Pub Date : 2024-08-07DOI: 10.1134/S1063783424600699
S. Rouag, D. Amari
The full potential linearized augmented plane wave (FP-LAPW) method, employing density functional theory (DFT) within the generalized gradient approximation (GGA), is utilized to investigate the structural, electronic and magnetic characteristics of the rare earth element based Pr2CoX (X = Al, Ga, In) full Heusler compounds. The results indicate that, at the equilibrium volume, the Hg2CuTi-type structure is energetically more stable than the Cu2MnAl-type structure for Pr2CoX (X = Al, Ga, In). The electronic band structure of Pr2CoX (X = Al, Ga, In) reveals an indirect band gap with the minority spin, suggesting half-metallic behavior. The calculations of magnetic properties affirm the half-metallic nature of these compounds, with total magnetic moment of 3.99 μB.
{"title":"Theoretical Calculation of the Structural, Electronic, and Magnetic Properties of a New Rare-Earth Based Full Heusler Alloys Pr2CoZ (Z = Al, Ga, In)","authors":"S. Rouag, D. Amari","doi":"10.1134/S1063783424600699","DOIUrl":"10.1134/S1063783424600699","url":null,"abstract":"<p>The full potential linearized augmented plane wave (FP-LAPW) method, employing density functional theory (DFT) within the generalized gradient approximation (GGA), is utilized to investigate the structural, electronic and magnetic characteristics of the rare earth element based Pr<sub>2</sub>CoX (X = Al, Ga, In) full Heusler compounds. The results indicate that, at the equilibrium volume, the Hg<sub>2</sub>CuTi-type structure is energetically more stable than the Cu<sub>2</sub>MnAl-type structure for Pr<sub>2</sub>CoX (X = Al, Ga, In). The electronic band structure of Pr<sub>2</sub>CoX (X = Al, Ga, In) reveals an indirect band gap with the minority spin, suggesting half-metallic behavior. The calculations of magnetic properties affirm the half-metallic nature of these compounds, with total magnetic moment of 3.99 μB.</p>","PeriodicalId":731,"journal":{"name":"Physics of the Solid State","volume":"66 6","pages":"176 - 183"},"PeriodicalIF":0.9,"publicationDate":"2024-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141948045","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
In this paper, we delved into the intricacies of In0.17Al0.83N/GaN high-electron-mobility transistors (HEMTs) using a comprehensive simulation model and by Leveraging the capabilities of Nextnano simulation software. We extensively explored how different thicknesses of the AlN buffer layer impact electronic and electrical properties. Our study was centered on scrutinizing the density and mobility of the two-dimensional electron gas (2-DEG) within the In0.17Al0.83N/GaN HEMT structure. Aiming to understand how different AlN buffer layer thicknesses impact device performance. Our findings unveil a crucial relationship between AlN buffer layer thickness and critical performance metrics. Specifically, we observed significant trends in output current and transconductance, shedding light on the direct influence of AlN thickness on device behavior. Our simulations identified an optimal AlN thickness of 350 nm, demonstrating the highest output current and surpassing a transconductance peak of 510 mS/mm. Importantly, our computational predictions closely align with experimental observations, validating the reliability and accuracy of our simulation model. Through this meticulous analysis, we contribute valuable insights that can guide the design and optimization of In0.17Al0.83N/GaN HEMT, paving the way for improved device performance and functionality across various electronic applications. Our study underscores the importance of considering AlN buffer layer thickness in designing and engineering high-performance HEMTs, highlighting avenues for future research and development in semiconductor device technology.
