Pub Date : 2026-02-02DOI: 10.1134/S1063783425602887
Budumuru Iswarya Rani, M N V Ramesh, D Venkatesh, T Durga Rao, K.V. Ramesh
Lead-free 0.7BiFeO3–0.3(BaTi1–xCexO3) ceramics with compositions of (x = 0, 0.01, 0.03, 0.05, and 0.07) were produced using a conventional solid-state reaction method. X-ray diffraction analysis was performed to examine the crystal structure and phases of the samples, verifying the rhombohedral perovskite structure of the compound. The lattice parameter and unit cell volume varied with the addition of Ce ions. Temperature and frequency variation impedance spectroscopic studies confirmed that the relaxation time and impedance real and imaginary parts decreased with increasing temperature, suggesting a normal conductive nature of the samples. The resistance values for both the grain and grain boundary followed a similar trend as the temperature varied. As the Ce doping level increased, the resistance within the grains surpassed that of the grain boundaries in all the samples. This is indicated by the reduction in the activation energy (Eτ) of the Ce-doped sample. The electric modulus and AC conductivity studies also followed a trend similar to that of the impedance studies. These studies confirm that the 0.7BiFeO3–0.3(BaTi1–xCexO3) sample is suitable for relaxor applications.
{"title":"Structural and Impedance Characteristics of BiFeO3–BaTiO3 Multiferroics with Substitution of CeO2 for Relaxor Applications","authors":"Budumuru Iswarya Rani, M N V Ramesh, D Venkatesh, T Durga Rao, K.V. Ramesh","doi":"10.1134/S1063783425602887","DOIUrl":"10.1134/S1063783425602887","url":null,"abstract":"<p>Lead-free 0.7BiFeO<sub>3</sub>–0.3(BaTi<sub>1–<i>x</i></sub>Ce<sub><i>x</i></sub>O<sub>3</sub>) ceramics with compositions of (<i>x</i> = 0, 0.01, 0.03, 0.05, and 0.07) were produced using a conventional solid-state reaction method. X-ray diffraction analysis was performed to examine the crystal structure and phases of the samples, verifying the rhombohedral perovskite structure of the compound. The lattice parameter and unit cell volume varied with the addition of Ce ions. Temperature and frequency variation impedance spectroscopic studies confirmed that the relaxation time and impedance real and imaginary parts decreased with increasing temperature, suggesting a normal conductive nature of the samples. The resistance values for both the grain and grain boundary followed a similar trend as the temperature varied. As the Ce doping level increased, the resistance within the grains surpassed that of the grain boundaries in all the samples. This is indicated by the reduction in the activation energy (<i>E</i><sub>τ</sub>) of the Ce-doped sample. The electric modulus and AC conductivity studies also followed a trend similar to that of the impedance studies. These studies confirm that the 0.7BiFeO<sub>3</sub>–0.3(BaTi<sub>1–<i>x</i></sub>Ce<sub><i>x</i></sub>O<sub>3</sub>) sample is suitable for relaxor applications.</p>","PeriodicalId":731,"journal":{"name":"Physics of the Solid State","volume":"68 1","pages":"83 - 94"},"PeriodicalIF":1.8,"publicationDate":"2026-02-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146099229","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-12-01DOI: 10.1134/S1063783425602085
T. K. Liang, J. Y. Li, R. Y. Zhang, B. H. Zhang, Y. Chen, G. J. Yin, S. L. Chi, Q. Q. Zhang, F. Y. Guo, Y. C. Hu, Y. Zhang, X. W. Wang
Researches on Ba0.85Ca0.15Zr0.1Ti0.9O3 (BCZT) ceramics revealed that their low energy storage density and efficiency limit their applications. This study prepared (1–x)Ba0.85Ca0.15Zr0.1Ti0.9O3–xBi(Mg0.5Ti0.5)O3 (abbreviated as (1–x)BCZT–xBMT, x = 0, 0.01, 0.05, 0.07, and 0.1) ceramics using the solid-state method. We looked closely at how the degree of BMT doping affected the BCZT ceramics’ structures and characteristics. The results indicate that all samples with different compositions exhibit the pure phase and dense microstructures. The doping with BMT significantly improves both energy storage efficiency and density. 0.93BCZT-0.07BMT ceramics achieve an efficiency of 65.9% and an energy storage density of 1.09 J/cm3. The improvement in energy storage performances can be attributed to appropriate BMT doping, which densifies the system, refines grain size and facilitates the transition of the system from ferroelectric to relaxor ferroelectric.
