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Carrier-mediated reduction mechanism in WO3 nanowires under electron-beam irradiation. 电子束辐照下WO3纳米线中载流子介导的还原机制。
IF 1.9 Pub Date : 2026-01-02 DOI: 10.1093/jmicro/dfaf058
Sho Nekita, Itsuki Misono, Kazuhiro Yasuda, Yusuke Shimada, Chou Jyh-Tyng, Tetsuya Okuyama, Satoshi Hata

Electron-beam irradiation often induces unintended structural and chemical changes in materials. Here, we show that damage and reduction in tungsten trioxide (WO3) nanowires are primarily driven by a carrier-mediated ionization process. In situ electron microscopy and electron energy-loss spectroscopy reveal structural degradation accompanied by the reduction of W6+ to W5+, while carrier dynamics simulations identify persistent, high-density electron-hole populations. Quantitative analyses and control experiments indicate that knock-on displacement and heating contribute minimally. This study establishes a microscopy-based quantitative framework for understanding electron-beam-induced damage and redox processes, highlighting the potential of electron microscopy for mechanistic insights and nanoscale chemical patterning in oxides.

电子束辐照经常引起材料的结构和化学变化。研究表明,三氧化钨(WO3)纳米线的损伤和还原主要是由载流子介导的电离过程驱动的。原位电子显微镜和电子能量损失能谱显示W6+到W5+的结构降解,而载流子动力学模拟发现了持续的高密度电子空穴居群。定量分析和控制实验表明,冲击位移和加热对影响最小。本研究建立了一个基于显微镜的定量框架,用于理解电子束诱导的损伤和氧化还原过程,强调了电子显微镜在氧化物的机制见解和纳米级化学图案方面的潜力。
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引用次数: 0
Detection of low-energy backscattered electron in scanning electron microscopy using microchannel plate detector. 利用微通道板探测器检测扫描电镜低能背散射电子。
IF 1.9 Pub Date : 2026-01-01 DOI: 10.1093/jmicro/dfaf033
Yuto Yanagihara, Yuanzhao Yao, Hayata Yamamoto, Takashi Sekiguchi

Si-photodiode is commonly used for the backscattered electron (BSE) detector in scanning electron microscope (SEM). However, it is difficult to detect low-energy electrons below 3 kV. We have developed a thin microchannel plate (MCP) chip with an energy filter grid as an alternative BSE detector for low-energy SEM observations. The MCP can get enough signals even at 1 keV electron beam operation. The energy filtering operation revealed that the MCP image is composed of SE and BSE signals. By filtering SE component, the low-energy BSE images are easily obtained, which will open-up the new observation method of SEM using low-BSE image.

硅光二极管(Si-PD)是扫描电子显微镜(SEM)中常用的背散射电子(BSE)探测器。然而,很难探测到3kv以下的低能电子。我们开发了一种带有能量滤波网格的薄微通道板(MCP)芯片,作为低能量SEM观测的替代BSE探测器。即使在1kev的电子束下,MCP也能获得足够的信号。能量滤波运算表明,MCP图像由SE和BSE信号组成。通过对SE分量的滤波,可以很容易地获得低能量的BSE图像,从而开辟了利用低BSE图像进行扫描电镜观测的新方法。研制了一种带能量滤波网格的微通道板(MCP)探测器,用于扫描电镜下的低能量疯牛病检测。该探测器可以检测50 eV到1 keV的低能量bse。它也可以在低能量电子束操作,如1千电子伏特。
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引用次数: 0
Fluorescent probes for visualizing ion dynamics in bacteria: current tools and future perspectives. 荧光探针在细菌离子动力学可视化:目前的工具和未来的展望。
IF 1.9 Pub Date : 2026-01-01 DOI: 10.1093/jmicro/dfaf040
Yusuke V Morimoto

Ion gradients and membrane potential are fundamental to bacterial physiology, driving essential processes such as ATP synthesis, nutrient uptake, motility and stress adaptation. Visualizing these ion dynamics has become increasingly feasible through the use of fluorescent probes. This review provides a comprehensive overview of both synthetic dyes and genetically encoded indicators developed or adapted for bacterial systems. This review describes the principles underlying ion detection, highlights representative fluorescent probe tools and assesses their application in monitoring cytoplasmic ions and membrane potential in living bacterial cells. Specific challenges in bacterial imaging, such as cell size, membrane permeability, dye efflux and signal quantification, are discussed alongside recent advances in probe design and imaging platforms. This review aims to guide future research by outlining current capabilities, identifying limitations and suggesting opportunities for innovation in bacterial ion imaging.

