Physical property data such as hardness has been used in the manufacture of materials for many years. This information has become increasingly valuable because of the emphasis for continuous improvement in optical quality and its corresponding cost and more recently the emergence of CAD/CAM optics manufacturing technology such as Opticam. Radius of curvature and subsurface damage specifications can be tightly controlled while reducing the need for laborious and cost-intensive manufacture of precision optics, including infrared glasses and crystalline structures.
{"title":"Establishing a relationship between Static and Dynamic Hardness Testing of Materials","authors":"K. Cerqua-Richardson, J. Ruckart","doi":"10.1364/oft.1994.otuc3","DOIUrl":"https://doi.org/10.1364/oft.1994.otuc3","url":null,"abstract":"Physical property data such as hardness has been used in the manufacture of materials for many years. This information has become increasingly valuable because of the emphasis for continuous improvement in optical quality and its corresponding cost and more recently the emergence of CAD/CAM optics manufacturing technology such as Opticam. Radius of curvature and subsurface damage specifications can be tightly controlled while reducing the need for laborious and cost-intensive manufacture of precision optics, including infrared glasses and crystalline structures.","PeriodicalId":142307,"journal":{"name":"Optical Fabrication and Testing Workshop","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126407834","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A method for evaluating the performance of an optical system has been developed. The method is based on a comparison between the actual wavefront as measured at the output of the optical system under test and a simulated wavefront corresponding to the nominal system. In this way information regarding fabrication related defects can be obtained, in other words the difference in performance between the actual system and the nominal system corresponding to the design prescription can be appraised.
{"title":"A method of interferogram interpretation.","authors":"G. Pinto, G. Vietri","doi":"10.1364/oft.1985.thcc4","DOIUrl":"https://doi.org/10.1364/oft.1985.thcc4","url":null,"abstract":"A method for evaluating the performance of an optical system has been developed. The method is based on a comparison between the actual wavefront as measured at the output of the optical system under test and a simulated wavefront corresponding to the nominal system. In this way information regarding fabrication related defects can be obtained, in other words the difference in performance between the actual system and the nominal system corresponding to the design prescription can be appraised.","PeriodicalId":142307,"journal":{"name":"Optical Fabrication and Testing Workshop","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125736556","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The accuracy of cnc diamond machining processes in directly related to the form accuracy of the diamond cutting tools available. Consequently both diamond tool manufacturers and machining houses require methods for inspection. The accuracy of the cutting edge which is primarily generated by the intersection of a cylinder/cone with a flat, must be typically 75-150nm. Most test methods rely on observation of the final generated cutting edge via high powered microscope. Unfortunately this means that the diamond tool manufacturer cannot qualify the accuracy of the cylindrical/conical portion of the tool prior to lapping the final flat which generates the final cutting edge. Therefore errors can only be detected on a finished tool which may result in costly re-working.
{"title":"An Interferometric Method For Measurement of the Accuracy of Single Point Contouring Tools for Diamond Machining","authors":"J. K. Myler","doi":"10.1364/oft.1992.tub3","DOIUrl":"https://doi.org/10.1364/oft.1992.tub3","url":null,"abstract":"The accuracy of cnc diamond machining processes in directly related to the form accuracy of the diamond cutting tools available. Consequently both diamond tool manufacturers and machining houses require methods for inspection. The accuracy of the cutting edge which is primarily generated by the intersection of a cylinder/cone with a flat, must be typically 75-150nm. Most test methods rely on observation of the final generated cutting edge via high powered microscope. Unfortunately this means that the diamond tool manufacturer cannot qualify the accuracy of the cylindrical/conical portion of the tool prior to lapping the final flat which generates the final cutting edge. Therefore errors can only be detected on a finished tool which may result in costly re-working.","PeriodicalId":142307,"journal":{"name":"Optical Fabrication and Testing Workshop","volume":"109 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123846972","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The development of techniques for the rapid production of flats using polishing with a polyurethane pad was previously reported.1 The pad polishing is usually followed with brief (less than one hour) final finishing on a planetary polisher. Optics up to about 200 mm square can be handled with available equipment at Los Alamos National Laboratory (LANL). This approach has become our standard production technique.