{"title":"Impact of AlN Buffer Layer Thickness on Electronic and Electrical Characteristics of In0.17Al0.83N/GaN High-Electron-Mobility Transistor","authors":"Abdelmalek Douara, Abdelaziz Rabehi, Mawloud Guermoui, Rania Daha, Imad Eddine Tibermacine","doi":"10.1134/S1063783424600766","DOIUrl":"10.1134/S1063783424600766","url":null,"abstract":"<p>In this paper, we delved into the intricacies of In<sub>0.17</sub>Al<sub>0.83</sub>N/GaN high-electron-mobility transistors (HEMTs) using a comprehensive simulation model and by Leveraging the capabilities of Nextnano simulation software. We extensively explored how different thicknesses of the AlN buffer layer impact electronic and electrical properties. Our study was centered on scrutinizing the density and mobility of the two-dimensional electron gas (2-DEG) within the In<sub>0.17</sub>Al<sub>0.83</sub>N/GaN HEMT structure. Aiming to understand how different AlN buffer layer thicknesses impact device performance. Our findings unveil a crucial relationship between AlN buffer layer thickness and critical performance metrics. Specifically, we observed significant trends in output current and transconductance, shedding light on the direct influence of AlN thickness on device behavior. Our simulations identified an optimal AlN thickness of 350 nm, demonstrating the highest output current and surpassing a transconductance peak of 510 mS/mm. Importantly, our computational predictions closely align with experimental observations, validating the reliability and accuracy of our simulation model. Through this meticulous analysis, we contribute valuable insights that can guide the design and optimization of In<sub>0.17</sub>Al<sub>0.83</sub>N/GaN HEMT, paving the way for improved device performance and functionality across various electronic applications. Our study underscores the importance of considering AlN buffer layer thickness in designing and engineering high-performance HEMTs, highlighting avenues for future research and development in semiconductor device technology.</p>","PeriodicalId":731,"journal":{"name":"Physics of the Solid State","volume":"66 6","pages":"157 - 164"},"PeriodicalIF":0.9,"publicationDate":"2024-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141948046","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-08-07DOI: 10.1134/S1063783424600663
Raghad K. Aljurays, Aicha Loucif
Triple perovskite La3Mn2FeO9 powder was synthesized via the sol gel method. The microstructural, morphological and magnetic features of the prepared perovskite sample were examined by means of X‑ray diffraction (XRD), filed-emission scanning electron microscopy (FE-SEM), and vibrating sample magnetometry (VSM). The XRD pattern was refined using the MAUD software based on the Rietveld program. The results confirmed that the sample crystallized in a trigonal structure, with a crystallite size measuring approximately 257 ± 5 nm and a microstrain of about 0.16%. The FE-SEM image revealed spherical like-particles with an average grain size in the vicinity of 514 nm. The VSM curve revealed that the prepared La3Mn2FeO9 powder exhibited a ferromagnetic behavior, and subsequent fitting using the law of approach to saturation revealed a saturation magnetization of 1.156438 ± 0.00384 emu/g.
{"title":"Microstructural, Morphological, and Magnetic Features of the Triple Perovskite Oxide La3Mn2FeO9","authors":"Raghad K. Aljurays, Aicha Loucif","doi":"10.1134/S1063783424600663","DOIUrl":"10.1134/S1063783424600663","url":null,"abstract":"<p>Triple perovskite La<sub>3</sub>Mn<sub>2</sub>FeO<sub>9</sub> powder was synthesized via the sol gel method. The microstructural, morphological and magnetic features of the prepared perovskite sample were examined by means of X‑ray diffraction (XRD), filed-emission scanning electron microscopy (FE-SEM), and vibrating sample magnetometry (VSM). The XRD pattern was refined using the MAUD software based on the Rietveld program. The results confirmed that the sample crystallized in a trigonal structure, with a crystallite size measuring approximately 257 ± 5 nm and a microstrain of about 0.16%. The FE-SEM image revealed spherical like-particles with an average grain size in the vicinity of 514 nm. The VSM curve revealed that the prepared La<sub>3</sub>Mn<sub>2</sub>FeO<sub>9</sub> powder exhibited a ferromagnetic behavior, and subsequent fitting using the law of approach to saturation revealed a saturation magnetization of 1.156438 ± 0.00384 emu/g.</p>","PeriodicalId":731,"journal":{"name":"Physics of the Solid State","volume":"66 6","pages":"165 - 168"},"PeriodicalIF":0.9,"publicationDate":"2024-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141948043","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-08-07DOI: 10.1134/S1063783424600857
Tuba Solakyildirim, Umit Alver
In this study, Zn1 –xFexS thin films were synthesized using the chemical spray pyrolysis technique at a substrate temperature of 450°C and with varying Fe concentrations. The spraying solution was prepared by combining distilled water with 0.05 M zinc chloride (ZnCl2), 0.05 M iron chloride (FeCl3⋅6H2O), and 0.2 M thiourea ((NH2)2CS). The initial solution was atomized onto heated glass substrates using an ultrasonic nebulizer operating at a frequency of 1.63 MHz and dry air. The morphology of the films was examined by scanning electron microscopy (SEM). The crystal structures were determined by X-ray diffraction analysis (XRD). The optical properties of the films were analyzed using a UV spectrometer. The energy band gap of the films was defined using the absorption spectrum.
