Pub Date : 1996-08-19DOI: 10.1109/ISEMC.1996.561411
M. Montrose
To analyze the effectiveness of various termination methods for clock traces related to signal functionality based on routed trace lengths and edge rates, the following is examined: (1) Effectiveness of termination methods which provides optimal performance for a given application; (2) Efficient termination technique for preventing ringing, overshoot and reflections; (3) Effects of various trace lengths based on clock edge rates; (4) Effects of dual (multiple) terminations. Results of this analysis are from measurements taken on a specially designed printed circuit board in the time domain. A companion paper, Analysis on the Effectiveness of Image Planes Related to Trace Lengths and Clock Edges on a Printed Circuit Board uses the same printed circuit board with radiated measurements in the frequency domain.
{"title":"Analysis on the effectiveness of clock trace termination methods and trace lengths on a printed circuit board","authors":"M. Montrose","doi":"10.1109/ISEMC.1996.561411","DOIUrl":"https://doi.org/10.1109/ISEMC.1996.561411","url":null,"abstract":"To analyze the effectiveness of various termination methods for clock traces related to signal functionality based on routed trace lengths and edge rates, the following is examined: (1) Effectiveness of termination methods which provides optimal performance for a given application; (2) Efficient termination technique for preventing ringing, overshoot and reflections; (3) Effects of various trace lengths based on clock edge rates; (4) Effects of dual (multiple) terminations. Results of this analysis are from measurements taken on a specially designed printed circuit board in the time domain. A companion paper, Analysis on the Effectiveness of Image Planes Related to Trace Lengths and Clock Edges on a Printed Circuit Board uses the same printed circuit board with radiated measurements in the frequency domain.","PeriodicalId":296175,"journal":{"name":"Proceedings of Symposium on Electromagnetic Compatibility","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130155796","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1996-08-19DOI: 10.1109/ISEMC.1996.561265
L. Hoeft, T. Salas, W. Prather
A test technique has been developed that can measure the clamp voltage of embedded terminal protection devices and thus determine their functionality with the application of a single pulse. The use of a moderate (50 ns) risetime reduces the artifact associated with the circuit elements and parasitic reactances. Pulse durations of several hundred nanoseconds are adequate for measuring the clamp voltage of TPDs in a wide range of circuits. With the appropriate choice of pulse duration and amplitude, the technique can be used in automatic test systems.
{"title":"Development of an embedded terminal protection device (TPD) tester","authors":"L. Hoeft, T. Salas, W. Prather","doi":"10.1109/ISEMC.1996.561265","DOIUrl":"https://doi.org/10.1109/ISEMC.1996.561265","url":null,"abstract":"A test technique has been developed that can measure the clamp voltage of embedded terminal protection devices and thus determine their functionality with the application of a single pulse. The use of a moderate (50 ns) risetime reduces the artifact associated with the circuit elements and parasitic reactances. Pulse durations of several hundred nanoseconds are adequate for measuring the clamp voltage of TPDs in a wide range of circuits. With the appropriate choice of pulse duration and amplitude, the technique can be used in automatic test systems.","PeriodicalId":296175,"journal":{"name":"Proceedings of Symposium on Electromagnetic Compatibility","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114156933","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1996-08-19DOI: 10.1109/ISEMC.1996.561213
H. Singer, H. Bruns, G. Burger
This article presents new developments in the method of moments (MOM). IT describes some variants of this method which deal with general bodies composed of metallic and dielectric structures. Some procedures are presented which combine the method of moments with analytical methods in order to solve additional problem classes in the area of EMC. Two of these approaches are able to analyse the shielding effectiveness (SE) of electromagnetic shields consisting of nonperfectly conductive materials. Both procedures can be implemented by the method of moments. Two other techniques, which are outlined, are able to treat the induction in lines close to metallic surfaces and to analyse the voltages coupled into cables.
