Pub Date : 1988-06-07DOI: 10.1109/CPEM.1988.671186
J. Vanier
The paper reviews the state of the art of primary laboratory atomic frequency standards. Emphasis will be put on the new techniques being used in the field such as ion trapping, laser cooling and optical pumping, to implement more accurate primary optical or microwave frequency standards. Progress made at NRC on the subject will be outlined. Finally the central role of time as a base quantity of the international system of units will be discussed.
{"title":"Atomic frequency standards: new trends and progress at nrc","authors":"J. Vanier","doi":"10.1109/CPEM.1988.671186","DOIUrl":"https://doi.org/10.1109/CPEM.1988.671186","url":null,"abstract":"The paper reviews the state of the art of primary laboratory atomic frequency standards. Emphasis will be put on the new techniques being used in the field such as ion trapping, laser cooling and optical pumping, to implement more accurate primary optical or microwave frequency standards. Progress made at NRC on the subject will be outlined. Finally the central role of time as a base quantity of the international system of units will be discussed.","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115901066","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1988-06-07DOI: 10.1109/CPEM.1988.671164
N. Oldham, P. S. Hetrick, Zeng Xiangren
A transportable ac voltage source is described, in which sinusoidal signals are digitally-synthesized in the audio-frequency range. The rms value of the output waveform may be calculated by measuring the dc level of the individual steps used to generate the waveform. The uncertainty of this calculation is typically 10 ppm from 20 Hz - 10 kHz at the 7 V level.
{"title":"A calculable, transportable audio-frequency AC reference standard","authors":"N. Oldham, P. S. Hetrick, Zeng Xiangren","doi":"10.1109/CPEM.1988.671164","DOIUrl":"https://doi.org/10.1109/CPEM.1988.671164","url":null,"abstract":"A transportable ac voltage source is described, in which sinusoidal signals are digitally-synthesized in the audio-frequency range. The rms value of the output waveform may be calculated by measuring the dc level of the individual steps used to generate the waveform. The uncertainty of this calculation is typically 10 ppm from 20 Hz - 10 kHz at the 7 V level.","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"88 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114402200","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1988-06-07DOI: 10.1109/CPEM.1988.671345
T. Aida, S. Hayasaki, T. Sakai
The gloss-meter using a CCD line-sensor, electronic circuits and a single-board computer was developed for curved surfaces, accordance with a new definition of glossiness. Also, by the improvement of an optical system in this meter, a high speeding of measurement and an error reducing were realized.
{"title":"High Speeding of the Gloss-Meter for Curved Surfaces Using CCD Line Sensor","authors":"T. Aida, S. Hayasaki, T. Sakai","doi":"10.1109/CPEM.1988.671345","DOIUrl":"https://doi.org/10.1109/CPEM.1988.671345","url":null,"abstract":"The gloss-meter using a CCD line-sensor, electronic circuits and a single-board computer was developed for curved surfaces, accordance with a new definition of glossiness. Also, by the improvement of an optical system in this meter, a high speeding of measurement and an error reducing were realized.","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117209979","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1988-06-07DOI: 10.1109/CPEM.1988.671211
D. Franzen
Standard measurement procedures for single-mode fibers are reviewed. Various methods are evaluated and agreement accuracy discussed.
回顾了单模光纤的标准测量程序。对各种方法进行了评价，并讨论了一致性的准确性。
{"title":"Measurement Standards For Single-Mode Fibers","authors":"D. Franzen","doi":"10.1109/CPEM.1988.671211","DOIUrl":"https://doi.org/10.1109/CPEM.1988.671211","url":null,"abstract":"Standard measurement procedures for single-mode fibers are reviewed. Various methods are evaluated and agreement accuracy discussed.","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125997228","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1988-06-07DOI: 10.1109/CPEM.1988.671318
V. Kuznetsov, V. Kaminskii, S. Lebedev, V. Pudalov, V. V. Sazhin, S. Semenchinsky, A. K. Yanysh
{"title":"Measurement of h/e/sup 2/ at IMS & IMM","authors":"V. Kuznetsov, V. Kaminskii, S. Lebedev, V. Pudalov, V. V. Sazhin, S. Semenchinsky, A. K. Yanysh","doi":"10.1109/CPEM.1988.671318","DOIUrl":"https://doi.org/10.1109/CPEM.1988.671318","url":null,"abstract":"","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"249 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124741723","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1988-06-07DOI: 10.1109/CPEM.1988.671206
N. S. Chung, C. Lee, In Deok Jeon
A time comparison system using the ranging signal of the Geostationary Meteorological Satellite of Japan (GMS) has been developed, and the GMS measurements have been carried out between KSRI and RRL.