摘要 本研究采用化学喷雾热解技术,在 450°C 的基底温度和不同的铁浓度下合成了 Zn1 - xFexS 薄膜。喷射溶液由蒸馏水与 0.05 M 氯化锌 (ZnCl2)、0.05 M 氯化铁 (FeCl3⋅6H2O) 和 0.2 M 硫脲 ((NH2)2CS)混合配制而成。使用频率为 1.63 MHz 的超声雾化器和干燥空气将初始溶液雾化到加热的玻璃基底上。薄膜的形态由扫描电子显微镜(SEM)进行检测。通过 X 射线衍射分析 (XRD) 确定了晶体结构。使用紫外光谱仪分析了薄膜的光学特性。利用吸收光谱确定了薄膜的能带隙。
{"title":"Production and Characterization of Zn1 – xFexS Thin Films by Ultrasonic Chemical Spray Deposition Technique","authors":"Tuba Solakyildirim, Umit Alver","doi":"10.1134/S1063783424600857","DOIUrl":"10.1134/S1063783424600857","url":null,"abstract":"<p>In this study, Zn<sub>1 –</sub> <sub><i>x</i></sub>Fe<sub><i>x</i></sub>S thin films were synthesized using the chemical spray pyrolysis technique at a substrate temperature of 450°C and with varying Fe concentrations. The spraying solution was prepared by combining distilled water with 0.05 M zinc chloride (ZnCl<sub>2</sub>), 0.05 M iron chloride (FeCl<sub>3</sub>⋅6H<sub>2</sub>O), and 0.2 M thiourea ((NH<sub>2</sub>)<sub>2</sub>CS). The initial solution was atomized onto heated glass substrates using an ultrasonic nebulizer operating at a frequency of 1.63 MHz and dry air. The morphology of the films was examined by scanning electron microscopy (SEM). The crystal structures were determined by X-ray diffraction analysis (XRD). The optical properties of the films were analyzed using a UV spectrometer. The energy band gap of the films was defined using the absorption spectrum.</p>","PeriodicalId":731,"journal":{"name":"Physics of the Solid State","volume":"66 6","pages":"169 - 175"},"PeriodicalIF":0.9,"publicationDate":"2024-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141948044","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
ZrTi alloys have potential applications in critical parts of spacecraft. As lightweight design is a fundamental requirement for spacecraft, incorporating light elements into ZrTi alloys is a feasible approach. In this paper, we investigated the tensile deformation behavior of ZrTi doped with light element by using the plane-wave pseudopotential density functional method. Covalent Ti–Zr bonds accommodate deformation by softening and breaking at large tensions, and structural stability of ZrTi and ZrTiX (X = B, Al, Ga, and V) is determined by the strength of these Ti–Zr bonds under tension. The results show that the lower doped concentrations of light element decrease the tensile strengths. However, there is no obvious difference in tensile strengths along [11(bar {2})0] direction between ZrTi and ZrTi0.875Al0.125. The results of Mulliken overlap populations indicate that different tensile strengths of ZrTiX should be resulted from different strengths of covalent Ti–Zr bonds. The incorporation of light element dopants does not strengthen all chemical bonds and weakens strengths of covalent Ti–Zr bonds, indicating that experimental strengthening mechanism of ternary ZrTiX alloys could be ascribed to Hall–Petch effect.
