An interferometric problem is the limited fringe density, which is due to the limited allowed slope difference of superimposed wave fronts. Thus, the angular dynamic range of measurable surfaces and objects under test is limited. In other words, all shapes that deviate from a plane surface or a sphere represent a measuring problem in interferometers, or require an individually adapted null optics, which might cost e.g. 10 k∈ or more. In addition, ground surfaces cannot be measured in standard interferometers, except by using Speckle interferometry, which is limited in resolution. Freeform optics are very problematic. Even when polished, only tactile or confocal coordinate measurement might work. Several interferometers address the problem of the angular deviation to a sphere. For instance, lateral stitching on a curved surface, which is equivalent to the best-fit sphere, or longitudinal stitching is used. To use a tilted wave interferometer for asphere metrology is another option, which provides versatile measurement configurations. The approach discussed here is to use optical filters. The development of this technique is part of a project most recently started at the Technology Campus in Teisnach. The surface under test (SUT) is imaged onto an optical filter, which has a calibrated angular selectivity. Thus, the angles of the local wave front normal vectors are transferred into an intensity distribution. A set of angular measurements enables reduced uncertainty of the wave front measurement. Aspects as e.g. the working principle, boundary conditions and the identification of practical filters are discussed in the paper.
{"title":"Wave front sensing for metrology by using optical filter","authors":"G. Fütterer","doi":"10.1117/12.2530013","DOIUrl":"https://doi.org/10.1117/12.2530013","url":null,"abstract":"An interferometric problem is the limited fringe density, which is due to the limited allowed slope difference of superimposed wave fronts. Thus, the angular dynamic range of measurable surfaces and objects under test is limited. In other words, all shapes that deviate from a plane surface or a sphere represent a measuring problem in interferometers, or require an individually adapted null optics, which might cost e.g. 10 k∈ or more. In addition, ground surfaces cannot be measured in standard interferometers, except by using Speckle interferometry, which is limited in resolution. Freeform optics are very problematic. Even when polished, only tactile or confocal coordinate measurement might work. Several interferometers address the problem of the angular deviation to a sphere. For instance, lateral stitching on a curved surface, which is equivalent to the best-fit sphere, or longitudinal stitching is used. To use a tilted wave interferometer for asphere metrology is another option, which provides versatile measurement configurations. The approach discussed here is to use optical filters. The development of this technique is part of a project most recently started at the Technology Campus in Teisnach. The surface under test (SUT) is imaged onto an optical filter, which has a calibrated angular selectivity. Thus, the angles of the local wave front normal vectors are transferred into an intensity distribution. A set of angular measurements enables reduced uncertainty of the wave front measurement. Aspects as e.g. the working principle, boundary conditions and the identification of practical filters are discussed in the paper.","PeriodicalId":422212,"journal":{"name":"Precision Optics Manufacturing","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-06-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125282507","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
In the metrology of aspheres and freeforms, missing reference surfaces are a big challenge. The evaluation of the performance of measurement systems is currently done by round robin tests. Since the true form of the used specimens are unknown, the question still remains: who is right? This problem is also faced during the assessment of the performance of the Tilted Wave Interferometer. For both the calibration and measurement complex algorithms are applied. They calculate the system model parameters or the surface error from phaseshifting data. The analytical evaluation of different configurations or the influence of certain errors is impossible. The GUM (Guide to the Expression of Uncertainty in Measurement) proposes Monte Carlo simulations as an option for uncertainty evaluations. They are applicable for complex relationships between a measurand and the system’s input quantities. By repeatedly setting the input quantities to random values within a given range and evaluating the system response, statistically relevant data can be generated. In this contribution we present a Monte Carlo based simulation environment for the performance assessment of non-null interferometric measurements. By using the presented simulation tool, virtual experiments can be executed, including the calibration of the setup. They provide simulated measurement data - in the case of the Tilted Wave Interferometer simulated phase data – taking a number of possible errors, like interferometer errors, stage errors and errors of the reference spheres, into account. On this basis, complete calibration procedures and measurements on given samples can be simulated. Its result can be compared with the simulated truth, since all parameters and errors are known, and a statement about the performance can be made. This tool also proves useful for investigations on effects of measurement parameters such as misalignments of the sample.
