Pub Date : 1993-10-17DOI: 10.1109/CEIDP.1993.378907
H. Deng, E. Cherney, R. Hackam
The authors present a study of the effects of the particle size of ATH (alumina trihydrate) on the performance of RTV (room-temperature vulcanizing) coatings on fiber glass rod insulators under contamination and wet conditions in a salt-fog chamber. Examination of the surface using attenuated total reflection Fourier transform infrared (FTIR) spectroscopy coupled with determination of the current pulse counts indicates a significant effect of the particle size on the performance of ATH-filled RTV coatings. The best performance leading to the lowest leakage current pulse counts and the longest time to failure was obtained with coatings having 4.5 and 13 /spl mu/m sizes of ATH particles. Measurement of the IR spectra of silicone fluid diffused to the surface shows that the silicone fluid was more pronounced with these two particle sizes.<>
在盐雾室中，研究了三水合氧化铝(ATH)的粒径对玻璃纤维棒绝缘子室温硫化涂层性能的影响。利用衰减全反射傅里叶变换红外光谱(FTIR)对表面进行检查，并结合电流脉冲计数的测定，表明颗粒尺寸对ath填充RTV涂层的性能有显著影响。孔径为4.5 μ m和13 μ m /spl μ m的涂层具有最低的泄漏电流脉冲数和最长的失效时间。对扩散到表面的硅流体的红外光谱测量表明，硅流体在这两种粒径下的表现更为明显。
{"title":"Effects of particles size of ATH fillers on the performance of RTV rubber coatings","authors":"H. Deng, E. Cherney, R. Hackam","doi":"10.1109/CEIDP.1993.378907","DOIUrl":"https://doi.org/10.1109/CEIDP.1993.378907","url":null,"abstract":"The authors present a study of the effects of the particle size of ATH (alumina trihydrate) on the performance of RTV (room-temperature vulcanizing) coatings on fiber glass rod insulators under contamination and wet conditions in a salt-fog chamber. Examination of the surface using attenuated total reflection Fourier transform infrared (FTIR) spectroscopy coupled with determination of the current pulse counts indicates a significant effect of the particle size on the performance of ATH-filled RTV coatings. The best performance leading to the lowest leakage current pulse counts and the longest time to failure was obtained with coatings having 4.5 and 13 /spl mu/m sizes of ATH particles. Measurement of the IR spectra of silicone fluid diffused to the surface shows that the silicone fluid was more pronounced with these two particle sizes.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"62 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126751167","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1993-10-17DOI: 10.1109/CEIDP.1993.378948
M. Pace, I. Alexeff, T. V. Blalock
A computer simulation is performed on the expansion of a low-density region (LDR) at the cathode in stressed hexane, and on the subsequent production of current pulses. Parameters are chosen to give good agreement with several experimental observations. Combining the Watson and Alexeff models in spherical geometry gives reasonably good results as judged by five criteria: the LDR growth at various pressures, the charge per pulse, the time duration of a set of pulses, the damping of LDR growth, and perhaps the LDR-electrode potential. Simulation revealed that the discharges affect growth (and act as a monitor of it); the discharge model of Alexeff thus complements the growth model of Watson.<>
{"title":"Spherical geometry, electromechanical modeling of cathode liquid prebreakdown","authors":"M. Pace, I. Alexeff, T. V. Blalock","doi":"10.1109/CEIDP.1993.378948","DOIUrl":"https://doi.org/10.1109/CEIDP.1993.378948","url":null,"abstract":"A computer simulation is performed on the expansion of a low-density region (LDR) at the cathode in stressed hexane, and on the subsequent production of current pulses. Parameters are chosen to give good agreement with several experimental observations. Combining the Watson and Alexeff models in spherical geometry gives reasonably good results as judged by five criteria: the LDR growth at various pressures, the charge per pulse, the time duration of a set of pulses, the damping of LDR growth, and perhaps the LDR-electrode potential. Simulation revealed that the discharges affect growth (and act as a monitor of it); the discharge model of Alexeff thus complements the growth model of Watson.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125960788","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1993-10-17DOI: 10.1109/CEIDP.1993.378901
D. Auckland, A. Taha, B.R. Varlow
