Pub Date : 1995-09-17DOI: 10.1109/ISEIM.1995.496501
R. Clavreul, F. Duchateau
The objective of the development of polyethylene insulation diagnosis of high voltage cables in France was first to check or to determine the origin of the damage after a dielectric breakdown and to confirm hypothesis such as an accidental water penetration in the insulation or an excess temperature rise in the cable. According to our experience gained in the operation, the main cause of the dielectric breakdown of extruded cables is water penetration in the insulation, generally in high voltage extruded cables manufactured without any waterproof screen in the sixties. Other defects correlated with an excess of the temperature rise in on-line cables can also be observed : we can note the existence of a high temperature annealing in polyethylene, or eventually a modification of the mechanical properties of the insulation. Sometimes manufactured defects, for example large cavities in the insulation, can also be detected. Finally, an evolution of the insulation could be correlated with the polyethylene ageing.
{"title":"Development of polyethylene insulation diagnosis of high voltage cables in France","authors":"R. Clavreul, F. Duchateau","doi":"10.1109/ISEIM.1995.496501","DOIUrl":"https://doi.org/10.1109/ISEIM.1995.496501","url":null,"abstract":"The objective of the development of polyethylene insulation diagnosis of high voltage cables in France was first to check or to determine the origin of the damage after a dielectric breakdown and to confirm hypothesis such as an accidental water penetration in the insulation or an excess temperature rise in the cable. According to our experience gained in the operation, the main cause of the dielectric breakdown of extruded cables is water penetration in the insulation, generally in high voltage extruded cables manufactured without any waterproof screen in the sixties. Other defects correlated with an excess of the temperature rise in on-line cables can also be observed : we can note the existence of a high temperature annealing in polyethylene, or eventually a modification of the mechanical properties of the insulation. Sometimes manufactured defects, for example large cavities in the insulation, can also be detected. Finally, an evolution of the insulation could be correlated with the polyethylene ageing.","PeriodicalId":130178,"journal":{"name":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","volume":"299 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114577208","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-09-17DOI: 10.1109/ISEIM.1995.496527
L. Qingquan, Han Shuyu, Zhang Xiaohong
Experimental results show the water molecule, as a plasticizer, or via ohmic conduction and its strong poling field, to be able to accelerate the charge decay of the poled LDPE specimen; also, as an accepter, to assist charge injection during poling of specimens. A newly found humidity-induced TSC peak at medium temperature could be attributed to dissociated ions from trap in amorphous-crystalline interface.
{"title":"The role of water molecules in low density polyethylene","authors":"L. Qingquan, Han Shuyu, Zhang Xiaohong","doi":"10.1109/ISEIM.1995.496527","DOIUrl":"https://doi.org/10.1109/ISEIM.1995.496527","url":null,"abstract":"Experimental results show the water molecule, as a plasticizer, or via ohmic conduction and its strong poling field, to be able to accelerate the charge decay of the poled LDPE specimen; also, as an accepter, to assist charge injection during poling of specimens. A newly found humidity-induced TSC peak at medium temperature could be attributed to dissociated ions from trap in amorphous-crystalline interface.","PeriodicalId":130178,"journal":{"name":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","volume":"63 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114745469","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-09-17DOI: 10.1109/ISEIM.1995.496510
R. Romanets, V. Bolshakov, B. Dikarev, G. Karasev
A review of data on the investigation of reversal currents in dielectric liquids shows that the shape of the reversal characteristic depends on the nature of the liquid and the impurities in it, the field strength, the time interval, the time repetition, the electrode gap, the temperature etc. In general, the reversal current shows that charged layers accumulated near electrodes can act as reservoirs of positive and negative charge carriers. So, the current waveform under reverse DC polarity in dielectric liquids can be explained in terms of monopolar or bipolar injection from these charged layers.
{"title":"Reversal currents in dielectric liquids","authors":"R. Romanets, V. Bolshakov, B. Dikarev, G. Karasev","doi":"10.1109/ISEIM.1995.496510","DOIUrl":"https://doi.org/10.1109/ISEIM.1995.496510","url":null,"abstract":"A review of data on the investigation of reversal currents in dielectric liquids shows that the shape of the reversal characteristic depends on the nature of the liquid and the impurities in it, the field strength, the time interval, the time repetition, the electrode gap, the temperature etc. In general, the reversal current shows that charged layers accumulated near electrodes can act as reservoirs of positive and negative charge carriers. So, the current waveform under reverse DC polarity in dielectric liquids can be explained in terms of monopolar or bipolar injection from these charged layers.","PeriodicalId":130178,"journal":{"name":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","volume":"153 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127032429","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-09-17DOI: 10.1109/ISEIM.1995.496551
K. Uchida, T. Kawashima, T. Uozumi, Y. Inoue, S. Fukunaga
The space charge distribution in linear low-density polyethylene (LLDPE) samples with different morphologies was measured using the pulsed electro-acoustic method to investigate the relationship to DC breakdown strength.
