Pub Date : 2012-11-12DOI: 10.1109/ISEMC.2012.6351653
A. Drozd, B. Archambeault, A. Duffy, I. Kasperovich
This paper identifies several important aspects of current Feature Selective Validation (FSV) methodologies that are embodied in IEEE Standard 1597.1 for the Validation of CEM Computer Modeling and Simulations. The FSV method facilitates comparisons of sets of electromagnetic (EM) observable data for a given problem to determine “levels of agreement” across amplitude and feature variables. Areas of future revision to this standard are presented that will further enhance the standard's utility for performing Computational Electromagnetic (CEM) technique validation for a wide range of problems. In particular, we consider the utility of the N-dimensional FSV and revisit applications of the Amplitude Difference Measure (ADM), Feature Difference Measure (FDM) and the Global Difference Measure (GDM). This is discussed within the context of large complex system problems that present interesting challenges to the FSV method due to the potentially wide dynamic range of the data. Certain use cases for scattering cross section, system-level coupling, and large system-level EMC problems require a somewhat modified approach in computing the GDM based on how the FDM and ADM are weighted. For the current 1-D FSV, unweighted or incorrectly weighted amplitude and feature measures can potentially lead to inconclusive or even misleading results. These issues are addressed and future revisions to the IEEE Standard 1597.1 are highlighted.
{"title":"Development of next generation FSV tools and standards","authors":"A. Drozd, B. Archambeault, A. Duffy, I. Kasperovich","doi":"10.1109/ISEMC.2012.6351653","DOIUrl":"https://doi.org/10.1109/ISEMC.2012.6351653","url":null,"abstract":"This paper identifies several important aspects of current Feature Selective Validation (FSV) methodologies that are embodied in IEEE Standard 1597.1 for the Validation of CEM Computer Modeling and Simulations. The FSV method facilitates comparisons of sets of electromagnetic (EM) observable data for a given problem to determine “levels of agreement” across amplitude and feature variables. Areas of future revision to this standard are presented that will further enhance the standard's utility for performing Computational Electromagnetic (CEM) technique validation for a wide range of problems. In particular, we consider the utility of the N-dimensional FSV and revisit applications of the Amplitude Difference Measure (ADM), Feature Difference Measure (FDM) and the Global Difference Measure (GDM). This is discussed within the context of large complex system problems that present interesting challenges to the FSV method due to the potentially wide dynamic range of the data. Certain use cases for scattering cross section, system-level coupling, and large system-level EMC problems require a somewhat modified approach in computing the GDM based on how the FDM and ADM are weighted. For the current 1-D FSV, unweighted or incorrectly weighted amplitude and feature measures can potentially lead to inconclusive or even misleading results. These issues are addressed and future revisions to the IEEE Standard 1597.1 are highlighted.","PeriodicalId":197346,"journal":{"name":"2012 IEEE International Symposium on Electromagnetic Compatibility","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2012-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121091774","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-11-12DOI: 10.1109/ISEMC.2012.6351822
D. Moongilan
As the wireless receiver sensitivity levels surpass thermal noise levels, reliable operation of smart grid Distributed Generating System (DGS) wireless communication and control devices demands consideration of the power line produced noise spectrum. The power line noise spectrum varies based on voltage and current of transmission lines and load characteristics. The electrical-noise environment is anticipated to be more severe in a DGS than in a Conventional Electrical Power System (CEPS) due to the frequent changes in power distribution routing. While most measurable noise occurs at frequencies less than 200 MHz, the corona noise spectrum extends up to 2000 MHz. The corona noise spectrum measured near a 26 kV substation was compared with corona generated in the laboratory. Using this data, in-band wireless receiver susceptibility levels for GSM, CDMA and LTE modulation techniques were experimentally evaluated and presented.
