Pub Date : 1993-10-17DOI: 10.1109/CEIDP.1993.378974
N. Femia, M. Vitelli, G. Lupò, V. Tucci
The authors give a brief description of the transport properties in fractal materials and present results concerning the dependence of the power law exponent on the applied electric field. Interesting properties concerning the anisotropic structure of grading materials which can revealed by analyzing this dependence are discussed. Experimental data are presented, indicating the validity of the CTRW (continuous-time random walk) approach to explaining the power law time-dependence of the decaying current in composite materials.<>
{"title":"Electrical field dependence of charge carrier dynamics in disordered materials","authors":"N. Femia, M. Vitelli, G. Lupò, V. Tucci","doi":"10.1109/CEIDP.1993.378974","DOIUrl":"https://doi.org/10.1109/CEIDP.1993.378974","url":null,"abstract":"The authors give a brief description of the transport properties in fractal materials and present results concerning the dependence of the power law exponent on the applied electric field. Interesting properties concerning the anisotropic structure of grading materials which can revealed by analyzing this dependence are discussed. Experimental data are presented, indicating the validity of the CTRW (continuous-time random walk) approach to explaining the power law time-dependence of the decaying current in composite materials.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130791944","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1993-10-17DOI: 10.1109/CEIDP.1993.378881
W. Otowski, R. Courteau, T. Bose, L. Lamarre
Systematic measurements of dielectric constant and dielectric absorption of field-assembled power cable junctions aged by temperature cycling over a wide range have been performed. Experimental results on dielectric properties for power cable junctions in the frequency range 10/sup -4/ Hz to 1 Hz are reported. Evidence of decreasing dissipation factor with time for short aging time and increasing dissipation factor after a long aging time is presented. Results show that the measurement of the dissipation factor and the relaxation frequency in the low frequency region is useful way to estimate the degradation of the power cable junctions. The chemical and physical changes which can occur because of the aging of the polymer seem to affect the complex dielectric constant at low frequency.<>
{"title":"Effect of temperature and time on the dissipation factor of power cable junctions","authors":"W. Otowski, R. Courteau, T. Bose, L. Lamarre","doi":"10.1109/CEIDP.1993.378881","DOIUrl":"https://doi.org/10.1109/CEIDP.1993.378881","url":null,"abstract":"Systematic measurements of dielectric constant and dielectric absorption of field-assembled power cable junctions aged by temperature cycling over a wide range have been performed. Experimental results on dielectric properties for power cable junctions in the frequency range 10/sup -4/ Hz to 1 Hz are reported. Evidence of decreasing dissipation factor with time for short aging time and increasing dissipation factor after a long aging time is presented. Results show that the measurement of the dissipation factor and the relaxation frequency in the low frequency region is useful way to estimate the degradation of the power cable junctions. The chemical and physical changes which can occur because of the aging of the polymer seem to affect the complex dielectric constant at low frequency.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132397726","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1993-10-17DOI: 10.1109/CEIDP.1993.378890
H. Li, B. Crichton, R. Fouracre, M. Given, Y. Liang
In an attempt to understand ion specific properties and the significance of oxidation in the water treeing process, an experimental examination of oxidation and tree growth in LDPE has been undertaken. In a series of water tree growth tests, conditions promoting oxidation were present either during or prior to tree development. FTIR (Fourier-transform infrared) techniques were employed to assess any oxidation occurring during tree growth in samples aged in the laboratory using ionic solutions of FeCl/sub 3/, KMnO/sub 4/, or LiCl. The lengths of trees grown in virgin and pre-oxidized LDPE using a LiCl solution have been compared. Neither enhanced tree growth nor significant oxidation was observed for LDPE samples aged in strong oxidizing solutions of FeCl/sub 3/ and KMnO/sub 4/. This shows that oxidation is not responsible for the observed tree growth characteristics. Reduced water tree growth was observed in highly oxidized material, indicating that the presence of such material is not significant in the water treeing process and that thermal oxidation alone is unlikely to be important during treeing.<>
