We propose an AVF-driven parity selection method for protecting modern microprocessor in-core memory arrays against MBUs. As MBUs constitute more than 50% of the upsets in latest technologies, error correcting codes or physical interleaving are typically employed to effectively protect out-of-core memory structures, such as caches. However, such methods are not applicable to high-performance in-core arrays, due to computational complexity, high delay and area overhead. To this end, we revisit parity as an effective mechanism to detect errors and we resort to pipeline flushing and checkpointing for correction. We demonstrate that optimal parity tree construction for MBU detection is a computationally complex problem, which we then formulate as an integer-linear-program (ILP). Experimental results on Alpha 21264 and Intel P6 in-core memory arrays demonstrate that optimal parity tree selection can achieve great vulnerability reduction, even when a small number of bits are added to the parity trees, compared to simple heuristics. Furthermore, the ILP formulation allows us to find better solutions by effectively exploring the solution space in the presence of multiple parity trees; results show that the presence of 2 parity trees offers a vulnerability reduction of more than 50% over a single parity tree.
{"title":"AVF-driven parity optimization for MBU protection of in-core memory arrays","authors":"M. Maniatakos, M. Michael, Y. Makris","doi":"10.7873/DATE.2013.301","DOIUrl":"https://doi.org/10.7873/DATE.2013.301","url":null,"abstract":"We propose an AVF-driven parity selection method for protecting modern microprocessor in-core memory arrays against MBUs. As MBUs constitute more than 50% of the upsets in latest technologies, error correcting codes or physical interleaving are typically employed to effectively protect out-of-core memory structures, such as caches. However, such methods are not applicable to high-performance in-core arrays, due to computational complexity, high delay and area overhead. To this end, we revisit parity as an effective mechanism to detect errors and we resort to pipeline flushing and checkpointing for correction. We demonstrate that optimal parity tree construction for MBU detection is a computationally complex problem, which we then formulate as an integer-linear-program (ILP). Experimental results on Alpha 21264 and Intel P6 in-core memory arrays demonstrate that optimal parity tree selection can achieve great vulnerability reduction, even when a small number of bits are added to the parity trees, compared to simple heuristics. Furthermore, the ILP formulation allows us to find better solutions by effectively exploring the solution space in the presence of multiple parity trees; results show that the presence of 2 parity trees offers a vulnerability reduction of more than 50% over a single parity tree.","PeriodicalId":6310,"journal":{"name":"2013 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2013-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77537818","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Massively repeated structures such as SRAM cells usually require extremely low failure rate. This brings on a challenging issue for Monte Carlo based statistical yield analysis, as huge amount of samples have to be drawn in order to observe one single failure. Fast Monte Carlo methods, e.g. importance sampling methods, are still quite expensive as the anticipated failure rate is very low. In this paper, a new method is proposed to tackle this issue. The key idea is to improve traditional importance sampling method with an efficient online surrogate model. The proposed method improves the performance for both stages in importance sampling, i.e. finding the distorted probability density function, and the distorted sampling. Experimental results show that the proposed method is 1e2X∼1e5X faster than the standard Monte Carlo approach and achieves 5X∼22X speedup over existing state-of-the-art techniques without sacrificing estimation accuracy.
{"title":"Efficient importance sampling for high-sigma yield analysis with adaptive online surrogate modeling","authors":"Jian Yao, Zuochang Ye, Yan Wang","doi":"10.7873/DATE.2013.267","DOIUrl":"https://doi.org/10.7873/DATE.2013.267","url":null,"abstract":"Massively repeated structures such as SRAM cells usually require extremely low failure rate. This brings on a challenging issue for Monte Carlo based statistical yield analysis, as huge amount of samples have to be drawn in order to observe one single failure. Fast Monte Carlo methods, e.g. importance sampling methods, are still quite expensive as the anticipated failure rate is very low. In this paper, a new method is proposed to tackle this issue. The key idea is to improve traditional importance sampling method with an efficient online surrogate model. The proposed method improves the performance for both stages in importance sampling, i.e. finding the distorted probability density function, and the distorted sampling. Experimental results show that the proposed method is 1e2X∼1e5X faster than the standard Monte Carlo approach and achieves 5X∼22X speedup over existing state-of-the-art techniques without sacrificing estimation accuracy.","PeriodicalId":6310,"journal":{"name":"2013 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2013-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86912898","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
As graphics processing units (GPUs) are becoming increasingly popular for general purpose workloads (GPGPU), the question arises how such processors will evolve architecturally in the near future. In this work, we identify and discuss trade-offs for three GPU architecture parameters: active thread count, compute-memory ratio, and cluster and warp sizing. For each parameter, we propose changes to improve GPU design, keeping in mind trends such as dark silicon and the increasing popularity of GPGPU architectures. A key-enabler is dynamism and workload-adaptiveness, enabling among others: dynamic register file sizing, latency aware scheduling, roofline-aware DVFS, run-time cluster fusion, and dynamic warp sizing.
