Pub Date : 2005-07-10DOI: 10.1109/IVNC.2005.1619618
X.H. Liang, N. Xu, Jun Chen, S. Deng
The damage effects of emission current of different levels on the carbon nanotube (CNT) films were investigated. A critical emission current density is found, which divides the different dominative mechanisms responsible for the damage of the CNT films.
{"title":"Damage of carbon nanotube films during field emission","authors":"X.H. Liang, N. Xu, Jun Chen, S. Deng","doi":"10.1109/IVNC.2005.1619618","DOIUrl":"https://doi.org/10.1109/IVNC.2005.1619618","url":null,"abstract":"The damage effects of emission current of different levels on the carbon nanotube (CNT) films were investigated. A critical emission current density is found, which divides the different dominative mechanisms responsible for the damage of the CNT films.","PeriodicalId":121164,"journal":{"name":"2005 International Vacuum Nanoelectronics Conference","volume":"9 41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126989706","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2005-07-10DOI: 10.1109/IVNC.2005.1619587
R.C. Smith, W. Tsang, D. Cox, S. Silva
Electron field emission from an isolated carbon nanotube (CNT) were performed in-situ in a modified scanning electron microscope, over a range of anode to CNT tip separations, D, of 1 to 60 /spl mu/m. The CNT was exposed from a CNT-polymer composite which was physically broken and examined along the broken edge. The threshold field required for an emission of 100 nA was seen to decrease from a value of 45 V/spl mu/m/sup -1/ at an anode to CNT tip separation of 1 /spl mu/m, and asymptotically approaches 4 V/spl mu/m/sup -1/ at a separation of 60 /spl mu/m. By defining the separation as (D-h) rather than D, where h is the height of the CNT, our applied electric field is E=V/(D-h). Calculation of enhancement factor using the Fowler Nordheim equation shows an increase in enhancement factor with an increasing D, and ties in well with the decrease in threshold field with increasing D. Under "far field" conditions, where D > 3h, the CNT enhancement factor is no longer dependent on D as shown by the asymptotic behaviour of threshold field, and is purely a factor of the CNT height and radius. Fowler-Nordheim analysis allowed calculation of the emission currents for given CNT to tip separation. The calculated emission current, threshold field and enhancement are comparable to that found experimentally.
{"title":"Electron field emission from a single carbon nanotube: effects of anode location","authors":"R.C. Smith, W. Tsang, D. Cox, S. Silva","doi":"10.1109/IVNC.2005.1619587","DOIUrl":"https://doi.org/10.1109/IVNC.2005.1619587","url":null,"abstract":"Electron field emission from an isolated carbon nanotube (CNT) were performed in-situ in a modified scanning electron microscope, over a range of anode to CNT tip separations, D, of 1 to 60 /spl mu/m. The CNT was exposed from a CNT-polymer composite which was physically broken and examined along the broken edge. The threshold field required for an emission of 100 nA was seen to decrease from a value of 45 V/spl mu/m/sup -1/ at an anode to CNT tip separation of 1 /spl mu/m, and asymptotically approaches 4 V/spl mu/m/sup -1/ at a separation of 60 /spl mu/m. By defining the separation as (D-h) rather than D, where h is the height of the CNT, our applied electric field is E=V/(D-h). Calculation of enhancement factor using the Fowler Nordheim equation shows an increase in enhancement factor with an increasing D, and ties in well with the decrease in threshold field with increasing D. Under \"far field\" conditions, where D > 3h, the CNT enhancement factor is no longer dependent on D as shown by the asymptotic behaviour of threshold field, and is purely a factor of the CNT height and radius. Fowler-Nordheim analysis allowed calculation of the emission currents for given CNT to tip separation. The calculated emission current, threshold field and enhancement are comparable to that found experimentally.","PeriodicalId":121164,"journal":{"name":"2005 International Vacuum Nanoelectronics Conference","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131878945","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2005-07-10DOI: 10.1109/IVNC.2005.1619634
Y. Park, H. Kim, I. Han, A.Z. Zoulkarneev, K. Min, C.W. Baek, T. Jeong, D. Chung, S. Park, J.H. Choi, B. K. Song, H.S. Kang, J. Heo, Y.W. Jin, J.M. Kim
In this report, we have controlled the growth of multiwalled carbon nanotubes (MWNT) in terms of the populations and diameters by introducing a buffer layer between catalytic layer and amorphous silicon coated substrates. The carbon nanotubes growth with the chemical vapor deposition technique might produce interaction of the metallic catalyst with silicon layer, which could interrupt the catalytic effect. We will show how control of diffusion layer between the amorphous silicon and metal catalyst effectively control the formation of the silicide phase and consequently optimize the carbon nanotubes growth. It is performed on amorphous silicon coated glass by infrared radiation heated thermal chemical vapor deposition(CVD), using a gas mixture of carbon mono-oxide and hydrogen and Fe-Ni-Co alloy catalyst at temperatures as low as 480/spl sim/580/spl deg/C.
