Pub Date : 1996-11-10DOI: 10.1109/ICCAD.1996.569415
V. Narayanan, B. Chappell, B. Fleischer
Static timing analysis techniques are widely used to verify the timing behavior of large digital designs implemented predominantly in conventional static CMOS. These techniques, however, are not sufficient to completely verify the dynamic circuit families now finding favor in high-performance designs. In this paper, we describe an approach that extends static timing analysis to a high-performance dynamic CMOS logic family called self-resetting CMOS (SRCMOS). Due to the circuit structure employed in SRCMOS, designs naturally decompose into a hierarchy of gates and macros; timing analysis must address and preferably exploit this hierarchy. At the gate level, three categories of constraints on pulse timing arise from considering the effects of pulse width, overlap, and collisions. Timing analysis is performed at the macro level, by a) performing timing tests at macro boundaries and b) using macro-level delay models. We define various macro-level timing tests which ensure that fundamental gate-level timing constraints are satisfied. We extend the standard delay model to handle leading and trailing edges of signal pulses, across-chip variations, trading of signals, and slow and fast operating conditions. We have developed an SRCMOS timing analyzer based on this approach; the analyzer implemented as extensions to a standard static timing analysis program, thus facilitating its integration into an existing design system and methodology.
{"title":"Static timing analysis for self resetting circuits","authors":"V. Narayanan, B. Chappell, B. Fleischer","doi":"10.1109/ICCAD.1996.569415","DOIUrl":"https://doi.org/10.1109/ICCAD.1996.569415","url":null,"abstract":"Static timing analysis techniques are widely used to verify the timing behavior of large digital designs implemented predominantly in conventional static CMOS. These techniques, however, are not sufficient to completely verify the dynamic circuit families now finding favor in high-performance designs. In this paper, we describe an approach that extends static timing analysis to a high-performance dynamic CMOS logic family called self-resetting CMOS (SRCMOS). Due to the circuit structure employed in SRCMOS, designs naturally decompose into a hierarchy of gates and macros; timing analysis must address and preferably exploit this hierarchy. At the gate level, three categories of constraints on pulse timing arise from considering the effects of pulse width, overlap, and collisions. Timing analysis is performed at the macro level, by a) performing timing tests at macro boundaries and b) using macro-level delay models. We define various macro-level timing tests which ensure that fundamental gate-level timing constraints are satisfied. We extend the standard delay model to handle leading and trailing edges of signal pulses, across-chip variations, trading of signals, and slow and fast operating conditions. We have developed an SRCMOS timing analyzer based on this approach; the analyzer implemented as extensions to a standard static timing analysis program, thus facilitating its integration into an existing design system and methodology.","PeriodicalId":408850,"journal":{"name":"Proceedings of International Conference on Computer Aided Design","volume":"63 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125619679","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1996-11-10DOI: 10.1109/ICCAD.1996.569610
H. Kondo, K. Cheng
We propose a generalized stuck-at fault model for sequential circuits under the selective I/sub DDQ/ test strategy. The proposed fault model makes a pessimistic assumption on the Boolean fault effects when the fault is activated. We show that by using the proposed fault model, test sequences of higher quality can be generated and/or selected. We further propose a test vector generation and selection method for this fault model. We present results to illustrate that a high fault coverage for the proposed fault model can be achieved by a small test set under the selective I/sub DDQ/ test environment.
{"title":"Driving toward higher I/sub DDQ/ test quality for sequential circuits: A generalized fault model and its ATPG","authors":"H. Kondo, K. Cheng","doi":"10.1109/ICCAD.1996.569610","DOIUrl":"https://doi.org/10.1109/ICCAD.1996.569610","url":null,"abstract":"We propose a generalized stuck-at fault model for sequential circuits under the selective I/sub DDQ/ test strategy. The proposed fault model makes a pessimistic assumption on the Boolean fault effects when the fault is activated. We show that by using the proposed fault model, test sequences of higher quality can be generated and/or selected. We further propose a test vector generation and selection method for this fault model. We present results to illustrate that a high fault coverage for the proposed fault model can be achieved by a small test set under the selective I/sub DDQ/ test environment.","PeriodicalId":408850,"journal":{"name":"Proceedings of International Conference on Computer Aided Design","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127927044","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1996-11-10DOI: 10.1109/ICCAD.1996.569907
D. Kirkpatrick, A. Sangiovanni-Vincentelli
Maintaining signal integrity in digital systems is becoming increasingly difficult due to the rising number of analog effects seen in deep submicron design. One such effect, the signal crosstalk problem, is now a serious design concern. Signals which couple electrically may not affect system behavior because of timing or function in the digital domain. If we can isolate observable coupling then we can constrain layout synthesis to eliminate them. In this paper, we find that it is possible to predict signal interaction by signal functionality alone, leading to a significant amount of robust switching isolation, independent of parasitics introduced by layout or semiconductor process. We introduce techniques to predict signal interaction using functional sensitivity analysis. In general sequential networks we find that significant switching isolation can be extracted with efficient sensitivity analysis algorithms, thus giving promise to the goal of synthesizing layout free from crosstalk effects.
