Pub Date : 1989-09-01DOI: 10.1088/0022-3735/22/9/018
C. Aroca, C. Morón, E. López, M. Sánchez, P. Sánchez
A simple device to cut conductive samples by electroerosion is described. It is expensive and easy to use. The basic idea may be adapted for other configurations.
介绍了一种简单的电侵蚀切割导电样品的装置。它既贵又好用。基本思想可以适用于其他配置。
{"title":"A simple and inexpensive electroerosion device","authors":"C. Aroca, C. Morón, E. López, M. Sánchez, P. Sánchez","doi":"10.1088/0022-3735/22/9/018","DOIUrl":"https://doi.org/10.1088/0022-3735/22/9/018","url":null,"abstract":"A simple device to cut conductive samples by electroerosion is described. It is expensive and easy to use. The basic idea may be adapted for other configurations.","PeriodicalId":16791,"journal":{"name":"Journal of Physics E: Scientific Instruments","volume":"15 1","pages":"780-781"},"PeriodicalIF":0.0,"publicationDate":"1989-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81798420","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1989-09-01DOI: 10.1088/0022-3735/22/9/009
A. Wilson, L. Lambrianidis
The performance of a high take-off angle energy dispersive X-ray spectrometer (EDXS) on a 200 keV STEM has been investigated. A simple modification to the multichannel analyser (MCA) was used to extend the energy range beyond 200 keV to confirm that high energy, backscattered electrons were entering the detector. Up to 50% of the total count rate was observed to be due to these electrons. The spectrometer performance was determined both with and without a carbon filter which was used to stop the backscattered electrons entering the detector. It is shown that these electrons reduce the resolution and increase the dead-time and background noise in the X-ray spectra. The performance of the high take-off angle detector is compared with that of a horizontally mounted detector on a similar 200 keV STEM and a 300 keV STEM.
{"title":"Backscattered electron effects in a high-angle EDXS","authors":"A. Wilson, L. Lambrianidis","doi":"10.1088/0022-3735/22/9/009","DOIUrl":"https://doi.org/10.1088/0022-3735/22/9/009","url":null,"abstract":"The performance of a high take-off angle energy dispersive X-ray spectrometer (EDXS) on a 200 keV STEM has been investigated. A simple modification to the multichannel analyser (MCA) was used to extend the energy range beyond 200 keV to confirm that high energy, backscattered electrons were entering the detector. Up to 50% of the total count rate was observed to be due to these electrons. The spectrometer performance was determined both with and without a carbon filter which was used to stop the backscattered electrons entering the detector. It is shown that these electrons reduce the resolution and increase the dead-time and background noise in the X-ray spectra. The performance of the high take-off angle detector is compared with that of a horizontally mounted detector on a similar 200 keV STEM and a 300 keV STEM.","PeriodicalId":16791,"journal":{"name":"Journal of Physics E: Scientific Instruments","volume":"55 1","pages":"726-729"},"PeriodicalIF":0.0,"publicationDate":"1989-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83094701","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1989-09-01DOI: 10.1088/0022-3735/22/9/015
J. P. Grant, R. Clarke, G. Symm, N. Spyrou
An HP 8510 automatic network analyser and a six-port reflectometer have been used with a purpose-built calculable open-ended coaxial line sensor to measure the reflection coefficients of various materials, including dielectric reference liquids, in the frequency range 50 MHz-2.0 GHz. Factors crucial for calculable measurements have been identified including associated measurement uncertainties. The reference material measurements have been used in critical studies of: a commonly employed lumped equivalent circuit model of the fringing fields of the sensor; and a numerical point-matching theory of the propagating and evanescent modes, at the termination of the sensor. It is concluded that the inverse point-matching theory should enable a more widespread and accurate exploitation of the sensor technique for various applications including those in biomedicine and industrial quality control.
{"title":"A critical study of the open-ended coaxial line sensor technique for RF and microwave complex permittivity measurements","authors":"J. P. Grant, R. Clarke, G. Symm, N. Spyrou","doi":"10.1088/0022-3735/22/9/015","DOIUrl":"https://doi.org/10.1088/0022-3735/22/9/015","url":null,"abstract":"An HP 8510 automatic network analyser and a six-port reflectometer have been used with a purpose-built calculable open-ended coaxial line sensor to measure the reflection coefficients of various materials, including dielectric reference liquids, in the frequency range 50 MHz-2.0 GHz. Factors crucial for calculable measurements have been identified including associated measurement uncertainties. The reference material measurements have been used in critical studies of: a commonly employed lumped equivalent circuit model of the fringing fields of the sensor; and a numerical point-matching theory of the propagating and evanescent modes, at the termination of the sensor. It is concluded that the inverse point-matching theory should enable a more widespread and accurate exploitation of the sensor technique for various applications including those in biomedicine and industrial quality control.","PeriodicalId":16791,"journal":{"name":"Journal of Physics E: Scientific Instruments","volume":"63 1","pages":"757-770"},"PeriodicalIF":0.0,"publicationDate":"1989-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76254701","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1989-09-01DOI: 10.1088/0022-3735/22/9/010
J. C. Nickel, P. Zetner, G. Shen, S. Trajmar
A set of procedures for measuring the absolute elastic and inelastic differential cross sections (DCS) for electronimpact on molecular (atomic) species is described. First the elastic DCS of a test gas is obtained using a relative flow technique which measures the elastic DCS of the test gas in terms of that of helium at each impact energy and angle. Then the inelastic DCS is obtained in terms of the elastic DCS at each impact energy and angle by means of an energy-loss spectrum, corrected for background scattering, containing both elastic and inelastic features. To relate the amplitudes of the inelastic features in the energy-loss spectrum to the amplitude of the elastic peak, it is necessary to know the energy response function of the detector. A procedure for measuring this energy response function is given. The problem of extracting inelastic DCS information from complicated molecular spectra with overlapping inelastic features is discussed.
