Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)最新文献
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.352030
H. Tsutsui, A. Kurosaki, T. Sato, Y. Hiraide
We apply a new modeling technique, Topological Case Based Modeling (TCBM), to fault diagnosis. In this paper we propose a new model which represents a continuous input/output relation using a set of numerical data, and it is possible to describe nonlinear systems. We employ the idea of case based reasoning (CBR). CBR infers a new case from stored cases and these relation.[1] It is important to define the similarity, that is a relation among the cases. We propose to define the similarity as the neighbourhood in input space corresponding to output accuracy and its accuracy is arbitrarily set before constructing the model. We name this technique Topological Case Based Modeling. In addition, we describe that TCBM has several advantages over other models. Finally we also show the example of TCBM to detect the deterioration for a chiller system.<>
{"title":"Fault detection using topological case based modelimg and its application to chiller performance deterioration","authors":"H. Tsutsui, A. Kurosaki, T. Sato, Y. Hiraide","doi":"10.1109/IMTC.1994.352030","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352030","url":null,"abstract":"We apply a new modeling technique, Topological Case Based Modeling (TCBM), to fault diagnosis. In this paper we propose a new model which represents a continuous input/output relation using a set of numerical data, and it is possible to describe nonlinear systems. We employ the idea of case based reasoning (CBR). CBR infers a new case from stored cases and these relation.[1] It is important to define the similarity, that is a relation among the cases. We propose to define the similarity as the neighbourhood in input space corresponding to output accuracy and its accuracy is arbitrarily set before constructing the model. We name this technique Topological Case Based Modeling. In addition, we describe that TCBM has several advantages over other models. Finally we also show the example of TCBM to detect the deterioration for a chiller system.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"84 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116146714","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.352057
Lim Young Cheol, Park Jong Kun, Cho Kyung Young, Kim Eui Sun, Kim Tae Gon, Kim I Gon
This paper describes a noble robot sensor designed to recognize an unknown material by measuring thermal conductivity on various ambient temperature. An active sensor to measure the thermal conductivity of a gripped object was designed and the software program to discriminate material was developed with C language. To discriminate material, it is required to make the look-up table in which temperature response of different materials on the various ambient temperature are stored. But it is impractical to store data on the all ambient temperature. Therefore using cubic spline interpolation, we can estimate the temperature response on ambient temperature condition that is not stored in the look-up table.<>
{"title":"Performance improvement of material recognition sensor using cubic spline interpolation","authors":"Lim Young Cheol, Park Jong Kun, Cho Kyung Young, Kim Eui Sun, Kim Tae Gon, Kim I Gon","doi":"10.1109/IMTC.1994.352057","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352057","url":null,"abstract":"This paper describes a noble robot sensor designed to recognize an unknown material by measuring thermal conductivity on various ambient temperature. An active sensor to measure the thermal conductivity of a gripped object was designed and the software program to discriminate material was developed with C language. To discriminate material, it is required to make the look-up table in which temperature response of different materials on the various ambient temperature are stored. But it is impractical to store data on the all ambient temperature. Therefore using cubic spline interpolation, we can estimate the temperature response on ambient temperature condition that is not stored in the look-up table.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"129 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115256631","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.352033
Y. Yoshida, K. Mizoe, A. Matsuda, S. Kuroiwa
This paper introduces FRONTIER-1; the first chip developed for Fieldbus Interface which integrates complete functions including the modem and the transceiver required for implementing H1 Fieldbus Physical Layer Specification (Wire media, Voltage mode, 31.25 kbps). FRONTIER-1 contains high-voltage bipolar devices to drive the bus, analog circuits such as Op-amps, comparators and a voltage reference for drive control, voltage regulation and filters, and CMOS for the modem circuits. The integration of the transceiver and the modem was accomplished by using high-voltage Bi-CMOS process technology. On transmitting, FRONTIER-1 adds the frame delimiters and preambles to the messages supplied by a host CPU, generates FCS (Frame Check Sequence), and performs Manchester encoding. Transmitted digital signal is converted to the analog signal on the bus. On receiving, the signal on the bus is digitized, and modem circuits decode Manchester data and check FCS, and a host CPU reads the messages.<>
