Pub Date : 2014-01-01DOI: 10.3788/GXJS20144002.0176
蒋文娟 Jiang Wenjuan, 刘经天 Liu Jingtian, 郝东山 Hao Dongshan
By using the model of the multi-photon nonlinear Compton scattering,the influences of Compton scattering on the dielectric constant to the dispersive of one-dimensional plasma photonic crystals are studied,the dispersive relations of the one-dimensional plasma photonic crystals are given out under the influence on Compton scattering to dielectric constant,and the dispersive relations are simulated by using numbers.The results show that than before the Compton scattering,when the dielectric constante=1,the band gap can not be taken place;whene3,the first band gap width is slowly increased,then it is come a maximum number,and finally it is slowly decreased;the second band gap width is firstly slowly increased,then it is come saturation number 0.69,0.03is decreased than before the scattering.The critical numbereof the two band gaps is 5.4,and 0.6is decreased than before the scattering.Whene5.4,the first band gap width is clearly bigger than the second band gap width,and 0.04is decreased than before the scattering;whene5.4,the second band gap width is bigger than the first band gap width,and their difference number is clearly decreased than before the scattering;the cut-off frequency and the boundary frequency of the second band gap are faster moved to low frequency direction,and the changed extent of the boundary frequency of the second band gap is the clear big than the cut-off frequency.
{"title":"Influence on dielectric constant to the dispersive of plasma photonic crystals","authors":"蒋文娟 Jiang Wenjuan, 刘经天 Liu Jingtian, 郝东山 Hao Dongshan","doi":"10.3788/GXJS20144002.0176","DOIUrl":"https://doi.org/10.3788/GXJS20144002.0176","url":null,"abstract":"By using the model of the multi-photon nonlinear Compton scattering,the influences of Compton scattering on the dielectric constant to the dispersive of one-dimensional plasma photonic crystals are studied,the dispersive relations of the one-dimensional plasma photonic crystals are given out under the influence on Compton scattering to dielectric constant,and the dispersive relations are simulated by using numbers.The results show that than before the Compton scattering,when the dielectric constante=1,the band gap can not be taken place;whene3,the first band gap width is slowly increased,then it is come a maximum number,and finally it is slowly decreased;the second band gap width is firstly slowly increased,then it is come saturation number 0.69,0.03is decreased than before the scattering.The critical numbereof the two band gaps is 5.4,and 0.6is decreased than before the scattering.Whene5.4,the first band gap width is clearly bigger than the second band gap width,and 0.04is decreased than before the scattering;whene5.4,the second band gap width is bigger than the first band gap width,and their difference number is clearly decreased than before the scattering;the cut-off frequency and the boundary frequency of the second band gap are faster moved to low frequency direction,and the changed extent of the boundary frequency of the second band gap is the clear big than the cut-off frequency.","PeriodicalId":35591,"journal":{"name":"Guangxue Jishu/Optical Technique","volume":"40 1","pages":"176-179"},"PeriodicalIF":0.0,"publicationDate":"2014-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"70263551","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-01-01DOI: 10.3788/GXJS20144004.0302
冯新康 Feng Xinkang, 徐中民 Xu Zhong-min, 张翼飞 Zhang Yifei, 杨铁莹 Yang Tieying, 王. W. Jie, 王纳秀 Wang Na-xiu
As a good diffracted component,single-crystal silicon is commonly used in monochromators of beamline stations in synchrotron radiation facilities.It is significant to find methods to reduce the residual strain during the manufacturing process.The orientation theory is introduced and a reciprocating wire saw machine with diamond is used to manufacture a diffracted single-crystal silicon.Roughness and surface shape of the processing surface are tested and its rocking curve is measured in BL14Bstation at SSRF.The result shows that the data meet the design requirements.
