Pub Date : 2010-11-11DOI: 10.1109/BEC.2010.5630292
L. Moller, H. Jesus, F. Moraes, L. Indrusiak, T. Hollstein, M. Glesner
One problem of Multiprocessor Systems-on-Chip (MPSoCs) based on Networks-on-Chip (NoCs) is tracing the dozens of parallel communications that are transferred in the system. The goals of tracing communications are usually either debugging or monitoring the NoC for design space exploration. On Register Transfer Level (RTL) NoCs the tracing is frequently verified by waveforms, which provides limited useful information about the global status of the NoC. The goal of this work is to improve the tracing capabilities of RTL NoCs and provide a global picture of what is happening in the NoC. This is accomplished by using a Java tool to represent graphically relevant events of the NoC. The input of this tool is a list of relevant events generated by the RTL simulator during the simulation of an MPSoC. The HERMES NoC is used as test case for the tool.
{"title":"Graphical interface for debugging RTL Networks-on-Chip","authors":"L. Moller, H. Jesus, F. Moraes, L. Indrusiak, T. Hollstein, M. Glesner","doi":"10.1109/BEC.2010.5630292","DOIUrl":"https://doi.org/10.1109/BEC.2010.5630292","url":null,"abstract":"One problem of Multiprocessor Systems-on-Chip (MPSoCs) based on Networks-on-Chip (NoCs) is tracing the dozens of parallel communications that are transferred in the system. The goals of tracing communications are usually either debugging or monitoring the NoC for design space exploration. On Register Transfer Level (RTL) NoCs the tracing is frequently verified by waveforms, which provides limited useful information about the global status of the NoC. The goal of this work is to improve the tracing capabilities of RTL NoCs and provide a global picture of what is happening in the NoC. This is accomplished by using a Java tool to represent graphically relevant events of the NoC. The input of this tool is a list of relevant events generated by the RTL simulator during the simulation of an MPSoC. The HERMES NoC is used as test case for the tool.","PeriodicalId":228594,"journal":{"name":"2010 12th Biennial Baltic Electronics Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129187352","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-11-11DOI: 10.1109/BEC.2010.5631006
Michele Bertasi, G. Di Guglielmo, F. Fummi, G. Pravadelli
The paper presents an automatic procedure for generating a particular kind of extended finite state machine, which allows a more uniform exploration of the state space of a design under verification. The proposed approach avoids the transition-incompatibility problem which typically arises in actual HW/SW-system descriptions. A EFSM-based ATPG, which exploits such a model, is able to more uniformly analyze the state space of the system with respect to using a generic EFSM.
{"title":"Effective EFSM generation for HW/SW-design verification","authors":"Michele Bertasi, G. Di Guglielmo, F. Fummi, G. Pravadelli","doi":"10.1109/BEC.2010.5631006","DOIUrl":"https://doi.org/10.1109/BEC.2010.5631006","url":null,"abstract":"The paper presents an automatic procedure for generating a particular kind of extended finite state machine, which allows a more uniform exploration of the state space of a design under verification. The proposed approach avoids the transition-incompatibility problem which typically arises in actual HW/SW-system descriptions. A EFSM-based ATPG, which exploits such a model, is able to more uniformly analyze the state space of the system with respect to using a generic EFSM.","PeriodicalId":228594,"journal":{"name":"2010 12th Biennial Baltic Electronics Conference","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127203537","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-10-01DOI: 10.1109/BEC.2010.5631591
M. Janošek, S. Dado
We present a simple narrowband method to detect the amplitude of alternating magnetic fields by a fluxgate sensor using a single lock-in amplifier, improving the common method of using two phase sensitive demodulators (lock-in amplifiers). We eliminated the need for two phase-sensitivite demodulators by processing the reference signals of lock-in amplifier and of the fluxgate excitation unit. This setup can be used as a high-resolution, narrowband spectral analyzer of magnetic fields or as a system for measuring the AC response of magnetic markers. Two methods were introduced and tested; we achieved 2 kHz detecting noise spectral density of 80 pT/√Hz in the laboratory environment. The method is directly usable for any fluxgate sensor or magnetometer, where the reference signals are available. Using a slow feedback compensating-loop further improves the dynamic range of the instrument.
{"title":"Single-lockin detection of AC magnetic fields by fluxgate sensor","authors":"M. Janošek, S. Dado","doi":"10.1109/BEC.2010.5631591","DOIUrl":"https://doi.org/10.1109/BEC.2010.5631591","url":null,"abstract":"We present a simple narrowband method to detect the amplitude of alternating magnetic fields by a fluxgate sensor using a single lock-in amplifier, improving the common method of using two phase sensitive demodulators (lock-in amplifiers). We eliminated the need for two phase-sensitivite demodulators by processing the reference signals of lock-in amplifier and of the fluxgate excitation unit. This setup can be used as a high-resolution, narrowband spectral analyzer of magnetic fields or as a system for measuring the AC response of magnetic markers. Two methods were introduced and tested; we achieved 2 kHz detecting noise spectral density of 80 pT/√Hz in the laboratory environment. The method is directly usable for any fluxgate sensor or magnetometer, where the reference signals are available. Using a slow feedback compensating-loop further improves the dynamic range of the instrument.","PeriodicalId":228594,"journal":{"name":"2010 12th Biennial Baltic Electronics Conference","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126431365","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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