1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century最新文献
Pub Date : 1997-09-22DOI: 10.1109/AUTEST.1997.633622
W. Hartmann
The Department of Defense has decreed that all new or upgraded laboratory facilities must use an architecture that is highly flexible. New Designs must have sufficient flexibility to satisfy future needs, make maximum use of commercial off-the-shelf products, include products with built-in vendor support, and adhere to DoD and industry standards. Under contract to the US Air Force, AIL Systems Inc./Technical Services Operations developed an advanced electronic warfare system consisting of real-time and non real-time networks. The laboratory encompasses digital, radio frequency, and platform simulation and measurements. This paper describes the architecture used in the laboratory to tie together the disparate elements of digital, radio frequency, and avionics simulators in a manner that is both cost effective and flexible. The program yielded an electronic warfare assessment system suitable for either man-in-the-loop or automatic testing.
{"title":"Advanced electronic counter-measures laboratory design","authors":"W. Hartmann","doi":"10.1109/AUTEST.1997.633622","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633622","url":null,"abstract":"The Department of Defense has decreed that all new or upgraded laboratory facilities must use an architecture that is highly flexible. New Designs must have sufficient flexibility to satisfy future needs, make maximum use of commercial off-the-shelf products, include products with built-in vendor support, and adhere to DoD and industry standards. Under contract to the US Air Force, AIL Systems Inc./Technical Services Operations developed an advanced electronic warfare system consisting of real-time and non real-time networks. The laboratory encompasses digital, radio frequency, and platform simulation and measurements. This paper describes the architecture used in the laboratory to tie together the disparate elements of digital, radio frequency, and avionics simulators in a manner that is both cost effective and flexible. The program yielded an electronic warfare assessment system suitable for either man-in-the-loop or automatic testing.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129140542","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1997-09-22DOI: 10.1109/AUTEST.1997.633656
H. Dill, K. Bratton, C. Sparr, L. Pitzen
This paper describes the fault definition, simulation, test strategy development and validation activities that were accomplished during beta testing of a new CAE tool, Test Designer. It addresses the issues of simulation convergence, component fault models, circuit model implementation, simulation run times and test strategy accuracy. To ensure a realistic test of Test Designer's capabilities, diagnostics were developed for a moderately complex analog and mixed signal UUT which was selected from the Navy's list of CASS TPS offload candidates. These diagnostics were evaluated on the CASS to measure the diagnostic sequence accuracy and to assess the ability of Test Designer to predict the nominal measurement values and fault detection characteristics of each test.
{"title":"Application of analog and mixed signal simulation techniques to the synthesis and sequencing of diagnostic tests","authors":"H. Dill, K. Bratton, C. Sparr, L. Pitzen","doi":"10.1109/AUTEST.1997.633656","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633656","url":null,"abstract":"This paper describes the fault definition, simulation, test strategy development and validation activities that were accomplished during beta testing of a new CAE tool, Test Designer. It addresses the issues of simulation convergence, component fault models, circuit model implementation, simulation run times and test strategy accuracy. To ensure a realistic test of Test Designer's capabilities, diagnostics were developed for a moderately complex analog and mixed signal UUT which was selected from the Navy's list of CASS TPS offload candidates. These diagnostics were evaluated on the CASS to measure the diagnostic sequence accuracy and to assess the ability of Test Designer to predict the nominal measurement values and fault detection characteristics of each test.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115689687","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1997-09-22DOI: 10.1109/AUTEST.1997.633629
M. Borrero, J. Deffler
The S_tandard T_est Program Set C_ost M_odel (STCM) is an integrated model suite being developed jointly by Naval Air Warfare Center Aircraft Division Lakehurst (NAWCAD LKE), Naval Aviation Depot Jacksonville (NAOEP JAX), and Test Automation Incorporated (TAI) to provide government agencies with a tool to perform consistent TPS cost estimating across multiple Automatic Test System (ATS) platforms. Through the World Wide Web, STCM will provide the government Test Program Set (TPS) Program Manager(PM) with a comprehensive tool for TPS cost estimating, forecasting, and tracking by capitalizing on the unique capabilities of the following existing software tools for TPS cost estimation and ATS analysis: (i) NAWCAD LKE system synthesis model plus (SSM+) (ii) NADEP JAX Should-Cost TPS Cost Estimate Model (iii) NADEP JAX Auto-ID Merge Model (iv) TAI Cost Asset Schedule Prediction Evaluation Routine (CASPER).
