Pub Date : 2024-06-29DOI: 10.1016/j.cap.2024.06.016
Hyewon Shim , Jun-Ho Park , Shinyoung Choi, Cheol-Joo Kim
Spin-coating stands out as one of the fastest and simplest processes for material solidification. While it is commonly employed for producing polycrystalline thin films, recent endeavors have explored its potential for epitaxial growth, albeit primarily limited to inorganic materials. In this study, we demonstrate the spin-coating method enabling the rapid growth of large-sized organic single crystals (OSCs). Within 2 h, we successfully obtained OSCs with controlled lateral sizes of up to 2 mm, which conventionally takes several weeks using slow solvent evaporation. Raman mapping and UV–Vis absorption measurements confirmed the growths of the OSCs. We propose the growth mechanism by using the supersaturated dynamic fluid model. Furthermore, we demonstrate the device integration of these OSCs for charge-transfer complex channel, revealing ambipolar behavior during gate sweep. This innovative OSCs production method has the potential to advance the various field of science and electronics, traditionally hindered by the scarcity of adequately sized OSCs.
{"title":"Fast growth of large-sized organic single crystals via spin coating","authors":"Hyewon Shim , Jun-Ho Park , Shinyoung Choi, Cheol-Joo Kim","doi":"10.1016/j.cap.2024.06.016","DOIUrl":"https://doi.org/10.1016/j.cap.2024.06.016","url":null,"abstract":"<div><p>Spin-coating stands out as one of the fastest and simplest processes for material solidification. While it is commonly employed for producing polycrystalline thin films, recent endeavors have explored its potential for epitaxial growth, albeit primarily limited to inorganic materials. In this study, we demonstrate the spin-coating method enabling the rapid growth of large-sized organic single crystals (OSCs). Within 2 h, we successfully obtained OSCs with controlled lateral sizes of up to 2 mm, which conventionally takes several weeks using slow solvent evaporation. Raman mapping and UV–Vis absorption measurements confirmed the growths of the OSCs. We propose the growth mechanism by using the supersaturated dynamic fluid model. Furthermore, we demonstrate the device integration of these OSCs for charge-transfer complex channel, revealing ambipolar behavior during gate sweep. This innovative OSCs production method has the potential to advance the various field of science and electronics, traditionally hindered by the scarcity of adequately sized OSCs.</p></div>","PeriodicalId":11037,"journal":{"name":"Current Applied Physics","volume":"66 ","pages":"Pages 60-65"},"PeriodicalIF":2.4,"publicationDate":"2024-06-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141486114","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-06-27DOI: 10.1016/j.cap.2024.06.015
A. Shahriyari , Z. GolshanBafghi , M. Yousefizad , N. Manavizadeh , H. Pourfarzad , F. Ahaninpajooh , S. Samoodi
Herein, the rotary triboelectric nanogenerator (R-TENG) with a modified structure is simulated and fabricated to investigate the effect of changes on the geometric structure experimentally. The R-TENGs were fabricated using cost-effective and easily accessible dry-film lithography based on the PCB approach. This process which is explained step-by-step in detail in this paper, provides uniform electrode layers without using high-tech instruments, resulting in enhanced fabrication speed and electrical performance. R-TENGs with varying electrode and PTFE sector counts (32/16, 16/8, and 8/4) were fabricated and analyzed. At 1000 rpm, the output power of R-TENGs with 8, 16, and 32 electrodes demonstrated escalating output power with increasing electrode numbers: 6.82, 19.52, and 30.64 Wm-2, respectively. Simulation results corroborated the experimental findings, confirming that more electrodes and freestanding sectors yield superior power density and electrical generation. The 32-electrode, 16-sector R-TENG outperformed its counterparts, suggesting that strategic design alterations can significantly optimize energy harvesting in R-TENGs.
