1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century最新文献
Pub Date : 1997-09-22DOI: 10.1109/AUTEST.1997.633542
L. Su, C. Bosco, W. England
The Department of Defense is in the process of digitizing paper technical manuals (TMs). This consists, mainly, of direct copy to disk, with only a few being upgraded to Electronic Technical Manual (ETM) or Interactive Electronic Technical Manual (IETM). However, there is no clear-cut methodology for cost-effectively converting paper manual to various levels of upgrade. The Advanced Technology Office, the US Army Test, Measurement, and Diagnostics Equipment Activity the US Army Missile Command, has investigated the conversion technologies/tools and developed conversion procedures that can achieve these goals: the most cost effective, value-added, and user-friendly ETM/IETM. The authors provide some guidelines to assist the ETMs/IETMs developers to achieve these goals.
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Pub Date : 1997-09-22DOI: 10.1109/AUTEST.1997.633540
L. Pace, R. Negron, T. Erickson
The Advanced Airlift Interactive Maintenance System (AAIMS) concept is both an on-aircraft and off-aircraft information system that gathers, correlates, and processes aircraft data; automates the debrief process; provides historical data for each aircraft tail number as well as the entire fleet; provides the ability to interactively diagnose the aircraft. The objective of AAIMS is to improve mission effectiveness, reduce life-cycle costs and maintenance man-hours per flight-hour, and decrease aircraft turnaround time. AAIMS also provides the data collection mechanisms to interface to the Integrated Maintenance Data System (IMDS).
{"title":"C-17 advanced automated interactive maintenance system","authors":"L. Pace, R. Negron, T. Erickson","doi":"10.1109/AUTEST.1997.633540","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633540","url":null,"abstract":"The Advanced Airlift Interactive Maintenance System (AAIMS) concept is both an on-aircraft and off-aircraft information system that gathers, correlates, and processes aircraft data; automates the debrief process; provides historical data for each aircraft tail number as well as the entire fleet; provides the ability to interactively diagnose the aircraft. The objective of AAIMS is to improve mission effectiveness, reduce life-cycle costs and maintenance man-hours per flight-hour, and decrease aircraft turnaround time. AAIMS also provides the data collection mechanisms to interface to the Integrated Maintenance Data System (IMDS).","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130758079","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1997-09-22DOI: 10.1109/AUTEST.1997.643996
D.R. Pressler
Over the past 40 years, the strategic planning concept evolved at an increasing rate. Practical applications of strategic planning are now being fine-tuned, and the continued studies of strategy have reached what is referred to in academia as "third generation". McDonnell Douglas Corporation (MDC) C-17 Support Equipment (SE) is engaged in strategically motivated integrated product teams and process improvement activities to International Standards Organization (ISO) and Software Engineering Institute (SEI) standards. The Test Program Set (TPS) organization is pursuing SEI Level 3 compliance by the end of 1997. The TPS industry is inherently a straightforward and regimented software development environment. It would therefore appear that attainment of SEI Level 3 compliance could be achieved with ease. The report constitutes a reality check, a snapshot of the MDC C-17 SE TPS department's process improvement effort at publication, and assesses the operational and strategic health of the department due to the SEI Level 3 compliance effort.
在过去的40年里，战略规划概念的发展速度越来越快。战略规划的实际应用现在正在微调，对战略的持续研究已达到学术界所称的“第三代”。麦克唐纳道格拉斯公司(MDC)的C-17支持设备(SE)从事战略激励的集成产品团队和过程改进活动，以达到国际标准组织(ISO)和软件工程研究所(SEI)的标准。到1997年底，测试程序集(TPS)组织正在追求SEI 3级合规。TPS行业本质上是一个直接的、有组织的软件开发环境。因此，似乎可以很容易地达到SEI第3级合规。该报告构成了现实检查，是MDC C-17 SE TPS部门在发布时流程改进工作的快照，并评估了该部门由于SEI 3级合规工作而产生的运营和战略健康状况。
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Pub Date : 1997-09-22DOI: 10.1109/AUTEST.1997.633684
L. J. Stockwell
Over the pest eighteen years, Boeing has developed and distributed thirty-seven ATS-182 test systems, to support maintenance of 737/757/767/747-400 avionics LRUs. These systems were provided to support electronics manufacturing commercial airline maintenance and Boeing Service Centers. Over 1000 Test Program Sets have been developed for the ATS-182. Within the aircraft industry, it is not uncommon to have an airplane with a life expectancy of over thirty-five years. With test equipment life expectancy averaging ten to fifteen years, at least two or more iterations of test equipment are expected during the life cycle of an aircraft. The ATS-182 was designed and developed in the late seventies, and the test systems have been provided since the eighties. As these systems approach terminal life expectancy, obsolescence becomes a major issue. To resolve this problem, Boeing has taken multiple steps to extend the life expectancy of the systems well into the next century. Upwards compatibility of the 1000 TPSs is one of the most prominent issues addressed. Boeing has made an extensive push in the use of new technology to ensure total operability of the existing TPS suite on the upgraded systems.
