Pub Date : 2025-10-14DOI: 10.1016/j.jcrysgro.2025.128371
Ha Young Kang, Jaeheon Jung, Young Soo Hwang, Roy B. Chung
This study systematically explores the structural factors influencing κ-phase gallium oxide (κ-Ga2O3) thin film growth and domain formation on non-basal plane substrates. Accordingly, we grew κ-Ga2O3 thin films using mist chemical vapor deposition on both basal and non-basal plane sapphire (c-, a-, m-, and r-plane) and GaN (c- and m-plane) substrates for analysis. Crystallinity, orientation, and domain structures were assessed by X-ray diffraction including 2θ–ω scans, rocking curves, and φ-scans. On c- and a-plane sapphire and GaN substrates, κ-Ga2O3 with c-axis orientation was selectively stabilized, whereas α-Ga2O3 predominantly formed on r- and m-plane sapphire. Regardless of substrate symmetry, all κ-Ga2O3 films exhibited persistent three-fold rotational domains, highlighting the limitations of current substrate configurations. These results demonstrate the significant influence of substrate atomic arrangement on phase stability and domain control, emphasizing the need for advanced substrate engineering to realize single-domain κ-Ga2O3 thin films with improved crystalline quality.
{"title":"Influence of substrate atomic symmetry on the epitaxy and rotational domain formation of κ-Ga2O3","authors":"Ha Young Kang, Jaeheon Jung, Young Soo Hwang, Roy B. Chung","doi":"10.1016/j.jcrysgro.2025.128371","DOIUrl":"10.1016/j.jcrysgro.2025.128371","url":null,"abstract":"<div><div>This study systematically explores the structural factors influencing κ-phase gallium oxide (κ-Ga<sub>2</sub>O<sub>3</sub>) thin film growth and domain formation on non-basal plane substrates. Accordingly, we grew κ-Ga<sub>2</sub>O<sub>3</sub> thin films using mist chemical vapor deposition on both basal and non-basal plane sapphire (c-, a-, m-, and r-plane) and GaN (c- and m-plane) substrates for analysis. Crystallinity, orientation, and domain structures were assessed by X-ray diffraction including 2θ–ω scans, rocking curves, and φ-scans. On c- and a-plane sapphire and GaN substrates, κ-Ga<sub>2</sub>O<sub>3</sub> with c-axis orientation was selectively stabilized, whereas α-Ga<sub>2</sub>O<sub>3</sub> predominantly formed on r- and m-plane sapphire. Regardless of substrate symmetry, all κ-Ga<sub>2</sub>O<sub>3</sub> films exhibited persistent three-fold rotational domains, highlighting the limitations of current substrate configurations. These results demonstrate the significant influence of substrate atomic arrangement on phase stability and domain control, emphasizing the need for advanced substrate engineering to realize single-domain κ-Ga<sub>2</sub>O<sub>3</sub> thin films with improved crystalline quality.</div></div>","PeriodicalId":353,"journal":{"name":"Journal of Crystal Growth","volume":"671 ","pages":"Article 128371"},"PeriodicalIF":2.0,"publicationDate":"2025-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145326237","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-10-14DOI: 10.1016/j.jcrysgro.2025.128355
Yingzhao Geng , Yang Xu , Xu Li , Xiao Wang , Hao Wu , Chang Liu
InN thin films have been deposited on fluorophlogopite mica (F-mica) substrates by molecular beam epitaxy (MBE) under various growth conditions. The N2 flow rate and radio-frequency (RF) power were adjusted to realize N-rich and In-rich growth conditions. During the transition from N-rich to In-rich conditions, the plateaus formed by partially coalesced larger grains or islands were observed, which was attributed to the short diffusion length of indium (In) atoms. Meanwhile, the In-rich InN thin films exhibit lower dislocation densities than those of N-rich thin films. Under In-rich conditions, similar plateaus were also observed at lower growth temperatures. Additionally, the surface roughness and total dislocation density were reduced by increasing the growth and In source temperatures to 490 and 775 °C. Throughout all growth condition, the in-plane epitaxial relationship remains as InN [110]//F-mica [010].