{"title":"State of the art in the method of moments","authors":"H. Singer, H. Bruns, G. Burger","doi":"10.1109/ISEMC.1996.561213","DOIUrl":"https://doi.org/10.1109/ISEMC.1996.561213","url":null,"abstract":"This article presents new developments in the method of moments (MOM). IT describes some variants of this method which deal with general bodies composed of metallic and dielectric structures. Some procedures are presented which combine the method of moments with analytical methods in order to solve additional problem classes in the area of EMC. Two of these approaches are able to analyse the shielding effectiveness (SE) of electromagnetic shields consisting of nonperfectly conductive materials. Both procedures can be implemented by the method of moments. Two other techniques, which are outlined, are able to treat the induction in lines close to metallic surfaces and to analyse the voltages coupled into cables.","PeriodicalId":296175,"journal":{"name":"Proceedings of Symposium on Electromagnetic Compatibility","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134028198","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1996-08-19DOI: 10.1109/ISEMC.1996.561262
J. P. Donohoe, C. Taylor
The objective of this paper is to develop a basic understanding of the resonances in the axial aperture electric field of an open-ended body of revolution (BOR) excited via plane wave illumination. Four distinct perfectly-conducting BORs are studied in this paper: (1) a straight cylinder, (2) a straight cylinder closed on one end, (3) a tapered cylinder open on both ends and (4) a tapered cylinder which is closed on the nontapered end. The incident plane wave is assumed to be transverse magnetic to the BOR axis. The fundamental characteristics of the first three dominant aperture field resonances for each of the four BORs are presented. The surface currents which produce these resonances are also given. The axial electric field along the BOR axes are compared for four distinct models. All of the aforementioned data is given for various angles of plane wave incidence.
{"title":"On the axial aperture electric field resonances of open-ended missile-like structures","authors":"J. P. Donohoe, C. Taylor","doi":"10.1109/ISEMC.1996.561262","DOIUrl":"https://doi.org/10.1109/ISEMC.1996.561262","url":null,"abstract":"The objective of this paper is to develop a basic understanding of the resonances in the axial aperture electric field of an open-ended body of revolution (BOR) excited via plane wave illumination. Four distinct perfectly-conducting BORs are studied in this paper: (1) a straight cylinder, (2) a straight cylinder closed on one end, (3) a tapered cylinder open on both ends and (4) a tapered cylinder which is closed on the nontapered end. The incident plane wave is assumed to be transverse magnetic to the BOR axis. The fundamental characteristics of the first three dominant aperture field resonances for each of the four BORs are presented. The surface currents which produce these resonances are also given. The axial electric field along the BOR axes are compared for four distinct models. All of the aforementioned data is given for various angles of plane wave incidence.","PeriodicalId":296175,"journal":{"name":"Proceedings of Symposium on Electromagnetic Compatibility","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122212930","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1996-08-19DOI: 10.1109/ISEMC.1996.561203
R. DeMoor
Microcontrollers with integrated PLL (phase-locked loop) oscillators provide significant EMI reductions as compared to microcontrollers with standard oscillators, which typically run at two or four times the frequency of the system clocks. Three microcontrollers have been evaluated: one with a standard oscillator (system clock frequency= 1/4 * oscillator frequency), one with a X1 PLL (system clock=oscillator), and one with a 32 kHz-based PLL which produces a system clock frequency equivalent to that of the other two devices. The EMI contribution of the oscillators has been measured and compared using the SAE J1752/3 method.