{"title":"Corona noise considerations for smart grid wireless communication and control network planning","authors":"D. Moongilan","doi":"10.1109/ISEMC.2012.6351822","DOIUrl":"https://doi.org/10.1109/ISEMC.2012.6351822","url":null,"abstract":"As the wireless receiver sensitivity levels surpass thermal noise levels, reliable operation of smart grid Distributed Generating System (DGS) wireless communication and control devices demands consideration of the power line produced noise spectrum. The power line noise spectrum varies based on voltage and current of transmission lines and load characteristics. The electrical-noise environment is anticipated to be more severe in a DGS than in a Conventional Electrical Power System (CEPS) due to the frequent changes in power distribution routing. While most measurable noise occurs at frequencies less than 200 MHz, the corona noise spectrum extends up to 2000 MHz. The corona noise spectrum measured near a 26 kV substation was compared with corona generated in the laboratory. Using this data, in-band wireless receiver susceptibility levels for GSM, CDMA and LTE modulation techniques were experimentally evaluated and presented.","PeriodicalId":197346,"journal":{"name":"2012 IEEE International Symposium on Electromagnetic Compatibility","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2012-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121188264","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-11-12DOI: 10.1109/ISEMC.2012.6351683
Felix Traub, J. Hansen, W. Ackermann, T. Weiland
Physical equivalent circuits are powerful tools for EMC analysis of electronic devices, however their generation is in general cumbersome. In this paper, a procedure to generate physical equivalent circuits using 3D simulations is described. The method is based on a numerical computation of Z parameters using 3D simulations. Equivalent circuit tpoplogy and parameters are extracted from the simulated Z parameter matrix. Maxwell's equations are used in a reduced form to eliminate all effects that cannot be modelled by equivalent circuits.
{"title":"Generation of physical equivalent circuits using 3D simulations","authors":"Felix Traub, J. Hansen, W. Ackermann, T. Weiland","doi":"10.1109/ISEMC.2012.6351683","DOIUrl":"https://doi.org/10.1109/ISEMC.2012.6351683","url":null,"abstract":"Physical equivalent circuits are powerful tools for EMC analysis of electronic devices, however their generation is in general cumbersome. In this paper, a procedure to generate physical equivalent circuits using 3D simulations is described. The method is based on a numerical computation of Z parameters using 3D simulations. Equivalent circuit tpoplogy and parameters are extracted from the simulated Z parameter matrix. Maxwell's equations are used in a reduced form to eliminate all effects that cannot be modelled by equivalent circuits.","PeriodicalId":197346,"journal":{"name":"2012 IEEE International Symposium on Electromagnetic Compatibility","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2012-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121189036","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-11-12DOI: 10.1109/ISEMC.2012.6351694
M. Sørensen, O. Franek, G. Pedersen, K. A. Baltsen, H. Ebert
The perturbation of near-fields scan from connected cables are investigated and how to handle the cables is discussed. A connected cable induced small but theoretical detectable changes in the near-field. This change can be seen in Huygens' box simulations (equivalent source currents on a box) at the cable resonance frequencies while there is no change away from the resonance frequencies.
{"title":"Perturbation of near-field scan from connected cables","authors":"M. Sørensen, O. Franek, G. Pedersen, K. A. Baltsen, H. Ebert","doi":"10.1109/ISEMC.2012.6351694","DOIUrl":"https://doi.org/10.1109/ISEMC.2012.6351694","url":null,"abstract":"The perturbation of near-fields scan from connected cables are investigated and how to handle the cables is discussed. A connected cable induced small but theoretical detectable changes in the near-field. This change can be seen in Huygens' box simulations (equivalent source currents on a box) at the cable resonance frequencies while there is no change away from the resonance frequencies.","PeriodicalId":197346,"journal":{"name":"2012 IEEE International Symposium on Electromagnetic Compatibility","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2012-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126241516","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-11-12DOI: 10.1109/ISEMC.2012.6351834
L. Kolb
CISPR 22 and CISPR 32 both require statistical compliance, specifically that products demonstrate with at least 80% confidence that at least 80% of the product population passes the radiated and conducted emissions limits. There have been problems applying the statistical test specified in CISPR 22 to real products because the method assumes a normal distribution, and products often exhibit characteristics which do not fit that model. For example, if the shielding or grounding in electronic equipment is not consistent unit to unit, it can result in bimodal or multi-modal distributions of some emissions. The bimodal distribution may be a common cause behind signal frequencies which appear as significant emissions in some units but are unmeasurable in others. CISPR 32 introduces more options for tools which may be used to demonstrate 80/80 compliance, notably the binomial distribution test, which is robust enough to accommodate a wide variety of population distributions. When CISPR 32 replaces CISPR 22 as the emissions standard, this binomial test method should be available for product qualifications.
