Pub Date : 1996-11-10DOI: 10.1109/ICCAD.1996.569822
Yirng-An Chen, R. Bryant
Based on a hierarchical verification methodology, we present an arithmetic circuit verifier ACV, in which circuits expressed in a hardware description language, also called ACV, are symbolically verified using binary decision diagrams for Boolean functions and multiplicative binary moment diagrams (BMDs) for word-level functions. A circuit is described in ACV as a hierarchy of modules. Each module has a structural definition as an interconnection of logic gates and other modules. Modules may also have functional descriptions, declaring the numeric encodings of the inputs and outputs, as well as specifying their functionality in terms of arithmetic expressions. Verification then proceeds recursively, proving that each module in the hierarchy having a functional description, including the top-level one, realizes its specification. The language and the verifier contain additional enhancements for overcoming some of the difficulties in applying BMD-based verification to circuits computing functions such as division and square root. ACV has successfully verified a number of circuits, implementing such functions as multiplication, division, and square root, with word sizes up to 256 bits.
{"title":"ACV: an arithmetic circuit verifier","authors":"Yirng-An Chen, R. Bryant","doi":"10.1109/ICCAD.1996.569822","DOIUrl":"https://doi.org/10.1109/ICCAD.1996.569822","url":null,"abstract":"Based on a hierarchical verification methodology, we present an arithmetic circuit verifier ACV, in which circuits expressed in a hardware description language, also called ACV, are symbolically verified using binary decision diagrams for Boolean functions and multiplicative binary moment diagrams (BMDs) for word-level functions. A circuit is described in ACV as a hierarchy of modules. Each module has a structural definition as an interconnection of logic gates and other modules. Modules may also have functional descriptions, declaring the numeric encodings of the inputs and outputs, as well as specifying their functionality in terms of arithmetic expressions. Verification then proceeds recursively, proving that each module in the hierarchy having a functional description, including the top-level one, realizes its specification. The language and the verifier contain additional enhancements for overcoming some of the difficulties in applying BMD-based verification to circuits computing functions such as division and square root. ACV has successfully verified a number of circuits, implementing such functions as multiplication, division, and square root, with word sizes up to 256 bits.","PeriodicalId":408850,"journal":{"name":"Proceedings of International Conference on Computer Aided Design","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132585517","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1996-11-10DOI: 10.1109/ICCAD.1996.568969
Woohyuk Lee, Abelardo Pardo, Jaemoon Jang, G. Hachtel, F. Somenzi
In this paper we present the tearing paradigm as a way to automatically abstract behavior to obtain upper and lower bound approximations of a reactive system. We present algorithms that exploit the bounds to perform conservative ECTL and ACTL model checking. We also give an algorithm for false negative (or false positive) resolution for verification based on a theory of a lattice of approximations. We show that there exists a bipartition of the lattice set based on positive versus negative verification results. Our resolution methods are based on determining a pseudo-optimal shortest path from a given, possibly coarse but tractable approximation, to a nearest point on the contour separating one set of the bipartition from the other.
{"title":"Tearing based automatic abstraction for CTL model checking","authors":"Woohyuk Lee, Abelardo Pardo, Jaemoon Jang, G. Hachtel, F. Somenzi","doi":"10.1109/ICCAD.1996.568969","DOIUrl":"https://doi.org/10.1109/ICCAD.1996.568969","url":null,"abstract":"In this paper we present the tearing paradigm as a way to automatically abstract behavior to obtain upper and lower bound approximations of a reactive system. We present algorithms that exploit the bounds to perform conservative ECTL and ACTL model checking. We also give an algorithm for false negative (or false positive) resolution for verification based on a theory of a lattice of approximations. We show that there exists a bipartition of the lattice set based on positive versus negative verification results. Our resolution methods are based on determining a pseudo-optimal shortest path from a given, possibly coarse but tractable approximation, to a nearest point on the contour separating one set of the bipartition from the other.","PeriodicalId":408850,"journal":{"name":"Proceedings of International Conference on Computer Aided Design","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133739353","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1996-11-10DOI: 10.1109/ICCAD.1996.569826
D. Brand, C. Visweswariah
This paper studies the confidence with which power can be estimated at various levels of design abstraction. We report the results of experiments designed to evaluate and identify the sources of inaccuracies in gate-level power estimation. In particular, we are interested in power estimation during logic synthesis. Factors that may invalidate or diminish the accuracy of pourer estimates include optimization, technology mapping, transistor sizing, physical design, and choice of input stimuli.