{"title":"First-Principles Study of Structural Stability and Tensile Strengths of Light-Element-Doped ZrTi","authors":"Shouxin Cui, Wenxia Feng, Bao Zhao, Guiqing Zhang, Feng Guo, Zengtao Lv","doi":"10.1134/S106378342460064X","DOIUrl":"10.1134/S106378342460064X","url":null,"abstract":"<p>ZrTi alloys have potential applications in critical parts of spacecraft. As lightweight design is a fundamental requirement for spacecraft, incorporating light elements into ZrTi alloys is a feasible approach. In this paper, we investigated the tensile deformation behavior of ZrTi doped with light element by using the plane-wave pseudopotential density functional method. Covalent Ti–Zr bonds accommodate deformation by softening and breaking at large tensions, and structural stability of ZrTi and ZrTiX (X = B, Al, Ga, and V) is determined by the strength of these Ti–Zr bonds under tension. The results show that the lower doped concentrations of light element decrease the tensile strengths. However, there is no obvious difference in tensile strengths along [11<span>(bar {2})</span>0] direction between ZrTi and ZrTi<sub>0.875</sub>Al<sub>0.125</sub>. The results of Mulliken overlap populations indicate that different tensile strengths of ZrTiX should be resulted from different strengths of covalent Ti–Zr bonds. The incorporation of light element dopants does not strengthen all chemical bonds and weakens strengths of covalent Ti–Zr bonds, indicating that experimental strengthening mechanism of ternary ZrTiX alloys could be ascribed to Hall–Petch effect.</p>","PeriodicalId":731,"journal":{"name":"Physics of the Solid State","volume":"66 5","pages":"129 - 138"},"PeriodicalIF":0.9,"publicationDate":"2024-07-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141741744","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-07-19DOI: 10.1134/S1063783424600559
Jizhen Hui, Anwar Hushur, Amat Hasan, Seiji Kojima, Abliz Mattursun
The temperature and pressure dependences of low-frequency Raman scattering were studied on structural phase transformations of Sr2Ta2O7 ceramics. The Raman spectrum was measured over a temperature range from 0 to –185°C. The temperature dependence of the Raman shift of a low-lying mode of the B1g symmetry shows at T = –110°C. This anomaly of Sr2Ta2O7 is related to a ferroelectric phase transition. During cooling, the peak width of the B1g mode shows a change at 150°C, and the temperature dependence of Raman shifts of B3g, and B1g modes becomes abnormal. Under high pressure, we discovered a phase transition between 4 and 5.5 GPa. Angle-dispersive X-ray diffraction data suggest the phase transition from incommensurate to commensurate states.
{"title":"Effect of Temperature and Pressure on Low-Frequency Raman Scattering from Strontium Tantalate Ceramic Material","authors":"Jizhen Hui, Anwar Hushur, Amat Hasan, Seiji Kojima, Abliz Mattursun","doi":"10.1134/S1063783424600559","DOIUrl":"10.1134/S1063783424600559","url":null,"abstract":"<p>The temperature and pressure dependences of low-frequency Raman scattering were studied on structural phase transformations of Sr<sub>2</sub>Ta<sub>2</sub>O<sub>7</sub> ceramics. The Raman spectrum was measured over a temperature range from 0 to –185°C. The temperature dependence of the Raman shift of a low-lying mode of the <i>B</i><sub>1<i>g</i></sub> symmetry shows at <i>T</i> = –110°C. This anomaly of Sr<sub>2</sub>Ta<sub>2</sub>O<sub>7</sub> is related to a ferroelectric phase transition. During cooling, the peak width of the <i>B</i><sub>1<i>g</i></sub> mode shows a change at 150°C, and the temperature dependence of Raman shifts of <i>B</i><sub>3<i>g</i></sub>, and <i>B</i><sub>1<i>g</i></sub> modes becomes abnormal. Under high pressure, we discovered a phase transition between 4 and 5.5 GPa. Angle-dispersive X-ray diffraction data suggest the phase transition from incommensurate to commensurate states.</p>","PeriodicalId":731,"journal":{"name":"Physics of the Solid State","volume":"66 5","pages":"121 - 128"},"PeriodicalIF":0.9,"publicationDate":"2024-07-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141741746","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-07-19DOI: 10.1134/S1063783424600730
B. Benabdelkrim, T. Ghaitaoui, B. Amrani, A. E. Ghaitaoui, I. Arbaoui
In this work, we present first-principles DFT calculations to predict the structural and electronic properties of HgX (X = S, Se, and Te) compounds. First-principles methods using the local density approximation (LDA) and generalized gradient approximation (GGA) lead to an underestimation of the band gap energy. The objective of this work is to use various exchange and correlation potentials (LDA, GGA-PBE, EVGGA, MBJGGA, MBJLDA, etc.) to determine the band gap energy and electronic properties. We show that the use of the modified Becke–Johnson (mBJ) approximation leads to very good agreement with the experimental band gap energies for mercury chalcogenides.
