs to a closed set of known signal classes. In an open electromagnetic signal environment, this type of closed-set recognition method will experience a drastic drop in performance due to the encounter with unknown types of signals. We propose an SCNN-SVDD model based on a combination of a lightweight convolutional neural network and a support vector data description algorithm to achieve open-set recognition of LPI radar signals under unknown signal conditions. In this approach, Choi-William's time-frequency distribution is used to obtain two-dimensional time-frequency images of the signal to be identified, and convolutional neural networks are used to achieve high-precision classification of known signals and extract the corresponding feature vectors. Then, the feature vectors are used as input to the SVDD algorithm and a hypersphere is constructed to detect whether the signal to be identified belongs to a known class. Experimental results show that the proposed method can detect unknown signals while maintaining high recognition accuracy for known signals.</p>","PeriodicalId":50300,"journal":{"name":"International Journal of Numerical Modelling-Electronic Networks Devices and Fields","volume":null,"pages":null},"PeriodicalIF":1.6,"publicationDate":"2024-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139516668","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Additional findings on S-parameter bounds valid for unconditionally stable N-ports 对无条件稳定 N 端口有效的 S 参数边界的其他发现
IF 1.6 4区 工程技术 Q2 Mathematics Pub Date : 2024-01-21 DOI: 10.1002/jnm.3211
Sergio Colangeli, Antonio Serino, Walter Ciccognani, Patrick E. Longhi, Ernesto Limiti

In a recent paper, it has been shown that, if an N-port network fulfills the condition of (geometrical) unconditional stability at a given frequency, then its scattering parameters will also necessarily satisfy N easily computable bounds, one per port. In order to complete that picture, this contribution investigates whether a tighter bound can be obtained by combining the N$$ N $$ bounds into just one. The answer is in general negative, except that the 3-port case does indeed exhibit a peculiar behavior: this can be exploited to reduce the upper bound when the diagonal elements of the scattering matrix are limited in magnitude up to some α$$ alpha $$, and in particular for α=0$$ alpha =0 $$ (simultaneous conjugate match).

最近的一篇论文表明,如果一个 N 端口网络满足给定频率下的(几何)无条件稳定性条件,那么它的散射参数也必然满足 N 个易于计算的边界,每个端口一个。为了使这幅图更完整,本文研究了是否可以通过将 N$$ N$ 个约束合并为一个约束来获得更严格的约束。答案一般是否定的,但 3 端口情况确实表现出一种奇特的行为:当散射矩阵对角元素的大小限制在某个 α$$ alpha $$ 时,尤其是 α=0$$ alpha =0 $$ 时(同时共轭匹配),可以利用这一点来减小上界。
{"title":"Additional findings on S-parameter bounds valid for unconditionally stable N-ports","authors":"Sergio Colangeli,&nbsp;Antonio Serino,&nbsp;Walter Ciccognani,&nbsp;Patrick E. Longhi,&nbsp;Ernesto Limiti","doi":"10.1002/jnm.3211","DOIUrl":"10.1002/jnm.3211","url":null,"abstract":"<p>In a recent paper, it has been shown that, if an <i>N</i>-port network fulfills the condition of (geometrical) unconditional stability at a given frequency, then its scattering parameters will also necessarily satisfy <i>N</i> easily computable bounds, one per port. In order to complete that picture, this contribution investigates whether a tighter bound can be obtained by combining the <math>\u0000 <semantics>\u0000 <mrow>\u0000 <mi>N</mi>\u0000 </mrow>\u0000 <annotation>$$ N $$</annotation>\u0000 </semantics></math> bounds into just one. The answer is in general negative, except that the 3-port case does indeed exhibit a peculiar behavior: this can be exploited to reduce the upper bound when the diagonal elements of the scattering matrix are limited in magnitude up to some <math>\u0000 <semantics>\u0000 <mrow>\u0000 <mi>α</mi>\u0000 </mrow>\u0000 <annotation>$$ alpha $$</annotation>\u0000 </semantics></math>, and in particular for <math>\u0000 <semantics>\u0000 <mrow>\u0000 <mi>α</mi>\u0000 <mo>=</mo>\u0000 <mn>0</mn>\u0000 </mrow>\u0000 <annotation>$$ alpha =0 $$</annotation>\u0000 </semantics></math> (simultaneous conjugate match).</p>","PeriodicalId":50300,"journal":{"name":"International Journal of Numerical Modelling-Electronic Networks Devices and Fields","volume":null,"pages":null},"PeriodicalIF":1.6,"publicationDate":"2024-01-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139516667","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Analytical modeling of recessed double gate junctionless field-effect-transistor in subthreshold region 亚阈值区凹陷双栅极无结场效应晶体管的分析建模
IF 1.6 4区 工程技术 Q2 Mathematics Pub Date : 2024-01-18 DOI: 10.1002/jnm.3209
Sandeep Kumar, Arun Kumar Chatterjee, Rishikesh Pandey

In this work, we have presented an analytical model for a recently proposed symmetrical recessed double gate junctionless field-effect transistor (R_DGJLFET) operating in subthreshold region. The model has been developed by solving a two-dimensional Poisson's equation in three continuous rectangular silicon regions, resulting in explicit expressions for surface potential, center potential, and eventually the subthreshold drain current. The model provides deeper physical insights by successfully incorporating the effect of various design parameters such as doping concentration, gate length, gate work function, and effective oxide thickness on the subthreshold drain current. Moreover, the effect of variations in gate length on the subthreshold slope has also been presented. The model results have been validated with the simulation results obtained from the Silvaco Atlas tool and found reasonably close.

