Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956165
J. Deng
An extremely small and inexpensively manufactured physics package for an atomic frequency standard can be provided with a microwave cavity having non-critical dimensions that is driven in a substantially TEM mode by a lumped LC structure inside a hollow, substantially closed, conducting enclosure. The enclosure can be a cylinder with rectangular or circular cross section. If this cavity is formed by modifying a coaxial cavity, the outer conductor will be the enclosure, and the inner conductor, shorted to at least one of the walls, with a gap at the other end, will be the lumped LC. The resonant frequency of the cavity is primarily determined by the capacitance of the lumped C and the inductance of the inner conductor.
{"title":"Subminiature microwave cavity for atomic frequency standards","authors":"J. Deng","doi":"10.1109/FREQ.2001.956165","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956165","url":null,"abstract":"An extremely small and inexpensively manufactured physics package for an atomic frequency standard can be provided with a microwave cavity having non-critical dimensions that is driven in a substantially TEM mode by a lumped LC structure inside a hollow, substantially closed, conducting enclosure. The enclosure can be a cylinder with rectangular or circular cross section. If this cavity is formed by modifying a coaxial cavity, the outer conductor will be the enclosure, and the inner conductor, shorted to at least one of the walls, with a gap at the other end, will be the lumped LC. The resonant frequency of the cavity is primarily determined by the capacitance of the lumped C and the inductance of the inner conductor.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125246591","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956203
J. Kosinski, R. Pastore, E. Bigler, M. D. da Cunha, D. Malocha, J. Détaint
The aim of this paper is to derive an improved set of Langasite (LGS) material constants based on BAW and SAW data in order to get a better agreement between theoretical predictions and experimental measurements for wave velocities and temperature effects. In a previous work it was shown that an "aggregate" set of the measured values of bulk wave velocities can provide a improved set of measurement data for BAW propagation. Recent advances in LGS crystal growth and measurement of material properties obtained independently from the original authors allows us to go further, one unsolved problem with previous data being inconsistencies in the temperature derivatives of material constants of LGS. This paper brings together a large quantity of experimental data obtained independently by the authors. Comparison between experiments and theoretical predictions are recomputed taking into account the more recently published data sets for LGS. In combination with a critical analysis of the literature on LGS crystals, an improvement of a "best fit" data set for velocities is proposed.
{"title":"A review of langasite material constants from BAW and SAW data: toward an improved data set","authors":"J. Kosinski, R. Pastore, E. Bigler, M. D. da Cunha, D. Malocha, J. Détaint","doi":"10.1109/FREQ.2001.956203","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956203","url":null,"abstract":"The aim of this paper is to derive an improved set of Langasite (LGS) material constants based on BAW and SAW data in order to get a better agreement between theoretical predictions and experimental measurements for wave velocities and temperature effects. In a previous work it was shown that an \"aggregate\" set of the measured values of bulk wave velocities can provide a improved set of measurement data for BAW propagation. Recent advances in LGS crystal growth and measurement of material properties obtained independently from the original authors allows us to go further, one unsolved problem with previous data being inconsistencies in the temperature derivatives of material constants of LGS. This paper brings together a large quantity of experimental data obtained independently by the authors. Comparison between experiments and theoretical predictions are recomputed taking into account the more recently published data sets for LGS. In combination with a critical analysis of the literature on LGS crystals, an improvement of a \"best fit\" data set for velocities is proposed.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127852208","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956277
K. Ikeda
This paper describes a temperature-compensation factor and a deviation factor of a new simple ultrasonic solution-concentration sensor by using the phase-locked loop method (PLLM) and the phase difference method (PDM). The deviation factor is an essential specification for designing a voltage-controlled oscillator (VCO) and a phase detector (PD). It was proved that the deviation factor obtained by the empirical equation is always the same value, regardless the center frequency (f/sub O/) of the VCO in the PLLM and the frequency of a driving oscillator (f/sub D/) for a transmitter in the PDM. The deviation factor in the 20-30/spl deg/C temperature range for 0.0-1.0% NaCl and 0.0-5.0% sugar solutions of the PLLM is 1.61/spl times/10/sup -3///spl deg/C and 1.68/spl times/10/sup -3///spl deg/C. Moreover, it has become clear that the same temperature compensation factor can be used for both the NaCl and sugar solutions deriving from their equations.
