Pub Date : 1989-09-01DOI: 10.1088/0022-3735/22/9/001
P. Bergveld
After a long period of mainly static application of ISFETS, other more sophisticated applications are being developed, based on the exploitation of the dynamic properties of ISFETS. Examples are the use of flow-through cells with sample injection and the integration of a pH actuator electrode for very fast titration in a microvolume. The development of an immunoFET makes use of induced transient phenomena
{"title":"Exploiting the dynamic properties of FET-based chemical sensors","authors":"P. Bergveld","doi":"10.1088/0022-3735/22/9/001","DOIUrl":"https://doi.org/10.1088/0022-3735/22/9/001","url":null,"abstract":"After a long period of mainly static application of ISFETS, other more sophisticated applications are being developed, based on the exploitation of the dynamic properties of ISFETS. Examples are the use of flow-through cells with sample injection and the integration of a pH actuator electrode for very fast titration in a microvolume. The development of an immunoFET makes use of induced transient phenomena","PeriodicalId":16791,"journal":{"name":"Journal of Physics E: Scientific Instruments","volume":"25 1","pages":"678-683"},"PeriodicalIF":0.0,"publicationDate":"1989-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89770097","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1989-09-01DOI: 10.1088/0022-3735/22/9/017
G. C. Nascimento, R. E. Souza, M. Engelsberg
The construction of a simple, low-cost NMR imaging system including a 0.3 m diameter electromagnet is described. The system operates at the unusually low frequency of 680 kHz and can be readily scaled-up to a full body machine. In spite of the inherently poor signal-to-noise ratio at this frequency, potentially useful results may be obtained using very simple and inexpensive equipment and a home-built approach.
{"title":"A simple, ultralow magnetic field NMR imaging system","authors":"G. C. Nascimento, R. E. Souza, M. Engelsberg","doi":"10.1088/0022-3735/22/9/017","DOIUrl":"https://doi.org/10.1088/0022-3735/22/9/017","url":null,"abstract":"The construction of a simple, low-cost NMR imaging system including a 0.3 m diameter electromagnet is described. The system operates at the unusually low frequency of 680 kHz and can be readily scaled-up to a full body machine. In spite of the inherently poor signal-to-noise ratio at this frequency, potentially useful results may be obtained using very simple and inexpensive equipment and a home-built approach.","PeriodicalId":16791,"journal":{"name":"Journal of Physics E: Scientific Instruments","volume":"383 1","pages":"774-779"},"PeriodicalIF":0.0,"publicationDate":"1989-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83467564","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1989-09-01DOI: 10.1088/0022-3735/22/9/008
B. Wolf, J. Zach, H. Rose
Voltage measurements in integrated circuits are often performed with an electron probe, in which case the measurement accuracy is limited by the so-called 'local field effects' (LFE). By performing ray tracing for the secondary electrons, the sensitivity of 'in-lens detection' to LFE has been analysed. A promising mode of operation was found for low extraction-field strengths (e.g. 40 V mm-1). By combining such an extraction field with a suitable objective-lens field the most crucial measurement error resulting from the LFE can be compensated. This method can also be applied, at least in principle, for the inspection of submicrometre devices. The results are compared with experimental measurements, some differences are discussed in detail.
集成电路中的电压测量通常使用电子探针进行，在这种情况下，测量精度受到所谓的“局部场效应”(LFE)的限制。通过对二次电子进行射线追踪，分析了“透镜内探测”对LFE的灵敏度。低萃取场强度(例如40 V mm-1)的操作模式很有前途。通过将这样的提取场与合适的物镜场相结合，可以补偿由LFE引起的最关键的测量误差。至少在原则上，这种方法也可以应用于亚微米器件的检查。结果与实验测量值进行了比较，并详细讨论了差异。
{"title":"Analysis of the local field effects on voltage measurements with an 'in-lens spectrometer'","authors":"B. Wolf, J. Zach, H. Rose","doi":"10.1088/0022-3735/22/9/008","DOIUrl":"https://doi.org/10.1088/0022-3735/22/9/008","url":null,"abstract":"Voltage measurements in integrated circuits are often performed with an electron probe, in which case the measurement accuracy is limited by the so-called 'local field effects' (LFE). By performing ray tracing for the secondary electrons, the sensitivity of 'in-lens detection' to LFE has been analysed. A promising mode of operation was found for low extraction-field strengths (e.g. 40 V mm-1). By combining such an extraction field with a suitable objective-lens field the most crucial measurement error resulting from the LFE can be compensated. This method can also be applied, at least in principle, for the inspection of submicrometre devices. The results are compared with experimental measurements, some differences are discussed in detail.","PeriodicalId":16791,"journal":{"name":"Journal of Physics E: Scientific Instruments","volume":"43 1","pages":"720-725"},"PeriodicalIF":0.0,"publicationDate":"1989-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73796920","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1989-09-01DOI: 10.1088/0022-3735/22/9/016
J. Brown, P. Chappell, G. Egglestone, E. Gellert
A laboratory scale gas gun and associated instrumentation have been designed and constructed as a tool for transverse impact experiments on composite materials at velocities in the range 200-750 m s-1, using projectiles of 5.59 and 7.62 mm diameter (0.22 and 0.30 calibre respectively) which simulate fragments of larger munitions. Good agreement is obtained between the measured projectile velocities and those calculated from an approximate theoretical dynamic gas model.