{"title":"Effects of morphology on space charge distribution in polyethylene","authors":"K. Uchida, T. Kawashima, T. Uozumi, Y. Inoue, S. Fukunaga","doi":"10.1109/ISEIM.1995.496551","DOIUrl":"https://doi.org/10.1109/ISEIM.1995.496551","url":null,"abstract":"The space charge distribution in linear low-density polyethylene (LLDPE) samples with different morphologies was measured using the pulsed electro-acoustic method to investigate the relationship to DC breakdown strength.","PeriodicalId":130178,"journal":{"name":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128859239","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-09-17DOI: 10.1109/ISEIM.1995.496554
H. Kon, Y. Suzuoki, T. Mizutani, N. Yoshifuji
Space charge in insulating polymers is known to affect high field phenomena such as conduction and breakdown. Recently, space-charge behavior has become widely studied by utilizing various direct space-charge probing techniques, e.g. the pulse electroacoustic (PEA) method and the laser-induced-pressure-pulse ( LIPP) technique. Dynamic behavior of space charge is considered to be very important especially under very high field. Recently, packet-like space-charge behavior was reported in a power cable under high stress. We observed similar packet charge in polyethylene (PE) thin films. This report concerns packet-like space charge behavior in PE films, its relation to conduction current and its possible origin.
{"title":"Packet-like space-charge behavior and conduction current in polyethylene for cable insulation","authors":"H. Kon, Y. Suzuoki, T. Mizutani, N. Yoshifuji","doi":"10.1109/ISEIM.1995.496554","DOIUrl":"https://doi.org/10.1109/ISEIM.1995.496554","url":null,"abstract":"Space charge in insulating polymers is known to affect high field phenomena such as conduction and breakdown. Recently, space-charge behavior has become widely studied by utilizing various direct space-charge probing techniques, e.g. the pulse electroacoustic (PEA) method and the laser-induced-pressure-pulse ( LIPP) technique. Dynamic behavior of space charge is considered to be very important especially under very high field. Recently, packet-like space-charge behavior was reported in a power cable under high stress. We observed similar packet charge in polyethylene (PE) thin films. This report concerns packet-like space charge behavior in PE films, its relation to conduction current and its possible origin.","PeriodicalId":130178,"journal":{"name":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123025840","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-09-17DOI: 10.1109/ISEIM.1995.496536
L. Zhang, S. Wu, N. Gao, Min, Yang Wu, Heng-Kun Xei
The effects of an interface in polymer materials was investigated by the Du Pont 983 DMA instrument. Experimental results of PP and its blends have especially been made and some important DMA curves were analyzed in order to explain the effects of the blend on dynamic mechanical properties. All these will be useful for further research on the effect of interfaces.
{"title":"Effect of interface on DMA of polymer","authors":"L. Zhang, S. Wu, N. Gao, Min, Yang Wu, Heng-Kun Xei","doi":"10.1109/ISEIM.1995.496536","DOIUrl":"https://doi.org/10.1109/ISEIM.1995.496536","url":null,"abstract":"The effects of an interface in polymer materials was investigated by the Du Pont 983 DMA instrument. Experimental results of PP and its blends have especially been made and some important DMA curves were analyzed in order to explain the effects of the blend on dynamic mechanical properties. All these will be useful for further research on the effect of interfaces.","PeriodicalId":130178,"journal":{"name":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","volume":"201 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123025972","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-09-17DOI: 10.1109/ISEIM.1995.496532
Kai Wu, Zhang Chengwei, Guangnying Wu, Hengkun Xie
On the basis of the fractal model for describing the shapes of breakdown paths (including trees), and considering the influence of local electrical field on treeing growth rate, a new model is put forward to describe the characteristic of treeing growth with time. It is found that the changes of the local field around the tree tip directly determine the variations of treeing growth rate with time. The characteristics of treeing growth under different voltages are analyzed by using this model.
{"title":"A new fractal model for describing time-dependence of treeing growth","authors":"Kai Wu, Zhang Chengwei, Guangnying Wu, Hengkun Xie","doi":"10.1109/ISEIM.1995.496532","DOIUrl":"https://doi.org/10.1109/ISEIM.1995.496532","url":null,"abstract":"On the basis of the fractal model for describing the shapes of breakdown paths (including trees), and considering the influence of local electrical field on treeing growth rate, a new model is put forward to describe the characteristic of treeing growth with time. It is found that the changes of the local field around the tree tip directly determine the variations of treeing growth rate with time. The characteristics of treeing growth under different voltages are analyzed by using this model.","PeriodicalId":130178,"journal":{"name":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","volume":"86 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132721789","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-09-17DOI: 10.1109/ISEIM.1995.496535
A. Kawamoto, Y. Suzuoki, T. Ikejiri, T. Mizutani, M. Ieda
In the composites of PS(polystyrene) and PMMA( polymethyl-methacrylate), electrons transported from the PMMA layer can pass through the interface more easily than holes from the PMMA layer. Holes from the PS layer can pass through the interface more easily than electrons from the PS layer. As exemplified above, the charge-exchange rate at the interface in insulating composites is affected by the direction of the carrier transport. These asymmetric characteristics are widely seen in insulating composites, such as epoxy-alumina, and seem very important for the better understanding of the insulation performance of the composites. The photoinjection current technique was utilized in order to estimate the conduction levels in PS and PMMA. In this paper, the charge-exchange processes at the polymer-polymer interface are discussed mainly on the basis of the conduction levels in polymers.
