Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)最新文献
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.351828
S. Okamura, F. Tomita
A microwave moisture meter used in a drying process for green tea production is described. It can measure the leaves of green tea containing the moisture of 40 to 100 percent in dry basis. It is a transmission type of 9.4 GHz waves. To eliminate the variation in the layer thickness the sample weight is controlled. The moisture content is obtained from the ratio of the microwave attenuation to the weight of the leaves. Averaging the data with a computer the moisture content were measured in the error of 3% of moisture values. It is better than the error of the conventional measurement by the feeling of a skilled workman's fingers actually used in factories.<>
{"title":"Microwave moisture sensing system in drying process for green tea production","authors":"S. Okamura, F. Tomita","doi":"10.1109/IMTC.1994.351828","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351828","url":null,"abstract":"A microwave moisture meter used in a drying process for green tea production is described. It can measure the leaves of green tea containing the moisture of 40 to 100 percent in dry basis. It is a transmission type of 9.4 GHz waves. To eliminate the variation in the layer thickness the sample weight is controlled. The moisture content is obtained from the ratio of the microwave attenuation to the weight of the leaves. Averaging the data with a computer the moisture content were measured in the error of 3% of moisture values. It is better than the error of the conventional measurement by the feeling of a skilled workman's fingers actually used in factories.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"197 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123032845","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.352035
Jen-Dau Lin, Kung-Hung Kuo, C. Yeh
In this paper, we have developed a phase-domain model to analyze a nonlinear fiber-optic gyroscope (FOG) system theoretically, and use it to obtain an optimal-designed system. System's design including details of signal processing is described here and used to improve system's sensitivity and precision. From computer's simulation and experimental results, we know that 1. The experimental results coincide with the analytic results, with error less than 4% in the respects of rise time, overshooting, and steady state error; that is proved by the computer simulation for the time domain response of a step and a ramp input tests. 2. Using the phase-domain model, one can build up one's optimal FOG system with zero steady state error, 6% overshooting, high stability, and short rise time about one of system's natural frequency, i.e. 1spl omegasub n/.<>
{"title":"Phase domain model of a second order fiber-optic gyroscope dynamic system","authors":"Jen-Dau Lin, Kung-Hung Kuo, C. Yeh","doi":"10.1109/IMTC.1994.352035","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352035","url":null,"abstract":"In this paper, we have developed a phase-domain model to analyze a nonlinear fiber-optic gyroscope (FOG) system theoretically, and use it to obtain an optimal-designed system. System's design including details of signal processing is described here and used to improve system's sensitivity and precision. From computer's simulation and experimental results, we know that 1. The experimental results coincide with the analytic results, with error less than 4% in the respects of rise time, overshooting, and steady state error; that is proved by the computer simulation for the time domain response of a step and a ramp input tests. 2. Using the phase-domain model, one can build up one's optimal FOG system with zero steady state error, 6% overshooting, high stability, and short rise time about one of system's natural frequency, i.e. 1spl omegasub n/.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123701118","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.351790
A. Kozlov, I. B. Yakovkin
In this paper we consider two kinds of tag based on surface acoustic wave (SAW) devices and different terminal equipment for registration of these tags. Experimental parameters of tags and an interrogated equipment are considered.<>
{"title":"SAW elements in identification systems","authors":"A. Kozlov, I. B. Yakovkin","doi":"10.1109/IMTC.1994.351790","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351790","url":null,"abstract":"In this paper we consider two kinds of tag based on surface acoustic wave (SAW) devices and different terminal equipment for registration of these tags. Experimental parameters of tags and an interrogated equipment are considered.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121684237","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.352048
L. Szczecinski, R. Morawski, A. Barwicz
The reconstruction of a measurand on the basis of measurement data which are subject to systematic distortions and random errors is a problem often met in instrumental applications. Different regularization techniques are used to deal with its ill-conditioning. In this paper the applicability of variational methods based on entropy-like criteria is studied. The quality of reconstruction is assessed using synthetic measurement data as well as real-world spectrophotometric data. Two proposed algorithms are compared with other methods frequently used for measurand reconstruction.<>
