1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century最新文献
Pub Date : 1997-09-22DOI: 10.1109/AUTEST.1997.633682
R. Wong
In the effort to enhance the maintenance of the logistics data associated with the jet engine testing facilities a Highly Integrated Database Application system has been created. HILDA permits the integration of the logistics data tree structure with the associated technical data. This technical data includes the link to the CAD drawing, Technical Order, Integrated Parts Breakdown data and any associated image files. Utilizing Microsoft's Access Data Base Manager, Netscape's Browser and AutoCad's Browser software this application allows the user to view, search, modify and print the data associated with their facility. This paper provides the details of the application's capabilities and enhancements for the future plus describes the versatility of the system.
{"title":"HILDA-highly integrated logistics database application","authors":"R. Wong","doi":"10.1109/AUTEST.1997.633682","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633682","url":null,"abstract":"In the effort to enhance the maintenance of the logistics data associated with the jet engine testing facilities a Highly Integrated Database Application system has been created. HILDA permits the integration of the logistics data tree structure with the associated technical data. This technical data includes the link to the CAD drawing, Technical Order, Integrated Parts Breakdown data and any associated image files. Utilizing Microsoft's Access Data Base Manager, Netscape's Browser and AutoCad's Browser software this application allows the user to view, search, modify and print the data associated with their facility. This paper provides the details of the application's capabilities and enhancements for the future plus describes the versatility of the system.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127567296","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1997-09-22DOI: 10.1109/AUTEST.1997.633644
D. Zimmermann, J. Dean
This paper will cover the forces behind the ATS PGM office's drive to commercial, open architecture standards (critical interfaces) in Automatic Test Systems. How we are identifying those standards, what we expect them to give us, and our plans for their continued evolution are also discussed.
{"title":"The Air Force perspective on ATS standardization legacy, vision, and challenges","authors":"D. Zimmermann, J. Dean","doi":"10.1109/AUTEST.1997.633644","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633644","url":null,"abstract":"This paper will cover the forces behind the ATS PGM office's drive to commercial, open architecture standards (critical interfaces) in Automatic Test Systems. How we are identifying those standards, what we expect them to give us, and our plans for their continued evolution are also discussed.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133153858","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1997-09-22DOI: 10.1109/AUTEST.1997.633546
Rui Ding, W. Darling
The Consolidated Automated Support System (CASS) documentation used to develop CASS test program sets (TPS) is extensive in size, is updated frequently, and is used by large numbers of TPS developers at numerous sites. This documentation was originally delivered in paper format, which was relatively difficult and expensive to maintain and distribute. Alternate methods of maintaining and distributing these documents were investigated. In an attempt to reduce problems and costs, this technical paper discusses how and why the CASS TPS development documentation was converted from a large set of books to the Test Program Set Development (TPSD) Hypertext Guide (THG), a set of hypertexted documents that is now being distributed and read on the World Wide Web (WWW). This paper also provides information on the associated costs and benefits, and describes how these documents are currently being maintained and controlled.
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Pub Date : 1997-09-22DOI: 10.1109/AUTEST.1997.633670
W. Simpson, A. Greenspan
The US Department of Defense has directed increased reliance on commercial standards and commercial products be used in procurement There are many sources for such standards. For example, in the US we have several consensus bodies such as the Institute of Electronics and Electrical Engineers (IEEE), American National Standards Institute (ANSI), American Institute of Aeronautics and Astronautics (AIAA), and the Society of Automotive Engineers (SAE) to name a few. In addition, consortiums such as VXIPlug&Play, the Aeronautical Radio Inc. (ARINC), the National Security industrial Association (NSIA), or the Electronic Industry Associates (EIA) may provide standards. At the international level, we have the International Standards Organization (lSO) international and Electrotechnical Commission (IEC) and organizations are sister organizations operating out off Geneva, the latter handling matters of electronic test. Although we have many potential sources, there are major gaps in the availability of commercially based standards to fill procurement needs. Many of these groups are tooling up to provide some capabilities for these areas, and the IEC is no exception. The paper describes a newly formed working group within the Technical Committee 93 (Design Automation) of the IEC designated working group 7. Working group 7 is the system test working group for the IEC TC-93. This group will handle the review and recommendation for standards related to test and diagnosis of systems such as the ATLAS-716 standard, EDIF for Test, A Broad Based Environment for Test, etc. Currently the group has a task to facilitate the harmonization between ATLAS 716 which is an IEEE standard and is fast tracked for IEC standardization, and ATLAS 626 which is used by the commercial airlines. The paper presents the makeup of this group, the process by which individuals can participate and the recent and upcoming meetings and work of the group. It will also show the manner in which the efforts of the IEC are helping to close the gap between the existing commercial standards needed to support procurements and what is currently available. It also suggests additional standards efforts which are required and how interaction between standards organizations and the user communities which need these standards can be optimized.
