1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century最新文献
Pub Date : 1997-09-22DOI: 10.1109/AUTEST.1997.633672
M. Blair
Earlier this year, the IEEE approved a new test interface standard called IEEE Std 993-Test Equipment Description Language (TEDL). For many years, industry has bridged the gap between test language standards, such as ATLAS and instrumentation standards such as GPIB and VXI, using non standard terminology. This new standard will provide a standard interface between test specifications on the one hand and instrumentation control on the other hand. The purpose of this paper is: (i) to describe the new TEDL standard; (ii) to highlight areas where TEDL could be used; (iii) to explain the way forward and future development of the standard. The TEDL Standard. This section of the paper will define the layered approach adopted and describe the three basic TEDL models, namely the Adaptation Model (AM), the Configuration Model (CM) and the Device Model (DM). The AM is the logical model for describing the interconnection between the ATE interface, the adapter devices (if any) and the UUT interface. One AM is typically associated with each adapter. The CM is the logical model for identifying the elements of an ATE, as well as describing their interconnection and intercommunication in the test environment One CM is associated with each ATE. The primary purpose of the DM is to provide a description of the capabilities of the ATE and adapter devices and to define how these devices are controlled. One DM is necessary for each different device associated with an ATE. TEDL will be used as an integral part of an ATE Software System where test programs written in ATLAS (or equivalent signal orientated language) are compiled, translated or interpreted into commands that control the ATE instrumentation.
{"title":"TEDL-a new test interface standard from the IEEE","authors":"M. Blair","doi":"10.1109/AUTEST.1997.633672","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633672","url":null,"abstract":"Earlier this year, the IEEE approved a new test interface standard called IEEE Std 993-Test Equipment Description Language (TEDL). For many years, industry has bridged the gap between test language standards, such as ATLAS and instrumentation standards such as GPIB and VXI, using non standard terminology. This new standard will provide a standard interface between test specifications on the one hand and instrumentation control on the other hand. The purpose of this paper is: (i) to describe the new TEDL standard; (ii) to highlight areas where TEDL could be used; (iii) to explain the way forward and future development of the standard. The TEDL Standard. This section of the paper will define the layered approach adopted and describe the three basic TEDL models, namely the Adaptation Model (AM), the Configuration Model (CM) and the Device Model (DM). The AM is the logical model for describing the interconnection between the ATE interface, the adapter devices (if any) and the UUT interface. One AM is typically associated with each adapter. The CM is the logical model for identifying the elements of an ATE, as well as describing their interconnection and intercommunication in the test environment One CM is associated with each ATE. The primary purpose of the DM is to provide a description of the capabilities of the ATE and adapter devices and to define how these devices are controlled. One DM is necessary for each different device associated with an ATE. TEDL will be used as an integral part of an ATE Software System where test programs written in ATLAS (or equivalent signal orientated language) are compiled, translated or interpreted into commands that control the ATE instrumentation.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116917150","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1997-09-22DOI: 10.1109/AUTEST.1997.633639
J. Molnár, R. Zhorofsky
The architecture and implementation of a W-Band signal generator are described. The architecture presented highlights the developmental areas of: the signal source, frequency control, output control and modulation. Voltage controlled oscillators (VCOs) were developed to provide frequency agility, to enhance the viability of frequency modulation (FM) characteristics, and to improve weight and power management requirements. Frequency control and phase coherence were achieved through the exploitation of digital phase lock loop (PLL) techniques. PIN diode attenuators that were developed cover the entire W-Band and provide the capacity for output level control. Additionally, the attenuators provide the capacity for amplitude modulation (AM) and pulse modulation (PM) because of the attenuation flatness (<5 dB), large dynamic range (>40 dB) and modulation bandwidth. A prototype has been developed to demonstrate the feasibility. The final implementation will be integrated into a C-sized VXI module chassis.
