Pub Date : 2022-10-13DOI: https://dl.acm.org/doi/10.1145/3517813
N. Nalla Anandakumar, Mohammad S. Hashmi, Somitra Kumar Sanadhya
This article presents a thorough analysis of two distinct Physically Unclonable Functions (PUF), namely RO-PUF (Ring oscillator-based PUF) and RS-LPUF (RS Latch-based PUF), prototyped on FPGA. It is shown that the implemented PUFs possess significantly enhanced performance when compared to the state of the art. It is also identified that the enhancements are achieved through the incorporation of Programmable Delay Lines of FPGA Lookup Tables, the Temporal Majority Voting (TMV) scheme, and placed macro techniques for routing and placements of PUF units. The prototypes developed on Xilinx Artix-7 FPGAs are used for validation over the rated temperature range of 0-85°C with ±5% variation in the supply voltage. The proposed schemes when evaluated experimentally also achieve good uniformity, bit-aliasing, uniqueness, and reliability. Finally, it is shown that the proposed designs outperform the existing conventional PUFs in the area and speed tradeoff.
{"title":"Design and Analysis of FPGA-based PUFs with Enhanced Performance for Hardware-oriented Security","authors":"N. Nalla Anandakumar, Mohammad S. Hashmi, Somitra Kumar Sanadhya","doi":"https://dl.acm.org/doi/10.1145/3517813","DOIUrl":"https://doi.org/https://dl.acm.org/doi/10.1145/3517813","url":null,"abstract":"<p>This article presents a thorough analysis of two distinct Physically Unclonable Functions (PUF), namely RO-PUF (Ring oscillator-based PUF) and RS-LPUF (RS Latch-based PUF), prototyped on FPGA. It is shown that the implemented PUFs possess significantly enhanced performance when compared to the state of the art. It is also identified that the enhancements are achieved through the incorporation of Programmable Delay Lines of FPGA Lookup Tables, the Temporal Majority Voting (TMV) scheme, and placed macro techniques for routing and placements of PUF units. The prototypes developed on Xilinx Artix-7 FPGAs are used for validation over the rated temperature range of 0-85°<i>C</i> with ±5% variation in the supply voltage. The proposed schemes when evaluated experimentally also achieve good uniformity, bit-aliasing, uniqueness, and reliability. Finally, it is shown that the proposed designs outperform the existing conventional PUFs in the area and speed tradeoff.</p>","PeriodicalId":50924,"journal":{"name":"ACM Journal on Emerging Technologies in Computing Systems","volume":"15 1","pages":""},"PeriodicalIF":2.2,"publicationDate":"2022-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138537941","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-10-13DOI: https://dl.acm.org/doi/10.1145/3534971
Meysam Zaeemi, Siamak Mohammadi
In addition to the advantages of asynchronous circuits, compatibility with synchronous EDA tools is another strength point of synchronous elastic circuits. Synchronous elastic circuits face some challenges, such as process variations that can compromise its performance and functionality, and the multitude of available implementations based on elastic elements’ combinations, meaning that choosing the best combination could not be simple. In this paper, a novel method is introduced to model and verify synchronous elastic circuits in the presence of variations. The model is based on xMAS, which is a new formal modeling paradigm to synthesize, test, and verify circuits and networks. In this method, various elastic elements are modeled and available in the form of a library in xMAS, so the designer can build complicated elastic circuits by combining different elastic elements. Additionally, by translating a high-level xMAS model into a SAN statistical model and using its capabilities, elements’ internal delays will be embedded, which makes the high-level modeling and elastic circuits’ high-resolution time analysis available. Based on the obtained results, elastic circuits are highly capable of tolerating variations. However, this phenomenon could lead to a maximum of 2.35% error in synchronization control units and data in these circuits.