离子梯度和膜电位是细菌生理的基础,驱动ATP合成、营养摄取、运动和应激适应等基本过程。通过使用荧光探针可视化这些离子动力学已经变得越来越可行。这篇综述提供了合成染料和开发或适应细菌系统的遗传编码指标的全面概述。本文综述了离子检测的基本原理,重点介绍了具有代表性的荧光探针工具,并评估了它们在监测活细菌细胞细胞质离子和膜电位方面的应用。在细菌成像的具体挑战,如细胞大小,膜的通透性,染料外排和信号量化,讨论探针设计和成像平台的最新进展。本综述旨在通过概述细菌离子成像的现有能力、识别局限性和提出创新机会来指导未来的研究。
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引用次数: 0
Detection limit of defect-induced strain in GaN evaluated by valence EELS and correlated structural analysis. 用价态EELS和相关结构分析评价GaN中缺陷诱发应变的检测限。
IF 1.9 Pub Date : 2026-01-01 DOI: 10.1093/jmicro/dfaf034
Shunsuke Yamashita, Jun Kikkawa, Susumu Kusanagi, Ichiro Nomachi, Ryoji Arai, Yuya Kanitani, Koji Kimoto, Yoshihiro Kudo

Crystal defects are intrinsically linked to the electrical and optical properties of semiconductor materials, making their nanoscale detection essential across all phases (from research and development to manufacturing). Electron energy loss spectroscopy (EELS) in scanning transmission electron microscopy (STEM) has emerged as a promising technique for detecting even point defects due to the shape modulation in valence-loss spectra induced by defects. However, previous studies have primarily focused on qualitative detection, leaving the detection limit, i.e. the minimum detectable concentration, insufficiently explored. To experimentally evaluate the detection limit of defects and clarify the application scope of valence EELS, we prepared GaN samples with controlled defect concentrations along the depth direction using multi-step He-ion implantation and acquired valence-loss spectra at each depth. Based on the simulated depth profile of defects, we evaluated the detection limit from the depth at which significant modulation in the spectral shape was observed. The detection limit fundamentally depends on the signal-to-noise ratio of the valence-loss spectra. Under typical STEM conditions with an electron dose of 5 × 105 e-/Å2, the detection limit of defects in GaN was determined to be 0.35% (3500 ppm). Detailed structural analysis revealed that GaN contains implantation-induced defects and their clusters, and exhibits lattice strain and local disorder while retaining its wurtzite structure. The shape modulation in the valence-loss spectra was attributed to the indirect detection of defects through the surrounding strain fields.

晶体缺陷与半导体材料的电学和光学特性有着内在的联系,这使得它们的纳米级检测在所有阶段(从研发到制造)都是必不可少的。扫描透射电子显微镜(STEM)中的电子能量损失谱(EELS)由于缺陷引起的价损失谱的形状调制而成为一种很有前途的检测偶点缺陷的技术。然而,以往的研究主要集中在定性检测上,而对检测限(即最低可检测浓度)的探索不足。为了实验评估缺陷的检测极限,明确价态EELS的应用范围,我们采用多步he离子注入制备了沿深度方向控制缺陷浓度的GaN样品,并获得了每个深度的价态损失谱。基于模拟的缺陷深度轮廓,我们从观察到光谱形状显著调制的深度评估了检测极限。检测极限基本上取决于价损谱的信噪比。在典型的STEM条件下,电子剂量为5 × 105 e-/Å2, GaN中缺陷的检测限为0.35% (3500 ppm)。详细的结构分析表明,GaN在保留纤锌矿结构的同时,含有植入缺陷及其团簇,表现出晶格应变和局部无序。价损谱中的形状调制归因于通过周围的应变场间接检测缺陷。我们利用价态EELS和相关结构分析研究了GaN中缺陷诱导应变的检测限。检出限基本上取决于价损谱的信噪比,在典型的STEM电子剂量条件下确定为0.35% (3500 ppm)。迷你摘要图:图2和图3。
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引用次数: 0
Detection and electron microscopic study of thick cross-striated linear fibrils in mammalian cell nuclei. 哺乳动物细胞核中粗横纹线状原纤维的检测与电镜研究。
IF 1.9 Pub Date : 2026-01-01 DOI: 10.1093/jmicro/dfaf036
Mark I Mosevitsky

