Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)最新文献
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.351894
C. Komiyama, E. Saito, Y. Tomita, S. Honda
Functional Electrical Stimulation (FES) is one of the methods to activate paralyzed muscles for the restoration of functional movements in the patients of spinal cord or central nervous system injury. In the clinical application of FES, the convenience is important as well as safety. Hence, this work combines walker support and orthosis of lower limbs with FES, which is called a hybrid FES. It requires less power of stimulation and it is simple to put pn electrodes comparing with the stand alone FES system. The stimulator applies the constant current stimulus of which rectangular monophasic pulse train is amplitude-modulated. The stimulation is derived through surface electrodes to quadriceps femoris and gluteus maximus muscles. The control strategy is open-loop, based on the stimulus pattern of standing up motion in nonparalyzed persons, whose electromyogram (EMG) is recorded at standing up motion. The envelope of the amplitude of the surface EMG corresponds to the amplitude of the stimulus current. We set the standard stimulus pattern to the maximal pulse height for each paralyzed person and then made their own stimulus pattern of a specified paralyzed persons.<>
{"title":"Hybrid FES orthosis for standing up in paraplegia","authors":"C. Komiyama, E. Saito, Y. Tomita, S. Honda","doi":"10.1109/IMTC.1994.351894","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351894","url":null,"abstract":"Functional Electrical Stimulation (FES) is one of the methods to activate paralyzed muscles for the restoration of functional movements in the patients of spinal cord or central nervous system injury. In the clinical application of FES, the convenience is important as well as safety. Hence, this work combines walker support and orthosis of lower limbs with FES, which is called a hybrid FES. It requires less power of stimulation and it is simple to put pn electrodes comparing with the stand alone FES system. The stimulator applies the constant current stimulus of which rectangular monophasic pulse train is amplitude-modulated. The stimulation is derived through surface electrodes to quadriceps femoris and gluteus maximus muscles. The control strategy is open-loop, based on the stimulus pattern of standing up motion in nonparalyzed persons, whose electromyogram (EMG) is recorded at standing up motion. The envelope of the amplitude of the surface EMG corresponds to the amplitude of the stimulus current. We set the standard stimulus pattern to the maximal pulse height for each paralyzed person and then made their own stimulus pattern of a specified paralyzed persons.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"199 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122285354","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.351974
M. Begin, F. Ghannouchi, L. Selmi, B. Riccò
An innovative six-port network analyzer (SPNA) for characterizing GaAs MESFETs under pulsed bias and RF conditions is presented in this paper. This SPNA allows the measurements of instantaneous S parameters of microwave active devices. These S parameters may then be used to extract the electrical model elements (Cgs, Cgd, Gds, Gm, etc.) of the MESFET using standard procedures. This system is particularly suitable for studying trapping and self-heating effects in GaAs devices.<>
{"title":"Instantaneous S parameters measurements of MESFETs under burst bias conditions","authors":"M. Begin, F. Ghannouchi, L. Selmi, B. Riccò","doi":"10.1109/IMTC.1994.351974","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351974","url":null,"abstract":"An innovative six-port network analyzer (SPNA) for characterizing GaAs MESFETs under pulsed bias and RF conditions is presented in this paper. This SPNA allows the measurements of instantaneous S parameters of microwave active devices. These S parameters may then be used to extract the electrical model elements (Cgs, Cgd, Gds, Gm, etc.) of the MESFET using standard procedures. This system is particularly suitable for studying trapping and self-heating effects in GaAs devices.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122381182","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.351815
H. Nagura, K. Fujino
The single chip power meter is a programmable mixed signal IC for three phase power line measurement. The DSP block includes two programmable 32 bit processors which executes metering functions and calibration algorithm for six AD converter inputs. In the calibration algorithm correction methods for two major errors have been attempted: for a non-linearity error of input transformers and AD converters, for a phase leading error of the current transformers against the voltage transformers. 30 correction coefficients including frequency dependency are computed by an automatic calibration system. The experimental results demonstrate the efficiency of the corrections: the non-linearity of RMS current measurement has been reduced from /spl plusmn/0.17%FS to /spl plusmn/0.07%FS by the nonlinearity correction, the measurement offset error of three phase power has been reduced from /spl plusmn/3%FS to /spl plusmn/0.25%FS by the phase error correction. These correction techniques bring a breakthrough for cutting the production cost, by permitting use with inexpensive transformers which have less linearity and large characteristic deviation.<>