{"title":"Opportunities for improved 80%/80% statistical methods with CISPR 32","authors":"L. Kolb","doi":"10.1109/ISEMC.2012.6351834","DOIUrl":"https://doi.org/10.1109/ISEMC.2012.6351834","url":null,"abstract":"CISPR 22 and CISPR 32 both require statistical compliance, specifically that products demonstrate with at least 80% confidence that at least 80% of the product population passes the radiated and conducted emissions limits. There have been problems applying the statistical test specified in CISPR 22 to real products because the method assumes a normal distribution, and products often exhibit characteristics which do not fit that model. For example, if the shielding or grounding in electronic equipment is not consistent unit to unit, it can result in bimodal or multi-modal distributions of some emissions. The bimodal distribution may be a common cause behind signal frequencies which appear as significant emissions in some units but are unmeasurable in others. CISPR 32 introduces more options for tools which may be used to demonstrate 80/80 compliance, notably the binomial distribution test, which is robust enough to accommodate a wide variety of population distributions. When CISPR 32 replaces CISPR 22 as the emissions standard, this binomial test method should be available for product qualifications.","PeriodicalId":197346,"journal":{"name":"2012 IEEE International Symposium on Electromagnetic Compatibility","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2012-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115899763","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-11-12DOI: 10.1109/ISEMC.2012.6351808
Jing Li, M. Koledintseva, A. Razmadze, A. Gafarov, Yaojiang Zhang, J. Drewniak, J. Fan, J. Shenhui
Sensitivity analysis of the performance of thin absorbing coatings and ferrite chokes on cables to the variation in dielectric and magnetic properties of materials is carried out. This variation corresponds to possible uncertainty in measuring complex permittivity and permeability of materials. The analysis in this paper is done numerically using the 2D-FEM code. The modeled parameters are input impedance and EMI radiation reduction when applying absorbing materials and ferrite chokes on the cables, represented as monopole antenna rods. The material parameters of absorbing materials and ferrites used in this study were measured using the standard 7-mm coaxial air line. Higher sensitivity of the modeled parameters to the uncertainty of measuring complex permeability of absorbing materials and ferrites, and lower to the uncertainty of measuring complex permittivity, even in the case of high-permittivity absorbing coatings, have been demonstrated.
{"title":"Permeability and permittivity uncertainty effects in modeling absorbing coatings and ferrites on cables","authors":"Jing Li, M. Koledintseva, A. Razmadze, A. Gafarov, Yaojiang Zhang, J. Drewniak, J. Fan, J. Shenhui","doi":"10.1109/ISEMC.2012.6351808","DOIUrl":"https://doi.org/10.1109/ISEMC.2012.6351808","url":null,"abstract":"Sensitivity analysis of the performance of thin absorbing coatings and ferrite chokes on cables to the variation in dielectric and magnetic properties of materials is carried out. This variation corresponds to possible uncertainty in measuring complex permittivity and permeability of materials. The analysis in this paper is done numerically using the 2D-FEM code. The modeled parameters are input impedance and EMI radiation reduction when applying absorbing materials and ferrite chokes on the cables, represented as monopole antenna rods. The material parameters of absorbing materials and ferrites used in this study were measured using the standard 7-mm coaxial air line. Higher sensitivity of the modeled parameters to the uncertainty of measuring complex permeability of absorbing materials and ferrites, and lower to the uncertainty of measuring complex permittivity, even in the case of high-permittivity absorbing coatings, have been demonstrated.","PeriodicalId":197346,"journal":{"name":"2012 IEEE International Symposium on Electromagnetic Compatibility","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2012-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116718052","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-11-12DOI: 10.1109/ISEMC.2012.6351669
L. Gertmar, R. Eide, M. Baxter
Abnormalities within a limited number of small and medium enterprises (SMEs) in Australia are reported. A set of interrelated industrial issues are brought out in order to advance the state of knowledge and avoid similar abnormalities/irregularities and to bring back some ideas for the mitigations. Impacts on new automated systems and on industrial as well as safety standards are expected in the long run.
{"title":"Are DC currents in an AC power distribution the root cause for some abnormalities in AU?","authors":"L. Gertmar, R. Eide, M. Baxter","doi":"10.1109/ISEMC.2012.6351669","DOIUrl":"https://doi.org/10.1109/ISEMC.2012.6351669","url":null,"abstract":"Abnormalities within a limited number of small and medium enterprises (SMEs) in Australia are reported. A set of interrelated industrial issues are brought out in order to advance the state of knowledge and avoid similar abnormalities/irregularities and to bring back some ideas for the mitigations. Impacts on new automated systems and on industrial as well as safety standards are expected in the long run.","PeriodicalId":197346,"journal":{"name":"2012 IEEE International Symposium on Electromagnetic Compatibility","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2012-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128404082","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-11-12DOI: 10.1109/ISEMC.2012.6351676
M. H. Nisanci, F. de Paulis, A. Orlandi, B. Archambeault, S. Connor
This paper presents an efficient design procedure to obtain the physical dimensions of the electromagnetic bandgap (EBG) structure intended to filter common mode noise in high speed differential interconnects. The procedure is based on the concept of total inductance associated to the EBG geometry, and it offers wide flexibility for setting the geometrical EBG parameters. An optimum EBG design is studied investigating the relationships among the design parameters. This allows restricting the range of parameters that minimize the error between the achieved filter frequency and the nominal frequency. The study is carried out for several filtering frequency values and the results are validated by using full wave simulations. This paper also offers an example to synthesize the optimum EBG design for achieving a common mode filter at the desired frequency.
