Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956355
S. Goka, H. Sekimoto, Y. Watanabe, T. Sato
To confirm the effect of bi-mesa structures on the decoupling of thickness-shear (TS) and thickness-flexure (TF) modes, we measured the frequency-temperature behavior of bi-mesa shaped AT cut quartz resonators. The TF mode couples with the TS mode because the same displacement component is contained within the TS mode. This strong coupling cannot be eliminated as long as the plates have boundaries. Therefore, the temperature characteristics of the fundamental TS mode are clearly affected by the TF components. Bi-mesa structures have an energy trapping effect large enough to spatially separate the vibrational modes, so bi-mesa structures can decrease the effect of TF components. Therefore, the frequency-temperature behavior of a bi-mesa resonator is close to that of an infinite plate, which has no TF component effect. The bi-mesa resonators used in this study were fabricated using a wet etching process, and the fundamental TS frequency was 8.3 MHz. The frequency-temperature behavior was measured using a network analyzer. Results showed that bi-mesa resonators have temperature characteristics four times better than those of flat resonators, ranging from -20 to 85/spl deg/C. These results confirm the energy trapping effect of bi-mesa structures and their effectiveness in separating vibrational modes.
{"title":"Frequency temperature behavior of bi-mesa shaped at cut quartz resonators","authors":"S. Goka, H. Sekimoto, Y. Watanabe, T. Sato","doi":"10.1109/FREQ.2001.956355","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956355","url":null,"abstract":"To confirm the effect of bi-mesa structures on the decoupling of thickness-shear (TS) and thickness-flexure (TF) modes, we measured the frequency-temperature behavior of bi-mesa shaped AT cut quartz resonators. The TF mode couples with the TS mode because the same displacement component is contained within the TS mode. This strong coupling cannot be eliminated as long as the plates have boundaries. Therefore, the temperature characteristics of the fundamental TS mode are clearly affected by the TF components. Bi-mesa structures have an energy trapping effect large enough to spatially separate the vibrational modes, so bi-mesa structures can decrease the effect of TF components. Therefore, the frequency-temperature behavior of a bi-mesa resonator is close to that of an infinite plate, which has no TF component effect. The bi-mesa resonators used in this study were fabricated using a wet etching process, and the fundamental TS frequency was 8.3 MHz. The frequency-temperature behavior was measured using a network analyzer. Results showed that bi-mesa resonators have temperature characteristics four times better than those of flat resonators, ranging from -20 to 85/spl deg/C. These results confirm the energy trapping effect of bi-mesa structures and their effectiveness in separating vibrational modes.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"2017 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132993509","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956353
H. Sekimoto, Xun Gong, S. Goka, Y. Watanabe
We numerically studied the f-T behavior of the fundamental TS fast mode in a partially plated X-cut LiTaO/sub 3/ strip resonator. Using the material constants measured by Smith and Welsh [1971], the f-T curves were calculated as a function of the electrode-length and the plate-length direction /spl psi/. The results confirmed that the turnover temperature of f-T curve decreases with increasing the electrode length. Furthermore we found out that the turnover temperature changes according to the coupling between TS and TF modes through c/sub 56/, and that it therefore depends on the plate-length direction /spl psi/. An angle /spl psi/=40/spl deg/ that yields the turnover temperature in the range of 33/spl sim/6.5/spl deg/C is optimal for the material constants of Smith and Welsh because c/sub 56/ is zero. We also showed that the external loading of both series and parallel capacitances can make the adjustment of turnover temperature very flexible.
{"title":"Analysis of frequency-temperature behavior of X-cut LiTaO/sub 3/ strip resonators","authors":"H. Sekimoto, Xun Gong, S. Goka, Y. Watanabe","doi":"10.1109/FREQ.2001.956353","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956353","url":null,"abstract":"We numerically studied the f-T behavior of the fundamental TS fast mode in a partially plated X-cut LiTaO/sub 3/ strip resonator. Using the material constants measured by Smith and Welsh [1971], the f-T curves were calculated as a function of the electrode-length and the plate-length direction /spl psi/. The results confirmed that the turnover temperature of f-T curve decreases with increasing the electrode length. Furthermore we found out that the turnover temperature changes according to the coupling between TS and TF modes through c/sub 56/, and that it therefore depends on the plate-length direction /spl psi/. An angle /spl psi/=40/spl deg/ that yields the turnover temperature in the range of 33/spl sim/6.5/spl deg/C is optimal for the material constants of Smith and Welsh because c/sub 56/ is zero. We also showed that the external loading of both series and parallel capacitances can make the adjustment of turnover temperature very flexible.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132696467","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956262
R. Lucklum, P. Hauptmann
An important application of quartz crystal resonators is the quartz crystal microbalance (QCM). It is well established as thickness monitor in vacuum deposition units or as chemical sensor, e.g., in an electronic nose or electronic tongue. As QCM the high sensitivity of the mechanical eigenfrequency to surface mass changes is exploited. QCMs obtain their chemical sensitivity and selectivity from a chemically active coating, which interacts with the surrounding environment. Analyte sorption in the sensitive layer results in a change of the surface mass and hence in the resonator's frequency. A new fascinating application is the determination of material properties of thin viscoelastic films. The recently developed methods will be reviewed.
