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Binder free approach for fabrication of lithium cobalt oxide for thin film based lithium-ion µ-batteries 无粘合剂薄膜锂离子微电池钴氧化锂制造方法
IF 2 4区 材料科学 Q3 MATERIALS SCIENCE, COATINGS & FILMS Pub Date : 2024-08-23 DOI: 10.1016/j.tsf.2024.140506
Ananya Bansal, Pramod Kumar, Sheetal Issar, Vipin Chawla, Ramesh Chandra

The increasing demand for microelectronics has significantly driven the advancement of thin film energy storage devices, specifically lithium-ion batteries. In this current work, binder-free lithium cobalt oxide (LCO) has been synthesized by Radio Frequency (RF) magnetron sputtering on aluminium foil substrate in an argon atmosphere. The investigation focused on optimizing the cathode on aluminium foil by varying parameters, such as RF source power, working pressure, and temperature of the substrate. The deposited layers were analyzed for their structural and surface properties to confirm the formation of LCO. The surface of LCO obtained from this binder-free approach helps us create an excellent interface between cathode-electrolyte with a low contact angle (18.1°). An electrochemical analysis of the optimized sample (480 nm thick) was carried out by using 1 M lithium hexa-fluoro-phosphate. The initial charge capacity in the 2 − 4.2 V voltage range was obtained to be 624 mAh/cm3 at the C-rate of 0.05C, which is closer to the theoretical capacity (690 mAh/cm3). Signifying, over 90 % of total lithium is contributed during the charge storage mechanism. As a result, it can be interpreted that the binder-free sputtering technology can be implemented to fabricate efficient electrodes for lithium-ion batteries.

微电子需求的不断增长极大地推动了薄膜储能设备(尤其是锂离子电池)的发展。在当前的研究中,通过射频(RF)磁控溅射技术,在氩气环境下在铝箔基底上合成了无粘结剂的锂钴氧化物(LCO)。研究重点是通过改变射频源功率、工作压力和基底温度等参数来优化铝箔上的阴极。对沉积层的结构和表面特性进行了分析,以确认 LCO 的形成。通过这种无粘合剂方法获得的 LCO 表面有助于我们在阴极-电解质之间建立一个接触角较低(18.1°)的良好界面。使用 1 M 六氟磷酸锂对优化样品(480 nm 厚)进行了电化学分析。在 0.05C 的 C 速率下,2 - 4.2 V 电压范围内的初始充电容量为 624 mAh/cm3,更接近理论容量(690 mAh/cm3)。这表明,在充电存储机制中,超过 90% 的总锂电量来自于此。因此,无粘合剂溅射技术可以用于制造锂离子电池的高效电极。
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引用次数: 0
Influence of deposition pressure on microstructure, mechanical and electrical properties of niobium thin films 沉积压力对铌薄膜微观结构、机械和电气性能的影响
IF 2 4区 材料科学 Q3 MATERIALS SCIENCE, COATINGS & FILMS Pub Date : 2024-08-22 DOI: 10.1016/j.tsf.2024.140503
P.N. Rao , M.K. Swami , Amrit Ghosh , R. Jangir , S.K. Rai

Niobium (Nb) thin films were deposited on a Si substrate using magnetron sputtering system by varying the deposition pressure. The effect of deposition pressure on the microstructure, residual stresses, and electrical properties was investigated by systematically varying the deposition pressure from 0.15 to 0.60 Pa. The Nb thin films were characterized using hard x-ray reflectivity, grazing incidence x-ray diffraction, four point probe method, and atomic force microscopy. The films grown at lower deposition pressures had smooth surfaces and more compact structures, which are advantageous for lowering electrical resistance but had higher compressive stress. On the other hand, the films grown at higher deposition pressures had columnar type growth with less dense structures, which leads to increase in electrical resistance. However the nature of stresses transform from compressive to tensile. Hard X-ray reflectivity performed on Nb films provides direct insight into the growth and the microstructure which were correlated with the mechanical and electrical properties.

