Pub Date : 2010-10-01DOI: 10.1109/ISOT.2010.5687366
S. Hasegawa, Y. Hayasaki
Precise control of a diffraction pattern reconstructed from a computer-generated hologram (CGH) is very important in holographic femtosecond laser processing. To obtain a desired diffraction pattern, an optimization based on an estimation of the second harmonic wave generated by the diffraction pattern in the optical setup is performed, because the phenomena induced by a femtosecond laser pulse is based on nonlinear optical effects. The second harmonic optimization we named is performed experimentally and the effective performance is demonstrated.
{"title":"Optimization of computer-generated hologram using second harmonic generation","authors":"S. Hasegawa, Y. Hayasaki","doi":"10.1109/ISOT.2010.5687366","DOIUrl":"https://doi.org/10.1109/ISOT.2010.5687366","url":null,"abstract":"Precise control of a diffraction pattern reconstructed from a computer-generated hologram (CGH) is very important in holographic femtosecond laser processing. To obtain a desired diffraction pattern, an optimization based on an estimation of the second harmonic wave generated by the diffraction pattern in the optical setup is performed, because the phenomena induced by a femtosecond laser pulse is based on nonlinear optical effects. The second harmonic optimization we named is performed experimentally and the effective performance is demonstrated.","PeriodicalId":91154,"journal":{"name":"Optomechatronic Technologies (ISOT), 2010 International Symposium on : 25-27 Oct. 2010 : [Toronto, ON]. International Symposium on Optomechatronic Technologies (2010 : Toronto, Ont.)","volume":"297 1","pages":"1-5"},"PeriodicalIF":0.0,"publicationDate":"2010-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76255895","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-10-01DOI: 10.1109/ISOT.2010.5687386
T. Wortmann
Combination of single images to panoramic views is a popular application of image stitching in digital photography. By applying the same principle to micrographs, a number of common limitations of microscopes such as aberrations or limited depth of field may be overcome. This paper adapts recent methods of image registration for different application areas in light- and electron microscopy. Especially the suitability of SIFT and SURF features for micrograph correspondence analysis is in the focus of investigations. Test scenarios covering a wide range of magnifications and image contents are discussed. Additionally, the acquisition of the single scans and finally the complete generation of high-resolution panoramic micrographs may be automated. The proposed system is not only suitable as a tool for surface inspections, but also as a navigational aid for micro-and nanorobotic applications.
{"title":"Automatic stitching of micrographs using local features","authors":"T. Wortmann","doi":"10.1109/ISOT.2010.5687386","DOIUrl":"https://doi.org/10.1109/ISOT.2010.5687386","url":null,"abstract":"Combination of single images to panoramic views is a popular application of image stitching in digital photography. By applying the same principle to micrographs, a number of common limitations of microscopes such as aberrations or limited depth of field may be overcome. This paper adapts recent methods of image registration for different application areas in light- and electron microscopy. Especially the suitability of SIFT and SURF features for micrograph correspondence analysis is in the focus of investigations. Test scenarios covering a wide range of magnifications and image contents are discussed. Additionally, the acquisition of the single scans and finally the complete generation of high-resolution panoramic micrographs may be automated. The proposed system is not only suitable as a tool for surface inspections, but also as a navigational aid for micro-and nanorobotic applications.","PeriodicalId":91154,"journal":{"name":"Optomechatronic Technologies (ISOT), 2010 International Symposium on : 25-27 Oct. 2010 : [Toronto, ON]. International Symposium on Optomechatronic Technologies (2010 : Toronto, Ont.)","volume":"48 11 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2010-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85141392","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-10-01DOI: 10.1109/ISOT.2010.5687320
Y. Otani, Y. Yamabe, Y. Mizutani
Crystal growth in the microgravity is attracting attention for material science because it is possible to produce a uniform crystal. A purpose of this research is to manipulate a small droplet with a diameter of nano-micro meters by Paul effect and to vaporize for producing a crystal. In case a cyli ndrical electrode between cap-electrodes is charged, a micro particle of whatever solid, liquid and solution is manipulated a sim ple harmonic motion behavior. An electrical charge of trapped particles is derived from analyzing a motion of vibration par ticles using high-speed camera. Applied voltage and frequency are adjusted to control a position of the particle. Fin ally, we succeed to fabricate crystals of sodium and KDP.
