Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)最新文献
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.351966
P. Low
This paper introduces the design of a vertically structured subranging A/D-Converter. The vertically structured analog subranging circuits combined with the most common flash ADC led to the development of a converter for high conversion rates up to a resolution of 12 Bit. The compensation of the analog circuits reduces linearity errors to a minimum. Special attention has been paid on the differential architecture of the analog subranging circuits. The major advantage of this architecture is the improvement of the SNR and the reduction of errors caused by symmetrical parasitic impedances. New results are presented with a hybrid test circuit for a 10 Bit 30 Ms/s converter.<>
{"title":"A fully differential, vertically structured and compensated subranging A/D-converter","authors":"P. Low","doi":"10.1109/IMTC.1994.351966","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351966","url":null,"abstract":"This paper introduces the design of a vertically structured subranging A/D-Converter. The vertically structured analog subranging circuits combined with the most common flash ADC led to the development of a converter for high conversion rates up to a resolution of 12 Bit. The compensation of the analog circuits reduces linearity errors to a minimum. Special attention has been paid on the differential architecture of the analog subranging circuits. The major advantage of this architecture is the improvement of the SNR and the reduction of errors caused by symmetrical parasitic impedances. New results are presented with a hybrid test circuit for a 10 Bit 30 Ms/s converter.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126481404","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.351898
G. Hancke, D. Vrey
An electric load monitoring and control system for the domestic environment has been developed, utilizing the domestic mains conductors as a communication medium. Although the domestic mains is a hostile environment for communication signals, it seems to have become increasingly more popular for use in load management and distribution automation systems. A variety of power line communication systems are in use, but none seems to have the qualities of a "best-system". This paper intends to briefly show some of the most prominent characteristics of the domestic transmission line. It also outlines the principles on which the present system works and how this system could be improved to be used as a subsystem of an intelligent controller in domestic load management programmes.<>
{"title":"Electric load monitoring and control in the domestic environment","authors":"G. Hancke, D. Vrey","doi":"10.1109/IMTC.1994.351898","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351898","url":null,"abstract":"An electric load monitoring and control system for the domestic environment has been developed, utilizing the domestic mains conductors as a communication medium. Although the domestic mains is a hostile environment for communication signals, it seems to have become increasingly more popular for use in load management and distribution automation systems. A variety of power line communication systems are in use, but none seems to have the qualities of a \"best-system\". This paper intends to briefly show some of the most prominent characteristics of the domestic transmission line. It also outlines the principles on which the present system works and how this system could be improved to be used as a subsystem of an intelligent controller in domestic load management programmes.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126390743","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.351867
N. Abd Rabou, H. Ikeda, H. Yoshida, S. Shinohara
This paper describes a two-way transmission system for sending a pair of wideband FM signals in both directions via an optical fiber. The transmission system using an LED at 1.3 /spl mu/m has a bandwidth of approximately 300 MHz with a carrier-to-noise ratio (CNR) of 16 dB. The optical fiber of 1 km long can be connected for two-way communications even though the optical power loss is great.<>
{"title":"Two-way optical fiber wideband FM signal transmission using LEDs","authors":"N. Abd Rabou, H. Ikeda, H. Yoshida, S. Shinohara","doi":"10.1109/IMTC.1994.351867","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351867","url":null,"abstract":"This paper describes a two-way transmission system for sending a pair of wideband FM signals in both directions via an optical fiber. The transmission system using an LED at 1.3 /spl mu/m has a bandwidth of approximately 300 MHz with a carrier-to-noise ratio (CNR) of 16 dB. The optical fiber of 1 km long can be connected for two-way communications even though the optical power loss is great.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126440454","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.352177
H. Takahashi, S. Aoshima, Y. Tsuchiya
