This study predicts the failure of energized silicone rubber exposed to corrosive fog environments by analyzing leakage current characteristics and the hydrophobicity loss ratio, which serve as indicators of insulation degradation and operational reliability.
{"title":"Failure Mechanisms and Characterization of High-Temperature-Vulcanized Silicone Rubber Under AC Electric Fields Subject to Corrosive Environments","authors":"Guohui Pang;Zhijin Zhang;Steven Qi Li;Jiayu Li;Simon M. Rowland;Song Yue;Konstantinos Kopsidas;Xingliang Jiang","doi":"10.1109/MEI.2026.11306299","DOIUrl":"https://doi.org/10.1109/MEI.2026.11306299","url":null,"abstract":"This study predicts the failure of energized silicone rubber exposed to corrosive fog environments by analyzing leakage current characteristics and the hydrophobicity loss ratio, which serve as indicators of insulation degradation and operational reliability.","PeriodicalId":444,"journal":{"name":"IEEE Electrical Insulation Magazine","volume":"42 1","pages":"16-29"},"PeriodicalIF":1.3,"publicationDate":"2025-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145778261","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-12-19DOI: 10.1109/TDMR.2025.3638080
{"title":"IEEE Transactions on Device and Materials Reliability Information for Authors","authors":"","doi":"10.1109/TDMR.2025.3638080","DOIUrl":"https://doi.org/10.1109/TDMR.2025.3638080","url":null,"abstract":"","PeriodicalId":448,"journal":{"name":"IEEE Transactions on Device and Materials Reliability","volume":"25 4","pages":"C3-C3"},"PeriodicalIF":2.3,"publicationDate":"2025-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11306201","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145778419","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-12-19DOI: 10.1109/MEI.2026.11306325
Alfredo Contin;Andrea Piccolo;Andrea Cavallini
New categories of partial discharge activity are proposed to enable source identification consistent with the intrinsic nature of partial discharges.
提出了部分放电活动的新类别，以便能够与部分放电的内在性质相一致地识别源。
{"title":"New Categories for Phase-Resolved Partial Discharge Pattern Classification","authors":"Alfredo Contin;Andrea Piccolo;Andrea Cavallini","doi":"10.1109/MEI.2026.11306325","DOIUrl":"https://doi.org/10.1109/MEI.2026.11306325","url":null,"abstract":"New categories of partial discharge activity are proposed to enable source identification consistent with the intrinsic nature of partial discharges.","PeriodicalId":444,"journal":{"name":"IEEE Electrical Insulation Magazine","volume":"42 1","pages":"6-15"},"PeriodicalIF":1.3,"publicationDate":"2025-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145778311","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-12-19DOI: 10.1109/MEI.2026.11306327
Yoshimichi Ohki
In recent years, the development of CO2-free power generation has been progressing around the world to reach the goal of realizing a sustainable society. As an island nation surrounded by oceans, Japan has begun to promote the introduction of off-shore wind power generation. However, in many projects being planned, it is envisaged that large-scale offshore wind farms may be in areas away from major electricity consumption areas because of the restrictions of favorable wind and other conditions. To expand offshore wind power generation, we need to introduce a DC power transmission system with an excellent long-distance power transmission efficiency. Specifically, to increase the capacity of highly stable and efficient power transmission, it is desirable to introduce a DC power transmission system that connects via multiple terminals many offshore wind farms and power grids, transmitting power to demanding areas.