{"title":"Study on manufacturing a single-crystal silicon monochromator using wire saw machine","authors":"冯新康 Feng Xinkang, 徐中民 Xu Zhong-min, 张翼飞 Zhang Yifei, 杨铁莹 Yang Tieying, 王. W. Jie, 王纳秀 Wang Na-xiu","doi":"10.3788/GXJS20144004.0302","DOIUrl":"https://doi.org/10.3788/GXJS20144004.0302","url":null,"abstract":"As a good diffracted component,single-crystal silicon is commonly used in monochromators of beamline stations in synchrotron radiation facilities.It is significant to find methods to reduce the residual strain during the manufacturing process.The orientation theory is introduced and a reciprocating wire saw machine with diamond is used to manufacture a diffracted single-crystal silicon.Roughness and surface shape of the processing surface are tested and its rocking curve is measured in BL14Bstation at SSRF.The result shows that the data meet the design requirements.","PeriodicalId":35591,"journal":{"name":"Guangxue Jishu/Optical Technique","volume":"40 1","pages":"302-306"},"PeriodicalIF":0.0,"publicationDate":"2014-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"70264831","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-01-01DOI: 10.3788/GXJS20144004.0307
杨利伟 Yang Li-wei, 李志来 Li Zhilai, 薛栋林 Xue Donglin
In the field of space remote sensing,adhesive bonding technology for mounting optical components is increasingly favored by opto-mechanical engineers.In contrast to mechanical methods,adhesive bonding method usually results in lighter weight,lower costs and easier assembly.Most structural adhesives will shrink during curing process,the shrinkage may cause internal stress,which will lead to deformation of optical surfaces,and affect the imaging quality.To simulate this process using finite element analysis(FEA),a concept of equivalent linear expansion is proposed.In this method,the linear shrinkage of structural adhesive is equivalent to the coefficient of linear expansion,so the shrink of the adhesive during curing can be thought of a process of contraction resulted from drop of temperature while doing thermal elastic analysis.Analysis results show that:with circular bonding,the smaller the bonding area is,the lower the error of mirror surface is,the farther the bonding location is,the lower the error of mirror surface is.Experiments are conducted to verify the analysis,and the results show that:1)The variable quantify of surface figure error is 0.64~1.10λPV while the distance between centroid of bonding layer and mirror surface is 20.5mm and the width of bonding layer is 15 ~25mm;2)The variable quantify of surface figure error is 1.08~0.40λPV while the width is 15mm and the distance is15.5~25.5mm;3)The variable quantify of surface figure error is 0.38~0.88λPV while the distance is 25.5mm,the width is 25mm,and circular distribution angle of bonding layer is 40°~80°.The method proposed here and the results of analysis and experiments may guide the engineering design of mirrors.
{"title":"Analysis and test for effect of structural adhesive shrinkage during curing on mirror surface","authors":"杨利伟 Yang Li-wei, 李志来 Li Zhilai, 薛栋林 Xue Donglin","doi":"10.3788/GXJS20144004.0307","DOIUrl":"https://doi.org/10.3788/GXJS20144004.0307","url":null,"abstract":"In the field of space remote sensing,adhesive bonding technology for mounting optical components is increasingly favored by opto-mechanical engineers.In contrast to mechanical methods,adhesive bonding method usually results in lighter weight,lower costs and easier assembly.Most structural adhesives will shrink during curing process,the shrinkage may cause internal stress,which will lead to deformation of optical surfaces,and affect the imaging quality.To simulate this process using finite element analysis(FEA),a concept of equivalent linear expansion is proposed.In this method,the linear shrinkage of structural adhesive is equivalent to the coefficient of linear expansion,so the shrink of the adhesive during curing can be thought of a process of contraction resulted from drop of temperature while doing thermal elastic analysis.Analysis results show that:with circular bonding,the smaller the bonding area is,the lower the error of mirror surface is,the farther