在这项研究中,我们提出了一种最近提出的在亚阈值区工作的对称凹陷双栅无结场效应晶体管(R_DGJLFET)的分析模型。该模型是通过求解三个连续矩形硅区域中的二维泊松方程建立的,从而得到了表面电势、中心电势以及最终的次阈值漏极电流的明确表达式。该模型成功地结合了各种设计参数,如掺杂浓度、栅极长度、栅极功函数和有效氧化物厚度对亚阈值漏极电流的影响,从而提供了更深入的物理洞察力。此外,还介绍了栅极长度变化对亚阈值斜率的影响。模型结果与 Silvaco Atlas 工具获得的模拟结果进行了验证,发现两者相当接近。
{"title":"Analytical modeling of recessed double gate junctionless field-effect-transistor in subthreshold region","authors":"Sandeep Kumar,&nbsp;Arun Kumar Chatterjee,&nbsp;Rishikesh Pandey","doi":"10.1002/jnm.3209","DOIUrl":"https://doi.org/10.1002/jnm.3209","url":null,"abstract":"<p>In this work, we have presented an analytical model for a recently proposed symmetrical recessed double gate junctionless field-effect transistor (R_DGJLFET) operating in subthreshold region. The model has been developed by solving a two-dimensional Poisson's equation in three continuous rectangular silicon regions, resulting in explicit expressions for surface potential, center potential, and eventually the subthreshold drain current. The model provides deeper physical insights by successfully incorporating the effect of various design parameters such as doping concentration, gate length, gate work function, and effective oxide thickness on the subthreshold drain current. Moreover, the effect of variations in gate length on the subthreshold slope has also been presented. The model results have been validated with the simulation results obtained from the Silvaco Atlas tool and found reasonably close.</p>","PeriodicalId":50300,"journal":{"name":"International Journal of Numerical Modelling-Electronic Networks Devices and Fields","volume":null,"pages":null},"PeriodicalIF":1.6,"publicationDate":"2024-01-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139494570","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Design of low-voltage low-noise operational transconductance amplifiers for low frequency applications 为低频应用设计低压低噪声运算跨导放大器
IF 1.6 4区 工程技术 Q2 Mathematics Pub Date : 2024-01-15 DOI: 10.1002/jnm.3212
Kulbhushan Sharma, Ayush Kumar, Jaya Madan, Rahul Pandey

Low-noise and low-voltage operation is prime requirement of an operational transconductance amplifier for low frequency applications. However, achieving low-noise operation at low supply voltages is a challenging task in CMOS technology owing to noise-power and noise-stability tradeoffs. This article outlines, the design of four differential bias self-cascode (DBSC) operational transconductance amplifiers (OTAs) working at ±0.7 V. The four design techniques namely gate driven (GD), bulk driven (BD), bulk driven quasi-floating gate (BDQFG), and gate driven quasi floating bulk (GDQFB) have been applied on DBSC OTAs. The designing aspects and performance parameters of these four OTAs such as gain, gain-bandwidth, input referred noise (IRN), settling time (ST), common mode rejection ratio (CMRR), total harmonic distortion, input impedance, transconductance, power consumption, area consumption and process/mismatch variations have been fairly compared in this work. These DBSC OTAs have been designed and simulated using a standard 0.18-μm 6M1P CMOS N-well process. The results infer GD DBSC OTA shows high CMRR of 125.83 dB. While the BD DBSC OTA consumes very low power of 0.2 μW. The BDQFG DBSC OTA shows low 1% ST of 24.83 μS. The GDQFB DBSC OTA show high transconductance (2.35 mS), high gain (64.97 dB), and low IRN (0.40 μV/√Hz at 10 Hz). The theoretical predictions for these OTAs agree with the post-layout simulations. The proposed OTAs can be used for designing various analog circuits such as programmable gain amplifiers, variable gain amplifiers, and transimpedance amplifiers for low-frequency biomedical and health care applications.