{"title":"Correction method for a single chip power meter","authors":"H. Nagura, K. Fujino","doi":"10.1109/IMTC.1994.351815","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351815","url":null,"abstract":"The single chip power meter is a programmable mixed signal IC for three phase power line measurement. The DSP block includes two programmable 32 bit processors which executes metering functions and calibration algorithm for six AD converter inputs. In the calibration algorithm correction methods for two major errors have been attempted: for a non-linearity error of input transformers and AD converters, for a phase leading error of the current transformers against the voltage transformers. 30 correction coefficients including frequency dependency are computed by an automatic calibration system. The experimental results demonstrate the efficiency of the corrections: the non-linearity of RMS current measurement has been reduced from /spl plusmn/0.17%FS to /spl plusmn/0.07%FS by the nonlinearity correction, the measurement offset error of three phase power has been reduced from /spl plusmn/3%FS to /spl plusmn/0.25%FS by the phase error correction. These correction techniques bring a breakthrough for cutting the production cost, by permitting use with inexpensive transformers which have less linearity and large characteristic deviation.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116521798","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.351845
Y. Nonaka, H. Nakane, T. Maeda, K. Hasuike
A method is proposed for a simultaneous measurement of the resistivity and permeability of a film by measuring the difference in the composite impedance of a pair of coils placed on both sides of the sample film facing each other. In first case, the current passes through the coils in the same direction and in second case, the current passes through the coils in opposite directions to each other. It was theoretically found that the optimum frequency for the measurement was proportional to the resistivity and inversely proportional to the thickness of a sample film in the case of paramagnetic films. This method was tested by measuring the resistivity of copper and brass films of a thickness ranging from 0.01 to 0.08 mm, and by simultaneously measuring the resistivity and permeability of nickel films of a thickness of 0.01 and 0.02 mm. The measured values of the resistivity with this method have correlated well with the values measured with the dc four-point probe method.<>
{"title":"Simultaneous measuring the resistivity and permeability of a film sample with double coils","authors":"Y. Nonaka, H. Nakane, T. Maeda, K. Hasuike","doi":"10.1109/IMTC.1994.351845","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351845","url":null,"abstract":"A method is proposed for a simultaneous measurement of the resistivity and permeability of a film by measuring the difference in the composite impedance of a pair of coils placed on both sides of the sample film facing each other. In first case, the current passes through the coils in the same direction and in second case, the current passes through the coils in opposite directions to each other. It was theoretically found that the optimum frequency for the measurement was proportional to the resistivity and inversely proportional to the thickness of a sample film in the case of paramagnetic films. This method was tested by measuring the resistivity of copper and brass films of a thickness ranging from 0.01 to 0.08 mm, and by simultaneously measuring the resistivity and permeability of nickel films of a thickness of 0.01 and 0.02 mm. The measured values of the resistivity with this method have correlated well with the values measured with the dc four-point probe method.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126680391","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.352031
J. Donohue, I. Novak
Previous publications have described an effect termed "wired-OR glitch" on digital bus lines driven by multiple transmitters. This effect occurs when a given line is pulled to the active "low" state simultaneously by open collector/drain transmitters. If one of the transmitters switches to the inactive open-collector state, the line will momentarily be forced toward the high level, due to the propagation of the current transition, despite the other transmitter maintaining a constant low. Most prior work has focused on Futurebus handshake and control lines. It is shown that this effect can also be observed on data lines. Even if the two transistor's "on" times never overlap. Measurements are provided for a TeleComBus-style system using (Backplane-Transceiver Logic) BTL devices. Simulations art used to provide a detailed analysis of the glitch effect, and show that this effect must be considered in any digital bus system using more than one, physically-separated transmitter.<>
