Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)最新文献
In this paper, the structure and principle of a synergetic expert system for fault diagnosis (SESFD) are introduced in view of the limit of present expert system in application. SESFD is composed of four subordinate expert systems (SES) and a meta expert system (MES). MES controls and coordinates the work of SESs. Object-oriented programming has been used in system design. SESFD surmounts the brittleness of the single expert system and has a wide application prospective.<>
{"title":"Object-oriented synergetic expert system for fault diagnosis","authors":"Changshen Xu, Sixing Liu, Zhaoying Zhou, Yaoqing Zhang","doi":"10.1109/IMTC.1994.352040","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352040","url":null,"abstract":"In this paper, the structure and principle of a synergetic expert system for fault diagnosis (SESFD) are introduced in view of the limit of present expert system in application. SESFD is composed of four subordinate expert systems (SES) and a meta expert system (MES). MES controls and coordinates the work of SESs. Object-oriented programming has been used in system design. SESFD surmounts the brittleness of the single expert system and has a wide application prospective.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"225 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116111570","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.351815
H. Nagura, K. Fujino
The single chip power meter is a programmable mixed signal IC for three phase power line measurement. The DSP block includes two programmable 32 bit processors which executes metering functions and calibration algorithm for six AD converter inputs. In the calibration algorithm correction methods for two major errors have been attempted: for a non-linearity error of input transformers and AD converters, for a phase leading error of the current transformers against the voltage transformers. 30 correction coefficients including frequency dependency are computed by an automatic calibration system. The experimental results demonstrate the efficiency of the corrections: the non-linearity of RMS current measurement has been reduced from /spl plusmn/0.17%FS to /spl plusmn/0.07%FS by the nonlinearity correction, the measurement offset error of three phase power has been reduced from /spl plusmn/3%FS to /spl plusmn/0.25%FS by the phase error correction. These correction techniques bring a breakthrough for cutting the production cost, by permitting use with inexpensive transformers which have less linearity and large characteristic deviation.<>
{"title":"Correction method for a single chip power meter","authors":"H. Nagura, K. Fujino","doi":"10.1109/IMTC.1994.351815","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351815","url":null,"abstract":"The single chip power meter is a programmable mixed signal IC for three phase power line measurement. The DSP block includes two programmable 32 bit processors which executes metering functions and calibration algorithm for six AD converter inputs. In the calibration algorithm correction methods for two major errors have been attempted: for a non-linearity error of input transformers and AD converters, for a phase leading error of the current transformers against the voltage transformers. 30 correction coefficients including frequency dependency are computed by an automatic calibration system. The experimental results demonstrate the efficiency of the corrections: the non-linearity of RMS current measurement has been reduced from /spl plusmn/0.17%FS to /spl plusmn/0.07%FS by the nonlinearity correction, the measurement offset error of three phase power has been reduced from /spl plusmn/3%FS to /spl plusmn/0.25%FS by the phase error correction. These correction techniques bring a breakthrough for cutting the production cost, by permitting use with inexpensive transformers which have less linearity and large characteristic deviation.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116521798","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.352083
M. Kyomasu, T. Suzuki, K. Okajima, M. Sahara
An abnormal phenomenon was found in the integrated PIN photodiode sensors (which is named PIN Photo Integrated Circuits Sensor: PIN-PICS) combined with a bipolar IC in the same substrate. It was observed in the optical device called "2 electric wires type photoelectric sensor". It occurs at the time to drive the external LED by internal timing generator. This phenomenon was investigated by three methods, that is, the failure analysis the measurement of device parameters and both circuit and device simulations. These results show that the problem was induced from the PIN structure forming PIN-PICS. When the switching noise was altered, the most of this noise was transferred to preamplifier through parasitic capacitance of the PIN photodiode connected with a P/sup +/tab across a P-layer, and it distorted the output waveform of preamplifier by differential components. Therefore, in order to prevent this phenomenon, it's necessary to exchange the connection of parasitic capacitance from P/sup +/tab to substrate. We confirmed that an Au back metallization of 3000 /spl Aring/ thickness, or Au-Si alloy die bonding is the most effective.<>
{"title":"An abnormal phenomenon due to substrate bias modulation in the integrated PIN photodiode sensor with dielectric isolation","authors":"M. Kyomasu, T. Suzuki, K. Okajima, M. Sahara","doi":"10.1109/IMTC.1994.352083","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352083","url":null,"abstract":"An abnormal phenomenon was found in the integrated PIN photodiode sensors (which is named PIN Photo Integrated Circuits Sensor: PIN-PICS) combined with a bipolar IC in the same substrate. It was observed in the optical device called \"2 electric wires type photoelectric sensor\". It occurs at the time to drive the external LED by internal timing generator. This phenomenon was investigated by three methods, that is, the failure analysis the measurement of device parameters and both circuit and device simulations. These results show that the problem was induced from the PIN structure forming PIN-PICS. When the switching noise was altered, the most of this noise was transferred to preamplifier through parasitic capacitance of the PIN photodiode connected with a P/sup +/tab across a P-layer, and it distorted the output waveform of preamplifier by differential components. Therefore, in order to prevent this phenomenon, it's necessary to exchange the connection of parasitic capacitance from P/sup +/tab to substrate. We confirmed that an Au back metallization of 3000 /spl Aring/ thickness, or Au-Si alloy die bonding is the most effective.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"118 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114878760","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.351789