{"title":"Manipulation of droplet and crystal growth by Paul effect","authors":"Y. Otani, Y. Yamabe, Y. Mizutani","doi":"10.1109/ISOT.2010.5687320","DOIUrl":"https://doi.org/10.1109/ISOT.2010.5687320","url":null,"abstract":"Crystal growth in the microgravity is attracting attention for material science because it is possible to produce a uniform crystal. A purpose of this research is to manipulate a small droplet with a diameter of nano-micro meters by Paul effect and to vaporize for producing a crystal. In case a cyli ndrical electrode between cap-electrodes is charged, a micro particle of whatever solid, liquid and solution is manipulated a sim ple harmonic motion behavior. An electrical charge of trapped particles is derived from analyzing a motion of vibration par ticles using high-speed camera. Applied voltage and frequency are adjusted to control a position of the particle. Fin ally, we succeed to fabricate crystals of sodium and KDP.","PeriodicalId":91154,"journal":{"name":"Optomechatronic Technologies (ISOT), 2010 International Symposium on : 25-27 Oct. 2010 : [Toronto, ON]. International Symposium on Optomechatronic Technologies (2010 : Toronto, Ont.)","volume":"27 1","pages":"1-4"},"PeriodicalIF":0.0,"publicationDate":"2010-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90714178","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-10-01DOI: 10.1109/ISOT.2010.5687374
A. Rostami, S. Makouei, F. Janabi-Sharifi
A proposal for the new graded index single mode optical fiber applicable in zero-dispersion communication is presented in this paper. This method is capable to set the zero-dispersion wavelength and mode field diameter in the predefined desired values. The systematic design of the mode field diameter is suggested in this paper for the first time. The dispersion management is done by optimizing the structural parameters of the cladding layers with the aid of fitness function in the Genetic algorithm technique. The special assumption for the electrical field distribution of the core region is responsible to mode field diameter adjustment.
{"title":"Zero-dispersion wavelength and mode field diameter managements of ZDSF by optimization technique","authors":"A. Rostami, S. Makouei, F. Janabi-Sharifi","doi":"10.1109/ISOT.2010.5687374","DOIUrl":"https://doi.org/10.1109/ISOT.2010.5687374","url":null,"abstract":"A proposal for the new graded index single mode optical fiber applicable in zero-dispersion communication is presented in this paper. This method is capable to set the zero-dispersion wavelength and mode field diameter in the predefined desired values. The systematic design of the mode field diameter is suggested in this paper for the first time. The dispersion management is done by optimizing the structural parameters of the cladding layers with the aid of fitness function in the Genetic algorithm technique. The special assumption for the electrical field distribution of the core region is responsible to mode field diameter adjustment.","PeriodicalId":91154,"journal":{"name":"Optomechatronic Technologies (ISOT), 2010 International Symposium on : 25-27 Oct. 2010 : [Toronto, ON]. International Symposium on Optomechatronic Technologies (2010 : Toronto, Ont.)","volume":"13 1","pages":"1-4"},"PeriodicalIF":0.0,"publicationDate":"2010-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75650514","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-10-01DOI: 10.1109/ISOT.2010.5687355
Dukho Do, Wanhee Chun, D. Gweon
A new type of spectrometer design for confocal-spectral microscopy is proposed in this paper. Spectral imaging is the technique to collect spectrum information of the sample at each point. By combining with the confocal microscope, the sign al related with the position including z-axis and the wavelength can be measured. To select appropriate wavelength ban d detected by PMT channel, various methods can be used as occasion demands. In this paper, it is proposed that the dispersed sign al is scanned by a galvano mirror to change the wavelength. Also, Acousto-optic tunable filter(AOTF) is used to diffract specific excitation light and to divide excitation and emission signals. Because of the birefringent characteristics in AOTF material, the emission lights experience different paths according to their polarization states. This effect is analyzed and compensated by using an additional birefringent material.