{"title":"Optimum geometrical parameters for the EBG-based common mode filter design","authors":"M. H. Nisanci, F. de Paulis, A. Orlandi, B. Archambeault, S. Connor","doi":"10.1109/ISEMC.2012.6351676","DOIUrl":"https://doi.org/10.1109/ISEMC.2012.6351676","url":null,"abstract":"This paper presents an efficient design procedure to obtain the physical dimensions of the electromagnetic bandgap (EBG) structure intended to filter common mode noise in high speed differential interconnects. The procedure is based on the concept of total inductance associated to the EBG geometry, and it offers wide flexibility for setting the geometrical EBG parameters. An optimum EBG design is studied investigating the relationships among the design parameters. This allows restricting the range of parameters that minimize the error between the achieved filter frequency and the nominal frequency. The study is carried out for several filtering frequency values and the results are validated by using full wave simulations. This paper also offers an example to synthesize the optimum EBG design for achieving a common mode filter at the desired frequency.","PeriodicalId":197346,"journal":{"name":"2012 IEEE International Symposium on Electromagnetic Compatibility","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2012-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130788900","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-11-12DOI: 10.1109/ISEMC.2012.6351801
Lin Yang, Yan Zhou, Wei Bai, Xuequan Yu
With the ever-increasing energy consumption and speed of the integrated circuit (IC), the electromagnetic interfere (EMI) introduced by heat spreaders becomes more and more serious. In the EMI simulation of heat spreaders, sources are difficult to obtain as they are actually distributed on surfaces. To simplify the sources, a method is introduced to use a point source instead of sources in a surface when the IC chip area is much smaller than the heat spreader area. An engineering method called “worst case” is used to make a tolerance analysis. Comparison between simulation and measurement is provided for an engineering application, and thus the correctness of the method is verified.
{"title":"A method for simplifying excited source in EMI simulation of heat spreaders","authors":"Lin Yang, Yan Zhou, Wei Bai, Xuequan Yu","doi":"10.1109/ISEMC.2012.6351801","DOIUrl":"https://doi.org/10.1109/ISEMC.2012.6351801","url":null,"abstract":"With the ever-increasing energy consumption and speed of the integrated circuit (IC), the electromagnetic interfere (EMI) introduced by heat spreaders becomes more and more serious. In the EMI simulation of heat spreaders, sources are difficult to obtain as they are actually distributed on surfaces. To simplify the sources, a method is introduced to use a point source instead of sources in a surface when the IC chip area is much smaller than the heat spreader area. An engineering method called “worst case” is used to make a tolerance analysis. Comparison between simulation and measurement is provided for an engineering application, and thus the correctness of the method is verified.","PeriodicalId":197346,"journal":{"name":"2012 IEEE International Symposium on Electromagnetic Compatibility","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2012-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130591380","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-11-12DOI: 10.1109/ISEMC.2012.6351689
G. Lovat, R. Araneo, S. Celozzi
The frequency-selective shielding behavior of periodic screens based on resonant elements is investigated, with particular reference to two-dimensional arrays of Jerusalem crosses and split-ring resonators. A parametric study of the shielding effectiveness under plane-wave far-field incidence is first performed based on a conventional periodic Method-of-Moment approach and verified through other full-wave commercial software simulations. Next, an Array-Scanning Method technique is used to study the shielding properties against finite dipole near-field sources, pointing out the main differences with respect to the far-field excitation.
{"title":"Planar and bulk resonant periodic screens against plane-wave and electric-dipole excitations","authors":"G. Lovat, R. Araneo, S. Celozzi","doi":"10.1109/ISEMC.2012.6351689","DOIUrl":"https://doi.org/10.1109/ISEMC.2012.6351689","url":null,"abstract":"The frequency-selective shielding behavior of periodic screens based on resonant elements is investigated, with particular reference to two-dimensional arrays of Jerusalem crosses and split-ring resonators. A parametric study of the shielding effectiveness under plane-wave far-field incidence is first performed based on a conventional periodic Method-of-Moment approach and verified through other full-wave commercial software simulations. Next, an Array-Scanning Method technique is used to study the shielding properties against finite dipole near-field sources, pointing out the main differences with respect to the far-field excitation.","PeriodicalId":197346,"journal":{"name":"2012 IEEE International Symposium on Electromagnetic Compatibility","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2012-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124270037","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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