Using an electron microscope, thick (30-100 nm wide), linear (not branched), cross-striated protein fibrils with an axial repeat of about 65 nm were detected in mammalian cell nuclei. These fibrils differ from the thin filaments of the nuclear matrix described in the literature. Therefore, in this work, the main efforts were aimed at demonstrating the nuclear origin of thick fibrils. Their presence in the material of nuclei destroyed by ultrasound, their contact with isolated nucleoli, and their presence in residual nuclei (nuclear matrix) are shown. Contacts of thick fibrils with both chromatin and the network of filaments of the nuclear matrix were observed. Thick fibrils, which are axial components of condensed chromosomes, are preserved during mitosis. It is likely that their contacts with chromatin and elements of the nuclear matrix are also preserved, ensuring the reproduction of the internal structure of the nuclei in daughter cells. Thick fibrils disintegrate in a medium with low ionic strength. Perhaps this is the reason for their absence in other authors' nuclear matrix preparations. In this work, the nuclei were isolated, and all experiments were carried out in a "complete medium" simulating the intranuclear salt content.

在电子显微镜下,在哺乳动物细胞核中检测到厚(30-100 nm宽)、线性(不分枝)、交叉条纹的蛋白原纤维,轴向重复约65 nm。这些原纤维不同于文献中描述的核基质的细丝。因此,在这项工作中,主要的努力是为了证明厚原纤维的核起源。它们存在于超声破坏核的物质中,与分离核仁的接触,以及存在于残核(核基质)中。观察到粗原纤维与染色质和核基质细丝网络的接触。粗原纤维是浓缩染色体的轴向成分,在有丝分裂期间被保存下来。很可能它们与染色质和核基质元素的接触也被保留下来,确保了细胞核内部结构在子细胞中的复制。粗纤维在低离子强度的介质中分解。也许这就是其他作者的核基质制备中没有它们的原因。在这项工作中,原子核被分离,所有的实验都在模拟核内盐含量的“完全介质”中进行。在细胞核中,用电子显微镜检测并描述了厚的(直径30-100 nm)线性交叉条纹(轴向重复约65 nm)原纤维。它们大概是核矩阵的组成部分。
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引用次数: 0
Myosin-1e drives ruffle-edge lamellipodia formation and motility in A549 invasive lung cancer cells. 肌球蛋白- ie驱动A549浸润性肺癌细胞褶边板足的形成和运动。
IF 1.9 Pub Date : 2026-01-01 DOI: 10.1093/jmicro/dfaf039
Haruka Morishita, Katsuhisa Kawai, Ayaka Noda, Youhei Egami, Nobukazu Araki

Lamellipodia are generally defined as thin, sheet-like cell protrusions that constitute the actin cytoskeleton-based motile apparatus, which promotes the movement of migrating cells. Recently, we identified a novel type of lamellipodia, termed ruffle-edge lamellipodia, which have α-actinin-4 (ACTN4)-enriched multilayer membrane folds at their leading edges in certain invasive cancer cell lines. In this study, the role of unconventional myosin-1e (Myo1E) in ACTN4-enriched ruffle-edge lamellipodia was analyzed using live-cell imaging, immunofluorescence, and scanning electron microscopy. Immunofluorescence microscopy for endogenous Myo1E and live-cell imaging of mApple-Myo1E-expressing cells showed that Myo1E was localized to ACTN4-rich lamellipodia tips in A549 cells. The wound-healing assay and live-cell movies showed that Myo1E small interfering RNA knockdown significantly suppressed cell migration and ruffle-edge lamellipodia formation. Furthermore, scanning electron microscopy demonstrated that Myo1E knockdown significantly reduced ruffle-edge structures. These results suggest that Myo1E may play an important role not only in the motility of ruffle-edge lamellipodia but also in the construction of ruffle-edge structures, which are probably associated with cancer cell invasion and metastasis.

板足通常被定义为薄的片状细胞突起,构成基于肌动蛋白的细胞骨架运动装置,促进迁移细胞的运动。最近,我们在某些侵袭性癌细胞系中发现了一种新型的板足,称为褶边板足,其前缘具有富含α-肌动蛋白-4 (ACTN4)的多层膜褶皱。本研究采用活细胞、免疫荧光和扫描电镜分析了非常规肌球蛋白- ie (Myo1E)在actn4富集的褶边板足中的作用。内源性Myo1E的免疫荧光显微镜和mApple-Myo1E表达细胞的活细胞成像显示,Myo1E定位于A549细胞中富含actn4的板足尖端。伤口愈合实验和活细胞影像显示,Myo1E siRNA敲低显著抑制细胞迁移和褶边板足的形成。此外,扫描电镜显示Myo1E基因敲除显著减少了褶边结构。这些结果表明,Myo1E可能不仅在褶边板足的运动中起重要作用,而且在褶边结构的构建中起重要作用,而褶边结构的构建可能与癌细胞的侵袭和转移有关。
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引用次数: 0
Reduction of membrane-derived noise using beam-tilt measurement and deep learning in observation using environmental cell. 利用波束倾斜测量和环境细胞观测中的深度学习降低膜源噪声。
IF 1.9 Pub Date : 2026-01-01 DOI: 10.1093/jmicro/dfaf031
Fumiaki Ichihashi, Yoshio Takahashi, Toshiaki Tanigaki