{"title":"Molecular beam epitaxy of flexible InN thin films on fluorophlogopite mica","authors":"Yingzhao Geng , Yang Xu , Xu Li , Xiao Wang , Hao Wu , Chang Liu","doi":"10.1016/j.jcrysgro.2025.128355","DOIUrl":"10.1016/j.jcrysgro.2025.128355","url":null,"abstract":"<div><div>InN thin films have been deposited on fluorophlogopite mica (F-mica) substrates by molecular beam epitaxy (MBE) under various growth conditions. The N<sub>2</sub> flow rate and radio-frequency (RF) power were adjusted to realize N-rich and In-rich growth conditions. During the transition from N-rich to In-rich conditions, the plateaus formed by partially coalesced larger grains or islands were observed, which was attributed to the short diffusion length of indium (In) atoms. Meanwhile, the In-rich InN thin films exhibit lower dislocation densities than those of N-rich thin films. Under In-rich conditions, similar plateaus were also observed at lower growth temperatures. Additionally, the surface roughness and total dislocation density were reduced by increasing the growth and In source temperatures to 490 and 775 °C. Throughout all growth condition, the in-plane epitaxial relationship remains as InN [110]//F-mica [010].</div></div>","PeriodicalId":353,"journal":{"name":"Journal of Crystal Growth","volume":"671 ","pages":"Article 128355"},"PeriodicalIF":2.0,"publicationDate":"2025-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145326234","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-10-14DOI: 10.1016/j.jcrysgro.2025.128369
Minh-Anh Nguyen Tran , Van Quang Nguyen , Cao Khang Nguyen , Sunglae Cho
In this work, we systematically investigate the epitaxial growth of GaSe thin films on different substrates, including GaAs(100), GaAs(111), GaN/Al2O3(0001), and SrTiO3(001), using molecular beam epitaxy (MBE). All films exhibit a universal strain configuration with biaxial tensile strain in the basal plane coupled with out-of-plane compressive strain, whose magnitude varies with substrate type. On cubic GaAs substrates, GaSe grows with well-aligned single domains, while hexagonal GaN and perovskite STO promote multiple domain orientations, reflecting the role of interfacial symmetry mismatch. X-ray diffraction confirms out-of-plane lattice contraction, with compressive strain ranging from ∼1.3 % on GaAs(1 0 0) to ∼2.5 % on GaN(0001). Raman spectroscopy shows red-shifts of the in-plane phonon mode, directly evidencing biaxial tensile strain. These findings demonstrate that substrate-induced strain, governed primarily by symmetry mismatch, provides a powerful and intrinsic route to tailor the optical and electronic properties of GaSe, enabling new strategies for strain-engineered 2D optoelectronic devices.
{"title":"Strain modulation in 2D GaSe epitaxial films by substrate engineering via molecular beam epitaxy (MBE)","authors":"Minh-Anh Nguyen Tran , Van Quang Nguyen , Cao Khang Nguyen , Sunglae Cho","doi":"10.1016/j.jcrysgro.2025.128369","DOIUrl":"10.1016/j.jcrysgro.2025.128369","url":null,"abstract":"<div><div>In this work, we systematically investigate the epitaxial growth of GaSe thin films on different substrates, including GaAs(100), GaAs(111), GaN/Al<sub>2</sub>O<sub>3</sub>(0001), and SrTiO<sub>3</sub>(001), using molecular beam epitaxy (MBE). All films exhibit a universal strain configuration with biaxial tensile strain in the basal plane coupled with out-of-plane compressive strain, whose magnitude varies with substrate type. On cubic GaAs substrates, GaSe grows with well-aligned single domains, while hexagonal GaN and perovskite STO promote multiple domain orientations, reflecting the role of interfacial symmetry mismatch. X-ray diffraction confirms out-of-plane lattice contraction, with compressive strain ranging from ∼1.3 % on GaAs(1<!--> <!-->0<!--> <!-->0) to ∼2.5 % on GaN(0001). Raman spectroscopy shows red-shifts of the in-plane <span><math><msubsup><mi>E</mi><mrow><mn>2</mn><mi>g</mi></mrow><mn>2</mn></msubsup></math></span> phonon mode, directly evidencing biaxial tensile strain. These findings demonstrate that substrate-induced strain, governed primarily by symmetry mismatch, provides a powerful and intrinsic route to tailor the optical and electronic properties of GaSe, enabling new strategies for strain-engineered 2D optoelectronic devices.</div></div>","PeriodicalId":353,"journal":{"name":"Journal of Crystal Growth","volume":"671 ","pages":"Article 128369"},"PeriodicalIF":2.0,"publicationDate":"2025-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145326236","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-10-13DOI: 10.1016/j.jcrysgro.2025.128343
Debajani Rout , R. Kulkarni , A. Thamizhavel , Santosh Kumar
We report the growth of single crystals of the non-centrosymmetric material YCoC2 by the Czochralski technique using a tetra arc furnace. This compound belongs to the family of rare-earth transition-metal carbides, the members of which exhibit a wide range of interesting phenomena including topological semimetallic behaviour. We have investigated the magnetic and transport properties of YCoC2. The results of resistivity measurements revealed a typical metallic behaviour across the temperature range, 4 < T < 300 K. At T = 3.9(1) K, a transition in both magnetization and resistivity measurements has been observed. This feature has been explored in detail with the temperature-dependent magnetization M(T) and resistivity ρ(T) measurements carried out at different magnetic fields.