{"title":"High-level Modeling and Verification Platform for Elastic Circuits with Process Variation Considerations","authors":"Meysam Zaeemi, Siamak Mohammadi","doi":"https://dl.acm.org/doi/10.1145/3534971","DOIUrl":"https://doi.org/https://dl.acm.org/doi/10.1145/3534971","url":null,"abstract":"<p>In addition to the advantages of asynchronous circuits, compatibility with synchronous EDA tools is another strength point of synchronous elastic circuits. Synchronous elastic circuits face some challenges, such as process variations that can compromise its performance and functionality, and the multitude of available implementations based on elastic elements’ combinations, meaning that choosing the best combination could not be simple. In this paper, a novel method is introduced to model and verify synchronous elastic circuits in the presence of variations. The model is based on xMAS, which is a new formal modeling paradigm to synthesize, test, and verify circuits and networks. In this method, various elastic elements are modeled and available in the form of a library in xMAS, so the designer can build complicated elastic circuits by combining different elastic elements. Additionally, by translating a high-level xMAS model into a SAN statistical model and using its capabilities, elements’ internal delays will be embedded, which makes the high-level modeling and elastic circuits’ high-resolution time analysis available. Based on the obtained results, elastic circuits are highly capable of tolerating variations. However, this phenomenon could lead to a maximum of 2.35% error in synchronization control units and data in these circuits.</p>","PeriodicalId":50924,"journal":{"name":"ACM Journal on Emerging Technologies in Computing Systems","volume":"107 1","pages":""},"PeriodicalIF":2.2,"publicationDate":"2022-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138537930","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-10-13DOI: https://dl.acm.org/doi/10.1145/3531010
Maitreyi Ashok, Matthew J. Turner, Ronald L. Walsworth, Edlyn V. Levine, Anantha P. Chandrakasan
This article presents a method for hardware trojan detection in integrated circuits. Unsupervised deep learning is used to classify wide field-of-view (4 × 4 mm2), high spatial resolution magnetic field images taken using a Quantum Diamond Microscope (QDM). QDM magnetic imaging is enhanced using quantum control techniques and improved diamond material to increase magnetic field sensitivity by a factor of 4 and measurement speed by a factor of 16 over previous demonstrations. These upgrades facilitate the first demonstration of QDM magnetic field measurement for hardware trojan detection. Unsupervised convolutional neural networks and clustering are used to infer trojan presence from unlabeled data sets of 600 × 600 pixel magnetic field images without human bias. This analysis is shown to be more accurate than principal component analysis for distinguishing between field programmable gate arrays configured with trojan-free and trojan-inserted logic. This framework is tested on a set of scalable trojans that we developed and measured with the QDM. Scalable and TrustHub trojans are detectable down to a minimum trojan trigger size of 0.5% of the total logic. The trojan detection framework can be used for golden-chip-free detection, since knowledge of the chips’ identities is only used to evaluate detection accuracy.
{"title":"Hardware Trojan Detection Using Unsupervised Deep Learning on Quantum Diamond Microscope Magnetic Field Images","authors":"Maitreyi Ashok, Matthew J. Turner, Ronald L. Walsworth, Edlyn V. Levine, Anantha P. Chandrakasan","doi":"https://dl.acm.org/doi/10.1145/3531010","DOIUrl":"https://doi.org/https://dl.acm.org/doi/10.1145/3531010","url":null,"abstract":"<p>This article presents a method for hardware trojan detection in integrated circuits. Unsupervised deep learning is used to classify wide field-of-view (4 × 4 mm<sup>2</sup>), high spatial resolution magnetic field images taken using a Quantum Diamond Microscope (QDM). QDM magnetic imaging is enhanced using quantum control techniques and improved diamond material to increase magnetic field sensitivity by a factor of 4 and measurement speed by a factor of 16 over previous demonstrations. These upgrades facilitate the first demonstration of QDM magnetic field measurement for hardware trojan detection. Unsupervised convolutional neural networks and clustering are used to infer trojan presence from unlabeled data sets of 600 × 600 pixel magnetic field images without human bias. This analysis is shown to be more accurate than principal component analysis for distinguishing between field programmable gate arrays configured with trojan-free and trojan-inserted logic. This framework is tested on a set of scalable trojans that we developed and measured with the QDM. Scalable and TrustHub trojans are detectable down to a minimum trojan trigger size of 0.5% of the total logic. The trojan detection framework can be used for golden-chip-free detection, since knowledge of the chips’ identities is only used to evaluate detection accuracy.</p>","PeriodicalId":50924,"journal":{"name":"ACM Journal on Emerging Technologies in Computing Systems","volume":"2006 1","pages":""},"PeriodicalIF":2.2,"publicationDate":"2022-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138537958","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-10-13DOI: https://dl.acm.org/doi/10.1145/3531012
Haiyang Han, Theoni Alexoudi, Chris Vagionas, Nikos Pleros, Nikos Hardavellas
Conventional electronic memory hierarchies are intrinsically limited in their ability to overcome the memory wall due to scaling constraints. Optical caches and interconnects can mitigate these constraints, and enable processors to reach performance and energy efficiency unattainable by purely electronic means. However, the promised benefits cannot be realized through a simple replacement process; to reach its full potential, the architecture needs to be holistically redesigned. This article proposes Pho$, an opto-electronic memory hierarchy architecture for multicores. Pho$ replaces conventional core-private electronic caches with a large shared optical L1 built with optical SRAMs. The shared optical cache is supported by Pho$Net, a novel hybrid MWSR/R-SWMR optical NoC that provides low-latency and high-bandwidth communication between the electronic cores and the shared optical L1 at low optical loss. Pho$Net’s unique network arbitration protocol seamlessly co-arbitrates the request and reply sub-networks and facilitates cache requests and replies that optimize for the common case of cache hits. Through Pho$ we solve the problems that render previous designs impractical. Our results show that Pho$ achieves on average 1.41× performance speedup (3.89× max) and 31% lower energy-delay product (90% max) against conventional designs. Moreover, the Pho$Net optical NoC for core-cache communication consumes 70% less power compared to directly applying previously proposed optical NoC architectures.