低噪声和低电压工作是低频应用对运算跨导放大器的首要要求。然而,在 CMOS 技术中,由于噪声功率和噪声稳定性的权衡,在低电源电压下实现低噪声工作是一项具有挑战性的任务。本文概述了工作电压为 ±0.7 V 的四个差分偏置自级联(DBSC)运算跨导放大器(OTA)的设计。在 DBSC OTA 上应用了四种设计技术,即栅极驱动 (GD)、散装驱动 (BD)、散装驱动准浮动栅极 (BDQFG) 和栅极驱动准浮动散装 (GDQFB)。在这项工作中,对这四种 OTA 的设计方面和性能参数(如增益、增益带宽、输入参考噪声 (IRN)、沉淀时间 (ST)、共模抑制比 (CMRR)、总谐波失真、输入阻抗、跨导、功耗、面积消耗和工艺/错配变化)进行了公平的比较。这些 DBSC OTA 采用标准 0.18-μm 6M1P CMOS N 孔工艺进行设计和仿真。结果表明,GD DBSC OTA 的 CMRR 高达 125.83 dB。BD DBSC OTA 的功耗非常低,仅为 0.2 μW。BDQFG DBSC OTA 显示出 24.83 μS 的低 1% ST。GDQFB DBSC OTA 显示出高跨导(2.35 mS)、高增益(64.97 dB)和低 IRN(10 Hz 时为 0.40 μV/√Hz)。这些 OTA 的理论预测结果与布局后模拟结果一致。所提出的 OTA 可用于设计各种模拟电路,如可编程增益放大器、可变增益放大器和跨阻抗放大器,以满足低频生物医学和保健应用的需要。
{"title":"Design of low-voltage low-noise operational transconductance amplifiers for low frequency applications","authors":"Kulbhushan Sharma,&nbsp;Ayush Kumar,&nbsp;Jaya Madan,&nbsp;Rahul Pandey","doi":"10.1002/jnm.3212","DOIUrl":"https://doi.org/10.1002/jnm.3212","url":null,"abstract":"<p>Low-noise and low-voltage operation is prime requirement of an operational transconductance amplifier for low frequency applications. However, achieving low-noise operation at low supply voltages is a challenging task in CMOS technology owing to noise-power and noise-stability tradeoffs. This article outlines, the design of four differential bias self-cascode (DBSC) operational transconductance amplifiers (OTAs) working at ±0.7 V. The four design techniques namely gate driven (GD), bulk driven (BD), bulk driven quasi-floating gate (BDQFG), and gate driven quasi floating bulk (GDQFB) have been applied on DBSC OTAs. The designing aspects and performance parameters of these four OTAs such as gain, gain-bandwidth, input referred noise (<i>IRN</i>), settling time (ST), common mode rejection ratio (CMRR), total harmonic distortion, input impedance, transconductance, power consumption, area consumption and process/mismatch variations have been fairly compared in this work. These DBSC OTAs have been designed and simulated using a standard 0.18-μm 6M1P CMOS N-well process. The results infer GD DBSC OTA shows high CMRR of 125.83 dB. While the BD DBSC OTA consumes very low power of 0.2 μW. The BDQFG DBSC OTA shows low 1% ST of 24.83 μS. The GDQFB DBSC OTA show high transconductance (2.35 mS), high gain (64.97 dB), and low <i>IRN</i> (0.40 μV/√Hz at 10 Hz). The theoretical predictions for these OTAs agree with the post-layout simulations. The proposed OTAs can be used for designing various analog circuits such as programmable gain amplifiers, variable gain amplifiers, and transimpedance amplifiers for low-frequency biomedical and health care applications.</p>","PeriodicalId":50300,"journal":{"name":"International Journal of Numerical Modelling-Electronic Networks Devices and Fields","volume":null,"pages":null},"PeriodicalIF":1.6,"publicationDate":"2024-01-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139474055","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Fractional order capacitance behavior due to hysteresis effect of ferroelectric material on GaN HEMT devices GaN HEMT 器件上的铁电材料滞后效应导致的分数阶电容行为
IF 1.6 4区 工程技术 Q2 Mathematics Pub Date : 2024-01-15 DOI: 10.1002/jnm.3206
Dariskhem Pyngrope, Shubhankar Majumdar, Giovanni Crupi

In recent years, gallium nitride (GaN) high electron mobility transistors (HEMTs) have come to the forefront of the semiconductor industry because of their exceptional performance in both high-power and high-frequency utility. Accurate capacitance modeling is crucial to optimize performance and facilitate energy-efficient electronic circuit design. In order to reflect the complex nature of the aluminum scandium nitride (AlScN) gate capacitance in GaN HEMTs this study investigates the use of the unique Grünwald-Letnikov model based on fractional order calculus. The proposed model presents a powerful approach to accurately characterize capacitance since fractional order derivatives allow modeling of non-integer order systems. Quantitative assessment of the Grünwald-Letnikov model's accuracy is performed through various error metrics, including mean absolute error (MAE), root mean square error (RMSE), maximum percentage error (MPE), mean absolute percentage error (MAPE), and mean squared error (MSE), by comparing the model's predictions to experimental data. Notably, this model demonstrates remarkable consistency in error metrics, with maximum values of MPE = 0.21%, MAE = 0.05%, MAPE = 0.33%, MSE = 0.01%, and RMSE = 0.09% for the forward scan, and MPE = 0.32%, MAE = 0.04%, MAPE = 0.39%, MSE = 0.01%, and RMSE = 0.08% for the backward scan. These metrics affirm the model's precision in capturing the nuanced capacitance characteristics of GaN HEMT devices. Hence, herein for the first time, the novel Grünwald-Letnikov model, augmented by fractional order calculus, proves to be a robust tool for accurately characterizing GaN HEMT capacitance. Its ability to seamlessly account for the complexities introduced by using ferroelectric material highlights its potential for advancing semiconductor design and optimizing device performance.