{"title":"A gas-gun facility for material impact studies using low-velocity, low-mass projectiles","authors":"J. Brown, P. Chappell, G. Egglestone, E. Gellert","doi":"10.1088/0022-3735/22/9/016","DOIUrl":"https://doi.org/10.1088/0022-3735/22/9/016","url":null,"abstract":"A laboratory scale gas gun and associated instrumentation have been designed and constructed as a tool for transverse impact experiments on composite materials at velocities in the range 200-750 m s-1, using projectiles of 5.59 and 7.62 mm diameter (0.22 and 0.30 calibre respectively) which simulate fragments of larger munitions. Good agreement is obtained between the measured projectile velocities and those calculated from an approximate theoretical dynamic gas model.","PeriodicalId":16791,"journal":{"name":"Journal of Physics E: Scientific Instruments","volume":"82 1","pages":"771-774"},"PeriodicalIF":0.0,"publicationDate":"1989-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83997987","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1989-09-01DOI: 10.1088/0022-3735/22/9/022
M. P. Cox, T. Heppell, W. Hanrieder
Standard components of surface analysis are integrated with a high-performance scanning tunnelling microscope (STM) into a UHV system. This new type of sample and tip handling system is fully compatible with the standard components and allows rapid exchange of samples and tips while maintaining UHV. The total drift of the STM was below 0.5 nm min-1; atomic resolution was attained on highly oriented pyrolytic graphite. The installation has a resonant frequency of 2 Hz and is thus efficiently insulated from ground vibrations. This makes it suitable for use in an industrial environment.
{"title":"RAPID COMMUNICATION: A new UHV system with integrated STM for industrial applications","authors":"M. P. Cox, T. Heppell, W. Hanrieder","doi":"10.1088/0022-3735/22/9/022","DOIUrl":"https://doi.org/10.1088/0022-3735/22/9/022","url":null,"abstract":"Standard components of surface analysis are integrated with a high-performance scanning tunnelling microscope (STM) into a UHV system. This new type of sample and tip handling system is fully compatible with the standard components and allows rapid exchange of samples and tips while maintaining UHV. The total drift of the STM was below 0.5 nm min-1; atomic resolution was attained on highly oriented pyrolytic graphite. The installation has a resonant frequency of 2 Hz and is thus efficiently insulated from ground vibrations. This makes it suitable for use in an industrial environment.","PeriodicalId":16791,"journal":{"name":"Journal of Physics E: Scientific Instruments","volume":"71 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"1989-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86565557","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1989-09-01DOI: 10.1088/0022-3735/22/9/007
C. Xie, A. Stott, S. M. Huang, A. Plaskowski, M. Beck
Mass-flow measurement of gas/solids flow is a common requirement in many industrial processes. The authors present a case study dealing with the measurement of returned fines in the recycle line of a fluidised-bed gasifier pilot plant. The problem is solved by measuring two parameters, namely the solids velocity and the volumetric concentration. The former is measured by cross correlating the electrostatic charge fluctuations generated by the conveyed solids, and the latter by using an inherently stray-immune capacitance transducer. The two measurements are then combined to give the solids mass-flow rate. The effects of solids flow characteristics (Reynolds number, flow regime) on the measurement errors of solids velocity and concentration are experimentally investigated. Possible measures to reduce these errors are discussed.
{"title":"Mass-flow measurement of solids using electrodynamic and capacitance transducers","authors":"C. Xie, A. Stott, S. M. Huang, A. Plaskowski, M. Beck","doi":"10.1088/0022-3735/22/9/007","DOIUrl":"https://doi.org/10.1088/0022-3735/22/9/007","url":null,"abstract":"Mass-flow measurement of gas/solids flow is a common requirement in many industrial processes. The authors present a case study dealing with the measurement of returned fines in the recycle line of a fluidised-bed gasifier pilot plant. The problem is solved by measuring two parameters, namely the solids velocity and the volumetric concentration. The former is measured by cross correlating the electrostatic charge fluctuations generated by the conveyed solids, and the latter by using an inherently stray-immune capacitance transducer. The two measurements are then combined to give the solids mass-flow rate. The effects of solids flow characteristics (Reynolds number, flow regime) on the measurement errors of solids velocity and concentration are experimentally investigated. Possible measures to reduce these errors are discussed.","PeriodicalId":16791,"journal":{"name":"Journal of Physics E: Scientific Instruments","volume":"12 1","pages":"712-719"},"PeriodicalIF":0.0,"publicationDate":"1989-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76832776","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1989-09-01DOI: 10.1088/0022-3735/22/9/006
J. D. Clark, J. Guthrie, R. Chaney, A. J. Cunningham
The design and operation of an inexpensive multichannel scaler (MCS) having an adjustable time resolution between 100 ns/channel and 12.8 mu s/channel is described. The device is installed in one of the peripheral expansion slots of a microcomputer and utilises a total of 2048 channels. Software control provided by a user interface program allows convenient device configuration and data manipulation, display and storage. Two applications are discussed.