{"title":"Photoinjection currents in polymers and electronic charge-exchange at the interface in insulating composites","authors":"A. Kawamoto, Y. Suzuoki, T. Ikejiri, T. Mizutani, M. Ieda","doi":"10.1109/ISEIM.1995.496535","DOIUrl":"https://doi.org/10.1109/ISEIM.1995.496535","url":null,"abstract":"In the composites of PS(polystyrene) and PMMA( polymethyl-methacrylate), electrons transported from the PMMA layer can pass through the interface more easily than holes from the PMMA layer. Holes from the PS layer can pass through the interface more easily than electrons from the PS layer. As exemplified above, the charge-exchange rate at the interface in insulating composites is affected by the direction of the carrier transport. These asymmetric characteristics are widely seen in insulating composites, such as epoxy-alumina, and seem very important for the better understanding of the insulation performance of the composites. The photoinjection current technique was utilized in order to estimate the conduction levels in PS and PMMA. In this paper, the charge-exchange processes at the polymer-polymer interface are discussed mainly on the basis of the conduction levels in polymers.","PeriodicalId":130178,"journal":{"name":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133762018","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-09-17DOI: 10.1109/ISEIM.1995.496557
M. Onoda, K. Yoshino
The layer-by-layer self-assembly of charged polymers has recently emerged as a versatile means of processing conjugated polymers into ultra thin films with an unprecedented control over thickness and molecular architecture. To date, this method has been successfully utilized to manipulate conjugated and nonconjugated polyions, etc. Multilayer heterostructures have been designed and fabricated from various combinations of these materials to study properties unique to the specific supramolecular organizations created. In this paper, layer-by-layer self-assembly was used to fabricate extremely thin films of conducting polymers such as sulfonated polyaniline (SPAn) and poly(p-phenylene vinylene) (PPV). Finally, the fabrication of thin film light-emitting diodes based on self-assembled PPV active layers is described.
{"title":"Unique electrical properties of self-assembled ultra-thin polymer film","authors":"M. Onoda, K. Yoshino","doi":"10.1109/ISEIM.1995.496557","DOIUrl":"https://doi.org/10.1109/ISEIM.1995.496557","url":null,"abstract":"The layer-by-layer self-assembly of charged polymers has recently emerged as a versatile means of processing conjugated polymers into ultra thin films with an unprecedented control over thickness and molecular architecture. To date, this method has been successfully utilized to manipulate conjugated and nonconjugated polyions, etc. Multilayer heterostructures have been designed and fabricated from various combinations of these materials to study properties unique to the specific supramolecular organizations created. In this paper, layer-by-layer self-assembly was used to fabricate extremely thin films of conducting polymers such as sulfonated polyaniline (SPAn) and poly(p-phenylene vinylene) (PPV). Finally, the fabrication of thin film light-emitting diodes based on self-assembled PPV active layers is described.","PeriodicalId":130178,"journal":{"name":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","volume":"42 ","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131433517","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-09-17DOI: 10.1109/ISEIM.1995.496517
S. D. Khanin
The paper presents the results of investigating the electronic conduction and destruction of amorphous tantalum and niobium oxides (a-Ta/sub 2/O/sub 5/, a-Nb/sub 2/O/sub 5/) in thin anodic layers on metal surfaces in strong electric fields. It is shown that the breakdown of a highly homogeneous oxide dielectric is preceded by storage processes (dielectric aging).
{"title":"Electrical conduction and breakdown in amorphous tantalum and niobium oxide films","authors":"S. D. Khanin","doi":"10.1109/ISEIM.1995.496517","DOIUrl":"https://doi.org/10.1109/ISEIM.1995.496517","url":null,"abstract":"The paper presents the results of investigating the electronic conduction and destruction of amorphous tantalum and niobium oxides (a-Ta/sub 2/O/sub 5/, a-Nb/sub 2/O/sub 5/) in thin anodic layers on metal surfaces in strong electric fields. It is shown that the breakdown of a highly homogeneous oxide dielectric is preceded by storage processes (dielectric aging).","PeriodicalId":130178,"journal":{"name":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","volume":"95 3","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131550050","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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