{"title":"Inaccuracies in power estimation during logic synthesis","authors":"D. Brand, C. Visweswariah","doi":"10.1109/ICCAD.1996.569826","DOIUrl":"https://doi.org/10.1109/ICCAD.1996.569826","url":null,"abstract":"This paper studies the confidence with which power can be estimated at various levels of design abstraction. We report the results of experiments designed to evaluate and identify the sources of inaccuracies in gate-level power estimation. In particular, we are interested in power estimation during logic synthesis. Factors that may invalidate or diminish the accuracy of pourer estimates include optimization, technology mapping, transistor sizing, physical design, and choice of input stimuli.","PeriodicalId":408850,"journal":{"name":"Proceedings of International Conference on Computer Aided Design","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115049803","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1996-11-10DOI: 10.1109/ICCAD.1996.569423
G. Lehmann, Bernhard Wunder, K. Müller-Glaser
Designer's productivity has become the key-factor of the development of electronic systems. An increasing application of design data reuse is widely recognized as a promising technique to master future design complexities. Since the intellectual property of a design is more and more kept in software-like hardware description languages (HDL), successful reuse depends on the availability of suitable HDL reverse engineering tools. This paper introduces new concepts for an integrated HDL reverse engineering tool-set and presents an implemented evaluation prototype for VHDL designs. Starting from an arbitrary collection of HDL source code files, several graphical and textual views on the design description are automatically generated. The tool-set provides novel hypertext techniques, expressive graphical code representations, a user-defined level of abstraction, and interactive configuration mechanisms in order to facilitate the analysis, adoption and upgrade of existing HDL designs.
{"title":"Basic concepts for an HDL reverse engineering tool-set","authors":"G. Lehmann, Bernhard Wunder, K. Müller-Glaser","doi":"10.1109/ICCAD.1996.569423","DOIUrl":"https://doi.org/10.1109/ICCAD.1996.569423","url":null,"abstract":"Designer's productivity has become the key-factor of the development of electronic systems. An increasing application of design data reuse is widely recognized as a promising technique to master future design complexities. Since the intellectual property of a design is more and more kept in software-like hardware description languages (HDL), successful reuse depends on the availability of suitable HDL reverse engineering tools. This paper introduces new concepts for an integrated HDL reverse engineering tool-set and presents an implemented evaluation prototype for VHDL designs. Starting from an arbitrary collection of HDL source code files, several graphical and textual views on the design description are automatically generated. The tool-set provides novel hypertext techniques, expressive graphical code representations, a user-defined level of abstraction, and interactive configuration mechanisms in order to facilitate the analysis, adoption and upgrade of existing HDL designs.","PeriodicalId":408850,"journal":{"name":"Proceedings of International Conference on Computer Aided Design","volume":"109 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116243356","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1996-11-10DOI: 10.1109/ICCAD.1996.569601
Alok Agrawal, A. Saldanha, L. Lavagno, A. Sangiovanni-Vincentelli
We propose a novel procedure for testing all multiple stuck-faults in a logic circuit using two complementary algorithms. The first algorithm finds pairs of input vectors to detect the occurrence of target single stuck-faults independent of the occurrence of other faults. The second uses a sophisticated branch and bound procedure to complete the test set generation on the faults undetected by the first algorithm. The technique is complete and applies to all circuits. Experimental results presented in this paper demonstrate that compact and complete test sets can be quickly generated for standard benchmark circuits.
{"title":"Compact and complete test set generation for multiple stuck-faults","authors":"Alok Agrawal, A. Saldanha, L. Lavagno, A. Sangiovanni-Vincentelli","doi":"10.1109/ICCAD.1996.569601","DOIUrl":"https://doi.org/10.1109/ICCAD.1996.569601","url":null,"abstract":"We propose a novel procedure for testing all multiple stuck-faults in a logic circuit using two complementary algorithms. The first algorithm finds pairs of input vectors to detect the occurrence of target single stuck-faults independent of the occurrence of other faults. The second uses a sophisticated branch and bound procedure to complete the test set generation on the faults undetected by the first algorithm. The technique is complete and applies to all circuits. Experimental results presented in this paper demonstrate that compact and complete test sets can be quickly generated for standard benchmark circuits.","PeriodicalId":408850,"journal":{"name":"Proceedings of International Conference on Computer Aided Design","volume":"433 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123417787","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A new method is presented to compute the exact observability don't cares (ODC) for multilevel combinational circuits. A new mathematical concept, called polarization, is introduced. Polarization captures the essence of ODC calculation on the otherwise difficult points of reconvergence. It makes it possible to derive the ODC of a node from the ODCs of its fanouts with a very simple formula. Experimental results for the 39 largest MCNC benchmark examples show that the method is able to compute the ODC set (expressed as a Boolean network) for all but 1 circuit in at most a few seconds.
