Pub Date : 2010-11-11DOI: 10.1109/BEC.2010.5630791
P. Mysiak
The article presents the principle of operation of a coupled three-phase reactor (CTRλ) used applied in 18-pulse diode converter. Using sets of coupled three-phase power network reactors, the presented converter makes it possible to considerably reduce, at low cost, undesired higher harmonics in the power network current. Selected results of laboratory tests done on a 20kVA 18-pulse diode converter are included.
{"title":"20 kW 18-pulse diode converter - results of laboratory tests","authors":"P. Mysiak","doi":"10.1109/BEC.2010.5630791","DOIUrl":"https://doi.org/10.1109/BEC.2010.5630791","url":null,"abstract":"The article presents the principle of operation of a coupled three-phase reactor (CTRλ) used applied in 18-pulse diode converter. Using sets of coupled three-phase power network reactors, the presented converter makes it possible to considerably reduce, at low cost, undesired higher harmonics in the power network current. Selected results of laboratory tests done on a 20kVA 18-pulse diode converter are included.","PeriodicalId":228594,"journal":{"name":"2010 12th Biennial Baltic Electronics Conference","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133397658","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-11-11DOI: 10.1109/BEC.2010.5631216
E. Velmre
Thomas Johann Seebeck, Estonian-German physicist, chemist and physician was born in 1770 in Reval, now Tallinn, Estonia. Educated in Tallinn, Berlin and Göttingen, he lived and worked in Jena, Bayreuth, Nuremberg, and Berlin, where he died in 1831. In this article, his life and his main scientific achievements are briefly overviewed.
{"title":"Thomas Johann Seebeck and his contribution to the modern science and technology","authors":"E. Velmre","doi":"10.1109/BEC.2010.5631216","DOIUrl":"https://doi.org/10.1109/BEC.2010.5631216","url":null,"abstract":"Thomas Johann Seebeck, Estonian-German physicist, chemist and physician was born in 1770 in Reval, now Tallinn, Estonia. Educated in Tallinn, Berlin and Göttingen, he lived and worked in Jena, Bayreuth, Nuremberg, and Berlin, where he died in 1831. In this article, his life and his main scientific achievements are briefly overviewed.","PeriodicalId":228594,"journal":{"name":"2010 12th Biennial Baltic Electronics Conference","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134620221","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-11-11DOI: 10.1109/BEC.2010.5630751
V. Sklyarov
The paper integrates the results of the previous work and presents the complete methodology for synthesis of digital circuits and systems from hierarchical and parallel specifications expressed in the form of hierarchical graph-schemes. Such specifications provide support for design reuse, parallelization and other important features highlighted in the paper. The synthesis is based on the model of a hierarchical finite state machine (HFSM) and the proposed design templates. Two different types of HFSM (with explicit and implicit modules) are discussed. Practicability and advantages of the proposed technique are demonstrated on numerous examples, such as data sorting, priority buffering and embedded controllers.
{"title":"Synthesis of circuits and systems from hierarchical and parallel specifications","authors":"V. Sklyarov","doi":"10.1109/BEC.2010.5630751","DOIUrl":"https://doi.org/10.1109/BEC.2010.5630751","url":null,"abstract":"The paper integrates the results of the previous work and presents the complete methodology for synthesis of digital circuits and systems from hierarchical and parallel specifications expressed in the form of hierarchical graph-schemes. Such specifications provide support for design reuse, parallelization and other important features highlighted in the paper. The synthesis is based on the model of a hierarchical finite state machine (HFSM) and the proposed design templates. Two different types of HFSM (with explicit and implicit modules) are discussed. Practicability and advantages of the proposed technique are demonstrated on numerous examples, such as data sorting, priority buffering and embedded controllers.","PeriodicalId":228594,"journal":{"name":"2010 12th Biennial Baltic Electronics Conference","volume":"59 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133228750","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-11-11DOI: 10.1109/BEC.2010.5630204
U. Pliquett, T. Nacke
Impedance measurement promises a fast and cheap method for characterization of virtually any matter. Especially for applications in medicine, biotechnology or food industry, bioimpedance measurement technique is believed to solve problems associated with established but time consuming and complicate methods. The practice, however, shows that despite of more than 60 years of intensive research in this field only a few applications are established. The success of impedance measurement relies more and more on the capabilities of devices designed for process environment. These devices have to be fast and robust and should be operable without trained technicians. In recent years an increasing number of solutions appear at the market establishing impedance measurement more and more as common tool in process control and quality management.