The mechanical properties and corresponding treeing behavior over a wide range of temperatures was measured in both polyester and epoxy resins. Young's modulus, tensile strength, and fracture toughness show a definite decrease in value as the temperature is increased. The material's resistance to crack propagation therefore becomes lower with the application of heat. The main reason for the degradation in mechanical properties is that the material passes through its glass transition point, Tg, during the range of test temperatures. The treeing resistance displays a similar fall as the temperature is increased. The results of the treeing tests show a rapid deterioration in tree resistance, as evidenced by a sharp fall in the number of cycles of applied voltage to produce tree growth to breakdown, which follows the decline in mechanical characteristics in the same temperature range from Tg.<>
{"title":"Correlation of mechanical properties with electrical treeing behaviour at elevated temperatures","authors":"D. Auckland, A. Taha, B.R. Varlow","doi":"10.1109/CEIDP.1993.378901","DOIUrl":"https://doi.org/10.1109/CEIDP.1993.378901","url":null,"abstract":"The mechanical properties and corresponding treeing behavior over a wide range of temperatures was measured in both polyester and epoxy resins. Young's modulus, tensile strength, and fracture toughness show a definite decrease in value as the temperature is increased. The material's resistance to crack propagation therefore becomes lower with the application of heat. The main reason for the degradation in mechanical properties is that the material passes through its glass transition point, Tg, during the range of test temperatures. The treeing resistance displays a similar fall as the temperature is increased. The results of the treeing tests show a rapid deterioration in tree resistance, as evidenced by a sharp fall in the number of cycles of applied voltage to produce tree growth to breakdown, which follows the decline in mechanical characteristics in the same temperature range from Tg.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"71 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127098847","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1993-10-17DOI: 10.1109/CEIDP.1993.378975
H. Gong, C. Gressus, K. H. Oh, X. Ding, C. Ong, B. Tan
Electrons trapped on different cuts of /spl alpha/-quartz are determined. From an SEM (scanning electron microscope) mirror image for the charge potential. Different charging abilities for the various cuts are observed; charging ability decreases with increase of cutting angle. This phenomenon is related to polarization energy, defect density, and stresses.<>
{"title":"The investigation of charging on /spl alpha/-quartz facets by a SEM technique","authors":"H. Gong, C. Gressus, K. H. Oh, X. Ding, C. Ong, B. Tan","doi":"10.1109/CEIDP.1993.378975","DOIUrl":"https://doi.org/10.1109/CEIDP.1993.378975","url":null,"abstract":"Electrons trapped on different cuts of /spl alpha/-quartz are determined. From an SEM (scanning electron microscope) mirror image for the charge potential. Different charging abilities for the various cuts are observed; charging ability decreases with increase of cutting angle. This phenomenon is related to polarization energy, defect density, and stresses.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130631538","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1993-10-17DOI: 10.1109/CEIDP.1993.378928
McAllister, Iain Wilson
The dipole moment of a wall-charged void is examined with reference to the spatial extent of the surface charge density /spl sigma/ and the distribution of this charge. The salient factors influencing the void dipole moment are also examined. From a study of spherical voids, it is shown that, although the /spl sigma/-distribution influences the dipole moment, the spatial extent of /spl sigma/ has a greater influence. This behavior is not unexpected. For a void of fixed dimensions, the smaller the charged surface area, the greater is the charges, and thus the greater the dipole moment.<>
{"title":"The dipole moment of a wall-charged void in a bulk dielectric","authors":"McAllister, Iain Wilson","doi":"10.1109/CEIDP.1993.378928","DOIUrl":"https://doi.org/10.1109/CEIDP.1993.378928","url":null,"abstract":"The dipole moment of a wall-charged void is examined with reference to the spatial extent of the surface charge density /spl sigma/ and the distribution of this charge. The salient factors influencing the void dipole moment are also examined. From a study of spherical voids, it is shown that, although the /spl sigma/-distribution influences the dipole moment, the spatial extent of /spl sigma/ has a greater influence. This behavior is not unexpected. For a void of fixed dimensions, the smaller the charged surface area, the greater is the charges, and thus the greater the dipole moment.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130883703","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1993-10-17DOI: 10.1109/CEIDP.1993.378925