{"title":"Polarized observability don't cares","authors":"H. Arts, Michel Berkelaar, C. V. Eijk","doi":"10.5555/244522.244938","DOIUrl":"https://doi.org/10.5555/244522.244938","url":null,"abstract":"A new method is presented to compute the exact observability don't cares (ODC) for multilevel combinational circuits. A new mathematical concept, called polarization, is introduced. Polarization captures the essence of ODC calculation on the otherwise difficult points of reconvergence. It makes it possible to derive the ODC of a node from the ODCs of its fanouts with a very simple formula. Experimental results for the 39 largest MCNC benchmark examples show that the method is able to compute the ODC set (expressed as a Boolean network) for all but 1 circuit in at most a few seconds.","PeriodicalId":408850,"journal":{"name":"Proceedings of International Conference on Computer Aided Design","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122208084","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1996-11-10DOI: 10.1109/ICCAD.1996.568907
A. Kahng, K. Masuko, S. Muddu
Elmore delay has been widely used as an analytical estimate of interconnect delays in the performance-driven synthesis and layout of VLSI routing topologies. However, for typical RLC interconnections with ramp input, Elmore delay can deviate by up to 100% or more from SPICE-computed delay since it is independent of rise time of the input ramp signal. We develop new analytical delay models based on the first and second moments of the interconnect transfer function when the input is a ramp signal with finite rise time. Delay estimates using our first moment based analytical models are within 4% of SPICE-computed delay, and models based on both first and second moments are within 2.3% of SPICE, across a wide range of interconnect parameter values. Evaluation of our analytical models is several orders of magnitude faster than simulation using SPICE. We also describe extensions of our approach for estimation of source-sink delays in arbitrary interconnect trees.
{"title":"Analytical delay models for VLSI interconnects under ramp input","authors":"A. Kahng, K. Masuko, S. Muddu","doi":"10.1109/ICCAD.1996.568907","DOIUrl":"https://doi.org/10.1109/ICCAD.1996.568907","url":null,"abstract":"Elmore delay has been widely used as an analytical estimate of interconnect delays in the performance-driven synthesis and layout of VLSI routing topologies. However, for typical RLC interconnections with ramp input, Elmore delay can deviate by up to 100% or more from SPICE-computed delay since it is independent of rise time of the input ramp signal. We develop new analytical delay models based on the first and second moments of the interconnect transfer function when the input is a ramp signal with finite rise time. Delay estimates using our first moment based analytical models are within 4% of SPICE-computed delay, and models based on both first and second moments are within 2.3% of SPICE, across a wide range of interconnect parameter values. Evaluation of our analytical models is several orders of magnitude faster than simulation using SPICE. We also describe extensions of our approach for estimation of source-sink delays in arbitrary interconnect trees.","PeriodicalId":408850,"journal":{"name":"Proceedings of International Conference on Computer Aided Design","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121262984","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1996-11-10DOI: 10.1109/ICCAD.1996.569415
V. Narayanan, B. Chappell, B. Fleischer
Static timing analysis techniques are widely used to verify the timing behavior of large digital designs implemented predominantly in conventional static CMOS. These techniques, however, are not sufficient to completely verify the dynamic circuit families now finding favor in high-performance designs. In this paper, we describe an approach that extends static timing analysis to a high-performance dynamic CMOS logic family called self-resetting CMOS (SRCMOS). Due to the circuit structure employed in SRCMOS, designs naturally decompose into a hierarchy of gates and macros; timing analysis must address and preferably exploit this hierarchy. At the gate level, three categories of constraints on pulse timing arise from considering the effects of pulse width, overlap, and collisions. Timing analysis is performed at the macro level, by a) performing timing tests at macro boundaries and b) using macro-level delay models. We define various macro-level timing tests which ensure that fundamental gate-level timing constraints are satisfied. We extend the standard delay model to handle leading and trailing edges of signal pulses, across-chip variations, trading of signals, and slow and fast operating conditions. We have developed an SRCMOS timing analyzer based on this approach; the analyzer implemented as extensions to a standard static timing analysis program, thus facilitating its integration into an existing design system and methodology.
