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Exploring electronic, optical, and vibrational properties of low-dimensional materials employing monochromated EELS. 利用单色EELS探索低维材料的电子、光学和振动特性。
IF 1.9 Pub Date : 2026-02-16 DOI: 10.1093/jmicro/dfag005
Ryosuke Senga

Low-dimensional materials, such as fullerenes, carbon nanotubes, graphene, hexagonal boron nitride, and transition metal dichalcogenides have garnered significant attention as candidates for next-generation device components. Their distinctive properties stem from reduced dimensionality and are significantly influenced by the behavior of quasiparticles, including excitons and phonons, particularly in non-periodic structures like vacancies and edges. Correlating local atomic structures with spectral features is crucial for elucidating their physical properties. Scanning transmission electron microscopy coupled with electron energy loss spectroscopy (EELS) offers localized spectral information at the single-atom level, providing valuable insights for materials characterization. Recent advances in monochromators for transmission electron microscopy have enhanced the energy resolution of EELS, enabling the measurement of optical and vibrational absorption properties at the nanoscale and atomic level. Additionally, phenomena like optically forbidden excitations and modulation of the local phonon density of states, previously inaccessible via conventional spectroscopic methods, are now observable. This review summarizes recent advancements in employing monochromated transmission electron microscopy to characterize low-dimensional materials.

低维材料,如富勒烯、碳纳米管、石墨烯、六方氮化硼和过渡金属二硫族化合物,作为下一代器件组件的候选材料,已经引起了人们的极大关注。它们的独特性质源于降维,并受到准粒子(包括激子和声子)行为的显著影响,特别是在空位和边缘等非周期结构中。将局部原子结构与光谱特征联系起来对于阐明它们的物理性质是至关重要的。扫描透射电子显微镜结合电子能量损失光谱(EELS)提供了单原子水平的局部光谱信息,为材料表征提供了有价值的见解。透射电子显微镜单色仪的最新进展提高了EELS的能量分辨率,使得在纳米尺度和原子水平上测量光学和振动吸收特性成为可能。此外,光学禁止激发和局部声子密度调制等现象,以前无法通过传统的光谱方法,现在可以观察到。本文综述了利用单铬化透射电镜表征低维材料的最新进展。
{"title":"Exploring electronic, optical, and vibrational properties of low-dimensional materials employing monochromated EELS.","authors":"Ryosuke Senga","doi":"10.1093/jmicro/dfag005","DOIUrl":"https://doi.org/10.1093/jmicro/dfag005","url":null,"abstract":"<p><p>Low-dimensional materials, such as fullerenes, carbon nanotubes, graphene, hexagonal boron nitride, and transition metal dichalcogenides have garnered significant attention as candidates for next-generation device components. Their distinctive properties stem from reduced dimensionality and are significantly influenced by the behavior of quasiparticles, including excitons and phonons, particularly in non-periodic structures like vacancies and edges. Correlating local atomic structures with spectral features is crucial for elucidating their physical properties. Scanning transmission electron microscopy coupled with electron energy loss spectroscopy (EELS) offers localized spectral information at the single-atom level, providing valuable insights for materials characterization. Recent advances in monochromators for transmission electron microscopy have enhanced the energy resolution of EELS, enabling the measurement of optical and vibrational absorption properties at the nanoscale and atomic level. Additionally, phenomena like optically forbidden excitations and modulation of the local phonon density of states, previously inaccessible via conventional spectroscopic methods, are now observable. This review summarizes recent advancements in employing monochromated transmission electron microscopy to characterize low-dimensional materials.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":""},"PeriodicalIF":1.9,"publicationDate":"2026-02-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146208131","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Analysis of photo-functional materials using momentum-resolved EELS. 利用动量分辨EELS分析光功能材料。
IF 1.9 Pub Date : 2026-02-13 DOI: 10.1093/jmicro/dfag006
Yohei K Sato