{"title":"A Practical Shared Optical Cache With Hybrid MWSR/R-SWMR NoC for Multicore Processors","authors":"Haiyang Han, Theoni Alexoudi, Chris Vagionas, Nikos Pleros, Nikos Hardavellas","doi":"https://dl.acm.org/doi/10.1145/3531012","DOIUrl":"https://doi.org/https://dl.acm.org/doi/10.1145/3531012","url":null,"abstract":"<p>Conventional electronic memory hierarchies are intrinsically limited in their ability to overcome the memory wall due to scaling constraints. Optical caches and interconnects can mitigate these constraints, and enable processors to reach performance and energy efficiency unattainable by purely electronic means. However, the promised benefits cannot be realized through a simple replacement process; to reach its full potential, the architecture needs to be holistically redesigned. This article proposes Pho$, an opto-electronic memory hierarchy architecture for multicores. Pho$ replaces conventional core-private electronic caches with a large shared optical L1 built with optical SRAMs. The shared optical cache is supported by Pho$Net, a novel hybrid MWSR/R-SWMR optical NoC that provides low-latency and high-bandwidth communication between the electronic cores and the shared optical L1 at low optical loss. Pho$Net’s unique network arbitration protocol seamlessly co-arbitrates the request and reply sub-networks and facilitates cache requests and replies that optimize for the common case of cache hits. Through Pho$ we solve the problems that render previous designs impractical. Our results show that Pho$ achieves on average 1.41× performance speedup (3.89× max) and 31% lower energy-delay product (90% max) against conventional designs. Moreover, the Pho$Net optical NoC for core-cache communication consumes 70% less power compared to directly applying previously proposed optical NoC architectures.</p>","PeriodicalId":50924,"journal":{"name":"ACM Journal on Emerging Technologies in Computing Systems","volume":"24 1","pages":""},"PeriodicalIF":2.2,"publicationDate":"2022-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138537960","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-10-13DOI: https://dl.acm.org/doi/10.1145/3517181
Mohsen Riahi Alam, M. Hassan Najafi, Nima Taherinejad
Sorting data is needed in many application domains. Traditionally, the data is read from memory and sent to a general-purpose processor or application-specific hardware for sorting. The sorted data is then written back to the memory. Reading/writing data from/to memory and transferring data between memory and processing unit incur significant latency and energy overhead. In this work, we develop the first architectures for in-memory sorting of data to the best of our knowledge. We propose two architectures. The first architecture is applicable to the conventional format of representing data, i.e., weighted binary radix. The second architecture is proposed for developing unary processing systems, where data is encoded as uniform unary bit-streams. As we present, each of the two architectures has different advantages and disadvantages, making one or the other more suitable for a specific application. However, the common property of both is a significant reduction in the processing time compared to prior sorting designs. Our evaluations show on average 37 × and 138× energy reduction for binary and unary designs, respectively, compared to conventional CMOS off-memory sorting systems in a 45 nm technology. We designed a 3×3 and a 5×5 Median filter using the proposed sorting solutions, which we used for processing 64×64 pixel images. Our results show a reduction of 14× and 634× in energy and latency, respectively, with the proposed binary, and 5.6× and 152×103 in energy and latency with the proposed unary approach compared to those of the off-memory binary and unary designs for the 3 × 3 Median filtering system.
