Pub Date : 1995-09-17DOI: 10.1109/ISEIM.1995.496502
C. Shinoda, M. Hotta, K. Nakamura, T. Hashizume, T. Tani
This paper describes the results of the residual AC breakdown voltage investigated using different initial voltage steps for dry-cured power XLPE cables. Also we investigated the cause of the breakdown and the starting points of the electrical-trees which occurred. Based on the relationship between the residual AC breakdown voltages and the starting points of electrical-trees, we will discuss the influence of the initial voltage step on the residual AC breakdown voltage.
{"title":"Influence of initial voltage step on residual AC breakdown voltage of XLPE power cables after accelerated water immersion aging test","authors":"C. Shinoda, M. Hotta, K. Nakamura, T. Hashizume, T. Tani","doi":"10.1109/ISEIM.1995.496502","DOIUrl":"https://doi.org/10.1109/ISEIM.1995.496502","url":null,"abstract":"This paper describes the results of the residual AC breakdown voltage investigated using different initial voltage steps for dry-cured power XLPE cables. Also we investigated the cause of the breakdown and the starting points of the electrical-trees which occurred. Based on the relationship between the residual AC breakdown voltages and the starting points of electrical-trees, we will discuss the influence of the initial voltage step on the residual AC breakdown voltage.","PeriodicalId":130178,"journal":{"name":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","volume":"2006 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125706462","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-09-17DOI: 10.1109/ISEIM.1995.496524
S. Nakamura, K. Inoue, K. Saito, T. Ohkawa, G. Sawa, K. Kitagawa
The resistivity and dielectric constant and their dependence on frequency and temperature were measured in order to clarify the change of aggregations with carbon loading. It has been suggested that there are conducting paths related to networks and branches related to dielectric constant above the percolation threshold where resistivity shows a PTC. It has been concluded that the behavior of branches for temperature is independent of that of conducting paths and branches are formed with weak aggregations. In high carbon loading, isolated carbon aggregations change into conducting paths and branches with heating and that contributes to a part of the negative temperature coefficient of resistance and the increment of /spl epsiv/r'.
{"title":"Resistive and dielectric properties of carbon black (MA600)-polyethylene composites","authors":"S. Nakamura, K. Inoue, K. Saito, T. Ohkawa, G. Sawa, K. Kitagawa","doi":"10.1109/ISEIM.1995.496524","DOIUrl":"https://doi.org/10.1109/ISEIM.1995.496524","url":null,"abstract":"The resistivity and dielectric constant and their dependence on frequency and temperature were measured in order to clarify the change of aggregations with carbon loading. It has been suggested that there are conducting paths related to networks and branches related to dielectric constant above the percolation threshold where resistivity shows a PTC. It has been concluded that the behavior of branches for temperature is independent of that of conducting paths and branches are formed with weak aggregations. In high carbon loading, isolated carbon aggregations change into conducting paths and branches with heating and that contributes to a part of the negative temperature coefficient of resistance and the increment of /spl epsiv/r'.","PeriodicalId":130178,"journal":{"name":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","volume":"2014 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127554334","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-09-17DOI: 10.1109/ISEIM.1995.496562
X. Hang, F. Bai, Z. Yan
A digital measurement technique for on-line measurement of the dielectric loss angle of capacitive-type insulation by means of an 8098 single chip microcontroller is presented. The principle of the method and the hardware and software design are discussed.
{"title":"On-line measuring dielectric loss angle of capacitive-type insulation by using digital measurement technique","authors":"X. Hang, F. Bai, Z. Yan","doi":"10.1109/ISEIM.1995.496562","DOIUrl":"https://doi.org/10.1109/ISEIM.1995.496562","url":null,"abstract":"A digital measurement technique for on-line measurement of the dielectric loss angle of capacitive-type insulation by means of an 8098 single chip microcontroller is presented. The principle of the method and the hardware and software design are discussed.","PeriodicalId":130178,"journal":{"name":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116599092","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-09-17DOI: 10.1109/ISEIM.1995.496607
N. Tohyama, Y. Tateno, H. Sato, N. Shimizu
We have studied extruded solid polymer insulation for superconducting power transmission cables. Recently, we examined tree initiation properties in polyethylene absorbing helium gas with AC and impulse voltages. As a result, we found that helium gas decreases AC tree initiation voltage. This paper reports the detailed results and discuss the effect of Penning ionization on tree initiation.
