Pub Date : 2023-01-01DOI: 10.1109/lascas16614.2010
N. Mora
{"title":"IEEE Latin American Symposium on Circuits and Systems (LASCAS)","authors":"N. Mora","doi":"10.1109/lascas16614.2010","DOIUrl":"https://doi.org/10.1109/lascas16614.2010","url":null,"abstract":"","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62236636","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-01-01DOI: 10.1109/MEMC.2023.10136459
Y. Zhechev, A. Medvedev, T. Gazizov
To improve the reliability of radio electronic devices, engineers use redundancy of the most relevant circuits. The simplest and most common solution is classical cold redundancy in which the primary and redundant circuits are located far from each other. Meanwhile, locating the primary and redundant circuits close together makes it possible to use modal distortions to protect both circuits from unwanted ultra-wideband interference. This approach is known as modal redundancy or modal reservation (MR). This paper presents the results of signal integrity analysis for a structure with single MR before and after failures. It is shown that the bandwidth after failures changes. This affects the rate of data that can be excited to the input of the device without significant distortion of the useful signal. The authors used pseudorandom binary sequences with a data rate of 50 and 200 Mbps. It is experimentally shown that failures in the redundant circuit do not significantly degrade the quality of signal integrity in the bandwidth. Thus, the data-dependent jitter changes from 12 (before failures) to 19 ps (after the worst failure). In all investigated variants, the eye stays open; as a result, the bit error rate will be low. The mismatch of the redundant circuit has the largest effect on the noise amplitude. As a result, the signal-to-noise ratio decreases from 57 (before failures) to 28 (after the worst failure). To confirm the measurements, we performed electrodynamic simulations. Their results are in good agreement with the experimental data.
{"title":"Signal Integrity Analysis of the Structure with Single Modal Reservation Before and After Failures","authors":"Y. Zhechev, A. Medvedev, T. Gazizov","doi":"10.1109/MEMC.2023.10136459","DOIUrl":"https://doi.org/10.1109/MEMC.2023.10136459","url":null,"abstract":"To improve the reliability of radio electronic devices, engineers use redundancy of the most relevant circuits. The simplest and most common solution is classical cold redundancy in which the primary and redundant circuits are located far from each other. Meanwhile, locating the primary and redundant circuits close together makes it possible to use modal distortions to protect both circuits from unwanted ultra-wideband interference. This approach is known as modal redundancy or modal reservation (MR). This paper presents the results of signal integrity analysis for a structure with single MR before and after failures. It is shown that the bandwidth after failures changes. This affects the rate of data that can be excited to the input of the device without significant distortion of the useful signal. The authors used pseudorandom binary sequences with a data rate of 50 and 200 Mbps. It is experimentally shown that failures in the redundant circuit do not significantly degrade the quality of signal integrity in the bandwidth. Thus, the data-dependent jitter changes from 12 (before failures) to 19 ps (after the worst failure). In all investigated variants, the eye stays open; as a result, the bit error rate will be low. The mismatch of the redundant circuit has the largest effect on the noise amplitude. As a result, the signal-to-noise ratio decreases from 57 (before failures) to 28 (after the worst failure). To confirm the measurements, we performed electrodynamic simulations. Their results are in good agreement with the experimental data.","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62489928","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-01-01DOI: 10.1109/MEMC.2023.10136447
Di Wang, Xing-Chang Wei, En-Xiao Liu, Richard Xian-Ke Gao
This paper elaborates the near-field scanning and modeling technique developed for electromagnetic interference (EMI) analysis. The technique has been increasingly deployed in many R&D labs of universities and testing centers of industry companies due to its advantages in terms of time and cost, comparing with conventional EMI measurement methods. The major research works related to the near-field scanning and modeling are probe design and source reconstruction method (SRM). In this article, the working principle of electric and magnetic probes are firstly introduced. Probe parameters including calibration factor, electric center, sensitivity, spatial resolution and bandwidth are discussed. Next, the equivalent radiation source modeling approach is presented. Through SRM, a complex and unknown EMI source is substituted with the simplified equivalent radiation source based on the electromagnetic fields measured by magnetic and/or electric probes. The phaseless SRM is thereafter discussed for addressing the limitations in conventional SRM and its applications prove that the near-field scanning and modeling technique can effectively predict EMI far-field radiation and near-field coupling.