{"title":"Process relevant impedance measurement: Fast and robust","authors":"U. Pliquett, T. Nacke","doi":"10.1109/BEC.2010.5630204","DOIUrl":"https://doi.org/10.1109/BEC.2010.5630204","url":null,"abstract":"Impedance measurement promises a fast and cheap method for characterization of virtually any matter. Especially for applications in medicine, biotechnology or food industry, bioimpedance measurement technique is believed to solve problems associated with established but time consuming and complicate methods. The practice, however, shows that despite of more than 60 years of intensive research in this field only a few applications are established. The success of impedance measurement relies more and more on the capabilities of devices designed for process environment. These devices have to be fast and robust and should be operable without trained technicians. In recent years an increasing number of solutions appear at the market establishing impedance measurement more and more as common tool in process control and quality management.","PeriodicalId":228594,"journal":{"name":"2010 12th Biennial Baltic Electronics Conference","volume":"26 12","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131751024","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-11-11DOI: 10.1109/BEC.2010.5630194
R. Erts, E. Kviesis-Kipge, J. Zaharans, E. Zaharans, J. Spigulis
A sensitive, digital, wireless sensor probe has been developed for photoplethysmography (PPG) measurements. It uses standard light emitting source and detector. The main advantage of this approach is to measure discharge time of the photodiode as amplitude of PPG signal. It reduces the cost, dimensions, power consumption and filtering of the device. First results of distant monitoring of heart rate using the newly developed sensor probe are presented.
{"title":"Wireless photoplethysmography finger sensor probe","authors":"R. Erts, E. Kviesis-Kipge, J. Zaharans, E. Zaharans, J. Spigulis","doi":"10.1109/BEC.2010.5630194","DOIUrl":"https://doi.org/10.1109/BEC.2010.5630194","url":null,"abstract":"A sensitive, digital, wireless sensor probe has been developed for photoplethysmography (PPG) measurements. It uses standard light emitting source and detector. The main advantage of this approach is to measure discharge time of the photodiode as amplitude of PPG signal. It reduces the cost, dimensions, power consumption and filtering of the device. First results of distant monitoring of heart rate using the newly developed sensor probe are presented.","PeriodicalId":228594,"journal":{"name":"2010 12th Biennial Baltic Electronics Conference","volume":"10 48","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114052296","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-11-11DOI: 10.1109/BEC.2010.5631144
J. Tyystjárvi, T. Santti, J. Plosila
As the bytecode produced by the Java compiler is unoptimized, the bytecode generated from certain types of idiomatic Java code is inefficient for execution in an interpreter. This effect is amplified in a co-processor system, in which a single processor must process heap accesses and virtual method calls from multiple threads. Two types of optimizations are presented which can be performed directly on bytecode during class loading and which do not require a large amount of processing time. These optimizations are shown to improve performance greatly, up to 29 % in the Embedded Caffeinemark Benchmark suite. Even higher improvements were measured in multithreaded programs.
{"title":"Efficient bytecode optimizations for a multicore Java co-processor system","authors":"J. Tyystjárvi, T. Santti, J. Plosila","doi":"10.1109/BEC.2010.5631144","DOIUrl":"https://doi.org/10.1109/BEC.2010.5631144","url":null,"abstract":"As the bytecode produced by the Java compiler is unoptimized, the bytecode generated from certain types of idiomatic Java code is inefficient for execution in an interpreter. This effect is amplified in a co-processor system, in which a single processor must process heap accesses and virtual method calls from multiple threads. Two types of optimizations are presented which can be performed directly on bytecode during class loading and which do not require a large amount of processing time. These optimizations are shown to improve performance greatly, up to 29 % in the Embedded Caffeinemark Benchmark suite. Even higher improvements were measured in multithreaded programs.","PeriodicalId":228594,"journal":{"name":"2010 12th Biennial Baltic Electronics Conference","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126810917","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-11-11DOI: 10.1109/BEC.2010.5631589
J. Svarny
The broadband external intensity electro-optic modulating unit is aimed to serve as a vital part of analogue measuring electro-optic system that is under the development at our department. The modulating unit is based on integrated intensity electro-optic modulator of Mach-Zehnder type. Undoubtedly, one of the most severe problems linked with application of the appliance like this seems to be its operating point time-drift. The paper deals with methodology of measurements and evaluation of drift value. Furthermore, prospective necessity of operating point stabilization is discussed here from particular application point of view.
{"title":"Analysis of quadrature bias-point drift of Mach-Zehnder electro-optic modulator","authors":"J. Svarny","doi":"10.1109/BEC.2010.5631589","DOIUrl":"https://doi.org/10.1109/BEC.2010.5631589","url":null,"abstract":"The broadband external intensity electro-optic modulating unit is aimed to serve as a vital part of analogue measuring electro-optic system that is under the development at our department. The modulating unit is based on integrated intensity electro-optic modulator of Mach-Zehnder type. Undoubtedly, one of the most severe problems linked with application of the appliance like this seems to be its operating point time-drift. The paper deals with methodology of measurements and evaluation of drift value. Furthermore, prospective necessity of operating point stabilization is discussed here from particular application point of view.","PeriodicalId":228594,"journal":{"name":"2010 12th Biennial Baltic Electronics Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126718035","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-11-11DOI: 10.1109/BEC.2010.5629723
S. Kostin, R. Ubar, J. Raik
We propose a hierarchical approach for the macro level cause-effect physical defect diagnosis in digital circuits. As macros we may consider arbitrary subcircuits or library components (e.g. complex gates) of digital circuits. The faulty macro location procedure is considered as a two step task. First, to locate a subset of suspected faulty macros in a network by using stuck-at-fault (SAF) dictionaries for the outputs of macros. Second, to prune the set of suspected faulty macros by subsequent physical defect reasoning. In case of library components as macros, the library defect dictionaries may be used for defect location. The size of the SAF dictionary depends linearly on the number of macros to be determined as faulty or not faulty, and the size of the defect dictionaries depends on the number of simulated possible defects inside the macros. The proposed hierarchical approach to fault diagnosis helps to cope with the growing complexities of digital circuits. On the other hand, the experimental results have shown higher diagnosability of the proposed defect oriented approach compared to the SAF oriented macro level fault diagnosis.