the bonding location is,the lower the error of mirror surface is.Experiments are conducted to verify the analysis,and the results show that:1)The variable quantify of surface figure error is 0.64~1.10λPV while the distance between centroid of bonding layer and mirror surface is 20.5mm and the width of bonding layer is 15 ~25mm;2)The variable quantify of surface figure error is 1.08~0.40λPV while the width is 15mm and the distance is15.5~25.5mm;3)The variable quantify of surface figure error is 0.38~0.88λPV while the distance is 25.5mm,the width is 25mm,and circular distribution angle of bonding layer is 40°~80°.The method proposed here and the results of analysis and experiments may guide the engineering design of mirrors.","PeriodicalId":35591,"journal":{"name":"Guangxue Jishu/Optical Technique","volume":"40 1","pages":"307-312"},"PeriodicalIF":0.0,"publicationDate":"2014-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"70264960","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-01-01DOI: 10.3788/GXJS20144005.0445
赵明强 Zhao Mingqiang, 张国玉 Zhang Guoyu, 张. Z. Jian, 孙高飞 Sun Gao-fei, 陈启梦 Chen Qimeng
A single star simulator with closed-loop control is designed to adapt to the development of space technology and higher technical requirements.The working principle of single star simulator is introduced.Light energy of single star simulator is analyzed.The selection of light sources and related components,the design of closed loop control system and the star simulator magnitude are realized.The star simulator can realize simulation of magnitude-2~+6magnitude.Stability error is less than the corresponding magnitude of illuminance of±10%.Test results show that the single star simulator is stable and reliable and flexible adjustment.It can satisfy the single star simulator design requirements.
{"title":"The research of magnitude control for light source based on single star simulator","authors":"赵明强 Zhao Mingqiang, 张国玉 Zhang Guoyu, 张. Z. Jian, 孙高飞 Sun Gao-fei, 陈启梦 Chen Qimeng","doi":"10.3788/GXJS20144005.0445","DOIUrl":"https://doi.org/10.3788/GXJS20144005.0445","url":null,"abstract":"A single star simulator with closed-loop control is designed to adapt to the development of space technology and higher technical requirements.The working principle of single star simulator is introduced.Light energy of single star simulator is analyzed.The selection of light sources and related components,the design of closed loop control system and the star simulator magnitude are realized.The star simulator can realize simulation of magnitude-2~+6magnitude.Stability error is less than the corresponding magnitude of illuminance of±10%.Test results show that the single star simulator is stable and reliable and flexible adjustment.It can satisfy the single star simulator design requirements.","PeriodicalId":35591,"journal":{"name":"Guangxue Jishu/Optical Technique","volume":"40 1","pages":"445-449"},"PeriodicalIF":0.0,"publicationDate":"2014-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"70265720","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-01-01DOI: 10.3788/gxjs20144006.0515
Hu Huiyin
Sampling interval required for traditional sampling is small,when the signal is too long,the sample volume is increased,the more time is consumed,the more storage space is taken up.A improved orthogonal matching pursuit(OMP)algorithm based on atomic matching criterion of Dice coefficient(DOMP)is used to reconstruct images based on Daubechies wavelet transform base as sparse transform base and Gaussian random matrices as measurement matrices.In the atomic matching of DOMP algorithm the arithmetic mean is introduced to replace the geometric mean,the role of an important component in the vector is more prominent using of Dice measurement,so it enables more accurately to pick out the best match with the residual vector atoms from the dictionary.The experiment results show that the reconstruction error of images has great improvements under the same number of measurement values.The quality of the reconstructive image is improved about 2%,the probability of the reconstructive image is improved about 7%,this algorithm has higher application value.