{"title":"Probe Design and Source Reconstruction for Near-Field Scanning and Modeling","authors":"Di Wang, Xing-Chang Wei, En-Xiao Liu, Richard Xian-Ke Gao","doi":"10.1109/MEMC.2023.10136447","DOIUrl":"https://doi.org/10.1109/MEMC.2023.10136447","url":null,"abstract":"This paper elaborates the near-field scanning and modeling technique developed for electromagnetic interference (EMI) analysis. The technique has been increasingly deployed in many R&D labs of universities and testing centers of industry companies due to its advantages in terms of time and cost, comparing with conventional EMI measurement methods. The major research works related to the near-field scanning and modeling are probe design and source reconstruction method (SRM). In this article, the working principle of electric and magnetic probes are firstly introduced. Probe parameters including calibration factor, electric center, sensitivity, spatial resolution and bandwidth are discussed. Next, the equivalent radiation source modeling approach is presented. Through SRM, a complex and unknown EMI source is substituted with the simplified equivalent radiation source based on the electromagnetic fields measured by magnetic and/or electric probes. The phaseless SRM is thereafter discussed for addressing the limitations in conventional SRM and its applications prove that the near-field scanning and modeling technique can effectively predict EMI far-field radiation and near-field coupling.","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62490154","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-01-01DOI: 10.1109/MEMC.2023.10201437
Manish Mathew Tirkey, N. Gupta
Limitation of the absorption band is an inherent problem in the resonant absorbers. An investigation carried out to address this problem is presented in this magazine. Initially, we have designed a resonant absorber using the conventional metal-insulator-metal configuration, which provides a narrow fractional bandwidth (FBW) of 3.4%. Then the FBW of the absorber is increased up to 28.4% by modifying the conventional configuration while maintaining the same resonant frequency for both absorbers. Generally, it is observed that the reflection coefficient of the absorber increases with the increase in its bandwidth. However, the proposed absorber increases the FBW as well as reduces the reflection coefficient simultaneously and achieves superior performance than the conventional resonant absorber. In addition, the proposed absorber is compact, thin, polarization-insensitive, and angularly stable.
{"title":"Investigation on Fractional Bandwidth Enhancement of a Resonant Absorber","authors":"Manish Mathew Tirkey, N. Gupta","doi":"10.1109/MEMC.2023.10201437","DOIUrl":"https://doi.org/10.1109/MEMC.2023.10201437","url":null,"abstract":"Limitation of the absorption band is an inherent problem in the resonant absorbers. An investigation carried out to address this problem is presented in this magazine. Initially, we have designed a resonant absorber using the conventional metal-insulator-metal configuration, which provides a narrow fractional bandwidth (FBW) of 3.4%. Then the FBW of the absorber is increased up to 28.4% by modifying the conventional configuration while maintaining the same resonant frequency for both absorbers. Generally, it is observed that the reflection coefficient of the absorber increases with the increase in its bandwidth. However, the proposed absorber increases the FBW as well as reduces the reflection coefficient simultaneously and achieves superior performance than the conventional resonant absorber. In addition, the proposed absorber is compact, thin, polarization-insensitive, and angularly stable.","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62490243","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-01-01DOI: 10.1109/memc.2023.10201444
Gabe Alcala
I hope everyone is having a great summer! It is nice seeing our EMC Chapters all over the globe getting together and the pictures that they are sending in are great. I did want to give a shout out to the Chapter leadership that organize these events. The IEEE EMC Society is a volunteer run organization and these events take time to organize, but they give so much value to our EMC members and industry. Other than our annual symposium, it is the only other time where we get to see EMC members. Speaking of the annual IEEE EMC+SIPI Symposium, I hope all of you can make it to this event. See you there!
