Z. Tan, Yun Huang, Suyong Wu, Xiaobao Zhang, Yibo Zhang
Light scattering is an important and classical method for optical surface testing. Typical scheme of light scattering measurement often uses a single laser beam incidence, and then evaluates the surface quality via detecting and analyzing the scattering signal. In this work, a developed method for optical surface testing is proposed and demonstrated, and whose measuring principle is based on the scattering interference effect. In this approach, a single longitudinal mode laser beam is divided into two beams, when these beams irradiate the optical surface, their respective scattering fields would interfere with each other. If the phase between these incidence lights is scanned periodically, their scattering light interference signal would fluctuate simultaneously. Through analyzing this kind of scattering signal, our method can not only determine the scattering loss of optical surface, but also scale its inhomogeneity performance. A simply set of experimental apparatus is built up and used to demonstrated this method, which uses a single mode laser as the light source. Furthermore, to modulate the phase difference between two incidence beams, a piezoelectric ceramic is used. Some typical cases are then experimented and discussed, the results show that this method can be used to calibrate the quality of optical surface.
{"title":"A developed method for surface testing based on the scattering interference effect","authors":"Z. Tan, Yun Huang, Suyong Wu, Xiaobao Zhang, Yibo Zhang","doi":"10.1117/12.2191034","DOIUrl":"https://doi.org/10.1117/12.2191034","url":null,"abstract":"Light scattering is an important and classical method for optical surface testing. Typical scheme of light scattering measurement often uses a single laser beam incidence, and then evaluates the surface quality via detecting and analyzing the scattering signal. In this work, a developed method for optical surface testing is proposed and demonstrated, and whose measuring principle is based on the scattering interference effect. In this approach, a single longitudinal mode laser beam is divided into two beams, when these beams irradiate the optical surface, their respective scattering fields would interfere with each other. If the phase between these incidence lights is scanned periodically, their scattering light interference signal would fluctuate simultaneously. Through analyzing this kind of scattering signal, our method can not only determine the scattering loss of optical surface, but also scale its inhomogeneity performance. A simply set of experimental apparatus is built up and used to demonstrated this method, which uses a single mode laser as the light source. Furthermore, to modulate the phase difference between two incidence beams, a piezoelectric ceramic is used. Some typical cases are then experimented and discussed, the results show that this method can be used to calibrate the quality of optical surface.","PeriodicalId":212434,"journal":{"name":"SPIE Optical Systems Design","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115215372","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
S. Mühlig, J. Siepmann, M. Lotz, A. Wiegmann, G. Blobel, S. Mika, A. Beutler, U. Nehse
Two techniques for the measurement of aspheres as well as freeforms are presented. The first method, the tilted wave interferometer, is a full aperture interferometric measurement method without any moving parts during the measurement. The second method applies an optical single point sensor in conjunction with two translational and one rotational axes. Both techniques are compared by measuring a selected asphere and a special freeform surface. Differences between both measurement principles are discussed.
{"title":"Current developments on optical asphere and freeform metrology","authors":"S. Mühlig, J. Siepmann, M. Lotz, A. Wiegmann, G. Blobel, S. Mika, A. Beutler, U. Nehse","doi":"10.1117/12.2191247","DOIUrl":"https://doi.org/10.1117/12.2191247","url":null,"abstract":"Two techniques for the measurement of aspheres as well as freeforms are presented. The first method, the tilted wave interferometer, is a full aperture interferometric measurement method without any moving parts during the measurement. The second method applies an optical single point sensor in conjunction with two translational and one rotational axes. Both techniques are compared by measuring a selected asphere and a special freeform surface. Differences between both measurement principles are discussed.","PeriodicalId":212434,"journal":{"name":"SPIE Optical Systems Design","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128316372","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
In this paper, we propose an effective method for extracting the important parameters like radius of curvature, conic constant, and deformation coefficients indwelling unknown aspheric surfaces. These parameters can be inversely found from measured data by using the method that is based on aspheric equations and conic surfaces. To demonstrate the precision of the method, it is compared with a higher-order polynomial curve fit, employing two different examples. In a theoretical case, each largest fitting error (or shape error) resulted from the two methods appears a significant difference in precision. Lastly, we apply the proposed method to a real example and show the results.