{"title":"W-band synthesized signal generator using fundamental voltage controlled oscillators","authors":"J. Molnár, R. Zhorofsky","doi":"10.1109/AUTEST.1997.633639","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633639","url":null,"abstract":"The architecture and implementation of a W-Band signal generator are described. The architecture presented highlights the developmental areas of: the signal source, frequency control, output control and modulation. Voltage controlled oscillators (VCOs) were developed to provide frequency agility, to enhance the viability of frequency modulation (FM) characteristics, and to improve weight and power management requirements. Frequency control and phase coherence were achieved through the exploitation of digital phase lock loop (PLL) techniques. PIN diode attenuators that were developed cover the entire W-Band and provide the capacity for output level control. Additionally, the attenuators provide the capacity for amplitude modulation (AM) and pulse modulation (PM) because of the attenuation flatness (<5 dB), large dynamic range (>40 dB) and modulation bandwidth. A prototype has been developed to demonstrate the feasibility. The final implementation will be integrated into a C-sized VXI module chassis.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129419323","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1997-09-22DOI: 10.1109/AUTEST.1997.633615
M. D. Cadogan, J. M. Moorehead
This paper describes the integration efforts by Teradyne and Hewlett-Packard to produce the Radio Frequency Analog Digital (RFAD) tester for the B-2 Depot at Tinker AFB. The objective was to combine commercial-off-the-shelf (COTS) components while meeting the depot's system-level performance requirements. This paper discusses aspects of the integration effort, including hardware integration and test, software integration, and verification of system specifications. Hardware topics include the use of a matrix switching configuration to provide hybrid digital/analog pins and an RF interface switch matrix to ensure signal integrity at the RF system interface. Software topics include the integration of Teradyne's ProgramGuide software with Hewlett-Packard's Visual Engineering Environment (HP VEE) to provide a single, integrated test executive environment. The paper also discusses the self-test and normalization techniques used to ensure signal specifications are met at the RFAD's interfaces. The conclusion summarizes the challenges of integrating COTS test hardware and software on the scale required by the B-2 Depot, and describes technology that can be applied to a wide range of avionics applications.
{"title":"A full-function COTS tester for B-2 avionics","authors":"M. D. Cadogan, J. M. Moorehead","doi":"10.1109/AUTEST.1997.633615","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633615","url":null,"abstract":"This paper describes the integration efforts by Teradyne and Hewlett-Packard to produce the Radio Frequency Analog Digital (RFAD) tester for the B-2 Depot at Tinker AFB. The objective was to combine commercial-off-the-shelf (COTS) components while meeting the depot's system-level performance requirements. This paper discusses aspects of the integration effort, including hardware integration and test, software integration, and verification of system specifications. Hardware topics include the use of a matrix switching configuration to provide hybrid digital/analog pins and an RF interface switch matrix to ensure signal integrity at the RF system interface. Software topics include the integration of Teradyne's ProgramGuide software with Hewlett-Packard's Visual Engineering Environment (HP VEE) to provide a single, integrated test executive environment. The paper also discusses the self-test and normalization techniques used to ensure signal specifications are met at the RFAD's interfaces. The conclusion summarizes the challenges of integrating COTS test hardware and software on the scale required by the B-2 Depot, and describes technology that can be applied to a wide range of avionics applications.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128749976","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1997-09-22DOI: 10.1109/AUTEST.1997.643993
A. Kildishev, S. Volokhov, J.D. Saltykov
We report a solution of the instrumentation problems in measuring spacecraft magnetic parameters. A list of the main magnetic parameters is considered. The development basics of both static and dynamic magnetic measuring systems are presented. The brief descriptions are also given to analyse and compare the systems.
{"title":"Measurement of the spacecraft main magnetic parameters","authors":"A. Kildishev, S. Volokhov, J.D. Saltykov","doi":"10.1109/AUTEST.1997.643993","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.643993","url":null,"abstract":"We report a solution of the instrumentation problems in measuring spacecraft magnetic parameters. A list of the main magnetic parameters is considered. The development basics of both static and dynamic magnetic measuring systems are presented. The brief descriptions are also given to analyse and compare the systems.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"129 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116206607","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1997-09-22DOI: 10.1109/AUTEST.1997.633635
V. Zagursky, D. Zibinch
In this paper the question of creation of high-throughput communication network architecture is described. The paper deals with the problem of contention-free access which determines an utilization of active medium and throughput in this area networks. The solution of this problem is considered within the framework of a star network topology with an active center. It is demonstrated that distributed management of the resources of the transmitting medium is possible. The development of networks with more complex topology, on the basis of the elementary star topology ender consideration, is analyzed.
{"title":"Architecture of high-throughput network with active transmission medium","authors":"V. Zagursky, D. Zibinch","doi":"10.1109/AUTEST.1997.633635","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633635","url":null,"abstract":"In this paper the question of creation of high-throughput communication network architecture is described. The paper deals with the problem of contention-free access which determines an utilization of active medium and throughput in this area networks. The solution of this problem is considered within the framework of a star network topology with an active center. It is demonstrated that distributed management of the resources of the transmitting medium is possible. The development of networks with more complex topology, on the basis of the elementary star topology ender consideration, is analyzed.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126403491","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1997-09-22DOI: 10.1109/AUTEST.1997.633665
W. V. Barnishan
This paper will discuss automated alternatives to traditionally manual Test Program (TP) re-host tasks using Commercial Off The Shelf (COTS) software tools. It will present the concept of a relational database and an object-oriented design. This paper will address incorporating a relational database back end in an object-oriented design for TP re-host as well as common software engines to be considered. This paper will discuss several existing object oriented tools designed to expedite all phases of a TP re-host effort.