近年来,氮化镓(GaN)高电子迁移率晶体管(HEMT)因其在大功率和高频率应用方面的卓越性能而跻身半导体行业的前沿。准确的电容建模对于优化性能和促进高能效电子电路设计至关重要。为了反映氮化镓 HEMT 中氮化铝钪(AlScN)栅电容的复杂性质,本研究调查了基于分数阶微积分的独特 Grünwald-Letnikov 模型的使用情况。由于分数阶导数可对非整数阶系统进行建模,因此所提出的模型为准确表征电容提供了一种强有力的方法。通过将模型的预测结果与实验数据进行比较,利用各种误差指标(包括平均绝对误差 (MAE)、均方根误差 (RMSE)、最大百分比误差 (MPE)、平均绝对百分比误差 (MAPE) 和均方误差 (MSE))对 Grünwald-Letnikov 模型的准确性进行了定量评估。值得注意的是,该模型在误差指标上表现出显著的一致性,前向扫描的最大值为 MPE = 0.21%、MAE = 0.05%、MAPE = 0.33%、MSE = 0.01% 和 RMSE = 0.09%,后向扫描的最大值为 MPE = 0.32%、MAE = 0.04%、MAPE = 0.39%、MSE = 0.01% 和 RMSE = 0.08%。这些指标肯定了模型在捕捉 GaN HEMT 器件细微电容特性方面的精确性。因此,通过分数阶微积分增强的新型 Grünwald-Letnikov 模型首次被证明是精确描述 GaN HEMT 电容特性的可靠工具。该模型能够无缝地解释使用铁电材料所带来的复杂性,凸显了它在推进半导体设计和优化器件性能方面的潜力。
{"title":"Fractional order capacitance behavior due to hysteresis effect of ferroelectric material on GaN HEMT devices","authors":"Dariskhem Pyngrope,&nbsp;Shubhankar Majumdar,&nbsp;Giovanni Crupi","doi":"10.1002/jnm.3206","DOIUrl":"https://doi.org/10.1002/jnm.3206","url":null,"abstract":"<p>In recent years, gallium nitride (GaN) high electron mobility transistors (HEMTs) have come to the forefront of the semiconductor industry because of their exceptional performance in both high-power and high-frequency utility. Accurate capacitance modeling is crucial to optimize performance and facilitate energy-efficient electronic circuit design. In order to reflect the complex nature of the aluminum scandium nitride (AlScN) gate capacitance in GaN HEMTs this study investigates the use of the unique Grünwald-Letnikov model based on fractional order calculus. The proposed model presents a powerful approach to accurately characterize capacitance since fractional order derivatives allow modeling of non-integer order systems. Quantitative assessment of the Grünwald-Letnikov model's accuracy is performed through various error metrics, including mean absolute error (MAE), root mean square error (RMSE), maximum percentage error (MPE), mean absolute percentage error (MAPE), and mean squared error (MSE), by comparing the model's predictions to experimental data. Notably, this model demonstrates remarkable consistency in error metrics, with maximum values of MPE = 0.21%, MAE = 0.05%, MAPE = 0.33%, MSE = 0.01%, and RMSE = 0.09% for the forward scan, and MPE = 0.32%, MAE = 0.04%, MAPE = 0.39%, MSE = 0.01%, and RMSE = 0.08% for the backward scan. These metrics affirm the model's precision in capturing the nuanced capacitance characteristics of GaN HEMT devices. Hence, herein for the first time, the novel Grünwald-Letnikov model, augmented by fractional order calculus, proves to be a robust tool for accurately characterizing GaN HEMT capacitance. Its ability to seamlessly account for the complexities introduced by using ferroelectric material highlights its potential for advancing semiconductor design and optimizing device performance.</p>","PeriodicalId":50300,"journal":{"name":"International Journal of Numerical Modelling-Electronic Networks Devices and Fields","volume":null,"pages":null},"PeriodicalIF":1.6,"publicationDate":"2024-01-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139474039","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Adaptation and comparative analysis of HSPICE level-61 and level-62 model for a-IGZO thin film transistors 针对 a-IGZO 薄膜晶体管的 HSPICE 61 级和 62 级模型的调整和比较分析
IF 1.6 4区 工程技术 Q2 Mathematics Pub Date : 2024-01-15 DOI: 10.1002/jnm.3210
Divya Dubey, Manish Goswami, Kavindra Kandpal

This paper presents a Computer-aided design (CAD) model for a-IGZO thin film transistors (TFTs) by adapting SPICE level-61 RPI a-Si: H (Hydrogenated Amorphous Silicon) TFT model and level-62 RPI Poly-Si (Poly Silicon) TFT model. This work provides a complete understanding of SPICE level-61 and 62 model parameters, which must be tuned for a-IGZO TFT simulation. The adapted SPICE models of level-61 and level-62 could model all regions of operation of the TFT, that is, above-threshold and below-threshold regions. Adapted RPI poly-Si model also shows the kink effect in ZnO thin film transistors (TFTs) due to the recombination of electron–hole pairs in the channel via boundary trap states present in the poly-Si TFTs thereby increasing the drain current in the transistors above pinch-off region. The extracted performance parameters of the adapted models were found to be contiguous with experimental results. The maximum deviation in the subthreshold slope is approximately 5 mV/decade for level-61 a-Si TFT, and for level-62 poly-Si TFT, deviation in the subthreshold slope is even less, that is, 0.2 mV/decade. The experimental and simulated characteristics, extracted on-to-off ratio, negative bias reverse saturation current, and threshold voltage were almost similar. However, an average deviation of 2.4% and 2.27% was observed in the output characteristics of the adapted level-61 and level-62 models, respectively.