对Ba0.85Ca0.15Zr0.1Ti0.9O3 (BCZT)陶瓷的研究表明,其低储能密度和效率限制了其应用。本研究采用固态法制备了(1-x) Ba0.85Ca0.15Zr0.1Ti0.9O3-xBi (Mg0.5Ti0.5)O3(简称为(1-x) BCZT-xBMT, x = 0、0.01、0.05、0.07、0.1)陶瓷。我们仔细观察了BMT掺杂程度如何影响BCZT陶瓷的结构和特性。结果表明,不同成分的样品均表现出纯净的相和致密的显微组织。BMT的掺杂显著提高了储能效率和储能密度。0.93BCZT-0.07BMT陶瓷的效率为65.9%,储能密度为1.09 J/cm3。储能性能的提高可归因于适当的BMT掺杂,使系统致密化,细化晶粒尺寸,促进系统从铁电向弛豫铁电转变。
{"title":"Preparation and Dielectric Properties of Bi(Mg0.5Ti0.5)O3 Ceramics Doped with Ba0.85Ca0.15Zr0.1Ti0.9O3","authors":"T. K. Liang, J. Y. Li, R. Y. Zhang, B. H. Zhang, Y. Chen, G. J. Yin, S. L. Chi, Q. Q. Zhang, F. Y. Guo, Y. C. Hu, Y. Zhang, X. W. Wang","doi":"10.1134/S1063783425602085","DOIUrl":"10.1134/S1063783425602085","url":null,"abstract":"<p>Researches on Ba<sub>0.85</sub>Ca<sub>0.15</sub>Zr<sub>0.1</sub>Ti<sub>0.9</sub>O<sub>3</sub> (BCZT) ceramics revealed that their low energy storage density and efficiency limit their applications. This study prepared (1–<i>x</i>)Ba<sub>0.85</sub>Ca<sub>0.15</sub>Zr<sub>0.1</sub>Ti<sub>0.9</sub>O<sub>3</sub>–<i>x</i>Bi(Mg<sub>0.5</sub>Ti<sub>0.5</sub>)O<sub>3</sub> (abbreviated as (1–<i>x</i>)BCZT–<i>x</i>BMT, <i>x</i> = 0, 0.01, 0.05, 0.07, and 0.1) ceramics using the solid-state method. We looked closely at how the degree of BMT doping affected the BCZT ceramics’ structures and characteristics. The results indicate that all samples with different compositions exhibit the pure phase and dense microstructures. The doping with BMT significantly improves both energy storage efficiency and density. 0.93BCZT-0.07BMT ceramics achieve an efficiency of 65.9% and an energy storage density of 1.09 J/cm<sup>3</sup>. The improvement in energy storage performances can be attributed to appropriate BMT doping, which densifies the system, refines grain size and facilitates the transition of the system from ferroelectric to relaxor ferroelectric.</p>","PeriodicalId":731,"journal":{"name":"Physics of the Solid State","volume":"67 12","pages":"1044 - 1054"},"PeriodicalIF":1.8,"publicationDate":"2025-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145625452","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-12-01DOI: 10.1134/S1063783425602310
Muzaffar Imam, Arun Kumar Singh, Md. Akram Ahmad
Developing efficient polycrystalline silicon (pc-Si) thin-film solar cells offers a promising route to reducing photovoltaic costs, but their performance is strongly constrained by carrier recombination. In this work, a two-dimensional device simulation is developed to analyse recombination mechanisms in pc-Si thin-film solar cells, incorporating Gaussian and tail-distributed donor- and acceptor-like traps for bulk recombination and delta-distributed traps for interface recombination. Both Shockley–Read–Hall (SRH) and auger recombination, along with interface recombination, are examined in detail. Results show that increasing defect density enhances both SRH and auger recombination, with SRH dominating below emitter doping densities of 1016 cm–3 and auger recombination prevailing above this level; however, SRH remains dominant across absorber defect densities from 1014 to 1019 cm–3. Interface trap densities between 1011 and 1013 cm–2 are found to significantly degrade performance, underscoring the need for bulk and interface trap passivation. Device performance metrics; short-circuit current density (JSC), open-circuit voltage (VOC), fill factor (FF), and efficiency are further evaluated against variations in absorber bandgap, absorber thickness, and emitter doping concentration. For an optimized absorber thickness of 3 μm, absorber bandgap of 1.3 eV, emitter doping of 1018 cm–3, and interface trap density of 1012 cm–2, the model predicts a maximum efficiency of ~9.6%. The developed model is in good agreement with reported experimental results.