美国国防部已经指示在采购中增加对商业标准和商业产品的依赖，这些标准有许多来源。例如，在美国，我们有几个共识机构，如电子和电气工程师协会(IEEE)，美国国家标准协会(ANSI)，美国航空航天学会(AIAA)和汽车工程师协会(SAE)等等。此外，诸如VXIPlug&Play、航空无线电公司(ARINC)、国家安全工业协会(NSIA)或电子工业协会(EIA)等联盟也可以提供标准。在国际层面上，我们有国际标准组织(lSO)和国际电工委员会(IEC)，这两个组织是在日内瓦以外运作的姐妹组织，后者处理电子测试事宜。虽然我们有许多潜在的来源，但在满足采购需求的商业标准的可用性方面存在重大差距。这些组织中的许多都在为这些领域提供一些功能，IEC也不例外。本文描述了IEC指定工作组7的93技术委员会(设计自动化)内新成立的工作组。第7工作组是IEC TC-93的系统测试工作组。该小组将负责审查和推荐与系统测试和诊断相关的标准，如ATLAS-716标准、EDIF for test、A Broad Based Environment for test等。目前，该组织的任务是促进ATLAS 716与ATLAS 626之间的协调，ATLAS 716是IEEE标准，并被IEC标准化快速跟踪。ATLAS 626是商业航空公司使用的。本文介绍了该小组的组成，个人可以参与的过程以及小组最近和即将举行的会议和工作。它还将显示独立信息委员会的努力如何帮助缩小支持采购所需的现有商业标准与现有标准之间的差距。它还建议需要额外的标准工作，以及如何优化标准组织和需要这些标准的用户社区之间的交互。
{"title":"The International Electrotechnical Commission and system level test","authors":"W. Simpson, A. Greenspan","doi":"10.1109/AUTEST.1997.633670","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633670","url":null,"abstract":"The US Department of Defense has directed increased reliance on commercial standards and commercial products be used in procurement There are many sources for such standards. For example, in the US we have several consensus bodies such as the Institute of Electronics and Electrical Engineers (IEEE), American National Standards Institute (ANSI), American Institute of Aeronautics and Astronautics (AIAA), and the Society of Automotive Engineers (SAE) to name a few. In addition, consortiums such as VXIPlug&Play, the Aeronautical Radio Inc. (ARINC), the National Security industrial Association (NSIA), or the Electronic Industry Associates (EIA) may provide standards. At the international level, we have the International Standards Organization (lSO) international and Electrotechnical Commission (IEC) and organizations are sister organizations operating out off Geneva, the latter handling matters of electronic test. Although we have many potential sources, there are major gaps in the availability of commercially based standards to fill procurement needs. Many of these groups are tooling up to provide some capabilities for these areas, and the IEC is no exception. The paper describes a newly formed working group within the Technical Committee 93 (Design Automation) of the IEC designated working group 7. Working group 7 is the system test working group for the IEC TC-93. This group will handle the review and recommendation for standards related to test and diagnosis of systems such as the ATLAS-716 standard, EDIF for Test, A Broad Based Environment for Test, etc. Currently the group has a task to facilitate the harmonization between ATLAS 716 which is an IEEE standard and is fast tracked for IEC standardization, and ATLAS 626 which is used by the commercial airlines. The paper presents the makeup of this group, the process by which individuals can participate and the recent and upcoming meetings and work of the group. It will also show the manner in which the efforts of the IEC are helping to close the gap between the existing commercial standards needed to support procurements and what is currently available. It also suggests additional standards efforts which are required and how interaction between standards organizations and the user communities which need these standards can be optimized.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125168706","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1997-09-22DOI: 10.1109/AUTEST.1997.633661
K. Fertitta, B. Meacham
This paper describes techniques for reducing test station hardware dependence in test programs implemented in National instrument's LabVIEW development environment hardware dependence is reduced by a combination of design strategies, and by the definition of a Hardware Abstraction Layer (HAL). The HAL reduces hardware dependence by insulating the developer from the test station resources, by encapsulating the hardware drivers supplied by the equipment manufacturer with wrapper functions. The HAL allows the TPS to be partitioned into hardware dependent and independent components, localizing the hardware dependencies in the HAL wrapper Vis. This paper also describes a method using hardware configuration tables to effectively defer binding of test resources until program execution. This technique allows the TPS to compensate for minor changes in hardware configuration without having to edit or recompile any LabVIEW code.