{"title":"Future of GPGPU micro-architectural parameters","authors":"C. Nugteren, Gert-Jan van den Braak, H. Corporaal","doi":"10.7873/DATE.2013.089","DOIUrl":"https://doi.org/10.7873/DATE.2013.089","url":null,"abstract":"As graphics processing units (GPUs) are becoming increasingly popular for general purpose workloads (GPGPU), the question arises how such processors will evolve architecturally in the near future. In this work, we identify and discuss trade-offs for three GPU architecture parameters: active thread count, compute-memory ratio, and cluster and warp sizing. For each parameter, we propose changes to improve GPU design, keeping in mind trends such as dark silicon and the increasing popularity of GPGPU architectures. A key-enabler is dynamism and workload-adaptiveness, enabling among others: dynamic register file sizing, latency aware scheduling, roofline-aware DVFS, run-time cluster fusion, and dynamic warp sizing.","PeriodicalId":6310,"journal":{"name":"2013 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2013-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87681892","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Circuit reliability in the presence of variability is a major concern for SRAM designers. With the size of memory ever increasing, Monte Carlo simulations have become too time consuming for margining and yield evaluation. In addition, dynamic write-ability metrics have an advantage over static metrics because they take into account timing constraints. However, these metrics are much more expensive in terms of runtime. Statistical blockade is one method that reduces the number of simulations by filtering out non-tail samples, however the total number of simulations required still remains relatively large. In this paper, we present a method that uses sensitivity analysis to provide a total speedup of ∼112X compared with recursive statistical blockade with only a 3% average loss in accuracy. In addition, we show how this method can be used to calculate dynamic VMIN and to evaluate several write assist methods.
{"title":"Leveraging sensitivity analysis for fast, accurate estimation of SRAM dynamic write VMIN","authors":"James Boley, V. Chandra, R. Aitken, B. Calhoun","doi":"10.7873/DATE.2013.364","DOIUrl":"https://doi.org/10.7873/DATE.2013.364","url":null,"abstract":"Circuit reliability in the presence of variability is a major concern for SRAM designers. With the size of memory ever increasing, Monte Carlo simulations have become too time consuming for margining and yield evaluation. In addition, dynamic write-ability metrics have an advantage over static metrics because they take into account timing constraints. However, these metrics are much more expensive in terms of runtime. Statistical blockade is one method that reduces the number of simulations by filtering out non-tail samples, however the total number of simulations required still remains relatively large. In this paper, we present a method that uses sensitivity analysis to provide a total speedup of ∼112X compared with recursive statistical blockade with only a 3% average loss in accuracy. In addition, we show how this method can be used to calculate dynamic VMIN and to evaluate several write assist methods.","PeriodicalId":6310,"journal":{"name":"2013 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2013-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90084497","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
In this work we present an experimental environment for electronic system-level design based on the OpenMP programming paradigm. Fully compliant with the OpenMP standard, the environment allows the generation of heterogeneous hardware/software systems exhibiting good scalability with respect to the number of threads and limited performance overheads. Based on well-established OpenMP benchmarks, the paper also presents some comparisons with high-performance software implementations as well as with previous proposals oriented to pure hardware translation. The results confirm that the proposed approach achieves improved results in terms of both efficiency and scalability.
{"title":"Efficient and scalable OpenMP-based system-level design","authors":"A. Cilardo, L. Gallo, A. Mazzeo, N. Mazzocca","doi":"10.7873/DATE.2013.206","DOIUrl":"https://doi.org/10.7873/DATE.2013.206","url":null,"abstract":"In this work we present an experimental environment for electronic system-level design based on the OpenMP programming paradigm. Fully compliant with the OpenMP standard, the environment allows the generation of heterogeneous hardware/software systems exhibiting good scalability with respect to the number of threads and limited performance overheads. Based on well-established OpenMP benchmarks, the paper also presents some comparisons with high-performance software implementations as well as with previous proposals oriented to pure hardware translation. The results confirm that the proposed approach achieves improved results in terms of both efficiency and scalability.","PeriodicalId":6310,"journal":{"name":"2013 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2013-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86058346","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Crossbar-based architectures are promising for the future nanoelectronic systems. However, due to the inherent unreliability of nanoscale devices, the implementation of any logic functions relies on aggressive defect-tolerant schemes applied at the post-manufacturing stage. Most of such defect-tolerant approaches explore mapping choices between logic variables/products and crossbar vertical/horizontal wires. In this paper, we develop a new approach, namely fine-grained logic hardening, based on the idea of adding redundancies into a logic function so as to boost the success rate of logic implementation. We propose an analytical framework to evaluate and fine-tune the amount and location of redundancy to be added for a given logic function. Furthermore, we devise a method to optimally harden the logic function so as to maximize the defect tolerance capability. Simulation results show that the proposed logic hardening scheme boosts defect tolerance capability significantly in yield improvement, compared to mapping-only schemes with the same amount of hardware cost.