{"title":"Variational algorithms of measurand reconstruction based on entropy-like criteria","authors":"L. Szczecinski, R. Morawski, A. Barwicz","doi":"10.1109/IMTC.1994.352048","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352048","url":null,"abstract":"The reconstruction of a measurand on the basis of measurement data which are subject to systematic distortions and random errors is a problem often met in instrumental applications. Different regularization techniques are used to deal with its ill-conditioning. In this paper the applicability of variational methods based on entropy-like criteria is studied. The quality of reconstruction is assessed using synthetic measurement data as well as real-world spectrophotometric data. Two proposed algorithms are compared with other methods frequently used for measurand reconstruction.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"260 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122742721","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.351840
J. Nakamura, Y. Tomita, S. Honda
Particle Image Velocimetry (PIV) measures two-dimensional in-plane flow vectors without disturbing the flow. The multiple exposure photo of the particles suspended into the flow has been used to give the flow velocity vector. Because of the photo developing process, the PIV has not measured in real-time. To process in real-time, we propose an optical PIV system of the spatial filtering technique using a Liquid Crystal Display.<>
{"title":"Real time particle image velocimetry using liquid crystal display","authors":"J. Nakamura, Y. Tomita, S. Honda","doi":"10.1109/IMTC.1994.351840","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351840","url":null,"abstract":"Particle Image Velocimetry (PIV) measures two-dimensional in-plane flow vectors without disturbing the flow. The multiple exposure photo of the particles suspended into the flow has been used to give the flow velocity vector. Because of the photo developing process, the PIV has not measured in real-time. To process in real-time, we propose an optical PIV system of the spatial filtering technique using a Liquid Crystal Display.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"352 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122757047","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.352017
M. Catelani, P. Salvaneschi, A. Zanobini, M. Mugnaini
In this paper an application of Logarithmic Poisson Execution Time Model to the software product MIDAS is presented. In order to cope with the maintenance effort we predict an index of user's satisfaction according to the failure intensity predicted by the model. A trade-off between maintenance task and user's satisfaction achieved.<>
{"title":"Use of software reliability models for the maintenance of information systems: a case study","authors":"M. Catelani, P. Salvaneschi, A. Zanobini, M. Mugnaini","doi":"10.1109/IMTC.1994.352017","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352017","url":null,"abstract":"In this paper an application of Logarithmic Poisson Execution Time Model to the software product MIDAS is presented. In order to cope with the maintenance effort we predict an index of user's satisfaction according to the failure intensity predicted by the model. A trade-off between maintenance task and user's satisfaction achieved.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"439 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122887148","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.351975
Hsieh Chen-Huei, Huang Yue-Wei, Wu Menq-Jiun
Responding to the market demand for high quality and production limited quantity and variety, the automation technology of flexible manufacturing system or computer manufacture system has been developed. During the automated manufacturing, the instability of product quality depends to some degree on different precision of machine tool, qualification of operators and manufacturing technology. In addition, the utilization of traditional manual measurement or off-line contact quality inspection reduce productivity. Therefore, the technology of non-contact on-line product quality inspection is becoming a very important research issue. This report focuses on the setup of non-contact automatic measurement of concentricity by applying personal computer and image processing technologies. LOG and zero-crossing method are used to complete image edge detection. Then curve-fitting is applied to generate the inner circle and outer circle of mechanical parts. Subsequently, the coordinate of edge points of the inner and outer circles, together with the least-square error method, will be applied to estimate the concentricity of the mechanical part waiting for inspection. Comparison of the result of experiment with the data measured by a FEDERAL high-precision roundest equipment indicates that the proposed system exhibits good repeatability and accuracy.<>
{"title":"Automatic concentricity measurement by image processing","authors":"Hsieh Chen-Huei, Huang Yue-Wei, Wu Menq-Jiun","doi":"10.1109/IMTC.1994.351975","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351975","url":null,"abstract":"Responding to the market demand for high quality and production limited quantity and variety, the automation technology of flexible manufacturing system or computer manufacture system has been developed. During the automated manufacturing, the instability of product quality depends to some degree on different precision of machine tool, qualification of operators and manufacturing technology. In addition, the utilization of traditional manual measurement or off-line contact quality inspection reduce productivity. Therefore, the technology of non-contact on-line product quality inspection is becoming a very important research issue. This report focuses on the setup of non-contact automatic measurement of concentricity by applying personal computer and image processing technologies. LOG and zero-crossing method are used to complete image edge detection. Then curve-fitting is applied to generate the inner circle and outer circle of mechanical parts. Subsequently, the coordinate of edge points of the inner and outer circles, together with the least-square error method, will be applied to estimate the concentricity of the mechanical part waiting for inspection. Comparison of the result of experiment with the data measured by a FEDERAL high-precision roundest equipment indicates that the proposed system exhibits good repeatability and accuracy.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131325785","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.351940
