Pub Date : 1900-01-01DOI: 10.1109/vdat.2009.5158076
R. P. D. Vries, Kuen-Jong Lee, T. Cheng, Yao-Wen Chang, Ting-Ting Hwang, Cheng-Wen Wu
The International Symposium on VLSI Design, Automation and Test (VLSI-DAT), spun-off from the influential International Symposium on VLSI Technology, Systems, and Applications (VLSI-TSA) in 2006, has stepped into the 4 year. Every year, scientists and engineers discuss and present the state-of-the-art technology and macro development of the industry's future. The VLSI-DAT symposium is becoming more significant, since Taiwan not only occupies a prominent position in the global semiconductor industry, but also is increasingly competitive globally in IC design technology for communication and information products.
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