{"title":"Study of the Effect of Exchange and Correlation Potential on the Electronic Properties of Mercury Chalcogenides","authors":"B. Benabdelkrim, T. Ghaitaoui, B. Amrani, A. E. Ghaitaoui, I. Arbaoui","doi":"10.1134/S1063783424600730","DOIUrl":"10.1134/S1063783424600730","url":null,"abstract":"<p>In this work, we present first-principles DFT calculations to predict the structural and electronic properties of HgX (X = S, Se, and Te) compounds. First-principles methods using the local density approximation (LDA) and generalized gradient approximation (GGA) lead to an underestimation of the band gap energy. The objective of this work is to use various exchange and correlation potentials (LDA, GGA-PBE, EVGGA, MBJGGA, MBJLDA, etc.) to determine the band gap energy and electronic properties. We show that the use of the modified Becke–Johnson (mBJ) approximation leads to very good agreement with the experimental band gap energies for mercury chalcogenides.</p>","PeriodicalId":731,"journal":{"name":"Physics of the Solid State","volume":"66 5","pages":"139 - 148"},"PeriodicalIF":0.9,"publicationDate":"2024-07-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141741745","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-07-19DOI: 10.1134/S1063783424600602
K. Ben Abdelaziz, O. Soltani, M. Kanzari
In this work, we studied by simulation the performance of a cancer sensor based on 1D symmetrical photonic crystal. The proposal 1D photonic crystal structure is (AB)5C(BA)5 where A = TiO2 with high refractive index, B = SiO2 with low refractive index and layer C is a blood cell. The study was conducted using the Transfer Matrix method (TMM) method. So, the transmissions spectra, the sensitivity as well as the quality factor of the sensor for different blood cell samples including normal blood cells and various cancerous blood cells: Jurkat, HeLa, PC-12, MDA-MB-231, and MCF-7 were obtained. The obtained results have shown the improvement in the performance of the proposal 1D photonic crystal sensors, namely sensitivity and quality factor, as a function of the thickness of the sample layer C and the angle of incidence in case of the two polarization mode.
摘要 在这项工作中,我们通过仿真研究了基于一维对称光子晶体的癌症传感器的性能。提议的一维光子晶体结构为 (AB)5C(BA)5,其中 A = 高折射率的 TiO2,B = 低折射率的 SiO2,C 层为血细胞。研究采用传递矩阵法(TMM)进行。因此,传感器对不同血细胞样本(包括正常血细胞和各种癌血细胞)的透射光谱、灵敏度和品质因数都不同:这些血细胞包括:Jurkat、HeLa、PC-12、MDA-MB-231 和 MCF-7。结果表明,在双偏振模式下,随着样品层 C 厚度和入射角度的变化,所提出的一维光子晶体传感器的灵敏度和品质因数的性能都有所提高。
{"title":"Theoretical Study of Symmetrical 1D Photonic Crystal as a Blood Cancer Sensor","authors":"K. Ben Abdelaziz, O. Soltani, M. Kanzari","doi":"10.1134/S1063783424600602","DOIUrl":"10.1134/S1063783424600602","url":null,"abstract":"<p>In this work, we studied by simulation the performance of a cancer sensor based on 1D symmetrical photonic crystal. The proposal 1D photonic crystal structure is (AB)<sup>5</sup>C(BA)<sup>5</sup> where A = TiO<sub>2</sub> with high refractive index, B = SiO<sub>2</sub> with low refractive index and layer C is a blood cell. The study was conducted using the Transfer Matrix method (TMM) method. So, the transmissions spectra, the sensitivity as well as the quality factor of the sensor for different blood cell samples including normal blood cells and various cancerous blood cells: Jurkat, HeLa, PC-12, MDA-MB-231, and MCF-7 were obtained. The obtained results have shown the improvement in the performance of the proposal 1D photonic crystal sensors, namely sensitivity and quality factor, as a function of the thickness of the sample layer C and the angle of incidence in case of the two polarization mode.</p>","PeriodicalId":731,"journal":{"name":"Physics of the Solid State","volume":"66 5","pages":"149 - 156"},"PeriodicalIF":0.9,"publicationDate":"2024-07-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141741747","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-06-24DOI: 10.1134/S1063783423600061
Z. Yarar, M. D. Alyörük, H. C. Çekil, B. Özdemir, M. Özdemir
The electron mobility characteristics of a ZnMgO/ZnO heterostructure are systematically investigated by an ensemble Monte Carlo method. Screening effects are included in all electron scattering mechanisms. The mobilities are calculated for a temperature range of 4 to 300 K and Mg contents ranging from 8.5 to 44%. In this range, dislocation scattering (DS) and interface roughness scattering (IFR) are highly effective for low and high values of Mg compositions, respectively. Screening effects must be considered in scattering mechanisms to achieve a reasonable agreement with existing experimental results. Our findings could be significant for the design and optimization of ZnO-based devices.