{"title":"A new type of spectrometer for confocal-spectral microscopy","authors":"Dukho Do, Wanhee Chun, D. Gweon","doi":"10.1109/ISOT.2010.5687355","DOIUrl":"https://doi.org/10.1109/ISOT.2010.5687355","url":null,"abstract":"A new type of spectrometer design for confocal-spectral microscopy is proposed in this paper. Spectral imaging is the technique to collect spectrum information of the sample at each point. By combining with the confocal microscope, the sign al related with the position including z-axis and the wavelength can be measured. To select appropriate wavelength ban d detected by PMT channel, various methods can be used as occasion demands. In this paper, it is proposed that the dispersed sign al is scanned by a galvano mirror to change the wavelength. Also, Acousto-optic tunable filter(AOTF) is used to diffract specific excitation light and to divide excitation and emission signals. Because of the birefringent characteristics in AOTF material, the emission lights experience different paths according to their polarization states. This effect is analyzed and compensated by using an additional birefringent material.","PeriodicalId":91154,"journal":{"name":"Optomechatronic Technologies (ISOT), 2010 International Symposium on : 25-27 Oct. 2010 : [Toronto, ON]. International Symposium on Optomechatronic Technologies (2010 : Toronto, Ont.)","volume":"51 1","pages":"1-4"},"PeriodicalIF":0.0,"publicationDate":"2010-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83676974","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-10-01DOI: 10.1109/ISOT.2010.5687376
C. Falldorf, C. von Kopylow, R. Bergmann, M. Agour
We show that phase retrieval from a set of intensity measurements can be used to determine the thermally induced deformation of a diffusely reflecting surface. The presented approach is based on an experimental setup with a spatial light modulator (SLM) located in the Fourier domain of a 4f-configuration. The SLM is used to modulate the incident light with the transfer function of propagation. Since no mechanical adjustment is required throughout the measurement process, the setup is capable of capturing the intensity distributions associated with a large number of propagated representations of the same wave field in a short instance of time. Consequently, it enables the investigation of quasi static scenes, e.g. object surfaces under thermal load which are common in the field of non destructive testing for example. The result of the measurement process can be subjected to well established, iterative phase retrieval algorithms in order to recover the deformation from the lateral phase distribution directly in front of the object. As a proof of principle we show experimental investigations which address the deformation of a resistors surface under thermal load. Eventually, the results obtained from phase retrieval are compared to those of standard interferometry.
{"title":"Measurement of thermally induced deformations by means of phase retrieval","authors":"C. Falldorf, C. von Kopylow, R. Bergmann, M. Agour","doi":"10.1109/ISOT.2010.5687376","DOIUrl":"https://doi.org/10.1109/ISOT.2010.5687376","url":null,"abstract":"We show that phase retrieval from a set of intensity measurements can be used to determine the thermally induced deformation of a diffusely reflecting surface. The presented approach is based on an experimental setup with a spatial light modulator (SLM) located in the Fourier domain of a 4f-configuration. The SLM is used to modulate the incident light with the transfer function of propagation. Since no mechanical adjustment is required throughout the measurement process, the setup is capable of capturing the intensity distributions associated with a large number of propagated representations of the same wave field in a short instance of time. Consequently, it enables the investigation of quasi static scenes, e.g. object surfaces under thermal load which are common in the field of non destructive testing for example. The result of the measurement process can be subjected to well established, iterative phase retrieval algorithms in order to recover the deformation from the lateral phase distribution directly in front of the object. As a proof of principle we show experimental investigations which address the deformation of a resistors surface under thermal load. Eventually, the results obtained from phase retrieval are compared to those of standard interferometry.","PeriodicalId":91154,"journal":{"name":"Optomechatronic Technologies (ISOT), 2010 International Symposium on : 25-27 Oct. 2010 : [Toronto, ON]. International Symposium on Optomechatronic Technologies (2010 : Toronto, Ont.)","volume":"103 1","pages":"1-5"},"PeriodicalIF":0.0,"publicationDate":"2010-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82505430","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-10-01DOI: 10.1109/ISOT.2010.5687373
A. Rostami, P. Ahmadi, F. Janabi-Sharifi
Simulation of Organic Light Emitting Diodes (OLEDs) can be helpful for improving the performance and optimization of the device. In this study Finite Difference (FD) method was employed for the discretization of the governing equations, i.e., continuity, drift-diffusion and Poisson's equations. Hole and electron mobilities were considered to be electric field dependent of Poole-Frenkel form and electron-hole recombination of a Langevin type. The results of this paper give a detailed knowledge about the operation mechanism of OLEDs, charge, field and exciton formation distributions. Also the effects of various parameters changes in OLED response were analyzed.