{"title":"Enhancing energy harvesting for low-power electronics: A study on the impact of electrode number and freestanding layer in rotary triboelectric nanogenerator","authors":"A. Shahriyari , Z. GolshanBafghi , M. Yousefizad , N. Manavizadeh , H. Pourfarzad , F. Ahaninpajooh , S. Samoodi","doi":"10.1016/j.cap.2024.06.015","DOIUrl":"https://doi.org/10.1016/j.cap.2024.06.015","url":null,"abstract":"<div><p>Herein, the rotary triboelectric nanogenerator (R-TENG) with a modified structure is simulated and fabricated to investigate the effect of changes on the geometric structure experimentally. The R-TENGs were fabricated using cost-effective and easily accessible dry-film lithography based on the PCB approach. This process which is explained step-by-step in detail in this paper, provides uniform electrode layers without using high-tech instruments, resulting in enhanced fabrication speed and electrical performance. R-TENGs with varying electrode and PTFE sector counts (32/16, 16/8, and 8/4) were fabricated and analyzed. At 1000 rpm, the output power of R-TENGs with 8, 16, and 32 electrodes demonstrated escalating output power with increasing electrode numbers: 6.82, 19.52, and 30.64 Wm<sup>-2</sup>, respectively. Simulation results corroborated the experimental findings, confirming that more electrodes and freestanding sectors yield superior power density and electrical generation. The 32-electrode, 16-sector R-TENG outperformed its counterparts, suggesting that strategic design alterations can significantly optimize energy harvesting in R-TENGs.</p></div>","PeriodicalId":11037,"journal":{"name":"Current Applied Physics","volume":"66 ","pages":"Pages 49-59"},"PeriodicalIF":2.4,"publicationDate":"2024-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141486116","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-06-25DOI: 10.1016/j.cap.2024.06.014
Alexey Yakubov , Petr Lazarenko , Elena Kirilenko , Irina Sagunova , Alexey Babich , Alexey Sherchenkov
Ge2Sb2Te5 (GST225) thin films are used as a functional element in multilayer cells of phase change random access memory (PCRAM, PCM) and have good prospects in electrically driven tunable reflective metasurfaces and on-chip waveguide devices, including those implemented on a flexible substrate. Knowledge of the mechanical properties of GST225 thin films, their adhesion to conductive layers, and the correct choice of conductive material is critical to the reliable operation of these devices. The present work focuses on the effect of phase change on mechanical parameters such as hardness, Young's modulus and stiffness, as well as on the adhesion of GST225 thin films to various metal sublayers (Al, Ti, TiN, W, Ni). The formation of GST225 films was carried out by vacuum thermal evaporation and DC magnetron sputtering, which made it possible to study layers with different distributions of elements over the thickness.
{"title":"Influence of phase state, conducting sublayer material and deposition method on mechanical properties and adhesion of Ge2Sb2Te5 thin films","authors":"Alexey Yakubov , Petr Lazarenko , Elena Kirilenko , Irina Sagunova , Alexey Babich , Alexey Sherchenkov","doi":"10.1016/j.cap.2024.06.014","DOIUrl":"https://doi.org/10.1016/j.cap.2024.06.014","url":null,"abstract":"<div><p>Ge<sub>2</sub>Sb<sub>2</sub>Te<sub>5</sub> (GST225) thin films are used as a functional element in multilayer cells of phase change random access memory (PCRAM, PCM) and have good prospects in electrically driven tunable reflective metasurfaces and on-chip waveguide devices, including those implemented on a flexible substrate. Knowledge of the mechanical properties of GST225 thin films, their adhesion to conductive layers, and the correct choice of conductive material is critical to the reliable operation of these devices. The present work focuses on the effect of phase change on mechanical parameters such as hardness, Young's modulus and stiffness, as well as on the adhesion of GST225 thin films to various metal sublayers (Al, Ti, TiN, W, Ni). The formation of GST225 films was carried out by vacuum thermal evaporation and DC magnetron sputtering, which made it possible to study layers with different distributions of elements over the thickness.</p></div>","PeriodicalId":11037,"journal":{"name":"Current Applied Physics","volume":"66 ","pages":"Pages 66-75"},"PeriodicalIF":2.4,"publicationDate":"2024-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141486112","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-06-24DOI: 10.1016/j.cap.2024.06.013
Soonjae Moon , Jungseek Hwang
Infrared spectroscopy is a powerful and versatile experimental technique for studying the electronic response of condensed matter. Infrared spectroscopy measurements in a broad energy region provide invaluable insights on the electronic excitations and collective modes in condensed matter and thus play pivotal roles in establishing current understandings of various classes of condensed matter. Here we discuss the usefulness and importance of infrared spectroscopy to study the physics of quantum materials, which were formerly known as strongly correlated materials. We will describe the basic principles and experimental methods of infrared spectroscopy and discuss how infrared spectroscopy can be utilized to extract quantitative information on the charge dynamics and electronic band structures of quantum materials.