{"title":"Principles and procedures for determining absolute differential electron-molecule (atom) scattering cross sections","authors":"J. C. Nickel, P. Zetner, G. Shen, S. Trajmar","doi":"10.1088/0022-3735/22/9/010","DOIUrl":"https://doi.org/10.1088/0022-3735/22/9/010","url":null,"abstract":"A set of procedures for measuring the absolute elastic and inelastic differential cross sections (DCS) for electronimpact on molecular (atomic) species is described. First the elastic DCS of a test gas is obtained using a relative flow technique which measures the elastic DCS of the test gas in terms of that of helium at each impact energy and angle. Then the inelastic DCS is obtained in terms of the elastic DCS at each impact energy and angle by means of an energy-loss spectrum, corrected for background scattering, containing both elastic and inelastic features. To relate the amplitudes of the inelastic features in the energy-loss spectrum to the amplitude of the elastic peak, it is necessary to know the energy response function of the detector. A procedure for measuring this energy response function is given. The problem of extracting inelastic DCS information from complicated molecular spectra with overlapping inelastic features is discussed.","PeriodicalId":16791,"journal":{"name":"Journal of Physics E: Scientific Instruments","volume":"13 1","pages":"730-738"},"PeriodicalIF":0.0,"publicationDate":"1989-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76200343","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1989-09-01DOI: 10.1088/0022-3735/22/9/201
P. Vigoureux
{"title":"VIEWPOINT: Eighty-eight years of Giorgi's MKS units","authors":"P. Vigoureux","doi":"10.1088/0022-3735/22/9/201","DOIUrl":"https://doi.org/10.1088/0022-3735/22/9/201","url":null,"abstract":"","PeriodicalId":16791,"journal":{"name":"Journal of Physics E: Scientific Instruments","volume":"44 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"1989-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77623396","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1989-09-01DOI: 10.1088/0022-3735/22/9/005
G. Giugliarelli, P. Tancini, S. Cannistraro
An inexpensive, versatile computer interface for a Varian E109 spectrometer has been realised. This interface, which is constructed using low cost and easily available electronic components, is able to communicate actively (listen and talk mode) with the host computer through the IEEE-488 standard bus. The hardware of the interface provides a means for: controlling the magnetic field without any manipulation of the spectrometer field controller; recording, in a digital form, the EPR analogue signal; and plotting any computer synthesised and/or stored spectrum on the EPR X-Y recorder. All the hardware diagrams and a summary of the data acquisition and processing software are presented.
{"title":"IEEE-488 bus compatible computer interface for an EPR spectrometer","authors":"G. Giugliarelli, P. Tancini, S. Cannistraro","doi":"10.1088/0022-3735/22/9/005","DOIUrl":"https://doi.org/10.1088/0022-3735/22/9/005","url":null,"abstract":"An inexpensive, versatile computer interface for a Varian E109 spectrometer has been realised. This interface, which is constructed using low cost and easily available electronic components, is able to communicate actively (listen and talk mode) with the host computer through the IEEE-488 standard bus. The hardware of the interface provides a means for: controlling the magnetic field without any manipulation of the spectrometer field controller; recording, in a digital form, the EPR analogue signal; and plotting any computer synthesised and/or stored spectrum on the EPR X-Y recorder. All the hardware diagrams and a summary of the data acquisition and processing software are presented.","PeriodicalId":16791,"journal":{"name":"Journal of Physics E: Scientific Instruments","volume":"2 1","pages":"702-708"},"PeriodicalIF":0.0,"publicationDate":"1989-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84483431","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1989-09-01DOI: 10.1088/0022-3735/22/9/021
P. Raerinne, P. Ketolainen
Equipment is described which is used to produce colour centres electrolytically in alkali-halide crystals and to measure their spectra simultaneously using a high-speed spectroradiometer. The colouration process takes place in an inert atmosphere and its progress can be easily followed. A rapid and gentle quenching of the crystal after the colouration is executed by a flow of inert gas. A high-speed spectroradiometer, combined with the furnace, records transmittance spectra of the crystal within a few seconds during the colouration.