{"title":"A variable time-resolution MCS for kinetic studies","authors":"J. D. Clark, J. Guthrie, R. Chaney, A. J. Cunningham","doi":"10.1088/0022-3735/22/9/006","DOIUrl":"https://doi.org/10.1088/0022-3735/22/9/006","url":null,"abstract":"The design and operation of an inexpensive multichannel scaler (MCS) having an adjustable time resolution between 100 ns/channel and 12.8 mu s/channel is described. The device is installed in one of the peripheral expansion slots of a microcomputer and utilises a total of 2048 channels. Software control provided by a user interface program allows convenient device configuration and data manipulation, display and storage. Two applications are discussed.","PeriodicalId":16791,"journal":{"name":"Journal of Physics E: Scientific Instruments","volume":"1 1","pages":"709-711"},"PeriodicalIF":0.0,"publicationDate":"1989-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89963344","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1989-08-01DOI: 10.1088/0022-3735/22/8/001
T. Wilson
We review the imaging properties and electrical applications o f scanning optical microscopes. We show that the choice of a scanning approach allows the modification of the optical system to give differential phase contrast imaging and confocal imaging. The latter has unique properties which permit the high resolution imaging and metrology of thick device structures. We also discuss the optical beam-induced current method of device, VLSI circuit and material testing and consider the factors affecting its resolution.
{"title":"Techniques of optical scanning microscopy","authors":"T. Wilson","doi":"10.1088/0022-3735/22/8/001","DOIUrl":"https://doi.org/10.1088/0022-3735/22/8/001","url":null,"abstract":"We review the imaging properties and electrical applications o f scanning optical microscopes. We show that the choice of a scanning approach allows the modification of the optical system to give differential phase contrast imaging and confocal imaging. The latter has unique properties which permit the high resolution imaging and metrology of thick device structures. We also discuss the optical beam-induced current method of device, VLSI circuit and material testing and consider the factors affecting its resolution.","PeriodicalId":16791,"journal":{"name":"Journal of Physics E: Scientific Instruments","volume":"1 1","pages":"532-547"},"PeriodicalIF":0.0,"publicationDate":"1989-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84349508","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1989-08-01DOI: 10.1088/0022-3735/22/8/017
M. Oger, A. Daudé, A. Floch
Compact Zeeman lasers have been built to test the frequency stability which can be obtained using the magnetic Lamb dip. The lasers are strictly monomode. No frequency modulation is needed, the error function resulting from a Zeeman modulation of the sigma components of the laser line for a fixed laser frequency. Frequency fluctuations of better than 10-11 are obtained by Allan variance analysis for the integration period range of 0.1-100 s.
{"title":"Frequency stability measurement on magnetic Lamb dip-stabilised lasers","authors":"M. Oger, A. Daudé, A. Floch","doi":"10.1088/0022-3735/22/8/017","DOIUrl":"https://doi.org/10.1088/0022-3735/22/8/017","url":null,"abstract":"Compact Zeeman lasers have been built to test the frequency stability which can be obtained using the magnetic Lamb dip. The lasers are strictly monomode. No frequency modulation is needed, the error function resulting from a Zeeman modulation of the sigma components of the laser line for a fixed laser frequency. Frequency fluctuations of better than 10-11 are obtained by Allan variance analysis for the integration period range of 0.1-100 s.","PeriodicalId":16791,"journal":{"name":"Journal of Physics E: Scientific Instruments","volume":"60 1","pages":"618-622"},"PeriodicalIF":0.0,"publicationDate":"1989-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87604687","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1989-08-01DOI: 10.1088/0022-3735/22/8/007
B. Suits, D. Wilken
A general method of designing magnetic field gradient coils for NMR imaging is suggested and developed. The method utilises a combination of exact calculations for infinite continuous current sheets with a series expansion method to analyse finite discrete models of the continuous case. The method is applied to two orientations for coils on a cylindrical form resulting in improvements of existing gradient coil designs.
{"title":"Improving magnetic field gradient coils for NMR imaging","authors":"B. Suits, D. Wilken","doi":"10.1088/0022-3735/22/8/007","DOIUrl":"https://doi.org/10.1088/0022-3735/22/8/007","url":null,"abstract":"A general method of designing magnetic field gradient coils for NMR imaging is suggested and developed. The method utilises a combination of exact calculations for infinite continuous current sheets with a series expansion method to analyse finite discrete models of the continuous case. The method is applied to two orientations for coils on a cylindrical form resulting in improvements of existing gradient coil designs.","PeriodicalId":16791,"journal":{"name":"Journal of Physics E: Scientific Instruments","volume":"84 12 1","pages":"565-573"},"PeriodicalIF":0.0,"publicationDate":"1989-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83225786","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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