{"title":"Investigation of Carrier Recombination in Polycrystalline Silicon Thin-Film Solar Cells","authors":"Muzaffar Imam, Arun Kumar Singh, Md. Akram Ahmad","doi":"10.1134/S1063783425602310","DOIUrl":"10.1134/S1063783425602310","url":null,"abstract":"<p>Developing efficient polycrystalline silicon (pc-Si) thin-film solar cells offers a promising route to reducing photovoltaic costs, but their performance is strongly constrained by carrier recombination. In this work, a two-dimensional device simulation is developed to analyse recombination mechanisms in pc-Si thin-film solar cells, incorporating Gaussian and tail-distributed donor- and acceptor-like traps for bulk recombination and delta-distributed traps for interface recombination. Both Shockley–Read–Hall (SRH) and auger recombination, along with interface recombination, are examined in detail. Results show that increasing defect density enhances both SRH and auger recombination, with SRH dominating below emitter doping densities of 10<sup>16</sup> cm<sup>–3</sup> and auger recombination prevailing above this level; however, SRH remains dominant across absorber defect densities from 10<sup>14</sup> to 10<sup>19</sup> cm<sup>–3</sup>. Interface trap densities between 10<sup>11</sup> and 10<sup>13</sup> cm<sup>–2</sup> are found to significantly degrade performance, underscoring the need for bulk and interface trap passivation. Device performance metrics; short-circuit current density (<i>J</i><sub>SC</sub>), open-circuit voltage (<i>V</i><sub>OC</sub>), fill factor (FF), and efficiency are further evaluated against variations in absorber bandgap, absorber thickness, and emitter doping concentration. For an optimized absorber thickness of 3 μm, absorber bandgap of 1.3 eV, emitter doping of 10<sup>18</sup> cm<sup>–3</sup>, and interface trap density of 10<sup>12</sup> cm<sup>–2</sup>, the model predicts a maximum efficiency of ~9.6%. The developed model is in good agreement with reported experimental results.</p>","PeriodicalId":731,"journal":{"name":"Physics of the Solid State","volume":"67 12","pages":"1098 - 1110"},"PeriodicalIF":1.8,"publicationDate":"2025-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145625509","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-12-01DOI: 10.1134/S1063783425603030
N. S. Solovyev, A. V. Lukoyanov
Many Heusler alloys are half-metals because of the band structure with one of the spin projections insulating and another one being metallic that provides a possibility for 100% spin-polarized current. We present the first-principles calculations of the electronic structure and magnetic properties of M-n2Co1‒xNixSn Heusler alloys for x = 0–1. The alloys crystallize in the XA-type Heusler structure. For x = 0, Mn2CoSn is found to be a half-metal with a band gap of less than 1 eV in the majority spin direction, thus the spin-polarization of current is almost full. The other compositions are found to be metallic in the density of states with spin polarization near 0.3. The presence of Ni in Mn2Co1–xNixSn Heusler alloys results in the band gap shift to the lower energies. In Mn2CoSn, the total magnetic moment equal to 3 µB satisfies the Slater–Pauling rule. With the increasing nickel concentration, the total magnetic moment decreases, however, the magnetic moment of all Mn ions become large. The Mn–Co–Ni-based alloys are promising for spintronic applications due to the high spin polarization and composition-dependent total magnetic moment.
