Pub Date : 2022-01-01DOI: 10.1109/MEMC.2022.9873829
A. Pena-Quintal, H. Loschi, R. Smoleński, M. Sumner, Dave W. P. Thomas, S. Greedy, P. Lezynski, F. Leferink
This paper demonstrates that using conventional frequency scanning methods for the evaluation of conducted electromagnetic interference generated by DC/DC converters can give misleading results when pseudo-random modulation is used as part of the converter control scheme. The paper therefore proposes that the resolution bandwidth of the super heterodyne EMI test receiver used for measurements and the dwell time should be adjusted to match the control parameters of the random modulation scheme. The use of different values for resolution bandwidth and dwell time is demonstrated and measurements for random and fixed modulation schemes are compared.
{"title":"Impact of Pseudo-Random Modulation on Measured Conducted EMI","authors":"A. Pena-Quintal, H. Loschi, R. Smoleński, M. Sumner, Dave W. P. Thomas, S. Greedy, P. Lezynski, F. Leferink","doi":"10.1109/MEMC.2022.9873829","DOIUrl":"https://doi.org/10.1109/MEMC.2022.9873829","url":null,"abstract":"This paper demonstrates that using conventional frequency scanning methods for the evaluation of conducted electromagnetic interference generated by DC/DC converters can give misleading results when pseudo-random modulation is used as part of the converter control scheme. The paper therefore proposes that the resolution bandwidth of the super heterodyne EMI test receiver used for measurements and the dwell time should be adjusted to match the control parameters of the random modulation scheme. The use of different values for resolution bandwidth and dwell time is demonstrated and measurements for random and fixed modulation schemes are compared.","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"11 1","pages":"84-92"},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62489134","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-01-01DOI: 10.1109/MEMC.2022.10058836
Andre Tavora de A. Silva, C. Dias, E. R. De Lima, G. Fraidenraich, Gustavo Iervolino de Morais Eldorado
The fifth-generation wireless system (5G) is becoming more present in today's reality. Understanding the electromagnetic compatibility (EMC) requirements is critical for preparing future device designs to conform to the upcoming standards. This article provides an overview of EMC's role in the certification process and provides an updated standardization guide, comparing emissions and immunity tests of the latest 3GPP/ETSI and ITU recommendations. We discuss the test methodologies and challenges when setting up EMC test facilities, especially for OTA at the FR2 band. We also provide an example of equipment selection as a guide for 5G 3GPP RF conformance tests for User Equipment (UE) and Base Station (BS). Finally, thinking about the future, we dive into the next-generation wireless communication world to provide insights on how 6G technology advancements would impact EMC.
{"title":"A Pathway on 5G EMC Testing: A Tutorial","authors":"Andre Tavora de A. Silva, C. Dias, E. R. De Lima, G. Fraidenraich, Gustavo Iervolino de Morais Eldorado","doi":"10.1109/MEMC.2022.10058836","DOIUrl":"https://doi.org/10.1109/MEMC.2022.10058836","url":null,"abstract":"The fifth-generation wireless system (5G) is becoming more present in today's reality. Understanding the electromagnetic compatibility (EMC) requirements is critical for preparing future device designs to conform to the upcoming standards. This article provides an overview of EMC's role in the certification process and provides an updated standardization guide, comparing emissions and immunity tests of the latest 3GPP/ETSI and ITU recommendations. We discuss the test methodologies and challenges when setting up EMC test facilities, especially for OTA at the FR2 band. We also provide an example of equipment selection as a guide for 5G 3GPP RF conformance tests for User Equipment (UE) and Base Station (BS). Finally, thinking about the future, we dive into the next-generation wireless communication world to provide insights on how 6G technology advancements would impact EMC.","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"11 1","pages":"63-72"},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62488312","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-01-01DOI: 10.1109/memc.2022.9780282
D. Hoolihan
{"title":"A Review of Developments in Wireless and Electrical Engineering","authors":"D. Hoolihan","doi":"10.1109/memc.2022.9780282","DOIUrl":"https://doi.org/10.1109/memc.2022.9780282","url":null,"abstract":"","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62488673","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-01-01DOI: 10.1109/MEMC.2022.10058830
Kye Yak, P. Sudhakar, D. Kumar, S. Baisakhiya, K. G. Thomas
The key factors that influence the Radiated Emission (RE) measurement results of Inter Laboratory Comparison (ILC) program, conducted as part of proficiency testing/Quality Assurance of EMC test laboratory are presented in this paper. The evaluated classical Z score results and overall performance of the participant EMC test laboratories in ILC program are affected by these factors. The performance improvement techniques to address the influencing factors and eliminate the deviation in test results of ILC program are outlined in detail. A case study was conducted in the frequency range from 30 MHz to 1 GHz, as the deviation in Z score results is predominant below 1 GHz. The importance of awareness required to conduct ILC program accurately with minimum possible errors is highlighted in this paper.
{"title":"Importance of Performance Improvement for Inter Laboratory Comparison (ILC) of Radiated Emission Measurements","authors":"Kye Yak, P. Sudhakar, D. Kumar, S. Baisakhiya, K. G. Thomas","doi":"10.1109/MEMC.2022.10058830","DOIUrl":"https://doi.org/10.1109/MEMC.2022.10058830","url":null,"abstract":"The key factors that influence the Radiated Emission (RE) measurement results of Inter Laboratory Comparison (ILC) program, conducted as part of proficiency testing/Quality Assurance of EMC test laboratory are presented in this paper. The evaluated classical Z score results and overall performance of the participant EMC test laboratories in ILC program are affected by these factors. The performance improvement techniques to address the influencing factors and eliminate the deviation in test results of ILC program are outlined in detail. A case study was conducted in the frequency range from 30 MHz to 1 GHz, as the deviation in Z score results is predominant below 1 GHz. The importance of awareness required to conduct ILC program accurately with minimum possible errors is highlighted in this paper.","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"11 1","pages":"53-61"},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62488699","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-01-01DOI: 10.1109/memc.2022.9780312
T. Braxton
{"title":"The Interference Will Be With You. Always","authors":"T. Braxton","doi":"10.1109/memc.2022.9780312","DOIUrl":"https://doi.org/10.1109/memc.2022.9780312","url":null,"abstract":"","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62489157","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-01-01DOI: 10.1109/memc.2022.9982578
T. Braxton
{"title":"No Gas Tanks in Electric Vehicles - Maybe No Radios, Either","authors":"T. Braxton","doi":"10.1109/memc.2022.9982578","DOIUrl":"https://doi.org/10.1109/memc.2022.9982578","url":null,"abstract":"","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62489344","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-01-01DOI: 10.1109/memc.2022.9982535
J. Maas, F. Grassi
{"title":"Workshops and Tutorials in Spokane","authors":"J. Maas, F. Grassi","doi":"10.1109/memc.2022.9982535","DOIUrl":"https://doi.org/10.1109/memc.2022.9982535","url":null,"abstract":"","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62488845","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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