Momentum-resolved EELS (q-EELS) offers unique insights into the electronic excitations governing material performance. We analyzed anisotropic plasmons in NIR-shielding WO3 and LaB6, and correlated exciton size with photocatalytic activity in TiO2, demonstrating the technique's power to elucidate the origins of key photo-functional properties. Momentum transfer (q)-resolved electron energy-loss spectroscopy (q-EELS) is a powerful tool for analyzing photo-functional materials. The technique's application has demonstrated in several recent studies. This study first investigated the anisotropic plasmon oscillations in Cs-doped hexagonal WO3, a near-infrared (NIR) shielding material, to understand the origin of its highly efficient light-scattering properties. This revealed how plasmon energies differ along different crystallographic directions, contributing to the broad NIR absorption capabilities of the material. Second, the study measured the q dispersion of carrier plasmons and thus quantified interactions (exchange-correlation effect) between carrier electrons in LaB6 crystals, another NIR shielding filter. This analysis provides critical insights into many-body effects not captured by the ideal free-electron gas model. Finally, the spatial spread sizes of excitons in anatase TiO2 were determined, establishing a correlation between the exciton size and the anisotropic photocatalytic activity of anatase TiO2. Collectively, this research demonstrates that q-EELS provides unique, q-dependent information on electronic excitations, deepening our understanding of the properties governing the performance of advanced materials.

动量分辨EELS (q-EELS)为控制材料性能的电子激励提供了独特的见解。我们分析了nir屏蔽WO3和LaB6中的各向异性等离子体,并将激子大小与TiO2中的光催化活性进行了关联,证明了该技术在阐明关键光功能性质起源方面的能力。动量传递(q)分辨电子能量损失谱(q- eels)是分析光功能材料的有力工具。这项技术的应用已在最近的几项研究中得到证实。本研究首先研究了近红外(NIR)屏蔽材料掺碳六方WO3的各向异性等离子体振荡,以了解其高效光散射特性的起源。这揭示了等离子体能量如何沿着不同的晶体方向变化,从而促进了材料广泛的近红外吸收能力。其次,该研究测量了载流子等离子体的q色散,从而量化了另一种近红外屏蔽滤波器LaB6晶体中载流子电子之间的相互作用(交换相关效应)。这一分析为理想的自由电子气体模型所没有捕捉到的多体效应提供了重要的见解。最后,测定了激子在锐钛矿TiO2中的空间分布大小,建立了激子大小与锐钛矿TiO2各向异性光催化活性之间的关系。总的来说,这项研究表明,q-EELS提供了独特的、依赖于q的电子激发信息,加深了我们对高级材料性能特性的理解。
{"title":"Analysis of photo-functional materials using momentum-resolved EELS.","authors":"Yohei K Sato","doi":"10.1093/jmicro/dfag006","DOIUrl":"https://doi.org/10.1093/jmicro/dfag006","url":null,"abstract":"<p><p>Momentum-resolved EELS (q-EELS) offers unique insights into the electronic excitations governing material performance. We analyzed anisotropic plasmons in NIR-shielding WO3 and LaB6, and correlated exciton size with photocatalytic activity in TiO2, demonstrating the technique's power to elucidate the origins of key photo-functional properties. Momentum transfer (q)-resolved electron energy-loss spectroscopy (q-EELS) is a powerful tool for analyzing photo-functional materials. The technique's application has demonstrated in several recent studies. This study first investigated the anisotropic plasmon oscillations in Cs-doped hexagonal WO3, a near-infrared (NIR) shielding material, to understand the origin of its highly efficient light-scattering properties. This revealed how plasmon energies differ along different crystallographic directions, contributing to the broad NIR absorption capabilities of the material. Second, the study measured the q dispersion of carrier plasmons and thus quantified interactions (exchange-correlation effect) between carrier electrons in LaB6 crystals, another NIR shielding filter. This analysis provides critical insights into many-body effects not captured by the ideal free-electron gas model. Finally, the spatial spread sizes of excitons in anatase TiO2 were determined, establishing a correlation between the exciton size and the anisotropic photocatalytic activity of anatase TiO2. Collectively, this research demonstrates that q-EELS provides unique, q-dependent information on electronic excitations, deepening our understanding of the properties governing the performance of advanced materials.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":""},"PeriodicalIF":1.9,"publicationDate":"2026-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146196334","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Non-Destructive Pre- and Post-Experimental Validation of Glass Nanopipette Geometry: Quantifying Beam-Induced Deformation in Membrane-Free TEM. 玻璃纳米吸管几何形状的非破坏性实验前和实验后验证:在无膜透射电镜中量化光束引起的变形。
IF 1.9 Pub Date : 2026-02-13 DOI: 10.1093/jmicro/dfag004
Han Gia Nguyen, Linhao Sun, Hirotoshi Furusho, Shinji Watanabe