{"title":"Density control of carbon nanotubes for field emission display by control of catalytic layer diffusion","authors":"Y. Park, H. Kim, I. Han, A.Z. Zoulkarneev, K. Min, C.W. Baek, T. Jeong, D. Chung, S. Park, J.H. Choi, B. K. Song, H.S. Kang, J. Heo, Y.W. Jin, J.M. Kim","doi":"10.1109/IVNC.2005.1619634","DOIUrl":"https://doi.org/10.1109/IVNC.2005.1619634","url":null,"abstract":"In this report, we have controlled the growth of multiwalled carbon nanotubes (MWNT) in terms of the populations and diameters by introducing a buffer layer between catalytic layer and amorphous silicon coated substrates. The carbon nanotubes growth with the chemical vapor deposition technique might produce interaction of the metallic catalyst with silicon layer, which could interrupt the catalytic effect. We will show how control of diffusion layer between the amorphous silicon and metal catalyst effectively control the formation of the silicide phase and consequently optimize the carbon nanotubes growth. It is performed on amorphous silicon coated glass by infrared radiation heated thermal chemical vapor deposition(CVD), using a gas mixture of carbon mono-oxide and hydrogen and Fe-Ni-Co alloy catalyst at temperatures as low as 480/spl sim/580/spl deg/C.","PeriodicalId":121164,"journal":{"name":"2005 International Vacuum Nanoelectronics Conference","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134311240","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2005-07-10DOI: 10.1109/IVNC.2005.1619458
Zhibing Li, Weiliang Wang, S. Deng, N. Xu
It is shown that significant field emission from nanorods of wide band gap semiconductors is possible. The nanorod is assumed to have a thin surface layer containing a large number of localized states originating from defects. Taking SiC as an example, the electrostatic potential, charge distribution, conduction current, tunnelling current, and field enhancement are calculated. It is found that the field-induced insulator to semimetal transition is responsible for the efficient field emission from the nanorods and that field enhancement is not constant with applied fields but varies with the field and has a maximum.