{"title":"Image fast reconstruction algorithm based on improved orthogonal matching pursuit","authors":"Hu Huiyin","doi":"10.3788/gxjs20144006.0515","DOIUrl":"https://doi.org/10.3788/gxjs20144006.0515","url":null,"abstract":"Sampling interval required for traditional sampling is small,when the signal is too long,the sample volume is increased,the more time is consumed,the more storage space is taken up.A improved orthogonal matching pursuit(OMP)algorithm based on atomic matching criterion of Dice coefficient(DOMP)is used to reconstruct images based on Daubechies wavelet transform base as sparse transform base and Gaussian random matrices as measurement matrices.In the atomic matching of DOMP algorithm the arithmetic mean is introduced to replace the geometric mean,the role of an important component in the vector is more prominent using of Dice measurement,so it enables more accurately to pick out the best match with the residual vector atoms from the dictionary.The experiment results show that the reconstruction error of images has great improvements under the same number of measurement values.The quality of the reconstructive image is improved about 2%,the probability of the reconstructive image is improved about 7%,this algorithm has higher application value.","PeriodicalId":35591,"journal":{"name":"Guangxue Jishu/Optical Technique","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2014-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"70266256","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-01-01DOI: 10.3788/GXJS20144006.0520
吴俊峰 Wu Junfeng, 刘志刚 Liu Zhigang, 刘力力 Liu Lili, 刘永梅 Liu Yongmei, 严红红 Yan Honghong
In order to ensure that the Large Sky Area Multi-Object Fiber Spectroscopy Telescope(LAMOST)system can run accurately,it is necessary to measure the position of optical fibers on the focal plate of LAMOST.It is needed to match on the position of light spot extracted by front illuminate with the actual positions of units.During the study of position matching,a new pattern(the minimum matching method)based on the old one and more appropriate to front illuminate method is presented.With the new method,problems found in matching of front illuminate method,such as excessive amounts of light spots,random location,complicated calculations,are solved effectively.
{"title":"Research on position matching of LAMOST fiber units","authors":"吴俊峰 Wu Junfeng, 刘志刚 Liu Zhigang, 刘力力 Liu Lili, 刘永梅 Liu Yongmei, 严红红 Yan Honghong","doi":"10.3788/GXJS20144006.0520","DOIUrl":"https://doi.org/10.3788/GXJS20144006.0520","url":null,"abstract":"In order to ensure that the Large Sky Area Multi-Object Fiber Spectroscopy Telescope(LAMOST)system can run accurately,it is necessary to measure the position of optical fibers on the focal plate of LAMOST.It is needed to match on the position of light spot extracted by front illuminate with the actual positions of units.During the study of position matching,a new pattern(the minimum matching method)based on the old one and more appropriate to front illuminate method is presented.With the new method,problems found in matching of front illuminate method,such as excessive amounts of light spots,random location,complicated calculations,are solved effectively.","PeriodicalId":35591,"journal":{"name":"Guangxue Jishu/Optical Technique","volume":"40 1","pages":"520-523"},"PeriodicalIF":0.0,"publicationDate":"2014-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"70266264","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-01-01DOI: 10.3788/GXJS20144006.0543
郑芳兰 Zheng Fanglan, 刘. L. Yong, 刘. L. Xu, 马科 Ma Ke, 冯晓璇 Feng Xiaoxuan, 马玉荣 Ma Yurong, 任寰 Ren Huan, 杨一 Yang Yi, 姜宏振 Jiang Hongzhen, 原泉 Yuan Quan, 石振东 Shi Zhendong, 马骅 Ma Hua
When measuring transmit wavefront of parallel plate,sometimes there are spurious fringes in the interferogram which can introduce error into the measurement result.The cause of spurious fringes is analyzed,and the effect to transmit wavefront error is emulated.The adjust method to remove spurious fringes is introduced.The transmit wavefront before and after remove spurious fringes is measured respectively on a parallel plate.By comparing the results,this method can reduce the affect of spurious fringes availability and make the measuring result more truthful.