利用磁控溅射系统通过改变沉积压力在硅基底上沉积了铌(Nb)薄膜。通过系统地改变沉积压力(0.15 至 0.60 Pa),研究了沉积压力对微观结构、残余应力和电性能的影响。使用硬 X 射线反射率、掠入射 X 射线衍射、四点探针法和原子力显微镜对铌薄膜进行了表征。在较低沉积压力下生长的薄膜表面光滑,结构更紧凑,有利于降低电阻,但压缩应力较大。另一方面,在较高沉积压力下生长的薄膜呈柱状生长,结构密度较低,从而导致电阻增加。不过,应力的性质从压应力转变为拉应力。通过对铌薄膜进行硬 X 射线反射,可以直接了解其生长过程和微观结构,并将其与机械和电气性能联系起来。
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引用次数: 0
Sputter deposited silver niobate thin films: Pathway towards phase purity 溅射沉积铌酸银薄膜:实现相纯度的途径
IF 2 4区 材料科学 Q3 MATERIALS SCIENCE, COATINGS & FILMS Pub Date : 2024-08-22 DOI: 10.1016/j.tsf.2024.140505
L. Kölbl , A.M. Kobald , T. Griesser , F. Munnik , C. Mitterer

The quest for environmentally sustainable alternatives to lead-based dielectric materials in dielectric capacitors has led research to the exploration of options such as silver niobate (AgNbO3), which has been found to display excellent energy storage properties. Homogeneity and phase-purity of the used thin films are vital for optimal performance of these devices. In this study, a systematic variation of oxygen partial pressure and bias voltage during reactive d.c. magnetron co-sputtering from metallic targets is employed to synthesise AgNbO3 thin films. Structural and chemical composition of the films are investigated using X-ray diffraction, Raman spectroscopy, X-ray photoelectron spectroscopy, energy dispersive X-ray spectroscopy, elastic recoil detection analysis, and Rutherford backscattering spectrometry. The findings emphasise the necessity of precise parameter control during deposition to avoid the presence of undesirable secondary phases like Ag and Ag2Nb4O11 and to ensure the formation of homogeneous and phase-pure AgNbO3 thin films. The gained insights demonstrate the potential of reactive d.c. magnetron sputtering for the deposition of lead-free AgNbO3 thin films, offering pathways for enhanced environmental compatibility of future dielectric capacitors.

为了在环境上可持续地替代电介质电容器中的铅基电介质材料,研究人员开始探索铌酸银(AgNbO3)等具有出色储能特性的材料。所用薄膜的均匀性和相纯度对这些设备的最佳性能至关重要。在这项研究中,采用了在从金属靶上进行反应式直流磁控共溅射过程中系统地改变氧分压和偏置电压的方法来合成 AgNbO3 薄膜。使用 X 射线衍射、拉曼光谱、X 射线光电子能谱、能量色散 X 射线能谱、弹性反冲探测分析和卢瑟福反向散射光谱法研究了薄膜的结构和化学成分。研究结果强调了在沉积过程中精确控制参数的必要性,以避免出现诸如 Ag 和 Ag2Nb4O11 等不良次生相,并确保形成均匀且相纯的 AgNbO3 薄膜。这些见解证明了反应式直流磁控溅射沉积无铅 AgNbO3 薄膜的潜力,为提高未来电介质电容器的环境兼容性提供了途径。
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引用次数: 0
Inelastic relaxation in tin oxide thin films with an amorphous structure 非晶结构氧化锡薄膜中的非弹性弛豫
IF 2 4区 材料科学 Q3 MATERIALS SCIENCE, COATINGS & FILMS Pub Date : 2024-08-22 DOI: 10.1016/j.tsf.2024.140504
K.S. Gabriels, T.V. Dubovitskaya, Yu.E. Kalinin, M.A. Kashirin, V.A. Makagonov, A.E. Nikonov, I.I. Popov, A.V. Sitnikov, V.A. Foshin, N.A. Tolstykh

Inelastic relaxation in amorphous tin oxide thin films obtained by ion-beam sputtering in an argon atmosphere were studied. The films retain an amorphous structure after annealing at temperatures below 623 K for 30 min and crystallization begins after annealing at 673 K with the formation of two phases, where the SnO2 phase predominates over the SnO phase. Annealing at 723 K for 30 min leads to a partial transition of the SnO crystalline phase to the SnO2 phase.