{"title":"Effective method for extracting aspheric parameters inherent in unknown aspheric surfaces","authors":"Dong-Ik Kim, Ghiseok Kim, G. Kim","doi":"10.1117/12.2190503","DOIUrl":"https://doi.org/10.1117/12.2190503","url":null,"abstract":"In this paper, we propose an effective method for extracting the important parameters like radius of curvature, conic constant, and deformation coefficients indwelling unknown aspheric surfaces. These parameters can be inversely found from measured data by using the method that is based on aspheric equations and conic surfaces. To demonstrate the precision of the method, it is compared with a higher-order polynomial curve fit, employing two different examples. In a theoretical case, each largest fitting error (or shape error) resulted from the two methods appears a significant difference in precision. Lastly, we apply the proposed method to a real example and show the results.","PeriodicalId":212434,"journal":{"name":"SPIE Optical Systems Design","volume":"69 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126229691","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
3D printed freeform optical sensors are a different and new approach for optical metrology. Thereby the optical design is adapted to the fabrication characteristics of additive manufacturing. All needed optical elements like mirrors and lenses are reduced to one simple printed sample, which is capable to illuminate a complex shaped industrial part for shaped measurement based on light section technique. Additionally the laser line can be formed on the part in a way, so that no shadow appears–even in the case of kinks etc.. Due to the physical limitations of the printing process and different printing techniques each optical design would present some drawbacks that has to be considered prior a printing process in order to obtain the best results possible.
{"title":"3D printed freeform optical sensors for metrology application","authors":"P. Maillard, A. Heinrich","doi":"10.1117/12.2191280","DOIUrl":"https://doi.org/10.1117/12.2191280","url":null,"abstract":"3D printed freeform optical sensors are a different and new approach for optical metrology. Thereby the optical design is adapted to the fabrication characteristics of additive manufacturing. All needed optical elements like mirrors and lenses are reduced to one simple printed sample, which is capable to illuminate a complex shaped industrial part for shaped measurement based on light section technique. Additionally the laser line can be formed on the part in a way, so that no shadow appears–even in the case of kinks etc.. Due to the physical limitations of the printing process and different printing techniques each optical design would present some drawbacks that has to be considered prior a printing process in order to obtain the best results possible.","PeriodicalId":212434,"journal":{"name":"SPIE Optical Systems Design","volume":"75 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131807816","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Extremely low dispersion glasses (e.g. SCHOTT XLD glasses) play an essential role in the color correction of optical systems. Together with short flint glasses (KZFS Types) they can be used for apochromatic color correction in the visible spectrum or even for broadband color correction in combination with lanthanum crown glasses (LAK Types). Unfortunately the chemical composition of those glasses leads to a high coefficient of thermal expansion, low hardness and low resistance against chemical attacks. As a consequence these glasses tend to be difficult in processing. Therefore the glass engineer’s task is to improve processing characteristics while keeping their special optical properties. N-FK58 XLD is an example of a new generation of XLD glasses from SCHOTT with improved workability. In 2014 a processing study has been conducted to optimize the polishing of XLD glasses. This presentation will show the results of this study for N-FK58 XLD and the application to other fluorophosphates glasses.