本文通过调整 SPICE 第 61 级 RPI a-Si:H(氢化非晶硅)TFT 模型和第 62 级 RPI Poly-Si(多晶硅)TFT 模型,提出了 a-IGZO 薄膜晶体管(TFT)的计算机辅助设计(CAD)模型。这项工作提供了对 SPICE 第 61 级和第 62 级模型参数的完整理解,这些参数必须在 a-IGZO TFT 仿真中进行调整。调整后的 SPICE 61 级和 62 级模型可模拟 TFT 的所有工作区域,即阈值以上和阈值以下区域。调整后的 RPI 多晶硅模型还显示了氧化锌薄膜晶体管(TFT)中的扭结效应,这是由于电子-空穴对通过多晶硅 TFT 中存在的边界陷阱态在沟道中重组,从而增加了晶体管中掐断区以上的漏极电流。经调整的模型提取的性能参数与实验结果一致。对于 61 级 a-Si TFT,次阈值斜率的最大偏差约为 5 mV/decade,而对于 62 级多晶硅 TFT,次阈值斜率的偏差更小,仅为 0.2 mV/decade。实验和模拟特性、提取的导通与关断比、负偏压反向饱和电流和阈值电压几乎相似。不过,经调整的 61 级和 62 级模型的输出特性平均偏差分别为 2.4% 和 2.27%。
{"title":"Adaptation and comparative analysis of HSPICE level-61 and level-62 model for a-IGZO thin film transistors","authors":"Divya Dubey,&nbsp;Manish Goswami,&nbsp;Kavindra Kandpal","doi":"10.1002/jnm.3210","DOIUrl":"https://doi.org/10.1002/jnm.3210","url":null,"abstract":"<p>This paper presents a Computer-aided design (CAD) model for a-IGZO thin film transistors (TFTs) by adapting SPICE level-61 RPI a-Si: H (Hydrogenated Amorphous Silicon) TFT model and level-62 RPI Poly-Si (Poly Silicon) TFT model. This work provides a complete understanding of SPICE level-61 and 62 model parameters, which must be tuned for a-IGZO TFT simulation. The adapted SPICE models of level-61 and level-62 could model all regions of operation of the TFT, that is, above-threshold and below-threshold regions. Adapted RPI poly-Si model also shows the kink effect in ZnO thin film transistors (TFTs) due to the recombination of electron–hole pairs in the channel via boundary trap states present in the poly-Si TFTs thereby increasing the drain current in the transistors above pinch-off region. The extracted performance parameters of the adapted models were found to be contiguous with experimental results. The maximum deviation in the subthreshold slope is approximately 5 mV/decade for level-61 a-Si TFT, and for level-62 poly-Si TFT, deviation in the subthreshold slope is even less, that is, 0.2 mV/decade. The experimental and simulated characteristics, extracted on-to-off ratio, negative bias reverse saturation current, and threshold voltage were almost similar. However, an average deviation of 2.4% and 2.27% was observed in the output characteristics of the adapted level-61 and level-62 models, respectively.</p>","PeriodicalId":50300,"journal":{"name":"International Journal of Numerical Modelling-Electronic Networks Devices and Fields","volume":null,"pages":null},"PeriodicalIF":1.6,"publicationDate":"2024-01-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139474054","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Design and simulation of a germanium source dual-metal dopingless tunnel FET as a label-free biosensor 设计和模拟作为无标记生物传感器的锗源双金属无掺杂隧道场效应晶体管
IF 1.6 4区 工程技术 Q2 Mathematics Pub Date : 2024-01-15 DOI: 10.1002/jnm.3208
Sidhartha Dash, Shwetapadma Panda

This study presents a new dual-metal dopingless tunnel field effect transistor with a Germanium source (GeS-DM-DLT) for label-free biomolecule detection. Introducing a Ge source and dual-metal gate provides improved drain current. We have considered an L-shaped cavity at the top and bottom source metal region for investigating the sensitivity. The biosensor's sensitivity has been measured using the neutral biomolecules' dielectric constants (varying the k-values in the cavity). The sensor's DC performance is investigated using transfer characteristics, BTBT rate, energy band, and electric field variation for different k-values. The sensitivity performance of the proposed biosensor is evaluated in terms of different DC parameters (drain current, surface potential, subthreshold swing, interband tunneling rate, electric field) and RF parameters (parasitic capacitance, transconductance, cut-off frequency, maximum frequency). The suggested biosensor offers a much-improved SON of 9.86 × 108 and SRATIO of 1.94 × 104 for a dielectric constant of 22.0 at room temperature. Further research has been done to study the effects of dielectric materials, interface trap carriers (ITC), and temperature on drain current, drain current sensitivity, and other sensitivity parameters. The article also includes investigating the influence of the fill factor on sensitivity performance. The GeS-DM-DLT sensor performs best in fully-filled conditions compared to the partially-filled condition inside the cavity region.