{"title":"Re-host automation of signal based test programs utilizing a COTS software tools","authors":"W. V. Barnishan","doi":"10.1109/AUTEST.1997.633665","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633665","url":null,"abstract":"This paper will discuss automated alternatives to traditionally manual Test Program (TP) re-host tasks using Commercial Off The Shelf (COTS) software tools. It will present the concept of a relational database and an object-oriented design. This paper will address incorporating a relational database back end in an object-oriented design for TP re-host as well as common software engines to be considered. This paper will discuss several existing object oriented tools designed to expedite all phases of a TP re-host effort.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126644990","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1997-09-22DOI: 10.1109/AUTEST.1997.633669
J. Kasprick
This paper describes several capabilities that greatly improve the test program set (TPS) debug and integration efforts. As TPS debug and integration activities are significant cost factors in TPS development, improvements in this phase offer potentially high returns. Important considerations include hardware and software architecture decisions, instrument interface visibility, interactive control, degree of simulation, and various modes of controlling and monitoring execution. Specific operation of various capabilities is also discussed as are the benefits to TPS debug and integration.
{"title":"Test executive features for improved TPS debug","authors":"J. Kasprick","doi":"10.1109/AUTEST.1997.633669","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633669","url":null,"abstract":"This paper describes several capabilities that greatly improve the test program set (TPS) debug and integration efforts. As TPS debug and integration activities are significant cost factors in TPS development, improvements in this phase offer potentially high returns. Important considerations include hardware and software architecture decisions, instrument interface visibility, interactive control, degree of simulation, and various modes of controlling and monitoring execution. Specific operation of various capabilities is also discussed as are the benefits to TPS debug and integration.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126841920","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1997-09-22DOI: 10.1109/AUTEST.1997.633561
B. Ishmael, Dale S. Brown, J. Kohler, D. Longley, D. Paros, W. Dearborn, D. Paige, E. Tsang, Lockheed Martin, Roy Iwata
The United States Marine Corps (USMC) has a requirement to develop Test Program Sets (TPSs), reduce costs, and provide compatibility with other testers. The USMC Automated Test Support Unit (ATSU), Lockheed Martin Federal Systems (LMFS), and Naval Weapon Station (NWS) teamed together to develop methods and procedures that would implement an open architecture TPS development environment. A Broad Based Environment for Testing (ABBET) standard established the baseline for this architecture, and the business process reengineering analysis produced the Model-Based Programming (MBP) Project. MBP has been designed to standardize test programs that are unit under test (UUT)-specific and Automated Test Equipment (ATE)-independent. "TO-BE" information models were developed and analyzed to predict the intended information flow under the MBP-enhanced TPS development process. Currently, the USMC is planning to migrate to the Third Echelon Test Set (TETS) in 1998. As the TETS becomes available, the MBP Project will provide TPSs that can be fielded to TETS or targeted to other DoD ATE platforms. While the original TPSs development process remains unchanged, data bases and tools technologically enhance development to yield improved TPSs quality, consistency, compatibility and reduce costs.
{"title":"USMC model-based programming (MBP) project","authors":"B. Ishmael, Dale S. Brown, J. Kohler, D. Longley, D. Paros, W. Dearborn, D. Paige, E. Tsang, Lockheed Martin, Roy Iwata","doi":"10.1109/AUTEST.1997.633561","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633561","url":null,"abstract":"The United States Marine Corps (USMC) has a requirement to develop Test Program Sets (TPSs), reduce costs, and provide compatibility with other testers. The USMC Automated Test Support Unit (ATSU), Lockheed Martin Federal Systems (LMFS), and Naval Weapon Station (NWS) teamed together to develop methods and procedures that would implement an open architecture TPS development environment. A Broad Based Environment for Testing (ABBET) standard established the baseline for this architecture, and the business process reengineering analysis produced the Model-Based Programming (MBP) Project. MBP has been designed to standardize test programs that are unit under test (UUT)-specific and Automated Test Equipment (ATE)-independent. \"TO-BE\" information models were developed and analyzed to predict the intended information flow under the MBP-enhanced TPS development process. Currently, the USMC is planning to migrate to the Third Echelon Test Set (TETS) in 1998. As the TETS becomes available, the MBP Project will provide TPSs that can be fielded to TETS or targeted to other DoD ATE platforms. While the original TPSs development process remains unchanged, data bases and tools technologically enhance development to yield improved TPSs quality, consistency, compatibility and reduce costs.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"85 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127007502","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1997-09-22DOI: 10.1109/AUTEST.1997.633631
J. Scully, A. W. Meyer
Spaceborne devices demand high standards of reliability that in turn, must be met by rigorous testing. The multiplexers/demultiplexers (MDMs) used on the International Space Station for measurement and control represent a typical example of these devices. In order to test the MDMs, and in order to support development and testing of MDM software. It became necessary to develop an SES (sensor and effector simulator) system consisting of a primarily COTS, VXI based, SES hardware console, and SES application control software, programmed in C and running under Windows 95. The SES system simulates external equipment in real time, by generating sensor stimulus to the MDM and by receiving effector responses from the MDM. The SES application control software supports the simulation process by responding to SCSI commands from the simulation environment. The SES responds to these commands by formatting and controlling the application of sensor stimulus commanded by the simulation environment, and by formatting and transmitting effector responses to the simulation environment. This permits the SES system to operate in a real time loop consisting of the simulation environment, the SES itself and a multi channel MDM, which, in turn, enables the MDM to be thoroughly tested by interacting with a faithful simulation of its external environment.