{"title":"Developing portable test program sets in a graphical design environment","authors":"K. Fertitta, B. Meacham","doi":"10.1109/AUTEST.1997.633661","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633661","url":null,"abstract":"This paper describes techniques for reducing test station hardware dependence in test programs implemented in National instrument's LabVIEW development environment hardware dependence is reduced by a combination of design strategies, and by the definition of a Hardware Abstraction Layer (HAL). The HAL reduces hardware dependence by insulating the developer from the test station resources, by encapsulating the hardware drivers supplied by the equipment manufacturer with wrapper functions. The HAL allows the TPS to be partitioned into hardware dependent and independent components, localizing the hardware dependencies in the HAL wrapper Vis. This paper also describes a method using hardware configuration tables to effectively defer binding of test resources until program execution. This technique allows the TPS to compensate for minor changes in hardware configuration without having to edit or recompile any LabVIEW code.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129324889","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1997-09-22DOI: 10.1109/AUTEST.1997.633572
S. Singer, L. Vanetsky
The process outlined in this paper describes the system developed to meet the goals of the Next Generation Test Generator program, funded by the Office of Naval Research. This system takes advantage of an unsupervised pattern classification algorithm (Adaptive Resonance Theory (ART)) and a Genetic Algorithm (GA) that is combined to form an optimizing control system. The GA generates a population of test patterns (individuals). Each individual is provided as a set of timed inputs to behavior based simulations representing good and faulty systems. The response of each model (good and faulty) is recombined in the form of an image matrix with each row representing a signature of each of the different circuits. FuzzyART (Fuzzy Logic Based ART) provides a method of image recognition, extracting those images that are distinctly different from any other. Each individual generated by the GA is provided as input to the list of models, then evaluated by FuzzyART and a fitness representing the number of separate classes is formed. New test sequences evolve with increasing fault isolation and detection. The process is repeated until a maximum number of models have been identified and separated. A selective breading algorithm was included to reduce the need for large populations, thus increasing the speed to converge to the "best test". The process was demonstrated using a commercial simulator based on Verilog HDL with a simple master/slave flip-flop and a moderately complex digital circuit (real UUT).
{"title":"Next Generation Test Generator (NGTG) for digital circuits","authors":"S. Singer, L. Vanetsky","doi":"10.1109/AUTEST.1997.633572","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633572","url":null,"abstract":"The process outlined in this paper describes the system developed to meet the goals of the Next Generation Test Generator program, funded by the Office of Naval Research. This system takes advantage of an unsupervised pattern classification algorithm (Adaptive Resonance Theory (ART)) and a Genetic Algorithm (GA) that is combined to form an optimizing control system. The GA generates a population of test patterns (individuals). Each individual is provided as a set of timed inputs to behavior based simulations representing good and faulty systems. The response of each model (good and faulty) is recombined in the form of an image matrix with each row representing a signature of each of the different circuits. FuzzyART (Fuzzy Logic Based ART) provides a method of image recognition, extracting those images that are distinctly different from any other. Each individual generated by the GA is provided as input to the list of models, then evaluated by FuzzyART and a fitness representing the number of separate classes is formed. New test sequences evolve with increasing fault isolation and detection. The process is repeated until a maximum number of models have been identified and separated. A selective breading algorithm was included to reduce the need for large populations, thus increasing the speed to converge to the \"best test\". The process was demonstrated using a commercial simulator based on Verilog HDL with a simple master/slave flip-flop and a moderately complex digital circuit (real UUT).","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"68 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129365800","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1997-09-22DOI: 10.1109/AUTEST.1997.633563
John, Sheppard, Bartolini, L. Orlidge
The proliferation of artificially intelligent diagnostic reasoners and tools necessitates establishing standard interfaces to these tools and formal data specifications to capture relevant diagnostic information to be processed by these tools. Current test standards provide little guidance to using AI technology in test applications. Proposed AI standards (e.g., KIF) do not specifically address the concerns of the test community. Thus, no standard exists, currently, addressing the use of AI systems in test environments. AI-ESTATE is intended to fill this void. This paper provides an update on the status of all of the AI-ESTATE standards and their potential use to support diagnostic tools and applications.