{"title":"Tree initiation in polyethylene absorbing helium gas","authors":"N. Tohyama, Y. Tateno, H. Sato, N. Shimizu","doi":"10.1109/ISEIM.1995.496607","DOIUrl":"https://doi.org/10.1109/ISEIM.1995.496607","url":null,"abstract":"We have studied extruded solid polymer insulation for superconducting power transmission cables. Recently, we examined tree initiation properties in polyethylene absorbing helium gas with AC and impulse voltages. As a result, we found that helium gas decreases AC tree initiation voltage. This paper reports the detailed results and discuss the effect of Penning ionization on tree initiation.","PeriodicalId":130178,"journal":{"name":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132206923","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-09-17DOI: 10.1109/ISEIM.1995.496570
J.V. Serdjuk, I. Bozhko, N.I. Falkovsky
Quantitative data on breakdown voltages of non-isothermically heated inert gases at temperatures up to 3600 K are obtained. Existence of polarity effect of breakdown voltages U/sub br/ in uniform electric field at temperatures more than /spl sim/1700 K is established. At cathode heating up to specified temperatures breakdown voltages sharply decrease comparing with U/sub br/ at positive polarity of a heating electrode up to tens and units of volts because of increase of current of thermal electron emission. At anode heating breakdown voltages are determined by pattern or temperature field between electrodes. With this Paschen's law is used for evaluation of insulation properties of non-isothermically heated gases up to 3600 K temperatures.
{"title":"Breakdown of gaseous dielectrics at non-isothermic heating up to 3600 K","authors":"J.V. Serdjuk, I. Bozhko, N.I. Falkovsky","doi":"10.1109/ISEIM.1995.496570","DOIUrl":"https://doi.org/10.1109/ISEIM.1995.496570","url":null,"abstract":"Quantitative data on breakdown voltages of non-isothermically heated inert gases at temperatures up to 3600 K are obtained. Existence of polarity effect of breakdown voltages U/sub br/ in uniform electric field at temperatures more than /spl sim/1700 K is established. At cathode heating up to specified temperatures breakdown voltages sharply decrease comparing with U/sub br/ at positive polarity of a heating electrode up to tens and units of volts because of increase of current of thermal electron emission. At anode heating breakdown voltages are determined by pattern or temperature field between electrodes. With this Paschen's law is used for evaluation of insulation properties of non-isothermically heated gases up to 3600 K temperatures.","PeriodicalId":130178,"journal":{"name":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","volume":"2008 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134475734","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-09-17DOI: 10.1109/ISEIM.1995.496608
T. Ozaki, K. Abe, Y. Ito, T. Umemura
The partial discharge behavior of a layered polymer film/air gap insulation system was studied. It was found that the divided voltage of the air gap calculated from the partial discharge inception voltage coincided well with the breakdown voltage of the air gap estimated from Paschen's law. It was suggested that the polarity difference of the discharge magnitude-repetition rate distribution, which appeared in the overvoltage region, could be due to injection of electrons from the exposed electrode.
{"title":"A partial discharge behavior of piled PET films","authors":"T. Ozaki, K. Abe, Y. Ito, T. Umemura","doi":"10.1109/ISEIM.1995.496608","DOIUrl":"https://doi.org/10.1109/ISEIM.1995.496608","url":null,"abstract":"The partial discharge behavior of a layered polymer film/air gap insulation system was studied. It was found that the divided voltage of the air gap calculated from the partial discharge inception voltage coincided well with the breakdown voltage of the air gap estimated from Paschen's law. It was suggested that the polarity difference of the discharge magnitude-repetition rate distribution, which appeared in the overvoltage region, could be due to injection of electrons from the exposed electrode.","PeriodicalId":130178,"journal":{"name":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132066232","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-09-17DOI: 10.1109/ISEIM.1995.496503
Z. Hong, T. Demin, Z. Hongwei, Wang Xuan
Using the fact that under irradiation by a laser beam, black contaminants, microvoids and translucent impurities in XLPE insulation display different characteristics of light extinction and scattering, the relationships of detected pulse polarity with kinds of defects and the pulse width and amplitude with the size of the defects are found. Therefore, the detected signal can be applied for measuring and recognizing defects with the aid of a computer. The instrument for defect detection in bulk XLPE insulation is presented in this paper. It is shown in test results that the resolution of detection is 40 /spl mu/m in HV XLPE samples with volume 33.6 cm/sup 3/ at temperature 109/spl deg/C.