本文报道了在四弧炉中,用Czochralski法生长非中心对称材料YCoC2的单晶。该化合物属于稀土过渡金属碳化物家族,其成员表现出广泛的有趣现象,包括拓扑半金属行为。我们研究了YCoC2的磁性和输运性质。电阻率测量结果显示在4 <; T <; 300 K的温度范围内具有典型的金属行为。在T = 3.9(1) K时,磁化率和电阻率测量值都发生了转变。在不同磁场下进行的温度相关磁化强度M(T)和电阻率ρ(T)测量详细探讨了这一特征。
{"title":"Single crystal growth, study of magnetic and transport properties in the noncentrosymmetric material YCoC2","authors":"Debajani Rout , R. Kulkarni , A. Thamizhavel , Santosh Kumar","doi":"10.1016/j.jcrysgro.2025.128343","DOIUrl":"10.1016/j.jcrysgro.2025.128343","url":null,"abstract":"<div><div>We report the growth of single crystals of the non-centrosymmetric material YCoC<sub>2</sub> by the Czochralski technique using a tetra arc furnace. This compound belongs to the family of rare-earth transition-metal carbides, the members of which exhibit a wide range of interesting phenomena including topological semimetallic behaviour. We have investigated the magnetic and transport properties of YCoC<sub>2</sub>. The results of resistivity measurements revealed a typical metallic behaviour across the temperature range, 4 < <em>T</em> < 300 K. At <em>T</em> = 3<em>.</em>9(1) K, a transition in both magnetization and resistivity measurements has been observed. This feature has been explored in detail with the temperature-dependent magnetization <em>M</em>(<em>T</em>) and resistivity <em>ρ</em>(<em>T</em>) measurements carried out at different magnetic fields.</div></div>","PeriodicalId":353,"journal":{"name":"Journal of Crystal Growth","volume":"671 ","pages":"Article 128343"},"PeriodicalIF":2.0,"publicationDate":"2025-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145326238","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-10-12DOI: 10.1016/j.jcrysgro.2025.128366
Ya Li , Jing Liang , Yucong Lin , Yu Lu , Zhifeng Wang , Houfu Dai , Jian Li
Zinc oxide (ZnO) films hold significant value in the field of optoelectronic devices due to their exceptional properties as wide bandgap semiconductors. Although Metal-Organic Chemical Vapor Deposition (MOCVD) technology enables the production of high-quality thin film epitaxy, its industrial application continues to encounter persistent challenges related to inadequate deposition uniformity and efficiency. In this research, we employed a novel vertical reaction chamber ZnO-MOCVD device to systematically investigate the synergistic mechanisms governing multiple parameters—including MO source, O source, Ar carrier gas flow rate, and observation window flow rate—through multi-physics coupled numerical simulations and orthogonal experimental design. The results demonstrate that precisely adjusting the O source flow velocity effectively mitigates vortex phenomena within the turntable, thereby stabilizing the laminar flow state. Increasing the inlet flow rate suppresses the thermal buoyancy effect and reduces the risk of gas-phase pre-reaction. The synergistic regulation of MO and O flow velocities significantly enhances the uniformity of diethyl zinc (DEZn) and oxygen (O2) distribution. Orthogonal analysis successfully identified the optimal combination of process parameters, resulting in an exceptional deposition rate (0.2049 μm/h) and a coefficient of variation (4 %), thereby fully validating the effectiveness of the multi-parameter collaborative optimization strategy. This research provides an important theoretical foundation for MOCVD equipment process design and offers crucial guidance for advancing the industrial preparation of high-performance ZnO films.