{"title":"Defect-tolerant logic hardening for crossbar-based nanosystems","authors":"Yehua Su, Wenjing Rao","doi":"10.7873/DATE.2013.361","DOIUrl":"https://doi.org/10.7873/DATE.2013.361","url":null,"abstract":"Crossbar-based architectures are promising for the future nanoelectronic systems. However, due to the inherent unreliability of nanoscale devices, the implementation of any logic functions relies on aggressive defect-tolerant schemes applied at the post-manufacturing stage. Most of such defect-tolerant approaches explore mapping choices between logic variables/products and crossbar vertical/horizontal wires. In this paper, we develop a new approach, namely fine-grained logic hardening, based on the idea of adding redundancies into a logic function so as to boost the success rate of logic implementation. We propose an analytical framework to evaluate and fine-tune the amount and location of redundancy to be added for a given logic function. Furthermore, we devise a method to optimally harden the logic function so as to maximize the defect tolerance capability. Simulation results show that the proposed logic hardening scheme boosts defect tolerance capability significantly in yield improvement, compared to mapping-only schemes with the same amount of hardware cost.","PeriodicalId":6310,"journal":{"name":"2013 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2013-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90532319","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The advantages of moving from 2-Dimensional Networks-on-Chip (NoCs) to 3-Dimensional NoCs for any application must be justified by the improvements in performance, power, latency and the overall system costs, especially the cost of Through-Silicon-Via (TSV). The trade-off between the number of TSVs and the 3D NoCs system performance becomes one of the most critical design issues. In this paper, we present a fast and optimized task allocation method for low vertical link density (TSV number) 3D NoCs based many core systems, in comparison to the classic methods as Genetic Algorithm (GA) and Simulated Annealing (SA), our method can save quite a number of design time. We take several state-of-the-art benchmarks and the generic scalable pseudo application (GSPA) with different network scales to simulate the achieved design (by our method), in comparison to GA and SA methods achieved designs, our technique can achieve better performance and lower cost. All the experiments have been done in GSNOC framework (written in SystemC-RTL), which can achieve the cycle accuracy and good flexibility.
{"title":"Fast and optimized task allocation method for low vertical link density 3-Dimensional Networks-on-Chip based many core systems","authors":"Haoyuan Ying, T. Hollstein, K. Hofmann","doi":"10.7873/DATE.2013.357","DOIUrl":"https://doi.org/10.7873/DATE.2013.357","url":null,"abstract":"The advantages of moving from 2-Dimensional Networks-on-Chip (NoCs) to 3-Dimensional NoCs for any application must be justified by the improvements in performance, power, latency and the overall system costs, especially the cost of Through-Silicon-Via (TSV). The trade-off between the number of TSVs and the 3D NoCs system performance becomes one of the most critical design issues. In this paper, we present a fast and optimized task allocation method for low vertical link density (TSV number) 3D NoCs based many core systems, in comparison to the classic methods as Genetic Algorithm (GA) and Simulated Annealing (SA), our method can save quite a number of design time. We take several state-of-the-art benchmarks and the generic scalable pseudo application (GSPA) with different network scales to simulate the achieved design (by our method), in comparison to GA and SA methods achieved designs, our technique can achieve better performance and lower cost. All the experiments have been done in GSNOC framework (written in SystemC-RTL), which can achieve the cycle accuracy and good flexibility.","PeriodicalId":6310,"journal":{"name":"2013 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2013-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90682607","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
In this paper, we investigate how to use the complete flexibility of P-circuits, which realize a Boolean function by projecting it onto overlapping subsets given by a generalized Shannon decomposition. It is known how to compute the complete flexibility of P-circuits, but the algorithms proposed so far for its exploitation do not guarantee to find the best implementation, because they cast the problem as the minimization of an incompletely specified function. Instead, here we show that to explore all solutions we must set up the problem as the minimization of a Boolean relation, because there are don't care conditions that cannot be expressed by single cubes. In the experiments we report major improvements with respect to the previously published results.
