Pub Date : 2022-01-01DOI: 10.1109/MEMC.2022.9982567
D. Choi, Euibum Lee, Taesik Nam, J. Yook
Information input/output technology has been employed in various fields in our modern lives, and it is almost impossible for society to function without the devices based on this technology. Therefore, security issues associated with such electronic devices have attracted extensive attention. This study thoroughly reviews various TEMPEST-related research outcomes and trends. It contains both conventional and deep learning-based image processing techniques and research involving realistic scenarios, including concrete walls, information recovery under multiple devices, and reconstruction of color information.
{"title":"Recent Trends in Image Information Recovery Using Leaked Electromagnetic Wave from Electronic Equipment","authors":"D. Choi, Euibum Lee, Taesik Nam, J. Yook","doi":"10.1109/MEMC.2022.9982567","DOIUrl":"https://doi.org/10.1109/MEMC.2022.9982567","url":null,"abstract":"Information input/output technology has been employed in various fields in our modern lives, and it is almost impossible for society to function without the devices based on this technology. Therefore, security issues associated with such electronic devices have attracted extensive attention. This study thoroughly reviews various TEMPEST-related research outcomes and trends. It contains both conventional and deep learning-based image processing techniques and research involving realistic scenarios, including concrete walls, information recovery under multiple devices, and reconstruction of color information.","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"11 1","pages":"77-83"},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62489706","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-01-01DOI: 10.1109/MEMC.2022.9982569
Youngwoo Kim, Daisuke Fujimoto, Y. Hayashi
This article introduces a method to simultaneously evaluate the security and electromagnetic compatibility (EMC) of information devices equipped with cryptographic modules by measuring the electromagnetic (EM) field distribution on a printed circuit board (PCB). The proposed method requires a single correlation analysis above the cryptographic integrated circuit (IC) to define the frequency band of the EM field containing the secret information. Then, focusing on the radiation intensity in the frequency domain, an efficient method capable of obtaining the EM field distribution that contributes to the leakage of confidential information is proposed. Simultaneous EMC and security evaluations can be conducted by analyzing the obtained EM field distribution. Using the proposed method, EM field radiation and information leakage of an actual cryptographic device are analyzed. Compared to conventional methods requiring a large computational resource and analysis time, the proposed method can efficiently obtain the distribution of electric and magnetic fields that cause leakage of confidential information. Lastly, discussion, design guide, and future research directions are briefly provided.
{"title":"Simultaneous Security and EMC Evaluations Based on Measuring Electromagnetic Field Distribution on PCBs","authors":"Youngwoo Kim, Daisuke Fujimoto, Y. Hayashi","doi":"10.1109/MEMC.2022.9982569","DOIUrl":"https://doi.org/10.1109/MEMC.2022.9982569","url":null,"abstract":"This article introduces a method to simultaneously evaluate the security and electromagnetic compatibility (EMC) of information devices equipped with cryptographic modules by measuring the electromagnetic (EM) field distribution on a printed circuit board (PCB). The proposed method requires a single correlation analysis above the cryptographic integrated circuit (IC) to define the frequency band of the EM field containing the secret information. Then, focusing on the radiation intensity in the frequency domain, an efficient method capable of obtaining the EM field distribution that contributes to the leakage of confidential information is proposed. Simultaneous EMC and security evaluations can be conducted by analyzing the obtained EM field distribution. Using the proposed method, EM field radiation and information leakage of an actual cryptographic device are analyzed. Compared to conventional methods requiring a large computational resource and analysis time, the proposed method can efficiently obtain the distribution of electric and magnetic fields that cause leakage of confidential information. Lastly, discussion, design guide, and future research directions are briefly provided.","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"11 1","pages":"84-92"},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62489759","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-01-01DOI: 10.1109/MEMC.2022.10058843
Yu-hao Chen, Kejie Li, Zongyang Wang, Yi Zhou, Yan-zhao Xie
Vulnerability assessment of electronic devices excited by various transient electromagnetic disturbances (TEDs) has been a key issue in electromagnetic susceptibility research. This paper proposes a generalized vulnerability assessment method that includes acquiring data and building assessment model. The data is normally acquired by carrying out experiments, while the assessment model is mainly determined by prior information. As different devices under test (DUTs) could offer a different amount of prior information, a generalized assessment model consisting of a white-box model, a grey-box model, and a black-box model is built to deal with situations of sufficient prior information, partial prior information, and no prior information, respectively.
{"title":"Vulnerability Assessment Method for Electronic Devices Excited by Transient Electromagnetic Disturbances","authors":"Yu-hao Chen, Kejie Li, Zongyang Wang, Yi Zhou, Yan-zhao Xie","doi":"10.1109/MEMC.2022.10058843","DOIUrl":"https://doi.org/10.1109/MEMC.2022.10058843","url":null,"abstract":"Vulnerability assessment of electronic devices excited by various transient electromagnetic disturbances (TEDs) has been a key issue in electromagnetic susceptibility research. This paper proposes a generalized vulnerability assessment method that includes acquiring data and building assessment model. The data is normally acquired by carrying out experiments, while the assessment model is mainly determined by prior information. As different devices under test (DUTs) could offer a different amount of prior information, a generalized assessment model consisting of a white-box model, a grey-box model, and a black-box model is built to deal with situations of sufficient prior information, partial prior information, and no prior information, respectively.","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"11 1","pages":"94-99"},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62488463","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-01-01DOI: 10.1109/memc.2022.9780308
Randy Wolff
{"title":"What's New with IBIS and Upcoming Opportunities for SI and PI Engineers to Learn More","authors":"Randy Wolff","doi":"10.1109/memc.2022.9780308","DOIUrl":"https://doi.org/10.1109/memc.2022.9780308","url":null,"abstract":"","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62488473","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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