The electro-optic (E-O) probing system using laser diode (LD) for measuring the voltage waveform at internal nodes of high speed LSI is described comparing performance to other electric instruments. The voltage sensitivity was improved by using an external ZnTe E-O probe and a low noise LD. Two kinds of E-O probing systems have been developed; a sampling system using a pulsed LD has the frequency bandwidth of 10 GHz and the minimum detectable voltage of 430 /spl mu/V/spl radic/Hz, and a real time system using a CW LD and a high speed photo detector has 480 MHz and 23 mV with 700 accumulations. Each system is based on mechanical prober and a microscope. Approach of the E-O probe to the electrode is computer-controlled. The advantages of high temporal resolution, noncontact and noninvasive method have realized measurements for microwave devices and passivated electrodes. Dependency of the output signal on the space between E-O probe and electrode is discussed as well as that on the electrode width.<>
{"title":"How the electro-optic probing system can contribute to LSI testing?","authors":"H. Takahashi, S. Aoshima, Y. Tsuchiya","doi":"10.1109/IMTC.1994.352177","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352177","url":null,"abstract":"The electro-optic (E-O) probing system using laser diode (LD) for measuring the voltage waveform at internal nodes of high speed LSI is described comparing performance to other electric instruments. The voltage sensitivity was improved by using an external ZnTe E-O probe and a low noise LD. Two kinds of E-O probing systems have been developed; a sampling system using a pulsed LD has the frequency bandwidth of 10 GHz and the minimum detectable voltage of 430 /spl mu/V/spl radic/Hz, and a real time system using a CW LD and a high speed photo detector has 480 MHz and 23 mV with 700 accumulations. Each system is based on mechanical prober and a microscope. Approach of the E-O probe to the electrode is computer-controlled. The advantages of high temporal resolution, noncontact and noninvasive method have realized measurements for microwave devices and passivated electrodes. Dependency of the output signal on the space between E-O probe and electrode is discussed as well as that on the electrode width.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127912544","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.352180
Li-Zhi-Xien, N. Takeuchi
Brillouin scattering in optical fibers is a nonlinear phenomenon in which monochromatic light undergoes a shift by the frequency characteristic of the medium and is scattered as a result of interaction with a acoustic wave in the optical fiber. This frequency shift is referred to as the Brillouin frequency shift. The Brillouin frequency shift is proportional to the speed of the acoustic wave in the optical fiber. which depends largely on the stress applied to the optical fiber, so that it is highly dependent on the tensile strain induced in the optical fiber. The basic configuration of the measurement system is shown. In this measurement system, which is based upon an end-to-end lightwave measurement technique, the change in probe light waveform with time is continuously measured while varying the relative pump light-probe light frequency difference, and the relative frequency difference. The present measurement system has enabled measurement of optical fiber strains in the longitudinal direction, the time for measurement being successfully reduced to within one minute. This measurement system, which permits real-time strain measurement, promises to find a widespread range of applications in various fields.<>
{"title":"Optical fiber strain distribution measurement by a Brillouin frequency shift technique","authors":"Li-Zhi-Xien, N. Takeuchi","doi":"10.1109/IMTC.1994.352180","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352180","url":null,"abstract":"Brillouin scattering in optical fibers is a nonlinear phenomenon in which monochromatic light undergoes a shift by the frequency characteristic of the medium and is scattered as a result of interaction with a acoustic wave in the optical fiber. This frequency shift is referred to as the Brillouin frequency shift. The Brillouin frequency shift is proportional to the speed of the acoustic wave in the optical fiber. which depends largely on the stress applied to the optical fiber, so that it is highly dependent on the tensile strain induced in the optical fiber. The basic configuration of the measurement system is shown. In this measurement system, which is based upon an end-to-end lightwave measurement technique, the change in probe light waveform with time is continuously measured while varying the relative pump light-probe light frequency difference, and the relative frequency difference. The present measurement system has enabled measurement of optical fiber strains in the longitudinal direction, the time for measurement being successfully reduced to within one minute. This measurement system, which permits real-time strain measurement, promises to find a widespread range of applications in various fields.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115784609","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.352094
A. Liberatore, S. Manetti, M. Piccirilli
