Pub Date : 1993-10-17DOI: 10.1109/CEIDP.1993.378924
B. Pahlavanpour, G. Duffy
Furfuraldehyde (FFA) has been measured colorimetrically in gas oil and hydrocarbon oil. The method is based on reaction between FFA and aniline acetate solution to produce a bright pink color. The intensity of the color is measured spectrophotometrically. This rapid technique of color development was applied to the determination of FFA in transformer oil. The method is sensitive to sub-ppm FFA in transformer oil. The results are comparable with those obtained using the high-performance liquid chromatography method.<>
{"title":"Development of a rapid spectrophotometry method for analysis of furfuraldehyde in transformer oil as an indication of paper ageing","authors":"B. Pahlavanpour, G. Duffy","doi":"10.1109/CEIDP.1993.378924","DOIUrl":"https://doi.org/10.1109/CEIDP.1993.378924","url":null,"abstract":"Furfuraldehyde (FFA) has been measured colorimetrically in gas oil and hydrocarbon oil. The method is based on reaction between FFA and aniline acetate solution to produce a bright pink color. The intensity of the color is measured spectrophotometrically. This rapid technique of color development was applied to the determination of FFA in transformer oil. The method is sensitive to sub-ppm FFA in transformer oil. The results are comparable with those obtained using the high-performance liquid chromatography method.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121779761","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1993-10-17DOI: 10.1109/CEIDP.1993.378972
K. Suh, J. Lee, J. Park, T. Takada
PE (polyethylene)/PE laminates were selected as test specimens to simulate the interface of blends, and their charge formation characteristics have been investigated. Charge behavior in PE/polymer laminates is shown to differ depending on the type of laminates. In laminates with PE and EVA, the charge tends to be trapped in the PE component and migrate through the interface relatively freely. In laminates with PE/ionomer, however the charge is trapped dominantly. It was also found that the nature of the interface may be modified to make the charge migrate through the interface. The charge accumulation characteristics of the laminates are governed by the type of polymer in the middle layer and do not resemble those of the parent polymers.<>
{"title":"Charge formation in PE/Polymer laminates","authors":"K. Suh, J. Lee, J. Park, T. Takada","doi":"10.1109/CEIDP.1993.378972","DOIUrl":"https://doi.org/10.1109/CEIDP.1993.378972","url":null,"abstract":"PE (polyethylene)/PE laminates were selected as test specimens to simulate the interface of blends, and their charge formation characteristics have been investigated. Charge behavior in PE/polymer laminates is shown to differ depending on the type of laminates. In laminates with PE and EVA, the charge tends to be trapped in the PE component and migrate through the interface relatively freely. In laminates with PE/ionomer, however the charge is trapped dominantly. It was also found that the nature of the interface may be modified to make the charge migrate through the interface. The charge accumulation characteristics of the laminates are governed by the type of polymer in the middle layer and do not resemble those of the parent polymers.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122116275","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1993-10-17DOI: 10.1109/CEIDP.1993.378904
K. Iida, R. Nakanishi, S. Nakamura, G. Sawa, T. Okumura, C. Takeya
Polyamideimide (PAI) composite film containing 57 phr glass was prepared by the sol-gel process starting from metal alkoxides. The film is flexible, pale yellow, and transparent. The fracture surface indicates that the glass particles are uniformly dispersed and have a diameter of less than 0.1 /spl mu/m. The dielectric breakdown strength Eb of the glass-PAI film is almost equal to that of the PAI film. Eb decreases with sample thickness from 0.4 to 1.3 /spl mu/m and decreases with temperature from room temperature to 300/spl deg/C. These results indicate that PAI can be filled with the solgel glass without the introduction of defects which affect the dielectric breakdown. Eb is lowered by aging at 300/spl deg/C. The Eb of glass-PAI film decreases more than the Eb of PAI film. The decrease in Eb seems to be caused by oxidation of silane coupling agent as well as diphenylmethane groups in the PAI chain.<>