本研究提出了一种带有锗源的新型双金属无掺杂隧道场效应晶体管(GeS-DM-DLT),用于无标记生物分子检测。引入锗源和双金属栅极可改善漏极电流。为了研究灵敏度,我们考虑在源金属区域的顶部和底部设计一个 L 形空腔。利用中性生物分子的介电常数(改变空腔中的 k 值)测量了生物传感器的灵敏度。传感器的直流性能通过不同 k 值下的传输特性、BTBT 率、能带和电场变化进行了研究。根据不同的直流参数(漏极电流、表面电位、阈下摆动、带间隧道率、电场)和射频参数(寄生电容、跨导、截止频率、最大频率),对所建议的生物传感器的灵敏度性能进行了评估。在室温下,介电常数为 22.0 时,建议的生物传感器的 SON 和 SRATIO 分别为 9.86 × 108 和 1.94 × 104。研究人员还进一步研究了介电材料、界面阱载流子 (ITC) 和温度对漏极电流、漏极电流灵敏度和其他灵敏度参数的影响。文章还包括研究填充因子对灵敏度性能的影响。与空腔区域内的部分填充条件相比,GeS-DM-DLT 传感器在完全填充条件下性能最佳。
{"title":"Design and simulation of a germanium source dual-metal dopingless tunnel FET as a label-free biosensor","authors":"Sidhartha Dash,&nbsp;Shwetapadma Panda","doi":"10.1002/jnm.3208","DOIUrl":"https://doi.org/10.1002/jnm.3208","url":null,"abstract":"<p>This study presents a new dual-metal dopingless tunnel field effect transistor with a Germanium source (GeS-DM-DLT) for label-free biomolecule detection. Introducing a Ge source and dual-metal gate provides improved drain current. We have considered an L-shaped cavity at the top and bottom source metal region for investigating the sensitivity. The biosensor's sensitivity has been measured using the neutral biomolecules' dielectric constants (varying the k-values in the cavity). The sensor's DC performance is investigated using transfer characteristics, BTBT rate, energy band, and electric field variation for different k-values. The sensitivity performance of the proposed biosensor is evaluated in terms of different DC parameters (drain current, surface potential, subthreshold swing, interband tunneling rate, electric field) and RF parameters (parasitic capacitance, transconductance, cut-off frequency, maximum frequency). The suggested biosensor offers a much-improved S<sub>ON</sub> of 9.86 × 10<sup>8</sup> and S<sub>RATIO</sub> of 1.94 × 10<sup>4</sup> for a dielectric constant of 22.0 at room temperature. Further research has been done to study the effects of dielectric materials, interface trap carriers (ITC), and temperature on drain current, drain current sensitivity, and other sensitivity parameters. The article also includes investigating the influence of the fill factor on sensitivity performance. The GeS-DM-DLT sensor performs best in fully-filled conditions compared to the partially-filled condition inside the cavity region.</p>","PeriodicalId":50300,"journal":{"name":"International Journal of Numerical Modelling-Electronic Networks Devices and Fields","volume":null,"pages":null},"PeriodicalIF":1.6,"publicationDate":"2024-01-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139473818","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Automatic multi-objective particle swarm optimization method for effective Doherty power amplifier design 多目标粒子群自动优化法用于有效设计 Doherty 功率放大器
IF 1.6 4区 工程技术 Q2 Mathematics Pub Date : 2024-01-11 DOI: 10.1002/jnm.3204
Zefang Hao, Yan Qu, Jiajun Huang, Giovanni Crupi, Jialin Cai

In this paper, an automatic multi-objective particle swarm optimization (AMOPSO) method is developed for the design of Doherty power amplifiers (DPAs). In comparison to the well-known built-in optimizer available in commercial simulators, the proposed method not only reduces the optimization time, but also provides superior power added efficiency (PAE) for the final power amplifier. According to the reported measurements, the output PAE of the fabricated DPA exceeds 50% at 6 dB backoff, the saturated PAE is more than 61%, and the saturated output power (Pout) is over 43 dBm in the target frequency range of 1.9–2.1 GHz. As compared with existing optimization methods, the proposed method allows reducing optimization time by more than 37%.