{"title":"Infrared spectroscopy of quantum materials","authors":"Soonjae Moon , Jungseek Hwang","doi":"10.1016/j.cap.2024.06.013","DOIUrl":"https://doi.org/10.1016/j.cap.2024.06.013","url":null,"abstract":"<div><p>Infrared spectroscopy is a powerful and versatile experimental technique for studying the electronic response of condensed matter. Infrared spectroscopy measurements in a broad energy region provide invaluable insights on the electronic excitations and collective modes in condensed matter and thus play pivotal roles in establishing current understandings of various classes of condensed matter. Here we discuss the usefulness and importance of infrared spectroscopy to study the physics of quantum materials, which were formerly known as strongly correlated materials. We will describe the basic principles and experimental methods of infrared spectroscopy and discuss how infrared spectroscopy can be utilized to extract quantitative information on the charge dynamics and electronic band structures of quantum materials.</p></div>","PeriodicalId":11037,"journal":{"name":"Current Applied Physics","volume":"66 ","pages":"Pages 35-41"},"PeriodicalIF":2.4,"publicationDate":"2024-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141486115","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-06-21DOI: 10.1016/j.cap.2024.06.012
Jung Ehy Hong , Yeong Uk Choi , Hyun Soo Ahn , Bhubnesh Lama , Jong Hun Kim , Tula R. Paudel , Jung-Woo Lee , Jong Hoon Jung
Flexible electronics, such as wearable devices and biosensors, require materials that maintain their properties under mechanical stress. A recent study addresses this by focusing on SrRuO3 (SRO) thin films, which typically suffer reduced coercivity under strain. Herein, we introduce a novel approach by using CoFe2O4 (CFO) as a buffer layer in SRO/CFO/F-mica heterostructures to address this issue. When subjected to a strain of up to ±0.553 %, these heterostructures displayed a mere 11 % variation in saturation magnetic moment and coercive field, significantly outperforming SRO/BaTiO3 configurations, which showed a 95 % reduction in coercivity at only −0.3 % strain. This result demonstrates the effectiveness of the CFO layer in stabilizing the magnetic properties of SRO films against external mechanical deformations. These findings mark a significant advancement in the development of mechanically robust thin films for complex oxide heterostructures in flexible device applications.
{"title":"Strain-insensitive ferromagnetic SrRuO3 thin films with ferrimagnetic CoFe2O4 buffer layer","authors":"Jung Ehy Hong , Yeong Uk Choi , Hyun Soo Ahn , Bhubnesh Lama , Jong Hun Kim , Tula R. Paudel , Jung-Woo Lee , Jong Hoon Jung","doi":"10.1016/j.cap.2024.06.012","DOIUrl":"https://doi.org/10.1016/j.cap.2024.06.012","url":null,"abstract":"<div><p>Flexible electronics, such as wearable devices and biosensors, require materials that maintain their properties under mechanical stress. A recent study addresses this by focusing on SrRuO<sub>3</sub> (SRO) thin films, which typically suffer reduced coercivity under strain. Herein, we introduce a novel approach by using CoFe<sub>2</sub>O<sub>4</sub> (CFO) as a buffer layer in SRO/CFO/F-mica heterostructures to address this issue. When subjected to a strain of up to ±0.553 %, these heterostructures displayed a mere 11 % variation in saturation magnetic moment and coercive field, significantly outperforming SRO/BaTiO<sub>3</sub> configurations, which showed a 95 % reduction in coercivity at only −0.3 % strain. This result demonstrates the effectiveness of the CFO layer in stabilizing the magnetic properties of SRO films against external mechanical deformations. These findings mark a significant advancement in the development of mechanically robust thin films for complex oxide heterostructures in flexible device applications.</p></div>","PeriodicalId":11037,"journal":{"name":"Current Applied Physics","volume":"66 ","pages":"Pages 24-29"},"PeriodicalIF":2.4,"publicationDate":"2024-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141486111","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-06-20DOI: 10.1016/j.cap.2024.06.011
Dzung T. Tran , Tien Le , Hong Gu Lee , Tuson Park , Nguyen The Nghia , Bui Thi Hoa , Duc H. Tran , Won Nam Kang , Jungseek Hwang
Magnesium diboride (MgB2) is a two-band superconductor with a high superconducting critical temperature (Tc) of approximately 39 K. Owing to the lack of vortex pinning centers, MgB2 exhibits an abrupt decline in the critical current density (Jc) in an applied magnetic field. Here, we prepared 1 MeV Nb ion-irradiated MgB2 thin-film samples with doses of , , and ions/cm2. Temperature-dependent magnetization and x-ray diffraction (XRD) measurements were performed to determine the Tc and c-axis lattice constant of each sample. Furthermore, a Fourier transform infrared (FTIR) spectroscopy was performed to obtain the infrared properties of the Nb-ion-irradiated MgB2 thin-film samples. The optical conductivity of each sample in the low-energy region was fitted with two (narrow and broad) Drude modes. We found that the spectral weight redistribution from the low-to high-frequency regions and the broadening of the narrow Drude mode caused by irradiation are closely related to the reduction in Tc.