{"title":"Development of a Standard Test Program Set Cost Model","authors":"M. Borrero, J. Deffler","doi":"10.1109/AUTEST.1997.633629","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633629","url":null,"abstract":"The S_tandard T_est Program Set C_ost M_odel (STCM) is an integrated model suite being developed jointly by Naval Air Warfare Center Aircraft Division Lakehurst (NAWCAD LKE), Naval Aviation Depot Jacksonville (NAOEP JAX), and Test Automation Incorporated (TAI) to provide government agencies with a tool to perform consistent TPS cost estimating across multiple Automatic Test System (ATS) platforms. Through the World Wide Web, STCM will provide the government Test Program Set (TPS) Program Manager(PM) with a comprehensive tool for TPS cost estimating, forecasting, and tracking by capitalizing on the unique capabilities of the following existing software tools for TPS cost estimation and ATS analysis: (i) NAWCAD LKE system synthesis model plus (SSM+) (ii) NADEP JAX Should-Cost TPS Cost Estimate Model (iii) NADEP JAX Auto-ID Merge Model (iv) TAI Cost Asset Schedule Prediction Evaluation Routine (CASPER).","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"143 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116209691","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1997-09-22DOI: 10.1109/AUTEST.1997.633638
A. M. P. Marinelli
The Dynamic Range Tester (DRT) is a patented, prototype system designed at the Army Research Laboratory. This useful tool emulates field conditions in the laboratory in order to characterize signal processing hardware with repeatability and reliability. It is a multi-purpose, test instrument that simultaneously generates two highly isolated, wideband, "real-world" signals. The DRT contains precision attenuators that allow the user to independently vary the signal-to-noise ratio (S/N) of each generated signal. This prototype system operates from 30 to 400 MHz, and the patented design is extendible to all frequency ranges to produce useful instrumentation for telecommunications, telemetry, biomedical instrumentation, or other applications. The DRT can be used to determine dynamic range of a radio frequency (RF) system, as well as processing gain and frequency resolution of an acousto-optic (AO) system. It can be used for testing and demonstration purposes, to evaluate a system's tolerance to noisy inputs. It can be used to conduct bandwidth and interference testing and to determine two-tone dynamic range on a dual-input device. In the DRT, the phase of the signals is not controlled. However, the basic DRT design could be amended to include controls for varying the phase of the generated signals, if such a system were needed.
{"title":"The Dynamic Range Tester: a patented, dual-channel, precision signal-to-noise ratio generator","authors":"A. M. P. Marinelli","doi":"10.1109/AUTEST.1997.633638","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633638","url":null,"abstract":"The Dynamic Range Tester (DRT) is a patented, prototype system designed at the Army Research Laboratory. This useful tool emulates field conditions in the laboratory in order to characterize signal processing hardware with repeatability and reliability. It is a multi-purpose, test instrument that simultaneously generates two highly isolated, wideband, \"real-world\" signals. The DRT contains precision attenuators that allow the user to independently vary the signal-to-noise ratio (S/N) of each generated signal. This prototype system operates from 30 to 400 MHz, and the patented design is extendible to all frequency ranges to produce useful instrumentation for telecommunications, telemetry, biomedical instrumentation, or other applications. The DRT can be used to determine dynamic range of a radio frequency (RF) system, as well as processing gain and frequency resolution of an acousto-optic (AO) system. It can be used for testing and demonstration purposes, to evaluate a system's tolerance to noisy inputs. It can be used to conduct bandwidth and interference testing and to determine two-tone dynamic range on a dual-input device. In the DRT, the phase of the signals is not controlled. However, the basic DRT design could be amended to include controls for varying the phase of the generated signals, if such a system were needed.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"164 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127422629","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1997-09-22DOI: 10.1109/AUTEST.1997.633687
D. L. Stanley, R.F. Duncan, G.W. Smith
The development of a PC-based functional test platform that incorporates Statistical Process Control (SPC) and a failure analysis database is described. With Commercial Off-The-Shelf(COTS) tools available it is possible in a low volume high-mix environment to easily obtain basic statistical information on each test, develop an easily accessible database of information on failures, causes of failures and troubleshooting activities and increase test efficiency with minimal test development costs. A common test platform has been developed that can be configured to test a wide variety of sub-assemblies from digital controller cards to radio frequency (RF) modules. The platform consists of a PC with a multi-function data acquisition card and a General Purpose Interface Bus (GPIB) card for control of test instruments. Applications are linked with Dynamic Data Exchange (DDE) and the PCs are connected to the company's Local Area Network (LAN) so that test data can be accessed from throughout the plant. A key point is the implementation of SPC with this test platform. Statistics include process capability indices C/sub p/ and C/sub pk/ and failure rate. Test data is analyzed and used to make process improvements. Examples are presented. Since the entire system has been designed and built around established COTS software and hardware, additional capabilities can be easily added in the future. Some planned enhancements are described.