Nanopipettes have emerged as versatile tools for diverse applications, ranging from single-molecule sensing and nanoparticle detection to scanning probe microscopies such as scanning electrochemical microscopy and scanning ion conductance microscopy (SICM). In all these fields, precise geometrical characterization is a prerequisite for quantitative analysis. However, conventional "post-experimental" characterization cannot guarantee that the tip maintained its critical geometry during the experiment. While membrane-free transmission electron microscopy enables the non-destructive observation required for "pre- and post-experimental" validation, it introduces a risk of beam-induced deformation. In this study, we systematically investigated the deformation dynamics of quartz and borosilicate glass nanopipettes. Our analysis revealed distinct mechanisms: quartz exhibited continuous spheroidization enabled by structural homogeneity, whereas borosilicate glass showed fracture due to heterogeneity. Crucially, we identified a stable regime where deformation is negligible. By adhering to these conditions, we successfully demonstrated the rigorous tracking of a single quartz nanopipette's geometry both before and after live-cell SICM imaging. This workflow provides the first direct evidence of structural stability throughout the functional process, establishing a quantitative framework for reliable nanopipette metrology.

纳米吸管已经成为多种应用的通用工具,从单分子传感和纳米颗粒检测到扫描探针显微镜,如扫描电化学显微镜和扫描离子电导显微镜(SICM)。在所有这些领域中,精确的几何特征是定量分析的先决条件。然而,传统的“实验后”表征不能保证尖端在实验期间保持其临界几何形状。虽然无膜透射电子显微镜能够进行“实验前和实验后”验证所需的非破坏性观察,但它引入了光束引起变形的风险。在这项研究中,我们系统地研究了石英和硼硅酸盐玻璃纳米吸管的变形动力学。我们的分析揭示了不同的机制:石英表现出连续的球化,这是由于结构的均匀性,而硼硅酸盐玻璃则表现出断裂,这是由于非均匀性。至关重要的是,我们确定了一个稳定的状态,其中变形可以忽略不计。通过坚持这些条件,我们成功地展示了在活细胞SICM成像之前和之后对单个石英纳米吸管几何形状的严格跟踪。该工作流程在整个功能过程中提供了结构稳定性的第一个直接证据,为可靠的纳米吸管计量建立了定量框架。
{"title":"Non-Destructive Pre- and Post-Experimental Validation of Glass Nanopipette Geometry: Quantifying Beam-Induced Deformation in Membrane-Free TEM.","authors":"Han Gia Nguyen, Linhao Sun, Hirotoshi Furusho, Shinji Watanabe","doi":"10.1093/jmicro/dfag004","DOIUrl":"https://doi.org/10.1093/jmicro/dfag004","url":null,"abstract":"<p><p>Nanopipettes have emerged as versatile tools for diverse applications, ranging from single-molecule sensing and nanoparticle detection to scanning probe microscopies such as scanning electrochemical microscopy and scanning ion conductance microscopy (SICM). In all these fields, precise geometrical characterization is a prerequisite for quantitative analysis. However, conventional \"post-experimental\" characterization cannot guarantee that the tip maintained its critical geometry during the experiment. While membrane-free transmission electron microscopy enables the non-destructive observation required for \"pre- and post-experimental\" validation, it introduces a risk of beam-induced deformation. In this study, we systematically investigated the deformation dynamics of quartz and borosilicate glass nanopipettes. Our analysis revealed distinct mechanisms: quartz exhibited continuous spheroidization enabled by structural homogeneity, whereas borosilicate glass showed fracture due to heterogeneity. Crucially, we identified a stable regime where deformation is negligible. By adhering to these conditions, we successfully demonstrated the rigorous tracking of a single quartz nanopipette's geometry both before and after live-cell SICM imaging. This workflow provides the first direct evidence of structural stability throughout the functional process, establishing a quantitative framework for reliable nanopipette metrology.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":""},"PeriodicalIF":1.9,"publicationDate":"2026-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146196368","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Computing Initial Energy Distributions for Field Emission Sources. 场发射源初始能量分布的计算。
IF 1.9 Pub Date : 2026-02-06 DOI: 10.1093/jmicro/dfag003
John Rouse, Catherine Rouse, Haoning Liu

