A discussion is presented of design techniques and philosophies for airborne radar TWS (track-while-scan) intended to provide a pragmatic view of system design. The designs discussed apply to a hypothetical radar, but have been used by the authors in actual radars. The preprocessing, track filter, and control are discussed.<>
{"title":"Radar track-while-scan methodologies","authors":"G.L. Bair, E.D. Zink","doi":"10.1109/REG5.1988.15895","DOIUrl":"https://doi.org/10.1109/REG5.1988.15895","url":null,"abstract":"A discussion is presented of design techniques and philosophies for airborne radar TWS (track-while-scan) intended to provide a pragmatic view of system design. The designs discussed apply to a hypothetical radar, but have been used by the authors in actual radars. The preprocessing, track filter, and control are discussed.<<ETX>>","PeriodicalId":126733,"journal":{"name":"IEEE Region 5 Conference, 1988: 'Spanning the Peaks of Electrotechnology'","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-03-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130300821","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A 2D finite-difference model is presented that provides significant improvement over existing analytical approximations for the diffusive photocurrent generated in the collector by an epitaxial bipolar device when exposed to ionizing radiation. The model is used to gauge the effect of surface recombination on the amount of photocurrent generated. It is also used to compare the accuracy of several analytical approximations previously published in the literature.<>
{"title":"Two dimensional calculation of diffusive photocurrent in epitaxial bipolar devices","authors":"D. E. Dunn, C. A. Paz de Araújo","doi":"10.1109/REG5.1988.15904","DOIUrl":"https://doi.org/10.1109/REG5.1988.15904","url":null,"abstract":"A 2D finite-difference model is presented that provides significant improvement over existing analytical approximations for the diffusive photocurrent generated in the collector by an epitaxial bipolar device when exposed to ionizing radiation. The model is used to gauge the effect of surface recombination on the amount of photocurrent generated. It is also used to compare the accuracy of several analytical approximations previously published in the literature.<<ETX>>","PeriodicalId":126733,"journal":{"name":"IEEE Region 5 Conference, 1988: 'Spanning the Peaks of Electrotechnology'","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-03-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121236655","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A novel signal processing architecture is described that performs the fast Fourier transform (FFT) in near-optimum time, with minimal hardware. State-of-the-art circuitry and careful layout support ultrafast operations. The processor is capable of executing several signal processing algorithms utilizing a microprogrammable control unit. Array applications can make convenient use of this dedicated processor as a peripheral number cruncher.<>
{"title":"FFT hardware accelerator","authors":"O. Morales","doi":"10.1109/REG5.1988.15911","DOIUrl":"https://doi.org/10.1109/REG5.1988.15911","url":null,"abstract":"A novel signal processing architecture is described that performs the fast Fourier transform (FFT) in near-optimum time, with minimal hardware. State-of-the-art circuitry and careful layout support ultrafast operations. The processor is capable of executing several signal processing algorithms utilizing a microprogrammable control unit. Array applications can make convenient use of this dedicated processor as a peripheral number cruncher.<<ETX>>","PeriodicalId":126733,"journal":{"name":"IEEE Region 5 Conference, 1988: 'Spanning the Peaks of Electrotechnology'","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-03-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123499188","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The design of microwave filters using radial line stubs as reactive elements is investigated. To reduce the design complexity, a simplified model for radial line stub reactance versus frequency is first developed. This allows for an easy transition from the lowpass prototype to the desired planar circuit elements. The frequency-response characteristic of specific radial line stub filter is compared to ideal lumped-element equivalents, and also planar circuit realizations using more traditional straight transmission line elements.<>
{"title":"Microwave filter design using radial line stubs","authors":"D.W. Gardner, M. Wickert","doi":"10.1109/REG5.1988.15902","DOIUrl":"https://doi.org/10.1109/REG5.1988.15902","url":null,"abstract":"The design of microwave filters using radial line stubs as reactive elements is investigated. To reduce the design complexity, a simplified model for radial line stub reactance versus frequency is first developed. This allows for an easy transition from the lowpass prototype to the desired planar circuit elements. The frequency-response characteristic of specific radial line stub filter is compared to ideal lumped-element equivalents, and also planar circuit realizations using more traditional straight transmission line elements.<<ETX>>","PeriodicalId":126733,"journal":{"name":"IEEE Region 5 Conference, 1988: 'Spanning the Peaks of Electrotechnology'","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-03-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121331366","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A neural network that has the capability for viewer-independent recognition of occluded, complex three-dimensional objects is introduced. The technique is based on a set of object-dependent points known as critical points. These points are derived from a structure known as the concavity tree, which is a unique representation for planar shapes. Shapes or objects are compared and identified based on feature vectors formed from the critical point sets. Each feature vector is composed of exactly two critical points where the subsequent feature vectors are computed in succession along the contour of the shape. Finally, the feature vector representation is a ratio expression utilizing two successive feature vectors.<>
{"title":"A neural network for shape recognition","authors":"L. Moorehead, R.A. Jones","doi":"10.1109/REG5.1988.15927","DOIUrl":"https://doi.org/10.1109/REG5.1988.15927","url":null,"abstract":"A neural network that has the capability for viewer-independent recognition of occluded, complex three-dimensional objects is introduced. The technique is based on a set of object-dependent points known as critical points. These points are derived from a structure known as the concavity tree, which is a unique representation for planar shapes. Shapes or objects are compared and identified based on feature vectors formed from the critical point sets. Each feature vector is composed of exactly two critical points where the subsequent feature vectors are computed in succession along the contour of the shape. Finally, the feature vector representation is a ratio expression utilizing two successive feature vectors.<<ETX>>","PeriodicalId":126733,"journal":{"name":"IEEE Region 5 Conference, 1988: 'Spanning the Peaks of Electrotechnology'","volume":"101 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-03-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125702974","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The authors define testability and describe the benefits derived from its inclusion in products. Myths about testability are presented. Test architectures that help to maximize the chances of successfully achieving test goals while minimizing hardware and software costs are described.<>