{"title":"Fieldbus interface control IC","authors":"Y. Yoshida, K. Mizoe, A. Matsuda, S. Kuroiwa","doi":"10.1109/IMTC.1994.352033","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352033","url":null,"abstract":"This paper introduces FRONTIER-1; the first chip developed for Fieldbus Interface which integrates complete functions including the modem and the transceiver required for implementing H1 Fieldbus Physical Layer Specification (Wire media, Voltage mode, 31.25 kbps). FRONTIER-1 contains high-voltage bipolar devices to drive the bus, analog circuits such as Op-amps, comparators and a voltage reference for drive control, voltage regulation and filters, and CMOS for the modem circuits. The integration of the transceiver and the modem was accomplished by using high-voltage Bi-CMOS process technology. On transmitting, FRONTIER-1 adds the frame delimiters and preambles to the messages supplied by a host CPU, generates FCS (Frame Check Sequence), and performs Manchester encoding. Transmitted digital signal is converted to the analog signal on the bus. On receiving, the signal on the bus is digitized, and modem circuits decode Manchester data and check FCS, and a host CPU reads the messages.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121179675","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.352165
J. Rivest, P. Soille
In mathematical morphology, images are represented with sets. On binary images, sets delineate portions in the image plane, creating binary shapes. Measurements can be done on these shapes. It has been demonstrated that, for digital images, there exist very few basic measurements. These measurements, along with image transformations, generate all the possible measurements that can be done on an image. For binary images, all the measurements are based on the area, perimeter and connectivity number (number of connected components minus the number of holes inside them). Gray-tone images can also be modeled as 3-D sets. However the 5-D space is not homogeneous: units along the image plane are not the same as those on the intensity axis. This causes problems because not all the basic measurements are physically valid. The basic measurements on gray-tone images are the volume, surface, norm (or mean curvature) and the connectivity number. In this paper, we present a criterion to assess the physical validity of the basic measurements. This allows us to further limit the number of useful basic measurements. On gray-tone images, these are the volume and the connectivity number. We illustrate our findings with an experiment using physically valid and invalid measurements. These measurements are applied to texture characterization and segmentation. We study the behavior of these measurements under illumination changes. We show that a physically invalid measurement gives erratic answers under such circumstances. This has important consequences on the robustness of image analysis algorithms.<>
{"title":"Physical significance of measurements in images","authors":"J. Rivest, P. Soille","doi":"10.1109/IMTC.1994.352165","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352165","url":null,"abstract":"In mathematical morphology, images are represented with sets. On binary images, sets delineate portions in the image plane, creating binary shapes. Measurements can be done on these shapes. It has been demonstrated that, for digital images, there exist very few basic measurements. These measurements, along with image transformations, generate all the possible measurements that can be done on an image. For binary images, all the measurements are based on the area, perimeter and connectivity number (number of connected components minus the number of holes inside them). Gray-tone images can also be modeled as 3-D sets. However the 5-D space is not homogeneous: units along the image plane are not the same as those on the intensity axis. This causes problems because not all the basic measurements are physically valid. The basic measurements on gray-tone images are the volume, surface, norm (or mean curvature) and the connectivity number. In this paper, we present a criterion to assess the physical validity of the basic measurements. This allows us to further limit the number of useful basic measurements. On gray-tone images, these are the volume and the connectivity number. We illustrate our findings with an experiment using physically valid and invalid measurements. These measurements are applied to texture characterization and segmentation. We study the behavior of these measurements under illumination changes. We show that a physically invalid measurement gives erratic answers under such circumstances. This has important consequences on the robustness of image analysis algorithms.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114268397","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.352135
K. Ishihara, K. Matsuo
For EMC (electromagnetic compatibility) of electronic equipment, it is necessary to not only reduce the electromagnetic waves radiated from the equipment but also raise the resistance against external electromagnetic waves. A test method for checking the level of this resistance against electromagnetic waves is currently under study as IEC Standard 801-3 but it has a big problem in the matter of test efficiency because of an enormous amount of test time required. Under such circumstances, we developed a simple and efficient test method which can be applied without sacrificing the reliability of the test and have the honour of reporting an outline of this method hereafter.<>