{"title":"Digital sensitivity: predicting signal interaction using functional analysis","authors":"D. Kirkpatrick, A. Sangiovanni-Vincentelli","doi":"10.1109/ICCAD.1996.569907","DOIUrl":"https://doi.org/10.1109/ICCAD.1996.569907","url":null,"abstract":"Maintaining signal integrity in digital systems is becoming increasingly difficult due to the rising number of analog effects seen in deep submicron design. One such effect, the signal crosstalk problem, is now a serious design concern. Signals which couple electrically may not affect system behavior because of timing or function in the digital domain. If we can isolate observable coupling then we can constrain layout synthesis to eliminate them. In this paper, we find that it is possible to predict signal interaction by signal functionality alone, leading to a significant amount of robust switching isolation, independent of parasitics introduced by layout or semiconductor process. We introduce techniques to predict signal interaction using functional sensitivity analysis. In general sequential networks we find that significant switching isolation can be extracted with efficient sensitivity analysis algorithms, thus giving promise to the goal of synthesizing layout free from crosstalk effects.","PeriodicalId":408850,"journal":{"name":"Proceedings of International Conference on Computer Aided Design","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132671752","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1996-11-10DOI: 10.1109/ICCAD.1996.569819
G. Cabodi, P. Camurati, S. Quer
BDD-based symbolic traversals are the state-of-the-art technique for reachability analysis of finite state machines. They are currently limited to medium-small circuits for two reasons: peak BDD size during image computation and BDD explosion for representing state sets. Starting from these limits, this paper presents can optimized traversal technique particularly oriented to the exact exploration of the state space of large machines. This is possible thanks to: temporary simplification of a finite state machine by removing some of its state elements; and a "divide-and-conquer" approach based on state set decomposition. An effective use of secondary memory allows us to store relevant portions of BDDs and to regularize access to memory, resulting in less page faults. Experimental results show that this approach is particularly effective on the larger ISCAS'89 and ISCAS'89-addendum'93 circuits.
{"title":"Improved reachability analysis of large finite state machines","authors":"G. Cabodi, P. Camurati, S. Quer","doi":"10.1109/ICCAD.1996.569819","DOIUrl":"https://doi.org/10.1109/ICCAD.1996.569819","url":null,"abstract":"BDD-based symbolic traversals are the state-of-the-art technique for reachability analysis of finite state machines. They are currently limited to medium-small circuits for two reasons: peak BDD size during image computation and BDD explosion for representing state sets. Starting from these limits, this paper presents can optimized traversal technique particularly oriented to the exact exploration of the state space of large machines. This is possible thanks to: temporary simplification of a finite state machine by removing some of its state elements; and a \"divide-and-conquer\" approach based on state set decomposition. An effective use of secondary memory allows us to store relevant portions of BDDs and to regularize access to memory, resulting in less page faults. Experimental results show that this approach is particularly effective on the larger ISCAS'89 and ISCAS'89-addendum'93 circuits.","PeriodicalId":408850,"journal":{"name":"Proceedings of International Conference on Computer Aided Design","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130553006","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1996-11-10DOI: 10.1109/ICCAD.1996.569906
K. Shepard, V. Narayanan
As technology scales into the deep submicron regime, noise immunity is becoming a metric of comparable importance to area, timing, and power for the analysis and design of VLSI systems. This paper defines noise as it pertains to digital systems and addresses the technology trends which are bringing noise issues to the forefront. The noise sources which are plaguing digital systems are explained. A metric referred to as noise stability is defined, and a static noise analysis methodology based on this metric is introduced to demonstrate how noise can be analyzed systematically. Analysis issues associated with on-chip interconnect are also considered. This paper concludes with a discussion of the device, circuit, layout, and logic design issues associated with noise.