{"title":"Multiple-driver glitch in digital busses","authors":"J. Donohue, I. Novak","doi":"10.1109/IMTC.1994.352031","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352031","url":null,"abstract":"Previous publications have described an effect termed \"wired-OR glitch\" on digital bus lines driven by multiple transmitters. This effect occurs when a given line is pulled to the active \"low\" state simultaneously by open collector/drain transmitters. If one of the transmitters switches to the inactive open-collector state, the line will momentarily be forced toward the high level, due to the propagation of the current transition, despite the other transmitter maintaining a constant low. Most prior work has focused on Futurebus handshake and control lines. It is shown that this effect can also be observed on data lines. Even if the two transistor's \"on\" times never overlap. Measurements are provided for a TeleComBus-style system using (Backplane-Transceiver Logic) BTL devices. Simulations art used to provide a detailed analysis of the glitch effect, and show that this effect must be considered in any digital bus system using more than one, physically-separated transmitter.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126916265","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.351930
M. Ono, K. Ito, E. Yoshida, S. Sekimukai, H. Kamada
The purpose of this paper is to present the development of an L-band pulsed electron spin resonance (ESR) spectrometer. The configuration of a prototype spectrometer is explained. Using this spectrometer, the signal of electron spin echo (ESE) is detected for the sample of /spl gamma/-irradiated quartz powder. For the ESE signal, it is stated that the detectable minimum weight of the sample is 3 g.<>
{"title":"Development of pulsed L-band ESR spectrometer","authors":"M. Ono, K. Ito, E. Yoshida, S. Sekimukai, H. Kamada","doi":"10.1109/IMTC.1994.351930","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351930","url":null,"abstract":"The purpose of this paper is to present the development of an L-band pulsed electron spin resonance (ESR) spectrometer. The configuration of a prototype spectrometer is explained. Using this spectrometer, the signal of electron spin echo (ESE) is detected for the sample of /spl gamma/-irradiated quartz powder. For the ESE signal, it is stated that the detectable minimum weight of the sample is 3 g.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"106 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124160118","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.352182
S. Usui
It is very easy to create your own sophisticated custom Data Acquisition, Analysis and Control Applications using Visual Designer, an application generator software which greatly enhances your productivity by allowing you to create these applications without writing programs. Developed by Intelligent Instrumentation Lnc. in Tucson, Arizona, LISA, a Burr-Brown Company, Visual Designer runs on any ISA/EISA machines under Windows 3. 1 ( DOS/V machines under Windows 3.15 now in Japan). You develop your application software in an integrated development environment, called Diagram, by drawing a block diagram, called FlowGram. The Diagram compiles this into an executable application file, called FlowCode and parameter file. The application FlowCode is then executed from Visual Designer's Run environment. The Run environment can be invoked directly from the Diagram, or it can be done as a stand-alone application. Thus you have your own Windows Application in a drastically short time. Visual Designer has been used in hundreds of applications around the world since its release in November of 1993. It has shortened the development time required for these applications to a fraction of time required by programming languages, either graphical or textual.<>
{"title":"Application generators speed up development of acquisition/analysis/control systems","authors":"S. Usui","doi":"10.1109/IMTC.1994.352182","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352182","url":null,"abstract":"It is very easy to create your own sophisticated custom Data Acquisition, Analysis and Control Applications using Visual Designer, an application generator software which greatly enhances your productivity by allowing you to create these applications without writing programs. Developed by Intelligent Instrumentation Lnc. in Tucson, Arizona, LISA, a Burr-Brown Company, Visual Designer runs on any ISA/EISA machines under Windows 3. 1 ( DOS/V machines under Windows 3.15 now in Japan). You develop your application software in an integrated development environment, called Diagram, by drawing a block diagram, called FlowGram. The Diagram compiles this into an executable application file, called FlowCode and parameter file. The application FlowCode is then executed from Visual Designer's Run environment. The Run environment can be invoked directly from the Diagram, or it can be done as a stand-alone application. Thus you have your own Windows Application in a drastically short time. Visual Designer has been used in hundreds of applications around the world since its release in November of 1993. It has shortened the development time required for these applications to a fraction of time required by programming languages, either graphical or textual.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126603504","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.352078
S. Inoue, M. Ohmichi, T. Hashimoto