Electron microscopy using an environmental cell is a powerful tool for observing catalysts and other nanomaterials in gases and liquids. An environmental cell must contain amorphous silicon-nitride membranes because they protect the sample environment from the vacuum of the electron microscope and enable the electron beam to pass through the cell. However, the membranes superimpose non-uniform contrast on the projected image, degrading image quality. We propose a method for removing the noise derived from the membranes using Noise2Noise, a deep-learning method, for a series of transmission-electron-microscope images with slight electron-beam tilt and evaluated its effectiveness. We succeeded in removing the membrane-derived noise while retaining the information of the sample in the cell. We also succeeded in efficiently removing Poisson noise. We believe this method will enable measurements requiring high signal-to-noise ratios, which could previously only be observed in a vacuum, to be conducted in an environmental cell.

使用环境电池的电子显微镜是观察气体和液体中的催化剂和其他纳米材料的有力工具。环境电池必须包含非晶氮化硅膜,因为它们保护样品环境免受电子显微镜的真空影响,并使电子束能够通过电池。然而,薄膜在投影图像上叠加不均匀的对比度,降低图像质量。我们提出了一种使用Noise2Noise(一种深度学习方法)去除来自膜的噪声的方法,用于一系列具有轻微电子束倾斜的透射电子显微镜图像,并评估了其有效性。我们成功地去除了膜源噪声,同时保留了细胞中样品的信息。我们还成功地有效地去除了泊松噪声。我们相信这种方法将使需要高信噪比的测量,以前只能在真空中观察到,在环境电池中进行。
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引用次数: 0
Characterization of ultra-variable-pressure detector for secondary electrons in low-vacuum SEM. 低真空扫描电镜中二次电子超变压探测器的表征。
IF 1.9 Pub Date : 2026-01-01 DOI: 10.1093/jmicro/dfaf037
Yuanzhao Yao, Ryosuke Sonoda, Yasunari Sohda, Takashi Sekiguchi

Scanning electron microscope (SEM) observation in low vacuum can overcome the issue of charge-up at the specimen surface, allowing for the observation of insulating samples without sample pretreatment. The ultra-variable-pressure detector (UVD) was developed as a secondary electron (SE) detector for the low-vacuum observation in SEM. It works by collecting the light signal released from the collision between SEs and gas molecules. In this study, we propose a simple method using a stainless-steel sphere to characterize the feature of UVD signal in low-vacuum SEM and compare it with the traditional Everhart-Thornley (E-T) detector in normal SEM. The UVD signal showed characteristic features, namely a two-round-peak feature in the profile, which is different from that of E-T detector. Through experiment and simulation, we revealed that at higher vacuum levels (as a few Pa), SEs provide the primary contribution to the UVD signal, exhibiting a profile similar to that of the E-T signal. As the vacuum deteriorates, as 30 Pa, the main contribution to the UVD signal shifts from SEs to low-energy backscattered electrons (BSEs). Our finding indicates that by tuning the chamber pressure, we can vary the UVD image between SE and low-energy BSE features.

扫描电子显微镜(SEM)在低真空下的观察可以克服试样表面带电的问题,允许在没有样品预处理的情况下观察绝缘样品。超变压探测器(UVD)是一种用于扫描电镜低真空观测的二次电子探测器。它的工作原理是收集二次电子和气体分子碰撞时释放的光信号。在本研究中,我们提出了一种简单的方法,使用不锈钢(SUS)球来表征低真空扫描电镜下UVD信号的特征,并将其与传统的埃弗哈特-索恩利(E-T)探测器在普通扫描电镜下进行比较。UVD信号在剖面上表现出与E-T探测器不同的特征,即双圆峰特征。通过实验和模拟,我们发现在较高的真空水平(如几Pa), se是UVD信号的主要贡献者,表现出与E-T信号相似的特征。随着真空度的降低,在30 Pa时,UVD信号的主要贡献从se转移到低能量背散射电子(BSE)。我们的发现表明,通过调节腔压力,我们可以在SE和低能量BSE特征之间改变UVD图像。
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引用次数: 0
Biomedical application of organosilica nanoparticles. 有机二氧化硅纳米颗粒的生物医学应用。
IF 1.9 Pub Date : 2026-01-01 DOI: 10.1093/jmicro/dfaf030
Vikas Shukla, Junna Nakamura, Tomohiro Haruta, Michihiro Nakamura