{"title":"Sorting in Memristive Memory","authors":"Mohsen Riahi Alam, M. Hassan Najafi, Nima Taherinejad","doi":"https://dl.acm.org/doi/10.1145/3517181","DOIUrl":"https://doi.org/https://dl.acm.org/doi/10.1145/3517181","url":null,"abstract":"<p>Sorting data is needed in many application domains. Traditionally, the data is read from memory and sent to a general-purpose processor or application-specific hardware for sorting. The sorted data is then written back to the memory. Reading/writing data from/to memory and transferring data between memory and processing unit incur significant latency and energy overhead. In this work, we develop the first architectures for in-memory sorting of data to the best of our knowledge. We propose two architectures. The first architecture is applicable to the conventional format of representing data, i.e., weighted binary radix. The second architecture is proposed for developing unary processing systems, where data is encoded as uniform unary bit-streams. As we present, each of the two architectures has different advantages and disadvantages, making one or the other more suitable for a specific application. However, the common property of both is a significant reduction in the processing time compared to prior sorting designs. Our evaluations show on average 37 × and 138× energy reduction for binary and unary designs, respectively, compared to conventional CMOS off-memory sorting systems in a 45 nm technology. We designed a 3×3 and a 5×5 Median filter using the proposed sorting solutions, which we used for processing 64×64 pixel images. Our results show a reduction of 14× and 634× in energy and latency, respectively, with the proposed binary, and 5.6× and 152×10<sup>3</sup> in energy and latency with the proposed unary approach compared to those of the off-memory binary and unary designs for the 3 × 3 Median filtering system.</p>","PeriodicalId":50924,"journal":{"name":"ACM Journal on Emerging Technologies in Computing Systems","volume":"18 1","pages":""},"PeriodicalIF":2.2,"publicationDate":"2022-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138537962","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-10-13DOI: https://dl.acm.org/doi/10.1145/3513087
Tahoura Mosavirik, Fatemeh Ganji, Patrick Schaumont, Shahin Tajik
The globalization of electronic systems’ fabrication has made some of our most critical systems vulnerable to supply chain attacks. Implanting spy chips on the printed circuit boards (PCBs) or replacing genuine components with counterfeit/recycled ones are examples of such attacks. Unfortunately, conventional attack detection schemes for PCBs are ad hoc, costly, unscalable, and error prone. This work introduces a holistic physical verification framework for PCBs, called ScatterVerif, based on the characterization of the PCBs’ power distribution network. First, we demonstrate how scattering parameters, frequently used for impedance characterization of RF circuits, can characterize the entire PCB with a single measurement. Second, we present how a class of machine learning algorithms, namely the Gaussian mixture model, can be applied to the measurements to automatically classify/cluster the genuine and tampered/counterfeit PCBs. We show that these attacks affect the overall impedance of a PCB differently in various frequency ranges, hence the conventional impedance measurements using a constant-frequency electrical stimulus might leave the attack undetected. We conduct extensive experiments on counterfeit and tampered devices and demonstrate that these attacks can be detected with high confidence. Finally, we show that the acquired data from the power distribution network characterization can also be deployed for fingerprinting genuine PCBs.