{"title":"Monte Carlo simulations: a tool to assess complex measurement systems","authors":"A. Harsch, C. Pruss, G. Baer, W. Osten","doi":"10.1117/12.2526799","DOIUrl":"https://doi.org/10.1117/12.2526799","url":null,"abstract":"In the metrology of aspheres and freeforms, missing reference surfaces are a big challenge. The evaluation of the performance of measurement systems is currently done by round robin tests. Since the true form of the used specimens are unknown, the question still remains: who is right? This problem is also faced during the assessment of the performance of the Tilted Wave Interferometer. For both the calibration and measurement complex algorithms are applied. They calculate the system model parameters or the surface error from phaseshifting data. The analytical evaluation of different configurations or the influence of certain errors is impossible. The GUM (Guide to the Expression of Uncertainty in Measurement) proposes Monte Carlo simulations as an option for uncertainty evaluations. They are applicable for complex relationships between a measurand and the system’s input quantities. By repeatedly setting the input quantities to random values within a given range and evaluating the system response, statistically relevant data can be generated. In this contribution we present a Monte Carlo based simulation environment for the performance assessment of non-null interferometric measurements. By using the presented simulation tool, virtual experiments can be executed, including the calibration of the setup. They provide simulated measurement data - in the case of the Tilted Wave Interferometer simulated phase data – taking a number of possible errors, like interferometer errors, stage errors and errors of the reference spheres, into account. On this basis, complete calibration procedures and measurements on given samples can be simulated. Its result can be compared with the simulated truth, since all parameters and errors are known, and a statement about the performance can be made. This tool also proves useful for investigations on effects of measurement parameters such as misalignments of the sample.","PeriodicalId":422212,"journal":{"name":"Precision Optics Manufacturing","volume":"195 4","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-06-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133111381","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A comparison of two different measurement approaches, a tactile profilometer as well as a non-contact point-probe based metrology system, is conducted. The properties of each approach are highlighted, and measurement results examined.
{"title":"Measurement of freeforms and complex geometries by use of tactile profilometry and multi-wavelength interferometry","authors":"M. Wendel","doi":"10.1117/12.2526734","DOIUrl":"https://doi.org/10.1117/12.2526734","url":null,"abstract":"A comparison of two different measurement approaches, a tactile profilometer as well as a non-contact point-probe based metrology system, is conducted. The properties of each approach are highlighted, and measurement results examined.","PeriodicalId":422212,"journal":{"name":"Precision Optics Manufacturing","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-06-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129418714","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Accurate measurement of centration of aspheric lenses or even freeforms is a challenge for most devices in optical manufacturing. We are providing a new attempt by combining an autocollimation device and a Vignetting Field Stop [1, 2, 3] device to measure lens centration and sagittal surface profile in a deflectometric approach. Both devices work independently at high accuracy. This presentation explains the technical setup, consisting of an autocollimation sensor (ELWIMAT-AKF) and a Vignetting Field Stop Sensor (ELWIMAT V-SPOT), which is mounted together with an air bearing rotary table in a vertical arrangement. Secondly, we provide the results of the centration measurement and the results from the surface reconstruction and slope error from the measured sagittal angle deviations. Finally, the results from a measured asphere (High Level Expert Meeting HLEM sample #3) is critically discussed to state the accuracy and applicability of the proposed measurement attempt.
{"title":"A new approach to surface shape and centration measurement on aspheres with the new V-SPOT technology","authors":"E. Hofbauer, R. Kometer","doi":"10.1117/12.2527650","DOIUrl":"https://doi.org/10.1117/12.2527650","url":null,"abstract":"Accurate measurement of centration of aspheric lenses or even freeforms is a challenge for most devices in optical manufacturing. We are providing a new attempt by combining an autocollimation device and a Vignetting Field Stop [1, 2, 3] device to measure lens centration and sagittal surface profile in a deflectometric approach. Both devices work independently at high accuracy. This presentation explains the technical setup, consisting of an autocollimation sensor (ELWIMAT-AKF) and a Vignetting Field Stop Sensor (ELWIMAT V-SPOT), which is mounted together with an air bearing rotary table in a vertical arrangement. Secondly, we provide the results of the centration measurement and the results from the surface reconstruction and slope error from the measured sagittal angle deviations. Finally, the results from a measured asphere (High Level Expert Meeting HLEM sample #3) is critically discussed to state the accuracy and applicability of the proposed measurement attempt.","PeriodicalId":422212,"journal":{"name":"Precision Optics Manufacturing","volume":"27 5","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-06-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120860833","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Lasers have been known for a long time and are used in a wide variety of fields such as industrial and material processing or measuring and control technology. A new application is being tested which aims to use continuous wave UV-lasers in metrology. For this application a nonlinear optical crystal is needed. Its processing is developed in a two-year project at the Institute for Precision Manufacturing and High-Frequency Technology of Deggendorf Institute of Technology. The crucial factor for the full optical performance in the UV range is the low roughness of the crystal surface, as it is installed between two prisms and the contactability between them should be ensured. In China, a nonlinear crystal that meets the requirements has already been designed and a production process for the raw crystal has been established. However, since the production of optically homogenous crystals has proven to be difficult, the availability of such is very limited. For this reason, a reference material with similar hardness and material behaviour is used in the process development in order not to be limited in the number of trials. It is important to be able to transfer the results from the reference material in an analogous way to the original crystal. One challenge of the project lies in the crystal thickness, since only a maximum thickness of three millimetres can be achieved for the purest form of the crystal required in the application. Therefore, it is important to handle the material sparingly during the process. In addition, the small dimensions of about ten to five millimetres and the brittleness of the material pose a problem. The goal of the project will be to develop a process that can circumvent all these problems so that small roughness of the crystal can be achieved by precision polishing.