The temperature dependence of internal friction revealed maxima at 585 K and 603 K, identified as β - relaxation maxima, as well as at 690 K, identified as α - relaxation maximum. It is assumed that the β - relaxation maxima at 585 K and 603 K are associated with local hopps of oxygen atoms within the defect structure of SnO2 and with local hopps of tin atoms within the defect structure of SnO, respectively. The exponential increase in internal friction up to a temperature of 690 K in the α - relaxation region is associated with the diffusion of nonequilibrium vacancy-like defects of the amorphous structure below the glass transition temperature and equilibrium ones above the glass transition temperature. Estimates of the migration energy and formation energy of vacancy-like defects in amorphous tin oxide were made.

研究了在氩气环境中通过离子束溅射获得的无定形氧化锡薄膜的非弹性弛豫。薄膜在低于 623 K 的温度下退火 30 分钟后仍保持无定形结构,在 673 K 退火后开始结晶,形成两相,其中 SnO2 相比 SnO 相占优势。在 723 K 退火 30 分钟后,SnO 结晶相部分转变为 SnO2 相。内摩擦力的温度依赖性显示,在 585 K 和 603 K 出现最大值,即 β - 弛豫最大值;在 690 K 出现最大值,即 α - 弛豫最大值。据推测,585 K 和 603 K 处的β-松弛最大值分别与二氧化锡缺陷结构中氧原子的局部跳变和氧化锡缺陷结构中锡原子的局部跳变有关。α-弛豫区内的内摩擦指数增加到温度 690 K,这与玻璃转化温度以下非平衡空位样缺陷和玻璃转化温度以上平衡空位样缺陷在非晶态结构中的扩散有关。对无定形氧化锡中空位样缺陷的迁移能和形成能进行了估算。
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引用次数: 0
The flux pinning effect of different doping element combinations on metal-organic deposition-derived YBa2Cu3O7−δ nanocomposite films 不同掺杂元素组合对金属有机沉积衍生 YBa2Cu3O7-δ 纳米复合薄膜的磁通钉效应
IF 2 4区 材料科学 Q3 MATERIALS SCIENCE, COATINGS & FILMS Pub Date : 2024-08-22 DOI: 10.1016/j.tsf.2024.140502
Jing Chen , Xinghang Zhou , Rongtie Huang , Minjuan Li , Zhiyong Liu , Chuanbing Cai

Elemental doping has been proven effective in improving the flux pinning of yttrium barium copper oxide (YBa2Cu3O7−δ, YBCO) nanocomposite thin films. In the present work, we increased the number of doping elements to five to investigate the flux pinning effect of YBCO. The Zr-doped, Zr, Hf and Sn co-doped, Zr, Hf, Sn and Ta co-doped, and Zr, Hf, Sn, Ta and Mn co-doped YBCO films deposited on LaMnO3/MgO/Y2O3/Al2O3/ Hastelloy substrate were systematically studied. The samples were prepared by low-fluorine metal-organic deposition method, with a total dopant of 8 mol%. All films exhibit good c-axis growth and the multi-doping helps refining the surface particles, resulting in a smoother surface. The in-field properties of the films increase with the increase of co-doped element numbers, especially at a low temperature of 30 K. The pinning force density (Fp) and critical current density (Jc) are significantly improved by five-element Zr, Hf, Sn, Ta and Mn co-doped, which is about 3 times and 1.6 times higher, respectively, than that of the undoped film at 30 K and 1 T.