I.B. Yarovkin, Yu.N. Vlassov, A. Kozlov, N.S. Pashchin
The design and performance of two types of SAW pressure sensors have been considered. SAW resonator oscillators with metal strip gratings designed for operation at 200 and 360 MHz have been used in both type devices to study the opportunity of the mechanical pressure measurement became of mechanical loading on Rayleigh surface wave propagation. Such electrical characteristics of SAW resonator as amplitude and phase response are discussed, as well as a geometrical dimensions of the sensitive element and a disposition of SAW structures on it. The sensitivity and the non linearity of both sensors with a sensitive element shaped as an integral crystal diaphragm and sensor with mechanically loaded quartz plates measured and discussed too. Experimental data clearly show that sensitivity and threshold are not independent parameters for this kind of pressure sensor. We studied the opportunity to optimize this parameters for a given pressure range. Finally, recommendations are made for optimal configuration of SAW pressure sensor according to pressure and dynamic range demands. These results are important for the design of SAW pressure sensors intended for operation in gaseous or liquid media.<>
{"title":"SAW pressure sensors","authors":"I.B. Yarovkin, Yu.N. Vlassov, A. Kozlov, N.S. Pashchin","doi":"10.1109/IMTC.1994.351789","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351789","url":null,"abstract":"The design and performance of two types of SAW pressure sensors have been considered. SAW resonator oscillators with metal strip gratings designed for operation at 200 and 360 MHz have been used in both type devices to study the opportunity of the mechanical pressure measurement became of mechanical loading on Rayleigh surface wave propagation. Such electrical characteristics of SAW resonator as amplitude and phase response are discussed, as well as a geometrical dimensions of the sensitive element and a disposition of SAW structures on it. The sensitivity and the non linearity of both sensors with a sensitive element shaped as an integral crystal diaphragm and sensor with mechanically loaded quartz plates measured and discussed too. Experimental data clearly show that sensitivity and threshold are not independent parameters for this kind of pressure sensor. We studied the opportunity to optimize this parameters for a given pressure range. Finally, recommendations are made for optimal configuration of SAW pressure sensor according to pressure and dynamic range demands. These results are important for the design of SAW pressure sensors intended for operation in gaseous or liquid media.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115323416","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.352050
Zhou Zhao-ying, Xiong Shen-Shu, Li Yong
A dynamic parameter estimation method with a two step algorithm has been developed based on spectral analysis. The spectral density function is first obtained from input-output signals of a system, then the dynamic parameters can be estimated from frequency response data. Some parameter estimation algorithms are derived by minimizing a unified loss function with different weight selections. Some excellent application results have been achieved in the measurement, simulation, compensation and control of sensors, actuators and precision machineries.<>
{"title":"Dynamic parameter estimation based on spectral analysis and its application in mechanic-electric systems","authors":"Zhou Zhao-ying, Xiong Shen-Shu, Li Yong","doi":"10.1109/IMTC.1994.352050","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352050","url":null,"abstract":"A dynamic parameter estimation method with a two step algorithm has been developed based on spectral analysis. The spectral density function is first obtained from input-output signals of a system, then the dynamic parameters can be estimated from frequency response data. Some parameter estimation algorithms are derived by minimizing a unified loss function with different weight selections. Some excellent application results have been achieved in the measurement, simulation, compensation and control of sensors, actuators and precision machineries.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121973305","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.352035
Jen-Dau Lin, Kung-Hung Kuo, C. Yeh
In this paper, we have developed a phase-domain model to analyze a nonlinear fiber-optic gyroscope (FOG) system theoretically, and use it to obtain an optimal-designed system. System's design including details of signal processing is described here and used to improve system's sensitivity and precision. From computer's simulation and experimental results, we know that 1. The experimental results coincide with the analytic results, with error less than 4% in the respects of rise time, overshooting, and steady state error; that is proved by the computer simulation for the time domain response of a step and a ramp input tests. 2. Using the phase-domain model, one can build up one's optimal FOG system with zero steady state error, 6% overshooting, high stability, and short rise time about one of system's natural frequency, i.e. 1spl omegasub n/.<>
{"title":"Phase domain model of a second order fiber-optic gyroscope dynamic system","authors":"Jen-Dau Lin, Kung-Hung Kuo, C. Yeh","doi":"10.1109/IMTC.1994.352035","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352035","url":null,"abstract":"In this paper, we have developed a phase-domain model to analyze a nonlinear fiber-optic gyroscope (FOG) system theoretically, and use it to obtain an optimal-designed system. System's design including details of signal processing is described here and used to improve system's sensitivity and precision. From computer's simulation and experimental results, we know that 1. The experimental results coincide with the analytic results, with error less than 4% in the respects of rise time, overshooting, and steady state error; that is proved by the computer simulation for the time domain response of a step and a ramp input tests. 2. Using the phase-domain model, one can build up one's optimal FOG system with zero steady state error, 6% overshooting, high stability, and short rise time about one of system's natural frequency, i.e. 1spl omegasub n/.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123701118","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.352125