{"title":"Noise in deep submicron digital design","authors":"K. Shepard, V. Narayanan","doi":"10.1109/ICCAD.1996.569906","DOIUrl":"https://doi.org/10.1109/ICCAD.1996.569906","url":null,"abstract":"As technology scales into the deep submicron regime, noise immunity is becoming a metric of comparable importance to area, timing, and power for the analysis and design of VLSI systems. This paper defines noise as it pertains to digital systems and addresses the technology trends which are bringing noise issues to the forefront. The noise sources which are plaguing digital systems are explained. A metric referred to as noise stability is defined, and a static noise analysis methodology based on this metric is introduced to demonstrate how noise can be analyzed systematically. Analysis issues associated with on-chip interconnect are also considered. This paper concludes with a discussion of the device, circuit, layout, and logic design issues associated with noise.","PeriodicalId":408850,"journal":{"name":"Proceedings of International Conference on Computer Aided Design","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132340957","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1996-11-10DOI: 10.1109/ICCAD.1996.569870
S. Nakatake, K. Fujiyoshi, H. Murata, Y. Kajitani
A new method of packing rectangles (modules) is presented with applications to IC layout design. It is based on the bounded-sliceline grid (BSG) structure. The BSG dissects the plane into rooms associated with binary relations "right-to"and "above" such that any two rooms are uniquely in either relation. A packing is obtained through an assignment of modules on the BSG. Followed by physical realization BSG-PACK. A simulated annealing searches for a goon packing of all packings by changing the assignments. Experiments showed that hundreds of rectangles are easily packed in a small rectangle area (chip) with quite good quality in area efficiency. A wide adaptability is demonstrated specific to IC layout design. Remarkable examples are: the chip is not necessarily rectangle, L-shaped modules and modules which are allowed to partially overlap each other can be handled.
{"title":"Module placement on BSG-structure and IC layout applications","authors":"S. Nakatake, K. Fujiyoshi, H. Murata, Y. Kajitani","doi":"10.1109/ICCAD.1996.569870","DOIUrl":"https://doi.org/10.1109/ICCAD.1996.569870","url":null,"abstract":"A new method of packing rectangles (modules) is presented with applications to IC layout design. It is based on the bounded-sliceline grid (BSG) structure. The BSG dissects the plane into rooms associated with binary relations \"right-to\"and \"above\" such that any two rooms are uniquely in either relation. A packing is obtained through an assignment of modules on the BSG. Followed by physical realization BSG-PACK. A simulated annealing searches for a goon packing of all packings by changing the assignments. Experiments showed that hundreds of rectangles are easily packed in a small rectangle area (chip) with quite good quality in area efficiency. A wide adaptability is demonstrated specific to IC layout design. Remarkable examples are: the chip is not necessarily rectangle, L-shaped modules and modules which are allowed to partially overlap each other can be handled.","PeriodicalId":408850,"journal":{"name":"Proceedings of International Conference on Computer Aided Design","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129009718","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1996-11-10DOI: 10.1109/ICCAD.1996.569904
G. Roberts
This paper presents a tutorial on mixed-signal testing. Our focus is on testing the analog portion of the mixed-signal device, as the digital portion is handled in the usual way. We begin by first outlining the role of test in a manufacturing environment, and its impact on product cost and quality. We look at the impact of manufacturing defects on the behavior of digital and analog circuits. Subsequently, we argue that analog circuits require very different test methods than those presently used to test digital circuits. We then describe four common analog test methods and their measurement setups. We also describe how analog testing can be accomplished using digital sampling techniques. Finally, we close this tutorial with a brief description of several developments presently underway on the design of testable mixed-signal circuits.
{"title":"Metrics, techniques and recent developments in mixed-signal testing","authors":"G. Roberts","doi":"10.1109/ICCAD.1996.569904","DOIUrl":"https://doi.org/10.1109/ICCAD.1996.569904","url":null,"abstract":"This paper presents a tutorial on mixed-signal testing. Our focus is on testing the analog portion of the mixed-signal device, as the digital portion is handled in the usual way. We begin by first outlining the role of test in a manufacturing environment, and its impact on product cost and quality. We look at the impact of manufacturing defects on the behavior of digital and analog circuits. Subsequently, we argue that analog circuits require very different test methods than those presently used to test digital circuits. We then describe four common analog test methods and their measurement setups. We also describe how analog testing can be accomplished using digital sampling techniques. Finally, we close this tutorial with a brief description of several developments presently underway on the design of testable mixed-signal circuits.","PeriodicalId":408850,"journal":{"name":"Proceedings of International Conference on Computer Aided Design","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129377171","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1996-11-10DOI: 10.1109/ICCAD.1996.569918
W. M. Lindermeir
Test design of analog circuits based on statistical methods for decision making is a topic of growing interest. The major problem of such statistical approaches with respect to industrial applicability concerns the confidence with which the determined test criteria can be applied in production testing. This mainly refers to the consideration of measurement noise, to the selected measurements, as well as to the required training and validation samples. These crucial topics are addressed in this paper. On exploiting experience from the statistical design of analog circuits and from pattern recognition methods, efficient solutions to these problems are provided. A very robust test design is achieved by systematically considering measurement noise, by selecting most significant measurements, and by using most meaningful samples. Moreover, parametric as well as catastrophic faults are covered on application of digital testing methods.