Y. Sheiretov, M. Zahn
The authors present dielectric spectra for oil-impregnated pressboard samples of two different moisture contents at five temperatures. The temperature range examined was 30/spl deg/C to 70/spl deg/C. Results are presented for a relatively dry sample with a moisture content of 1% and for a sample of higher humidity, 3%.<>
{"title":"A study of the temperature and moisture dependent dielectric properties of oil-impregnated pressboard","authors":"Y. Sheiretov, M. Zahn","doi":"10.1109/CEIDP.1993.378925","DOIUrl":"https://doi.org/10.1109/CEIDP.1993.378925","url":null,"abstract":"The authors present dielectric spectra for oil-impregnated pressboard samples of two different moisture contents at five temperatures. The temperature range examined was 30/spl deg/C to 70/spl deg/C. Results are presented for a relatively dry sample with a moisture content of 1% and for a sample of higher humidity, 3%.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130384264","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1993-10-17DOI: 10.1109/CEIDP.1993.378887
T. Czaszejko
A computer model simulating the electrical properties of water trees has been developed. Tree-like patterns of various sizes, grown from a needle electrode, were generated by a random walk process on a rectangular grid of electrical impedances. The rate of change of the total impedance of the grid versus the size of the tree pattern was examined. This was compared with the experimental results of J.D. Cross and J.Y. Koo (1984). The computer model confirms that water in a water tree cluster is contained in a dispersed form. It is shown that, if water tree branches form interconnected, hollow channels, the number of unfilled voids in these channels must be greater than 30% for the changes in the admittance to be comparable with the changes in electric signal recorded by Cross and Koo. The quantity of water must be even smaller if polyethylene, instead of unfilled voids, separates microdrops of water.<>
{"title":"A network model of water tree","authors":"T. Czaszejko","doi":"10.1109/CEIDP.1993.378887","DOIUrl":"https://doi.org/10.1109/CEIDP.1993.378887","url":null,"abstract":"A computer model simulating the electrical properties of water trees has been developed. Tree-like patterns of various sizes, grown from a needle electrode, were generated by a random walk process on a rectangular grid of electrical impedances. The rate of change of the total impedance of the grid versus the size of the tree pattern was examined. This was compared with the experimental results of J.D. Cross and J.Y. Koo (1984). The computer model confirms that water in a water tree cluster is contained in a dispersed form. It is shown that, if water tree branches form interconnected, hollow channels, the number of unfilled voids in these channels must be greater than 30% for the changes in the admittance to be comparable with the changes in electric signal recorded by Cross and Koo. The quantity of water must be even smaller if polyethylene, instead of unfilled voids, separates microdrops of water.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134183543","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1993-10-17DOI: 10.1109/CEIDP.1993.378927
A. Pedersen, G. Crichton, I. W. McAllister, DK-2800 Lyngby, Denmark
The application of electromagnetic field theory to the subject of partial discharges shows that discharging in a void generates large field distortions within the bulk dielectric in the proximity of the void. Such inherent over-stressing of a dielectric could be the effect which triggers the onset of electrical treeing and other damaging processes, and which subsequently precipitates the breakdown of the insulation. If there were a train of partial discharge events per power frequency cycle, then, during each half period, these events would lead to cumulative stress levels within the solid dielectric.<>
{"title":"PD-related stresses in the bulk dielectric and their evaluation","authors":"A. Pedersen, G. Crichton, I. W. McAllister, DK-2800 Lyngby, Denmark","doi":"10.1109/CEIDP.1993.378927","DOIUrl":"https://doi.org/10.1109/CEIDP.1993.378927","url":null,"abstract":"The application of electromagnetic field theory to the subject of partial discharges shows that discharging in a void generates large field distortions within the bulk dielectric in the proximity of the void. Such inherent over-stressing of a dielectric could be the effect which triggers the onset of electrical treeing and other damaging processes, and which subsequently precipitates the breakdown of the insulation. If there were a train of partial discharge events per power frequency cycle, then, during each half period, these events would lead to cumulative stress levels within the solid dielectric.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"589 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132753912","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1993-10-17DOI: 10.1109/CEIDP.1993.378899
