Pub Date : 2012-11-12DOI: 10.1109/ISEMC.2012.6351644
J. McCloskey, K. Javor
At NASA's Goddard Space Flight Center (GSFC), the Electromagnetic Interference (EMI) requirements are defined in the General Environmental Verification Specification (GEVS), GSFC-STD-7000 [1]. These requirements were based on the requirements of MIL-STD-461C [2]and the test methods of MIL-STD-462 [3]. GEVS EMI requirements were reviewed and revised over a one year period by the GSFC Electromagnetic Compatibility (EMC) Working Group, using MIL-STD-461F [4] as a starting point and incorporating appropriate tailoring to address the specific needs of GSFC platforms. This paper describes the results of that working group effort to update the EMI requirements in GEVS for GSFC platforms.
{"title":"An updated EMC standard for NASA's Goddard Space Flight Center","authors":"J. McCloskey, K. Javor","doi":"10.1109/ISEMC.2012.6351644","DOIUrl":"https://doi.org/10.1109/ISEMC.2012.6351644","url":null,"abstract":"At NASA's Goddard Space Flight Center (GSFC), the Electromagnetic Interference (EMI) requirements are defined in the General Environmental Verification Specification (GEVS), GSFC-STD-7000 [1]. These requirements were based on the requirements of MIL-STD-461C [2]and the test methods of MIL-STD-462 [3]. GEVS EMI requirements were reviewed and revised over a one year period by the GSFC Electromagnetic Compatibility (EMC) Working Group, using MIL-STD-461F [4] as a starting point and incorporating appropriate tailoring to address the specific needs of GSFC platforms. This paper describes the results of that working group effort to update the EMI requirements in GEVS for GSFC platforms.","PeriodicalId":197346,"journal":{"name":"2012 IEEE International Symposium on Electromagnetic Compatibility","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2012-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115230887","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-11-12DOI: 10.1109/ISEMC.2012.6351664
L. Sauvage, S. Guilley, J. Danger, N. Homma, Y. Hayashi
Experimental setups used in electromagnetic compatibility tests can be used as platforms for fault injections. Faulting an equipment is a mean for a malevolent attacker to extract secret information. Compared to other fault injection setups, those based on EMC tests provide three advantages: non-invasivity, absence of synchronization, and frequency selectivity. This injection technique therefore allows the attacker to perform analysis with little knowledge of the targeted equipment. To assess the potential of this attack, a characterization of its effects is needed. This is the purpose of this paper. More precisely, our contributions are twofold: First of all, we observe that the faults are reproducible. Second, we show that the fault model is compatible with known attacks.
{"title":"A fault model for conducted intentional electromagnetic interferences","authors":"L. Sauvage, S. Guilley, J. Danger, N. Homma, Y. Hayashi","doi":"10.1109/ISEMC.2012.6351664","DOIUrl":"https://doi.org/10.1109/ISEMC.2012.6351664","url":null,"abstract":"Experimental setups used in electromagnetic compatibility tests can be used as platforms for fault injections. Faulting an equipment is a mean for a malevolent attacker to extract secret information. Compared to other fault injection setups, those based on EMC tests provide three advantages: non-invasivity, absence of synchronization, and frequency selectivity. This injection technique therefore allows the attacker to perform analysis with little knowledge of the targeted equipment. To assess the potential of this attack, a characterization of its effects is needed. This is the purpose of this paper. More precisely, our contributions are twofold: First of all, we observe that the faults are reproducible. Second, we show that the fault model is compatible with known attacks.","PeriodicalId":197346,"journal":{"name":"2012 IEEE International Symposium on Electromagnetic Compatibility","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2012-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125410778","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-11-12DOI: 10.1109/ISEMC.2012.6351794
D. Vande Ginste, D. De Zutter, D. Deschrijver, T. Dhaene, Paolo Manfredi, F. Canavero
In this contribution a novel stochastic modeling strategy to analyze the influence of parameter variability on differential signaling over on-chip interconnects is presented. The method starts from an accurate computation of the differential line's per unit of length transmission line parameters, adopts a parameterized macromodeling scheme, and invokes the so-called stochastic Galerkin method (SGM). Parameter variability of the line itself and of the terminations are studied and compared to a traditional Monte Carlo (MC) approach, as such demonstrating excellent accuracy and efficiency of the proposed new technique. For the first time, an SGM is constructed for and applied to differential on-chip interconnects, and it is illustrated that this novel stochastic modeling strategy is very well suited to analyze common-mode noise induced by random imbalance of the line's terminations.