{"title":"Preparation of polyamideimide films containing glass by sol-gel process and their dielectric breakdown","authors":"K. Iida, R. Nakanishi, S. Nakamura, G. Sawa, T. Okumura, C. Takeya","doi":"10.1109/CEIDP.1993.378904","DOIUrl":"https://doi.org/10.1109/CEIDP.1993.378904","url":null,"abstract":"Polyamideimide (PAI) composite film containing 57 phr glass was prepared by the sol-gel process starting from metal alkoxides. The film is flexible, pale yellow, and transparent. The fracture surface indicates that the glass particles are uniformly dispersed and have a diameter of less than 0.1 /spl mu/m. The dielectric breakdown strength Eb of the glass-PAI film is almost equal to that of the PAI film. Eb decreases with sample thickness from 0.4 to 1.3 /spl mu/m and decreases with temperature from room temperature to 300/spl deg/C. These results indicate that PAI can be filled with the solgel glass without the introduction of defects which affect the dielectric breakdown. Eb is lowered by aging at 300/spl deg/C. The Eb of glass-PAI film decreases more than the Eb of PAI film. The decrease in Eb seems to be caused by oxidation of silane coupling agent as well as diphenylmethane groups in the PAI chain.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"125 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124528773","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1993-10-17DOI: 10.1109/CEIDP.1993.378991
A. Jonscher
The universal dielectric response follows a frequency dependence of the complex susceptibility given by a fractional power law in which the ratio of energy lost per radian to energy stored at the peak is independent of frequency. It is shown that this energy criterion can be satisfied in any solid state system in which the energy lost in every microscopic reversal of polarization is independent of the rate of reversals. Specific models are discussed, such as dipolar and charge carrier polarizations in solids, and it is shown that the exponent n is related to the density of the polarizing species and also to the dipole length, which in the case of hopping charge carriers means the hopping distance. The limiting forms of dielectric response corresponding to the flat low-loss behavior characteristic of good insulators, with n /spl rarr/ 1, are obtained with low density systems. In high-density systems the highly lossy Debye-like dipolar or low-frequency dispersion charge carrier response is found to be in good agreement with experimental observations.<>
{"title":"The energy criterion in the interpretation of the universal dielectric response","authors":"A. Jonscher","doi":"10.1109/CEIDP.1993.378991","DOIUrl":"https://doi.org/10.1109/CEIDP.1993.378991","url":null,"abstract":"The universal dielectric response follows a frequency dependence of the complex susceptibility given by a fractional power law in which the ratio of energy lost per radian to energy stored at the peak is independent of frequency. It is shown that this energy criterion can be satisfied in any solid state system in which the energy lost in every microscopic reversal of polarization is independent of the rate of reversals. Specific models are discussed, such as dipolar and charge carrier polarizations in solids, and it is shown that the exponent n is related to the density of the polarizing species and also to the dipole length, which in the case of hopping charge carriers means the hopping distance. The limiting forms of dielectric response corresponding to the flat low-loss behavior characteristic of good insulators, with n /spl rarr/ 1, are obtained with low density systems. In high-density systems the highly lossy Debye-like dipolar or low-frequency dispersion charge carrier response is found to be in good agreement with experimental observations.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"125 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124540673","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1993-10-17DOI: 10.1109/CEIDP.1993.378923
M. Farzaneh, J. Kiernicki, J. Drapeau
The influence of the physical aspect of ice accumulation and of water conductivity on the withstand voltage of high-voltage (HV) insulators was determined. Two cap-and-pin insulators and one column type insulator were subjected to flashover testing in a climate room. Artificial ice was accumulated from supercooled droplets at an air temperature of -12/spl deg/C. The electrical conductivity of the spray water between 5 and 150 /spl mu/S/cm was adjusted by adding sodium chloride to de-ionized water. The results obtained indicated that, under experimental conditions, the highest probability of flashover resulted from uniform ice accretion. The withstand voltage of the insulators decreased as the conductivity of the spray water increased. In addition, a series of outdoor camera observations made it possible to compare the aspects of ice accretion during actual freezing rain to those obtained in the laboratory.<>