{"title":"Field electron emission of nanorods of semiconductors of wide energy band gaps","authors":"Zhibing Li, Weiliang Wang, S. Deng, N. Xu","doi":"10.1109/IVNC.2005.1619458","DOIUrl":"https://doi.org/10.1109/IVNC.2005.1619458","url":null,"abstract":"It is shown that significant field emission from nanorods of wide band gap semiconductors is possible. The nanorod is assumed to have a thin surface layer containing a large number of localized states originating from defects. Taking SiC as an example, the electrostatic potential, charge distribution, conduction current, tunnelling current, and field enhancement are calculated. It is found that the field-induced insulator to semimetal transition is responsible for the efficient field emission from the nanorods and that field enhancement is not constant with applied fields but varies with the field and has a maximum.","PeriodicalId":121164,"journal":{"name":"2005 International Vacuum Nanoelectronics Conference","volume":"73 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130344552","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2005-07-10DOI: 10.1109/IVNC.2005.1619621
M. Waite, H. Bishop, M. Brierly, R. A. Tuck, W. Taylor
A novel type of emitter for a FED, the pFED is being developed for the past ten years. This emitter is formed from micron-sized silica coated with a nano-scale silica insulator. Of the commercially available graphites tested, the best performance was obtained from a 6 mum grade material. When printing such a material a coverage of ~15% cannot be exceeded without forming large clusters that disrupt subsequent processing, thus limiting the density of potential emission sites. In addition, many flakes lie flat on the surface and are unlikely to contribute to emission. In order to improve the density of emitters a thick ink approach has been investigated where the flakes are supported in a mixture of nanoparticle silica (or other insulating particles such as TiO2 or Al2O3) and submicron graphite. The resulting structure is some 1-2 mum thick with the graphite flakes and the underlying cathode connected by a semi-resistive pathway of conducting and insulating particles. The emission properties of these thick inks were comparable with those of the thin inks except that in some cases a second type of emission (Type II emission) was observed
{"title":"Alternative field electron emission characteristics from graphite-insulator composite layers","authors":"M. Waite, H. Bishop, M. Brierly, R. A. Tuck, W. Taylor","doi":"10.1109/IVNC.2005.1619621","DOIUrl":"https://doi.org/10.1109/IVNC.2005.1619621","url":null,"abstract":"A novel type of emitter for a FED, the pFED is being developed for the past ten years. This emitter is formed from micron-sized silica coated with a nano-scale silica insulator. Of the commercially available graphites tested, the best performance was obtained from a 6 mum grade material. When printing such a material a coverage of ~15% cannot be exceeded without forming large clusters that disrupt subsequent processing, thus limiting the density of potential emission sites. In addition, many flakes lie flat on the surface and are unlikely to contribute to emission. In order to improve the density of emitters a thick ink approach has been investigated where the flakes are supported in a mixture of nanoparticle silica (or other insulating particles such as TiO2 or Al2O3) and submicron graphite. The resulting structure is some 1-2 mum thick with the graphite flakes and the underlying cathode connected by a semi-resistive pathway of conducting and insulating particles. The emission properties of these thick inks were comparable with those of the thin inks except that in some cases a second type of emission (Type II emission) was observed","PeriodicalId":121164,"journal":{"name":"2005 International Vacuum Nanoelectronics Conference","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117050231","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2005-07-10DOI: 10.1109/IVNC.2005.1619631
T. Ganetsos, Nikolaos Laskaris, Ch. Lontos, B. Kotsos
In this work, mass spectrum analysis using a new novel software by MATLAB were tested in several liquid metal ion sources (LMAISs) such as AuGeSi, GaIN, ErFeCrNi, and AuGe. The relative intensities of the main ions of each source were determined. In AuGeSi source our results strongly point towards the co-existence of two mechanisms for the emission of doubly-charged monomer ions: direct field evaporation for the Ge/sup 2+/ and Si/sup 2+/ ions but Au/sup 2+/ is formed by the post-ionisation of Au/sup +/. In ErFeCrNi source according to Brandon's criterion Er/sup 2+/, Fe/sup 2+/ is likely to be field evaporated as doubly charged ions. Also, in AuSi alloy source Si/sup 2+/ is directly field-evaporated while Au/sup 2+/ must formed by the post-ionisation of Au/sup +/.