{"title":"First-Principles Study of Magnetic and Half-Metallic Properties of Mn2Co1–xNixSn Alloys with Spin Polarization","authors":"N. S. Solovyev, A. V. Lukoyanov","doi":"10.1134/S1063783425603030","DOIUrl":"10.1134/S1063783425603030","url":null,"abstract":"<p>Many Heusler alloys are half-metals because of the band structure with one of the spin projections insulating and another one being metallic that provides a possibility for 100% spin-polarized current. We present the first-principles calculations of the electronic structure and magnetic properties of M-n<sub>2</sub>Co<sub>1‒<i>x</i></sub>Ni<sub><i>x</i></sub>Sn Heusler alloys for <i>x</i> = 0–1. The alloys crystallize in the XA-type Heusler structure. For <i>x</i> = 0, Mn<sub>2</sub>CoSn is found to be a half-metal with a band gap of less than 1 eV in the majority spin direction, thus the spin-polarization of current is almost full. The other compositions are found to be metallic in the density of states with spin polarization near 0.3. The presence of Ni in Mn<sub>2</sub>Co<sub>1–<i>x</i></sub>Ni<sub><i>x</i></sub>Sn Heusler alloys results in the band gap shift to the lower energies. In Mn<sub>2</sub>CoSn, the total magnetic moment equal to 3 µ<sub>B</sub> satisfies the Slater–Pauling rule. With the increasing nickel concentration, the total magnetic moment decreases, however, the magnetic moment of all Mn ions become large. The Mn–Co–Ni-based alloys are promising for spintronic applications due to the high spin polarization and composition-dependent total magnetic moment.</p>","PeriodicalId":731,"journal":{"name":"Physics of the Solid State","volume":"67 12","pages":"1055 - 1066"},"PeriodicalIF":1.8,"publicationDate":"2025-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145625475","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
This paper investigates the DC characteristics of a two-dimensional (2D) analytical model of AlGaN/GaN High Electron Mobility Transistor (HEMT), based on the solution of Poisson’s equation and incorporating the effects of spontaneous (({{P}_{{text{S}}}}_{{text{P}}})) and piezoelectric (({{P}_{{{text{PZ}}}}})) polarization. The behaviour of the sheet carrier density (({{n}_{s}})) is studied using a non-linear model of the Fermi level, and the two-dimensional electron gas (2DEG) current–voltage characteristics incorporate the effects of velocity saturation, field-dependent mobility, and parasitic resistances. Additionally, variations in the threshold voltage (({{V}_{{{text{th}}}}})) and ({{n}_{s}}) are examined in relation to barrier thickness (({{d}_{{{text{AlGaN}}}}})), aluminum mole fraction (n), and the doping density (({{N}_{{text{D}}}})) of the barrier layer. In predicting the 2DEG density and ({{V}_{{{text{th}}}}}) with varying n, ({{d}_{{{text{AlGaN}}}}}) and ND, both ({{P}_{{text{S}}}}_{{text{P}}}) and ({{P}_{{{text{PZ}}}}}) polarization effects were considered. The ({{n}_{s}}) increased with ({{d}_{{{text{AlGaN}}}}}), from 1.3 × 1013 cm–2 at 20 nm to 1.4 × 1013 cm–2 at 34 nm, while ({{V}_{{{text{th}}}}}) shifted negatively from –4.7 to –9.4 V due to reduced gate control at higher thickness. For n, ({{n}_{s}}) rose from 1.0 × 1013 to 1.7 × 1013 cm–2 as n increased from 0.20 to 0.30, with ({{V}_{{{text{th}}}}}) moving from –4.0 to –6.2 V, driven by enhanced polarization and carrier confinement. Similarly, increasing ({{N}_{{text{D}}}}) from 1 × 1018 to 6 × 1018 cm–3 elevated ({{n}_{s}}) from 1.3 × 1013 to 1.4 × 1013 cm–2 and shifted ({{V}_{{{text{th}}}}}) from –4.3 to ‒6.1 V, due to a higher supply of free electrons. The results obtained from this work closely match simulated data, confirming the validity of the model.