Zhang Zhongting, Guo Shize, Jin Xin
The design of a VXIbus general function generator module is presented in this paper. The module consists of a primary interface and a secondary interface. Because the VXIbus standard which is the latest test and measurement bus is adopted in the primary interface, the general function generator can be used to built conveniently a test system with the other instrument modules and the embedded controller or the external computer. A technique of direct digital synthesis is used in secondary interface to produce each basic waveform and AM signal modulated by sinusoid and pulse.<>
{"title":"The design of the general function generator module based on VXIbus","authors":"Zhang Zhongting, Guo Shize, Jin Xin","doi":"10.1109/IMTC.1994.352125","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352125","url":null,"abstract":"The design of a VXIbus general function generator module is presented in this paper. The module consists of a primary interface and a secondary interface. Because the VXIbus standard which is the latest test and measurement bus is adopted in the primary interface, the general function generator can be used to built conveniently a test system with the other instrument modules and the embedded controller or the external computer. A technique of direct digital synthesis is used in secondary interface to produce each basic waveform and AM signal modulated by sinusoid and pulse.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"62 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124755374","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.352078
S. Inoue, M. Ohmichi, T. Hashimoto
A simple evaluation of boundary integral in the inverse problem of the steady state heat conduction system is proposed. The boundary values of temperature and its gradient are computated from the direct analysis using FDM and the results of inverse analysis from these boundary values are compared with the given FDM parameters to give the reasonable estimation of boundary integrals. We show that the temperature gradient has some leaks from Dirichlet boundary region by the incomplete derivation of temperature gradient on the boundary surface. The 0.5 mesh extrapolation of temperature gradient from Dirichlet boundary region is also shown to give the accurate boundary integrals in the case of relatively coarse data points of boundary values. This 0.5 mesh extrapolation method is applicable to the actual inverse analysis of three dimensional system.<>
{"title":"Estimation of heat sources and temperature distribution by boundary integral method","authors":"S. Inoue, M. Ohmichi, T. Hashimoto","doi":"10.1109/IMTC.1994.352078","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352078","url":null,"abstract":"A simple evaluation of boundary integral in the inverse problem of the steady state heat conduction system is proposed. The boundary values of temperature and its gradient are computated from the direct analysis using FDM and the results of inverse analysis from these boundary values are compared with the given FDM parameters to give the reasonable estimation of boundary integrals. We show that the temperature gradient has some leaks from Dirichlet boundary region by the incomplete derivation of temperature gradient on the boundary surface. The 0.5 mesh extrapolation of temperature gradient from Dirichlet boundary region is also shown to give the accurate boundary integrals in the case of relatively coarse data points of boundary values. This 0.5 mesh extrapolation method is applicable to the actual inverse analysis of three dimensional system.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124355600","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.352184
S. Koike, S. Nonaka
The high frequency electronic component measuring system NET-1100A is described. The personal computer NEC PC-98D1 series and the gain phase analyzer HP 875101A are connected with GPIB. The /spl pi/ network is connected to the S7510A with coaxial cables. A GPIB plotter can be connected to the gain phase analyzer to plot the characteristics of the crystal under test. Using this system, we can analyze various kinds of crystal units from 100kHz to 200MHz.<>
{"title":"High frequency electronic component measuring system","authors":"S. Koike, S. Nonaka","doi":"10.1109/IMTC.1994.352184","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352184","url":null,"abstract":"The high frequency electronic component measuring system NET-1100A is described. The personal computer NEC PC-98D1 series and the gain phase analyzer HP 875101A are connected with GPIB. The /spl pi/ network is connected to the S7510A with coaxial cables. A GPIB plotter can be connected to the gain phase analyzer to plot the characteristics of the crystal under test. Using this system, we can analyze various kinds of crystal units from 100kHz to 200MHz.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"64 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114625541","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-05-10DOI: 10.1109/IMTC.1994.351930
M. Ono, K. Ito, E. Yoshida, S. Sekimukai, H. Kamada
The purpose of this paper is to present the development of an L-band pulsed electron spin resonance (ESR) spectrometer. The configuration of a prototype spectrometer is explained. Using this spectrometer, the signal of electron spin echo (ESE) is detected for the sample of /spl gamma/-irradiated quartz powder. For the ESE signal, it is stated that the detectable minimum weight of the sample is 3 g.<>
{"title":"Development of pulsed L-band ESR spectrometer","authors":"M. Ono, K. Ito, E. Yoshida, S. Sekimukai, H. Kamada","doi":"10.1109/IMTC.1994.351930","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351930","url":null,"abstract":"The purpose of this paper is to present the development of an L-band pulsed electron spin resonance (ESR) spectrometer. The configuration of a prototype spectrometer is explained. Using this spectrometer, the signal of electron spin echo (ESE) is detected for the sample of /spl gamma/-irradiated quartz powder. For the ESE signal, it is stated that the detectable minimum weight of the sample is 3 g.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"106 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124160118","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)