{"title":"Mass spectrum analysis of a L.M.A.I.Ss using a novel software by MATLAB","authors":"T. Ganetsos, Nikolaos Laskaris, Ch. Lontos, B. Kotsos","doi":"10.1109/IVNC.2005.1619631","DOIUrl":"https://doi.org/10.1109/IVNC.2005.1619631","url":null,"abstract":"In this work, mass spectrum analysis using a new novel software by MATLAB were tested in several liquid metal ion sources (LMAISs) such as AuGeSi, GaIN, ErFeCrNi, and AuGe. The relative intensities of the main ions of each source were determined. In AuGeSi source our results strongly point towards the co-existence of two mechanisms for the emission of doubly-charged monomer ions: direct field evaporation for the Ge/sup 2+/ and Si/sup 2+/ ions but Au/sup 2+/ is formed by the post-ionisation of Au/sup +/. In ErFeCrNi source according to Brandon's criterion Er/sup 2+/, Fe/sup 2+/ is likely to be field evaporated as doubly charged ions. Also, in AuSi alloy source Si/sup 2+/ is directly field-evaporated while Au/sup 2+/ must formed by the post-ionisation of Au/sup +/.","PeriodicalId":121164,"journal":{"name":"2005 International Vacuum Nanoelectronics Conference","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117061911","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2005-07-10DOI: 10.1109/IVNC.2005.1619583
R. Mouton, V. Semet, D. Guillot, V. Binh
Layers of non-directional carbon nanotubes (CNTs) are currently used as field emission (FE) cathodes. The main advantage for such cathodes is the low cost fabrication process using conventional film deposition techniques such as screen-printing or imprint. This advantage is unfortunately counter-balanced by the non-uniformity and low density of the field emission sites, a consequence of its mat-like deposition and the tubular geometry of the CNTs. Recently, by a chemical vapour deposition (CVD) technique, strings of nanoballs of carbon are obtained which are called carbon nanopearls. Due to its string-like structure of nanospheres, the deposited layers of the carbon nanopearls naturally present a higher density of field emission sites. As the nanopearls surface is constituted of graphene, as the carbon nanotubes apex, these field emission sites exhibit the same quality for current stability as observed with the carbon nanotubes. It has been demonstrated that a film of conditioned carbon nanopearls exhibits Fowler-Nordheim field emission behaviour, with currents of up to 50 muA readily obtainable under continuous emission in moderate vacuum. Compared to other graphitic nanostructures, in particular the tubular geometry of CNTs, the nanopearls have the advantage of presenting statistically a high density of apex areas with a small radius of curvature (~75 nm) when deposited on a planar surface. Moreover, these spheres are composed of graphitic flakes that are unclosed at the surface and therefore believed to exhibit many dangling bonds with the potential to enhance the field emission current. These two properties give the nanopearls excellent prospects as a cathode material. To investigate the field emission properties, the nanopearls were directly grown on the end of a metallic wire. The field emission was performed in a conventional field emission microscope environment, with the cathode located a few mm away from a flat screen. Systematic analysis of the field emission properties and behaviour of carbon nanopearls based cathodes were done, in particular the energy distribution measurements under different conditions. A comparative analysis with carbon nanotubes will point out the specific quality related to the nanopearl structure
{"title":"Field electron emission from a film of carbon nanopearls","authors":"R. Mouton, V. Semet, D. Guillot, V. Binh","doi":"10.1109/IVNC.2005.1619583","DOIUrl":"https://doi.org/10.1109/IVNC.2005.1619583","url":null,"abstract":"Layers of non-directional carbon nanotubes (CNTs) are currently used as field emission (FE) cathodes. The main advantage for such cathodes is the low cost fabrication process using conventional film deposition techniques such as screen-printing or imprint. This advantage is unfortunately counter-balanced by the non-uniformity and low density of the field emission sites, a consequence of its mat-like deposition and the tubular geometry of the CNTs. Recently, by a chemical vapour deposition (CVD) technique, strings of nanoballs of carbon are obtained which are called carbon nanopearls. Due to its string-like structure of nanospheres, the deposited layers of the carbon nanopearls naturally present a higher density of field emission sites. As the nanopearls surface is constituted of graphene, as the carbon nanotubes apex, these field emission sites exhibit the same quality for current stability as observed with the carbon nanotubes. It has been demonstrated that a film of conditioned carbon nanopearls exhibits Fowler-Nordheim field emission behaviour, with currents of up to 50 muA readily obtainable under continuous emission in moderate vacuum. Compared to other graphitic nanostructures, in particular the tubular geometry of CNTs, the nanopearls have the advantage of presenting statistically a high density of apex areas with a small radius of curvature (~75 nm) when deposited on a planar surface. Moreover, these spheres are composed of graphitic flakes that are unclosed at the surface and therefore believed to exhibit many dangling bonds with the potential to enhance the field emission current. These two properties give the nanopearls excellent prospects as a cathode material. To investigate the field emission properties, the nanopearls were directly grown on the end of a metallic wire. The field emission was performed in a conventional field emission microscope environment, with the cathode located a few mm away from a flat screen. Systematic analysis of the field emission properties and behaviour of carbon nanopearls based cathodes were done, in particular the energy distribution measurements under different conditions. A comparative analysis with carbon nanotubes will point out the specific quality related to the nanopearl structure","PeriodicalId":121164,"journal":{"name":"2005 International Vacuum Nanoelectronics Conference","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115007084","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2005-07-10DOI: 10.1109/IVNC.2005.1619623
M. Xiaoyan, Lei Wei, Gu Wei, Zhang Xiaobing
This paper discusses the capacitance effect of the triode structure on the display characteristic of a field emission display. An RC circuit model between gate and cathode is adopted and results show that the effect of the capacitance and resistance on the waveform and the grayscale are estimated.