{"title":"Chapter Chatter","authors":"Gabe Alcala","doi":"10.1109/memc.2023.10201444","DOIUrl":"https://doi.org/10.1109/memc.2023.10201444","url":null,"abstract":"I hope everyone is having a great summer! It is nice seeing our EMC Chapters all over the globe getting together and the pictures that they are sending in are great. I did want to give a shout out to the Chapter leadership that organize these events. The IEEE EMC Society is a volunteer run organization and these events take time to organize, but they give so much value to our EMC members and industry. Other than our annual symposium, it is the only other time where we get to see EMC members. Speaking of the annual IEEE EMC+SIPI Symposium, I hope all of you can make it to this event. See you there!","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135783713","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-01-01DOI: 10.1109/memc.2023.10136461
{"title":"NEW Signal Integrity/Power Integrity Short Course at 2023 EMC+SIPI Symposium","authors":"","doi":"10.1109/memc.2023.10136461","DOIUrl":"https://doi.org/10.1109/memc.2023.10136461","url":null,"abstract":"","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62489985","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-01-01DOI: 10.1109/MEMC.2023.10201434
Adrian Suarez Zapata, J. Dawson, Yoeri Ariën, J. Catrysse, D. Pissoort, A. Marvin
An electromagnetic shielding material is any material used to make shielding enclosures, typically to shield electronic components, circuits and systems against incoming electromagnetic fields, and to reduce the emission of electromagnetic waves by a circuit or system. For most applications, the choice of the material for designing and manufacturing the shielding enclosure is based on the characterization of planar samples of the shielding material. Several techniques are available to measure the shielding properties of materials. The “IEEE P2715 Guide for the Characterization of the Shielding Effectiveness of Planar Materials” provides guidance on the use of recognized techniques for the measurement of planar material shielding effectiveness. The guide describes the features and limitations of commonly accepted techniques for characterizing the shielding effectiveness of planar materials, and provides a basis for comparing the techniques. This contribution introduces the P2715 standard and summarizes the methods currently available to measure the shielding provided by a planar material.
{"title":"An Overview of the IEEE P2715 Guide for the Characterization of the Shielding Effectiveness of Planar Materials","authors":"Adrian Suarez Zapata, J. Dawson, Yoeri Ariën, J. Catrysse, D. Pissoort, A. Marvin","doi":"10.1109/MEMC.2023.10201434","DOIUrl":"https://doi.org/10.1109/MEMC.2023.10201434","url":null,"abstract":"An electromagnetic shielding material is any material used to make shielding enclosures, typically to shield electronic components, circuits and systems against incoming electromagnetic fields, and to reduce the emission of electromagnetic waves by a circuit or system. For most applications, the choice of the material for designing and manufacturing the shielding enclosure is based on the characterization of planar samples of the shielding material. Several techniques are available to measure the shielding properties of materials. The “IEEE P2715 Guide for the Characterization of the Shielding Effectiveness of Planar Materials” provides guidance on the use of recognized techniques for the measurement of planar material shielding effectiveness. The guide describes the features and limitations of commonly accepted techniques for characterizing the shielding effectiveness of planar materials, and provides a basis for comparing the techniques. This contribution introduces the P2715 standard and summarizes the methods currently available to measure the shielding provided by a planar material.","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62490182","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-01-01DOI: 10.1109/memc.2023.10136455
{"title":"2023 IEEE International Symposium on EMC+SIPI - Announcing Technical Program Highlights","authors":"","doi":"10.1109/memc.2023.10136455","DOIUrl":"https://doi.org/10.1109/memc.2023.10136455","url":null,"abstract":"","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62489871","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-01-01DOI: 10.1109/memc.2023.10201443
Frank Sabath
With this Personality Profile, I would like to introduce you to one of our directors-at-large of the IEEE EMC Society Board of Directors, Krzysztof Sieczkarek.