{"title":"Standardizing diagnostic information using IEEE AI-ESTATE","authors":"John, Sheppard, Bartolini, L. Orlidge","doi":"10.1109/AUTEST.1997.633563","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633563","url":null,"abstract":"The proliferation of artificially intelligent diagnostic reasoners and tools necessitates establishing standard interfaces to these tools and formal data specifications to capture relevant diagnostic information to be processed by these tools. Current test standards provide little guidance to using AI technology in test applications. Proposed AI standards (e.g., KIF) do not specifically address the concerns of the test community. Thus, no standard exists, currently, addressing the use of AI systems in test environments. AI-ESTATE is intended to fill this void. This paper provides an update on the status of all of the AI-ESTATE standards and their potential use to support diagnostic tools and applications.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129505856","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1997-09-22DOI: 10.1109/AUTEST.1997.633604
D. A. Harry
In 1996, Boeing began an effort to develop a reusable test library (RTL) for functional test requirements (FTR) and functional test program (FTP) development. The RTL was developed on the intranet to take advantage of commercial formats and browsers. The intranet provides access for test engineers in multiple locations on a variety of platforms. The RTL is continuing to evolve, looking at how to better develop FTRs and FTPs with the RTL in a more automated fashion. This paper discusses the development of automated tools to develop FTRs and FTPs from reusable test objects. It talks about customer participation, determining "Best-in-class" library elements and development and use of existing technologies for rapid prototyping. It also discusses some of the challenges to implementing an effective RTL, and how these challenges are being overcome.
{"title":"The reusable test library and how to use it","authors":"D. A. Harry","doi":"10.1109/AUTEST.1997.633604","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633604","url":null,"abstract":"In 1996, Boeing began an effort to develop a reusable test library (RTL) for functional test requirements (FTR) and functional test program (FTP) development. The RTL was developed on the intranet to take advantage of commercial formats and browsers. The intranet provides access for test engineers in multiple locations on a variety of platforms. The RTL is continuing to evolve, looking at how to better develop FTRs and FTPs with the RTL in a more automated fashion. This paper discusses the development of automated tools to develop FTRs and FTPs from reusable test objects. It talks about customer participation, determining \"Best-in-class\" library elements and development and use of existing technologies for rapid prototyping. It also discusses some of the challenges to implementing an effective RTL, and how these challenges are being overcome.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"284 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134411889","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1997-09-22DOI: 10.1109/AUTEST.1997.633681
L. Ungar, J. MacMillan
The lack of formal test education has brought about a need to examine how test engineers developing test program sets (TPSs) are able to perform their tasks. A test engineer's skill in developing TPSs usually comes from one or more of the following three sources: Training on using the ATE; continuing education courses at some universities, on-site and at conferences; on-the-job training. The effectiveness of each of these approaches is in question. While ATE training is necessary, it is usually not intended to teach TPS development. Continuing education is only sparsely available and because it is taught by individual consultants it is not standardized. On-The-Job training is the least efficient and probably the least cost-effective, but appears to be the most common. This paper focuses on TPS development for the US Navy's CASS ATE, but the issues may apply throughout the test community. The authors used a questionnaire distributed among CASS TPS developers and managers aimed at identifying the various methods used for training and the advantages or disadvantages of each method. The questionnaire was aimed at identifying problem areas and finding solutions that will enable TPS developers to create better TPSs in shorter time. One of the goals of this effort was to identify the appropriate curriculum which will best prepare TPS developers for their jobs. The paper also explains how the expected savings will outweigh the training costs.