In Monte Carlo simulations of electron sources, random initial conditions of the particles' velocity components at the cathode need to be generated: these velocities are governed by the initial energy and angular distribution of the source. To generate the distributions numerically, the probability densities must be integrated so that the distribution can be inverted. Unlike for thermionic sources, where these integrals can be performed using simple trigonometric functions, for field emission or thermal field emission sources it is not so straightforward to integrate the probability distributions analytically. In this paper, we will show how we have derived analytic formulæ for the integrals of the energy probability distributions for cold and thermal field emission sources. These formulæ involve the Gaussian hypergeometric function, which can be evaluated numerically using established computational techniques. Hence, the random energy, and therefore velocity components, can be generated efficiently for the many thousands of particles typically needed for a Monte Carlo analysis of field emission sources. We have implemented these integrals in a computer program and give results of the energy distribution for field emission sources generated by these techniques.

在电子源的蒙特卡罗模拟中,需要生成阴极上粒子速度分量的随机初始条件:这些速度由源的初始能量和角分布控制。为了在数值上生成分布,必须对概率密度进行积分,以便可以反转分布。与热离子源不同的是,这些积分可以用简单的三角函数来完成,对于场发射或热场发射源来说,分析地积分概率分布并不是那么简单。在本文中,我们将展示如何推导出冷场和热场发射源能量概率分布积分的解析公式。这些公式涉及高斯超几何函数,它可以用已建立的计算技术进行数值计算。因此,随机能量和速度分量可以有效地为场发射源的蒙特卡罗分析通常需要的数千个粒子生成。我们在计算机程序中实现了这些积分,并给出了由这些技术产生的场发射源的能量分布结果。
{"title":"Computing Initial Energy Distributions for Field Emission Sources.","authors":"John Rouse, Catherine Rouse, Haoning Liu","doi":"10.1093/jmicro/dfag003","DOIUrl":"https://doi.org/10.1093/jmicro/dfag003","url":null,"abstract":"<p><p>In Monte Carlo simulations of electron sources, random initial conditions of the particles' velocity components at the cathode need to be generated: these velocities are governed by the initial energy and angular distribution of the source. To generate the distributions numerically, the probability densities must be integrated so that the distribution can be inverted. Unlike for thermionic sources, where these integrals can be performed using simple trigonometric functions, for field emission or thermal field emission sources it is not so straightforward to integrate the probability distributions analytically. In this paper, we will show how we have derived analytic formulæ for the integrals of the energy probability distributions for cold and thermal field emission sources. These formulæ involve the Gaussian hypergeometric function, which can be evaluated numerically using established computational techniques. Hence, the random energy, and therefore velocity components, can be generated efficiently for the many thousands of particles typically needed for a Monte Carlo analysis of field emission sources. We have implemented these integrals in a computer program and give results of the energy distribution for field emission sources generated by these techniques.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":""},"PeriodicalIF":1.9,"publicationDate":"2026-02-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146222462","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Tribute to peter william hawkes. 向彼得·威廉·霍克斯致敬。
IF 1.9 Pub Date : 2026-02-06 DOI: 10.1093/jmicro/dfaf052
Sameen Ahmed Khan, Ramaswamy Jagannathan
{"title":"Tribute to peter william hawkes.","authors":"Sameen Ahmed Khan, Ramaswamy Jagannathan","doi":"10.1093/jmicro/dfaf052","DOIUrl":"https://doi.org/10.1093/jmicro/dfaf052","url":null,"abstract":"","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":""},"PeriodicalIF":1.9,"publicationDate":"2026-02-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146144999","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Eric Munro-Pioneer of Electron Optics Software. Eric munro -电子光学软件的先驱。
IF 1.9 Pub Date : 2026-02-06 DOI: 10.1093/jmicro/dfaf051
Rouse John, Rouse Catherine
{"title":"Eric Munro-Pioneer of Electron Optics Software.","authors":"Rouse John, Rouse Catherine","doi":"10.1093/jmicro/dfaf051","DOIUrl":"https://doi.org/10.1093/jmicro/dfaf051","url":null,"abstract":"","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":""},"PeriodicalIF":1.9,"publicationDate":"2026-02-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146145019","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
High-resolution spin-polarized scanning tunneling spectroscopy using a functionalized superconducting tip. 使用功能化超导尖端的高分辨率自旋极化扫描隧道光谱。
IF 1.9 Pub Date : 2026-01-16 DOI: 10.1093/jmicro/dfag001
T Machida

