{"title":"Highlights from Microscopy and Microanalysis","authors":"","doi":"10.1093/mictod/qaad031","DOIUrl":"https://doi.org/10.1093/mictod/qaad031","url":null,"abstract":"","PeriodicalId":74194,"journal":{"name":"Microscopy today","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134977562","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
We describe a method for cleaning leaf epicuticular wax and contaminants from herbarium specimens in preparation for scanning electron microscopy. Specimens are rinsed in chloroform, heated at 50°C for 8 hrs, ultrasonicated in 70% ethanol, and subjected to critical-point drying. This method helps preserve and reveal the surface details of specimens that are heavily covered with epicuticular wax and contaminants, making many morphologically and functionally important details readily visible. We tested our method by using it to clean herbarium specimens and comparing the results with those obtained using three other chemicals: acetone, xylene, and 1:1 acetone:xylene, confirming that chloroform treatment was the most effective.
{"title":"A Method for Epicuticular Wax and Contaminant Removal from Herbarium Specimens for Scanning Electron Microscopy","authors":"Guang-Yi Dai, Qiao-Mei Qin, R. Deng, Xiao-Ying Hu","doi":"10.1093/mictod/qaad019","DOIUrl":"https://doi.org/10.1093/mictod/qaad019","url":null,"abstract":"\u0000 We describe a method for cleaning leaf epicuticular wax and contaminants from herbarium specimens in preparation for scanning electron microscopy. Specimens are rinsed in chloroform, heated at 50°C for 8 hrs, ultrasonicated in 70% ethanol, and subjected to critical-point drying. This method helps preserve and reveal the surface details of specimens that are heavily covered with epicuticular wax and contaminants, making many morphologically and functionally important details readily visible. We tested our method by using it to clean herbarium specimens and comparing the results with those obtained using three other chemicals: acetone, xylene, and 1:1 acetone:xylene, confirming that chloroform treatment was the most effective.","PeriodicalId":74194,"journal":{"name":"Microscopy today","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49204666","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Microscopy Today [this is the front cover]","authors":"","doi":"10.1093/mictod/qaad033","DOIUrl":"https://doi.org/10.1093/mictod/qaad033","url":null,"abstract":"","PeriodicalId":74194,"journal":{"name":"Microscopy today","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"43771677","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
In the past decade, cryo-electron microscopy (cryoEM) has become a vital tool for structural biologists. Using cryoEM to determine structures of biomolecules at high resolution is a rapidly evolving technique with high barriers to entry for non-microscopists. To help academic researchers remain competitive in their fields, the NIH established a network of centers to broaden access and training in cryoEM. One initiative from this network is the monthly CryoEM Current Practices webinar that provides practical methodological tips and tricks and is openly accessible to anyone interested. Now in its third year, the webinar continues to attract a sizable audience and provides a forum for network building within the structural biology community.
{"title":"Keeping Up with Current Practices in a Rapidly Evolving Field Through Dissemination of “Tips and Tricks” in a Monthly Webinar","authors":"C. Zimanyi, V. Rayaprolu","doi":"10.1093/mictod/qaad024","DOIUrl":"https://doi.org/10.1093/mictod/qaad024","url":null,"abstract":"\u0000 In the past decade, cryo-electron microscopy (cryoEM) has become a vital tool for structural biologists. Using cryoEM to determine structures of biomolecules at high resolution is a rapidly evolving technique with high barriers to entry for non-microscopists. To help academic researchers remain competitive in their fields, the NIH established a network of centers to broaden access and training in cryoEM. One initiative from this network is the monthly CryoEM Current Practices webinar that provides practical methodological tips and tricks and is openly accessible to anyone interested. Now in its third year, the webinar continues to attract a sizable audience and provides a forum for network building within the structural biology community.","PeriodicalId":74194,"journal":{"name":"Microscopy today","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48939669","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Performance, usability, and even availability of 4D-scanning transmission electron microscopy (STEM) measurements have historically been compromised by the lack of integration of 4D-STEM components on (S)TEM columns that were not originally designed for this purpose. This article introduces TESCAN TENSOR, the world’s first dedicated 4D-STEM instrument for multimodal characterization of nanoscale morphological, chemical, and structural properties of functional materials, thin films, and natural and synthetic crystals with stand-out 4D-STEM performance and unprecedented usability. 4D-STEM is the microscopy method of choice for nanoscale, multimodal characterization of material properties such as morphology, chemistry, and structure. At each pixel in the STEM dataset, the TENSOR rapidly acquires a diffraction pattern and an energy dispersive spectroscopy (EDS) spectrum that are perfectly synchronized. Together, diffraction and spectroscopy data encapsulate the full picture of electron beam–specimen interaction, from which a wide range of material properties can be derived. This article will review analytical 4D-STEM applications and discuss how the new 4D-STEM meets these requirements.