{"title":"ScatterVerif: Verification of Electronic Boards Using Reflection Response of Power Distribution Network","authors":"Tahoura Mosavirik, Fatemeh Ganji, Patrick Schaumont, Shahin Tajik","doi":"https://dl.acm.org/doi/10.1145/3513087","DOIUrl":"https://doi.org/https://dl.acm.org/doi/10.1145/3513087","url":null,"abstract":"<p>The globalization of electronic systems’ fabrication has made some of our most critical systems vulnerable to supply chain attacks. Implanting spy chips on the <b>printed circuit boards (PCBs)</b> or replacing genuine components with counterfeit/recycled ones are examples of such attacks. Unfortunately, conventional attack detection schemes for PCBs are ad hoc, costly, unscalable, and error prone. This work introduces a holistic physical verification framework for PCBs, called <i>ScatterVerif</i>, based on the characterization of the PCBs’ power distribution network. First, we demonstrate how scattering parameters, frequently used for impedance characterization of RF circuits, can characterize the entire PCB with a single measurement. Second, we present how a class of machine learning algorithms, namely the Gaussian mixture model, can be applied to the measurements to automatically classify/cluster the genuine and tampered/counterfeit PCBs. We show that these attacks affect the overall impedance of a PCB differently in various frequency ranges, hence the conventional impedance measurements using a constant-frequency electrical stimulus might leave the attack undetected. We conduct extensive experiments on counterfeit and tampered devices and demonstrate that these attacks can be detected with high confidence. Finally, we show that the acquired data from the power distribution network characterization can also be deployed for fingerprinting genuine PCBs.</p>","PeriodicalId":50924,"journal":{"name":"ACM Journal on Emerging Technologies in Computing Systems","volume":"2 1","pages":""},"PeriodicalIF":2.2,"publicationDate":"2022-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138537963","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-10-13DOI: https://dl.acm.org/doi/10.1145/3517812
Simone Ruffini, Luca Caronti, Kasım Sinan Yıldırım, Davide Brunelli
Today’s intermittent computing systems operate by relying only on harvested energy accumulated in their tiny energy reservoirs, typically capacitors. An intermittent device dies due to a power failure when there is no energy in its capacitor and boots again when the harvested energy is sufficient to power its hardware components. Power failures prevent the forward progress of computation due to the frequent loss of computational state. To remedy this problem, intermittent computing systems comprise built-in fast non-volatile memories with high write endurance to store information that persists despite frequent power failures. However, the lack of design tools makes fast-prototyping these systems difficult. Even though FPGAs are common platforms for fast prototyping and behavioral verification of continuously powered architectures, they do not target prototyping intermittent computing systems. This article introduces a new FPGA-based framework, named NORM (Non-volatile memORy eMulator), to emulate and verify the behavior of any intermittent computing system that exploits fast non-volatile memories. Our evaluation showed that NORM can be used to emulate and validate FeRAM-based transiently powered hardware architectures successfully.
{"title":"NORM: An FPGA-based Non-volatile Memory Emulation Framework for Intermittent Computing","authors":"Simone Ruffini, Luca Caronti, Kasım Sinan Yıldırım, Davide Brunelli","doi":"https://dl.acm.org/doi/10.1145/3517812","DOIUrl":"https://doi.org/https://dl.acm.org/doi/10.1145/3517812","url":null,"abstract":"<p>Today’s intermittent computing systems operate by relying only on harvested energy accumulated in their tiny energy reservoirs, typically capacitors. An intermittent device dies due to a power failure when there is no energy in its capacitor and boots again when the harvested energy is sufficient to power its hardware components. Power failures prevent the forward progress of computation due to the frequent loss of computational state. To remedy this problem, intermittent computing systems comprise built-in fast non-volatile memories with high write endurance to store information that persists despite frequent power failures. However, the lack of design tools makes fast-prototyping these systems difficult. Even though FPGAs are common platforms for fast prototyping and behavioral verification of continuously powered architectures, they do not target prototyping intermittent computing systems. This article introduces a new FPGA-based framework, named NORM (<b>N</b>on-volatile mem<b>OR</b>y e<b>M</b>ulator), to emulate and verify the behavior of any intermittent computing system that exploits fast non-volatile memories. Our evaluation showed that NORM can be used to emulate and validate FeRAM-based transiently powered hardware architectures successfully.</p>","PeriodicalId":50924,"journal":{"name":"ACM Journal on Emerging Technologies in Computing Systems","volume":"9 1","pages":""},"PeriodicalIF":2.2,"publicationDate":"2022-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138537931","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-10-13DOI: https://dl.acm.org/doi/10.1145/3544975
Amal Thomas K, Soumyajit Poddar, Hemanta Kumar Mondal
Convolutional neural networks (CNNs) have gained a massive impression in the fields of computer vision and especially in the embedded applications because of their high accuracy and performance. However, high computational complexity and power consumption due to convolution operations causes a high demand for low-power accelerators. A 3D geometric optimization strategy is proposed to alleviate the area and power requirements of Multiply Accumulate operations prevalent in all spatial CNNs. The proposed technique is generic and may be easily scaled for accelerators performing spatial 2D convolution.