{"title":"The role of oxidation in the water treeing progress in low density polyethylene (LDPE)","authors":"H. Li, B. Crichton, R. Fouracre, M. Given, Y. Liang","doi":"10.1109/CEIDP.1993.378890","DOIUrl":"https://doi.org/10.1109/CEIDP.1993.378890","url":null,"abstract":"In an attempt to understand ion specific properties and the significance of oxidation in the water treeing process, an experimental examination of oxidation and tree growth in LDPE has been undertaken. In a series of water tree growth tests, conditions promoting oxidation were present either during or prior to tree development. FTIR (Fourier-transform infrared) techniques were employed to assess any oxidation occurring during tree growth in samples aged in the laboratory using ionic solutions of FeCl/sub 3/, KMnO/sub 4/, or LiCl. The lengths of trees grown in virgin and pre-oxidized LDPE using a LiCl solution have been compared. Neither enhanced tree growth nor significant oxidation was observed for LDPE samples aged in strong oxidizing solutions of FeCl/sub 3/ and KMnO/sub 4/. This shows that oxidation is not responsible for the observed tree growth characteristics. Reduced water tree growth was observed in highly oxidized material, indicating that the presence of such material is not significant in the water treeing process and that thermal oxidation alone is unlikely to be important during treeing.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129239385","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1993-10-17DOI: 10.1109/CEIDP.1993.378943
M. Frechette, M. Côté, R. Larocque
Conditions for the generation of true corona in a plane/point/plane SF/sub 6/ gap are discussed. For quasi-uniform field conditions, it is shown that corona currents can be sustained only in the low-pressure range. As the gas pressure was increased, these currents were totally quenched. In pressurized gas conditions, UV (ultraviolet)-assisted charge-integrated currents were recorded. It was hypothesized that their observed growth with applied voltage was too weak to bring about a self-sustained current over an extended voltage range beyond corona threshold.<>
{"title":"Discharge characteristics in an asymmetrically-perturbed SF/sub 6/ gap","authors":"M. Frechette, M. Côté, R. Larocque","doi":"10.1109/CEIDP.1993.378943","DOIUrl":"https://doi.org/10.1109/CEIDP.1993.378943","url":null,"abstract":"Conditions for the generation of true corona in a plane/point/plane SF/sub 6/ gap are discussed. For quasi-uniform field conditions, it is shown that corona currents can be sustained only in the low-pressure range. As the gas pressure was increased, these currents were totally quenched. In pressurized gas conditions, UV (ultraviolet)-assisted charge-integrated currents were recorded. It was hypothesized that their observed growth with applied voltage was too weak to bring about a self-sustained current over an extended voltage range beyond corona threshold.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"87 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129214229","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1993-10-17DOI: 10.1109/CEIDP.1993.378959
A. Watson, D.H. Ren
High-voltage charge transport in dielectric oil under slowly time-varying voltage conditions is considered. Theoretically the transport is seen to result from the formation and movement of aggregates of trapped charges bounded in tiny cells enclosing Beltram flow fields. Such entities do not interact with the fluid and can therefore accelerate as free particles for finite time intervals. They can react both with the electrostatic field and with an electrodynamic component introduced by detrapping of electrons and subsequent diffusion and retrapping on adjacent field lines, causing rotation of the fluid and mechanical acceleration, /spl omega/ /spl times/ u. This introduces a fluid dynamic analogue of the usual electrodynamic body force, J /spl times/ B. Since vorticity is thus generated, it is manifested as an effective reduction of the fluid viscosity with the superimposed effect of eddies.<>
{"title":"High stress aggregation and transport of electrons in dielectric oil","authors":"A. Watson, D.H. Ren","doi":"10.1109/CEIDP.1993.378959","DOIUrl":"https://doi.org/10.1109/CEIDP.1993.378959","url":null,"abstract":"High-voltage charge transport in dielectric oil under slowly time-varying voltage conditions is considered. Theoretically the transport is seen to result from the formation and movement of aggregates of trapped charges bounded in tiny cells enclosing Beltram flow fields. Such entities do not interact with the fluid and can therefore accelerate as free particles for finite time intervals. They can react both with the electrostatic field and with an electrodynamic component introduced by detrapping of electrons and subsequent diffusion and retrapping on adjacent field lines, causing rotation of the fluid and mechanical acceleration, /spl omega/ /spl times/ u. This introduces a fluid dynamic analogue of the usual electrodynamic body force, J /spl times/ B. Since vorticity is thus generated, it is manifested as an effective reduction of the fluid viscosity with the superimposed effect of eddies.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"114 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117079765","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1993-10-17DOI: 10.1109/CEIDP.1993.378956
S. Ochiai, A. Maeda, T. Ogawa, T. Takagi, M. Ieda, T. Mizutani
A ultrathin polypropylene film (PP film) is deposited on a glass substrate from an evaporating source in vacuum. The temperature of the glass substrate is kept at 100/spl deg/C during the deposition. The thin PP film is about 100/spl Aring/ in thickness. The film shows a self-healing breakdown in the high field region, and the electrode area gradually decreases. The electric strength of the film was 12.2MV/cm after self-healing breakdown. Its value is higher by a factor 1.7 than that of a conventional film. The conduction current in the ultrathin film is ohmic in the low field region and increases steeply by tunneling injection in the high field region.<>