{"title":"Scanning Transmission Electron Microscopy Done Right","authors":"","doi":"10.1093/mictod/qaad009","DOIUrl":"https://doi.org/10.1093/mictod/qaad009","url":null,"abstract":"\u0000 Performance, usability, and even availability of 4D-scanning transmission electron microscopy (STEM) measurements have historically been compromised by the lack of integration of 4D-STEM components on (S)TEM columns that were not originally designed for this purpose. This article introduces TESCAN TENSOR, the world’s first dedicated 4D-STEM instrument for multimodal characterization of nanoscale morphological, chemical, and structural properties of functional materials, thin films, and natural and synthetic crystals with stand-out 4D-STEM performance and unprecedented usability. 4D-STEM is the microscopy method of choice for nanoscale, multimodal characterization of material properties such as morphology, chemistry, and structure. At each pixel in the STEM dataset, the TENSOR rapidly acquires a diffraction pattern and an energy dispersive spectroscopy (EDS) spectrum that are perfectly synchronized. Together, diffraction and spectroscopy data encapsulate the full picture of electron beam–specimen interaction, from which a wide range of material properties can be derived. This article will review analytical 4D-STEM applications and discuss how the new 4D-STEM meets these requirements.","PeriodicalId":74194,"journal":{"name":"Microscopy today","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48842014","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
D. Stroppa, M. Meffert, C. Hoermann, P. Zambon, Darya Bachevskaya, Hervé Remigy, C. Schulze-Briese, L. Piazza
4D scanning transmission electron microscope (STEM) techniques have been increasingly featured among the electron microscopy characterization approaches, as they provide a perspective of improved information retrieval from samples overall. To make 4D STEM experiments as viable as conventional STEM image acquisition, the recording of diffraction patterns with a pixelated detector at fast frame rates, sufficient sensitivity to capture single electron hits, and high dynamic range is necessary. This paper addresses the recent development in hybrid-pixel detector technology that now allows 4D STEM experiments with a similar setup to conventional STEM imaging with pixel collection time under 10 µs. Application examples on virtual STEM detectors and crystal phase-orientation mapping are presented.
{"title":"From STEM to 4D STEM: Ultrafast Diffraction Mapping with a Hybrid-Pixel Detector","authors":"D. Stroppa, M. Meffert, C. Hoermann, P. Zambon, Darya Bachevskaya, Hervé Remigy, C. Schulze-Briese, L. Piazza","doi":"10.1093/mictod/qaad005","DOIUrl":"https://doi.org/10.1093/mictod/qaad005","url":null,"abstract":"\u0000 4D scanning transmission electron microscope (STEM) techniques have been increasingly featured among the electron microscopy characterization approaches, as they provide a perspective of improved information retrieval from samples overall. To make 4D STEM experiments as viable as conventional STEM image acquisition, the recording of diffraction patterns with a pixelated detector at fast frame rates, sufficient sensitivity to capture single electron hits, and high dynamic range is necessary. This paper addresses the recent development in hybrid-pixel detector technology that now allows 4D STEM experiments with a similar setup to conventional STEM imaging with pixel collection time under 10 µs. Application examples on virtual STEM detectors and crystal phase-orientation mapping are presented.","PeriodicalId":74194,"journal":{"name":"Microscopy today","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49645096","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Cover for Microscopy Today March 2023 issue","authors":"","doi":"10.1093/mictod/qaad004","DOIUrl":"https://doi.org/10.1093/mictod/qaad004","url":null,"abstract":"","PeriodicalId":74194,"journal":{"name":"Microscopy today","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47400584","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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