事实证明,元素掺杂能有效改善钇钡铜氧化物(YBa2Cu3O7-δ,YBCO)纳米复合薄膜的磁通钉凝效应。在本研究中,我们将掺杂元素的数量增加到五个,以研究 YBCO 的磁通钉凝效应。我们系统地研究了掺杂 Zr,掺杂 Zr、Hf 和 Sn,掺杂 Zr、Hf、Sn 和 Ta,以及掺杂 Zr、Hf、Sn、Ta 和 Mn 的 YBCO 薄膜,这些薄膜沉积在 LaMnO3/MgO/Y2O3/Al2O3/ 哈氏合金基底上。样品采用低氟金属有机沉积法制备,总掺杂量为 8 摩尔%。所有薄膜都表现出良好的 c 轴生长,多掺杂有助于细化表面颗粒,使表面更加光滑。共掺杂 Zr、Hf、Sn、Ta 和 Mn 五种元素的薄膜在 30 K 和 1 T 下的引脚力密度(Fp)和临界电流密度(Jc)比未掺杂的薄膜分别高出约 3 倍和 1.6 倍。
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引用次数: 0
Large area pulsed laser deposition of memristive Pr0.7Ca0.3MnO3 heterostructures for neuromorphic computing 大面积脉冲激光沉积用于神经形态计算的记忆性 Pr0.7Ca0.3MnO3 异质结构
IF 2 4区 材料科学 Q3 MATERIALS SCIENCE, COATINGS & FILMS Pub Date : 2024-08-19 DOI: 10.1016/j.tsf.2024.140499
M. Buczek , M. Pohlmann , Z. Liu , Z. Moos , A. Gutsche , P. Cao , J. Mayer , W. Stein , R. Dittmann

Heterostructures of the perovskite Pr0.7Ca0.3MnO3 (PCMO) and a tunnel oxide such as AlOx are highly interesting memristive devices for emulating synaptic properties in neuromorphic circuits. Future chip generations with these memristive elements requires PLD systems which enables PCMO growth on a full wafer. To address the issue of plume broadening in this study, a slit system was used to localize the deposition region, thereby eliminating the need for excessive scanning. This study investigates the effect of the slit system and process gas pressure on plume broadening. This investigation has been used to parameterize a simulation software to assess the effectiveness of different movement speeds and to develop strategies for homogeneous deposition, adjustable to a chosen film thickness in the order of twenty nanometers. We used these strategies to fabricate area dependent switching memory cells on a standard 4″ Si wafer using the material combination of Pr0.7Ca0.3MnO3 and AlOx. The influence of the aluminum oxide thickness on the switching shows that the IV loop starts to exhibit a hysteresis for AlOx thicknesses ≥ 3 nm. An increase in AlOx thickness leads to an increase in resistance and capacitive charging. An additional thermal treatment reduces the resistance and the switching voltage and increases the ratio between low resistive and high resistive state. Devices without thermal treatment of the PCMO are compatible for back end of line processing of standard CMOS technology.

过氧化物 Pr0.7Ca0.3MnO3(PCMO)和 AlOx 等隧道氧化物的异质结构是非常有趣的记忆性器件,可用于模拟神经形态电路中的突触特性。未来采用这些记忆元件的芯片需要 PLD 系统,以便在完整晶片上生长 PCMO。为了解决本研究中的羽流扩展问题,使用了狭缝系统来定位沉积区域,从而消除了过度扫描的需要。本研究调查了狭缝系统和制程气体压力对羽流扩展的影响。这项研究被用于模拟软件的参数设置,以评估不同运动速度的效果,并开发出可调整到所选薄膜厚度(20 纳米左右)的均匀沉积策略。我们利用这些策略,在标准 4 英寸硅晶片上使用 Pr0.7Ca0.3MnO3 和 AlOx 的材料组合制造了面积相关的开关存储单元。氧化铝厚度对开关的影响表明,氧化铝厚度≥ 3 nm 时,IV 环路开始出现滞后现象。氧化铝厚度增加会导致电阻和电容充电增加。额外的热处理可降低电阻和开关电压,并增加低电阻和高电阻状态之间的比率。未对 PCMO 进行热处理的器件可用于标准 CMOS 技术的后端处理。
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引用次数: 0
Effect of doping level on the photoconduction and chemiresistive ethanol gas sensing of lanthanum-doped CuO films 掺杂水平对掺镧氧化铜薄膜的光电导和化学阻抗乙醇气体传感的影响
IF 2 4区 材料科学 Q3 MATERIALS SCIENCE, COATINGS & FILMS Pub Date : 2024-08-18 DOI: 10.1016/j.tsf.2024.140500
S. Keerthana , R. Venkatesh , K. Mahalakshmi , K. Saravanakumar , C. Ravi Dhas