{"title":"Life of commercial ATS, a legacy story","authors":"L. J. Stockwell","doi":"10.1109/AUTEST.1997.633684","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633684","url":null,"abstract":"Over the pest eighteen years, Boeing has developed and distributed thirty-seven ATS-182 test systems, to support maintenance of 737/757/767/747-400 avionics LRUs. These systems were provided to support electronics manufacturing commercial airline maintenance and Boeing Service Centers. Over 1000 Test Program Sets have been developed for the ATS-182. Within the aircraft industry, it is not uncommon to have an airplane with a life expectancy of over thirty-five years. With test equipment life expectancy averaging ten to fifteen years, at least two or more iterations of test equipment are expected during the life cycle of an aircraft. The ATS-182 was designed and developed in the late seventies, and the test systems have been provided since the eighties. As these systems approach terminal life expectancy, obsolescence becomes a major issue. To resolve this problem, Boeing has taken multiple steps to extend the life expectancy of the systems well into the next century. Upwards compatibility of the 1000 TPSs is one of the most prominent issues addressed. Boeing has made an extensive push in the use of new technology to ensure total operability of the existing TPS suite on the upgraded systems.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121669719","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/AUTEST.1997.633568
M. Ben-Bassat, I. Beniaminy, D. Joseph
Increasingly complex test equipment, complex technologies, growing pressure on technicians' and engineers' performance, and the need for integrated knowledge during the problem-resolution process, are all demanding a higher level of expertise and a new approach to training.
{"title":"Intelligent computer based training","authors":"M. Ben-Bassat, I. Beniaminy, D. Joseph","doi":"10.1109/AUTEST.1997.633568","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633568","url":null,"abstract":"Increasingly complex test equipment, complex technologies, growing pressure on technicians' and engineers' performance, and the need for integrated knowledge during the problem-resolution process, are all demanding a higher level of expertise and a new approach to training.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121181407","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/AUTEST.1997.633544
R. Major, J. Mera
This paper traces the evolution of the U.S. Air Force C-5 aircraft G-File from a paper based system to a digital technical order system (DTOS). The C-5 DTOS replaced over 275 kilograms (600 pounds) of paper based documentation carried aboard the aircraft with 12 compact discs (CD). More importantly, it allows maintenance personnel to focus totally on aircraft maintenance, by relieving them of the technical data maintenance chore. The system is providing flightline personnel access to digital technical data to support aircraft maintenance today. The electronic C-5 Technical Orders (TO) are also hosted on local area networks (LAN), at various bases, providing access to TO data for many more military and civilian personnel involved in the C-5, such as logisticians, project officers, TO managers, etc. The savings in fuel, due to the reduction in weight, plus the reduction in manpower, due to the eliminated requirement for flightline TO maintenance, was sufficient to provide an acceptable return on investment (ROI). The ROI is further enhanced by harder to measure factors such as improved aircraft mission readiness, decreased aircraft TO replacement costs, and increased productivity.
{"title":"C-5 digital technical order system (G-File)","authors":"R. Major, J. Mera","doi":"10.1109/AUTEST.1997.633544","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633544","url":null,"abstract":"This paper traces the evolution of the U.S. Air Force C-5 aircraft G-File from a paper based system to a digital technical order system (DTOS). The C-5 DTOS replaced over 275 kilograms (600 pounds) of paper based documentation carried aboard the aircraft with 12 compact discs (CD). More importantly, it allows maintenance personnel to focus totally on aircraft maintenance, by relieving them of the technical data maintenance chore. The system is providing flightline personnel access to digital technical data to support aircraft maintenance today. The electronic C-5 Technical Orders (TO) are also hosted on local area networks (LAN), at various bases, providing access to TO data for many more military and civilian personnel involved in the C-5, such as logisticians, project officers, TO managers, etc. The savings in fuel, due to the reduction in weight, plus the reduction in manpower, due to the eliminated requirement for flightline TO maintenance, was sufficient to provide an acceptable return on investment (ROI). The ROI is further enhanced by harder to measure factors such as improved aircraft mission readiness, decreased aircraft TO replacement costs, and increased productivity.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"86 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132736397","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/AUTEST.1997.633688
D. Bergfeld
The following is a description of a general purpose display designed to emulate mission displays, which would normally require the use of additional equipment. The device is configurable to accept RS-170, RS-343, Stroke and VGA RGB video. The paper discusses the operational and design concepts of the device.