{"title":"A test platform implementing SPC in a low-volume, high-mix test department","authors":"D. L. Stanley, R.F. Duncan, G.W. Smith","doi":"10.1109/AUTEST.1997.633687","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633687","url":null,"abstract":"The development of a PC-based functional test platform that incorporates Statistical Process Control (SPC) and a failure analysis database is described. With Commercial Off-The-Shelf(COTS) tools available it is possible in a low volume high-mix environment to easily obtain basic statistical information on each test, develop an easily accessible database of information on failures, causes of failures and troubleshooting activities and increase test efficiency with minimal test development costs. A common test platform has been developed that can be configured to test a wide variety of sub-assemblies from digital controller cards to radio frequency (RF) modules. The platform consists of a PC with a multi-function data acquisition card and a General Purpose Interface Bus (GPIB) card for control of test instruments. Applications are linked with Dynamic Data Exchange (DDE) and the PCs are connected to the company's Local Area Network (LAN) so that test data can be accessed from throughout the plant. A key point is the implementation of SPC with this test platform. Statistics include process capability indices C/sub p/ and C/sub pk/ and failure rate. Test data is analyzed and used to make process improvements. Examples are presented. Since the entire system has been designed and built around established COTS software and hardware, additional capabilities can be easily added in the future. Some planned enhancements are described.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"261 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126875068","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1997-09-22DOI: 10.1109/AUTEST.1997.633630
C. Calhoun
This paper describes a general overview of applying Independent Verification and Validation (IV&V) to Automatic Test Equipment (ATE). The overview is not inclusive of all IV&V activities that can occur or of all development and maintenance items that can be validated and verified, during the IV&V process. A sampling of possible IV&V activities that can occur within each phase of the ATE life cycle are described.
{"title":"Applying independent verification & validation to ATE","authors":"C. Calhoun","doi":"10.1109/AUTEST.1997.633630","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633630","url":null,"abstract":"This paper describes a general overview of applying Independent Verification and Validation (IV&V) to Automatic Test Equipment (ATE). The overview is not inclusive of all IV&V activities that can occur or of all development and maintenance items that can be validated and verified, during the IV&V process. A sampling of possible IV&V activities that can occur within each phase of the ATE life cycle are described.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"142 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124447845","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1997-09-22DOI: 10.1109/AUTEST.1997.633571
J. Kneale
This paper describes a diagnostic system that traverses a fault tree to find the shortest path to a result. This differs from many systems using If /Then/ Else statements placed in the test software to direct troubleshooting, and has several unique advantages. Expert system test selection and result evaluation strategies allow diagnostics to be started at any time, even if the previous tests have been executed out of sequence. A simple text tree format captures the fault isolation data. This simplicity eases the entry of troubleshooting information, and increases the effectiveness of the entire system.