{"title":"Temperature-compensation factor and deviation factor of simple ultrasonic solution-concentration sensor","authors":"K. Ikeda","doi":"10.1109/FREQ.2001.956277","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956277","url":null,"abstract":"This paper describes a temperature-compensation factor and a deviation factor of a new simple ultrasonic solution-concentration sensor by using the phase-locked loop method (PLLM) and the phase difference method (PDM). The deviation factor is an essential specification for designing a voltage-controlled oscillator (VCO) and a phase detector (PD). It was proved that the deviation factor obtained by the empirical equation is always the same value, regardless the center frequency (f/sub O/) of the VCO in the PLLM and the frequency of a driving oscillator (f/sub D/) for a transmitter in the PDM. The deviation factor in the 20-30/spl deg/C temperature range for 0.0-1.0% NaCl and 0.0-5.0% sugar solutions of the PLLM is 1.61/spl times/10/sup -3///spl deg/C and 1.68/spl times/10/sup -3///spl deg/C. Moreover, it has become clear that the same temperature compensation factor can be used for both the NaCl and sugar solutions deriving from their equations.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"83 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127421130","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956247
H. Iwata, T. Takahashi, O. Ishii
We miniaturized a very high frequency (VHF) fundamental AT-cut resonator by flip-chip bonding that joins a turned crystal chip to a ceramic package with gold bumps. The dimensions of the new resonator are 3.8 mm long /spl times/3.8 mm wide /spl times/0.9 mm high. The capacity of the resonator is a quarter of that of a conventional resonator that uses wire bonding. Moreover, we observe high stability in the 155 MHz resonator with a vibrating area of 10 /spl mu/m thickness. The new resonator is unaffected by stress and contamination due to bonding. Therefore, in the frequency vs. temperature characteristics, hysteresis errors are less than or equal to 1 ppm in the temperature cycle ranging from -40/spl deg/C to +85/spl deg/C. In the accelerated aging characteristics at an ambient temperature of +85/spl deg/C, the frequency shift is less than 1 ppm up to 6,000 hours.
{"title":"VHF fundamental AT-cut resonators using flip-chip bonding","authors":"H. Iwata, T. Takahashi, O. Ishii","doi":"10.1109/FREQ.2001.956247","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956247","url":null,"abstract":"We miniaturized a very high frequency (VHF) fundamental AT-cut resonator by flip-chip bonding that joins a turned crystal chip to a ceramic package with gold bumps. The dimensions of the new resonator are 3.8 mm long /spl times/3.8 mm wide /spl times/0.9 mm high. The capacity of the resonator is a quarter of that of a conventional resonator that uses wire bonding. Moreover, we observe high stability in the 155 MHz resonator with a vibrating area of 10 /spl mu/m thickness. The new resonator is unaffected by stress and contamination due to bonding. Therefore, in the frequency vs. temperature characteristics, hysteresis errors are less than or equal to 1 ppm in the temperature cycle ranging from -40/spl deg/C to +85/spl deg/C. In the accelerated aging characteristics at an ambient temperature of +85/spl deg/C, the frequency shift is less than 1 ppm up to 6,000 hours.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128990202","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956365
P. Stockwell, C. McNeilage, M. Mossammaparast, D. Green, J. Searls
The performance of a compact sapphire microwave oscillator under vibration is measured in three orthogonal axes, and net vibration sensitivity is determined as less than 5 /spl times/ 10/sup -10/ per g. This result is compared with the vibration sensitivity of other oscillator technologies reported in the literature, together with other important oscillator characteristics.
{"title":"3-axis vibration performance of a compact sapphire microwave oscillator","authors":"P. Stockwell, C. McNeilage, M. Mossammaparast, D. Green, J. Searls","doi":"10.1109/FREQ.2001.956365","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956365","url":null,"abstract":"The performance of a compact sapphire microwave oscillator under vibration is measured in three orthogonal axes, and net vibration sensitivity is determined as less than 5 /spl times/ 10/sup -10/ per g. This result is compared with the vibration sensitivity of other oscillator technologies reported in the literature, together with other important oscillator characteristics.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131208871","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956379
Y. Vorokhovsky, I.G. Petrosyan, S. Anastasyev
The design of internally heated quartz resonators (IHQRs) is discussed. IHQR is a combination of quartz crystal and an oven in a one hermetically sealed package with vacuum thermal insulation. The major advantage of IHQRs is very low power consumption. Improvement of the frequency stability of IHQRs and OCXOs is then considered by further improving the design of IHQR itself in order to minimize influence of heat transfer through heat radiation and conductivity of the residual gases in a vacuum package and by introduction of an additional oven for the circuitry of the oscillator. This additional oven will also serve as an external oven for IHQR itself, i.e. such approach may be considered as attempt to build double oven OCXO based on IHQR.
