Each year, VTS recognizes the organizers and participants of the best panel at the previous year’s symposium. The selection is based entirely on audience feedback, as recorded on the attendee feedback forms. The audience rates each panel in various categories, including topical relevance, presentation quality, educational merit, panelist interaction, and audience participation.
{"title":"VTS 2004 Best Panel Award","authors":"C. Wang, K. Butler","doi":"10.1109/VTS.2005.90","DOIUrl":"https://doi.org/10.1109/VTS.2005.90","url":null,"abstract":"Each year, VTS recognizes the organizers and participants of the best panel at the previous year’s symposium. The selection is based entirely on audience feedback, as recorded on the attendee feedback forms. The audience rates each panel in various categories, including topical relevance, presentation quality, educational merit, panelist interaction, and audience participation.","PeriodicalId":268324,"journal":{"name":"23rd IEEE VLSI Test Symposium (VTS'05)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122652165","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：