{"title":"Achieving reduced EMI using microcontrollers with PLL oscillators","authors":"R. DeMoor","doi":"10.1109/ISEMC.1996.561203","DOIUrl":"https://doi.org/10.1109/ISEMC.1996.561203","url":null,"abstract":"Microcontrollers with integrated PLL (phase-locked loop) oscillators provide significant EMI reductions as compared to microcontrollers with standard oscillators, which typically run at two or four times the frequency of the system clocks. Three microcontrollers have been evaluated: one with a standard oscillator (system clock frequency= 1/4 * oscillator frequency), one with a X1 PLL (system clock=oscillator), and one with a 32 kHz-based PLL which produces a system clock frequency equivalent to that of the other two devices. The EMI contribution of the oscillators has been measured and compared using the SAE J1752/3 method.","PeriodicalId":296175,"journal":{"name":"Proceedings of Symposium on Electromagnetic Compatibility","volume":"87 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126402427","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1996-08-19DOI: 10.1109/ISEMC.1996.561258
J. Bernauer, A. Schwab
The transfer impedance of a 19"-aluminum subrack has been measured by injecting a current into the shield surface and measuring the voltage across the inner surface between the injection points. The measurements were performed in the frequency range from dc up to 30 MHz. With two different set-ups, the influence of the current return path was examined. The surface transfer impedance depends strongly on the mounting conditions of the basic unit (side plates and horizontal rails) and the covers. The interference currents were symmetrically injected into opposite shield surfaces in x, y and z-direction.
{"title":"Transfer impedance measurement of a 19\"-subrack","authors":"J. Bernauer, A. Schwab","doi":"10.1109/ISEMC.1996.561258","DOIUrl":"https://doi.org/10.1109/ISEMC.1996.561258","url":null,"abstract":"The transfer impedance of a 19\"-aluminum subrack has been measured by injecting a current into the shield surface and measuring the voltage across the inner surface between the injection points. The measurements were performed in the frequency range from dc up to 30 MHz. With two different set-ups, the influence of the current return path was examined. The surface transfer impedance depends strongly on the mounting conditions of the basic unit (side plates and horizontal rails) and the covers. The interference currents were symmetrically injected into opposite shield surfaces in x, y and z-direction.","PeriodicalId":296175,"journal":{"name":"Proceedings of Symposium on Electromagnetic Compatibility","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127575298","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1996-08-19DOI: 10.1109/ISEMC.1996.561195
R. Anderson
Medical device EMC compliance became mandatory for sales in the European Union on January 1, 1996. This paper reviews current requirements, provides examples of experiences and issues associated with compliance and provides insight on the development of a revision to the EMC standard for medical devices.
{"title":"The European medical device EMC specifications","authors":"R. Anderson","doi":"10.1109/ISEMC.1996.561195","DOIUrl":"https://doi.org/10.1109/ISEMC.1996.561195","url":null,"abstract":"Medical device EMC compliance became mandatory for sales in the European Union on January 1, 1996. This paper reviews current requirements, provides examples of experiences and issues associated with compliance and provides insight on the development of a revision to the EMC standard for medical devices.","PeriodicalId":296175,"journal":{"name":"Proceedings of Symposium on Electromagnetic Compatibility","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131013462","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1996-08-19DOI: 10.1109/ISEMC.1996.561410
B. R. Crain, A. Peterson
The dispersion characteristics of microstrip lines lying near substrate and ground plane edges are examined using the finite element method (FEM). Microstrips lying near two types of edges are analyzed: a substrate edge on an infinite ground plane and a substrate/ground plane edge. The FEM formulation is based on the curl-curl vector Helmholtz equation. Mixed-order covariant projection finite elements are employed to avoid problems with spurious modes. Local absorbing boundary conditions are used to truncate the FEM mesh in the open region. An efficient sparse eigensolver, based on iterative methods, is used to solve the resulting non-linear eigenvalue equation.