{"title":"Thin film shear modulus determination with quartz crystal resonators: a review","authors":"R. Lucklum, P. Hauptmann","doi":"10.1109/FREQ.2001.956262","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956262","url":null,"abstract":"An important application of quartz crystal resonators is the quartz crystal microbalance (QCM). It is well established as thickness monitor in vacuum deposition units or as chemical sensor, e.g., in an electronic nose or electronic tongue. As QCM the high sensitivity of the mechanical eigenfrequency to surface mass changes is exploited. QCMs obtain their chemical sensitivity and selectivity from a chemically active coating, which interacts with the surrounding environment. Analyte sorption in the sensitive layer results in a change of the surface mass and hence in the resonator's frequency. A new fascinating application is the determination of material properties of thin viscoelastic films. The recently developed methods will be reviewed.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"69 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116778752","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956283
M. Kuroiwa, Y. Shimamoto, Y. Yasuda, S. Wakamoto, M. Nakazawa
This paper describes experiments regarding the hysteresis of relative humidity on AT-cut quartz humidity sensors. This research was conducted to investigate principally the mechanism with respect to frequency change, etc. (including the impedance changes and equivalent circuit constant fluctuations) for the above humidity sensors.
{"title":"Hysteresis characteristics vs relative humidity for AT-Cut quartz humidity sensors","authors":"M. Kuroiwa, Y. Shimamoto, Y. Yasuda, S. Wakamoto, M. Nakazawa","doi":"10.1109/FREQ.2001.956283","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956283","url":null,"abstract":"This paper describes experiments regarding the hysteresis of relative humidity on AT-cut quartz humidity sensors. This research was conducted to investigate principally the mechanism with respect to frequency change, etc. (including the impedance changes and equivalent circuit constant fluctuations) for the above humidity sensors.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115044969","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956245
W. D. Beaver
This paper presents the electrical and mechanical characteristics of high frequency "all-quartz" surface mount resonators. All-quartz surface mount resonators are fabricated using a suitably electroded quartz crystal base plate and a cover plate of quartz which are bonded to a specially formed, electroded AT-cut quartz resonator plate with epoxy resin to create a hermetic seal. Methods of production have been developed which allow for the manufacture of this type of resonators having fundamental mode frequencies in the range from 3.5 MHz to more than 50 MHz. The paper presents the results of aging and environmental studies, that show that the frequency stability, equivalent series resistance and other electrical properties of the all-quartz surface mount resonators are equivalent to the values of the same parameters of quartz resonators which are encapsulated in SMT ceramic enclosures. However, the dimensions of the all-quartz surface mount resonators have a much lower height and smaller volume and they exhibit substantially greater resistance to shock and vibration than the ceramic enclosed resonators of the same frequency.
{"title":"All quartz surface mount resonators","authors":"W. D. Beaver","doi":"10.1109/FREQ.2001.956245","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956245","url":null,"abstract":"This paper presents the electrical and mechanical characteristics of high frequency \"all-quartz\" surface mount resonators. All-quartz surface mount resonators are fabricated using a suitably electroded quartz crystal base plate and a cover plate of quartz which are bonded to a specially formed, electroded AT-cut quartz resonator plate with epoxy resin to create a hermetic seal. Methods of production have been developed which allow for the manufacture of this type of resonators having fundamental mode frequencies in the range from 3.5 MHz to more than 50 MHz. The paper presents the results of aging and environmental studies, that show that the frequency stability, equivalent series resistance and other electrical properties of the all-quartz surface mount resonators are equivalent to the values of the same parameters of quartz resonators which are encapsulated in SMT ceramic enclosures. However, the dimensions of the all-quartz surface mount resonators have a much lower height and smaller volume and they exhibit substantially greater resistance to shock and vibration than the ceramic enclosed resonators of the same frequency.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"448 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116758168","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956351
K. Hirama, H. Konno, K. Asao, K. Nakamura
We propose a new type quartz resonator using an unelectroded resonant region. In this resonator unelectroded resonant regions and electroded resonant regions are acoustically coupled to each other. We examined a transmission type structure resonator using a lumped constant equivalent circuit and confirmed its performance by experiments. The resonance frequency drift observed through electric terminals was improved by one-tenth of the drift at the electroded resonant regions. The insertion loss of the resonator is typically 15 dB, and therefore steady oscillation can be sustained using an ordinary single stage amplifier.