{"title":"Electrical properties of ultra thin evaporated polypropylene films","authors":"S. Ochiai, A. Maeda, T. Ogawa, T. Takagi, M. Ieda, T. Mizutani","doi":"10.1109/CEIDP.1993.378956","DOIUrl":"https://doi.org/10.1109/CEIDP.1993.378956","url":null,"abstract":"A ultrathin polypropylene film (PP film) is deposited on a glass substrate from an evaporating source in vacuum. The temperature of the glass substrate is kept at 100/spl deg/C during the deposition. The thin PP film is about 100/spl Aring/ in thickness. The film shows a self-healing breakdown in the high field region, and the electrode area gradually decreases. The electric strength of the film was 12.2MV/cm after self-healing breakdown. Its value is higher by a factor 1.7 than that of a conventional film. The conduction current in the ultrathin film is ohmic in the low field region and increases steeply by tunneling injection in the high field region.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124388755","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1993-10-17DOI: 10.1109/CEIDP.1993.378904
K. Iida, R. Nakanishi, S. Nakamura, G. Sawa, T. Okumura, C. Takeya
Polyamideimide (PAI) composite film containing 57 phr glass was prepared by the sol-gel process starting from metal alkoxides. The film is flexible, pale yellow, and transparent. The fracture surface indicates that the glass particles are uniformly dispersed and have a diameter of less than 0.1 /spl mu/m. The dielectric breakdown strength Eb of the glass-PAI film is almost equal to that of the PAI film. Eb decreases with sample thickness from 0.4 to 1.3 /spl mu/m and decreases with temperature from room temperature to 300/spl deg/C. These results indicate that PAI can be filled with the solgel glass without the introduction of defects which affect the dielectric breakdown. Eb is lowered by aging at 300/spl deg/C. The Eb of glass-PAI film decreases more than the Eb of PAI film. The decrease in Eb seems to be caused by oxidation of silane coupling agent as well as diphenylmethane groups in the PAI chain.<>
{"title":"Preparation of polyamideimide films containing glass by sol-gel process and their dielectric breakdown","authors":"K. Iida, R. Nakanishi, S. Nakamura, G. Sawa, T. Okumura, C. Takeya","doi":"10.1109/CEIDP.1993.378904","DOIUrl":"https://doi.org/10.1109/CEIDP.1993.378904","url":null,"abstract":"Polyamideimide (PAI) composite film containing 57 phr glass was prepared by the sol-gel process starting from metal alkoxides. The film is flexible, pale yellow, and transparent. The fracture surface indicates that the glass particles are uniformly dispersed and have a diameter of less than 0.1 /spl mu/m. The dielectric breakdown strength Eb of the glass-PAI film is almost equal to that of the PAI film. Eb decreases with sample thickness from 0.4 to 1.3 /spl mu/m and decreases with temperature from room temperature to 300/spl deg/C. These results indicate that PAI can be filled with the solgel glass without the introduction of defects which affect the dielectric breakdown. Eb is lowered by aging at 300/spl deg/C. The Eb of glass-PAI film decreases more than the Eb of PAI film. The decrease in Eb seems to be caused by oxidation of silane coupling agent as well as diphenylmethane groups in the PAI chain.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"125 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124528773","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1993-10-17DOI: 10.1109/CEIDP.1993.378991
A. Jonscher
The universal dielectric response follows a frequency dependence of the complex susceptibility given by a fractional power law in which the ratio of energy lost per radian to energy stored at the peak is independent of frequency. It is shown that this energy criterion can be satisfied in any solid state system in which the energy lost in every microscopic reversal of polarization is independent of the rate of reversals. Specific models are discussed, such as dipolar and charge carrier polarizations in solids, and it is shown that the exponent n is related to the density of the polarizing species and also to the dipole length, which in the case of hopping charge carriers means the hopping distance. The limiting forms of dielectric response corresponding to the flat low-loss behavior characteristic of good insulators, with n /spl rarr/ 1, are obtained with low density systems. In high-density systems the highly lossy Debye-like dipolar or low-frequency dispersion charge carrier response is found to be in good agreement with experimental observations.<>