{"title":"Research on MOCVD structure design and process parameters based on CFD numerical simulation","authors":"Ya Li , Jing Liang , Yucong Lin , Yu Lu , Zhifeng Wang , Houfu Dai , Jian Li","doi":"10.1016/j.jcrysgro.2025.128366","DOIUrl":"10.1016/j.jcrysgro.2025.128366","url":null,"abstract":"<div><div>Zinc oxide (ZnO) films hold significant value in the field of optoelectronic devices due to their exceptional properties as wide bandgap semiconductors. Although Metal-Organic Chemical Vapor Deposition (MOCVD) technology enables the production of high-quality thin film epitaxy, its industrial application continues to encounter persistent challenges related to inadequate deposition uniformity and efficiency. In this research, we employed a novel vertical reaction chamber ZnO-MOCVD device to systematically investigate the synergistic mechanisms governing multiple parameters—including MO source, O source, Ar carrier gas flow rate, and observation window flow rate—through multi-physics coupled numerical simulations and orthogonal experimental design. The results demonstrate that precisely adjusting the O source flow velocity effectively mitigates vortex phenomena within the turntable, thereby stabilizing the laminar flow state. Increasing the inlet flow rate suppresses the thermal buoyancy effect and reduces the risk of gas-phase pre-reaction. The synergistic regulation of MO and O flow velocities significantly enhances the uniformity of diethyl zinc (DEZn) and oxygen (O<sub>2</sub>) distribution. Orthogonal analysis successfully identified the optimal combination of process parameters, resulting in an exceptional deposition rate (0.2049 μm/h) and a coefficient of variation (4 %), thereby fully validating the effectiveness of the multi-parameter collaborative optimization strategy. This research provides an important theoretical foundation for MOCVD equipment process design and offers crucial guidance for advancing the industrial preparation of high-performance ZnO films.</div></div>","PeriodicalId":353,"journal":{"name":"Journal of Crystal Growth","volume":"671 ","pages":"Article 128366"},"PeriodicalIF":2.0,"publicationDate":"2025-10-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145326235","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-10-11DOI: 10.1016/j.jcrysgro.2025.128356
Yisong Yang , Sha Chen , Zhishun Wei , Ying Chang , Yan Xiong , Junxiang Zhao , Hu Zhu , Min Li , Qirui Yang , Guoqiang Yi
This study proposes a method involving stirring after a constant-temperature water bath in a salt solution to enhance the crystal size, overall homogeneity, and hydration strength of α-hemihydrate gypsum (α-HH). Utilizing by-product gypsum from the chlor-alkali industry as raw material, the influence of Mg2+ ions on phase evolution and final morphology was systematically investigated. During the constant-temperature water bath process in salt solution, the neutral MgSO40 ion pairs formed by Mg2+ and SO42- facilitated the dissolution of dihydrate gypsum (DH) while amplifying the solubility difference between α-HH and DH, thereby promoting preferential crystallization and precipitation of α-HH. Furthermore, Mg2+ inhibited crystal growth along the c-axis direction during α-HH development, effectively reducing the aspect ratio. The subsequent stirring process significantly increased secondary nucleation probability, enabling mutual adhesion among α-HH crystals of varying dimensions. This synergistic process ultimately yielded enlarged α-HH crystals with an average particle size of 143.21 μm and aspect ratio of 5.57. The flexural strength and absolute dry compressive strength of bulk samples prepared from these α-HH crystals are discussed in detail, demonstrating substantial improvements in mechanical properties compared to conventional preparation methods.