{"title":"Improvement of frequency drift of at-cut resonators using an unelectroded resonant region","authors":"K. Hirama, H. Konno, K. Asao, K. Nakamura","doi":"10.1109/FREQ.2001.956351","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956351","url":null,"abstract":"We propose a new type quartz resonator using an unelectroded resonant region. In this resonator unelectroded resonant regions and electroded resonant regions are acoustically coupled to each other. We examined a transmission type structure resonator using a lumped constant equivalent circuit and confirmed its performance by experiments. The resonance frequency drift observed through electric terminals was improved by one-tenth of the drift at the electroded resonant regions. The insertion loss of the resonator is typically 15 dB, and therefore steady oscillation can be sustained using an ordinary single stage amplifier.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117115349","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956336
C. Zhang, J. Vetelino
A thickness shear mode (TSM) bulk acoustic wave (BAW) sensor for liquid electrical property (conductivity and dielectric constant) measurements is presented. This sensor, which is configured as a resonator structure, employs a sensing electrode geometry, which allows the accurate measurement of the liquid electrical properties. The frequency response of the sensor has been measured in both conductive (NaCl) and non-conductive (2-proponal) solutions. A theoretical model has been developed to describe the sensor operating in liquids and the calculated impedance is shown to agree well with the measured impedance. The sensitivity of this sensor to the change in liquid dielectric constant has been determined. Compared with other sensing technologies, the present sensor may provide a more reliable, portable and low cost solution for on-line monitoring of the liquid electrical property changes.
{"title":"A bulk acoustic wave resonator for sensing liquid electrical property changes","authors":"C. Zhang, J. Vetelino","doi":"10.1109/FREQ.2001.956336","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956336","url":null,"abstract":"A thickness shear mode (TSM) bulk acoustic wave (BAW) sensor for liquid electrical property (conductivity and dielectric constant) measurements is presented. This sensor, which is configured as a resonator structure, employs a sensing electrode geometry, which allows the accurate measurement of the liquid electrical properties. The frequency response of the sensor has been measured in both conductive (NaCl) and non-conductive (2-proponal) solutions. A theoretical model has been developed to describe the sensor operating in liquids and the calculated impedance is shown to agree well with the measured impedance. The sensitivity of this sensor to the change in liquid dielectric constant has been determined. Compared with other sensing technologies, the present sensor may provide a more reliable, portable and low cost solution for on-line monitoring of the liquid electrical property changes.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"12 4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126777705","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956341
H. Tiersten
In the derivation of two-dimensional equations for the vibration of piezoelectric plates from variational equations, expansions of the mechanical and electrical variables in the thickness coordinate are employed. If the major surfaces of the plate are electroded and the electric potential is expanded in functions of the thickness coordinate which do not vanish at the electrodes, the variations of the different orders of the expansion potentials are not independent because the electric potential must satisfy constraint conditions at the electrodes where it is independent of position. In this work the electric potential is expanded in functions of the thickness coordinate which do not vanish at the surface electrodes and the constraint conditions are included by means of the method of Lagrange multipliers. The resulting piezoelectric plate equations are obtained along with an integral condition on the Lagrange multipliers over the electrodes, which results in the equation for the current through the electrodes. It is shown that the elimination of the Lagrange multipliers results in a reduced system of electrostatic plate equations and associated edge conditions, which is easier to use.