{"title":"Results of a polishing study for SCHOTT XLD glasses","authors":"R. Jedamzik, Harshwadhan Yadwad, V. Dietrich","doi":"10.1117/12.2191036","DOIUrl":"https://doi.org/10.1117/12.2191036","url":null,"abstract":"Extremely low dispersion glasses (e.g. SCHOTT XLD glasses) play an essential role in the color correction of optical systems. Together with short flint glasses (KZFS Types) they can be used for apochromatic color correction in the visible spectrum or even for broadband color correction in combination with lanthanum crown glasses (LAK Types). Unfortunately the chemical composition of those glasses leads to a high coefficient of thermal expansion, low hardness and low resistance against chemical attacks. As a consequence these glasses tend to be difficult in processing. Therefore the glass engineer’s task is to improve processing characteristics while keeping their special optical properties. N-FK58 XLD is an example of a new generation of XLD glasses from SCHOTT with improved workability. In 2014 a processing study has been conducted to optimize the polishing of XLD glasses. This presentation will show the results of this study for N-FK58 XLD and the application to other fluorophosphates glasses.","PeriodicalId":212434,"journal":{"name":"SPIE Optical Systems Design","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132807080","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A focal length is a basic optical characteristic of an optical system. Thus, it is important to be able to measure this value for a given optical system very accurately in practice. At present there exist various physical principles of the focal length measurement which can achieve a different measurement accuracy. In our work we analyse several methods of measurement of the focal length with respect to factors, which are important for a measurement accuracy. The analysis is performed on examples.
{"title":"Analysis of factors important for measurements of focal length of optical systems","authors":"P. Pokorný, J. Opat, A. Mikš, J. Novák, P. Novák","doi":"10.1117/12.2191401","DOIUrl":"https://doi.org/10.1117/12.2191401","url":null,"abstract":"A focal length is a basic optical characteristic of an optical system. Thus, it is important to be able to measure this value for a given optical system very accurately in practice. At present there exist various physical principles of the focal length measurement which can achieve a different measurement accuracy. In our work we analyse several methods of measurement of the focal length with respect to factors, which are important for a measurement accuracy. The analysis is performed on examples.","PeriodicalId":212434,"journal":{"name":"SPIE Optical Systems Design","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127569369","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A system for two dimensional mapping of Total Scattering (TS) and Transmission (T) of optical flat surfaces in the spectral range from deep UV to NIR will be introduced. The adaptation of the scatter detector concept for the special requirements of the DUV range will be discussed. Also, the specifications of the set-up such as working ambient, background level, and data calibration procedure demonstrate the performance of the system for the analytical tasks in industrial optics production. On the basis of the presented measurement facility, the essential properties of bare flat optics in respect of their polishing state, roughness level, state of cleaning and defect distribution can be investigated with the TS system in a nondestructive way. The homogeneity of the whole surface of an optical component can be tested with a defined lateral resolution. The knowledge of the inhomogeneity is an important indication for the quality evaluation of optical components. We present the TS result and the calculated defect density distributions of selected components, which are handled by different cleaning procedures. Also, additional effects in TS and T will be outlined and compared with spectral photometric measurement.
{"title":"Facility for fast mapping of total scattering and transmission in the spectral range from DUV- NIR","authors":"P. Kadkhoda, L. Jensen, D. Ristau","doi":"10.1117/12.2191311","DOIUrl":"https://doi.org/10.1117/12.2191311","url":null,"abstract":"A system for two dimensional mapping of Total Scattering (TS) and Transmission (T) of optical flat surfaces in the spectral range from deep UV to NIR will be introduced. The adaptation of the scatter detector concept for the special requirements of the DUV range will be discussed. Also, the specifications of the set-up such as working ambient, background level, and data calibration procedure demonstrate the performance of the system for the analytical tasks in industrial optics production. On the basis of the presented measurement facility, the essential properties of bare flat optics in respect of their polishing state, roughness level, state of cleaning and defect distribution can be investigated with the TS system in a nondestructive way. The homogeneity of the whole surface of an optical component can be tested with a defined lateral resolution. The knowledge of the inhomogeneity is an important indication for the quality evaluation of optical components. We present the TS result and the calculated defect density distributions of selected components, which are handled by different cleaning procedures. Also, additional effects in TS and T will be outlined and compared with spectral photometric measurement.","PeriodicalId":212434,"journal":{"name":"SPIE Optical Systems Design","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125946451","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