{"title":"Cause and remove method of spurious fringes in measuring transmit wavefront","authors":"郑芳兰 Zheng Fanglan, 刘. L. Yong, 刘. L. Xu, 马科 Ma Ke, 冯晓璇 Feng Xiaoxuan, 马玉荣 Ma Yurong, 任寰 Ren Huan, 杨一 Yang Yi, 姜宏振 Jiang Hongzhen, 原泉 Yuan Quan, 石振东 Shi Zhendong, 马骅 Ma Hua","doi":"10.3788/GXJS20144006.0543","DOIUrl":"https://doi.org/10.3788/GXJS20144006.0543","url":null,"abstract":"When measuring transmit wavefront of parallel plate,sometimes there are spurious fringes in the interferogram which can introduce error into the measurement result.The cause of spurious fringes is analyzed,and the effect to transmit wavefront error is emulated.The adjust method to remove spurious fringes is introduced.The transmit wavefront before and after remove spurious fringes is measured respectively on a parallel plate.By comparing the results,this method can reduce the affect of spurious fringes availability and make the measuring result more truthful.","PeriodicalId":35591,"journal":{"name":"Guangxue Jishu/Optical Technique","volume":"40 1","pages":"543-546"},"PeriodicalIF":0.0,"publicationDate":"2014-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"70266348","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Autofocus is the key technology for automated microscopy.The velocity and accuracy of microscopy is dependent on autofocus methods.There are two types of autofocus technology,the passive type and the active type.The passive type is based on the digital image and the active one is based on the optical defocus error detection.By comparison the principles and development of the two types,it can be concluded that the active type based on the defocus error detection is more fast and accurate,which is more suitable for the automated microscopy.
{"title":"Research survey on microscopy autofocus methods","authors":"田畔 Tian Pan, 谷朝臣 Gu Chao-chen, 胡洁 Hu Jie, 吴开杰 Wu Kai-jie, 彭颖红 Peng Yinghong","doi":"10.3788/GXJS20144001.0084","DOIUrl":"https://doi.org/10.3788/GXJS20144001.0084","url":null,"abstract":"Autofocus is the key technology for automated microscopy.The velocity and accuracy of microscopy is dependent on autofocus methods.There are two types of autofocus technology,the passive type and the active type.The passive type is based on the digital image and the active one is based on the optical defocus error detection.By comparison the principles and development of the two types,it can be concluded that the active type based on the defocus error detection is more fast and accurate,which is more suitable for the automated microscopy.","PeriodicalId":35591,"journal":{"name":"Guangxue Jishu/Optical Technique","volume":"40 1","pages":"84-88"},"PeriodicalIF":0.0,"publicationDate":"2014-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"70262326","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-01-01DOI: 10.3788/GXJS20144001.0016
于向飞 Yu Xiangfei, 杨. Y. Hui, 杨海马 Yang Haima, 郑. Z. Gang, 胡恒庆 Hu Hengqing, 李. L. Jun, M. Biggs, 宋磊磊 Song Leilei
During the measurement of the ultrafine nanoparticles' s size with the method of PCS(Photon Correlation Spectroscopy),the fitting results are always susceptible to the noise and have quite large errors.To solve the problem, the filtering algorithm of photon correlation spectroscopy based on singular value decomposition is proposed.Its procedure is:the Hankel matrix H with the intensity autocorrelation data is constructed;the singular value decomposition of His calculated;the reconstruction parameters r with the singular value of H are determined;the filtered light intensity autocorrelation data from the reconstruction matrix H1 are extrac-ted,and fitting with the traditional method,and then the particle size distribution is obtained.The experiment is carried out in two different particle dispersions,one is 30nm standard monodisperse latex particle dispersion,and another is 30nm and 100nm standard double dispersion latex particle dispersion.The results show that,the filtering algorithm of photon correlation spectroscopy based on singular value decomposition can improve the measurement accuracy effectively.