{"title":"Growth of large-sized α-HH via Mg2+-involved atmospheric salt bath-stirring strategy: crystallization mechanism and enhanced mechanical properties","authors":"Yisong Yang , Sha Chen , Zhishun Wei , Ying Chang , Yan Xiong , Junxiang Zhao , Hu Zhu , Min Li , Qirui Yang , Guoqiang Yi","doi":"10.1016/j.jcrysgro.2025.128356","DOIUrl":"10.1016/j.jcrysgro.2025.128356","url":null,"abstract":"<div><div>This study proposes a method involving stirring after a constant-temperature water bath in a salt solution to enhance the crystal size, overall homogeneity, and hydration strength of α-hemihydrate gypsum (α-HH). Utilizing by-product gypsum from the chlor-alkali industry as raw material, the influence of Mg<sup>2+</sup> ions on phase evolution and final morphology was systematically investigated. During the constant-temperature water bath process in salt solution, the neutral MgSO<sub>4</sub><sup>0</sup> ion pairs formed by Mg<sup>2+</sup> and SO<sub>4</sub><sup>2-</sup> facilitated the dissolution of dihydrate gypsum (DH) while amplifying the solubility difference between α-HH and DH, thereby promoting preferential crystallization and precipitation of α-HH. Furthermore, Mg<sup>2+</sup> inhibited crystal growth along the c-axis direction during α-HH development, effectively reducing the aspect ratio. The subsequent stirring process significantly increased secondary nucleation probability, enabling mutual adhesion among α-HH crystals of varying dimensions. This synergistic process ultimately yielded enlarged α-HH crystals with an average particle size of 143.21 μm and aspect ratio of 5.57. The flexural strength and absolute dry compressive strength of bulk samples prepared from these α-HH crystals are discussed in detail, demonstrating substantial improvements in mechanical properties compared to conventional preparation methods.</div></div>","PeriodicalId":353,"journal":{"name":"Journal of Crystal Growth","volume":"671 ","pages":"Article 128356"},"PeriodicalIF":2.0,"publicationDate":"2025-10-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145326233","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-10-04DOI: 10.1016/j.jcrysgro.2025.128348
Jian Li , Yaxin Zhao , Xuan Wang , Chunyu Ma , Shuang Zhao , Hongsheng Liu , Karpinski Dzmitry , Fuwen Qin
The low-temperature growth of β-Ga2O3 thin films on FTO/glass substrates was achieved using ECR-PEMOCVD with TMGa and O2 as precursors, and their structural, optical, and electrical properties were systematically investigated. XRD results reveal a clear evolution in crystallinity: as the substrate temperature increased from 350 °C to 500 °C and the discharge pressure decreased from 2.0 Pa to 0.5 Pa, the β-Ga2O3 films transitioned from amorphous to polycrystalline, eventually exhibiting strong (110) preferred orientation. XPS analysis confirmed the n-type conductivity of the films. A vertical metal–semiconductor–metal (MSM) Schottky diode based on Ni/n-type β-Ga2O3/FTO demonstrated a high rectification ratio of 1.57 × 103 at ± 4 V, a Schottky barrier height of 0.8–0.9 eV, and a carrier concentration of approximately 2 × 1016 cm−3. These results suggest that ECR-PEMOCVD is a promising approach for the low-temperature deposition of β-Ga2O3 thin films, with great potential for vertical device applications under limited thermal budgets.
{"title":"Low-temperature ECR-PEMOCVD growth of β-Ga2O3 thin films on FTO/glass for potential vertical Schottky diode applications","authors":"Jian Li , Yaxin Zhao , Xuan Wang , Chunyu Ma , Shuang Zhao , Hongsheng Liu , Karpinski Dzmitry , Fuwen Qin","doi":"10.1016/j.jcrysgro.2025.128348","DOIUrl":"10.1016/j.jcrysgro.2025.128348","url":null,"abstract":"<div><div>The low-temperature growth of β-Ga<sub>2</sub>O<sub>3</sub> thin films on FTO/glass substrates was achieved using ECR-PEMOCVD with TMGa and O<sub>2</sub> as precursors, and their structural, optical, and electrical properties were systematically investigated. XRD results reveal a clear evolution in crystallinity: as the substrate temperature increased from 350 °C to 500 °C and the discharge pressure decreased from 2.0 Pa to 0.5 Pa, the β-Ga<sub>2</sub>O<sub>3</sub> films transitioned from amorphous to polycrystalline, eventually exhibiting strong (110) preferred orientation. XPS analysis confirmed the n-type conductivity of the films. A vertical metal–semiconductor–metal (MSM) Schottky diode based on Ni/n-type β-Ga<sub>2</sub>O<sub>3</sub>/FTO demonstrated a high rectification ratio of 1.57 × 10<sup>3</sup> at ± 4 V, a Schottky barrier height of 0.8–0.9 eV, and a carrier concentration of approximately 2 × 10<sup>16</sup> cm<sup>−3</sup>. These results suggest that ECR-PEMOCVD is a promising approach for the low-temperature deposition of β-Ga<sub>2</sub>O<sub>3</sub> thin films, with great potential for vertical device applications under limited thermal budgets.</div></div>","PeriodicalId":353,"journal":{"name":"Journal of Crystal Growth","volume":"671 ","pages":"Article 128348"},"PeriodicalIF":2.0,"publicationDate":"2025-10-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145264435","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-10-03DOI: 10.1016/j.jcrysgro.2025.128354
D. Sasireka , N. Kavitha , T.Sathis Kumar , L.Bruno Chandrasekar
A novel dysprosium-doped zirconium ferrite was prepared by the chemical precipitation method. The doping concentration of dysprosium was set at 0 %, 2 %, and 4 %. The structural properties, such as crystalline size and strain, were examined. The doping tuned the morphology of the nanoparticles. The band gap of the material decreases as the doping of dysprosium increases. The degradation of methylene blue was examined under natural sunlight and 93.2 % degradation efficiency was achieved at 120 min. The doping enhances the degradation efficiency using the zirconium ferrite catalyst. The electrochemical properties of the prepared nanoparticles as electrodes in a supercapacitor were studied using cyclic voltammetry and the galvanostatic charge–discharge technique. The maximum specific capacitance of ∼ 375F/g was observed at the scan rate of 5 mV/s.