Testing an electronic circuit is a vital part of its overall design and fabrication process. This problem is even going to be more critical with technology improvements and with the coexistence on a chip of analog and digital components. In fact the testing of mixed signal microsystems is very difficult compared to digital only devices. They do not lend themselves to earlier and simpler test routines. The entire mixed signal segment is hampered by the lack of design for testability methodologies and tools. In this field the concept of analog circuit testability is of fundamental importance. The aim of this work is to present a new symbolic approach for testability measurement of analog networks. The new method presents noteworthy advantages from a computational point of view with respect to previous techniques. In fact it does not require the computation of the sensitivities of the network functions but it is based only on the study of the network function symbolic coefficients. The new approach allows also the formulation of simple necessary conditions for maximum testability based only on the order of the network functions.<>
{"title":"A new efficient method for analog circuit testability measurement","authors":"A. Liberatore, S. Manetti, M. Piccirilli","doi":"10.1109/IMTC.1994.352094","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352094","url":null,"abstract":"Testing an electronic circuit is a vital part of its overall design and fabrication process. This problem is even going to be more critical with technology improvements and with the coexistence on a chip of analog and digital components. In fact the testing of mixed signal microsystems is very difficult compared to digital only devices. They do not lend themselves to earlier and simpler test routines. The entire mixed signal segment is hampered by the lack of design for testability methodologies and tools. In this field the concept of analog circuit testability is of fundamental importance. The aim of this work is to present a new symbolic approach for testability measurement of analog networks. The new method presents noteworthy advantages from a computational point of view with respect to previous techniques. In fact it does not require the computation of the sensitivities of the network functions but it is based only on the study of the network function symbolic coefficients. The new approach allows also the formulation of simple necessary conditions for maximum testability based only on the order of the network functions.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"86 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132028648","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.351921
J. Trontelj, L. Trontelj, R. Opara, A. Pletersek
An integrated reference magnetic field generator was introduced for integrated Hall sensors. Its model was presented and analysed. A simple SPICE type design tool was developed. The described structure was designed and the model parameters extracted and verified. Extracted reference voltage is used for compensation of Hall sensitivity temperature, time and mechanical stress dependence compensation and for mass production testing.<>
{"title":"CMOS integrated magnetic field source used as a reference in magnetic field sensors on common substrate","authors":"J. Trontelj, L. Trontelj, R. Opara, A. Pletersek","doi":"10.1109/IMTC.1994.351921","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351921","url":null,"abstract":"An integrated reference magnetic field generator was introduced for integrated Hall sensors. Its model was presented and analysed. A simple SPICE type design tool was developed. The described structure was designed and the model parameters extracted and verified. Extracted reference voltage is used for compensation of Hall sensitivity temperature, time and mechanical stress dependence compensation and for mass production testing.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130142994","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.351841
T. Tazawa, T. Hatashima, N. Ohnishi, N. Sugei
There are many studies on removal or suppression of reverberation. Among them, the approach, in which the impulse-response in a room is measured beforehand, has obtained very satisfactory results. An impulse-response is, however, not invariant, and changes with time depending on the room temperature and humidity, and the relative location between a sound source and a set of microphones. It is troublesome to measure an impulse response exactly each time. So, we have tried to cancel echoes using only one acoustic signal with echoes, obtained through a single microphone. In order to cancel echoes, we have to determine both delay times and amplitude ratios between direct sound and each of reflected sounds. Delay times are obtained as peaks of cepstrum of acoustic signal. Each amplitude ratio is iteratively searched so that resultant recovered sound may have the shortest duration. In the case that there are a few reflected signals, the result of experiment with reverberated signal synthesized using CD sound shows good recovery of an original sound.<>
