Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)最新文献
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.352153
F. Louage, J. Schoukens, Y. Rolain
In this paper a method is presented to impose a desired periodic excitation signal on the input of a nonlinear system using an arbitrary waveform generator. It is illustrated that this technique has many applications, like a linearity check of an unknown system and the measurement of the harmonic distortion.<>
{"title":"Generation of computer controlled excitations and its application to the detection and measurement of harmonic distortions","authors":"F. Louage, J. Schoukens, Y. Rolain","doi":"10.1109/IMTC.1994.352153","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352153","url":null,"abstract":"In this paper a method is presented to impose a desired periodic excitation signal on the input of a nonlinear system using an arbitrary waveform generator. It is illustrated that this technique has many applications, like a linearity check of an unknown system and the measurement of the harmonic distortion.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131647942","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.351859
L. Xiaofei, Guo Shize, Li Chengbin
The hardware design of a computer interface card which can improve the instantaneous writing speed to hard disk by means of memory image alternately buffering is introduced, and the precise coordination with the software and hard disk initialization based on the detail analysis of the writing process to hard disk is also given in this paper. In fact, since not only the average but also the instantaneous writing speed has been enhanced, the method is generally valuable to any rapid real-time storage of measurement data. It has been applied to a CAMAC remote measurement system for storing the large capacity and high throughput measurement data.<>
{"title":"Improving the instantaneous writing speed to hard disk by alternately buffering","authors":"L. Xiaofei, Guo Shize, Li Chengbin","doi":"10.1109/IMTC.1994.351859","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351859","url":null,"abstract":"The hardware design of a computer interface card which can improve the instantaneous writing speed to hard disk by means of memory image alternately buffering is introduced, and the precise coordination with the software and hard disk initialization based on the detail analysis of the writing process to hard disk is also given in this paper. In fact, since not only the average but also the instantaneous writing speed has been enhanced, the method is generally valuable to any rapid real-time storage of measurement data. It has been applied to a CAMAC remote measurement system for storing the large capacity and high throughput measurement data.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130688098","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.352105
A. Leva, L. Piroddi
This paper presents a simple technique for the structural identification of single-input, single-output (SISO) dynamic systems, based on the use of a neural network. The network is trained to recognize some significant features of the process dynamics starting from a simplified representation of its unit step response, which in turn is obtained by a convenient I/O experiment. In addition, the network classifies the process with respect to a convenient set of possible model structures, which represent the most common situations arising when a process model needs to be identified for control purposes.<>
{"title":"A neural network-based technique for structural identification of SISO systems","authors":"A. Leva, L. Piroddi","doi":"10.1109/IMTC.1994.352105","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352105","url":null,"abstract":"This paper presents a simple technique for the structural identification of single-input, single-output (SISO) dynamic systems, based on the use of a neural network. The network is trained to recognize some significant features of the process dynamics starting from a simplified representation of its unit step response, which in turn is obtained by a convenient I/O experiment. In addition, the network classifies the process with respect to a convenient set of possible model structures, which represent the most common situations arising when a process model needs to be identified for control purposes.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132269875","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.352123
Lin MaoLui, Shu Dongmei
In this paper, a special module using VXIbus which is the latest test and measurement bus is present. The module is a message-based servant device and can measure the time between two pulses. With detail analysis, the design method of the primary interface of the module, the operating principle and the error estimation of measurement circuit are described appropriately. The module has been successfully applied to a VXIbus-based radar automatic test system for measuring time and the corresponding distance.<>
{"title":"Development of a VXIbus B-size special module used for measurement of time and distance","authors":"Lin MaoLui, Shu Dongmei","doi":"10.1109/IMTC.1994.352123","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352123","url":null,"abstract":"In this paper, a special module using VXIbus which is the latest test and measurement bus is present. The module is a message-based servant device and can measure the time between two pulses. With detail analysis, the design method of the primary interface of the module, the operating principle and the error estimation of measurement circuit are described appropriately. The module has been successfully applied to a VXIbus-based radar automatic test system for measuring time and the corresponding distance.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"119 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132435127","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.352118