{"title":"Capacitance effect on FED system","authors":"M. Xiaoyan, Lei Wei, Gu Wei, Zhang Xiaobing","doi":"10.1109/IVNC.2005.1619623","DOIUrl":"https://doi.org/10.1109/IVNC.2005.1619623","url":null,"abstract":"This paper discusses the capacitance effect of the triode structure on the display characteristic of a field emission display. An RC circuit model between gate and cathode is adopted and results show that the effect of the capacitance and resistance on the waveform and the grayscale are estimated.","PeriodicalId":121164,"journal":{"name":"2005 International Vacuum Nanoelectronics Conference","volume":"166 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122165222","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2005-07-10DOI: 10.1109/IVNC.2005.1619480
Yu Wang, C. Hunt, Y. Diawara, T. Thorson
We present here an X-ray detector based on Si field-emission tip technology. The X-ray is first converted to EHPs in the substrate Si The electrons are emitted into vacuum from spatially-distinct nanoscale field emission tips fabricated on the back-side of the conversion layer, and detected using an imaging multi-channel plate (MCP).
{"title":"X-ray imaging detector silicon field emission tip array energy conversion","authors":"Yu Wang, C. Hunt, Y. Diawara, T. Thorson","doi":"10.1109/IVNC.2005.1619480","DOIUrl":"https://doi.org/10.1109/IVNC.2005.1619480","url":null,"abstract":"We present here an X-ray detector based on Si field-emission tip technology. The X-ray is first converted to EHPs in the substrate Si The electrons are emitted into vacuum from spatially-distinct nanoscale field emission tips fabricated on the back-side of the conversion layer, and detected using an imaging multi-channel plate (MCP).","PeriodicalId":121164,"journal":{"name":"2005 International Vacuum Nanoelectronics Conference","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124187353","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2005-07-10DOI: 10.1109/IVNC.2005.1619604
Yongsheng Shi, C. Zhu, Chang Tian
The new composites of carbon nanotube with silicon dioxide (SiO/sub 2/) nanoparticle for FED cathode is studied. It has significantly improved emission current density property and stable emission characterization of cathode, because it has higher enhancement factor and less shield-effect by adjusting silicon nanoparticle content. The results indicated that when about 80 wt% CNT is optimum content, the current density at the electric field 2 V//spl mu/m is 56 mA/mm/sup 2/, the turn-on field of the CNTs cathode was about 0.71 V//spl mu/m. The fluctuation of emission current is less than 3% for three hours.
{"title":"High stability cathode for carbon nanotube field emission display","authors":"Yongsheng Shi, C. Zhu, Chang Tian","doi":"10.1109/IVNC.2005.1619604","DOIUrl":"https://doi.org/10.1109/IVNC.2005.1619604","url":null,"abstract":"The new composites of carbon nanotube with silicon dioxide (SiO/sub 2/) nanoparticle for FED cathode is studied. It has significantly improved emission current density property and stable emission characterization of cathode, because it has higher enhancement factor and less shield-effect by adjusting silicon nanoparticle content. The results indicated that when about 80 wt% CNT is optimum content, the current density at the electric field 2 V//spl mu/m is 56 mA/mm/sup 2/, the turn-on field of the CNTs cathode was about 0.71 V//spl mu/m. The fluctuation of emission current is less than 3% for three hours.","PeriodicalId":121164,"journal":{"name":"2005 International Vacuum Nanoelectronics Conference","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129644355","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}