{"title":"Laser inspection of defects in HV XLPE cable insulation","authors":"Z. Hong, T. Demin, Z. Hongwei, Wang Xuan","doi":"10.1109/ISEIM.1995.496503","DOIUrl":"https://doi.org/10.1109/ISEIM.1995.496503","url":null,"abstract":"Using the fact that under irradiation by a laser beam, black contaminants, microvoids and translucent impurities in XLPE insulation display different characteristics of light extinction and scattering, the relationships of detected pulse polarity with kinds of defects and the pulse width and amplitude with the size of the defects are found. Therefore, the detected signal can be applied for measuring and recognizing defects with the aid of a computer. The instrument for defect detection in bulk XLPE insulation is presented in this paper. It is shown in test results that the resolution of detection is 40 /spl mu/m in HV XLPE samples with volume 33.6 cm/sup 3/ at temperature 109/spl deg/C.","PeriodicalId":130178,"journal":{"name":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","volume":"104 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122883898","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-09-17DOI: 10.1109/ISEIM.1995.496543
A. Yamazaki, Y. Tutumi, T. Yonezawa
Time series data of typical tree type discharges are analyzed from the viewpoint of whether a discharge pulse phase affects the next discharge pulse phase. Contrary to an expectation from the Whitehead model, there seem to be no mutual relationship between a pulse phase and the next pulse phase. On the other hand, the average phase of a discharge pulse group in a half cycle has a slight tendency to affect that in the next half cycle. The time series information of practical tree discharges are analyzed by using test data of a 66-kV cross-linked polyethylene cable with an artificial defect.
{"title":"Relation between pulse generating phase and that of the adjacent pulse at tree discharge","authors":"A. Yamazaki, Y. Tutumi, T. Yonezawa","doi":"10.1109/ISEIM.1995.496543","DOIUrl":"https://doi.org/10.1109/ISEIM.1995.496543","url":null,"abstract":"Time series data of typical tree type discharges are analyzed from the viewpoint of whether a discharge pulse phase affects the next discharge pulse phase. Contrary to an expectation from the Whitehead model, there seem to be no mutual relationship between a pulse phase and the next pulse phase. On the other hand, the average phase of a discharge pulse group in a half cycle has a slight tendency to affect that in the next half cycle. The time series information of practical tree discharges are analyzed by using test data of a 66-kV cross-linked polyethylene cable with an artificial defect.","PeriodicalId":130178,"journal":{"name":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121296921","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-09-17DOI: 10.1109/ISEIM.1995.496506
S. Kobayashi, T. Arai, K. Kudo
In this paper, we simulated 3D tree patterns with the field controlled random nature and used the parameters Vapp (applied voltage), Vd (potential drop in a tree channel), Ec (critical field for tree propagation) and /spl eta/ (the relation between local field and growing probability). As a result, the various shapes of tree patterns are obtained and the model holds more physical realizations.
{"title":"Fractal analysis of 3D simulated tree patterns considering critical field and potential drop","authors":"S. Kobayashi, T. Arai, K. Kudo","doi":"10.1109/ISEIM.1995.496506","DOIUrl":"https://doi.org/10.1109/ISEIM.1995.496506","url":null,"abstract":"In this paper, we simulated 3D tree patterns with the field controlled random nature and used the parameters Vapp (applied voltage), Vd (potential drop in a tree channel), Ec (critical field for tree propagation) and /spl eta/ (the relation between local field and growing probability). As a result, the various shapes of tree patterns are obtained and the model holds more physical realizations.","PeriodicalId":130178,"journal":{"name":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128713463","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-09-17DOI: 10.1109/ISEIM.1995.496603
R. Shimomura, S. Kobayashi, K. Kudo
This paper describes the chaotic behavior of luminous characteristics in time series during AC electrical tree propagation in EVA and PMMA specimens. The authors consider the fractal dimension of the attractor, maximum Lyapunov exponents and self correlation functions, based on light intensity measurements.
{"title":"Chaotic character of luminous phenomena during electrical tree propagation in polymeric insulating materials","authors":"R. Shimomura, S. Kobayashi, K. Kudo","doi":"10.1109/ISEIM.1995.496603","DOIUrl":"https://doi.org/10.1109/ISEIM.1995.496603","url":null,"abstract":"This paper describes the chaotic behavior of luminous characteristics in time series during AC electrical tree propagation in EVA and PMMA specimens. The authors consider the fractal dimension of the attractor, maximum Lyapunov exponents and self correlation functions, based on light intensity measurements.","PeriodicalId":130178,"journal":{"name":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129066527","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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