{"title":"Macro level defect-oriented diagnosability of digital circuits","authors":"S. Kostin, R. Ubar, J. Raik","doi":"10.1109/BEC.2010.5629723","DOIUrl":"https://doi.org/10.1109/BEC.2010.5629723","url":null,"abstract":"We propose a hierarchical approach for the macro level cause-effect physical defect diagnosis in digital circuits. As macros we may consider arbitrary subcircuits or library components (e.g. complex gates) of digital circuits. The faulty macro location procedure is considered as a two step task. First, to locate a subset of suspected faulty macros in a network by using stuck-at-fault (SAF) dictionaries for the outputs of macros. Second, to prune the set of suspected faulty macros by subsequent physical defect reasoning. In case of library components as macros, the library defect dictionaries may be used for defect location. The size of the SAF dictionary depends linearly on the number of macros to be determined as faulty or not faulty, and the size of the defect dictionaries depends on the number of simulated possible defects inside the macros. The proposed hierarchical approach to fault diagnosis helps to cope with the growing complexities of digital circuits. On the other hand, the experimental results have shown higher diagnosability of the proposed defect oriented approach compared to the SAF oriented macro level fault diagnosis.","PeriodicalId":228594,"journal":{"name":"2010 12th Biennial Baltic Electronics Conference","volume":"122 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121692860","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-11-11DOI: 10.1109/BEC.2010.5631143
M. Chupilko, A. Kamkin
The paper describes a methodology for formal cycle-accurate specification of synchronous parallel-pipeline hardware. The main application of the methodology is simulation-based verification of control-intensive digital designs. Its key features are as follows: (1) resources of a design under verification (buffers, arbiters, data transfer channels, etc.) are specified by means of reusable cycle-accurate models; (2) operations of a design (pipeline control flows) are described by defining contracts (i.e. pre- and post-conditions) for all operation stages (functional units of a pipeline). Formal specifications of that kind can be easily applied to automate simulation-based verification. The suggested solution is aimed at achieving technological effectiveness of specifications development.
{"title":"Developing cycle-accurate contract specifications for synchronous parallel-pipeline hardware: Application to verification","authors":"M. Chupilko, A. Kamkin","doi":"10.1109/BEC.2010.5631143","DOIUrl":"https://doi.org/10.1109/BEC.2010.5631143","url":null,"abstract":"The paper describes a methodology for formal cycle-accurate specification of synchronous parallel-pipeline hardware. The main application of the methodology is simulation-based verification of control-intensive digital designs. Its key features are as follows: (1) resources of a design under verification (buffers, arbiters, data transfer channels, etc.) are specified by means of reusable cycle-accurate models; (2) operations of a design (pipeline control flows) are described by defining contracts (i.e. pre- and post-conditions) for all operation stages (functional units of a pipeline). Formal specifications of that kind can be easily applied to automate simulation-based verification. The suggested solution is aimed at achieving technological effectiveness of specifications development.","PeriodicalId":228594,"journal":{"name":"2010 12th Biennial Baltic Electronics Conference","volume":"4 15","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132939099","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-11-11DOI: 10.1109/BEC.2010.5630918
J. Malmivuo
Though the principle of reciprocity was invented by Hermann von Helmholtz already over 150 years ago, and though it is a very powerful tool in solving various important problems in bioelectromagnetism, it is not generally used. In impedance tomography the measurement sensitivity distribution has generally been misunderstood. This can be easily demonstrated with the principle of reciprocity. Some other applications of the principle of reciprocity are also discussed.
{"title":"Application of the principle of reciprocity to impedance tomography and other problems in bioelectromagnetism","authors":"J. Malmivuo","doi":"10.1109/BEC.2010.5630918","DOIUrl":"https://doi.org/10.1109/BEC.2010.5630918","url":null,"abstract":"Though the principle of reciprocity was invented by Hermann von Helmholtz already over 150 years ago, and though it is a very powerful tool in solving various important problems in bioelectromagnetism, it is not generally used. In impedance tomography the measurement sensitivity distribution has generally been misunderstood. This can be easily demonstrated with the principle of reciprocity. Some other applications of the principle of reciprocity are also discussed.","PeriodicalId":228594,"journal":{"name":"2010 12th Biennial Baltic Electronics Conference","volume":"82 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134622247","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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