{"title":"News from Japan","authors":"Yoshimichi Ohki","doi":"10.1109/MEI.2026.11306327","DOIUrl":"https://doi.org/10.1109/MEI.2026.11306327","url":null,"abstract":"In recent years, the development of CO2-free power generation has been progressing around the world to reach the goal of realizing a sustainable society. As an island nation surrounded by oceans, Japan has begun to promote the introduction of off-shore wind power generation. However, in many projects being planned, it is envisaged that large-scale offshore wind farms may be in areas away from major electricity consumption areas because of the restrictions of favorable wind and other conditions. To expand offshore wind power generation, we need to introduce a DC power transmission system with an excellent long-distance power transmission efficiency. Specifically, to increase the capacity of highly stable and efficient power transmission, it is desirable to introduce a DC power transmission system that connects via multiple terminals many offshore wind farms and power grids, transmitting power to demanding areas.","PeriodicalId":444,"journal":{"name":"IEEE Electrical Insulation Magazine","volume":"42 1","pages":"37-41"},"PeriodicalIF":1.3,"publicationDate":"2025-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11306327","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145778316","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-12-19DOI: 10.1109/TSM.2025.3646324
Shih-Cheng Hu;Tee Lin;Omid Ali Zargar;Chen-Lin Cho;Yang-Cheng Shih;Graham Leggett
Studies have shown that when the door of a Front Opening Unified Pod (FOUP) opens, the moisture or airborne molecular contamination (AMC) in the microenvironment can be influenced by the equipment layout, forming a skewed flow field. This skewed flow field can allow contaminants to enter the FOUP, adversely affecting the yield of the semiconductor manufacturing process. To effectively eliminate contaminants inside the FOUP, in addition to the common method of purging the FOUP, a laminar air curtain (LAC) device can be added to the FOUP door. This device introduces compressed dry air (CDA) at the interface between the microenvironment and the FOUP, forming flow barrier. This method effectively controls the cleanliness and humidity inside the FOUP. Currently, with the use of the laminar air curtain device, the humidity inside the FOUP significantly decreases. However, when the air reaches the bottom of the wafer box, it tends to diffuse outward, allowing contaminants to invade. To enhance the barrier effect of the air curtain, increasing the flow rate of the injected air is considered, but this can cause deformation of the perforated plate. Since the laminar air curtain device is installed near the door of the Load-Port Unit (LPU), the deformed perforated plate might collide with the LPU door, causing structural damage, generating particles, or displacing the laminar air curtain device, thus compromising its ability to effectively block contaminants from entering the FOUP. The previously developed filter-type laminar air curtain device has met the high flow rate (700 L/min) requirements and improved issues related to deformation and particle generation caused by high flow rates. However, comparative testing of performance across multiple samples in mass production is lacking. Therefore, this study will optimize the configuration of the filter-type laminar air curtain device, including the use of a perforated plate at the outlet and an airflow diffusion device inside the structure. After mass production, we will conduct performance comparisons, including indicators such as airflow uniformity and particle concentration. We expect that advancements in this research and technology will promote broader application of the filter-type air curtain device in the semiconductor industry.
{"title":"Performance of Filter-Type Laminar Air Curtains When the FOUP Door Opened","authors":"Shih-Cheng Hu;Tee Lin;Omid Ali Zargar;Chen-Lin Cho;Yang-Cheng Shih;Graham Leggett","doi":"10.1109/TSM.2025.3646324","DOIUrl":"https://doi.org/10.1109/TSM.2025.3646324","url":null,"abstract":"Studies have shown that when the door of a Front Opening Unified Pod (FOUP) opens, the moisture or airborne molecular contamination (AMC) in the microenvironment can be influenced by the equipment layout, forming a skewed flow field. This skewed flow field can allow contaminants to enter the FOUP, adversely affecting the yield of the semiconductor manufacturing process. To effectively eliminate contaminants inside the FOUP, in addition to the common method of purging the FOUP, a laminar air curtain (LAC) device can be added to the FOUP door. This device introduces compressed dry air (CDA) at the interface between the microenvironment and the FOUP, forming flow barrier. This method effectively controls the cleanliness and humidity inside the FOUP. Currently, with the use of the laminar air curtain device, the humidity inside the FOUP significantly decreases. However, when the air reaches the bottom of the wafer box, it tends to diffuse outward, allowing contaminants to invade. To enhance the barrier effect of the air curtain, increasing the flow rate of the injected air is considered, but this can cause deformation of the perforated plate. Since the laminar air curtain device is installed near the door of the Load-Port Unit (LPU), the deformed perforated plate might collide with the LPU door, causing structural damage, generating particles, or displacing the laminar air curtain device, thus compromising its ability to effectively block contaminants from entering the FOUP. The previously developed filter-type laminar air curtain device has met the high flow rate (700 L/min) requirements and improved issues related to deformation and particle generation caused by high flow rates. However, comparative testing of performance across multiple samples in mass production is lacking. Therefore, this study will optimize the configuration of the filter-type laminar air curtain device, including the use of a perforated plate at the outlet and an airflow diffusion device inside the structure. After mass production, we will conduct performance comparisons, including indicators such as airflow uniformity and particle concentration. We expect that advancements in this research and technology will promote broader application of the filter-type air curtain device in the semiconductor industry.","PeriodicalId":451,"journal":{"name":"IEEE Transactions on Semiconductor Manufacturing","volume":"39 1","pages":"82-90"},"PeriodicalIF":2.3,"publicationDate":"2025-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146122794","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-12-19DOI: 10.1109/MEI.2026.11306296
Zepeng Lv
Metal oxide varistors (MOV) with excellent nonlinear current density-electric field $(J-E)$ characteristics are the key components of arresters, which are critical for protecting power systems against overvoltage. Metal oxide varistors inevitably undergo aging during their long-term service under continuous electrical stress, typically manifesting as degraded electrical performance such as declined nonlinear coefficient, decreased breakdown voltage, and increased leakage current. As shown in Figure 1, aging of conventional MOV leads to a monotonic increase in power loss, which finally triggers thermal runaway and serious failure. This classical aging behavior has been well described by the ion migration model proposed by Gupta and Carlson in 1985 [1], wherein mobile ions (e.g., zinc interstitials) migrate toward grain boundaries (GB) under an applied electric field, neutralizing negatively charged interface states. The double Schottky barrier (DSB) is thus reduces, resulting in increased power loss. It has been the theoretical foundation for reliability optimization and condition assessment of MOV over the past 40 years.