{"title":"Test education: a CASS perspective","authors":"L. Ungar, J. MacMillan","doi":"10.1109/AUTEST.1997.633681","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633681","url":null,"abstract":"The lack of formal test education has brought about a need to examine how test engineers developing test program sets (TPSs) are able to perform their tasks. A test engineer's skill in developing TPSs usually comes from one or more of the following three sources: Training on using the ATE; continuing education courses at some universities, on-site and at conferences; on-the-job training. The effectiveness of each of these approaches is in question. While ATE training is necessary, it is usually not intended to teach TPS development. Continuing education is only sparsely available and because it is taught by individual consultants it is not standardized. On-The-Job training is the least efficient and probably the least cost-effective, but appears to be the most common. This paper focuses on TPS development for the US Navy's CASS ATE, but the issues may apply throughout the test community. The authors used a questionnaire distributed among CASS TPS developers and managers aimed at identifying the various methods used for training and the advantages or disadvantages of each method. The questionnaire was aimed at identifying problem areas and finding solutions that will enable TPS developers to create better TPSs in shorter time. One of the goals of this effort was to identify the appropriate curriculum which will best prepare TPS developers for their jobs. The paper also explains how the expected savings will outweigh the training costs.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"170 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133336668","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1997-09-22DOI: 10.1109/AUTEST.1997.633678
P. Turley, M. Wright
CACI International Inc. is on contract with SAALC/LDAD, the Air Force engine tester program management office, to build an Engine Test/Trim Automated System II (ETTAS II) using Commercial Off The Shelf (COTS) hardware and software. This tester will ultimately replace the three aircraft engine test systems currently used by the Air Force, all of which are becoming increasingly difficult to maintain doe to hardware/software obsolescence problems. In keeping with the COTS requirement, we chose to develop our data acquisition and test program software in LabVIEW 4.0.1 for Windows NT/95. This paper discusses the advantages we have gained in using LabVIEW 4.0.1, a graphical programming language, rather than a conventional programming language as our software development environment. We detail how we were able to take advantage of LabVIEW's instrument control capabilities to optimize our VXI data acquisition process. We then discuss how LabVIEW can be used not only as an instrument control language, but also as a general purpose programming language. We discuss how we used LabVIEW for test program set (TPS) development and for rapidly prototyping user interfaces and program features for immediate operator/customer feedback. The paper also details how LabVIEW enabled os to readily establish a core of "generic" VIs (virtual instruments) for subsequent reuse in developing additional TPS for other aircraft engine types/variants.
{"title":"Developing engine test software in LabVIEW","authors":"P. Turley, M. Wright","doi":"10.1109/AUTEST.1997.633678","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633678","url":null,"abstract":"CACI International Inc. is on contract with SAALC/LDAD, the Air Force engine tester program management office, to build an Engine Test/Trim Automated System II (ETTAS II) using Commercial Off The Shelf (COTS) hardware and software. This tester will ultimately replace the three aircraft engine test systems currently used by the Air Force, all of which are becoming increasingly difficult to maintain doe to hardware/software obsolescence problems. In keeping with the COTS requirement, we chose to develop our data acquisition and test program software in LabVIEW 4.0.1 for Windows NT/95. This paper discusses the advantages we have gained in using LabVIEW 4.0.1, a graphical programming language, rather than a conventional programming language as our software development environment. We detail how we were able to take advantage of LabVIEW's instrument control capabilities to optimize our VXI data acquisition process. We then discuss how LabVIEW can be used not only as an instrument control language, but also as a general purpose programming language. We discuss how we used LabVIEW for test program set (TPS) development and for rapidly prototyping user interfaces and program features for immediate operator/customer feedback. The paper also details how LabVIEW enabled os to readily establish a core of \"generic\" VIs (virtual instruments) for subsequent reuse in developing additional TPS for other aircraft engine types/variants.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127843513","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century
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