{"title":"Non-Linear Analytical Approach to Investigate Barrier Layer Parameter Effect on 2DEG and DC Characteristics in AlGaN/GaN HEMTs","authors":"Pichingla Kharei, Achinta Baidya, Niladri Pratap Maity, Abhijyoti Ghosh, Zonunmawii","doi":"10.1134/S1063783425603066","DOIUrl":"10.1134/S1063783425603066","url":null,"abstract":"<p>This paper investigates the DC characteristics of a two-dimensional (2D) analytical model of AlGaN/GaN High Electron Mobility Transistor (HEMT), based on the solution of Poisson’s equation and incorporating the effects of spontaneous <span>(({{P}_{{text{S}}}}_{{text{P}}}))</span> and piezoelectric <span>(({{P}_{{{text{PZ}}}}}))</span> polarization. The behaviour of the sheet carrier density <span>(({{n}_{s}}))</span> is studied using a non-linear model of the Fermi level, and the two-dimensional electron gas (2DEG) current–voltage characteristics incorporate the effects of velocity saturation, field-dependent mobility, and parasitic resistances. Additionally, variations in the threshold voltage <span>(({{V}_{{{text{th}}}}}))</span> and <span>({{n}_{s}})</span> are examined in relation to barrier thickness <span>(({{d}_{{{text{AlGaN}}}}}))</span>, aluminum mole fraction (<i>n</i>), and the doping density <span>(({{N}_{{text{D}}}}))</span> of the barrier layer. In predicting the 2DEG density and <span>({{V}_{{{text{th}}}}})</span> with varying <i>n</i>, <span>({{d}_{{{text{AlGaN}}}}})</span> and <i>N</i><sub>D</sub>, both <span>({{P}_{{text{S}}}}_{{text{P}}})</span> and <span>({{P}_{{{text{PZ}}}}})</span> polarization effects were considered. The <span>({{n}_{s}})</span> increased with <span>({{d}_{{{text{AlGaN}}}}})</span>, from 1.3 × 10<sup>13</sup> cm<sup>–2</sup> at 20 nm to 1.4 × 10<sup>13</sup> cm<sup>–2</sup> at 34 nm, while <span>({{V}_{{{text{th}}}}})</span> shifted negatively from –4.7 to –9.4 V due to reduced gate control at higher thickness. For <i>n</i>, <span>({{n}_{s}})</span> rose from 1.0 × 10<sup>13</sup> to 1.7 × 10<sup>13</sup> cm<sup>–2</sup> as <i>n</i> increased from 0.20 to 0.30, with <span>({{V}_{{{text{th}}}}})</span> moving from –4.0 to –6.2 V, driven by enhanced polarization and carrier confinement. Similarly, increasing <span>({{N}_{{text{D}}}})</span> from 1 × 10<sup>18</sup> to 6 × 10<sup>18</sup> cm<sup>–3</sup> elevated <span>({{n}_{s}})</span> from 1.3 × 10<sup>13</sup> to 1.4 × 10<sup>13</sup> cm<sup>–2</sup> and shifted <span>({{V}_{{{text{th}}}}})</span> from –4.3 to ‒6.1 V, due to a higher supply of free electrons. The results obtained from this work closely match simulated data, confirming the validity of the model.</p>","PeriodicalId":731,"journal":{"name":"Physics of the Solid State","volume":"67 12","pages":"1135 - 1143"},"PeriodicalIF":1.8,"publicationDate":"2025-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145625454","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"","authors":"","doi":"","DOIUrl":"","url":null,"abstract":"","PeriodicalId":731,"journal":{"name":"Physics of the Solid State","volume":"67 12","pages":"1039 - 1043"},"PeriodicalIF":1.8,"publicationDate":"2025-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145625508","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-12-01DOI: 10.1134/S1063783425602875
S. Chelli, S. Touam, N. Mounis, F. Guenfoud, A. Douara, H. Meradji, S. Ghemid, R. Khenata, D. Singh, B. Ul Haq, S. Bin Omran
This study investigates the structural, electronic, elastic, and optical properties of YxB1–xAs ternary alloys using first-principles calculations based on the well-established full-potential linearized augmented plane-wave (FP-LAPW) method. The equilibrium structural, phase stability, and bulk moduli were analyzed in both zinc blende and NaCl structures. Results show that NaCl is the most stable structure for the YAs (x = 1) compound, while other compositions (x = 0, 0.25, 0.50, and 0.75) favor the zinc blende phase, indicating a phase transition near x ≈ 0.79. The electronic properties were predicted using the GGA and modified Becke–Johnson (mBJ) approximations, demonstrating a transition from semiconductor to metallic behavior as yttrium content increases. The alloys exhibit significant bowing in lattice constants and band gaps caused by lattice mismatch and electronic differences between the constituent binaries. Elastic constant calculations reveal a change in mechanical behavior with composition, emphasizing yttrium’s role in tuning the ductility of YxB1–xAs alloys. Optical properties such as the dielectric function, refractive index, and reflectivity were also examined, showing strong composition-dependent behavior. These findings provide insights for tailoring the properties of YxB1–xAs compounds for potential optoelectronic applications.