{"title":"Stories from China","authors":"Zepeng Lv","doi":"10.1109/MEI.2026.11306296","DOIUrl":"https://doi.org/10.1109/MEI.2026.11306296","url":null,"abstract":"Metal oxide varistors (MOV) with excellent nonlinear current density-electric field <tex>$(J-E)$</tex> characteristics are the key components of arresters, which are critical for protecting power systems against overvoltage. Metal oxide varistors inevitably undergo aging during their long-term service under continuous electrical stress, typically manifesting as degraded electrical performance such as declined nonlinear coefficient, decreased breakdown voltage, and increased leakage current. As shown in Figure 1, aging of conventional MOV leads to a monotonic increase in power loss, which finally triggers thermal runaway and serious failure. This classical aging behavior has been well described by the ion migration model proposed by Gupta and Carlson in 1985 [1], wherein mobile ions (e.g., zinc interstitials) migrate toward grain boundaries (GB) under an applied electric field, neutralizing negatively charged interface states. The double Schottky barrier (DSB) is thus reduces, resulting in increased power loss. It has been the theoretical foundation for reliability optimization and condition assessment of MOV over the past 40 years.","PeriodicalId":444,"journal":{"name":"IEEE Electrical Insulation Magazine","volume":"42 1","pages":"42-44"},"PeriodicalIF":1.3,"publicationDate":"2025-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11306296","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145778117","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-12-19DOI: 10.1109/MEI.2026.11306326
Xinyue Zhang
Harbin, China, August 7–10, 2025—The inaugural Asian Summer School on Dielectric Insulation (ASSDI 2025) was successfully held at the Ice Island Hotel on Sun Island, Harbin (Figure 1). The event was organized by Xi'an Jiaotong University, sponsored by the IEEE Dielectrics and Electrical Insulation Society (IEEE DEIS), and co-organized by Harbin University of Science and Technology.
{"title":"Bulletin Board: First Asian Summer School on Dielectric Insulation (ASSDI 2025) Successfully Held in Harbin, China","authors":"Xinyue Zhang","doi":"10.1109/MEI.2026.11306326","DOIUrl":"https://doi.org/10.1109/MEI.2026.11306326","url":null,"abstract":"Harbin, China, August 7–10, 2025—The inaugural Asian Summer School on Dielectric Insulation (ASSDI 2025) was successfully held at the Ice Island Hotel on Sun Island, Harbin (Figure 1). The event was organized by Xi'an Jiaotong University, sponsored by the IEEE Dielectrics and Electrical Insulation Society (IEEE DEIS), and co-organized by Harbin University of Science and Technology.","PeriodicalId":444,"journal":{"name":"IEEE Electrical Insulation Magazine","volume":"42 1","pages":"58-61"},"PeriodicalIF":1.3,"publicationDate":"2025-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11306326","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145778270","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-12-19DOI: 10.1109/OJNANO.2025.3635934
Supriyo Bandyopadhyay;Giovanni Finocchio
{"title":"Guest Editorial: Special Issue in Memory of Prof. Brajesh Kumar Kaushik","authors":"Supriyo Bandyopadhyay;Giovanni Finocchio","doi":"10.1109/OJNANO.2025.3635934","DOIUrl":"https://doi.org/10.1109/OJNANO.2025.3635934","url":null,"abstract":"","PeriodicalId":446,"journal":{"name":"IEEE Open Journal of Nanotechnology","volume":"6 ","pages":"187-188"},"PeriodicalIF":1.9,"publicationDate":"2025-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11306198","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145778248","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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