二硼化镁(MgB2)是一种双带超导体,超导临界温度(Tc)高达约 39 K。由于缺乏涡旋钉中心,MgB2 在外加磁场中的临界电流密度(Jc)会突然下降。在这里,我们制备了 1 MeV Nb 离子辐照 MgB2 薄膜样品,离子剂量分别为 3×1013、7×1013 和 9×1013。通过随温度变化的磁化和 X 射线衍射 (XRD) 测量,确定了每个样品的 Tc 和 c 轴晶格常数。此外,还进行了傅立叶变换红外(FTIR)光谱分析,以获得铌离子辐照 MgB2 薄膜样品的红外特性。用两种(窄和宽)德鲁德模式拟合了每个样品在低能区的光导率。我们发现,辐照造成的光谱重量从低频区到高频区的重新分布和窄德鲁德模式的拓宽与 Tc 的降低密切相关。
{"title":"Infrared spectroscopic study on Nb-ion-irradiated MgB2 thin films","authors":"Dzung T. Tran , Tien Le , Hong Gu Lee , Tuson Park , Nguyen The Nghia , Bui Thi Hoa , Duc H. Tran , Won Nam Kang , Jungseek Hwang","doi":"10.1016/j.cap.2024.06.011","DOIUrl":"https://doi.org/10.1016/j.cap.2024.06.011","url":null,"abstract":"<div><p>Magnesium diboride (MgB<sub>2</sub>) is a two-band superconductor with a high superconducting critical temperature (<em>T</em><sub><em>c</em></sub>) of approximately 39 K. Owing to the lack of vortex pinning centers, MgB<sub>2</sub> exhibits an abrupt decline in the critical current density (<em>J</em><sub><em>c</em></sub>) in an applied magnetic field. Here, we prepared 1 MeV Nb ion-irradiated MgB<sub>2</sub> thin-film samples with doses of <span><math><mrow><mn>3</mn><mo>×</mo><msup><mn>10</mn><mn>13</mn></msup></mrow></math></span>, <span><math><mrow><mn>7</mn><mo>×</mo><msup><mn>10</mn><mn>13</mn></msup></mrow></math></span>, and <span><math><mrow><mn>9</mn><mo>×</mo><msup><mn>10</mn><mn>13</mn></msup></mrow></math></span> ions/cm<sup>2</sup>. Temperature-dependent magnetization and x-ray diffraction (XRD) measurements were performed to determine the <em>T</em><sub><em>c</em></sub> and <em>c</em>-axis lattice constant of each sample. Furthermore, a Fourier transform infrared (FTIR) spectroscopy was performed to obtain the infrared properties of the Nb-ion-irradiated MgB<sub>2</sub> thin-film samples. The optical conductivity of each sample in the low-energy region was fitted with two (narrow and broad) Drude modes. We found that the spectral weight redistribution from the low-to high-frequency regions and the broadening of the narrow Drude mode caused by irradiation are closely related to the reduction in <em>T</em><sub>c</sub>.</p></div>","PeriodicalId":11037,"journal":{"name":"Current Applied Physics","volume":"66 ","pages":"Pages 30-34"},"PeriodicalIF":2.4,"publicationDate":"2024-06-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141486113","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-06-16DOI: 10.1016/j.cap.2024.06.008
Junhong Na
This study investigates the interfacial thermal resistance effect, primarily associated with the bottom-gate stack, in self-aligned top-gate amorphous indium gallium zinc oxide (a-IGZO) thin-film transistors (TFTs). We analyze self-heating and heat transfer characteristics across three different a-IGZO TFT configurations: single-gate, dual-gate type 1, and dual-gate type 2. Temperature maps, corresponding to various bias conditions, are acquired using infrared thermal microscopy. The extracted values of thermal resistance reveal a significant disparity between single- and dual-gate configurations. This suggests that the bottom-gate stack in a-IGZO TFTs, including the interfaces, notably impedes heat dissipation. These findings offer crucial insights into the power dissipation aspects of TFT technology, highlighting the importance of interfacial design for thermal management in advanced electronic devices.