{"title":"Ab-Initio Analysis of the Structural, Electronic, Elastic, and Optical Characteristics of YxB1–xAs Alloys Using the FP-LAPW Approach","authors":"S. Chelli, S. Touam, N. Mounis, F. Guenfoud, A. Douara, H. Meradji, S. Ghemid, R. Khenata, D. Singh, B. Ul Haq, S. Bin Omran","doi":"10.1134/S1063783425602875","DOIUrl":"10.1134/S1063783425602875","url":null,"abstract":"<p>This study investigates the structural, electronic, elastic, and optical properties of Y<sub><i>x</i></sub>B<sub>1–<i>x</i></sub>As ternary alloys using first-principles calculations based on the well-established full-potential linearized augmented plane-wave (FP-LAPW) method. The equilibrium structural, phase stability, and bulk moduli were analyzed in both zinc blende and NaCl structures. Results show that NaCl is the most stable structure for the YAs (<i>x</i> = 1) compound, while other compositions (<i>x</i> = 0, 0.25, 0.50, and 0.75) favor the zinc blende phase, indicating a phase transition near <i>x</i> ≈ 0.79. The electronic properties were predicted using the GGA and modified Becke–Johnson (mBJ) approximations, demonstrating a transition from semiconductor to metallic behavior as yttrium content increases. The alloys exhibit significant bowing in lattice constants and band gaps caused by lattice mismatch and electronic differences between the constituent binaries. Elastic constant calculations reveal a change in mechanical behavior with composition, emphasizing yttrium’s role in tuning the ductility of Y<sub><i>x</i></sub>B<sub>1–<i>x</i></sub>As alloys. Optical properties such as the dielectric function, refractive index, and reflectivity were also examined, showing strong composition-dependent behavior. These findings provide insights for tailoring the properties of Y<sub><i>x</i></sub>B<sub>1–<i>x</i></sub>As compounds for potential optoelectronic applications.</p>","PeriodicalId":731,"journal":{"name":"Physics of the Solid State","volume":"67 12","pages":"1120 - 1134"},"PeriodicalIF":1.8,"publicationDate":"2025-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145625451","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-12-01DOI: 10.1134/S1063783425601225
Elkenany Brens Elkenany, Hasan B. Albargi, R. Dhahri
The pseudo-potential approach (EPM) in the virtual crystal approximation (VCA) is used to estimate the mechanical and lattice dynamic properties of GaAs1–xPx alloys as a function of temperature. The results show a generally good agreement with the experimental data, which are available only for the binary compounds of interest. These results include the elastic constants, bulk modulus, Young’s modulus, shear modulus, bond bending constant, bond stretching constant, and sound velocity. Our findings show that the investigated alloy achieves mechanical stability at various temperatures. To the best of our knowledge, no previous research of this type has been reported for GaAs1–xPx alloys under temperature effects. According to the results, the alloy under investigation may provide a greater range of possibilities for obtaining the required properties with the right temperature setting, which would make it easier to create new materials with the required properties.
{"title":"Mechanical Stability, Elastic, and Lattice Vibrational Properties of GaAs1–xPx under the Effect of Temperature","authors":"Elkenany Brens Elkenany, Hasan B. Albargi, R. Dhahri","doi":"10.1134/S1063783425601225","DOIUrl":"10.1134/S1063783425601225","url":null,"abstract":"<p>The pseudo-potential approach (EPM) in the virtual crystal approximation (VCA) is used to estimate the mechanical and lattice dynamic properties of GaAs<sub>1–<i>x</i></sub>P<sub><i>x</i></sub> alloys as a function of temperature. The results show a generally good agreement with the experimental data, which are available only for the binary compounds of interest. These results include the elastic constants, bulk modulus, Young’s modulus, shear modulus, bond bending constant, bond stretching constant, and sound velocity. Our findings show that the investigated alloy achieves mechanical stability at various temperatures. To the best of our knowledge, no previous research of this type has been reported for GaAs<sub>1–<i>x</i></sub>P<sub><i>x</i></sub> alloys under temperature effects. According to the results, the alloy under investigation may provide a greater range of possibilities for obtaining the required properties with the right temperature setting, which would make it easier to create new materials with the required properties.</p>","PeriodicalId":731,"journal":{"name":"Physics of the Solid State","volume":"67 12","pages":"1087 - 1097"},"PeriodicalIF":1.8,"publicationDate":"2025-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145625474","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-12-01DOI: 10.1134/S1063783425603534
T. Isac-Gutul, I. B. Boris