{"title":"The energy criterion in the interpretation of the universal dielectric response","authors":"A. Jonscher","doi":"10.1109/CEIDP.1993.378991","DOIUrl":"https://doi.org/10.1109/CEIDP.1993.378991","url":null,"abstract":"The universal dielectric response follows a frequency dependence of the complex susceptibility given by a fractional power law in which the ratio of energy lost per radian to energy stored at the peak is independent of frequency. It is shown that this energy criterion can be satisfied in any solid state system in which the energy lost in every microscopic reversal of polarization is independent of the rate of reversals. Specific models are discussed, such as dipolar and charge carrier polarizations in solids, and it is shown that the exponent n is related to the density of the polarizing species and also to the dipole length, which in the case of hopping charge carriers means the hopping distance. The limiting forms of dielectric response corresponding to the flat low-loss behavior characteristic of good insulators, with n /spl rarr/ 1, are obtained with low density systems. In high-density systems the highly lossy Debye-like dipolar or low-frequency dispersion charge carrier response is found to be in good agreement with experimental observations.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"125 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124540673","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1993-10-17DOI: 10.1109/CEIDP.1993.378972
K. Suh, J. Lee, J. Park, T. Takada
PE (polyethylene)/PE laminates were selected as test specimens to simulate the interface of blends, and their charge formation characteristics have been investigated. Charge behavior in PE/polymer laminates is shown to differ depending on the type of laminates. In laminates with PE and EVA, the charge tends to be trapped in the PE component and migrate through the interface relatively freely. In laminates with PE/ionomer, however the charge is trapped dominantly. It was also found that the nature of the interface may be modified to make the charge migrate through the interface. The charge accumulation characteristics of the laminates are governed by the type of polymer in the middle layer and do not resemble those of the parent polymers.<>
{"title":"Charge formation in PE/Polymer laminates","authors":"K. Suh, J. Lee, J. Park, T. Takada","doi":"10.1109/CEIDP.1993.378972","DOIUrl":"https://doi.org/10.1109/CEIDP.1993.378972","url":null,"abstract":"PE (polyethylene)/PE laminates were selected as test specimens to simulate the interface of blends, and their charge formation characteristics have been investigated. Charge behavior in PE/polymer laminates is shown to differ depending on the type of laminates. In laminates with PE and EVA, the charge tends to be trapped in the PE component and migrate through the interface relatively freely. In laminates with PE/ionomer, however the charge is trapped dominantly. It was also found that the nature of the interface may be modified to make the charge migrate through the interface. The charge accumulation characteristics of the laminates are governed by the type of polymer in the middle layer and do not resemble those of the parent polymers.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122116275","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1993-10-17DOI: 10.1109/CEIDP.1993.378938
R. Shobha, R. Nema
The effect of cavity dimensions such as diameter (0.9 mm to 3.2 mm) and depth (40 /spl mu/m to 200 /spl mu/m) on the various PD (partial discharge) characteristics and the related breakdown of thin PP (polypropylene) films was studied experimentally. The inception voltage is found to increase with decreasing cavity diameter for a given depth and with increasing cavity depth for a given diameter. Measurements of discharge magnitudes indicate that a single discharge does not completely discharge the entire cavity. The discharge pulse magnitudes, number, and distribution depend on the diameter as well as the depth of the cavity. Experimental and calculated values of maximum discharge magnitude for different diameters and depths of the cavity indicate that there is an increasing deviation between the calculated and experimental values as the cavity diameter increases. This implies that only a part of the cavity and not the whole of discharges.<>
实验研究了腔体直径(0.9 mm ~ 3.2 mm)和腔体深度(40 ~ 200 /spl mu/m)对PP(聚丙烯)薄膜各种局部放电特性及相关击穿的影响。发现在一定深度下，起始电压随空腔直径的减小而增大，在一定直径下，随空腔深度的增大而增大。放电幅度的测量表明，单次放电不能完全放电整个腔。放电脉冲的大小、数量和分布取决于腔体的直径和深度。不同空腔直径和深度下的最大放电幅度的实验值和计算值表明，随着空腔直径的增大，计算值与实验值之间的偏差越来越大。这意味着只有一部分腔体而不是全部放电
{"title":"Internal partial discharge and breakdown characteristics of thin polypropylene films","authors":"R. Shobha, R. Nema","doi":"10.1109/CEIDP.1993.378938","DOIUrl":"https://doi.org/10.1109/CEIDP.1993.378938","url":null,"abstract":"The effect of cavity dimensions such as diameter (0.9 mm to 3.2 mm) and depth (40 /spl mu/m to 200 /spl mu/m) on the various PD (partial discharge) characteristics and the related breakdown of thin PP (polypropylene) films was studied experimentally. The inception voltage is found to increase with decreasing cavity diameter for a given depth and with increasing cavity depth for a given diameter. Measurements of discharge magnitudes indicate that a single discharge does not completely discharge the entire cavity. The discharge pulse magnitudes, number, and distribution depend on the diameter as well as the depth of the cavity. Experimental and calculated values of maximum discharge magnitude for different diameters and depths of the cavity indicate that there is an increasing deviation between the calculated and experimental values as the cavity diameter increases. This implies that only a part of the cavity and not the whole of discharges.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115510262","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：