M. Yamashita
In order to clarify the information processing of calculation in a brain, the event-related potentials (ERPs) elicited during the calculation task were measured. However, the ERPs associated with calculation were small amplitude, and the latency of it were unknown. Then, a new method named the sequential difference method was introduced, and succeeded to detect the signal clearly. The detected calculation-relevant waveform appeared followed the P3 in the opposite polarity. The distribution of the ERPs associated with calculation on a head were analyzed by the topography. The results showed that the responsible area for calculation was parietal region in the left hemisphere of the brain.<>
{"title":"The analysis of event-related potentials elicited during calculation task using the sequential difference method","authors":"M. Yamashita","doi":"10.1109/IMTC.1994.351940","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351940","url":null,"abstract":"In order to clarify the information processing of calculation in a brain, the event-related potentials (ERPs) elicited during the calculation task were measured. However, the ERPs associated with calculation were small amplitude, and the latency of it were unknown. Then, a new method named the sequential difference method was introduced, and succeeded to detect the signal clearly. The detected calculation-relevant waveform appeared followed the P3 in the opposite polarity. The distribution of the ERPs associated with calculation on a head were analyzed by the topography. The results showed that the responsible area for calculation was parietal region in the left hemisphere of the brain.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121940979","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.352050
Zhou Zhao-ying, Xiong Shen-Shu, Li Yong
A dynamic parameter estimation method with a two step algorithm has been developed based on spectral analysis. The spectral density function is first obtained from input-output signals of a system, then the dynamic parameters can be estimated from frequency response data. Some parameter estimation algorithms are derived by minimizing a unified loss function with different weight selections. Some excellent application results have been achieved in the measurement, simulation, compensation and control of sensors, actuators and precision machineries.<>
{"title":"Dynamic parameter estimation based on spectral analysis and its application in mechanic-electric systems","authors":"Zhou Zhao-ying, Xiong Shen-Shu, Li Yong","doi":"10.1109/IMTC.1994.352050","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352050","url":null,"abstract":"A dynamic parameter estimation method with a two step algorithm has been developed based on spectral analysis. The spectral density function is first obtained from input-output signals of a system, then the dynamic parameters can be estimated from frequency response data. Some parameter estimation algorithms are derived by minimizing a unified loss function with different weight selections. Some excellent application results have been achieved in the measurement, simulation, compensation and control of sensors, actuators and precision machineries.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121973305","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.351961
Kiseon Kim
Analog-to-digital conversion pertaining to the rotating coil-based magnetic field measurement systems requires an angular positioning as a sample-timing reference, which inherently introduces unwanted harmonics due to the positioning jitter. We have adopted two practical models for the positioning jitter: a random positioning and a systematic positioning errors. For each positioning error, we analyzed the magnitude of the harmonics. Further, we have introduced a positioning correction scheme to reduce the unwanted harmonics, and analyzed the reduced magnitude to show its significance or the multipole measurement system design.<>
{"title":"Analog-to-digital conversion and harmonics due to the angular positioning error in magnetic field measurement","authors":"Kiseon Kim","doi":"10.1109/IMTC.1994.351961","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351961","url":null,"abstract":"Analog-to-digital conversion pertaining to the rotating coil-based magnetic field measurement systems requires an angular positioning as a sample-timing reference, which inherently introduces unwanted harmonics due to the positioning jitter. We have adopted two practical models for the positioning jitter: a random positioning and a systematic positioning errors. For each positioning error, we analyzed the magnitude of the harmonics. Further, we have introduced a positioning correction scheme to reduce the unwanted harmonics, and analyzed the reduced magnitude to show its significance or the multipole measurement system design.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"66 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122825077","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)
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