{"title":"Design of robust test criteria in analog testing","authors":"W. M. Lindermeir","doi":"10.1109/ICCAD.1996.569918","DOIUrl":"https://doi.org/10.1109/ICCAD.1996.569918","url":null,"abstract":"Test design of analog circuits based on statistical methods for decision making is a topic of growing interest. The major problem of such statistical approaches with respect to industrial applicability concerns the confidence with which the determined test criteria can be applied in production testing. This mainly refers to the consideration of measurement noise, to the selected measurements, as well as to the required training and validation samples. These crucial topics are addressed in this paper. On exploiting experience from the statistical design of analog circuits and from pattern recognition methods, efficient solutions to these problems are provided. A very robust test design is achieved by systematically considering measurement noise, by selecting most significant measurements, and by using most meaningful samples. Moreover, parametric as well as catastrophic faults are covered on application of digital testing methods.","PeriodicalId":408850,"journal":{"name":"Proceedings of International Conference on Computer Aided Design","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114173597","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1996-11-10DOI: 10.1109/ICCAD.1996.569408
Wei Zhao, C. Papachristou
Design with cores has become popular recently because it can decrease the design time and ease the complexity of the design process. This paper presents a new method for the design of DSP cores based on multiple behaviors. This method uses redesign technique based on reallocation transformations to extract those RTL components in an initial RTL structure which are highly reusable and uses them to construct a DSP core. Experimental results are provided to illustrate the high reusability of core, extracted from given behaviors, when it accommodates new behaviors.
{"title":"Synthesis of reusable DSP cores based on multiple behaviors","authors":"Wei Zhao, C. Papachristou","doi":"10.1109/ICCAD.1996.569408","DOIUrl":"https://doi.org/10.1109/ICCAD.1996.569408","url":null,"abstract":"Design with cores has become popular recently because it can decrease the design time and ease the complexity of the design process. This paper presents a new method for the design of DSP cores based on multiple behaviors. This method uses redesign technique based on reallocation transformations to extract those RTL components in an initial RTL structure which are highly reusable and uses them to construct a DSP core. Experimental results are provided to illustrate the high reusability of core, extracted from given behaviors, when it accommodates new behaviors.","PeriodicalId":408850,"journal":{"name":"Proceedings of International Conference on Computer Aided Design","volume":"63 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114827018","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1996-11-10DOI: 10.1109/ICCAD.1996.569641
Shih-Chieh Chang, L. V. Ginneken, M. Marek-Sadowska
This paper presents a very efficient Boolean logic optimization method. The boolean optimization is achieved by adding and removing redundant wires in a circuit. Our algorithm applies the reasoning of Automatic Test Pattern Generation (ATPG) which can detect redundancy efficiently. During the ATPG process, mandatory assignments are assignments which must be satisfied. Our algorithm analyzes different characteristics of mandatory assignments during the ATPG process. New theoretical results based on the analysis are presented which lead to significant performance improvements. The fast run time and the excellent scaling to large problems make our Boolean optimization method practical for industrial applications. Experiments show that the optimization results are comparable to those of Kunz and Pradhan (1994) while the run time is two orders of magnitude faster (average 126/spl times/ speed up). Furthermore, we report optimization results for several large examples, which were previously thought to be too large to be handled by Boolean optimization methods.
{"title":"Fast Boolean optimization by rewiring","authors":"Shih-Chieh Chang, L. V. Ginneken, M. Marek-Sadowska","doi":"10.1109/ICCAD.1996.569641","DOIUrl":"https://doi.org/10.1109/ICCAD.1996.569641","url":null,"abstract":"This paper presents a very efficient Boolean logic optimization method. The boolean optimization is achieved by adding and removing redundant wires in a circuit. Our algorithm applies the reasoning of Automatic Test Pattern Generation (ATPG) which can detect redundancy efficiently. During the ATPG process, mandatory assignments are assignments which must be satisfied. Our algorithm analyzes different characteristics of mandatory assignments during the ATPG process. New theoretical results based on the analysis are presented which lead to significant performance improvements. The fast run time and the excellent scaling to large problems make our Boolean optimization method practical for industrial applications. Experiments show that the optimization results are comparable to those of Kunz and Pradhan (1994) while the run time is two orders of magnitude faster (average 126/spl times/ speed up). Furthermore, we report optimization results for several large examples, which were previously thought to be too large to be handled by Boolean optimization methods.","PeriodicalId":408850,"journal":{"name":"Proceedings of International Conference on Computer Aided Design","volume":"83 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126222532","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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