Chris Stanford, M. J. Wilson, B. Cabrera, M. Diamond, N. Kurinsky, R. Moffatt, F. Ponce, B. Krosigk, B. Young
The use of cryogenic silicon as a detector medium for dark matter searches is gaining popularity. Many of these searches are highly dependent on the value of the photoelectric absorption cross section of silicon at low temperatures, particularly near the silicon band gap energy, where the searches are most sensitive to low mass dark matter candidates. While such cross section data has been lacking from the literature, previous dark matter search experiments have attempted to estimate this parameter by extrapolating it from higher temperature data. However, discrepancies in the high temperature data have led to order-of-magnitude differences in the extrapolations. In this paper, we resolve these discrepancies by using a novel technique to make a direct, low temperature measurement of the photoelectric absorption cross section of silicon at energies near the band gap.
{"title":"Photoelectric absorption cross section of silicon near the bandgap from room temperature to sub-Kelvin temperature","authors":"Chris Stanford, M. J. Wilson, B. Cabrera, M. Diamond, N. Kurinsky, R. Moffatt, F. Ponce, B. Krosigk, B. Young","doi":"10.1063/5.0038392","DOIUrl":"https://doi.org/10.1063/5.0038392","url":null,"abstract":"The use of cryogenic silicon as a detector medium for dark matter searches is gaining popularity. Many of these searches are highly dependent on the value of the photoelectric absorption cross section of silicon at low temperatures, particularly near the silicon band gap energy, where the searches are most sensitive to low mass dark matter candidates. While such cross section data has been lacking from the literature, previous dark matter search experiments have attempted to estimate this parameter by extrapolating it from higher temperature data. However, discrepancies in the high temperature data have led to order-of-magnitude differences in the extrapolations. In this paper, we resolve these discrepancies by using a novel technique to make a direct, low temperature measurement of the photoelectric absorption cross section of silicon at energies near the band gap.","PeriodicalId":8467,"journal":{"name":"arXiv: Materials Science","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2020-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85816006","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-10-27DOI: 10.1103/PHYSREVB.103.144403
P. Manchanda, Pankaj Kumar, P. Dev
Platinum diselenide (PtSe$_{2}$) is a recently-discovered extrinsic magnet, with its magnetism attributed to the presence of Pt-vacancies. The host material to these defects itself displays interesting structural and electronic properties, some of which stem from an unusually strong interaction between its layers. To date, it is not clear how the unique intrinsic properties of PtSe$_2$ will affect its induced magnetism. In this theoretical work, we show that the defect-induced magnetism in PtSe$_{2}$ thin films is highly sensitive to: (i) the layer-thickness (ii) defect density, and (iii) substrate choice. These different factors dramatically modify all magnetic properties, including the magnitude of local moments, strength of the coupling, and even nature of the coupling between the moments. We further show that the strong inter-layer interactions are key to understanding these effects. A better understanding of the various influences on magnetism, can enable controllable tuning of the magnetic properties in Pt-based dichalcogenides, which can be used to design novel devices for magnetoelectric and magneto-optic applications.
{"title":"Defect-induced \u00004p\u0000-magnetism in layered platinum diselenide","authors":"P. Manchanda, Pankaj Kumar, P. Dev","doi":"10.1103/PHYSREVB.103.144403","DOIUrl":"https://doi.org/10.1103/PHYSREVB.103.144403","url":null,"abstract":"Platinum diselenide (PtSe$_{2}$) is a recently-discovered extrinsic magnet, with its magnetism attributed to the presence of Pt-vacancies. The host material to these defects itself displays interesting structural and electronic properties, some of which stem from an unusually strong interaction between its layers. To date, it is not clear how the unique intrinsic properties of PtSe$_2$ will affect its induced magnetism. In this theoretical work, we show that the defect-induced magnetism in PtSe$_{2}$ thin films is highly sensitive to: (i) the layer-thickness (ii) defect density, and (iii) substrate choice. These different factors dramatically modify all magnetic properties, including the magnitude of local moments, strength of the coupling, and even nature of the coupling between the moments. We further show that the strong inter-layer interactions are key to understanding these effects. A better understanding of the various influences on magnetism, can enable controllable tuning of the magnetic properties in Pt-based dichalcogenides, which can be used to design novel devices for magnetoelectric and magneto-optic applications.","PeriodicalId":8467,"journal":{"name":"arXiv: Materials Science","volume":"75 2 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2020-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74656788","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}