使用聚氨酯衬垫进行抛光快速生产平底鞋的技术的发展已经有过报道垫抛光后通常会在行星抛光机上进行短暂(不到一个小时)的最后处理。洛斯阿拉莫斯国家实验室(Los Alamos National Laboratory, LANL)可用的设备可以处理最大约200平方毫米的光学器件。这种方法已经成为我们的标准生产技术。
{"title":"Pad and planetary polishing for rapid fabrication of spherical surfaces","authors":"R. Schmell, R. Berggren","doi":"10.1364/oft.1994.otub4","DOIUrl":"https://doi.org/10.1364/oft.1994.otub4","url":null,"abstract":"The development of techniques for the rapid production of flats using polishing with a polyurethane pad was previously reported.1 The pad polishing is usually followed with brief (less than one hour) final finishing on a planetary polisher. Optics up to about 200 mm square can be handled with available equipment at Los Alamos National Laboratory (LANL). This approach has become our standard production technique.","PeriodicalId":142307,"journal":{"name":"Optical Fabrication and Testing Workshop","volume":"130 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122901060","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
This paper describes the active support system for the primary minor of the Air Force Phillips Laboratory’s Starfire Optical Range 3.5-m telescope, and in particular the optimization of axial forces after the initial installation of the minor in its operational support cell. The project had as its main goal determining the best set of support forces for the minor. Secondary goals involved characterizing the behavior of the support system, and developing techniques to optimize support forces for 6.5-m and 8.4-m minors, which will have 100-150 actuators as compared with 40 actuators for the 3.5-m minor.
{"title":"Use of active optics to optimize the figure of a 3.5-m honeycomb sandwich mirror","authors":"H. Martin","doi":"10.1364/oft.1994.owb1","DOIUrl":"https://doi.org/10.1364/oft.1994.owb1","url":null,"abstract":"This paper describes the active support system for the primary minor of the Air Force Phillips Laboratory’s Starfire Optical Range 3.5-m telescope, and in particular the optimization of axial forces after the initial installation of the minor in its operational support cell. The project had as its main goal determining the best set of support forces for the minor. Secondary goals involved characterizing the behavior of the support system, and developing techniques to optimize support forces for 6.5-m and 8.4-m minors, which will have 100-150 actuators as compared with 40 actuators for the 3.5-m minor.","PeriodicalId":142307,"journal":{"name":"Optical Fabrication and Testing Workshop","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121648014","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Cutter marks, often referred to as mid-spatial frequency errors during deterministic microgrinding, have been observed on the surface of ground spherical components in a series of experiments at the Center for Optics Manufacturing (COM) at the University of Rochester. A simple model is presented to explain the recent observation that the number of cutter marks N during deterministic microgrinding of spherical components is approximately equal to the ratio of tool rotational rate fT (rpm) to work rotational rate fW for a wide range of these parameters. The model is based on the fundamental assumption that both the tool and the work execute steady-state, forced harmonic oscillations, each at its respective driving frequency, and on the observation that for each revolution of the work, the tool executes fT/fW revolutions.
{"title":"Cutter Marks as Vibration-Induced Errors in Deterministic Microgrinding","authors":"J. Lambropoulos, Don Golin","doi":"10.1364/oft.1994.omb3","DOIUrl":"https://doi.org/10.1364/oft.1994.omb3","url":null,"abstract":"Cutter marks, often referred to as mid-spatial frequency errors during deterministic microgrinding, have been observed on the surface of ground spherical components in a series of experiments at the Center for Optics Manufacturing (COM) at the University of Rochester. A simple model is presented to explain the recent observation that the number of cutter marks N during deterministic microgrinding of spherical components is approximately equal to the ratio of tool rotational rate fT (rpm) to work rotational rate fW for a wide range of these parameters. The model is based on the fundamental assumption that both the tool and the work execute steady-state, forced harmonic oscillations, each at its respective driving frequency, and on the observation that for each revolution of the work, the tool executes fT/fW revolutions.","PeriodicalId":142307,"journal":{"name":"Optical Fabrication and Testing Workshop","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127595992","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
REOSC has been awarded by ESO with a contract on July 25, 1989 for the polishing of the four VLT mirrors and the following tasks: - design and manufacture of the mirror handling tool and container, - transportation of each VLT mirror blank from SCHOTT's plant in Mainz (Germany) to REOSC's plant, - design, manufacture and assembly on the mirror of special devices for the mirror fixation in the cell, - grinding, polishing and testing of the four VLT mirrors.