{"title":"AC flashover performance of H.V. insulators under glaze and rime","authors":"M. Farzaneh, J. Kiernicki, J. Drapeau","doi":"10.1109/CEIDP.1993.378923","DOIUrl":"https://doi.org/10.1109/CEIDP.1993.378923","url":null,"abstract":"The influence of the physical aspect of ice accumulation and of water conductivity on the withstand voltage of high-voltage (HV) insulators was determined. Two cap-and-pin insulators and one column type insulator were subjected to flashover testing in a climate room. Artificial ice was accumulated from supercooled droplets at an air temperature of -12/spl deg/C. The electrical conductivity of the spray water between 5 and 150 /spl mu/S/cm was adjusted by adding sodium chloride to de-ionized water. The results obtained indicated that, under experimental conditions, the highest probability of flashover resulted from uniform ice accretion. The withstand voltage of the insulators decreased as the conductivity of the spray water increased. In addition, a series of outdoor camera observations made it possible to compare the aspects of ice accretion during actual freezing rain to those obtained in the laboratory.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123029428","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1993-10-17DOI: 10.1109/CEIDP.1993.378944
H. Sakurai, T. Ueta, S. Itahashi, H. Mitsui, M. Sone
The effect of trimer water cluster on conduction phenomena was investigated using three kinds of liquid dielectrics: di-octhyle-phthalate (DOP), including dimer; acctonitrile (ACT), including dimer and much trimer; and a mixture of ACT and DOP. It is shown that, when the concentration of DOP in the mixture increases, the amount of trimer decreases and the cluster becomes smaller. In the conduction test, it is evident that the conduction current is electron current. It is also shown that, as the amount of trimer decreases and the cluster becomes smaller, the electron current decreases. This conduction phenomena appears to be due to trimer bridges.<>
{"title":"Influence of trimer water cluster in liquid materials on conduction phenomena by using nano-second pulse","authors":"H. Sakurai, T. Ueta, S. Itahashi, H. Mitsui, M. Sone","doi":"10.1109/CEIDP.1993.378944","DOIUrl":"https://doi.org/10.1109/CEIDP.1993.378944","url":null,"abstract":"The effect of trimer water cluster on conduction phenomena was investigated using three kinds of liquid dielectrics: di-octhyle-phthalate (DOP), including dimer; acctonitrile (ACT), including dimer and much trimer; and a mixture of ACT and DOP. It is shown that, when the concentration of DOP in the mixture increases, the amount of trimer decreases and the cluster becomes smaller. In the conduction test, it is evident that the conduction current is electron current. It is also shown that, as the amount of trimer decreases and the cluster becomes smaller, the electron current decreases. This conduction phenomena appears to be due to trimer bridges.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"196 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134496882","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1993-10-17DOI: 10.1109/CEIDP.1993.378967
J. Ganachaud, A. Mokrani
A Monte-Carlo simulation model has been constructed to describe the secondary electron emission of insulator targets. It accounts for the different electron insulator elementary processes. Other aspects relevant to recent developments in the field of space charge physics (distribution of polaron trapping sites, field distribution, etc.) are also included. The conclusions obtained by this method are in good agreement with experimental observations. The study suggests that a realistic simulation model, including elastic effects, the existence of defects and polaron trapping sites and the effect of the electrostatic field, is necessary in order to account for the measured values of the secondary yield in an insulator target like alumina.<>
{"title":"Study of the secondary electron emission of insulators by a Monte-Carlo simulation method","authors":"J. Ganachaud, A. Mokrani","doi":"10.1109/CEIDP.1993.378967","DOIUrl":"https://doi.org/10.1109/CEIDP.1993.378967","url":null,"abstract":"A Monte-Carlo simulation model has been constructed to describe the secondary electron emission of insulator targets. It accounts for the different electron insulator elementary processes. Other aspects relevant to recent developments in the field of space charge physics (distribution of polaron trapping sites, field distribution, etc.) are also included. The conclusions obtained by this method are in good agreement with experimental observations. The study suggests that a realistic simulation model, including elastic effects, the existence of defects and polaron trapping sites and the effect of the electrostatic field, is necessary in order to account for the measured values of the secondary yield in an insulator target like alumina.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"11 2","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132737399","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1993-10-17DOI: 10.1109/CEIDP.1993.378982
D. Moya-Siesse, G. Moya, C. Legressus, G. Blaise
A system able to measure in situ, after charging by an electron beam in a SEM, the energy released for small-sized dielectrics is described. The device observe the phenomena of breakdown during detrapping. Preliminary calibration by the Joule effect and by a laser irradiation technique has shown that the sensitivity of the device presently corresponds, through an amplifier, to an analog signal, giving a deviation of 0.70 /spl mu/Watt/mm. The nature of the thermal event (endothermic or exothermic) can be established by focusing the electron beam on the grounded steel sheet before implantation. Preliminary results show that an exothermic signal may occur during the event produced by the charge detrapping breakdown, whereas a slow detrapping cannot be detected.<>