{"title":"Finite difference modeling of bipolar OLED","authors":"A. Rostami, P. Ahmadi, F. Janabi-Sharifi","doi":"10.1109/ISOT.2010.5687373","DOIUrl":"https://doi.org/10.1109/ISOT.2010.5687373","url":null,"abstract":"Simulation of Organic Light Emitting Diodes (OLEDs) can be helpful for improving the performance and optimization of the device. In this study Finite Difference (FD) method was employed for the discretization of the governing equations, i.e., continuity, drift-diffusion and Poisson's equations. Hole and electron mobilities were considered to be electric field dependent of Poole-Frenkel form and electron-hole recombination of a Langevin type. The results of this paper give a detailed knowledge about the operation mechanism of OLEDs, charge, field and exciton formation distributions. Also the effects of various parameters changes in OLED response were analyzed.","PeriodicalId":91154,"journal":{"name":"Optomechatronic Technologies (ISOT), 2010 International Symposium on : 25-27 Oct. 2010 : [Toronto, ON]. International Symposium on Optomechatronic Technologies (2010 : Toronto, Ont.)","volume":"47 1","pages":"1-4"},"PeriodicalIF":0.0,"publicationDate":"2010-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78154999","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-10-01DOI: 10.1109/ISOT.2010.5687305
P. Webster, Joe X. Z. Yu, Ben Y. C. Leung, Logan G. Wright, K. Mortimer, J. Fraser
In applications ranging from noncontact microsurgery to semiconductor blind hole drilling, precise depth control of laser processing is a major challenge. Even expensive a priori characterization cannot compensate for material heterogeneity and stochasticity inherent to the ablation process. Here we use in situ depth imaging to guide the machining process in real time. W e image along the machining beam axis at high speeds (up to 300 kHz) to provide real-time feedback, even in high aspect ratio holes. The in situ metrology is based on coherent imaging (similar to optical coherence tomography) and is practical for a wide-range of light sources and machining processes (e.g., thermal cutting or ultrafast nonlinear ablation). Coherent imaging has a high dynamic range (> 60 dB) and strongly rejects incoherent signals allowing weak features to be observed in the presence of intense machining light and plasmas. High axial resolution (∼10 μm) requires broadband imaging light but the center wavelength can be chosen appropriate to the application. Infrared light (wavelength: 1320 ± 35 nm) allows simultaneous monitoring of both surface and subsurface interfaces in non-absorbing materials like tissue and semiconductors. By contrast, silicon based detector technology can be used with near infrared imaging light (805 ± 25 nm) enabling high speed acquisition and low cost implementation.
{"title":"Inline coherent imaging of laser micromachining","authors":"P. Webster, Joe X. Z. Yu, Ben Y. C. Leung, Logan G. Wright, K. Mortimer, J. Fraser","doi":"10.1109/ISOT.2010.5687305","DOIUrl":"https://doi.org/10.1109/ISOT.2010.5687305","url":null,"abstract":"In applications ranging from noncontact microsurgery to semiconductor blind hole drilling, precise depth control of laser processing is a major challenge. Even expensive a priori characterization cannot compensate for material heterogeneity and stochasticity inherent to the ablation process. Here we use in situ depth imaging to guide the machining process in real time. W e image along the machining beam axis at high speeds (up to 300 kHz) to provide real-time feedback, even in high aspect ratio holes. The in situ metrology is based on coherent imaging (similar to optical coherence tomography) and is practical for a wide-range of light sources and machining processes (e.g., thermal cutting or ultrafast nonlinear ablation). Coherent imaging has a high dynamic range (> 60 dB) and strongly rejects incoherent signals allowing weak features to be observed in the presence of intense machining light and plasmas. High axial resolution (∼10 μm) requires broadband imaging light but the center wavelength can be chosen appropriate to the application. Infrared light (wavelength: 1320 ± 35 nm) allows simultaneous monitoring of both surface and subsurface interfaces in non-absorbing materials like tissue and semiconductors. By contrast, silicon based detector technology can be used with near infrared imaging light (805 ± 25 nm) enabling high speed acquisition and low cost implementation.","PeriodicalId":91154,"journal":{"name":"Optomechatronic Technologies (ISOT), 2010 International Symposium on : 25-27 Oct. 2010 : [Toronto, ON]. International Symposium on Optomechatronic Technologies (2010 : Toronto, Ont.)","volume":"125 1","pages":"1-4"},"PeriodicalIF":0.0,"publicationDate":"2010-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75041338","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-10-01DOI: 10.1109/ISOT.2010.5687339
Yanhui Bai, J. Yeow, B. Wilson
This paper presents the design and fabrication of 2×2 and 4×4 biaxial micro-electro-mechanical systems (MEMS) mirror array. The fabrication process was extended from that of previous single micromirror with SW electrodes that bases on silicon-on-insulator (SOI) wafer, hybrid bulk/surface micromachined technology, and a high-aspect-ratio shadow mask. Each mirror plate size is 1000μm×1000μm, thickness 35μm. The gap between mirror plate and bottom electrodes is 300μm. This mirror array is well-suited for application where a large optical aperture is required.