{"title":"Processing of a new nonlinear optical crystal for continuous wave UV-laser applications","authors":"Jessica Stelzl, C. Wünsche, S. Höfer","doi":"10.1117/12.2528140","DOIUrl":"https://doi.org/10.1117/12.2528140","url":null,"abstract":"Lasers have been known for a long time and are used in a wide variety of fields such as industrial and material processing or measuring and control technology. A new application is being tested which aims to use continuous wave UV-lasers in metrology. For this application a nonlinear optical crystal is needed. Its processing is developed in a two-year project at the Institute for Precision Manufacturing and High-Frequency Technology of Deggendorf Institute of Technology. The crucial factor for the full optical performance in the UV range is the low roughness of the crystal surface, as it is installed between two prisms and the contactability between them should be ensured. In China, a nonlinear crystal that meets the requirements has already been designed and a production process for the raw crystal has been established. However, since the production of optically homogenous crystals has proven to be difficult, the availability of such is very limited. For this reason, a reference material with similar hardness and material behaviour is used in the process development in order not to be limited in the number of trials. It is important to be able to transfer the results from the reference material in an analogous way to the original crystal. One challenge of the project lies in the crystal thickness, since only a maximum thickness of three millimetres can be achieved for the purest form of the crystal required in the application. Therefore, it is important to handle the material sparingly during the process. In addition, the small dimensions of about ten to five millimetres and the brittleness of the material pose a problem. The goal of the project will be to develop a process that can circumvent all these problems so that small roughness of the crystal can be achieved by precision polishing.","PeriodicalId":422212,"journal":{"name":"Precision Optics Manufacturing","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-06-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130620924","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
M. Pohl, U. Bielke, R. Boerret, R. Rascher, Olga Kukso
This research is focused on the link between manufacturing parameters and the resulting mid-spatial frequency error in the manufacturing process of precision optics. This third publication focuses on strategies of avoidance and generation mechanisms of the mid-spatial frequency errors from the grinding process. The Goal is to understand the generation mechanisms of the mid-spatial frequency errors and avoid their appearance in the manufacturing process.
{"title":"MSF-error prevention strategies for the grinding process","authors":"M. Pohl, U. Bielke, R. Boerret, R. Rascher, Olga Kukso","doi":"10.1117/12.2526581","DOIUrl":"https://doi.org/10.1117/12.2526581","url":null,"abstract":"This research is focused on the link between manufacturing parameters and the resulting mid-spatial frequency error in the manufacturing process of precision optics. This third publication focuses on strategies of avoidance and generation mechanisms of the mid-spatial frequency errors from the grinding process. The Goal is to understand the generation mechanisms of the mid-spatial frequency errors and avoid their appearance in the manufacturing process.","PeriodicalId":422212,"journal":{"name":"Precision Optics Manufacturing","volume":"460 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-06-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115288767","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
C. Trum, C. Vogt, Sebastian Sitzberger, O. Faehnle, R. Rascher
Subsurface Damages (SSDs) can cause a wide variety of defects to optical lenses and other components. In addition to the adhesion and quality of coatings, the mechanical stability, the transmission quality and the laser-induced damage threshold (LIDT) of the products, is also affected. It is, therefore, attempted to get components as SSD-free as possible at the end of the production chain. Already during the individual production steps, it is important to know the depth of the SSDs in order to remove them in the following manufacturing steps. To design the manufacturing processes efficiently and avoid damage, it is important to be able to measure the depth and characteristics of SSDs as precisely as possible. There are a several approaches and methods to determine SSDs known in literature. However, many of them inevitably lead to the destruction of the workpiece. Although others are non-destructive, but very complex in design and/or associated with large investments. Likewise, only a few are suitable for determining SSDs on ground rough surfaces. Filled-Up Miicroscopy (FUM) is an alternative approach to approximating the depth of SSDs, even on rough surfaces without destroying them. At a first glance at the method, the procedure is described in detail and all necessary steps of preparing the samples are shown. A first comparison with the known Ball Dimpling Method confirms the functionality of the concept.