G. Roman, T. Dobrowiecki
Interdisciplinary applications exposed new interesting, but difficult problems in the field of measurement. Such applications put emphasis on the automation of the measurement process on the whole. The analysis of how the experiments are planned, controlled, evaluated, etc. Brought into focus the question of how well the expert knowledge related to the measurement can be represented and utilised in the development of autonomous intelligent measurement systems. Methods developed in the field of Artificial Intelligence (AI) lend themselves naturally for such applications. The present paper proposes so called constraints to be used as the knowledge representation tool in modelling measurements. When a deeper model of the phenomena underlying the measurement processes is needed, applying constraints as knowledge representation is potentially fruitful, considering how well they express the dependencies between different subsystems and state variables of the physical systems. Authors review measurement technical problems suited for the constraint based knowledge representation, analyse the requirements of the actual constraint satisfaction problems and evaluate the known methodology from that perspective.<>
{"title":"Modelling measurement technical problems with constraints","authors":"G. Roman, T. Dobrowiecki","doi":"10.1109/IMTC.1994.352118","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352118","url":null,"abstract":"Interdisciplinary applications exposed new interesting, but difficult problems in the field of measurement. Such applications put emphasis on the automation of the measurement process on the whole. The analysis of how the experiments are planned, controlled, evaluated, etc. Brought into focus the question of how well the expert knowledge related to the measurement can be represented and utilised in the development of autonomous intelligent measurement systems. Methods developed in the field of Artificial Intelligence (AI) lend themselves naturally for such applications. The present paper proposes so called constraints to be used as the knowledge representation tool in modelling measurements. When a deeper model of the phenomena underlying the measurement processes is needed, applying constraints as knowledge representation is potentially fruitful, considering how well they express the dependencies between different subsystems and state variables of the physical systems. Authors review measurement technical problems suited for the constraint based knowledge representation, analyse the requirements of the actual constraint satisfaction problems and evaluate the known methodology from that perspective.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"69 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131910795","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.351888
F.M.L. van der Goes, G. Meijer
This paper presents a simple and accurate dynamic voltage divider for resistive bridge transducers which can be completely integrated in a standard CMOS process. Calibration is not necessary. The division ratio does not depend on the switch resistance of the applied switches. The charge injection and the voltage dependency of the resistors do not have any influence on the performance. Furthermore, the number of components is drastically reduced, compared to traditional dividers. Measurements on an integrated divider in a CMOS process show an accuracy of 13 bits.<>
{"title":"A simple and accurate dynamic voltage divider for resistive bridge transducers","authors":"F.M.L. van der Goes, G. Meijer","doi":"10.1109/IMTC.1994.351888","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351888","url":null,"abstract":"This paper presents a simple and accurate dynamic voltage divider for resistive bridge transducers which can be completely integrated in a standard CMOS process. Calibration is not necessary. The division ratio does not depend on the switch resistance of the applied switches. The charge injection and the voltage dependency of the resistors do not have any influence on the performance. Furthermore, the number of components is drastically reduced, compared to traditional dividers. Measurements on an integrated divider in a CMOS process show an accuracy of 13 bits.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127071161","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.352167
H. Yasukawa
This paper describes system identification using a subband adaptive digital filter (ADF) valuable for a wide band system with very higher order impulse response. To analyze the system identification problem equivalent models are introduced and analyzed. The relationships between impulse response of the unknown system and coefficients of subband ADFs in the steady state are shown. We discuss the performance of the subband ADF, focusing on filter bank characteristics. We also discuss the simulation results of the subband ADF.<>
{"title":"Estimation of impulse response using a subband adaptive digital filter","authors":"H. Yasukawa","doi":"10.1109/IMTC.1994.352167","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352167","url":null,"abstract":"This paper describes system identification using a subband adaptive digital filter (ADF) valuable for a wide band system with very higher order impulse response. To analyze the system identification problem equivalent models are introduced and analyzed. The relationships between impulse response of the unknown system and coefficients of subband ADFs in the steady state are shown. We discuss the performance of the subband ADF, focusing on filter bank characteristics. We also discuss the simulation results of the subband ADF.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"2014 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127422899","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.351889