{"title":"Testability and test architectures","authors":"M. Hare, S. Sicola","doi":"10.1109/REG5.1988.15922","DOIUrl":"https://doi.org/10.1109/REG5.1988.15922","url":null,"abstract":"The authors define testability and describe the benefits derived from its inclusion in products. Myths about testability are presented. Test architectures that help to maximize the chances of successfully achieving test goals while minimizing hardware and software costs are described.<<ETX>>","PeriodicalId":126733,"journal":{"name":"IEEE Region 5 Conference, 1988: 'Spanning the Peaks of Electrotechnology'","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-03-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125255329","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A parallel scan design for finite-state machines (FSMs) was proposed by S.M. Reddy and R. Dandapani (1987), and analyzed for critical parameters such as area, delay, and active devices. The authors study the design presented by Reddy and Dandapani for test parameters including increase in test vectors for both cross-point and single stuck-at faults, fault coverage, and time taken for fault detection. It is shown that even though there is an increase in the number of test vectors due to additional hardware, the testing time is reduced to the parallelism of the design. NMOS technology is used in the analysis.<>
{"title":"Computer aided test synthesis for a parallel scan design of finite state sequential machines","authors":"S. Iyengar, R. Dandapani, S. Reddy","doi":"10.1109/REG5.1988.15920","DOIUrl":"https://doi.org/10.1109/REG5.1988.15920","url":null,"abstract":"A parallel scan design for finite-state machines (FSMs) was proposed by S.M. Reddy and R. Dandapani (1987), and analyzed for critical parameters such as area, delay, and active devices. The authors study the design presented by Reddy and Dandapani for test parameters including increase in test vectors for both cross-point and single stuck-at faults, fault coverage, and time taken for fault detection. It is shown that even though there is an increase in the number of test vectors due to additional hardware, the testing time is reduced to the parallelism of the design. NMOS technology is used in the analysis.<<ETX>>","PeriodicalId":126733,"journal":{"name":"IEEE Region 5 Conference, 1988: 'Spanning the Peaks of Electrotechnology'","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-03-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128243030","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A description is given of a full-rate color image digitization system that was developed to provide capabilities not available on commercial imaging products. The system provides a continuous full-rate data transfer bus, YIQ digitization formats, logarithmic companding, and real-time data flow synchronization for displaying images that have been transferred over asynchronous communications links.<>
{"title":"Color image digitization for real-time video processing","authors":"R. Taylor, P. Wheeler, R. W. Harris","doi":"10.1109/REG5.1988.15906","DOIUrl":"https://doi.org/10.1109/REG5.1988.15906","url":null,"abstract":"A description is given of a full-rate color image digitization system that was developed to provide capabilities not available on commercial imaging products. The system provides a continuous full-rate data transfer bus, YIQ digitization formats, logarithmic companding, and real-time data flow synchronization for displaying images that have been transferred over asynchronous communications links.<<ETX>>","PeriodicalId":126733,"journal":{"name":"IEEE Region 5 Conference, 1988: 'Spanning the Peaks of Electrotechnology'","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-03-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134375689","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The author explores fundamental characteristics of several power spectrum estimation techniques including the periodogram, the Blackman-Tukey method, and some of the more common rational transfer function models. The emphasis is on autoregressive methods, with reference to the closely related maximum-entropy method. The validity of each technique when applied to illustrative sequences is demonstrated.<>
{"title":"Practical utilization of power spectrum estimation techniques","authors":"K. D'Amico","doi":"10.1109/REG5.1988.15910","DOIUrl":"https://doi.org/10.1109/REG5.1988.15910","url":null,"abstract":"The author explores fundamental characteristics of several power spectrum estimation techniques including the periodogram, the Blackman-Tukey method, and some of the more common rational transfer function models. The emphasis is on autoregressive methods, with reference to the closely related maximum-entropy method. The validity of each technique when applied to illustrative sequences is demonstrated.<<ETX>>","PeriodicalId":126733,"journal":{"name":"IEEE Region 5 Conference, 1988: 'Spanning the Peaks of Electrotechnology'","volume":"120 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-03-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132312974","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Models are presented for ground targets detected by a high resolution airborne radar. Results of the modeling of some simple scatterers are presented, along with chi-square approximations to these models. Simple stabilized targets are modeled with 0.6 to 0.8 duo degrees of freedom (K). Targets with unknown rotation are modeled with K of about 0.3. The effect of cell straddling is quantified and found to be about 1.3 dB loss for one dimension and 2.8 dB loss for two dimensions. The effect of these models on detection performance is discussed.<>
{"title":"Detection models for radar ground targets","authors":"D. Reed, R. Ziemer","doi":"10.1109/REG5.1988.15892","DOIUrl":"https://doi.org/10.1109/REG5.1988.15892","url":null,"abstract":"Models are presented for ground targets detected by a high resolution airborne radar. Results of the modeling of some simple scatterers are presented, along with chi-square approximations to these models. Simple stabilized targets are modeled with 0.6 to 0.8 duo degrees of freedom (K). Targets with unknown rotation are modeled with K of about 0.3. The effect of cell straddling is quantified and found to be about 1.3 dB loss for one dimension and 2.8 dB loss for two dimensions. The effect of these models on detection performance is discussed.<<ETX>>","PeriodicalId":126733,"journal":{"name":"IEEE Region 5 Conference, 1988: 'Spanning the Peaks of Electrotechnology'","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-03-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130534768","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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