{"title":"DESIGN NOTE: Equipment for electrolytic colouration of alkali-halide crystals and their simultaneous spectral recording","authors":"P. Raerinne, P. Ketolainen","doi":"10.1088/0022-3735/22/9/021","DOIUrl":"https://doi.org/10.1088/0022-3735/22/9/021","url":null,"abstract":"Equipment is described which is used to produce colour centres electrolytically in alkali-halide crystals and to measure their spectra simultaneously using a high-speed spectroradiometer. The colouration process takes place in an inert atmosphere and its progress can be easily followed. A rapid and gentle quenching of the crystal after the colouration is executed by a flow of inert gas. A high-speed spectroradiometer, combined with the furnace, records transmittance spectra of the crystal within a few seconds during the colouration.","PeriodicalId":16791,"journal":{"name":"Journal of Physics E: Scientific Instruments","volume":"40 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"1989-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79300419","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1989-09-01DOI: 10.1088/0022-3735/22/9/011
Jeremy S. Smith, J. Lucas
In the automation of the TIG (tungsten inert gas) welding process, robots and dedicated machines have been used to place the welding torch at the correct orientation above the seam to be welded. Sensors are required to determine whether the workpiece is located correctly with respect to the welding torch, or whether distortion of the workpiece takes place due to thermal expansion during welding. The authors describe a seam tracker for following the small gap between closed butt plates. The system uses a CCD monochrome video camera with a coherent fibre-optic bundle to view the workpiece. Illumination is provided by an infrared laser diode mounted on the tracker head. The use of these components enables the tracker head to be kept extremely compact. The video signal from the camera is digitised and stored in a microcomputer which analyses the image to obtain the position and width of the gap. This information is then transferred, via a serial line, to the robot controller which then modifies the torch path to keep the welding torch over the seam throughout the welding process.
{"title":"A vision-based seam tracker for butt-plate TIG welding","authors":"Jeremy S. Smith, J. Lucas","doi":"10.1088/0022-3735/22/9/011","DOIUrl":"https://doi.org/10.1088/0022-3735/22/9/011","url":null,"abstract":"In the automation of the TIG (tungsten inert gas) welding process, robots and dedicated machines have been used to place the welding torch at the correct orientation above the seam to be welded. Sensors are required to determine whether the workpiece is located correctly with respect to the welding torch, or whether distortion of the workpiece takes place due to thermal expansion during welding. The authors describe a seam tracker for following the small gap between closed butt plates. The system uses a CCD monochrome video camera with a coherent fibre-optic bundle to view the workpiece. Illumination is provided by an infrared laser diode mounted on the tracker head. The use of these components enables the tracker head to be kept extremely compact. The video signal from the camera is digitised and stored in a microcomputer which analyses the image to obtain the position and width of the gap. This information is then transferred, via a serial line, to the robot controller which then modifies the torch path to keep the welding torch over the seam throughout the welding process.","PeriodicalId":16791,"journal":{"name":"Journal of Physics E: Scientific Instruments","volume":"1 1","pages":"739-744"},"PeriodicalIF":0.0,"publicationDate":"1989-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82934527","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1989-09-01DOI: 10.1088/0022-3735/22/9/014
J. Scarminio, S. N. Sahu, F. Decker
An optical system with a laser-beam position detector has been used for in situ measurement of the changes of the mechanical stress in thin films during electrochemical reactions. This non-interferometric system can measure stress variations as low as 106 N m-2 with response times better than 1.0 s.
采用激光位置检测器光学系统，对电化学反应过程中薄膜机械应力的变化进行了原位测量。这种非干涉测量系统可以测量低至106 N m-2的应力变化，响应时间优于1.0 s。
{"title":"In situ measurements of the stress changes in thin-film electrodes","authors":"J. Scarminio, S. N. Sahu, F. Decker","doi":"10.1088/0022-3735/22/9/014","DOIUrl":"https://doi.org/10.1088/0022-3735/22/9/014","url":null,"abstract":"An optical system with a laser-beam position detector has been used for in situ measurement of the changes of the mechanical stress in thin films during electrochemical reactions. This non-interferometric system can measure stress variations as low as 106 N m-2 with response times better than 1.0 s.","PeriodicalId":16791,"journal":{"name":"Journal of Physics E: Scientific Instruments","volume":"26 1","pages":"755-757"},"PeriodicalIF":0.0,"publicationDate":"1989-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78685975","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1989-09-01DOI: 10.1088/0022-3735/22/9/019
A. Gallerani
A precise phase-locked loop lock detector for very long baseline interferometry is presented. Important characteristics of the circuit design are its simplicity and low cost. In the minimum configuration, only one up-down counter, one double monostable and one NOR gate chip are required.
{"title":"A phase-locked loop indicator for use in very long baseline interferometry","authors":"A. Gallerani","doi":"10.1088/0022-3735/22/9/019","DOIUrl":"https://doi.org/10.1088/0022-3735/22/9/019","url":null,"abstract":"A precise phase-locked loop lock detector for very long baseline interferometry is presented. Important characteristics of the circuit design are its simplicity and low cost. In the minimum configuration, only one up-down counter, one double monostable and one NOR gate chip are required.","PeriodicalId":16791,"journal":{"name":"Journal of Physics E: Scientific Instruments","volume":"1 1","pages":"781-783"},"PeriodicalIF":0.0,"publicationDate":"1989-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89835137","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：