Kinetic regularities of hydroxychloroquine sulfate (HCQ) degradation in an aqueous medium during UV radiation and also in the presence of an oxidizer in the UV/HCQ/H2O2 system and a catalyst in the photo-Fenton system are established. The degree of degradation for 1 h of irradiation is found to reach up to 50.4% in the dependence on the concentration prepared. The kinetics of HCQ degradation follows the kinetics of pseudo-monomolecular reaction. The calculated reaction rate constants vary in the range of (0.4‒8.4) × 10–3 min–1. The degree of drug degradation in the presence of H2O2 reaches 78.9% at optimal conditions ([Н2О2] = 85 mg/L, t = 25°C, λ = 220 nm, pH = 4.5). During the degradation in the photo-Fenton system, the dependence of the reaction rate on molar [H2O2]/[Fe2+] ratio is also studied. The study revealed that, in the concentration range ([Fe2+] = 0.28–1.12 mg/L, [H2O2] = 85 mg/L, t = 25°C, λ = 220 nm, the optimal [H2O2]/[Fe2+] ratio = 80 at pH = 4.5, and the degree of hydroxychloroquine sulfate degradation in the photo-Fenton system is 86.1%. The apparent reaction rate constants calculated at various [H2O2]/[Fe2+] ratios from 1 : 50 to 1 : 200 have values in the range of (4.1–5.5) × 10–2 min–1.
{"title":"Kinetics of Hydroxychloroquine Sulfate Degradation in a Photo-Fenton System","authors":"T. Isac-Gutul, I. B. Boris","doi":"10.1134/S1063783425603534","DOIUrl":"10.1134/S1063783425603534","url":null,"abstract":"<p>Kinetic regularities of hydroxychloroquine sulfate (HCQ) degradation in an aqueous medium during UV radiation and also in the presence of an oxidizer in the UV/HCQ/H<sub>2</sub>O<sub>2</sub> system and a catalyst in the photo-Fenton system are established. The degree of degradation for 1 h of irradiation is found to reach up to 50.4% in the dependence on the concentration prepared. The kinetics of HCQ degradation follows the kinetics of pseudo-monomolecular reaction. The calculated reaction rate constants vary in the range of (0.4‒8.4) × 10<sup>–3</sup> min<sup>–1</sup>. The degree of drug degradation in the presence of H<sub>2</sub>O<sub>2</sub> reaches 78.9% at optimal conditions ([Н<sub>2</sub>О<sub>2</sub>] = 85 mg/L, <i>t</i> = 25°C, λ = 220 nm, pH = 4.5). During the degradation in the photo-Fenton system, the dependence of the reaction rate on molar [H<sub>2</sub>O<sub>2</sub>]/[Fe<sup>2+</sup>] ratio is also studied. The study revealed that, in the concentration range ([Fe<sup>2+</sup>] = 0.28–1.12 mg/L, [H<sub>2</sub>O<sub>2</sub>] = 85 mg/L, <i>t</i> = 25°C, λ = 220 nm, the optimal [H<sub>2</sub>O<sub>2</sub>]/[Fe<sup>2+</sup>] ratio = 80 at pH = 4.5, and the degree of hydroxychloroquine sulfate degradation in the photo-Fenton system is 86.1%. The apparent reaction rate constants calculated at various [H<sub>2</sub>O<sub>2</sub>]/[Fe<sup>2+</sup>] ratios from 1 : 50 to 1 : 200 have values in the range of (4.1–5.5) × 10<sup>–2</sup> min<sup>–1</sup>.</p>","PeriodicalId":731,"journal":{"name":"Physics of the Solid State","volume":"67 12","pages":"1067 - 1075"},"PeriodicalIF":1.8,"publicationDate":"2025-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145625507","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-12-01DOI: 10.1134/S1063783425602723
M. F. Khurshid, M. Zeeshan, S. Kousar, M. Mahmood, M. A. Kalyar, A. Ali
Zinc oxide (ZnO) thin films are known for their remarkable optical and electrical properties, m-aking them highly suitable for a wide range of applications in electronics, optoelectronics, and sensing devices (detectors). The current research carried out a detailed study on the deposition and characterization of zinc oxide thin films using the pulsed laser deposition (PLD) technique on two different substrates: silicon (p‑type) and glass (amorphous). Depositions were carried out at a base pressure of (8 times {{10}^{{ - 6}}}) mbar in a vacuum, and in an oxygen environment at a pressure of (1.5 times {{10}^{{ - 1}}}) mbar. A solid ZnO target was ablated using the third harmonics (355 nm) of a Q-switched Nd:YAG laser operated at a laser pulse energy of 38 mJ with a corresponding laser fluence of 47 J/cm2. Substrate temperature was maintained at 500°C for a deposition time of 40 min. The structural, morphological, optical, and electrical properties of the thin films were investigated using X-ray diffraction (XRD), scanning electron microscopy (SEM), Fourier transform infrared spectroscopy (FTIR), Raman spectroscopy, and the four-probe method. The thin film grown in an oxygen environment on the silicon substrate shows the best crystalline structure, while both thin films grown in a vacuum exhibit an amorphous nature. Electrical characterization performed using the four-probe method revealed a decrease in resistivity with increasing temperature for all deposited films; however, the thin film grown on a glass substrate in an oxygen atmosphere exhibited comparatively higher resistivity.