{"title":"New concepts of internally heated quartz resonators (IHQRs) and appropriate OCXOs","authors":"Y. Vorokhovsky, I.G. Petrosyan, S. Anastasyev","doi":"10.1109/FREQ.2001.956379","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956379","url":null,"abstract":"The design of internally heated quartz resonators (IHQRs) is discussed. IHQR is a combination of quartz crystal and an oven in a one hermetically sealed package with vacuum thermal insulation. The major advantage of IHQRs is very low power consumption. Improvement of the frequency stability of IHQRs and OCXOs is then considered by further improving the design of IHQR itself in order to minimize influence of heat transfer through heat radiation and conductivity of the residual gases in a vacuum package and by introduction of an additional oven for the circuitry of the oscillator. This additional oven will also serve as an external oven for IHQR itself, i.e. such approach may be considered as attempt to build double oven OCXO based on IHQR.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131452987","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956344
Y.T. Hu, Q. Jiang, J.S. Yang, X. Zhang
Two-dimensional equations for piezoelectric plates have been very effective in modeling piezoelectric resonators. To predict the behavior of resonators under environmental effects like temperature change or acceleration, the theory of incremental motions in an electroelastic body under biasing fields is necessary. Existing two-dimensional equations for electroelastic plates under biasing fields employ various simplifying assumptions. For example, electroelastic couplings are often neglected for materials like quartz with weak piezoelectric effect. Spatially uniform and time-independent biasing fields are usually assumed so that the resulting equations have constant coefficients. The study of resonators made from new materials with strong piezoelectric coupling and the treatment of, e.g., resonator vibration sensitivity require plate equations with full electroelastic coupling and time-dependent or spatially varying biasing fields. We develop two-dimensional equations for an electroelastic plate under general biasing fields. No assumptions on the biasing fields are made. Full electroelastic coupling is taken into account. A set of two-dimensional equations for coupled extension and flexure with shear deformations are obtained. The application of the equations in resonator vibration sensitivity is shown by an example.
{"title":"Two-dimensional equations for electroelastic plates under biasing fields","authors":"Y.T. Hu, Q. Jiang, J.S. Yang, X. Zhang","doi":"10.1109/FREQ.2001.956344","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956344","url":null,"abstract":"Two-dimensional equations for piezoelectric plates have been very effective in modeling piezoelectric resonators. To predict the behavior of resonators under environmental effects like temperature change or acceleration, the theory of incremental motions in an electroelastic body under biasing fields is necessary. Existing two-dimensional equations for electroelastic plates under biasing fields employ various simplifying assumptions. For example, electroelastic couplings are often neglected for materials like quartz with weak piezoelectric effect. Spatially uniform and time-independent biasing fields are usually assumed so that the resulting equations have constant coefficients. The study of resonators made from new materials with strong piezoelectric coupling and the treatment of, e.g., resonator vibration sensitivity require plate equations with full electroelastic coupling and time-dependent or spatially varying biasing fields. We develop two-dimensional equations for an electroelastic plate under general biasing fields. No assumptions on the biasing fields are made. Full electroelastic coupling is taken into account. A set of two-dimensional equations for coupled extension and flexure with shear deformations are obtained. The application of the equations in resonator vibration sensitivity is shown by an example.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131660276","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956169
Li Tianchu, Li Mingshou, H. Bingying, Qian Jin, L. Pingwei
An atomic cesium fountain has been designed for a new primary standard of frequency in China. Cold atomic clouds collected in the magneto-optical trap (MOT) were previously reported (1995). To further improve the performance of the MOT we have optimized the laser-optical system and operation of the MOT. Some optical elements were replaced with new ones with better quality; frequency stabilization of lasers and arrangement of the optical system was modified; and polarization maintaining (PM) optical fibers were adopted to transfer lights from the optical system to MOT. We also installed the fluorescence detecting - amplifying assembles to take the time of flight (TOF) measurement of the cold atoms.