{"title":"The characteristics of application control software for a space station sensor and effector simulator","authors":"J. Scully, A. W. Meyer","doi":"10.1109/AUTEST.1997.633631","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633631","url":null,"abstract":"Spaceborne devices demand high standards of reliability that in turn, must be met by rigorous testing. The multiplexers/demultiplexers (MDMs) used on the International Space Station for measurement and control represent a typical example of these devices. In order to test the MDMs, and in order to support development and testing of MDM software. It became necessary to develop an SES (sensor and effector simulator) system consisting of a primarily COTS, VXI based, SES hardware console, and SES application control software, programmed in C and running under Windows 95. The SES system simulates external equipment in real time, by generating sensor stimulus to the MDM and by receiving effector responses from the MDM. The SES application control software supports the simulation process by responding to SCSI commands from the simulation environment. The SES responds to these commands by formatting and controlling the application of sensor stimulus commanded by the simulation environment, and by formatting and transmitting effector responses to the simulation environment. This permits the SES system to operate in a real time loop consisting of the simulation environment, the SES itself and a multi channel MDM, which, in turn, enables the MDM to be thoroughly tested by interacting with a faithful simulation of its external environment.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130573699","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1997-09-22DOI: 10.1109/AUTEST.1997.633647
D. Majernik, B. Lynch, C. Siegel, D. Teegarden, R. Eram
By using mixed-signal simulation, the test engineer can obtain the nominal operation and operational range of an analog or mixed-signal device, board, or subsystem. The engineer can also study how the Device Under Test will operate if a component were to fail. For each test, the engineer can specify a sequence of single-point, hard faults, analyze the resultant measurement data, and compare the results with previously determined test limits. Analysis of injected faults produces a Fault Table which presents a fault coverage summary of the tests in the proposed TPS. This table will allow the test engineer to evaluate the quality and fault coverage of TPSs. Using simulation, the test engineer can also analyze the results of TPSs to efficiently isolate a failure in the DUT, leading to potentially significant savings in repair times. By using simulation capabilities of the Saber simulator and the AIM scripting language, the engineer can evaluate performance of the DUT under a wide range of failure conditions without needing to exercise the DUT on the ATE tester hardware. This paper presents a methodology which allows the test engineer to modify the simulation model of the DUT to include component failure effects. Through simulation, circuit behavior is predicted as each component within the DUT is failed in a user-specified sequence. The results of this fault analysis are compiled automatically. They specify the anticipated fault coverage of the TPS and facilitate creation of a fault dictionary for later use.
{"title":"Using simulation to improve fault coverage of analog and mixed-signal test program sets","authors":"D. Majernik, B. Lynch, C. Siegel, D. Teegarden, R. Eram","doi":"10.1109/AUTEST.1997.633647","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633647","url":null,"abstract":"By using mixed-signal simulation, the test engineer can obtain the nominal operation and operational range of an analog or mixed-signal device, board, or subsystem. The engineer can also study how the Device Under Test will operate if a component were to fail. For each test, the engineer can specify a sequence of single-point, hard faults, analyze the resultant measurement data, and compare the results with previously determined test limits. Analysis of injected faults produces a Fault Table which presents a fault coverage summary of the tests in the proposed TPS. This table will allow the test engineer to evaluate the quality and fault coverage of TPSs. Using simulation, the test engineer can also analyze the results of TPSs to efficiently isolate a failure in the DUT, leading to potentially significant savings in repair times. By using simulation capabilities of the Saber simulator and the AIM scripting language, the engineer can evaluate performance of the DUT under a wide range of failure conditions without needing to exercise the DUT on the ATE tester hardware. This paper presents a methodology which allows the test engineer to modify the simulation model of the DUT to include component failure effects. Through simulation, circuit behavior is predicted as each component within the DUT is failed in a user-specified sequence. The results of this fault analysis are compiled automatically. They specify the anticipated fault coverage of the TPS and facilitate creation of a fault dictionary for later use.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131914726","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century
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