{"title":"Development of effective test method of radiant high frequency electromagnetic field immunity (IEC 801-3)","authors":"K. Ishihara, K. Matsuo","doi":"10.1109/IMTC.1994.352135","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352135","url":null,"abstract":"For EMC (electromagnetic compatibility) of electronic equipment, it is necessary to not only reduce the electromagnetic waves radiated from the equipment but also raise the resistance against external electromagnetic waves. A test method for checking the level of this resistance against electromagnetic waves is currently under study as IEC Standard 801-3 but it has a big problem in the matter of test efficiency because of an enormous amount of test time required. Under such circumstances, we developed a simple and efficient test method which can be applied without sacrificing the reliability of the test and have the honour of reporting an outline of this method hereafter.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122864353","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.351838
H. Eren, J. Goh
DC type electromagnetic flowmeters generate signals proportional to the rates of flow of fluids in dosed pipes. These signals are processed and filtered suitably for flow measurements. Studies indicate that the generated signals carry secondary information on the characteristics of fluids, For instance, in slurry applications, the secondary information depends on the density of the slurry, the particle size distribution of solids and the types of materials used. The dependence manifests itself by having a frequency component and an amplitude component. A low-cost spectrum analyser is found to be effective in extracting the frequency dependent components. The amplitude variations of the signals can also be extracted using analog or digital techniques. A peak detector based on comparators and A/D conversion principles found to be capable of extracting the amplitude dependent components of the signals. By the use computers, the results obtained form the spectrum analyser and the peak amplitude detector can be correlated to the densities and other characteristics of slurries.<>
{"title":"Signal extraction from magnetic flowmeters for density measurements","authors":"H. Eren, J. Goh","doi":"10.1109/IMTC.1994.351838","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351838","url":null,"abstract":"DC type electromagnetic flowmeters generate signals proportional to the rates of flow of fluids in dosed pipes. These signals are processed and filtered suitably for flow measurements. Studies indicate that the generated signals carry secondary information on the characteristics of fluids, For instance, in slurry applications, the secondary information depends on the density of the slurry, the particle size distribution of solids and the types of materials used. The dependence manifests itself by having a frequency component and an amplitude component. A low-cost spectrum analyser is found to be effective in extracting the frequency dependent components. The amplitude variations of the signals can also be extracted using analog or digital techniques. A peak detector based on comparators and A/D conversion principles found to be capable of extracting the amplitude dependent components of the signals. By the use computers, the results obtained form the spectrum analyser and the peak amplitude detector can be correlated to the densities and other characteristics of slurries.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"350 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116502081","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.351906
R. Lapuh, D. Fefer, J. Drnovsek, A. Jeglic, R. Rape
A digital AC voltage standard with well known AC to DC output voltage difference is described. The proposed feedback configuration can effectively measure and correct for loading effects, caused by a measuring device. Because the AC standard can generate AC and DC voltages at the same output terminals, automatic measuring setup for thermal voltage converters (TVC) is considerably simplified.<>
{"title":"Sensing in an AC voltage standard","authors":"R. Lapuh, D. Fefer, J. Drnovsek, A. Jeglic, R. Rape","doi":"10.1109/IMTC.1994.351906","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351906","url":null,"abstract":"A digital AC voltage standard with well known AC to DC output voltage difference is described. The proposed feedback configuration can effectively measure and correct for loading effects, caused by a measuring device. Because the AC standard can generate AC and DC voltages at the same output terminals, automatic measuring setup for thermal voltage converters (TVC) is considerably simplified.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128050591","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.352172
P. Broersen, H. Wensink