{"title":"Analysis of common-mode noise on on-chip differential lines through stochastic modeling of parameter variability","authors":"D. Vande Ginste, D. De Zutter, D. Deschrijver, T. Dhaene, Paolo Manfredi, F. Canavero","doi":"10.1109/ISEMC.2012.6351794","DOIUrl":"https://doi.org/10.1109/ISEMC.2012.6351794","url":null,"abstract":"In this contribution a novel stochastic modeling strategy to analyze the influence of parameter variability on differential signaling over on-chip interconnects is presented. The method starts from an accurate computation of the differential line's per unit of length transmission line parameters, adopts a parameterized macromodeling scheme, and invokes the so-called stochastic Galerkin method (SGM). Parameter variability of the line itself and of the terminations are studied and compared to a traditional Monte Carlo (MC) approach, as such demonstrating excellent accuracy and efficiency of the proposed new technique. For the first time, an SGM is constructed for and applied to differential on-chip interconnects, and it is illustrated that this novel stochastic modeling strategy is very well suited to analyze common-mode noise induced by random imbalance of the line's terminations.","PeriodicalId":197346,"journal":{"name":"2012 IEEE International Symposium on Electromagnetic Compatibility","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2012-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115063858","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-11-12DOI: 10.1109/ISEMC.2012.6351752
P. Nicolae, I. Nicolae, D. Stănescu
Theoretical considerations about the immunity tests within a GTEM cell are discussed. Electromagnetic field in a GTEM cell is presented. The conditions in a GTEM cell for a high degree of field uniformity according to the standard IEC/EN 61000-4-20 are discussed. The GTEM cells used for tests within the main equipment involved in the realisation of tests are presented (GTEM cell; Signal Generator/Power Meter; Field sensors; Connectors; Bi-directional Coupler; Power Amplifier; Spectrum Analyzer). The Equipment Under Test (EUT) is an electronic board containing a microcontroller, with the processor operating frequency around 40 MHz. For the immunity tests, three criteria are considered, based on standards. Methods for field calibration involved in immunity tests are discussed. The experimental determination concerning the immunity tests are presented within the main conclusions.
{"title":"Using GTEM cells for immunity tests on electronic boards with microcontroller","authors":"P. Nicolae, I. Nicolae, D. Stănescu","doi":"10.1109/ISEMC.2012.6351752","DOIUrl":"https://doi.org/10.1109/ISEMC.2012.6351752","url":null,"abstract":"Theoretical considerations about the immunity tests within a GTEM cell are discussed. Electromagnetic field in a GTEM cell is presented. The conditions in a GTEM cell for a high degree of field uniformity according to the standard IEC/EN 61000-4-20 are discussed. The GTEM cells used for tests within the main equipment involved in the realisation of tests are presented (GTEM cell; Signal Generator/Power Meter; Field sensors; Connectors; Bi-directional Coupler; Power Amplifier; Spectrum Analyzer). The Equipment Under Test (EUT) is an electronic board containing a microcontroller, with the processor operating frequency around 40 MHz. For the immunity tests, three criteria are considered, based on standards. Methods for field calibration involved in immunity tests are discussed. The experimental determination concerning the immunity tests are presented within the main conclusions.","PeriodicalId":197346,"journal":{"name":"2012 IEEE International Symposium on Electromagnetic Compatibility","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2012-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125309291","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-11-12DOI: 10.1109/ISEMC.2012.6351795
M. Koledintseva, A. Razmadze, A. Gafarov, S. De, J. Drewniak, S. Hinaga
A model to substitute conductor surface roughness in printed circuit boards by a layer with an effective material (lossy dielectric) is proposed and tested using the 2D finite-element method (FEM) electromagnetics numerical simulations. The results of numerical modeling of a multilayered structure corresponding to a stripline transmission line with substituted roughness are compared with the experimental results obtained on a TRL-calibrated test vehicle with significant roughness on conductors made of a standard (STD)-roughness copper foil.