Organosilica nanoparticles are considered one of the promising nanomaterials for biomedical imaging and clinical applications due to their tunable properties, biocompatibility and multimodal imaging ability. In this review, we summarize the synthesis and functionalization of organosilica nanoparticles with a particular focus on their importance in biomedical imaging. By their high fluorescence intensity and unique photostability, organosilica nanoparticles provide capabilities for high-resolution and long-term imaging for in vivo, mesoscopic and microscopic applications. In addition, surface modifications of organosilica nanoparticles control cellular interactions, facilitating the accurate monitoring of cellular uptake, mitochondrial activity and endosomal sorting. Incorporating recent progress and experimental results, this review summarizes the multiformity and extensive prospects of organosilica nanoparticle-based imaging modalities and offers perspectives on future development in nanoparticle-driven biomedical imaging and therapeutic strategies.

有机二氧化硅纳米颗粒由于其可调特性、生物相容性和多模态成像能力被认为是生物医学成像和临床应用的有前途的纳米材料之一。在这篇综述中,我们总结了有机二氧化硅纳米颗粒的合成和功能化,特别关注了它们在生物医学成像中的重要性。由于其高荧光强度和独特的光稳定性,有机二氧化硅纳米颗粒为体内、介观和微观应用提供了高分辨率和长期成像的能力。此外,有机二氧化硅纳米颗粒的表面修饰控制细胞相互作用,促进细胞摄取,线粒体活性和内体分选的准确监测。结合最近的研究进展和实验结果,本文总结了基于纳米二氧化硅的生物医学成像方式的多样性和广阔的前景,并对纳米颗粒驱动的生物医学成像和治疗策略的未来发展提出了展望。
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引用次数: 0
Valence electron spectroscopy using soft X-ray emission spectroscopy electron microscopes. 使用软x射线发射光谱电子显微镜的价电子能谱。
IF 1.9 Pub Date : 2025-12-27 DOI: 10.1093/jmicro/dfaf057
Masami Terauchi

Compact soft-X-ray emission spectroscopy (SXES) instrument, which was first applied to transmission electron microscope, was recently applied to scanning electron microscope and electron-probe microanalyzer, which improved the practical applicability of SXES as a tool investigating chemical bonding state of elements in bulk materials. Intensity profiles of Al-L, B-K and Si-L emission spectra which directly reflect the partial density of state of valence band (VB) were explained. Those energy positions are affected by core-level shift (chemical shift; CS) and a change of density of state (DOS) of VB, for example a bandgap formation. Those VB DOS measurements combined with electron-beam scanning technique can conduct a chemical bond mapping of a bulk material. It was presented that L-emission spectra of 3d transition-metal elements gives DOS+CS information in Lα,β emission, dielectric information in Lℓ,η, and the number of 3d electrons in the integrated intensity ratio of Lα,β/(Lα,β+ Lℓ,η). Since the electron-beam excited SXES experiment for bulk specimens can control the self-absorption effect, L-absorption profile of 3d-TM elements is obtainable from L-emission measurements by changing the accelerating voltage. Furthermore, CB information can be obtained from SXES spectra of semiconductor materials, Si and diamond cases were presented, by using the self-absorption effect on the background intensity of bremsstrahlung (BS) caused by electron-beam irradiation of the specimen.

紧凑型软x射线发射光谱(SXES)仪器最初应用于透射电子显微镜,最近又应用于扫描电子显微镜和电子探针微量分析仪,提高了SXES作为块状材料中元素化学键态研究工具的实用性。解释了直接反映价带态(VB)偏密度的Al-L、B-K和Si-L发射光谱的强度分布。这些能量位置受到核心层位移(化学位移;CS)和VB的态密度变化(DOS)的影响,例如形成带隙。这些VB DOS测量与电子束扫描技术相结合,可以对块状材料进行化学键映射。三维过渡金属元素的L-发射光谱给出了Lα、β发射中的DOS+CS信息,Lα、η中的介电信息,以及Lα、β/(Lα,β+ Lα、η)积分强度比中的三维电子数。由于块状试样的电子束激发SXES实验可以控制自吸收效应,因此通过改变加速电压,可以从l发射测量中获得3d-TM元素的l吸收曲线。此外,利用电子束辐照引起的轫致辐射(BS)背景强度的自吸收效应,可以从半导体材料的SXES光谱中获得CB信息。
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引用次数: 0
期刊
Microscopy (Oxford, England)
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