{"title":"Application of expert system techniques to fault tree diagnostic data","authors":"J. Kneale","doi":"10.1109/AUTEST.1997.633571","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633571","url":null,"abstract":"This paper describes a diagnostic system that traverses a fault tree to find the shortest path to a result. This differs from many systems using If /Then/ Else statements placed in the test software to direct troubleshooting, and has several unique advantages. Expert system test selection and result evaluation strategies allow diagnostics to be started at any time, even if the previous tests have been executed out of sequence. A simple text tree format captures the fault isolation data. This simplicity eases the entry of troubleshooting information, and increases the effectiveness of the entire system.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"93 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123621277","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1997-09-22DOI: 10.1109/AUTEST.1997.633593
P. Stern
New component technology, made possible by wide acceptance of the VXIplug&play standard, allows ATE buyers to select test system components in much the same way they choose stereo system components. This paper will examine the uses and benefits of component software technology in three different ATE configuration scenarios: updating legacy ATE, integrating component test equipment into larger ATE, and configuring specialized test equipment (STE) for custom requirements. Several possibilities for leveraging new component technology such as high-performance test executives and diagnostic tools are discussed to illustrate the flexibility users will soon have in configuring ATE.
{"title":"High-performance component software changes the rules for configuring ATE","authors":"P. Stern","doi":"10.1109/AUTEST.1997.633593","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633593","url":null,"abstract":"New component technology, made possible by wide acceptance of the VXIplug&play standard, allows ATE buyers to select test system components in much the same way they choose stereo system components. This paper will examine the uses and benefits of component software technology in three different ATE configuration scenarios: updating legacy ATE, integrating component test equipment into larger ATE, and configuring specialized test equipment (STE) for custom requirements. Several possibilities for leveraging new component technology such as high-performance test executives and diagnostic tools are discussed to illustrate the flexibility users will soon have in configuring ATE.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125543232","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1997-09-22DOI: 10.1109/AUTEST.1997.633655
D. Allen
A partial differential operator consisting of phase and enable is defined for Boolean functions associated with combinatorial digital circuitry. The terms of the partial differentials can be used for generation of test vectors and analysis of circuitry.
{"title":"Partial differentiation of Boolean functions with applications to design and test","authors":"D. Allen","doi":"10.1109/AUTEST.1997.633655","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633655","url":null,"abstract":"A partial differential operator consisting of phase and enable is defined for Boolean functions associated with combinatorial digital circuitry. The terms of the partial differentials can be used for generation of test vectors and analysis of circuitry.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130991954","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1997-09-22DOI: 10.1109/AUTEST.1997.633663
K. R. Hilberth
One of the chronic problems associated with Test Program Set (TPS) development has been the lack of unambiguous standards for test definition. Elements of the definition include, but are not necessarily limited to, the questions of what constitutes a test, what aspect or failure mode of the UUT is being addressed by the test, why the test is being performed at that particular point in the overall test flow, and how the test relates to other tests within the main performance verification path or any of the diagnostic branches. Moreover, test definition standards are very closely related to the way in which unambiguous fault defection and fault isolation metrics are implemented, as well as the way in which overall (TPS) test strategy is documented. Definitive standards for test definition will support not only demonstrable TPS quality but also TPS documentation that is both descriptive and indicative of the levels of quality that are being achieved.
{"title":"The impact of test definition standards on TPS quality","authors":"K. R. Hilberth","doi":"10.1109/AUTEST.1997.633663","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633663","url":null,"abstract":"One of the chronic problems associated with Test Program Set (TPS) development has been the lack of unambiguous standards for test definition. Elements of the definition include, but are not necessarily limited to, the questions of what constitutes a test, what aspect or failure mode of the UUT is being addressed by the test, why the test is being performed at that particular point in the overall test flow, and how the test relates to other tests within the main performance verification path or any of the diagnostic branches. Moreover, test definition standards are very closely related to the way in which unambiguous fault defection and fault isolation metrics are implemented, as well as the way in which overall (TPS) test strategy is documented. Definitive standards for test definition will support not only demonstrable TPS quality but also TPS documentation that is both descriptive and indicative of the levels of quality that are being achieved.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"81 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128695677","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century
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