{"title":"Minimization of P-circuits using boolean relations","authors":"A. Bernasconi, V. Ciriani, G. Trucco, T. Villa","doi":"10.7873/DATE.2013.208","DOIUrl":"https://doi.org/10.7873/DATE.2013.208","url":null,"abstract":"In this paper, we investigate how to use the complete flexibility of P-circuits, which realize a Boolean function by projecting it onto overlapping subsets given by a generalized Shannon decomposition. It is known how to compute the complete flexibility of P-circuits, but the algorithms proposed so far for its exploitation do not guarantee to find the best implementation, because they cast the problem as the minimization of an incompletely specified function. Instead, here we show that to explore all solutions we must set up the problem as the minimization of a Boolean relation, because there are don't care conditions that cannot be expressed by single cubes. In the experiments we report major improvements with respect to the previously published results.","PeriodicalId":6310,"journal":{"name":"2013 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2013-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87563617","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
In this paper we propose a flexible slack budgeting approach for post-placement multi-bit flip-flop (MBFF) merging. Our approach considers existing wiring topology and flip-flop delay changes for achieving more accurate slack budgeting. Besides, we propose a slack-to-length converting approach to translating timing slack into equivalent wire length for simplifying a merging process. We also develop a merging method to evaluate our slack budgeting approach. Our slack budgeting and MBFF merging programs are fully integrated into an industrial design flow. Experimental results show that our approach on average achieves 3.4% area saving, 50% clock tree power saving, and 5.3% total power saving.
{"title":"Slack budgeting and slack to length converting for multi-bit flip-flop merging","authors":"Chia-Chieh Lu, Rung-Bin Lin","doi":"10.7873/DATE.2013.367","DOIUrl":"https://doi.org/10.7873/DATE.2013.367","url":null,"abstract":"In this paper we propose a flexible slack budgeting approach for post-placement multi-bit flip-flop (MBFF) merging. Our approach considers existing wiring topology and flip-flop delay changes for achieving more accurate slack budgeting. Besides, we propose a slack-to-length converting approach to translating timing slack into equivalent wire length for simplifying a merging process. We also develop a merging method to evaluate our slack budgeting approach. Our slack budgeting and MBFF merging programs are fully integrated into an industrial design flow. Experimental results show that our approach on average achieves 3.4% area saving, 50% clock tree power saving, and 5.3% total power saving.","PeriodicalId":6310,"journal":{"name":"2013 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2013-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84067635","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Konstantis Daloukas, Alexia Marnari, N. Evmorfopoulos, P. Tsompanopoulou, G. Stamoulis
Efficient analysis of massive on-chip power delivery networks is among the most challenging problems facing the EDA industry today. Due to Joule heating effect and the temperature dependence of resistivity, temperature is one of the most important factors that affect IR drop and must be taken into account in power grid analysis. However, the sheer size of modern power delivery networks (comprising several thousands or millions of nodes) usually forces designers to neglect thermal effects during IR drop analysis in order to simplify and accelerate simulation. As a result, the absence of accurate estimates of Joule heating effect on IR drop analysis introduces significant uncertainty in the evaluation of circuit functionality. This work presents a new approach for fast electrical-thermal co-simulation of large-scale power grids found in contemporary nanometer-scale ICs. A state-of-the-art iterative method is combined with an efficient and extremely parallel preconditioning mechanism, which enables harnessing the computational resources of massively parallel architectures, such as graphics processing units (GPUs). Experimental results demonstrate that the proposed method achieves a speedup of 66.1X for a 3.1M-node design over a state-of-the-art direct method and a speedup of 22.2X for a 20.9M-node design over a state-of-the-art iterative method when GPUs are utilized.
{"title":"A parallel fast transform-based preconditioning approach for electrical-thermal co-simulation of power delivery networks","authors":"Konstantis Daloukas, Alexia Marnari, N. Evmorfopoulos, P. Tsompanopoulou, G. Stamoulis","doi":"10.7873/DATE.2013.341","DOIUrl":"https://doi.org/10.7873/DATE.2013.341","url":null,"abstract":"Efficient analysis of massive on-chip power delivery networks is among the most challenging problems facing the EDA industry today. Due to Joule heating effect and the temperature dependence of resistivity, temperature is one of the most important factors that affect IR drop and must be taken into account in power grid analysis. However, the sheer size of modern power delivery networks (comprising several thousands or millions of nodes) usually forces designers to neglect thermal effects during IR drop analysis in order to simplify and accelerate simulation. As a result, the absence of accurate estimates of Joule heating effect on IR drop analysis introduces significant uncertainty in the evaluation of circuit functionality. This work presents a new approach for fast electrical-thermal co-simulation of large-scale power grids found in contemporary nanometer-scale ICs. A state-of-the-art iterative method is combined with an efficient and extremely parallel preconditioning mechanism, which enables harnessing the computational resources of massively parallel architectures, such as graphics processing units (GPUs). Experimental results demonstrate that the proposed method achieves a speedup of 66.1X for a 3.1M-node design over a state-of-the-art direct method and a speedup of 22.2X for a 20.9M-node design over a state-of-the-art iterative method when GPUs are utilized.","PeriodicalId":6310,"journal":{"name":"2013 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2013-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87193039","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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