Detecting spin states of electrons at the atomic scale has been at the heart of progress in condensed matter physics. Spin-polarized scanning tunneling microscopy and spectroscopy (SP-STM/STS) has provided important insights into understanding the nature of various spin-dependent phenomena, owing to its capability to visualize energy- and spin-resolved local density-of-states with atomic resolution. This review provides an overview of recent progress in SP-STS using functionalized superconducting tips, focusing on two approaches: conventional superconducting tips and Yu-Shiba-Rusinov (YSR) tips, which are formed by placing a single magnetic atom at the apex of a superconducting tip. Due to their nearly full spin polarization, both types allow for precise detection of the sample's spin polarization. These advanced techniques will be powerful probes for pursuing emergent quantum phenomena that demand ultra-high spin sensitivity, such as the spin polarization of Majorana zero modes around vortex cores in topological superconductors.

在原子尺度上探测电子的自旋状态一直是凝聚态物理学进展的核心。自旋极化扫描隧道显微镜和光谱学(SP-STM/STS)为理解各种自旋相关现象的本质提供了重要的见解,因为它能够以原子分辨率可视化能量和自旋分辨的局域态密度。本文综述了功能化超导针尖在SP-STS中的最新进展,重点介绍了两种方法:常规超导针尖和在超导针尖顶端放置单个磁性原子形成的YSR针尖。由于它们几乎完全的自旋极化,这两种类型都可以精确地检测样品的自旋极化。这些先进的技术将成为探索需要超高自旋灵敏度的新兴量子现象的有力探测器,例如拓扑超导体涡旋核周围马约拉纳零模式的自旋极化。
{"title":"High-resolution spin-polarized scanning tunneling spectroscopy using a functionalized superconducting tip.","authors":"T Machida","doi":"10.1093/jmicro/dfag001","DOIUrl":"https://doi.org/10.1093/jmicro/dfag001","url":null,"abstract":"<p><p>Detecting spin states of electrons at the atomic scale has been at the heart of progress in condensed matter physics. Spin-polarized scanning tunneling microscopy and spectroscopy (SP-STM/STS) has provided important insights into understanding the nature of various spin-dependent phenomena, owing to its capability to visualize energy- and spin-resolved local density-of-states with atomic resolution. This review provides an overview of recent progress in SP-STS using functionalized superconducting tips, focusing on two approaches: conventional superconducting tips and Yu-Shiba-Rusinov (YSR) tips, which are formed by placing a single magnetic atom at the apex of a superconducting tip. Due to their nearly full spin polarization, both types allow for precise detection of the sample's spin polarization. These advanced techniques will be powerful probes for pursuing emergent quantum phenomena that demand ultra-high spin sensitivity, such as the spin polarization of Majorana zero modes around vortex cores in topological superconductors.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":""},"PeriodicalIF":1.9,"publicationDate":"2026-01-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145992384","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Angle-resolved Cathodoluminescence Microscopy on Plasmonic Crystals. 等离子体晶体的角度分辨阴极发光显微镜。
IF 1.9 Pub Date : 2026-01-16 DOI: 10.1093/jmicro/dfag002
Hikaru Saito, Takumi Sannomiya

Controlling electromagnetic modes in nanostructures is vital for developing advanced optical devices. Metal surfaces with periodic structures, so-called plasmonic crystals (PlCs) form band structures of surface plasmon polaritons (SPPs), providing highly controllable confinement of SPPs and conversion to far-field light. Angle-resolved cathodoluminescence (CL) spectroscopy, where emitted light upon electron beam irradiation is analyzed with angle selection, can be combined with electron microscopy to visualize eigenmodes at specific wavenumbers. This method allows not only identifying the optical properties of Bloch modes appearing in PlCs, but also accessing functions emerging by local defects introduced into the lattice. This paper reviews applications of angle-resolved CL spectroscopy to mode analysis in one-dimensional and two-dimensional PlCs, and modified structures such as cavities and waveguides. Furthermore, this paper introduces an application of this method to the analysis of enhanced light emission from a phosphor film integrated in a PlC, where emitter-resonator coupling is visualized at the nanoscale.