本文针对多尔蒂功率放大器(DPA)的设计开发了一种自动多目标粒子群优化(AMOPSO)方法。与商业模拟器中众所周知的内置优化器相比,所提出的方法不仅缩短了优化时间,还为最终功率放大器提供了出色的功率附加效率(PAE)。根据所报告的测量结果,在 6 dB 回退时,所制造 DPA 的输出 PAE 超过 50%,饱和 PAE 超过 61%,在 1.9-2.1 GHz 目标频率范围内,饱和输出功率 (Pout) 超过 43 dBm。与现有的优化方法相比,所提出的方法可将优化时间缩短 37% 以上。
{"title":"Automatic multi-objective particle swarm optimization method for effective Doherty power amplifier design","authors":"Zefang Hao,&nbsp;Yan Qu,&nbsp;Jiajun Huang,&nbsp;Giovanni Crupi,&nbsp;Jialin Cai","doi":"10.1002/jnm.3204","DOIUrl":"https://doi.org/10.1002/jnm.3204","url":null,"abstract":"<p>In this paper, an automatic multi-objective particle swarm optimization (AMOPSO) method is developed for the design of Doherty power amplifiers (DPAs). In comparison to the well-known built-in optimizer available in commercial simulators, the proposed method not only reduces the optimization time, but also provides superior power added efficiency (PAE) for the final power amplifier. According to the reported measurements, the output PAE of the fabricated DPA exceeds 50% at 6 dB backoff, the saturated PAE is more than 61%, and the saturated output power (Pout) is over 43 dBm in the target frequency range of 1.9–2.1 GHz. As compared with existing optimization methods, the proposed method allows reducing optimization time by more than 37%.</p>","PeriodicalId":50300,"journal":{"name":"International Journal of Numerical Modelling-Electronic Networks Devices and Fields","volume":null,"pages":null},"PeriodicalIF":1.6,"publicationDate":"2024-01-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139419589","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Incorporating DC bias voltage in poly-harmonic distortion modeling for RF power GaN transistors 在射频功率氮化镓晶体管的多谐失真建模中加入直流偏置电压
IF 1.6 4区 工程技术 Q2 Mathematics Pub Date : 2024-01-11 DOI: 10.1002/jnm.3201
Shuhao Cheng, Xiaoqiang Tang, Zlatica Marinković, Giovanni Crupi, Jialin Cai

This paper presents a novel poly-harmonic distortion (PHD) model that incorporates the DC input and output bias voltages using Gaussian process regression (GPR). Simulation tests were conducted using a 10-W gallium nitride (GaN) HEMT transistor from Wolfspeed, and the model implementation test was performed in the Keysight Advanced Design System environment. The results showed that the GPR-based PHD model exhibited good performance in predicting both fundamental and harmonic behaviors over a wide range of bias variations with significant advantages over basic linear regression methods. Additionally, the model accurately predicted load-pull simulations. The measurement test was conducted using a 6-W GaN device, and the results showed a mean error of 2.22% and 4.54% for the fundamental and second harmonic of the reflected wave, respectively.

本文介绍了一种新型多谐波失真 (PHD) 模型,该模型利用高斯过程回归 (GPR) 将直流输入和输出偏置电压纳入其中。仿真测试使用 Wolfspeed 公司的 10 瓦氮化镓(GaN)HEMT 晶体管进行,模型实施测试在 Keysight 高级设计系统环境中进行。结果表明,与基本的线性回归方法相比,基于 GPR 的 PHD 模型在预测宽偏压变化范围内的基波和谐波行为方面具有显著优势。此外,该模型还能准确预测负载拉动模拟。测量测试使用了一个 6 瓦 GaN 器件,结果显示反射波的基波和二次谐波的平均误差分别为 2.22% 和 4.54%。
{"title":"Incorporating DC bias voltage in poly-harmonic distortion modeling for RF power GaN transistors","authors":"Shuhao Cheng,&nbsp;Xiaoqiang Tang,&nbsp;Zlatica Marinković,&nbsp;Giovanni Crupi,&nbsp;Jialin Cai","doi":"10.1002/jnm.3201","DOIUrl":"https://doi.org/10.1002/jnm.3201","url":null,"abstract":"<p>This paper presents a novel poly-harmonic distortion (PHD) model that incorporates the DC input and output bias voltages using Gaussian process regression (GPR). Simulation tests were conducted using a 10-W gallium nitride (GaN) HEMT transistor from Wolfspeed, and the model implementation test was performed in the Keysight Advanced Design System environment. The results showed that the GPR-based PHD model exhibited good performance in predicting both fundamental and harmonic behaviors over a wide range of bias variations with significant advantages over basic linear regression methods. Additionally, the model accurately predicted load-pull simulations. The measurement test was conducted using a 6-W GaN device, and the results showed a mean error of 2.22% and 4.54% for the fundamental and second harmonic of the reflected wave, respectively.</p>","PeriodicalId":50300,"journal":{"name":"International Journal of Numerical Modelling-Electronic Networks Devices and Fields","volume":null,"pages":null},"PeriodicalIF":1.6,"publicationDate":"2024-01-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139419590","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Data-driven model-free modified nodal analysis circuit solver 数据驱动的无模型修正节点分析电路求解器
IF 1.6 4区 工程技术 Q2 Mathematics Pub Date : 2024-01-10 DOI: 10.1002/jnm.3205
Armin Galetzka, Dimitrios Loukrezis, Herbert De Gersem

This work introduces a novel data-driven model-free modified nodal analysis (MNA) circuit solver. The solver is capable of handling circuit problems featuring elements for which solely measurement data are available. Rather than utilizing hard-coded phenomenological model representations, the data-driven MNA solver reformulates the circuit problem such that the solution is found by minimizing the distance between circuit states that fulfill Kirchhoff's laws, and states belonging to the measurement data. In this way, the formerly inevitable demand for model representations is eliminated, thus avoiding the introduction of related modeling errors and uncertainties. The proposed solver is applied to linear and nonlinear RC-circuits and to a half-wave rectifier.