{"title":"Finite element analysis of dispersion characteristics of microstrip lines lying near substrate and ground plane edges","authors":"B. R. Crain, A. Peterson","doi":"10.1109/ISEMC.1996.561410","DOIUrl":"https://doi.org/10.1109/ISEMC.1996.561410","url":null,"abstract":"The dispersion characteristics of microstrip lines lying near substrate and ground plane edges are examined using the finite element method (FEM). Microstrips lying near two types of edges are analyzed: a substrate edge on an infinite ground plane and a substrate/ground plane edge. The FEM formulation is based on the curl-curl vector Helmholtz equation. Mixed-order covariant projection finite elements are employed to avoid problems with spurious modes. Local absorbing boundary conditions are used to truncate the FEM mesh in the open region. An efficient sparse eigensolver, based on iterative methods, is used to solve the resulting non-linear eigenvalue equation.","PeriodicalId":296175,"journal":{"name":"Proceedings of Symposium on Electromagnetic Compatibility","volume":"148 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123435426","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1996-08-19DOI: 10.1109/ISEMC.1996.561221
H. Kurihara, K. Shiramizu, Y. Hirai, Y. Hashimoto, K. Ishino
The ferrite absorbing panel used for suppressing TV ghost images caused by TV wave reflection from tall buildings and the RF absorber used for an anechoic chamber have been realized for many years. The convenient and accurate measuring method of the reflectivity characteristics of RF absorbers against the oblique incidence in the low frequency range (lower than 1 GHz) is investigated by using a new time domain reflectometer method. The direct wave vector from the transmitting antenna to the receiving antenna and the undesired reflection vector can be eliminated by means of a mathematical treatment or by subtraction of the receiving signal without the target from that signal with the target in advance of time gating in the desired response. By using these new methods, a convenient and efficient evaluation method for an RF absorbing panel and absorber could be realized.
{"title":"Investigation on convenient measuring method of oblique incident characteristics for absorbing panel in low frequency range (lower than 1 GHz)","authors":"H. Kurihara, K. Shiramizu, Y. Hirai, Y. Hashimoto, K. Ishino","doi":"10.1109/ISEMC.1996.561221","DOIUrl":"https://doi.org/10.1109/ISEMC.1996.561221","url":null,"abstract":"The ferrite absorbing panel used for suppressing TV ghost images caused by TV wave reflection from tall buildings and the RF absorber used for an anechoic chamber have been realized for many years. The convenient and accurate measuring method of the reflectivity characteristics of RF absorbers against the oblique incidence in the low frequency range (lower than 1 GHz) is investigated by using a new time domain reflectometer method. The direct wave vector from the transmitting antenna to the receiving antenna and the undesired reflection vector can be eliminated by means of a mathematical treatment or by subtraction of the receiving signal without the target from that signal with the target in advance of time gating in the desired response. By using these new methods, a convenient and efficient evaluation method for an RF absorbing panel and absorber could be realized.","PeriodicalId":296175,"journal":{"name":"Proceedings of Symposium on Electromagnetic Compatibility","volume":"108 6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128693914","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1996-08-19DOI: 10.1109/ISEMC.1996.561210
F. Han, W.T. Smith
The significance of coupling and interference of external electromagnetic field sources to underground transmission systems has increased due to the development of underground technologies for various applications. This paper discusses the terminal effect of finite length underground cables illuminated by external sources. The equivalent transmission line equations (ETLEs) is used to validate the coupling to the 'sheath-earth' loop of the cables, and conventional TLM is employed to deal with the coupling to the 'sheath-core' loop. One application for conductive coupling of a two-cable underground system of both infinite and finite length cables is addressed and compared with experimental results.
{"title":"Terminal effect of finite length underground cables to illumination of external fields","authors":"F. Han, W.T. Smith","doi":"10.1109/ISEMC.1996.561210","DOIUrl":"https://doi.org/10.1109/ISEMC.1996.561210","url":null,"abstract":"The significance of coupling and interference of external electromagnetic field sources to underground transmission systems has increased due to the development of underground technologies for various applications. This paper discusses the terminal effect of finite length underground cables illuminated by external sources. The equivalent transmission line equations (ETLEs) is used to validate the coupling to the 'sheath-earth' loop of the cables, and conventional TLM is employed to deal with the coupling to the 'sheath-core' loop. One application for conductive coupling of a two-cable underground system of both infinite and finite length cables is addressed and compared with experimental results.","PeriodicalId":296175,"journal":{"name":"Proceedings of Symposium on Electromagnetic Compatibility","volume":"131 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124552979","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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