{"title":"Design and fabrication of 2×2 and 4×4 biaxial micromirror array","authors":"Yanhui Bai, J. Yeow, B. Wilson","doi":"10.1109/ISOT.2010.5687339","DOIUrl":"https://doi.org/10.1109/ISOT.2010.5687339","url":null,"abstract":"This paper presents the design and fabrication of 2×2 and 4×4 biaxial micro-electro-mechanical systems (MEMS) mirror array. The fabrication process was extended from that of previous single micromirror with SW electrodes that bases on silicon-on-insulator (SOI) wafer, hybrid bulk/surface micromachined technology, and a high-aspect-ratio shadow mask. Each mirror plate size is 1000μm×1000μm, thickness 35μm. The gap between mirror plate and bottom electrodes is 300μm. This mirror array is well-suited for application where a large optical aperture is required.","PeriodicalId":91154,"journal":{"name":"Optomechatronic Technologies (ISOT), 2010 International Symposium on : 25-27 Oct. 2010 : [Toronto, ON]. International Symposium on Optomechatronic Technologies (2010 : Toronto, Ont.)","volume":"7 1","pages":"1-5"},"PeriodicalIF":0.0,"publicationDate":"2010-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75135263","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-10-01DOI: 10.1109/ISOT.2010.5687383
H. Aghayan, Jun Yang, E. Bordatchev
Introduction of gasoline, water, coolant and other contaminants into the engine lubricant as well as the normal aging process affects the optical properties of liquid medium, such as transparency, absorption, and refractive index. A new methodology for optical analysis of contaminated engine lubricants is proposed and described in details in this paper. Novelty of the proposed methodology consists of obtaining and analysis of an optical image that combines an object with known periodical shape and lubricant. The object, e.g. a stainless steel woven wire cloth with a mesh size of 65×65 µm and a circular wire diameter of 33 µm was placed behind a microfluidic channel, containing engine lubricant and optical images of flowing lubricant with stationary object were acquired and analysed. Several parameters of acquired optical images, such as, color of lubricant and object, object shape width at object and lubricant levels, object relative color, and object width non-uniformity coefficient, were proposed. Measured on-line pa rameters were used for optical analysis of fresh and contaminated lubricants. Estimation of contaminant presence an d lubricant condition was performed by comparison of parameters for fresh and contaminated lubricants. Developed m ethodology was verified experimentally showing ability to distinguish lubricants with 1%, 4%, 7%, and 10% coolant contamination.
{"title":"Object shape-based methodology for optical analysis of contaminated engine lubricants","authors":"H. Aghayan, Jun Yang, E. Bordatchev","doi":"10.1109/ISOT.2010.5687383","DOIUrl":"https://doi.org/10.1109/ISOT.2010.5687383","url":null,"abstract":"Introduction of gasoline, water, coolant and other contaminants into the engine lubricant as well as the normal aging process affects the optical properties of liquid medium, such as transparency, absorption, and refractive index. A new methodology for optical analysis of contaminated engine lubricants is proposed and described in details in this paper. Novelty of the proposed methodology consists of obtaining and analysis of an optical image that combines an object with known periodical shape and lubricant. The object, e.g. a stainless steel woven wire cloth with a mesh size of 65×65 µm and a circular wire diameter of 33 µm was placed behind a microfluidic channel, containing engine lubricant and optical images of flowing lubricant with stationary object were acquired and analysed. Several parameters of acquired optical images, such as, color of lubricant and object, object shape width at object and lubricant levels, object relative color, and object width non-uniformity coefficient, were proposed. Measured on-line pa rameters were used for optical analysis of fresh and contaminated lubricants. Estimation of contaminant presence an d lubricant condition was performed by comparison of parameters for fresh and contaminated lubricants. Developed m ethodology was verified experimentally showing ability to distinguish lubricants with 1%, 4%, 7%, and 10% coolant contamination.","PeriodicalId":91154,"journal":{"name":"Optomechatronic Technologies (ISOT), 2010 International Symposium on : 25-27 Oct. 2010 : [Toronto, ON]. International Symposium on Optomechatronic Technologies (2010 : Toronto, Ont.)","volume":"14 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2010-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73845927","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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