{"title":"Mobility Characteristics of ZnMgO/ZnO Heterostructures with Screening Effects","authors":"Z. Yarar, M. D. Alyörük, H. C. Çekil, B. Özdemir, M. Özdemir","doi":"10.1134/S1063783423600061","DOIUrl":"10.1134/S1063783423600061","url":null,"abstract":"<p>The electron mobility characteristics of a ZnMgO/ZnO heterostructure are systematically investigated by an ensemble Monte Carlo method. Screening effects are included in all electron scattering mechanisms. The mobilities are calculated for a temperature range of 4 to 300 K and Mg contents ranging from 8.5 to 44%. In this range, dislocation scattering (DS) and interface roughness scattering (IFR) are highly effective for low and high values of Mg compositions, respectively. Screening effects must be considered in scattering mechanisms to achieve a reasonable agreement with existing experimental results. Our findings could be significant for the design and optimization of ZnO-based devices.</p>","PeriodicalId":731,"journal":{"name":"Physics of the Solid State","volume":"66 4","pages":"91 - 98"},"PeriodicalIF":0.9,"publicationDate":"2024-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141503211","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
This study investigates the impact of spin torque diode (STD) effect in a composite spin valve pillar, comprising distinct magnetic and non-magnetic layers arranged as AF/F0/NM1/F1/NM2/F2. Our investigation delves into the foundational mechanisms governing the STD effect within this magnetic multilayer system. Through the utilization of the composite spin valve pillar as a dynamic platform, we unravel the intricate interplay between spin-dependent charge transport and magnetic fields. Our inquiry is to understand diverse structural parameters, allowing us to unveil its operational capabilities and optimize its functionality across varied operating conditions. Furthermore, our exploration encompasses the quantification of detection sensitivity, scrutinizing the relationship between output voltage and applied input power. In our study, we have done an analysis of crucial parameters such as current, resistance, and sensitivity in the STD system. Our findings showcase the manifestation of the spin diode effect in low-dimensional magnetic structure. This finding indicates the feasibility of fabricating a spin diode device with diverse potential applications.
{"title":"Exploring the Spin Torque Diode Effect in Low Dimensional Magnetic Multilayer Structure","authors":"Rishma Thilakaraj, Kanimozhi Natarajan, Amuda Rajamani, Brinda Arumugam","doi":"10.1134/S1063783424600626","DOIUrl":"10.1134/S1063783424600626","url":null,"abstract":"<p>This study investigates the impact of spin torque diode (STD) effect in a composite spin valve pillar, comprising distinct magnetic and non-magnetic layers arranged as AF/F0/NM1/F1/NM2/F2. Our investigation delves into the foundational mechanisms governing the STD effect within this magnetic multilayer system. Through the utilization of the composite spin valve pillar as a dynamic platform, we unravel the intricate interplay between spin-dependent charge transport and magnetic fields. Our inquiry is to understand diverse structural parameters, allowing us to unveil its operational capabilities and optimize its functionality across varied operating conditions. Furthermore, our exploration encompasses the quantification of detection sensitivity, scrutinizing the relationship between output voltage and applied input power. In our study, we have done an analysis of crucial parameters such as current, resistance, and sensitivity in the STD system. Our findings showcase the manifestation of the spin diode effect in low-dimensional magnetic structure. This finding indicates the feasibility of fabricating a spin diode device with diverse potential applications.</p>","PeriodicalId":731,"journal":{"name":"Physics of the Solid State","volume":"66 4","pages":"113 - 120"},"PeriodicalIF":0.9,"publicationDate":"2024-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141503208","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}