{"title":"Surfacing and Testing of the E.S.O. 8.2m VLT Mirrors","authors":"J. Espiard","doi":"10.1364/oft.1992.tha7","DOIUrl":"https://doi.org/10.1364/oft.1992.tha7","url":null,"abstract":"REOSC has been awarded by ESO with a contract on July 25, 1989 for the polishing of the four VLT mirrors and the following tasks: - design and manufacture of the mirror handling tool and container, - transportation of each VLT mirror blank from SCHOTT's plant in Mainz (Germany) to REOSC's plant, - design, manufacture and assembly on the mirror of special devices for the mirror fixation in the cell, - grinding, polishing and testing of the four VLT mirrors.","PeriodicalId":142307,"journal":{"name":"Optical Fabrication and Testing Workshop","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131769902","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Silicon is a widely used material in IR systems and electronics. Methods to rapidly produce surfaces of a specific geometry that are also free of subsurface damage lead to more cost effective manufacture of silicon products. In particular, we have been led to this study as a potential means of polishing diamond ground aspheric surfaces for IR imaging systems.
{"title":"Diamond Polishing of Silicon","authors":"Robert E. Parks, C. Evans, A. Bartos","doi":"10.1364/oft.1994.otua1","DOIUrl":"https://doi.org/10.1364/oft.1994.otua1","url":null,"abstract":"Silicon is a widely used material in IR systems and electronics. Methods to rapidly produce surfaces of a specific geometry that are also free of subsurface damage lead to more cost effective manufacture of silicon products. In particular, we have been led to this study as a potential means of polishing diamond ground aspheric surfaces for IR imaging systems.","PeriodicalId":142307,"journal":{"name":"Optical Fabrication and Testing Workshop","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134252237","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Baffles in optical systems are internal surfaces that control or suppress stray radiation, typically using geometrically designed vanes and surface morphology. Baffles perform a major role in determining the signal-to-noise level of many optical systems. While a few commercially available baffle materials meet optical requirments, current industrial baffle materials do not meet survivability and endurability needs; i.e, thermal, mechanical, and chemical stability requirements. The major problem is the generation of particles from the baffle surfaces during transport and operation which degrade the image quality.
{"title":"Advanced Optically Black Baffles","authors":"R. D. Seals","doi":"10.1364/oft.1992.thc6","DOIUrl":"https://doi.org/10.1364/oft.1992.thc6","url":null,"abstract":"Baffles in optical systems are internal surfaces that control or suppress stray radiation, typically using geometrically designed vanes and surface morphology. Baffles perform a major role in determining the signal-to-noise level of many optical systems. While a few commercially available baffle materials meet optical requirments, current industrial baffle materials do not meet survivability and endurability needs; i.e, thermal, mechanical, and chemical stability requirements. The major problem is the generation of particles from the baffle surfaces during transport and operation which degrade the image quality.","PeriodicalId":142307,"journal":{"name":"Optical Fabrication and Testing Workshop","volume":"79 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114635061","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A fundamental evaluation of issues affecting the fabrication of infrared-transmitting materials has been initiated as part of the Center for Optics Manufacturing's (COM) Process Science effort. The study, which will investigate the effect of process conditions on resulting material properties and optical quality, is aimed at improving the database of manufacturing related parameters which will lead to increased fabrication efficiency. The objectives and goals of the program will be reviewed.
{"title":"\"Process Science of Infrared Materials\"","authors":"K. Cerqua-Richardson, G. Platt, J. Vakiner","doi":"10.1364/oft.1992.tuc4","DOIUrl":"https://doi.org/10.1364/oft.1992.tuc4","url":null,"abstract":"A fundamental evaluation of issues affecting the fabrication of infrared-transmitting materials has been initiated as part of the Center for Optics Manufacturing's (COM) Process Science effort. The study, which will investigate the effect of process conditions on resulting material properties and optical quality, is aimed at improving the database of manufacturing related parameters which will lead to increased fabrication efficiency. The objectives and goals of the program will be reviewed.","PeriodicalId":142307,"journal":{"name":"Optical Fabrication and Testing Workshop","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114414949","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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