{"title":"EMC Personality Profile","authors":"Frank Sabath","doi":"10.1109/memc.2023.10201443","DOIUrl":"https://doi.org/10.1109/memc.2023.10201443","url":null,"abstract":"With this Personality Profile, I would like to introduce you to one of our directors-at-large of the IEEE EMC Society Board of Directors, Krzysztof Sieczkarek.","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135784679","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-12-12DOI: 10.1109/memc.2022.9982572
Brian B Beard, Maria I Iacono, Joshua W Guag, Yongkang Liu
It has been shown that the presence of a hand holding a wireless handset (cell phone) can influence antenna efficiency and the measurement of specific absorption rate (SAR) and electromagnetic compatibility. Head phantoms, used in handset compliance testing to estimate SAR in the head, have achieved low cost and multi-frequency use. Head phantoms typically consist of a thin plastic shell, open on the top, holding a tissue simulating fluid. The specific simulant fluid used is determined by the radio frequency of the test. IEC 62209-1 has recipes, using safe nontoxic materials, for all the required frequency bands. Thus, head phantoms can be reused at different frequencies simply by changing the tissue simulating fluid. However, standards have not adopted the use of hand phantoms because SAR limits in limbs are less restrictive than the head, the tissue depth in a hand is insufficient to make accurate measurements with current electric field probes, and the cost of a solid hand phantom is limited to a single frequency band. Our goal was to determine whether 3D printing techniques would allow the construction of a hand phantom with the same utility as existing head phantoms. We developed this phantom based on computer simulations to determine how much human anatomy needed to be included in the phantom to obtain results consistent with actual use. Electric field scans of a handset alone, and held by the hand phantom, were performed. Comparison of handset scans using the phantom and human subjects was planned, but not performed due to Covid-19 restrictions and subsequent changes in priorities. We feel a fluid-filled 3D printed hand phantom is viable and practical. The 3D print files are available on GitHub.
{"title":"A Multi-Frequency 3D Printed Hand Phantom for Electromagnetic Measurements.","authors":"Brian B Beard, Maria I Iacono, Joshua W Guag, Yongkang Liu","doi":"10.1109/memc.2022.9982572","DOIUrl":"https://doi.org/10.1109/memc.2022.9982572","url":null,"abstract":"<p><p>It has been shown that the presence of a hand holding a wireless handset (cell phone) can influence antenna efficiency and the measurement of specific absorption rate (SAR) and electromagnetic compatibility. Head phantoms, used in handset compliance testing to estimate SAR in the head, have achieved low cost and multi-frequency use. Head phantoms typically consist of a thin plastic shell, open on the top, holding a tissue simulating fluid. The specific simulant fluid used is determined by the radio frequency of the test. IEC 62209-1 has recipes, using safe nontoxic materials, for all the required frequency bands. Thus, head phantoms can be reused at different frequencies simply by changing the tissue simulating fluid. However, standards have not adopted the use of hand phantoms because SAR limits in limbs are less restrictive than the head, the tissue depth in a hand is insufficient to make accurate measurements with current electric field probes, and the cost of a solid hand phantom is limited to a single frequency band. Our goal was to determine whether 3D printing techniques would allow the construction of a hand phantom with the same utility as existing head phantoms. We developed this phantom based on computer simulations to determine how much human anatomy needed to be included in the phantom to obtain results consistent with actual use. Electric field scans of a handset alone, and held by the hand phantom, were performed. Comparison of handset scans using the phantom and human subjects was planned, but not performed due to Covid-19 restrictions and subsequent changes in priorities. We feel a fluid-filled 3D printed hand phantom is viable and practical. The 3D print files are available on GitHub.</p>","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2022-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9871728/pdf/nihms-1864808.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"10574787","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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