{"title":"A derivation of two-dimensional equations for the vibration of electroded piezoelectric plates using an unrestricted thickness expansion of the electric potential","authors":"H. Tiersten","doi":"10.1109/FREQ.2001.956341","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956341","url":null,"abstract":"In the derivation of two-dimensional equations for the vibration of piezoelectric plates from variational equations, expansions of the mechanical and electrical variables in the thickness coordinate are employed. If the major surfaces of the plate are electroded and the electric potential is expanded in functions of the thickness coordinate which do not vanish at the electrodes, the variations of the different orders of the expansion potentials are not independent because the electric potential must satisfy constraint conditions at the electrodes where it is independent of position. In this work the electric potential is expanded in functions of the thickness coordinate which do not vanish at the surface electrodes and the constraint conditions are included by means of the method of Lagrange multipliers. The resulting piezoelectric plate equations are obtained along with an integral condition on the Lagrange multipliers over the electrodes, which results in the equation for the current through the electrodes. It is shown that the elimination of the Lagrange multipliers results in a reduced system of electrostatic plate equations and associated edge conditions, which is easier to use.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125218638","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956369
M. Tobar, J. Hartnett, E. Ivanov, D. Cros, P. Bilski
A dual-mode Sapphire Loaded Cavity (SLC) resonator has been designed and optimized with the aid of finite element software. The resonance frequency was designed to be near the frequency of a Cs atomic frequency standard. Experimental tests are shown to agree very well with calculations. The difference frequency of two differently polarized modes is shown to be a highly sensitive temperature sensor in the 50 to 80 K temperature range. We show that an oscillator based on this resonator has the potential to operate with fractional frequency instability below 10/sup -14/ for measurement times of 1 to 1000 seconds. This is sufficient to operate an atomic clock at the quantum projection noise limit.
{"title":"Design of a cryogenic dual-mode resonator for a fly-wheel oscillator for a cesium frequency standard","authors":"M. Tobar, J. Hartnett, E. Ivanov, D. Cros, P. Bilski","doi":"10.1109/FREQ.2001.956369","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956369","url":null,"abstract":"A dual-mode Sapphire Loaded Cavity (SLC) resonator has been designed and optimized with the aid of finite element software. The resonance frequency was designed to be near the frequency of a Cs atomic frequency standard. Experimental tests are shown to agree very well with calculations. The difference frequency of two differently polarized modes is shown to be a highly sensitive temperature sensor in the 50 to 80 K temperature range. We show that an oscillator based on this resonator has the potential to operate with fractional frequency instability below 10/sup -14/ for measurement times of 1 to 1000 seconds. This is sufficient to operate an atomic clock at the quantum projection noise limit.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125312129","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956383
Wei Zhou, Yamin Wang, L. Bai, Hui Zhou, Changsend Liu, Jie Li, Jing Jia
Describes an MCXO test system used mainly for MCXOs based on AT cut crystals. This system is composed of a temperature chamber, several switch groups, a PC, a high-resolution frequency meter, a frequency standard, a control system including a simulator and a controller. It can be used to produce the MCXOs with AT cut crystals and in the different temperature range /spl plusmn/1/spl sim/3/spl times/10/sup -7/ frequency-temperature stability can be obtained. In the test procedure for MCXOs, the system supplies MCXO standard temperature conditions, measures the frequency-temperature characteristics of the uncompensated MCXOs, obtains control signal (voltage, pulse width or digital code signal)-temperature sensed, signal data for the compensated MCXOs. According to the test data, the compensation table or equations for the completed MCXOs can be obtained. In the test system, high precision and fast speed frequency measurement combined with suitable computer control can be used instead of a complicated frequency synthesizer and is useful for MCXO production with different frequencies.
{"title":"An MCXO test system and its function in MCXO performances","authors":"Wei Zhou, Yamin Wang, L. Bai, Hui Zhou, Changsend Liu, Jie Li, Jing Jia","doi":"10.1109/FREQ.2001.956383","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956383","url":null,"abstract":"Describes an MCXO test system used mainly for MCXOs based on AT cut crystals. This system is composed of a temperature chamber, several switch groups, a PC, a high-resolution frequency meter, a frequency standard, a control system including a simulator and a controller. It can be used to produce the MCXOs with AT cut crystals and in the different temperature range /spl plusmn/1/spl sim/3/spl times/10/sup -7/ frequency-temperature stability can be obtained. In the test procedure for MCXOs, the system supplies MCXO standard temperature conditions, measures the frequency-temperature characteristics of the uncompensated MCXOs, obtains control signal (voltage, pulse width or digital code signal)-temperature sensed, signal data for the compensated MCXOs. According to the test data, the compensation table or equations for the completed MCXOs can be obtained. In the test system, high precision and fast speed frequency measurement combined with suitable computer control can be used instead of a complicated frequency synthesizer and is useful for MCXO production with different frequencies.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131500159","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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