Undoped and lanthanum (La)-doped copper oxide (CuO) thin films were prepared by the nebulizer spray pyrolysis technique. The X-ray diffraction analysis revealed that the effective doping of lanthanum does not alter the monoclinic crystalline structure of copper oxide thin films. Raman spectra confirmed the crystalline quality of undoped and La-incorporated CuO films. From, scanning electron micrograph images, the La-doped CuO films exhibit spherical particles. Energy dispersive X-ray analysis confirmed the existence of copper, lanthanum and oxygen elements. The doping of La-substituted CuO films showed a minimum bandgap when compared to undoped CuO film. The oxidation states of Cu 2p, La 3d and O 1s elements were observed. The electrical resistivity of the films was considerably decreased due to the doping of La ions in CuO matrix. The photoluminescence spectra show that the doping of La ions increases the defect states and shows increased intensity. The time resolved photoluminescence analysis revealed that an extended carrier lifetime was observed for the La-doped films. The La-doped CuO sensors achieved a superior gas sensing performance at room temperature and exhibited quick response and recovery times, suggesting that the sensor has the potential for the detection of harmful volatile gases in real-world applications. The photoconductive investigation revealed that the La-doped CuO films exhibited higher charge-transporting properties and increased light-harvesting ability. This study sheds light on designing gas sensors working under ambient conditions and photosensors for optoelectronic devices.

利用雾化喷射热解技术制备了未掺杂和掺杂镧(La)的氧化铜(CuO)薄膜。X 射线衍射分析表明,镧的有效掺杂不会改变氧化铜薄膜的单斜晶体结构。拉曼光谱证实了未掺杂和掺入镧的氧化铜薄膜的结晶质量。扫描电子显微镜图像显示,掺入 La 的氧化铜薄膜呈现球形颗粒。能量色散 X 射线分析证实了铜、镧和氧元素的存在。与未掺杂的氧化铜薄膜相比,掺杂 La 的氧化铜薄膜显示出最小带隙。观察到了铜 2p、镧 3d 和氧 1s 元素的氧化态。由于在 CuO 基体中掺入了 La 离子,薄膜的电阻率大大降低。光致发光光谱显示,掺入 La 离子增加了缺陷态,并显示出更高的强度。时间分辨光致发光分析表明,掺入 La 的薄膜的载流子寿命延长。掺 La 的 CuO 传感器在室温下实现了优异的气体传感性能,并表现出快速的响应和恢复时间,这表明该传感器在实际应用中具有检测有害挥发性气体的潜力。光电导研究表明,掺 La 的氧化铜薄膜具有更高的电荷传输性能和更强的光收集能力。这项研究为设计在环境条件下工作的气体传感器和光电设备的光传感器提供了启示。
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引用次数: 0
Impact of reduced-graphene-oxide functionalization of flower-like zinc-oxide nanostructures on sensing performance of resistive ethanol gas sensor 花状氧化锌纳米结构的还原氧化石墨烯功能化对电阻式乙醇气体传感器传感性能的影响
IF 2 4区 材料科学 Q3 MATERIALS SCIENCE, COATINGS & FILMS Pub Date : 2024-08-08 DOI: 10.1016/j.tsf.2024.140498
Hadi Riyahi Madvar , Mehdi Moayedi , Zoheir Kordrostami