{"title":"PCB conductor surface roughness as a layer with effective material parameters","authors":"M. Koledintseva, A. Razmadze, A. Gafarov, S. De, J. Drewniak, S. Hinaga","doi":"10.1109/ISEMC.2012.6351795","DOIUrl":"https://doi.org/10.1109/ISEMC.2012.6351795","url":null,"abstract":"A model to substitute conductor surface roughness in printed circuit boards by a layer with an effective material (lossy dielectric) is proposed and tested using the 2D finite-element method (FEM) electromagnetics numerical simulations. The results of numerical modeling of a multilayered structure corresponding to a stripline transmission line with substituted roughness are compared with the experimental results obtained on a TRL-calibrated test vehicle with significant roughness on conductors made of a standard (STD)-roughness copper foil.","PeriodicalId":197346,"journal":{"name":"2012 IEEE International Symposium on Electromagnetic Compatibility","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2012-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127506624","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-11-12DOI: 10.1109/ISEMC.2012.6351793
E. Assefa, J. West, V. Rajamani, C. Bunting
An electromagnetic susceptibility test in a reverberation chamber has been simulated numerically. The electromagnetic environment of the chamber was simulated using a previously introduced method that samples the plane wave spectrum of the random fields at fixed incidence angles determined from spherical sampling theory. The sampling scheme gives excitation fields that have ideal statistics over the volume occupied by the equipment under test (EUT) while reducing the computation time over traditional approaches. A refinement of the technique has been introduced that exploits the reciprocity principle to further reduce the computational load when simulating electromagnetically large EUTs with a limited number of test points of interest. Up to 1000 000 samples of the random chamber fields were considered. The simulations show that the current coupled onto a wire that is partially shielded by a conducting box with a large aperture exhibits strong resonances. The resonant frequencies appear to be determined mainly by the box dimensions, with aperture resonances also contributing. Statistical testing shows that the induced wire currents follow an ideal Rayleigh distribution independent of the frequency of the excitation.
{"title":"Numerical study of currents induced on a partially shielded wire within an ideal reverberation test chamber","authors":"E. Assefa, J. West, V. Rajamani, C. Bunting","doi":"10.1109/ISEMC.2012.6351793","DOIUrl":"https://doi.org/10.1109/ISEMC.2012.6351793","url":null,"abstract":"An electromagnetic susceptibility test in a reverberation chamber has been simulated numerically. The electromagnetic environment of the chamber was simulated using a previously introduced method that samples the plane wave spectrum of the random fields at fixed incidence angles determined from spherical sampling theory. The sampling scheme gives excitation fields that have ideal statistics over the volume occupied by the equipment under test (EUT) while reducing the computation time over traditional approaches. A refinement of the technique has been introduced that exploits the reciprocity principle to further reduce the computational load when simulating electromagnetically large EUTs with a limited number of test points of interest. Up to 1000 000 samples of the random chamber fields were considered. The simulations show that the current coupled onto a wire that is partially shielded by a conducting box with a large aperture exhibits strong resonances. The resonant frequencies appear to be determined mainly by the box dimensions, with aperture resonances also contributing. Statistical testing shows that the induced wire currents follow an ideal Rayleigh distribution independent of the frequency of the excitation.","PeriodicalId":197346,"journal":{"name":"2012 IEEE International Symposium on Electromagnetic Compatibility","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2012-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127891501","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-11-12DOI: 10.1109/ISEMC.2012.6351823
T. Kuriyama, T. Aoi, W. Takatsuji, H. Maeda, T. Itoh, Y. Ueno, T. Nakaie, J. Matsui, Y. Miyamoto
Electrostatic field distribution measurement using a silicon micro-mirror array fabricated by Micro-ElectroMechanical Systems (MEMS) process has been presented. The deflection of each micro-mirror by electrostatic field was measured optically using a two-dimensional optical scanner and a position sensitive detector (PSD). The obtained electrostatic data showed good agreement with Coulomb's law and the system was applied to a human body model.
{"title":"Electrostatic field distribution measurement using silicon micro-mirror array","authors":"T. Kuriyama, T. Aoi, W. Takatsuji, H. Maeda, T. Itoh, Y. Ueno, T. Nakaie, J. Matsui, Y. Miyamoto","doi":"10.1109/ISEMC.2012.6351823","DOIUrl":"https://doi.org/10.1109/ISEMC.2012.6351823","url":null,"abstract":"Electrostatic field distribution measurement using a silicon micro-mirror array fabricated by Micro-ElectroMechanical Systems (MEMS) process has been presented. The deflection of each micro-mirror by electrostatic field was measured optically using a two-dimensional optical scanner and a position sensitive detector (PSD). The obtained electrostatic data showed good agreement with Coulomb's law and the system was applied to a human body model.","PeriodicalId":197346,"journal":{"name":"2012 IEEE International Symposium on Electromagnetic Compatibility","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2012-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126042128","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-11-12DOI: 10.1109/ISEMC.2012.6351748
G. Kunkel
There are presently two (2) methods used by industry to grade the ability of EMI gaskets to seal seams in the chassis used to house Electronic equipment. These are the “Shielding Effectiveness” test method contained in MIL-DTL-83528 and the “Transfer Impedance” test method contained in SAE, ARP-1705. This paper describes (1) the development of the two methods for testing gaskets; (2) the faults and advantages of the two methods, (3) provides mathematical equations that can be used to predict the actual shielding obtained from a gasketed maintenance cover as a function of the transfer impedance of the gasketed cover; (4) illustrations that show that the shielding obtained from a gasket is a function of the joint surfaces as well as the conductivity of the gasket; (5) the effects a moisture soak has on the shielding offered by gasketed joints; and (6) the effect the storage in an office environment can have on the conductivity of a silver elastomeric gasket.