{"title":"Integrated display for functional emulation during test","authors":"D. Bergfeld","doi":"10.1109/AUTEST.1997.633688","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633688","url":null,"abstract":"The following is a description of a general purpose display designed to emulate mission displays, which would normally require the use of additional equipment. The device is configurable to accept RS-170, RS-343, Stroke and VGA RGB video. The paper discusses the operational and design concepts of the device.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"222 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116385160","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/AUTEST.1997.633618
T. Lingenfelter, H. Beardsley
Test equipment and other products that support test have continuously evolved along with the rest of the electronics technology. That is, for the same or better performance, modern test equipment packaging is much smaller and lower cost. In addition, test equipment controls and data interface directly with a computer data bus and/or standard computer I/O. Modern test equipment, PC computers, windows operating systems, high level test languages, and test programs can be combined in a system design that. Provides weapon system electronics testing at all levels of operational support (from depot to forward operating base). Therefore, a test system design and test program sets can be made for a weapon system that replaces the present practice of multiple specialized designs. The same can be said for supporting several different weapon systems deployed to the same forward operating base. This common test system design concept provides significant cost savings and increased support flexibility. This paper addresses the following topics: (i) test systems role in weapon system operational support; (ii) types of electronics testing required; (iii) COTS hardware and software test systems; (iv) one test system design that can do it all; (v) concept of operation; (vi) real test system example.
{"title":"Total operational support test systems for weapon system electronics","authors":"T. Lingenfelter, H. Beardsley","doi":"10.1109/AUTEST.1997.633618","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633618","url":null,"abstract":"Test equipment and other products that support test have continuously evolved along with the rest of the electronics technology. That is, for the same or better performance, modern test equipment packaging is much smaller and lower cost. In addition, test equipment controls and data interface directly with a computer data bus and/or standard computer I/O. Modern test equipment, PC computers, windows operating systems, high level test languages, and test programs can be combined in a system design that. Provides weapon system electronics testing at all levels of operational support (from depot to forward operating base). Therefore, a test system design and test program sets can be made for a weapon system that replaces the present practice of multiple specialized designs. The same can be said for supporting several different weapon systems deployed to the same forward operating base. This common test system design concept provides significant cost savings and increased support flexibility. This paper addresses the following topics: (i) test systems role in weapon system operational support; (ii) types of electronics testing required; (iii) COTS hardware and software test systems; (iv) one test system design that can do it all; (v) concept of operation; (vi) real test system example.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134039483","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/AUTEST.1997.633683
J.L. Carambot, C. Tarantino, J. Rubin
Providing improved Information Technology for the 21st century is the subject of high visibility in today's DoD. In light of shrinking budgets and subsequent increased demand for resources, battlefield dominance is seen as a product of infrastructure and information dissemination. Efficient execution of these two elements can move milestone steps toward information superiority a joint warfighting vision for every arm of DoD services worldwide. It is now clear that the DoD is field/fleet driven to accelerate the transition to P/spl chi/-based tactical and tactical support warfighting networks. This paper discusses several approaches by which one application of the Telelogistics work flow management system promotes tactical support networks at reduced cost and improved customer service across all DoD services.
{"title":"Telelogistics and IT21 compliance","authors":"J.L. Carambot, C. Tarantino, J. Rubin","doi":"10.1109/AUTEST.1997.633683","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633683","url":null,"abstract":"Providing improved Information Technology for the 21st century is the subject of high visibility in today's DoD. In light of shrinking budgets and subsequent increased demand for resources, battlefield dominance is seen as a product of infrastructure and information dissemination. Efficient execution of these two elements can move milestone steps toward information superiority a joint warfighting vision for every arm of DoD services worldwide. It is now clear that the DoD is field/fleet driven to accelerate the transition to P/spl chi/-based tactical and tactical support warfighting networks. This paper discusses several approaches by which one application of the Telelogistics work flow management system promotes tactical support networks at reduced cost and improved customer service across all DoD services.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130353518","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/AUTEST.1997.633650
M.E. Lovelace
There are many Design For Test techniques, and even a brief discussion on each would require considerable timer and effort. Therefore, this paper will only address the areas of Nodal Visibility and Built-in-Test. The area of nodal visibility addresses two methods of providing signal access points, and two methods of effectively increasing the number of signal access point by using some added circuitry. The BIT application section provides a method for testing the power supply voltage monitors to verify that a power supply failure will actually result in a failure indication and an example of a parallel data acquisition system.
{"title":"Design-for-test techniques","authors":"M.E. Lovelace","doi":"10.1109/AUTEST.1997.633650","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633650","url":null,"abstract":"There are many Design For Test techniques, and even a brief discussion on each would require considerable timer and effort. Therefore, this paper will only address the areas of Nodal Visibility and Built-in-Test. The area of nodal visibility addresses two methods of providing signal access points, and two methods of effectively increasing the number of signal access point by using some added circuitry. The BIT application section provides a method for testing the power supply voltage monitors to verify that a power supply failure will actually result in a failure indication and an example of a parallel data acquisition system.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132595510","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century
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