氧化锌(ZnO)薄膜以其卓越的光学和电性能而闻名,使其非常适合广泛应用于电子,光电子和传感器件(探测器)。目前的研究使用脉冲激光沉积(PLD)技术在两种不同的衬底:硅(p型)和玻璃(非晶)上进行了氧化锌薄膜沉积和表征的详细研究。沉积是在真空中(8 times {{10}^{{ - 6}}})毫巴的基本压力下进行的,在氧气环境中(1.5 times {{10}^{{ - 1}}})毫巴的压力。采用调q Nd:YAG激光器,激光脉冲能量为38 mJ,激光能量为47 J/cm2,三次谐波(355nm)烧蚀固体ZnO靶。衬底温度保持在500℃,沉积时间为40 min。采用x射线衍射(XRD)、扫描电镜(SEM)、傅里叶变换红外光谱(FTIR)、拉曼光谱和四探针法对薄膜的结构、形态、光学和电学性能进行了研究。在氧气环境下生长的薄膜在硅衬底上表现出最佳的晶体结构,而在真空环境下生长的薄膜都表现出非晶性质。使用四探针方法进行的电学表征表明,所有沉积膜的电阻率随温度升高而降低;然而,在氧气气氛下生长在玻璃衬底上的薄膜表现出相对较高的电阻率。
{"title":"Structural, Morphological, and Electrical Properties of Zinc Oxide Thin Films Grown by Pulsed Laser Deposition","authors":"M. F. Khurshid, M. Zeeshan, S. Kousar, M. Mahmood, M. A. Kalyar, A. Ali","doi":"10.1134/S1063783425602723","DOIUrl":"10.1134/S1063783425602723","url":null,"abstract":"<p>Zinc oxide (ZnO) thin films are known for their remarkable optical and electrical properties, m-aking them highly suitable for a wide range of applications in electronics, optoelectronics, and sensing devices (detectors). The current research carried out a detailed study on the deposition and characterization of zinc oxide thin films using the pulsed laser deposition (PLD) technique on two different substrates: silicon (<i>p</i>‑type) and glass (amorphous). Depositions were carried out at a base pressure of <span>(8 times {{10}^{{ - 6}}})</span> mbar in a vacuum, and in an oxygen environment at a pressure of <span>(1.5 times {{10}^{{ - 1}}})</span> mbar. A solid ZnO target was ablated using the third harmonics (355 nm) of a Q-switched Nd:YAG laser operated at a laser pulse energy of 38 mJ with a corresponding laser fluence of 47 J/cm<sup>2</sup>. Substrate temperature was maintained at 500°C for a deposition time of 40 min. The structural, morphological, optical, and electrical properties of the thin films were investigated using X-ray diffraction (XRD), scanning electron microscopy (SEM), Fourier transform infrared spectroscopy (FTIR), Raman spectroscopy, and the four-probe method. The thin film grown in an oxygen environment on the silicon substrate shows the best crystalline structure, while both thin films grown in a vacuum exhibit an amorphous nature. Electrical characterization performed using the four-probe method revealed a decrease in resistivity with increasing temperature for all deposited films; however, the thin film grown on a glass substrate in an oxygen atmosphere exhibited comparatively higher resistivity.</p>","PeriodicalId":731,"journal":{"name":"Physics of the Solid State","volume":"67 12","pages":"1111 - 1119"},"PeriodicalIF":1.8,"publicationDate":"2025-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145625510","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}