{"title":"Effect of dysprosium concentration on the photocatalytic and electrochemical properties of zirconium ferrite nanoparticles","authors":"D. Sasireka , N. Kavitha , T.Sathis Kumar , L.Bruno Chandrasekar","doi":"10.1016/j.jcrysgro.2025.128354","DOIUrl":"10.1016/j.jcrysgro.2025.128354","url":null,"abstract":"<div><div>A novel dysprosium-doped zirconium ferrite was prepared by the chemical precipitation method. The doping concentration of dysprosium was set at 0 %, 2 %, and 4 %. The structural properties, such as crystalline size and strain, were examined. The doping tuned the morphology of the nanoparticles. The band gap of the material decreases as the doping of dysprosium increases. The degradation of methylene blue was examined under natural sunlight and 93.2 % degradation efficiency was achieved at 120 min. The doping enhances the degradation efficiency using the zirconium ferrite catalyst. The electrochemical properties of the prepared nanoparticles as electrodes in a supercapacitor were studied using cyclic voltammetry and the galvanostatic charge–discharge technique. The maximum specific capacitance of ∼ 375F/g was observed at the scan rate of 5 mV/s.</div></div>","PeriodicalId":353,"journal":{"name":"Journal of Crystal Growth","volume":"671 ","pages":"Article 128354"},"PeriodicalIF":2.0,"publicationDate":"2025-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145264436","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The nucleation behaviour of d-mannitol polymorph which is influenced by supersaturation was scrutinized by swift cooling crystallization process in pure aqueous solution. During swift cooling, concentration of d-mannitol in the solution creates different level of relative supersaturation leads to substantial differences in induction time, nucleation and morphology of the resultant polymorphs. This technique is employed to generate wide range of relative supersaturation (0.159 < σ < 3.860) corresponds to the rapid decrease in the temperature from 55 °C to shifting temperature of 54–1 °C. Specifically, lower level of relative supersaturation promotes the stable form I polymorph, while the nucleation of form I and form II polymorph is flavoured in intermediate level. Conversely, higher level of relative supersaturation induces the formation of only metastable form II polymorph. In-situ optical microscopy was employed to analysis the morphology of the nucleated polymorphs. Further characterization was done to validate the internal structure and thermal stability of the grown polymorphs through powder X-ray diffraction (PXRD) and differential scanning calorimetry (DSC) analyses. Rietveld refinement was employed to confirm the structures of both polymorphs, supporting a reliable interpretation of the PXRD results. This work shows a key advantage in understanding the crystallization behaviour which can be employed for the nucleation of d-mannitol polymorphs without any external additives within the solution.