{"title":"Study on the filtering algorithm of photon correlation spectroscopy based on singular value decomposition","authors":"于向飞 Yu Xiangfei, 杨. Y. Hui, 杨海马 Yang Haima, 郑. Z. Gang, 胡恒庆 Hu Hengqing, 李. L. Jun, M. Biggs, 宋磊磊 Song Leilei","doi":"10.3788/GXJS20144001.0016","DOIUrl":"https://doi.org/10.3788/GXJS20144001.0016","url":null,"abstract":"During the measurement of the ultrafine nanoparticles' s size with the method of PCS(Photon Correlation Spectroscopy),the fitting results are always susceptible to the noise and have quite large errors.To solve the problem, the filtering algorithm of photon correlation spectroscopy based on singular value decomposition is proposed.Its procedure is:the Hankel matrix H with the intensity autocorrelation data is constructed;the singular value decomposition of His calculated;the reconstruction parameters r with the singular value of H are determined;the filtered light intensity autocorrelation data from the reconstruction matrix H1 are extrac-ted,and fitting with the traditional method,and then the particle size distribution is obtained.The experiment is carried out in two different particle dispersions,one is 30nm standard monodisperse latex particle dispersion,and another is 30nm and 100nm standard double dispersion latex particle dispersion.The results show that,the filtering algorithm of photon correlation spectroscopy based on singular value decomposition can improve the measurement accuracy effectively.","PeriodicalId":35591,"journal":{"name":"Guangxue Jishu/Optical Technique","volume":"33 1","pages":"16-20"},"PeriodicalIF":0.0,"publicationDate":"2014-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"70262419","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-01-01DOI: 10.3788/GXJS20144001.0058
徐树振 Xu Shuzhen, 田蕾 Tian Lei, 赵成均 Zhao Chengjun, 于亚红 Yu Yahong, 王. W. Tao, 李英娜 Li Yingna, 赵振刚 Zhao Zhengang, 李川 Li Chuan
Cross arm withstands more force in the tower of power system than other components,it's easy to cause the damage of the cross arm by the excessive weight of line ice,wave,or other physical factors.A model of power transmission tower with a duckbill-type cross arm is developed,four fiber Bragg gratings are mounted on the upper surface and the lower surface of main beam of duckbill-type cross arm with epoxy resin.The strain of main beams are induced by the stress of loading,which causes the wavelength shift of fiber Bragg gratings.When loading and unloading on the ends of duckbill-type cross arm,the experiment indicates that load sensitivities of four measuring gratings are respectively 6pm/ kg,2pm/kg,3pm/kg,2pm/kg,the repeatability errors are 0.7%FS,4.1%FS,1.9%FS,3.0%FS.
{"title":"Research of FBG-based duckbill-type cross arms by the strain","authors":"徐树振 Xu Shuzhen, 田蕾 Tian Lei, 赵成均 Zhao Chengjun, 于亚红 Yu Yahong, 王. W. Tao, 李英娜 Li Yingna, 赵振刚 Zhao Zhengang, 李川 Li Chuan","doi":"10.3788/GXJS20144001.0058","DOIUrl":"https://doi.org/10.3788/GXJS20144001.0058","url":null,"abstract":"Cross arm withstands more force in the tower of power system than other components,it's easy to cause the damage of the cross arm by the excessive weight of line ice,wave,or other physical factors.A model of power transmission tower with a duckbill-type cross arm is developed,four fiber Bragg gratings are mounted on the upper surface and the lower surface of main beam of duckbill-type cross arm with epoxy resin.The strain of main beams are induced by the stress of loading,which causes the wavelength shift of fiber Bragg gratings.When loading and unloading on the ends of duckbill-type cross arm,the experiment indicates that load sensitivities of four measuring gratings are respectively 6pm/ kg,2pm/kg,3pm/kg,2pm/kg,the repeatability errors are 0.7%FS,4.1%FS,1.9%FS,3.0%FS.","PeriodicalId":35591,"journal":{"name":"Guangxue Jishu/Optical Technique","volume":"40 1","pages":"58-61"},"PeriodicalIF":0.0,"publicationDate":"2014-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"70262542","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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