T. Verschooten, H. Ottevaere, M. Vervaeke, J. Van Erps, M. Callewaert, W. De Malsche, H. Thienpont
We show a proof-of-concept demonstration of a multi-parameter analysis low-cost optical detection system for the flowcytometric identification of vinegars. This multi-parameter analysis system can simultaneously measure laser induced fluorescence, absorption and scattering excited by two time-multiplexed lasers of different wavelengths. To our knowledge no other polymer optofluidic chip based system offers more simultaneous measurements. The design of the optofluidic channels is aimed at countering the effects that viscous fingering, air bubbles, and emulsion samples can have on the correct operation of such a detection system. Unpredictable variations in viscosity and refractive index of the channel content can be turned into a source of information. The sample is excited by two laser diodes that are driven by custom made low-cost laser drivers. The optofluidic chip is built to be robust and easy to handle and is reproducible using hot embossing. We show a custom optomechanical holder for the optofluidic chip that ensures correct alignment and automatic connection to the external fluidic system. We show an experiment in which 92 samples of vinegar are measured. We are able to identify 9 different kinds of vinegar with an accuracy of 94%. Thus we show an alternative approach to the classic optical spectroscopy solution at a lowered. Furthermore, we have shown the possibility of predicting the viscosity and turbidity of vinegars with a goodness-of-fit R2 over 0.947.
{"title":"Flow-cytometric identification of vinegars using a multi-parameter analysis optical detection module","authors":"T. Verschooten, H. Ottevaere, M. Vervaeke, J. Van Erps, M. Callewaert, W. De Malsche, H. Thienpont","doi":"10.1117/12.2197474","DOIUrl":"https://doi.org/10.1117/12.2197474","url":null,"abstract":"We show a proof-of-concept demonstration of a multi-parameter analysis low-cost optical detection system for the flowcytometric identification of vinegars. This multi-parameter analysis system can simultaneously measure laser induced fluorescence, absorption and scattering excited by two time-multiplexed lasers of different wavelengths. To our knowledge no other polymer optofluidic chip based system offers more simultaneous measurements. The design of the optofluidic channels is aimed at countering the effects that viscous fingering, air bubbles, and emulsion samples can have on the correct operation of such a detection system. Unpredictable variations in viscosity and refractive index of the channel content can be turned into a source of information. The sample is excited by two laser diodes that are driven by custom made low-cost laser drivers. The optofluidic chip is built to be robust and easy to handle and is reproducible using hot embossing. We show a custom optomechanical holder for the optofluidic chip that ensures correct alignment and automatic connection to the external fluidic system. We show an experiment in which 92 samples of vinegar are measured. We are able to identify 9 different kinds of vinegar with an accuracy of 94%. Thus we show an alternative approach to the classic optical spectroscopy solution at a lowered. Furthermore, we have shown the possibility of predicting the viscosity and turbidity of vinegars with a goodness-of-fit R2 over 0.947.","PeriodicalId":212434,"journal":{"name":"SPIE Optical Systems Design","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117010723","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Wen-fan Jiang, Meixiong Chen, W. Tian, Jiehong Yuan, Guangming Xu
An improved system for measuring the specific modes’ total loss in high quality ring cavity is presented. The experimental apparatus measuring cavity ring-down signals are described in detail. The specific modes in the passive ring cavity can be obtained by controlling the manually piezoelectric transducer which mounted on the laser cavity mirror. The image of the specific mode was shown on the CCD and its corresponding cavity ring-down signal is obtained when incident laser light was shut off by optical switch. The losses of three specific transverse modes, such as TEM00, TEM01 and TEM10, are measured. The improved system realizes the specific mode real-time monitoring and high precision loss measurement simultaneously when the ring cavity assembling and alignment.