控制纳米结构中的电磁模式对于开发先进的光学器件至关重要。具有周期性结构的金属表面,即所谓的等离子体晶体(plc)形成表面等离子体激元(SPPs)的能带结构,提供高度可控的SPPs限制和远场光的转换。角分辨阴极发光(CL)光谱学,其中发射的光在电子束照射分析与角度选择,可以与电子显微镜相结合,以可视化在特定波数的特征模式。这种方法不仅可以识别plc中出现的布洛赫模式的光学性质,而且还可以访问由引入晶格的局部缺陷产生的函数。本文综述了角分辨CL光谱在一维和二维plc模式分析中的应用,以及对腔和波导等结构的改进。此外,本文还介绍了将该方法应用于分析集成在PlC中的荧光粉膜的增强光发射,在纳米尺度上显示了发射器-谐振器耦合。
{"title":"Angle-resolved Cathodoluminescence Microscopy on Plasmonic Crystals.","authors":"Hikaru Saito, Takumi Sannomiya","doi":"10.1093/jmicro/dfag002","DOIUrl":"https://doi.org/10.1093/jmicro/dfag002","url":null,"abstract":"<p><p>Controlling electromagnetic modes in nanostructures is vital for developing advanced optical devices. Metal surfaces with periodic structures, so-called plasmonic crystals (PlCs) form band structures of surface plasmon polaritons (SPPs), providing highly controllable confinement of SPPs and conversion to far-field light. Angle-resolved cathodoluminescence (CL) spectroscopy, where emitted light upon electron beam irradiation is analyzed with angle selection, can be combined with electron microscopy to visualize eigenmodes at specific wavenumbers. This method allows not only identifying the optical properties of Bloch modes appearing in PlCs, but also accessing functions emerging by local defects introduced into the lattice. This paper reviews applications of angle-resolved CL spectroscopy to mode analysis in one-dimensional and two-dimensional PlCs, and modified structures such as cavities and waveguides. Furthermore, this paper introduces an application of this method to the analysis of enhanced light emission from a phosphor film integrated in a PlC, where emitter-resonator coupling is visualized at the nanoscale.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":""},"PeriodicalIF":1.9,"publicationDate":"2026-01-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145992399","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Carrier-mediated reduction mechanism in WO3 nanowires under electron-beam irradiation. 电子束辐照下WO3纳米线中载流子介导的还原机制。
IF 1.9 Pub Date : 2026-01-02 DOI: 10.1093/jmicro/dfaf058
Sho Nekita, Itsuki Misono, Kazuhiro Yasuda, Yusuke Shimada, Chou Jyh-Tyng, Tetsuya Okuyama, Satoshi Hata

Electron-beam irradiation often induces unintended structural and chemical changes in materials. Here, we show that damage and reduction in tungsten trioxide (WO3) nanowires are primarily driven by a carrier-mediated ionization process. In situ electron microscopy and electron energy-loss spectroscopy reveal structural degradation accompanied by the reduction of W6+ to W5+, while carrier dynamics simulations identify persistent, high-density electron-hole populations. Quantitative analyses and control experiments indicate that knock-on displacement and heating contribute minimally. This study establishes a microscopy-based quantitative framework for understanding electron-beam-induced damage and redox processes, highlighting the potential of electron microscopy for mechanistic insights and nanoscale chemical patterning in oxides.