This research presents a sensitive resistive ethanol gas sensor based on reduced graphene oxide (rGO)-functionalized Zinc oxide nanoflowers (ZnO NFs). Upon completion of synthesis, the resulting nanostructures were cast onto the photolithographed silver interdigitated electrodes positioned on an Al2O3 substrate. The graphene oxide (GO) with a low oxidation degree was synthesized using a Hummer's method. In the pursuit of optimizing sensing performance, rGO-functionalized ZnO NFs were synthesized through a one-pot hydrothermal process, utilizing different initial quantities of GO (0 mg, 2 mg, 8 mg, and 12 mg). According to the gas sensing measurements, the fabricated sensor with 8 mg initial GO showed the highest response to ethanol at 250 °C. The results show that the GO addition reduced the optimal working temperature of the pure ZnO NFs from 350 °C to 250 °C. The sensor exhibited a good selectivity, repeatability, and high long-term stability. Enhanced ethanol sensing response of the optimized gas sensor was related to the formation of p-n heterojunction between p-type rGO (formed during hydrothermal process at 200 °C) and n-type ZnO and the presence of the optimal amount of rGO on the surface of NFs. The results obtained in this investigation stress the significance of pinpointing the optimal quantity of GO for producing rGO-ZnO nanoflowers with the highest possible sensitivity to ethanol gas.

本研究介绍了一种基于还原氧化石墨烯(rGO)功能化氧化锌纳米花(ZnO NFs)的灵敏电阻式乙醇气体传感器。合成完成后,将得到的纳米结构浇铸到位于 Al2O3 基底上的光刻银间电极上。低氧化度的氧化石墨烯(GO)是用汉默法合成的。为了优化传感性能,利用不同初始量的 GO(0 毫克、2 毫克、8 毫克和 12 毫克),通过一锅水热法合成了 rGO 功能化 ZnO NF。根据气体传感测量结果,在 250 °C 温度下,初始 GO 为 8 毫克的传感器对乙醇的响应最高。结果表明,添加 GO 后,纯 ZnO 无纺布的最佳工作温度从 350 ℃ 降至 250 ℃。该传感器具有良好的选择性、可重复性和较高的长期稳定性。优化气体传感器乙醇传感响应的增强与 p 型 rGO(在 200 ℃ 水热过程中形成)和 n 型 ZnO 之间形成 p-n 异质结以及 NFs 表面存在最佳量的 rGO 有关。这项研究的结果表明,要生产出对乙醇气体具有最高灵敏度的 rGO-ZnO 纳米花,就必须确定最佳数量的 GO。
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引用次数: 0
Optimization of passivation layer on the front surface of N-type tunnel oxide passivated contact solar cells 优化 N 型隧道氧化物钝化接触式太阳能电池正面的钝化层
IF 2 4区 材料科学 Q3 MATERIALS SCIENCE, COATINGS & FILMS Pub Date : 2024-08-08 DOI: 10.1016/j.tsf.2024.140497
Meiling Zhang , Meilin Peng , Qiqi Wang , Xi Xi , Guilin Liu , Lan Wang , Tingting Yan

In this paper, an effective P+ emitter passivation scheme was proposed by continuously optimizing the passivation layer on the front surface of N-type tunnel oxide passivated contact (TOPCon) solar cells, that was using SiOx/AlOx/SiNx tri-layer passivation stack. The SiOx/AlOx/SiNx stack combined the benefits of the chemical passivation effect of SiOx and the field-effect passivation of SiOx/AlOx stack, resulting in high-quality passivation for boron-doped emitter. Three different passivation schemes of SiNx, AlOx/SiNx and SiOx/AlOx/SiNx were respectively prepared on the front surface of N-type TOPCon solar cells. It was revealed that the cells with SiOx/AlOx/SiNx stack had a superior conversion efficiency, while the SiOx thickness significantly influenced the surface passivation. Through optimization of SiOx thickness in the SiOx/AlOx/SiNx stack, the optimal deposition period for SiOx was 4 cycles by the plasma-enhanced atomic layer deposition (PEALD) process. The N-type TOPCon solar cells with SiOx/AlOx/SiNx stack on the front surface exhibited the highest performances with a conversion efficiency of 24.88 % when the deposition period of SiOx was 4 cycles. Compared with the baseline processes, the efficiency was increased by 0.11 %abs..