{"title":"A fully passive echo-canceler using a single microphone","authors":"T. Tazawa, T. Hatashima, N. Ohnishi, N. Sugei","doi":"10.1109/IMTC.1994.351841","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351841","url":null,"abstract":"There are many studies on removal or suppression of reverberation. Among them, the approach, in which the impulse-response in a room is measured beforehand, has obtained very satisfactory results. An impulse-response is, however, not invariant, and changes with time depending on the room temperature and humidity, and the relative location between a sound source and a set of microphones. It is troublesome to measure an impulse response exactly each time. So, we have tried to cancel echoes using only one acoustic signal with echoes, obtained through a single microphone. In order to cancel echoes, we have to determine both delay times and amplitude ratios between direct sound and each of reflected sounds. Delay times are obtained as peaks of cepstrum of acoustic signal. Each amplitude ratio is iteratively searched so that resultant recovered sound may have the shortest duration. In the case that there are a few reflected signals, the result of experiment with reverberated signal synthesized using CD sound shows good recovery of an original sound.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130237380","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.351949
M. Takahashi
This paper presents an in-line variable light attenuator of improved air-gap type with extremely low return light loss for single-mode transmission, constructed using the modified structure of the optical connector. Optical attenuation is adjustable through changing the axial distance between the slanted end-faces of a pair of the ferrules aligned within an aligning sleeve. As the result, maximum attenuation was 30 dB at a slanted angle of 8 degrees, and 40 dB at a slanted angle of 12 degrees, at an air-gap of 1.5 mm and at a wavelength of 1.31 /spl mu/m. The return light loss achieved was less than 60 dB at a slanted angle of 8 degrees or more.<>
{"title":"Variable light attenuator of improved air-gap type with extremely low returning light","authors":"M. Takahashi","doi":"10.1109/IMTC.1994.351949","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351949","url":null,"abstract":"This paper presents an in-line variable light attenuator of improved air-gap type with extremely low return light loss for single-mode transmission, constructed using the modified structure of the optical connector. Optical attenuation is adjustable through changing the axial distance between the slanted end-faces of a pair of the ferrules aligned within an aligning sleeve. As the result, maximum attenuation was 30 dB at a slanted angle of 8 degrees, and 40 dB at a slanted angle of 12 degrees, at an air-gap of 1.5 mm and at a wavelength of 1.31 /spl mu/m. The return light loss achieved was less than 60 dB at a slanted angle of 8 degrees or more.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134051885","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.351793
Hongnian Lu, Yan Han, S. Song
A new approach so-called multi-reflection scanning method by transverse ultrasonic wave is described for the NDT of adherent between metal and nonmetal surfaces. According to the adherent state, the destruction strength can be predicted by Bayesian inference. A skew probe scanning on the metal side is used to transform the longitudinal wave, dispatched by a PZT transducer, after entering the metal layer into transversal. Then the latter propagates in a zigzag path along the adhesive layer. The reflected wave strength are detected and integrated with respect to time. The relation between the adherent area along the scanned path and the time integral of reflected wave strength is found. The prediction model by Bayesian inference has been studied. As the adhesive process is fixed, the relation between the destruction strength of a part versus the measured adherent area proportion and their distribution can be established. Practice shows that, even the rate of spoilage as high as 60%, the software can strictly reject the spoils and maintain the probability of false rejection not exceed 7%.<>
{"title":"The ultrasonic NDT of adherent area between metal and nonmetal surfaces and the prediction of its destruction strength","authors":"Hongnian Lu, Yan Han, S. Song","doi":"10.1109/IMTC.1994.351793","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351793","url":null,"abstract":"A new approach so-called multi-reflection scanning method by transverse ultrasonic wave is described for the NDT of adherent between metal and nonmetal surfaces. According to the adherent state, the destruction strength can be predicted by Bayesian inference. A skew probe scanning on the metal side is used to transform the longitudinal wave, dispatched by a PZT transducer, after entering the metal layer into transversal. Then the latter propagates in a zigzag path along the adhesive layer. The reflected wave strength are detected and integrated with respect to time. The relation between the adherent area along the scanned path and the time integral of reflected wave strength is found. The prediction model by Bayesian inference has been studied. As the adhesive process is fixed, the relation between the destruction strength of a part versus the measured adherent area proportion and their distribution can be established. Practice shows that, even the rate of spoilage as high as 60%, the software can strictly reject the spoils and maintain the probability of false rejection not exceed 7%.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134320274","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)
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