{"title":"Filled-Up-Microscopy (FUM): a non-destructive method for approximating the depth of sub-surface damage on ground surfaces","authors":"C. Trum, C. Vogt, Sebastian Sitzberger, O. Faehnle, R. Rascher","doi":"10.1117/12.2318576","DOIUrl":"https://doi.org/10.1117/12.2318576","url":null,"abstract":"Subsurface Damages (SSDs) can cause a wide variety of defects to optical lenses and other components. In addition to the adhesion and quality of coatings, the mechanical stability, the transmission quality and the laser-induced damage threshold (LIDT) of the products, is also affected. It is, therefore, attempted to get components as SSD-free as possible at the end of the production chain. Already during the individual production steps, it is important to know the depth of the SSDs in order to remove them in the following manufacturing steps. To design the manufacturing processes efficiently and avoid damage, it is important to be able to measure the depth and characteristics of SSDs as precisely as possible. There are a several approaches and methods to determine SSDs known in literature. However, many of them inevitably lead to the destruction of the workpiece. Although others are non-destructive, but very complex in design and/or associated with large investments. Likewise, only a few are suitable for determining SSDs on ground rough surfaces. Filled-Up Miicroscopy (FUM) is an alternative approach to approximating the depth of SSDs, even on rough surfaces without destroying them. At a first glance at the method, the procedure is described in detail and all necessary steps of preparing the samples are shown. A first comparison with the known Ball Dimpling Method confirms the functionality of the concept.","PeriodicalId":422212,"journal":{"name":"Precision Optics Manufacturing","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114288816","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Wilhelmus Messelink, Amy Frantz, S. Ament, Matthew Stairiker
For the (CNC) polishing of aspheres, generally a compliant, sub-aperture tool is applied, which may cause mid- spatial frequency errors on the surface of the workpiece. The tolerance on surface figure is commonly given in peak-to-valley (PV) or root-mean-square (RMS). Even if a surface is fabricated within specified tolerances according to one of the mentioned metrics, the optical performance may be inadequate for the desired application. For the specification of the tolerance on mid-spatial frequency errors, several other characteristics have been proposed, e.g. power spectral density (PSD) or surface slope error. This paper presents an investigation into the mid-spatial frequency form error of mass-produced aspheres, discusses the results and draws relevant conclusions.
{"title":"Mid-spatial frequency errors of mass-produced aspheres","authors":"Wilhelmus Messelink, Amy Frantz, S. Ament, Matthew Stairiker","doi":"10.1117/12.2318663","DOIUrl":"https://doi.org/10.1117/12.2318663","url":null,"abstract":"For the (CNC) polishing of aspheres, generally a compliant, sub-aperture tool is applied, which may cause mid- spatial frequency errors on the surface of the workpiece. The tolerance on surface figure is commonly given in peak-to-valley (PV) or root-mean-square (RMS). Even if a surface is fabricated within specified tolerances according to one of the mentioned metrics, the optical performance may be inadequate for the desired application. For the specification of the tolerance on mid-spatial frequency errors, several other characteristics have been proposed, e.g. power spectral density (PSD) or surface slope error. This paper presents an investigation into the mid-spatial frequency form error of mass-produced aspheres, discusses the results and draws relevant conclusions.","PeriodicalId":422212,"journal":{"name":"Precision Optics Manufacturing","volume":"148 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132942532","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
In-situ measurements of complex surfaces during the polishing process is a challenge for the production of aspheric surfaces or freeforms. We are providing a new attempt by using a scanning deflectometric device based on our recently published DaOS [1] principle, which allows in-situ measurements of large optical surfaces in realistic production environments and offers the conditions for direct intervention and correction in the polishing process. The results of insitu surface measurements after three polishing steps of a large glass substrate (320 mm in diameter) in a lever-polishing machine (NLP500 from Stock Konstruktion GmbH) are shown and critically compared with interferometric measurements on a SSI-A Interferometer. In this paper, the technical setup consisting of a highly precise scanning penta prism device and a Vignetting Field Stop (VFS) Sensor is explained. Secondly, we are discussing the mathematical algorithm to reconstruct the complete surface from angle measurements from a given number of cross-sectional cuts. The data of the surface reconstruction are transformed into a XYZ-file format to be analyzed with MetroPro®. The results are shown and discussed in terms of accuracy and reproducibility. Finally, a comparison with interferometric measurements on an SSI-A (QED) at TH Deggendorf (THD), Technology Campus Teisnach is shown to proof the degree of accuracy and applicability of our new, fast and reliable device for in-situ measurements of complex surfaces.