电子束辐照经常引起材料的结构和化学变化。研究表明,三氧化钨(WO3)纳米线的损伤和还原主要是由载流子介导的电离过程驱动的。原位电子显微镜和电子能量损失能谱显示W6+到W5+的结构降解,而载流子动力学模拟发现了持续的高密度电子空穴居群。定量分析和控制实验表明,冲击位移和加热对影响最小。本研究建立了一个基于显微镜的定量框架,用于理解电子束诱导的损伤和氧化还原过程,强调了电子显微镜在氧化物的机制见解和纳米级化学图案方面的潜力。
{"title":"Carrier-mediated reduction mechanism in WO3 nanowires under electron-beam irradiation.","authors":"Sho Nekita, Itsuki Misono, Kazuhiro Yasuda, Yusuke Shimada, Chou Jyh-Tyng, Tetsuya Okuyama, Satoshi Hata","doi":"10.1093/jmicro/dfaf058","DOIUrl":"https://doi.org/10.1093/jmicro/dfaf058","url":null,"abstract":"<p><p>Electron-beam irradiation often induces unintended structural and chemical changes in materials. Here, we show that damage and reduction in tungsten trioxide (WO3) nanowires are primarily driven by a carrier-mediated ionization process. In situ electron microscopy and electron energy-loss spectroscopy reveal structural degradation accompanied by the reduction of W6+ to W5+, while carrier dynamics simulations identify persistent, high-density electron-hole populations. Quantitative analyses and control experiments indicate that knock-on displacement and heating contribute minimally. This study establishes a microscopy-based quantitative framework for understanding electron-beam-induced damage and redox processes, highlighting the potential of electron microscopy for mechanistic insights and nanoscale chemical patterning in oxides.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":""},"PeriodicalIF":1.9,"publicationDate":"2026-01-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145897161","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Detection of low-energy backscattered electron in scanning electron microscopy using microchannel plate detector. 利用微通道板探测器检测扫描电镜低能背散射电子。
IF 1.9 Pub Date : 2026-01-01 DOI: 10.1093/jmicro/dfaf033
Yuto Yanagihara, Yuanzhao Yao, Hayata Yamamoto, Takashi Sekiguchi

Si-photodiode is commonly used for the backscattered electron (BSE) detector in scanning electron microscope (SEM). However, it is difficult to detect low-energy electrons below 3 kV. We have developed a thin microchannel plate (MCP) chip with an energy filter grid as an alternative BSE detector for low-energy SEM observations. The MCP can get enough signals even at 1 keV electron beam operation. The energy filtering operation revealed that the MCP image is composed of SE and BSE signals. By filtering SE component, the low-energy BSE images are easily obtained, which will open-up the new observation method of SEM using low-BSE image.

硅光二极管(Si-PD)是扫描电子显微镜(SEM)中常用的背散射电子(BSE)探测器。然而,很难探测到3kv以下的低能电子。我们开发了一种带有能量滤波网格的薄微通道板(MCP)芯片,作为低能量SEM观测的替代BSE探测器。即使在1kev的电子束下,MCP也能获得足够的信号。能量滤波运算表明,MCP图像由SE和BSE信号组成。通过对SE分量的滤波,可以很容易地获得低能量的BSE图像,从而开辟了利用低BSE图像进行扫描电镜观测的新方法。研制了一种带能量滤波网格的微通道板(MCP)探测器,用于扫描电镜下的低能量疯牛病检测。该探测器可以检测50 eV到1 keV的低能量bse。它也可以在低能量电子束操作,如1千电子伏特。
{"title":"Detection of low-energy backscattered electron in scanning electron microscopy using microchannel plate detector.","authors":"Yuto Yanagihara, Yuanzhao Yao, Hayata Yamamoto, Takashi Sekiguchi","doi":"10.1093/jmicro/dfaf033","DOIUrl":"10.1093/jmicro/dfaf033","url":null,"abstract":"<p><p>Si-photodiode is commonly used for the backscattered electron (BSE) detector in scanning electron microscope (SEM). However, it is difficult to detect low-energy electrons below 3 kV. We have developed a thin microchannel plate (MCP) chip with an energy filter grid as an alternative BSE detector for low-energy SEM observations. The MCP can get enough signals even at 1 keV electron beam operation. The energy filtering operation revealed that the MCP image is composed of SE and BSE signals. By filtering SE component, the low-energy BSE images are easily obtained, which will open-up the new observation method of SEM using low-BSE image.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"70-73"},"PeriodicalIF":1.9,"publicationDate":"2026-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144644319","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
期刊
Microscopy (Oxford, England)
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