{"title":"Time Comparisons Between KSRI and RRL via the Geostationary Meteorological Satellite of Japan","authors":"N. S. Chung, C. Lee, In Deok Jeon","doi":"10.1109/CPEM.1988.671206","DOIUrl":"https://doi.org/10.1109/CPEM.1988.671206","url":null,"abstract":"A time comparison system using the ranging signal of the Geostationary Meteorological Satellite of Japan (GMS) has been developed, and the GMS measurements have been carried out between KSRI and RRL.","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129776083","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1988-06-07DOI: 10.1109/CPEM.1988.671141
Y. Sakamoto, T. Endo, Y. Murayama
Linearity of quantized voltages generated by a Josephson junction array is experimentally tested at every 100mV in a voltage range of 100mV to 1 volt. The priciple is to measure the resistance ratios of resistors connected in series and examining the consistency among the resistance ratios. The accuracy of measurement is expected to be few parts in 10/sup 8/.
{"title":"Linearity of quantized voltages generated by a josephson junction array","authors":"Y. Sakamoto, T. Endo, Y. Murayama","doi":"10.1109/CPEM.1988.671141","DOIUrl":"https://doi.org/10.1109/CPEM.1988.671141","url":null,"abstract":"Linearity of quantized voltages generated by a Josephson junction array is experimentally tested at every 100mV in a voltage range of 100mV to 1 volt. The priciple is to measure the resistance ratios of resistors connected in series and examining the consistency among the resistance ratios. The accuracy of measurement is expected to be few parts in 10/sup 8/.","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"97 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127377270","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1988-06-07DOI: 10.1109/CPEM.1988.671290
J. Kinard, Cai Ti-Xiong
Thermal voltage converter structures have been modeled theoretically and studied experimentally to determine their ac-dc differences in the 0.1-100 megahertz frequency range.
对热电压变换器结构进行了理论建模和实验研究，以确定其在0.1-100兆赫频率范围内的交直流差异。
{"title":"Determination of AC-DC Difference in the 0.1 - 100 MHZ Frequency Range","authors":"J. Kinard, Cai Ti-Xiong","doi":"10.1109/CPEM.1988.671290","DOIUrl":"https://doi.org/10.1109/CPEM.1988.671290","url":null,"abstract":"Thermal voltage converter structures have been modeled theoretically and studied experimentally to determine their ac-dc differences in the 0.1-100 megahertz frequency range.","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125678724","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1988-06-07DOI: 10.1109/CPEM.1988.671285
M. Kanno
This paper describes the traceability system of electrical standards in Japan. National standards are established and maintained by ETL. The dissemination of electrical standards has been carried out by the intermediate transfer agencies, JEMIC and JMI, since 1965.
{"title":"Traceability System of Electrical Standards in Japan","authors":"M. Kanno","doi":"10.1109/CPEM.1988.671285","DOIUrl":"https://doi.org/10.1109/CPEM.1988.671285","url":null,"abstract":"This paper describes the traceability system of electrical standards in Japan. National standards are established and maintained by ETL. The dissemination of electrical standards has been carried out by the intermediate transfer agencies, JEMIC and JMI, since 1965.","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132857457","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1988-06-07DOI: 10.1109/CPEM.1988.671297
Huang Junqin
A new multifunctional digital instrumentation is presented in this paper, which consists of multiplex, analog-to-digital converter (CAD), frequency-to-digital converter (FDC), single-chip-microcomputer, keyboard, digital display and printer. It can measure seven analog signals and two frequency signals. The analog signals are the output signals of analog transducers. The frequency signals may be the output signals of the transducers with frequency output. Besides, some main special functions of this digital instrument are: automatic compensation of temperature and source voltage fluctuation.
{"title":"A New Multifunctional Digital Instrumentation","authors":"Huang Junqin","doi":"10.1109/CPEM.1988.671297","DOIUrl":"https://doi.org/10.1109/CPEM.1988.671297","url":null,"abstract":"A new multifunctional digital instrumentation is presented in this paper, which consists of multiplex, analog-to-digital converter (CAD), frequency-to-digital converter (FDC), single-chip-microcomputer, keyboard, digital display and printer. It can measure seven analog signals and two frequency signals. The analog signals are the output signals of analog transducers. The frequency signals may be the output signals of the transducers with frequency output. Besides, some main special functions of this digital instrument are: automatic compensation of temperature and source voltage fluctuation.","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"72 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132876042","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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