The quest in autoregressive model order selection is for the model with smallest prediction error. The possibilities of selecting a suboptimal order can be divided in overfitting and underfitting. In order selection criteria based on asymptotical large sample theory as well as in their finite sample counterparts, the penalty factor /spl alpha/ can be considered as the balancing factor between overfit and underfit. An optimization of the value for the penalty factor is only effective, after a correction for the statistics of the finite observation length has been carried out, by using the results of the finite sample theory. A theoretical treatment is in asymptotic theory based on the true AR process order. To apply the reasonings to the practical situations, where only a finite number of observations has been measured, the optimal model order is introduced. It is defined as the order with lowest expected prediction error.<>
{"title":"The influence of the penalty factor in order selection criteria","authors":"P. Broersen, H. Wensink","doi":"10.1109/IMTC.1994.352172","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352172","url":null,"abstract":"The quest in autoregressive model order selection is for the model with smallest prediction error. The possibilities of selecting a suboptimal order can be divided in overfitting and underfitting. In order selection criteria based on asymptotical large sample theory as well as in their finite sample counterparts, the penalty factor /spl alpha/ can be considered as the balancing factor between overfit and underfit. An optimization of the value for the penalty factor is only effective, after a correction for the statistics of the finite observation length has been carried out, by using the results of the finite sample theory. A theoretical treatment is in asymptotic theory based on the true AR process order. To apply the reasonings to the practical situations, where only a finite number of observations has been measured, the optimal model order is introduced. It is defined as the order with lowest expected prediction error.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"102 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133701118","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.351983
K. Watanabe, M. Kakishima, K. Yokoyama
Here, we compare the two acoustic methods named cross-correlation and auto-correlation to locate pinhole locations in a gas-pipeline. The cross-correlation method that determines the location from the cross-correlation of two acoustic signals detected at two terminals of the pipeline is effective for pipelines with greater acoustic damping. Whereas the auto-correlation method that determines the location from the auto-correlation of the acoustic signal detected at one terminal of the pipeline is effective for those with less acoustic damping.<>
{"title":"A comparison of location methods for pinholes in pipelines","authors":"K. Watanabe, M. Kakishima, K. Yokoyama","doi":"10.1109/IMTC.1994.351983","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351983","url":null,"abstract":"Here, we compare the two acoustic methods named cross-correlation and auto-correlation to locate pinhole locations in a gas-pipeline. The cross-correlation method that determines the location from the cross-correlation of two acoustic signals detected at two terminals of the pipeline is effective for pipelines with greater acoustic damping. Whereas the auto-correlation method that determines the location from the auto-correlation of the acoustic signal detected at one terminal of the pipeline is effective for those with less acoustic damping.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"50 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134301925","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.351923
R. Freire, J. Neto, G. S. Deep, A. Lima, P. C. Lobo
The thermal time constant of a thermoresistive sensor is defined in terms of its physical properties such as mass m, specific heat c, area A and overall heat transfer coefficient U to the surroundings. Measurement of these parameters (e.g. c and U) may involve lengthy experimental procedures. An experimental method using only electrical quantities, to determine the intrinsic thermal time constant, is described. In the proposed procedure, the physical properties of the sensor are not required. A formulation, to compensate for the measurement errors due to electrical heating of the sensor, is presented.<>
{"title":"Experimental determination of the time constant of a thermoresistive sensor","authors":"R. Freire, J. Neto, G. S. Deep, A. Lima, P. C. Lobo","doi":"10.1109/IMTC.1994.351923","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351923","url":null,"abstract":"The thermal time constant of a thermoresistive sensor is defined in terms of its physical properties such as mass m, specific heat c, area A and overall heat transfer coefficient U to the surroundings. Measurement of these parameters (e.g. c and U) may involve lengthy experimental procedures. An experimental method using only electrical quantities, to determine the intrinsic thermal time constant, is described. In the proposed procedure, the physical properties of the sensor are not required. A formulation, to compensate for the measurement errors due to electrical heating of the sensor, is presented.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115229823","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)
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