{"title":"Transfer Impedance testing of EMI gasketed joints to 10 GHz for cost effective design","authors":"G. Kunkel","doi":"10.1109/ISEMC.2012.6351748","DOIUrl":"https://doi.org/10.1109/ISEMC.2012.6351748","url":null,"abstract":"There are presently two (2) methods used by industry to grade the ability of EMI gaskets to seal seams in the chassis used to house Electronic equipment. These are the “Shielding Effectiveness” test method contained in MIL-DTL-83528 and the “Transfer Impedance” test method contained in SAE, ARP-1705. This paper describes (1) the development of the two methods for testing gaskets; (2) the faults and advantages of the two methods, (3) provides mathematical equations that can be used to predict the actual shielding obtained from a gasketed maintenance cover as a function of the transfer impedance of the gasketed cover; (4) illustrations that show that the shielding obtained from a gasket is a function of the joint surfaces as well as the conductivity of the gasket; (5) the effects a moisture soak has on the shielding offered by gasketed joints; and (6) the effect the storage in an office environment can have on the conductivity of a silver elastomeric gasket.","PeriodicalId":197346,"journal":{"name":"2012 IEEE International Symposium on Electromagnetic Compatibility","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2012-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125905629","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-11-12DOI: 10.1109/ISEMC.2012.6351776
M. Feliziani, F. Maradei
A UHF RFID antenna is proposed for human tracking applications. The antenna size is adequately designed in order to satisfy special requirements: compact antenna size, read range greater than 3 m, respect of UHF RFID emission standards avoiding spurious emission. The antenna design is carried out by co-simulation between electromagnetic fields and circuit solvers.
{"title":"Antenna design of a UHF RFID tag for human tracking avoiding spurious emission","authors":"M. Feliziani, F. Maradei","doi":"10.1109/ISEMC.2012.6351776","DOIUrl":"https://doi.org/10.1109/ISEMC.2012.6351776","url":null,"abstract":"A UHF RFID antenna is proposed for human tracking applications. The antenna size is adequately designed in order to satisfy special requirements: compact antenna size, read range greater than 3 m, respect of UHF RFID emission standards avoiding spurious emission. The antenna design is carried out by co-simulation between electromagnetic fields and circuit solvers.","PeriodicalId":197346,"journal":{"name":"2012 IEEE International Symposium on Electromagnetic Compatibility","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2012-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126926598","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-11-12DOI: 10.1109/ISEMC.2012.6351812
T. Tsutaoka, A. Tsurunaga, T. Kasagi, K. Hatakeyama, M. Koledintseva
Electromagnetic properties of copper and Fe55Ni45 alloy (Permalloy) composite materials have been studied by measuring the relative complex permeability (μr = μr'- jμr”), and permittivity (εr = εr'- jεr”) spectra over the microwave range, as well as the a.c. electrical conductivity σac spectra. The variation of σac and εr with particle content shows the insulator-metal transition due to the percolation effect. The effective cluster model can be applied to the percolation effect in permittivity. The permeability spectra in Permalloy composites, which contain the percolated particles, can be affected by the eddy current effect. The permeability relaxation frequency of Permalloy composites shifts to the higher frequencies by the oxidation of embedded particle surfaces.
{"title":"Electromagnetic properties of metal granular composite materials for EMC applications","authors":"T. Tsutaoka, A. Tsurunaga, T. Kasagi, K. Hatakeyama, M. Koledintseva","doi":"10.1109/ISEMC.2012.6351812","DOIUrl":"https://doi.org/10.1109/ISEMC.2012.6351812","url":null,"abstract":"Electromagnetic properties of copper and Fe<sub>55</sub>Ni<sub>45</sub> alloy (Permalloy) composite materials have been studied by measuring the relative complex permeability (μ<sub>r</sub> = μ<sub>r</sub>'- jμ<sub>r</sub>”), and permittivity (ε<sub>r</sub> = ε<sub>r</sub>'- jε<sub>r</sub>”) spectra over the microwave range, as well as the a.c. electrical conductivity σ<sub>ac</sub> spectra. The variation of σ<sub>ac</sub> and ε<sub>r</sub> with particle content shows the insulator-metal transition due to the percolation effect. The effective cluster model can be applied to the percolation effect in permittivity. The permeability spectra in Permalloy composites, which contain the percolated particles, can be affected by the eddy current effect. The permeability relaxation frequency of Permalloy composites shifts to the higher frequencies by the oxidation of embedded particle surfaces.","PeriodicalId":197346,"journal":{"name":"2012 IEEE International Symposium on Electromagnetic Compatibility","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2012-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132223641","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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