{"title":"Interfacial thermal resistance effect in self-aligned top-gate a-IGZO thin film transistors","authors":"Junhong Na","doi":"10.1016/j.cap.2024.06.008","DOIUrl":"10.1016/j.cap.2024.06.008","url":null,"abstract":"<div><p>This study investigates the interfacial thermal resistance effect, primarily associated with the bottom-gate stack, in self-aligned top-gate amorphous indium gallium zinc oxide (a-IGZO) thin-film transistors (TFTs). We analyze self-heating and heat transfer characteristics across three different a-IGZO TFT configurations: single-gate, dual-gate type 1, and dual-gate type 2. Temperature maps, corresponding to various bias conditions, are acquired using infrared thermal microscopy. The extracted values of thermal resistance reveal a significant disparity between single- and dual-gate configurations. This suggests that the bottom-gate stack in a-IGZO TFTs, including the interfaces, notably impedes heat dissipation. These findings offer crucial insights into the power dissipation aspects of TFT technology, highlighting the importance of interfacial design for thermal management in advanced electronic devices.</p></div>","PeriodicalId":11037,"journal":{"name":"Current Applied Physics","volume":"65 ","pages":"Pages 91-95"},"PeriodicalIF":2.4,"publicationDate":"2024-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141393769","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-06-14DOI: 10.1016/j.cap.2024.06.009
Adila Rani , Sang Don Bu
Materials that produce electric charges in response to a mechanical load are known as piezoelectric materials. Materials with a lattice structure devoid of centosymmetry exhibit piezoelectric activity. These days, non-centrosymmetric 2D nanomaterials have been used in many possible applications and have attracted a lot of attention as piezoelectric materials. The crystal structure, crystal nonsymmetry, and nonzero electronic bandgap energy values of two-dimensional nanomaterials have a significant influence on their piezoelectric capabilities. For example, it was discovered that the symmetry of certain mono- or few-layered 2D nanomaterials differed from that of their bulk counterparts. Piezoelectricity is found at the atomic thickness level in many 2D monolayer materials with structurally broken symmetry, but it gradually vanishes with increasing thickness. Secondly, there is a strong correlation between this piezoelectric action and the polarization direction. In this sense, improving the piezoelectric capabilities in 2D mono, few, and multilayer nanomaterials requires a deeper comprehension of the crystal structure and direction of polarization. Based on theoretical and experimental findings, the crystal structure and direction of polarization of various 2D nanomaterials will be the main topics of this review. We will also discuss recent developments and applications of various 2D nanomaterials.