A simple evaluation of boundary integral in the inverse problem of the steady state heat conduction system is proposed. The boundary values of temperature and its gradient are computated from the direct analysis using FDM and the results of inverse analysis from these boundary values are compared with the given FDM parameters to give the reasonable estimation of boundary integrals. We show that the temperature gradient has some leaks from Dirichlet boundary region by the incomplete derivation of temperature gradient on the boundary surface. The 0.5 mesh extrapolation of temperature gradient from Dirichlet boundary region is also shown to give the accurate boundary integrals in the case of relatively coarse data points of boundary values. This 0.5 mesh extrapolation method is applicable to the actual inverse analysis of three dimensional system.<>
{"title":"Estimation of heat sources and temperature distribution by boundary integral method","authors":"S. Inoue, M. Ohmichi, T. Hashimoto","doi":"10.1109/IMTC.1994.352078","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352078","url":null,"abstract":"A simple evaluation of boundary integral in the inverse problem of the steady state heat conduction system is proposed. The boundary values of temperature and its gradient are computated from the direct analysis using FDM and the results of inverse analysis from these boundary values are compared with the given FDM parameters to give the reasonable estimation of boundary integrals. We show that the temperature gradient has some leaks from Dirichlet boundary region by the incomplete derivation of temperature gradient on the boundary surface. The 0.5 mesh extrapolation of temperature gradient from Dirichlet boundary region is also shown to give the accurate boundary integrals in the case of relatively coarse data points of boundary values. This 0.5 mesh extrapolation method is applicable to the actual inverse analysis of three dimensional system.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124355600","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.351901
Guo Shize, Sun Shenghe, Zhang Zhongting
The random equivalent sampling and sequential equivalent sampling are two equivalent sampling methods widely used in the Digital Storage Oscilloscopes. A novel equivalent sampling method which is called compound equivalent sampling is proposed in this paper. The method combines the high-speed of the random equivalent sampling with the high efficiency of the sequential equivalent sampling and can perform rapid and effective measurement for the periodic signal which is either fast-varying or slow-varying. The circuit using this method is also able to take real-time sampling to the single-shot signals.<>
{"title":"A novel equivalent sampling method using in the digital storage oscilloscopes","authors":"Guo Shize, Sun Shenghe, Zhang Zhongting","doi":"10.1109/IMTC.1994.351901","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351901","url":null,"abstract":"The random equivalent sampling and sequential equivalent sampling are two equivalent sampling methods widely used in the Digital Storage Oscilloscopes. A novel equivalent sampling method which is called compound equivalent sampling is proposed in this paper. The method combines the high-speed of the random equivalent sampling with the high efficiency of the sequential equivalent sampling and can perform rapid and effective measurement for the periodic signal which is either fast-varying or slow-varying. The circuit using this method is also able to take real-time sampling to the single-shot signals.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127768959","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.352020
T. Tsujimura, T. Yabuta
This paper describes telemeasurement for telecommunication conduits, which are long, winding, and cramped inside. Methods of transferring sensor devices or sensor signals along the line to measure the length and state of conduits are studied. A pneumatic system consisting of a thin wire, some balls attached to the wire, a microphone attached to the first of the balls, and a blower is designed. The blower generates airflow in a conduit, and the wire is carried along the conduit by the pressure against the balls. The microphone output indicates when the wire reaches the opposite end of the conduit. Experiments are conducted using a prototype to confirm the effectiveness of this system by evaluating its performance.<>
{"title":"Pneumatic telecommunication conduit inspection system","authors":"T. Tsujimura, T. Yabuta","doi":"10.1109/IMTC.1994.352020","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352020","url":null,"abstract":"This paper describes telemeasurement for telecommunication conduits, which are long, winding, and cramped inside. Methods of transferring sensor devices or sensor signals along the line to measure the length and state of conduits are studied. A pneumatic system consisting of a thin wire, some balls attached to the wire, a microphone attached to the first of the balls, and a blower is designed. The blower generates airflow in a conduit, and the wire is carried along the conduit by the pressure against the balls. The microphone output indicates when the wire reaches the opposite end of the conduit. Experiments are conducted using a prototype to confirm the effectiveness of this system by evaluating its performance.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"100 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117236940","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)
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