{"title":"Fast and reliable in-situ measurements of large and complex surfaces using a novel deflectometric device","authors":"R. Kometer, E. Hofbauer","doi":"10.1117/12.2318583","DOIUrl":"https://doi.org/10.1117/12.2318583","url":null,"abstract":"In-situ measurements of complex surfaces during the polishing process is a challenge for the production of aspheric surfaces or freeforms. We are providing a new attempt by using a scanning deflectometric device based on our recently published DaOS [1] principle, which allows in-situ measurements of large optical surfaces in realistic production environments and offers the conditions for direct intervention and correction in the polishing process. The results of insitu surface measurements after three polishing steps of a large glass substrate (320 mm in diameter) in a lever-polishing machine (NLP500 from Stock Konstruktion GmbH) are shown and critically compared with interferometric measurements on a SSI-A Interferometer. In this paper, the technical setup consisting of a highly precise scanning penta prism device and a Vignetting Field Stop (VFS) Sensor is explained. Secondly, we are discussing the mathematical algorithm to reconstruct the complete surface from angle measurements from a given number of cross-sectional cuts. The data of the surface reconstruction are transformed into a XYZ-file format to be analyzed with MetroPro®. The results are shown and discussed in terms of accuracy and reproducibility. Finally, a comparison with interferometric measurements on an SSI-A (QED) at TH Deggendorf (THD), Technology Campus Teisnach is shown to proof the degree of accuracy and applicability of our new, fast and reliable device for in-situ measurements of complex surfaces.","PeriodicalId":422212,"journal":{"name":"Precision Optics Manufacturing","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116254671","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The contents of this work are based on [1], [2] and [3]. Using the three wagons approach, critical parameters were identified and the process window of ductile machining was considerably enlarged. This made it possible to increase the critical depth of cut, which is ten times greater than predicted by the Bifano formula. A new formula to describe the machining process was developed and verified experimentally. In addition, the level of surface roughness (Sq) generated in ductile mode was analyzed and a formula was generated that allows roughness prediction depending on the critical process parameters. Finally, both formulas were used to create optimized sets of process parameters that produce a "first light" in ductile machining for a) single point diamond turning (SPDT) on ultra-precision machines (UPM) of binder-free carbide form and b) non-UPM, standard CNC ductile grinding of WC and glass.
{"title":"SPDT and standard CNC-grinding of tungsten carbide molds for precision glass molding: an experimental process analysis","authors":"C. Vogt, O. Faehnle, M. Doetz","doi":"10.1117/12.2318710","DOIUrl":"https://doi.org/10.1117/12.2318710","url":null,"abstract":"The contents of this work are based on [1], [2] and [3]. Using the three wagons approach, critical parameters were identified and the process window of ductile machining was considerably enlarged. This made it possible to increase the critical depth of cut, which is ten times greater than predicted by the Bifano formula. A new formula to describe the machining process was developed and verified experimentally. In addition, the level of surface roughness (Sq) generated in ductile mode was analyzed and a formula was generated that allows roughness prediction depending on the critical process parameters. Finally, both formulas were used to create optimized sets of process parameters that produce a \"first light\" in ductile machining for a) single point diamond turning (SPDT) on ultra-precision machines (UPM) of binder-free carbide form and b) non-UPM, standard CNC ductile grinding of WC and glass.","PeriodicalId":422212,"journal":{"name":"Precision Optics Manufacturing","volume":"68 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132523830","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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