J. Xu, A. Garton
An earlier observation of carboxylate ions in vented water trees in service-aged XLPE (cross-linked polyethylene) cable insulation is extended to bow-tie trees in lab-aged XLPE, to bow-tie and vented trees in lab-aged EPR (ethylene-propylene rubber) and to the surface of LDPE (low-density polyethylene) film aged in an electrolytic cell. The initiation sites for bow-tie trees in EPR frequently contain transition metal oxides. Water trees in EPR and lab-aged insulations are shown to share many common features with the more widely studied examples in film-aged XLPE. Ionic materials (carboxylates and metal ions) are present at high concentrations in the trees. The commonality of the chemical state of water trees in filled EPR compared to unfilled XLPE implies a common mechanism.<>
{"title":"Water trees in EPR cable insulation","authors":"J. Xu, A. Garton","doi":"10.1109/CEIDP.1993.378899","DOIUrl":"https://doi.org/10.1109/CEIDP.1993.378899","url":null,"abstract":"An earlier observation of carboxylate ions in vented water trees in service-aged XLPE (cross-linked polyethylene) cable insulation is extended to bow-tie trees in lab-aged XLPE, to bow-tie and vented trees in lab-aged EPR (ethylene-propylene rubber) and to the surface of LDPE (low-density polyethylene) film aged in an electrolytic cell. The initiation sites for bow-tie trees in EPR frequently contain transition metal oxides. Water trees in EPR and lab-aged insulations are shown to share many common features with the more widely studied examples in film-aged XLPE. Ionic materials (carboxylates and metal ions) are present at high concentrations in the trees. The commonality of the chemical state of water trees in filled EPR compared to unfilled XLPE implies a common mechanism.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132778431","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1993-10-17DOI: 10.1109/CEIDP.1993.378918
S. Boggs
In a discussion of high-field conductivity in solid dielectrics, the author inquires as to whether the limiting field is a strong function of the high field conduction model chosen and the model chosen causes substantial variations of other important parameters such as the power density in the high field region. The analysis is based on the AC conduction data of T. M. Tokoro et al. (1992), measured as a function of electric field and temperature. It is suggested that, if a defect-tolerant dielectric could be developed, it would be thermally stable for reasonable defects and power frequency application. Power dissipation and temperature rise do not appear to be strong functions of the model for /spl sigma/(E) when /spl sigma/(E)=/spl omega//spl epsi/ at the same fixed value of E. As a result, a defect-tolerant dielectric appears to be theoretically feasible.<>
{"title":"Implications of high field conductivity in solid dielectrics","authors":"S. Boggs","doi":"10.1109/CEIDP.1993.378918","DOIUrl":"https://doi.org/10.1109/CEIDP.1993.378918","url":null,"abstract":"In a discussion of high-field conductivity in solid dielectrics, the author inquires as to whether the limiting field is a strong function of the high field conduction model chosen and the model chosen causes substantial variations of other important parameters such as the power density in the high field region. The analysis is based on the AC conduction data of T. M. Tokoro et al. (1992), measured as a function of electric field and temperature. It is suggested that, if a defect-tolerant dielectric could be developed, it would be thermally stable for reasonable defects and power frequency application. Power dissipation and temperature rise do not appear to be strong functions of the model for /spl sigma/(E) when /spl sigma/(E)=/spl omega//spl epsi/ at the same fixed value of E. As a result, a defect-tolerant dielectric appears to be theoretically feasible.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"210 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133439897","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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