{"title":"Piezoelectricity in 2D nanomaterials-crystal structure and polarization direction","authors":"Adila Rani , Sang Don Bu","doi":"10.1016/j.cap.2024.06.009","DOIUrl":"10.1016/j.cap.2024.06.009","url":null,"abstract":"<div><p>Materials that produce electric charges in response to a mechanical load are known as piezoelectric materials. Materials with a lattice structure devoid of centosymmetry exhibit piezoelectric activity. These days, non-centrosymmetric 2D nanomaterials have been used in many possible applications and have attracted a lot of attention as piezoelectric materials. The crystal structure, crystal nonsymmetry, and nonzero electronic bandgap energy values of two-dimensional nanomaterials have a significant influence on their piezoelectric capabilities. For example, it was discovered that the symmetry of certain mono- or few-layered 2D nanomaterials differed from that of their bulk counterparts. Piezoelectricity is found at the atomic thickness level in many 2D monolayer materials with structurally broken symmetry, but it gradually vanishes with increasing thickness. Secondly, there is a strong correlation between this piezoelectric action and the polarization direction. In this sense, improving the piezoelectric capabilities in 2D mono, few, and multilayer nanomaterials requires a deeper comprehension of the crystal structure and direction of polarization. Based on theoretical and experimental findings, the crystal structure and direction of polarization of various 2D nanomaterials will be the main topics of this review. We will also discuss recent developments and applications of various 2D nanomaterials.</p></div>","PeriodicalId":11037,"journal":{"name":"Current Applied Physics","volume":"66 ","pages":"Pages 1-23"},"PeriodicalIF":2.4,"publicationDate":"2024-06-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141408475","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-06-13DOI: 10.1016/j.cap.2024.06.007
Do-Hoon Kim , Hyeon-Sik Jang , Changki Hong , Minky Seo , Hoonkyung Lee , Sang-Jin Lee , Nojoon Myoung , Donghun Lee , Seok-Kyun Son , Young Tea Chun
We developed a geometry of metal-insulated-semiconductor field-effect-transistor for the formation of two-dimensional electron gas (2DEG) in dopant-free GaAs/AlGaAs heterostructures in which the conduction band can be modulated by external electric field. We showed two different kinds of device processes: for simple device fabrication and for the uniform 2DEG. We optimized the process of ohmic contacts and the gate geometry for the high quality 2DEG in a triangular quantum well formed at the GaAs/AlGaAs heterointerface. We use these two types of devices to perform a direct comparison of the magneto-transport properties at a low temperature (1.2 K) to get a relationship between the induced carrier density and external electric field. By using our developed fabrication process, the tunability of a high-quality 2DEG was obtained with a carrier density ranging from 0.8 to 2.3 × 1011 cm−2, for which the corresponding mobility ranged 1.5 to 3.3 × 106 cm2 V−1 s−1. Also, we demonstrated that the 2DEG is well established with a suitable depth, 120 nm below the surface (near the GaAs/AlGaAs heterointerface) which is calculated by the capacitance model.
{"title":"Optimization of metal-insulated-semiconductor field-effect-transistor for the formation of two-dimensional electron gas in dopant-free systems","authors":"Do-Hoon Kim , Hyeon-Sik Jang , Changki Hong , Minky Seo , Hoonkyung Lee , Sang-Jin Lee , Nojoon Myoung , Donghun Lee , Seok-Kyun Son , Young Tea Chun","doi":"10.1016/j.cap.2024.06.007","DOIUrl":"10.1016/j.cap.2024.06.007","url":null,"abstract":"<div><p>We developed a geometry of metal-insulated-semiconductor field-effect-transistor for the formation of two-dimensional electron gas (2DEG) in dopant-free GaAs/AlGaAs heterostructures in which the conduction band can be modulated by external electric field. We showed two different kinds of device processes: for simple device fabrication and for the uniform 2DEG. We optimized the process of ohmic contacts and the gate geometry for the high quality 2DEG in a triangular quantum well formed at the GaAs/AlGaAs heterointerface. We use these two types of devices to perform a direct comparison of the magneto-transport properties at a low temperature (1.2 K) to get a relationship between the induced carrier density and external electric field. By using our developed fabrication process, the tunability of a high-quality 2DEG was obtained with a carrier density ranging from 0.8 to 2.3 × 10<sup>11</sup> cm<sup>−2</sup>, for which the corresponding mobility ranged 1.5 to 3.3 × 10<sup>6</sup> cm<sup>2</sup> V<sup>−1</sup> s<sup>−1</sup>. Also, we demonstrated that the 2DEG is well established with a suitable depth, 120 nm below the surface (near the GaAs/AlGaAs heterointerface) which is calculated by the capacitance model.</p></div>","PeriodicalId":11037,"journal":{"name":"Current Applied Physics","volume":"66 ","pages":"Pages 42-48"},"PeriodicalIF":2.4,"publicationDate":"2024-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141390963","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}