{"title":"Improved cavity ring-down system for high precision measurement of the specific modes' loss in ring cavity","authors":"Wen-fan Jiang, Meixiong Chen, W. Tian, Jiehong Yuan, Guangming Xu","doi":"10.1117/12.2196394","DOIUrl":"https://doi.org/10.1117/12.2196394","url":null,"abstract":"An improved system for measuring the specific modes’ total loss in high quality ring cavity is presented. The experimental apparatus measuring cavity ring-down signals are described in detail. The specific modes in the passive ring cavity can be obtained by controlling the manually piezoelectric transducer which mounted on the laser cavity mirror. The image of the specific mode was shown on the CCD and its corresponding cavity ring-down signal is obtained when incident laser light was shut off by optical switch. The losses of three specific transverse modes, such as TEM00, TEM01 and TEM10, are measured. The improved system realizes the specific mode real-time monitoring and high precision loss measurement simultaneously when the ring cavity assembling and alignment.","PeriodicalId":212434,"journal":{"name":"SPIE Optical Systems Design","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129745749","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Hans Gommans, S. Booij, F. Pijlman, M. Krijn, S. D. de Zwart, R. Sepkhanov, Dave Beaumont, Hans van der Schaft, R. Sanders
In lighting applications key drivers for optical design of surface textures are integration of optical elements, the disentanglement of optical functionality and appearance and late stage configuration. We investigated excimer laser ablation as a mastering technology for micro textured surfaces, where we targeted an increase in correspondence between surface design and ablated surface for high aspect ratio structures. To achieve this we have improved the photo mask design using a heuristic algorithm that corrects for the angular dependence of the ablation process and the loss of image resolution at ablation depths that exceed the depth of field. Using this approach we have been able to demonstrate close correspondence between designed and ablated facet structures up to 75° inclination at 75 μm depth. These facet design parameters allow for total internal reflection (TIR) as a means of beam deflection which is demonstrated in a range of mono shaped cone arrays in hexagonal tessellation. BSDF analysis was used to characterize the narrow TIR deflection beams that matched the peak positions of the design down to 28° apex. In addition, a single surface TIR-Fresnel lens design with focal distance 5 mm has been manufactured using this photo mask design algorithm and beam collimation up to 12° beam angle and 32° field angle is shown. These outcomes demonstrate that the laser ablation process intrinsically yields sufficient small dispersion in structure and fillet radii for lighting applications.
{"title":"Optical design and laser ablation of surface textures: demonstrating total internal reflection","authors":"Hans Gommans, S. Booij, F. Pijlman, M. Krijn, S. D. de Zwart, R. Sepkhanov, Dave Beaumont, Hans van der Schaft, R. Sanders","doi":"10.1117/12.2192082","DOIUrl":"https://doi.org/10.1117/12.2192082","url":null,"abstract":"In lighting applications key drivers for optical design of surface textures are integration of optical elements, the disentanglement of optical functionality and appearance and late stage configuration. We investigated excimer laser ablation as a mastering technology for micro textured surfaces, where we targeted an increase in correspondence between surface design and ablated surface for high aspect ratio structures. To achieve this we have improved the photo mask design using a heuristic algorithm that corrects for the angular dependence of the ablation process and the loss of image resolution at ablation depths that exceed the depth of field. Using this approach we have been able to demonstrate close correspondence between designed and ablated facet structures up to 75° inclination at 75 μm depth. These facet design parameters allow for total internal reflection (TIR) as a means of beam deflection which is demonstrated in a range of mono shaped cone arrays in hexagonal tessellation. BSDF analysis was used to characterize the narrow TIR deflection beams that matched the peak positions of the design down to 28° apex. In addition, a single surface TIR-Fresnel lens design with focal distance 5 mm has been manufactured using this photo mask design algorithm and beam collimation up to 12° beam angle and 32° field angle is shown. These outcomes demonstrate that the laser ablation process intrinsically yields sufficient small dispersion in structure and fillet radii for lighting applications.","PeriodicalId":212434,"journal":{"name":"SPIE Optical Systems Design","volume":"2012 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127393418","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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