{"title":"Enhanced separation of d-mannitol polymorphs I and II via nucleation control in swift cooling crystallization","authors":"Lavanisadevi Subiramaniyam, Srinivasan Karuppannan","doi":"10.1016/j.jcrysgro.2025.128353","DOIUrl":"10.1016/j.jcrysgro.2025.128353","url":null,"abstract":"<div><div>The nucleation behaviour of <span>d</span>-mannitol polymorph which is influenced by supersaturation was scrutinized by swift cooling crystallization process in pure aqueous solution. During swift cooling, concentration of <span>d</span>-mannitol in the solution creates different level of relative supersaturation leads to substantial differences in induction time, nucleation and morphology of the resultant polymorphs. This technique is employed to generate wide range of relative supersaturation (0.159 < σ < 3.860) corresponds to the rapid decrease in the temperature from 55 °C to shifting temperature of 54–1 °C. Specifically, lower level of relative supersaturation promotes the stable form I polymorph, while the nucleation of form I and form II polymorph is flavoured in intermediate level. Conversely, higher level of relative supersaturation induces the formation of only metastable form II polymorph. In-situ optical microscopy was employed to analysis the morphology of the nucleated polymorphs. Further characterization was done to validate the internal structure and thermal stability of the grown polymorphs through powder X-ray diffraction (PXRD) and differential scanning calorimetry (DSC) analyses. Rietveld refinement was employed to confirm the structures of both polymorphs, supporting a reliable interpretation of the PXRD results. This work shows a key advantage in understanding the crystallization behaviour which can be employed for the nucleation of <span>d</span>-mannitol polymorphs without any external additives within the solution.</div></div>","PeriodicalId":353,"journal":{"name":"Journal of Crystal Growth","volume":"671 ","pages":"Article 128353"},"PeriodicalIF":2.0,"publicationDate":"2025-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145236159","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-10-01DOI: 10.1016/j.jcrysgro.2025.128351
Alexey S.T. Rybakov, Vu Anton Lie, Louis Mirecki, Jörg August Becker
Rutile GeO2 nanoneedles were grown using a method involving eutectics of the Ge-GeO2 system and chemical transport reactions. The synthesis was carried out at 1095–1215 K in a miniature cell, which is evacuated and sealed, enclosing all products that are generated in reactions. In this cell, one can observe the processes throughout all stages of the method in situ via video microscopy. Differences in the process development depending on the heating time and mass ratio of reagents were revealed. Depending on the latter condition, two ways for growing nanoneedles have been proposed. The needles and other reaction products were studied ex situ using SEM, dark-field and bright-field TEM, HRTEM, SAED, EDX and Raman spectroscopy. The nanoneedles are single crystals without any amorphous surface layer. They are rutile GeO2 and belong to the tetragonal crystal system. Their longitudinal growth direction is . The spacings between lattice planes in the longitudinal and lateral directions are found to be 2.8 Å and 3.2 Å respectively. At higher temperatures, larger micrometre-sized crystals of rutile GeO2 with various morphologies are formed.
{"title":"Growth of rutile GeO2 nanoneedles supported by in situ microscopy","authors":"Alexey S.T. Rybakov, Vu Anton Lie, Louis Mirecki, Jörg August Becker","doi":"10.1016/j.jcrysgro.2025.128351","DOIUrl":"10.1016/j.jcrysgro.2025.128351","url":null,"abstract":"<div><div>Rutile GeO<sub>2</sub> nanoneedles were grown using a method involving eutectics of the Ge-GeO<sub>2</sub> system and chemical transport reactions. The synthesis was carried out at 1095–1215 K in a miniature cell, which is evacuated and sealed, enclosing all products that are generated in reactions. In this cell, one can observe the processes throughout all stages of the method in situ via video microscopy. Differences in the process development depending on the heating time and mass ratio of reagents were revealed. Depending on the latter condition, two ways for growing nanoneedles have been proposed. The needles and other reaction products were studied ex situ using SEM, dark-field and bright-field TEM, HRTEM, SAED, EDX and Raman spectroscopy. The nanoneedles are single crystals without any amorphous surface layer. They are rutile GeO<sub>2</sub> and belong to the tetragonal crystal system. Their longitudinal growth direction is <span><math><mrow><mfenced><mrow><mn>001</mn></mrow></mfenced></mrow></math></span>. The spacings between lattice planes in the longitudinal and lateral directions are found to be 2.8 Å and 3.2 Å respectively. At higher temperatures, larger micrometre-sized crystals of rutile GeO<sub>2</sub> with various morphologies are formed.</div></div>","PeriodicalId":353,"journal":{"name":"Journal of Crystal Growth","volume":"671 ","pages":"Article 128351"},"PeriodicalIF":2.0,"publicationDate":"2025-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145236183","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}