{"title":"A CNN Hardware Accelerator Using Triangle-based Convolution","authors":"Amal Thomas K, Soumyajit Poddar, Hemanta Kumar Mondal","doi":"https://dl.acm.org/doi/10.1145/3544975","DOIUrl":"https://doi.org/https://dl.acm.org/doi/10.1145/3544975","url":null,"abstract":"<p>Convolutional neural networks (CNNs) have gained a massive impression in the fields of computer vision and especially in the embedded applications because of their high accuracy and performance. However, high computational complexity and power consumption due to convolution operations causes a high demand for low-power accelerators. A 3D geometric optimization strategy is proposed to alleviate the area and power requirements of Multiply Accumulate operations prevalent in all spatial CNNs. The proposed technique is generic and may be easily scaled for accelerators performing spatial 2D convolution.</p>","PeriodicalId":50924,"journal":{"name":"ACM Journal on Emerging Technologies in Computing Systems","volume":"48 1","pages":""},"PeriodicalIF":2.2,"publicationDate":"2022-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138537957","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Ferhat Erata, Shuwen Deng, Faisal Zaghloul, Wenjie Xiong, O. Demir, Jakub Szefer
This article surveys the landscape of security verification approaches and techniques for computer systems at various levels: from a software-application level all the way to the physical hardware level. Different existing projects are compared, based on the tools used and security aspects being examined. Since many systems require both hardware and software components to work together to provide the system’s promised security protections, it is not sufficient to verify just the software levels or just the hardware levels in a mutually exclusive fashion. This survey especially highlights system levels that are verified by the different existing projects and presents to the readers the state of the art in hardware and software system security verification. Few approaches come close to providing full-system verification, and there is still much room for improvement.
{"title":"Survey of Approaches and Techniques for Security Verification of Computer Systems","authors":"Ferhat Erata, Shuwen Deng, Faisal Zaghloul, Wenjie Xiong, O. Demir, Jakub Szefer","doi":"10.1145/3564785","DOIUrl":"https://doi.org/10.1145/3564785","url":null,"abstract":"This article surveys the landscape of security verification approaches and techniques for computer systems at various levels: from a software-application level all the way to the physical hardware level. Different existing projects are compared, based on the tools used and security aspects being examined. Since many systems require both hardware and software components to work together to provide the system’s promised security protections, it is not sufficient to verify just the software levels or just the hardware levels in a mutually exclusive fashion. This survey especially highlights system levels that are verified by the different existing projects and presents to the readers the state of the art in hardware and software system security verification. Few approaches come close to providing full-system verification, and there is still much room for improvement.","PeriodicalId":50924,"journal":{"name":"ACM Journal on Emerging Technologies in Computing Systems","volume":"19 1","pages":"1 - 34"},"PeriodicalIF":2.2,"publicationDate":"2022-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"43261224","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
This article proposes an electrical analysis of a new defect mechanism, to be named as b-open defect, which may occur in nanometer technologies due to the use of the Self-Aligned Double Patterning (SADP) technique. In metal lines making use of the SADP technique, a single dust particle may cause the simultaneous occurrence of a bridge defect and an open defect. When the two defects impact the same gates, the electrical effects of the bridge and the open combine and exhibit a new specific electrical behavior; we call this new defect behavior a b-open. As a consequence, existing test generation methodologies may miss defect detection. The electrical behavior of the b-open defect is first analyzed graphically and then validated through extensive SPICE simulations. The test pattern conditions to detect the b-open defect are finally determined, and it is shown that the b-open defect requires specific test generation.
{"title":"B-open Defect: A Novel Defect Model in FinFET Technology","authors":"Freddy Forero, V. Champac, M. Renovell","doi":"10.1145/3564244","DOIUrl":"https://doi.org/10.1145/3564244","url":null,"abstract":"This article proposes an electrical analysis of a new defect mechanism, to be named as b-open defect, which may occur in nanometer technologies due to the use of the Self-Aligned Double Patterning (SADP) technique. In metal lines making use of the SADP technique, a single dust particle may cause the simultaneous occurrence of a bridge defect and an open defect. When the two defects impact the same gates, the electrical effects of the bridge and the open combine and exhibit a new specific electrical behavior; we call this new defect behavior a b-open. As a consequence, existing test generation methodologies may miss defect detection. The electrical behavior of the b-open defect is first analyzed graphically and then validated through extensive SPICE simulations. The test pattern conditions to detect the b-open defect are finally determined, and it is shown that the b-open defect requires specific test generation.","PeriodicalId":50924,"journal":{"name":"ACM Journal on Emerging Technologies in Computing Systems","volume":"19 1","pages":"1 - 19"},"PeriodicalIF":2.2,"publicationDate":"2022-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42011631","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}