{"title":"Energy released during space charge relaxation induced breakdown","authors":"D. Moya-Siesse, G. Moya, C. Legressus, G. Blaise","doi":"10.1109/CEIDP.1993.378982","DOIUrl":"https://doi.org/10.1109/CEIDP.1993.378982","url":null,"abstract":"A system able to measure in situ, after charging by an electron beam in a SEM, the energy released for small-sized dielectrics is described. The device observe the phenomena of breakdown during detrapping. Preliminary calibration by the Joule effect and by a laser irradiation technique has shown that the sensitivity of the device presently corresponds, through an amplifier, to an analog signal, giving a deviation of 0.70 /spl mu/Watt/mm. The nature of the thermal event (endothermic or exothermic) can be established by focusing the electron beam on the grounded steel sheet before implantation. Preliminary results show that an exothermic signal may occur during the event produced by the charge detrapping breakdown, whereas a slow detrapping cannot be detected.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"17 5","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133622860","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1993-10-17DOI: 10.1109/CEIDP.1993.378976
M. Khalil
A thermal step method was used to investigate space charge formation in low-density polyethylene (LDPE) and LDPE doped with an inorganic additive. Space charge was formed at a field of about 3.3 /spl times/ 10/sup 5/ Vcm/sup -1/ and at two different temperatures, 40/spl deg/C and 70/spl deg/C. Results indicate that the addition of such an additive considerably reduced the density of the remnant space charge in the doped material and appreciably changed its distribution pattern. It is also shown that the remnant space charge in the doped material is sensitive to the forming temperature, while in the plain material the space charge appears to be insensitive to the change of temperature within the temperature range used.<>
{"title":"Effect of additive and polarization temperature on space charge formation in polyethylene","authors":"M. Khalil","doi":"10.1109/CEIDP.1993.378976","DOIUrl":"https://doi.org/10.1109/CEIDP.1993.378976","url":null,"abstract":"A thermal step method was used to investigate space charge formation in low-density polyethylene (LDPE) and LDPE doped with an inorganic additive. Space charge was formed at a field of about 3.3 /spl times/ 10/sup 5/ Vcm/sup -1/ and at two different temperatures, 40/spl deg/C and 70/spl deg/C. Results indicate that the addition of such an additive considerably reduced the density of the remnant space charge in the doped material and appreciably changed its distribution pattern. It is also shown that the remnant space charge in the doped material is sensitive to the forming temperature, while in the plain material the space charge appears to be insensitive to the change of temperature within the temperature range used.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127133002","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1993-10-17DOI: 10.1109/CEIDP.1993.378993
S. Itahashi, T. Ueta, H. Sakurai, H. Mitsui, M. Sone
An experimental study of the effect of water dimer in insulating oil on conduction phenomena is presented, and results are given. It is shown that saturated hydrocarbons do not include water dimer which combines with molecules of liquids by hydrogen bonds. The conductivity of saturated hydrocarbons is lower than that of alphatic hydrocarbons. The effect of water dimer on conductivity is larger than the conductivity of saturated hydrocarbons. The effect of water dimer on conductivity depends on the size of the molecules of the dielectric liquids.<>
{"title":"Effect of water dimer in insulating oil on conduction phenomena","authors":"S. Itahashi, T. Ueta, H. Sakurai, H. Mitsui, M. Sone","doi":"10.1109/CEIDP.1993.378993","DOIUrl":"https://doi.org/10.1109/CEIDP.1993.378993","url":null,"abstract":"An experimental study of the effect of water dimer in insulating oil on conduction phenomena is presented, and results are given. It is shown that saturated hydrocarbons do not include water dimer which combines with molecules of liquids by hydrogen bonds. The conductivity of saturated hydrocarbons is lower than that of alphatic hydrocarbons. The effect of water dimer on conductivity is larger than the conductivity of saturated hydrocarbons. The effect of water dimer on conductivity depends on the size of the molecules of the dielectric liquids.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"297 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127181292","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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