本文通过不断优化 N 型隧道氧化物钝化接触(TOPCon)太阳能电池前表面的钝化层,提出了一种有效的 P+ 发射极钝化方案,即使用 SiOx/AlOx/SiNx 三层钝化叠层。SiOx/AlOx/SiNx 堆栈结合了 SiOx 的化学钝化效果和 SiOx/AlOx 堆栈的场效应钝化效果,从而为掺硼发射极实现了高质量的钝化。在 N 型 TOPCon 太阳能电池的正面分别制备了 SiNx、AlOx/SiNx 和 SiOx/AlOx/SiNx 三种不同的钝化方案。结果表明,采用 SiOx/AlOx/SiNx 叠层的电池具有更高的转换效率,而 SiOx 的厚度对表面钝化有显著影响。通过优化 SiOx/AlOx/SiNx 叠层中的 SiOx 厚度,采用等离子体增强原子层沉积(PEALD)工艺,SiOx 的最佳沉积周期为 4 个周期。当 SiOx 的沉积周期为 4 个周期时,正面带有 SiOx/AlOx/SiNx 叠层的 N 型 TOPCon 太阳能电池表现出最高的性能,转换效率达到 24.88%。与基线工艺相比,效率提高了 0.11%。
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引用次数: 0
Interface improvement of diamond/copper composites through a low-temperature high-efficiency coating method 通过低温高效涂层法改善金刚石/铜复合材料的界面
IF 2 4区 材料科学 Q3 MATERIALS SCIENCE, COATINGS & FILMS Pub Date : 2024-08-05 DOI: 10.1016/j.tsf.2024.140486
Chenlong Wei , Xuexiang Wang , Jun Wen , Qiang Wang , Zhaoshi Donga

A tungsten coating was formed by the in situ reaction of tungsten trioxide formed by the thermal decomposition of ammonium metatungstate in a molten salt (NaCl+BaCl2) environment with carbon atoms on the surface of diamond. Meanwhile, diamond/copper composites were prepared using the prepared tungsten-coated diamonds. The morphology and composition of the coatings and diamond/copper composites were observed using scanning electron microscopy, transmission electron microscopy, and energy-dispersive spectroscopy. The results revealed that the originally smooth diamond surface was uniformly covered by a tungsten coating after low-temperature salt bath treatment at 1050 °C, a temperature 50–100 °C lower than that of traditional methods. Compared to the directly added tungsten trioxide, the tungsten trioxide produced by the thermal decomposition of ammonium metatungstate was more active, and the coating was more uniform. The bending strength and thermal conductivity of tungsten-coated diamond/copper composites were 280.6 MPa and 516 W/(m·k), respectively, which were significantly higher than those of uncoated diamond/copper composites (128.6 MPa and 168 W/m·K). This indirectly confirms that the diamond surface coating can improve the interfacial bonding performance between diamond and copper.

偏钨酸铵在熔盐(NaCl+BaCl)环境中热分解形成的三氧化钨与金刚石表面的碳原子发生原位反应,形成了钨涂层。同时,利用制备的钨涂层金刚石制备了金刚石/铜复合材料。使用扫描电子显微镜、透射电子显微镜和能量色散光谱仪观察了涂层和金刚石/铜复合材料的形态和成分。结果表明,在 1050 ℃(比传统方法低 50-100 ℃)的低温盐浴处理后,原本光滑的金刚石表面被钨涂层均匀覆盖。与直接添加的三氧化钨相比,偏钨酸铵热分解产生的三氧化钨活性更高,涂层也更均匀。钨涂层金刚石/铜复合材料的抗弯强度和热导率分别为 280.6 MPa 和 516 W/(m-k),明显高于未涂层金刚石/铜复合材料(128.6 MPa 和 168 W/m-K)。这间接证实了金刚石表面涂层可以改善金刚石与铜的界面结合性能。
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Thin Solid Films
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