K. Hadidi, H. Kobayashi
This paper describes a new special purpose variable gain amplifier (VGA) using a standard 1.2 /spl mu/m digital CMOS process. The new architecture allows the gain to be varied over a wide range (more than 20 dB), while temperature induced drift in gain is kept very small over a wide temperature range (5/spl deg/C to 70/spl deg/C). With the new VGA architecture, bandwidth is almost independent of gain. Despite low power consumption (19 mW) the circuit has a large bandwidth (27 MHz), a high maximum gain (14), and shows low THD (better than -55 dB) over its full frequency range. The circuit does not use any capacitor for gain adjustment, thus it is very compact (0.28 mm/spl times/0.25 mm) and has a large input impedance (transistor gate).<>
{"title":"A 25 MHz 20 dB variable gain amplifier","authors":"K. Hadidi, H. Kobayashi","doi":"10.1109/IMTC.1994.351889","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351889","url":null,"abstract":"This paper describes a new special purpose variable gain amplifier (VGA) using a standard 1.2 /spl mu/m digital CMOS process. The new architecture allows the gain to be varied over a wide range (more than 20 dB), while temperature induced drift in gain is kept very small over a wide temperature range (5/spl deg/C to 70/spl deg/C). With the new VGA architecture, bandwidth is almost independent of gain. Despite low power consumption (19 mW) the circuit has a large bandwidth (27 MHz), a high maximum gain (14), and shows low THD (better than -55 dB) over its full frequency range. The circuit does not use any capacitor for gain adjustment, thus it is very compact (0.28 mm/spl times/0.25 mm) and has a large input impedance (transistor gate).<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115236863","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.352042
K. Watanabe, A. Komori, T. Kiyama
The diagnosis of faults in instrumentation equipment can often be confused with faults in the system. The correct diagnosis of instrument faults is of importance. Here it is described how to detect instrument faults in non-linearity. Time-varying processes that include uncertainties such as modelling error, parameter ambiguity, and input and output noise. The design of state estimation filters with zero sensitivity to the uncertainties and maximum sensitivity to the instrument faults is described together with the conditions for the existence of such filters. The idea was applied to the fault diagnosis of a heat exchanger. The heat exchanger can be described by a bilinear model with modelling uncertainties. The cause of the fault is estimated from a fault dictionary which was compiled.<>
{"title":"Diagnosis of instrument fault","authors":"K. Watanabe, A. Komori, T. Kiyama","doi":"10.1109/IMTC.1994.352042","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352042","url":null,"abstract":"The diagnosis of faults in instrumentation equipment can often be confused with faults in the system. The correct diagnosis of instrument faults is of importance. Here it is described how to detect instrument faults in non-linearity. Time-varying processes that include uncertainties such as modelling error, parameter ambiguity, and input and output noise. The design of state estimation filters with zero sensitivity to the uncertainties and maximum sensitivity to the instrument faults is described together with the conditions for the existence of such filters. The idea was applied to the fault diagnosis of a heat exchanger. The heat exchanger can be described by a bilinear model with modelling uncertainties. The cause of the fault is estimated from a fault dictionary which was compiled.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115422559","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.352157
J. Nakada, S. Tajiri
This paper discusses a new method of estimating the carrier leakage for evaluation of a DQPSK modulated signal. Measured values such as modulation accuracy, carrier frequency error, and IQ origin offset are used in the evaluation of digitally modulated signals. In this new method, the carrier leakage is estimated from two adjacent symbols that form an isosceles triangle. The method is applicable when the transmitted digital data is completely demodulated or when the transmitted data is known. It is available when there is carrier frequency error in a modulated signal.<>
{"title":"A simple method to estimate carrier leakage with carrier frequency error","authors":"J. Nakada, S. Tajiri","doi":"10.1109/IMTC.1994.352157","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352157","url":null,"abstract":"This paper discusses a new method of estimating the carrier leakage for evaluation of a DQPSK modulated signal. Measured values such as modulation accuracy, carrier frequency error, and IQ origin offset are used in the evaluation of digitally modulated signals. In this new method, the carrier leakage is estimated from two adjacent symbols that form an isosceles triangle. The method is applicable when the transmitted digital data is completely demodulated or when the transmitted data is known. It is available when there is carrier frequency error in a modulated signal.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"82 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124434195","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)
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