{"title":"Progress on the construction of an atomic cesium fountain at NIM","authors":"Li Tianchu, Li Mingshou, H. Bingying, Qian Jin, L. Pingwei","doi":"10.1109/FREQ.2001.956169","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956169","url":null,"abstract":"An atomic cesium fountain has been designed for a new primary standard of frequency in China. Cold atomic clouds collected in the magneto-optical trap (MOT) were previously reported (1995). To further improve the performance of the MOT we have optimized the laser-optical system and operation of the MOT. Some optical elements were replaced with new ones with better quality; frequency stabilization of lasers and arrangement of the optical system was modified; and polarization maintaining (PM) optical fibers were adopted to transfer lights from the optical system to MOT. We also installed the fluorescence detecting - amplifying assembles to take the time of flight (TOF) measurement of the cold atoms.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"79 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124083416","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956239
T. Watanabe, M. Kojima, K. Yamato
In a synthetic quartz crystal, it is desirable for the wafer immediately after slicing by a multi-wire-saw, which is a grinding system using free abrasive grains, to have no total thickness variation in the wafer and as near as possible zero warp as this influences the final product. Here, the terms and conditions for realizing high-precision machining were examined. Although based on abrasive grain particle diameter and a 800-1350 m/min. high-speed run of the wire , it turns out that the warp and the total thickness variation of a wafer can be brought close to zero by performing at a speed that brings a workpiece to the state where it is synchronized with the slicing speed. The performance of a unidirectional wire driving system and a bi-directional wire driving system were compared. The total thickness variation of the sliced wafer obtained using the unidirectional wire driving system is half the value of that using the bi-directional system. The various quality factors in slicing technology were examined, and the outstanding performance of unidirectional multi-wire-saw was verified.
{"title":"Study of quartz crystal slicing technology by using unidirectional multi-wire-saw","authors":"T. Watanabe, M. Kojima, K. Yamato","doi":"10.1109/FREQ.2001.956239","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956239","url":null,"abstract":"In a synthetic quartz crystal, it is desirable for the wafer immediately after slicing by a multi-wire-saw, which is a grinding system using free abrasive grains, to have no total thickness variation in the wafer and as near as possible zero warp as this influences the final product. Here, the terms and conditions for realizing high-precision machining were examined. Although based on abrasive grain particle diameter and a 800-1350 m/min. high-speed run of the wire , it turns out that the warp and the total thickness variation of a wafer can be brought close to zero by performing at a speed that brings a workpiece to the state where it is synchronized with the slicing speed. The performance of a unidirectional wire driving system and a bi-directional wire driving system were compared. The total thickness variation of the sliced wafer obtained using the unidirectional wire driving system is half the value of that using the bi-directional system. The various quality factors in slicing technology were examined, and the outstanding performance of unidirectional multi-wire-saw was verified.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128545085","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956371
C. Nicholls
Commercial ceramic resonator oscillator technology is limited to less than 3 GHz with respect to the output frequency The following paper presents results on ceramic resonator oscillator circuits capable of 4 and 5 GHz operation. Present work that extends the operating frequency of the oscillator to X and Ku bands is outlined. Measured phase noise for the oscillators at 10 kHz offset is better than -100 dBc/Hz. It is demonstrated that the push-push oscillator topology is advantageous with respect to its implementation in phase locked loop circuits as a second output signal at half the oscillation frequency can be obtained from the oscillator for use as the RF input signal for a phase locked loop synthesizer. The results represent a significant breakthrough in the field of ceramic resonator oscillator technology and present a viable low cost signal source solution to high QAM microwave radio applications.
{"title":"Extension of the frequency range of ceramic resonator oscillators using push-push circuit topology","authors":"C. Nicholls","doi":"10.1109/FREQ.2001.956371","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956371","url":null,"abstract":"Commercial ceramic resonator oscillator technology is limited to less than 3 GHz with respect to the output frequency The following paper presents results on ceramic resonator oscillator circuits capable of 4 and 5 GHz operation. Present work that extends the operating frequency of the oscillator to X and Ku bands is outlined. Measured phase noise for the oscillators at 10 kHz offset is better than -100 dBc/Hz. It is demonstrated that the push-push oscillator topology is advantageous with respect to its implementation in phase locked loop circuits as a second output signal at half the oscillation frequency can be obtained from the oscillator for use as the RF input signal for a phase locked loop synthesizer. The results represent a significant breakthrough in the field of ceramic resonator oscillator technology and present a viable low cost signal source solution to high QAM microwave radio applications.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"67 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129173622","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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