{"title":"Static timing analysis for self resetting circuits","authors":"V. Narayanan, B. Chappell, B. Fleischer","doi":"10.1109/ICCAD.1996.569415","DOIUrl":"https://doi.org/10.1109/ICCAD.1996.569415","url":null,"abstract":"Static timing analysis techniques are widely used to verify the timing behavior of large digital designs implemented predominantly in conventional static CMOS. These techniques, however, are not sufficient to completely verify the dynamic circuit families now finding favor in high-performance designs. In this paper, we describe an approach that extends static timing analysis to a high-performance dynamic CMOS logic family called self-resetting CMOS (SRCMOS). Due to the circuit structure employed in SRCMOS, designs naturally decompose into a hierarchy of gates and macros; timing analysis must address and preferably exploit this hierarchy. At the gate level, three categories of constraints on pulse timing arise from considering the effects of pulse width, overlap, and collisions. Timing analysis is performed at the macro level, by a) performing timing tests at macro boundaries and b) using macro-level delay models. We define various macro-level timing tests which ensure that fundamental gate-level timing constraints are satisfied. We extend the standard delay model to handle leading and trailing edges of signal pulses, across-chip variations, trading of signals, and slow and fast operating conditions. We have developed an SRCMOS timing analyzer based on this approach; the analyzer implemented as extensions to a standard static timing analysis program, thus facilitating its integration into an existing design system and methodology.","PeriodicalId":408850,"journal":{"name":"Proceedings of International Conference on Computer Aided Design","volume":"63 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125619679","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1996-11-10DOI: 10.1109/ICCAD.1996.569906
K. Shepard, V. Narayanan
As technology scales into the deep submicron regime, noise immunity is becoming a metric of comparable importance to area, timing, and power for the analysis and design of VLSI systems. This paper defines noise as it pertains to digital systems and addresses the technology trends which are bringing noise issues to the forefront. The noise sources which are plaguing digital systems are explained. A metric referred to as noise stability is defined, and a static noise analysis methodology based on this metric is introduced to demonstrate how noise can be analyzed systematically. Analysis issues associated with on-chip interconnect are also considered. This paper concludes with a discussion of the device, circuit, layout, and logic design issues associated with noise.
{"title":"Noise in deep submicron digital design","authors":"K. Shepard, V. Narayanan","doi":"10.1109/ICCAD.1996.569906","DOIUrl":"https://doi.org/10.1109/ICCAD.1996.569906","url":null,"abstract":"As technology scales into the deep submicron regime, noise immunity is becoming a metric of comparable importance to area, timing, and power for the analysis and design of VLSI systems. This paper defines noise as it pertains to digital systems and addresses the technology trends which are bringing noise issues to the forefront. The noise sources which are plaguing digital systems are explained. A metric referred to as noise stability is defined, and a static noise analysis methodology based on this metric is introduced to demonstrate how noise can be analyzed systematically. Analysis issues associated with on-chip interconnect are also considered. This paper concludes with a discussion of the device, circuit, layout, and logic design issues associated with noise.","PeriodicalId":408850,"journal":{"name":"Proceedings of International Conference on Computer Aided Design","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132340957","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1996-11-10DOI: 10.1109/ICCAD.1996.569907
D. Kirkpatrick, A. Sangiovanni-Vincentelli
Maintaining signal integrity in digital systems is becoming increasingly difficult due to the rising number of analog effects seen in deep submicron design. One such effect, the signal crosstalk problem, is now a serious design concern. Signals which couple electrically may not affect system behavior because of timing or function in the digital domain. If we can isolate observable coupling then we can constrain layout synthesis to eliminate them. In this paper, we find that it is possible to predict signal interaction by signal functionality alone, leading to a significant amount of robust switching isolation, independent of parasitics introduced by layout or semiconductor process. We introduce techniques to predict signal interaction using functional sensitivity analysis. In general sequential networks we find that significant switching isolation can be extracted with efficient sensitivity analysis algorithms, thus giving promise to the goal of synthesizing layout free from crosstalk effects.
{"title":"Digital sensitivity: predicting signal interaction using functional analysis","authors":"D. Kirkpatrick, A. Sangiovanni-Vincentelli","doi":"10.1109/ICCAD.1996.569907","DOIUrl":"https://doi.org/10.1109/ICCAD.1996.569907","url":null,"abstract":"Maintaining signal integrity in digital systems is becoming increasingly difficult due to the rising number of analog effects seen in deep submicron design. One such effect, the signal crosstalk problem, is now a serious design concern. Signals which couple electrically may not affect system behavior because of timing or function in the digital domain. If we can isolate observable coupling then we can constrain layout synthesis to eliminate them. In this paper, we find that it is possible to predict signal interaction by signal functionality alone, leading to a significant amount of robust switching isolation, independent of parasitics introduced by layout or semiconductor process. We introduce techniques to predict signal interaction using functional sensitivity analysis. In general sequential networks we find that significant switching isolation can be extracted with efficient sensitivity analysis algorithms, thus giving promise to the goal of synthesizing layout free from crosstalk effects.","PeriodicalId":408850,"journal":{"name":"Proceedings of International Conference on Computer Aided Design","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132671752","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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