这项工作介绍了一种新型的数据驱动无模型修正节点分析(MNA)电路求解器。该求解器能够处理仅有测量数据的电路问题。数据驱动的 MNA 求解器不使用硬编码的现象学模型表示法,而是重新表述电路问题,通过最小化符合基尔霍夫定律的电路状态与属于测量数据的状态之间的距离来求解。这样,以前不可避免的模型表征需求就被消除了,从而避免了相关建模误差和不确定性的引入。所提出的求解器适用于线性和非线性 RC 电路以及半波整流器。
{"title":"Data-driven model-free modified nodal analysis circuit solver","authors":"Armin Galetzka,&nbsp;Dimitrios Loukrezis,&nbsp;Herbert De Gersem","doi":"10.1002/jnm.3205","DOIUrl":"https://doi.org/10.1002/jnm.3205","url":null,"abstract":"<p>This work introduces a novel data-driven model-free modified nodal analysis (MNA) circuit solver. The solver is capable of handling circuit problems featuring elements for which solely measurement data are available. Rather than utilizing hard-coded phenomenological model representations, the data-driven MNA solver reformulates the circuit problem such that the solution is found by minimizing the distance between circuit states that fulfill Kirchhoff's laws, and states belonging to the measurement data. In this way, the formerly inevitable demand for model representations is eliminated, thus avoiding the introduction of related modeling errors and uncertainties. The proposed solver is applied to linear and nonlinear RC-circuits and to a half-wave rectifier.</p>","PeriodicalId":50300,"journal":{"name":"International Journal of Numerical Modelling-Electronic Networks Devices and Fields","volume":null,"pages":null},"PeriodicalIF":1.6,"publicationDate":"2024-01-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1002/jnm.3205","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139419652","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
期刊
International Journal of Numerical Modelling-Electronic Networks Devices and Fields
全部 Acc. Chem. Res. ACS Applied Bio Materials ACS Appl. Electron. Mater. ACS Appl. Energy Mater. ACS Appl. Mater. Interfaces ACS Appl. Nano Mater. ACS Appl. Polym. Mater. ACS BIOMATER-SCI ENG ACS Catal. ACS Cent. Sci. ACS Chem. Biol. ACS Chemical Health & Safety ACS Chem. Neurosci. ACS Comb. Sci. ACS Earth Space Chem. ACS Energy Lett. ACS Infect. Dis. ACS Macro Lett. ACS Mater. Lett. ACS Med. Chem. Lett. ACS Nano ACS Omega ACS Photonics ACS Sens. ACS Sustainable Chem. Eng. ACS Synth. Biol. Anal. Chem. BIOCHEMISTRY-US Bioconjugate Chem. BIOMACROMOLECULES Chem. Res. Toxicol. Chem. Rev. Chem. Mater. CRYST GROWTH DES ENERG FUEL Environ. Sci. Technol. Environ. Sci. Technol. Lett. Eur. J. Inorg. Chem. IND ENG CHEM RES Inorg. Chem. J. Agric. Food. Chem. J. Chem. Eng. Data J. Chem. Educ. J. Chem. Inf. Model. J. Chem. Theory Comput. J. Med. Chem. J. Nat. Prod. J PROTEOME RES J. Am. Chem. Soc. LANGMUIR MACROMOLECULES Mol. Pharmaceutics Nano Lett. Org. Lett. ORG PROCESS RES DEV ORGANOMETALLICS J. Org. Chem. J. Phys. Chem. J. Phys. Chem. A J. Phys. Chem. B J. Phys. Chem. C J. Phys. Chem. Lett. Analyst Anal. Methods Biomater. Sci. Catal. Sci. Technol. Chem. Commun. Chem. Soc. Rev. CHEM EDUC RES PRACT CRYSTENGCOMM Dalton Trans. Energy Environ. Sci. ENVIRON SCI-NANO ENVIRON SCI-PROC IMP ENVIRON SCI-WAT RES Faraday Discuss. Food Funct. Green Chem. Inorg. Chem. Front. Integr. Biol. J. Anal. At. Spectrom. J. Mater. Chem. A J. Mater. Chem. B J. Mater. Chem. C Lab Chip Mater. Chem. Front. Mater. Horiz. MEDCHEMCOMM Metallomics Mol. Biosyst. Mol. Syst. Des. Eng. Nanoscale Nanoscale Horiz. Nat. Prod. Rep. New J. Chem. Org. Biomol. Chem. Org. Chem. Front. PHOTOCH PHOTOBIO SCI PCCP Polym. Chem.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1